Testing device

Abstract

The utility model discloses a testing device, and relates to the technical field of memory bank detection, the testing device is used for being matched with a circuit board, the testing device comprises a testing seat, a terminal assembly, a positioning block and a concave-convex structure, the testing seat is provided with an accommodating groove and a slot which are communicated with each other, and the slot is used for plugging a memory bank; the terminal assembly is arranged in the accommodating groove and is used for electrically connecting the memory bank and the circuit board; the positioning block is mounted at the end part of the test seat; and the concave-convex structure is arranged between the positioning block and the test seat, and the positioning block and the test seat are clamped through the concave-convex structure. According to the technical scheme provided by the utility model, the problem that the assembling efficiency between the existing test seat and the positioning block is relatively low is solved.

Description

Technical Field

[0001] This utility model relates to the field of memory module testing technology, and in particular to a testing device. Background Technology

[0002] In the electronics manufacturing industry, memory modules are one of the core components of computers and other electronic devices. They need to undergo a series of rigorous testing processes, such as soldering inspection, PCB appearance inspection, functional testing, and overall appearance inspection, to ensure that their performance meets the standards.

[0003] During memory module testing, it is usually necessary to insert the memory module into the slot of the test socket. To ensure that the memory module is inserted into the slot correctly and stably, the two ends of the test socket are usually equipped with positioning blocks near the slot.

[0004] Currently, the positioning block is usually fixed by opening multiple threaded holes and adding multiple bolts, thereby fixing multiple parts on the positioning block separately. This not only increases the processing difficulty of the test seat and positioning block, but also increases the number of required parts, making the assembly process more complicated and the assembly efficiency lower. Utility Model Content

[0005] The main purpose of this invention is to propose a testing device that aims to solve the problem of low assembly efficiency between existing test seats and positioning blocks.

[0006] To achieve the above objectives, the present invention proposes a testing device for use with a circuit board, the testing device comprising:

[0007] The test socket has a connected receiving slot and a slot for inserting a memory module;

[0008] A terminal assembly is disposed within the receiving slot and is used for electrically connecting the memory module and the circuit board;

[0009] A positioning block, installed at the end of the test fixture; and

[0010] A concave-convex structure is provided between the positioning block and the test seat, and the positioning block and the test seat are engaged by the concave-convex structure.

[0011] In one embodiment, the concave-convex structure includes a engaging protrusion and a engaging recess, wherein the engaging protrusion is provided in one of the positioning block and the test seat, and the engaging recess is provided in the other.

[0012] In one embodiment, both the positioning block and the test seat are provided with threaded holes, and a bolt is threadedly connected to the threaded holes to fix the test seat and the positioning block.

[0013] In one embodiment, the positioning block is provided with a guide groove, which is located on the side of the positioning block facing the slot, and the end of the memory module is located in the guide groove when the memory module is inserted into the slot.

[0014] In one embodiment, the inner diameter of the guide groove gradually decreases from the end furthest from the test seat to the end closest to the test seat.

[0015] In one embodiment, the positioning block has an extended inclined surface located on one side of the positioning block facing the memory module, so as to guide the memory module into the guide groove.

[0016] In one embodiment, the receiving slot includes two sub-slots spaced apart along the length of the test seat; the testing device further includes a limiting block disposed between the two sub-slots, and at least a portion of the limiting block extends into the slot.

[0017] In one embodiment, the test seat is further provided with two limiting holes spaced apart along its width direction, and the two ends of the limiting block are respectively fixed in the limiting holes.

[0018] In one embodiment, the slot opening is provided with a guide slope, and the slot opening diameter gradually increases from the end closer to the terminal assembly to the end farther away from the terminal assembly.

[0019] In one embodiment, the testing apparatus further includes a push rod assembly rotatably disposed at the end of the testing seat.

[0020] The technical solution of this utility model features a concave-convex structure between the positioning block and the test socket. This structure enables a snap-fit ​​connection between the positioning block and the test socket, improving the efficiency of installation and removal, and enhancing the positioning accuracy when inserting the memory module. The positioning block's placement at both ends of the slot acts as a barrier, guiding the memory module to align with the slot and improving insertion efficiency. Terminal components ensure electrical conductivity between the memory module and the circuit board, guaranteeing stable electrical connections during testing. Furthermore, the concave-convex structure simplifies the installation process of the positioning block, eliminating the need for additional fasteners, reducing assembly complexity and cost, and minimizing frequent repairs due to loose fasteners. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0022] Figure 1 A schematic diagram of the structure of an embodiment of the testing device provided by this utility model;

[0023] Figure 2 Exploded view of an embodiment of the testing device provided by this utility model;

[0024] Figure 3 A schematic diagram of the structure of the test holder in another embodiment of the testing device provided by this utility model;

[0025] Figure 4 for Figure 3 A magnified view of a section at point A in the middle;

[0026] Figure 5 A schematic diagram of the positioning block in another embodiment of the testing device provided by this utility model;

[0027] Figure 6 A schematic diagram of the bottom structure of the test seat in another embodiment of the testing device provided by this utility model.

[0028] Explanation of icon numbers:

[0029] 100. Testing device; 1. Test base; 11. Slot; 111. Guide slope; 12. Receiving groove; 121. Sub-slot; 13. Limiting hole; 2. Circuit board; 3. Terminal assembly; 4. Positioning block; 41. Threaded hole; 42. Guide groove; 43. Extending slope; 5. Concave-convex structure; 51. Snap-fit ​​protrusion; 52. Snap-fit ​​recess; 6. Limiting block; 7. Push rod assembly; 8. Memory module.

[0030] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0031] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present utility model.

[0032] It should be noted that if the embodiments of this utility model involve directional indicators (such as up, down, left, right, front, back, etc.), the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly.

[0033] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the use of "and / or" or "and / or" throughout the text includes three parallel solutions. For example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0034] Currently, the positioning block is usually fixed by opening multiple threaded holes and adding multiple bolts, thereby fixing multiple parts on the positioning block separately. This not only increases the processing difficulty of the test seat and positioning block, but also increases the number of required parts, making the assembly process more complicated and the assembly efficiency lower.

[0035] This invention proposes a testing device for use with a circuit board.

[0036] Please see Figure 2 , Figure 4 and Figure 5 In one embodiment of this utility model, the testing device 100 includes:

[0037] Test socket 1 has a connected receiving slot 12 and a slot 11, the slot 11 being used to insert memory module 8;

[0038] Terminal assembly 3 is disposed in receiving slot 12 and is used for electrical connection between memory module 8 and circuit board 2;

[0039] Positioning block 4 is installed at the end of test base 1; and

[0040] The concave-convex structure 5 is located between the positioning block 4 and the test seat 1, and the positioning block 4 and the test seat 1 are engaged by the concave-convex structure 5.

[0041] The technical solution of this utility model provides a concave-convex structure 5 between the positioning block 4 and the test socket 1. This structure 5 enables a snap-fit ​​connection between the positioning block 4 and the test socket 1, improving the efficiency of installation and removal, and enhancing the positioning accuracy of the memory module 8 during insertion. The positioning block 4 at both ends of the slot 11 forms a barrier, guiding the memory module 8 to align with the slot 11 and improving insertion efficiency. The terminal assembly 3 ensures electrical conductivity between the memory module 8 and the circuit board 2, guaranteeing stable electrical connection during testing. Furthermore, the concave-convex structure 5 simplifies the installation process of the positioning block 4, eliminating the need for additional fasteners, reducing assembly complexity and cost, and minimizing frequent maintenance issues caused by loose fasteners.

[0042] Specifically, the concave-convex structure 5 includes protrusions and grooves. For example, the positioning block 4 can be a protruding edge, and a corresponding groove is provided on the test seat 1. When the positioning block 4 is installed at the end of the test seat 1, the protruding edge inserts into the groove, achieving a tight fit between the positioning block 4 and the test seat 1. This snap-fit ​​design allows the positioning block 4 to be securely positioned on the test seat 1, while providing a certain degree of anti-rotation and anti-displacement function. Optionally, the protrusion can be an elastic edge, slightly larger than the shape of the groove, so that the protrusion can have slight compression when inserted into the groove, pressing it firmly inside the groove by its elasticity. The concave-convex structure 5 may also include some elastic elements, such as springs, to provide additional locking force, ensuring that the positioning block 4 will not accidentally fall off during the test.

[0043] It should be noted that the test socket 1 and the circuit board 2 can be connected by bolts, threads, or welding to ensure a stable connection during testing. The terminal assembly 3 can be fixed in the receiving groove 12 using elastic elements such as adhesive strips, thereby ensuring stable contact with the potential points on the circuit board 2 and the memory module 8. It should also be noted that the positioning blocks 4 are located near both ends of the slot 11 to guide the insertion of the memory module 8, improving the efficiency of the memory module 8 insertion test. Furthermore, the length and shape of the receiving groove 12 and the slot 11 are not specifically limited and can be designed according to actual application requirements.

[0044] In the embodiments of this utility model, please refer to Figure 4 and Figure 5The concave-convex structure 5 includes a engaging protrusion 51 and a engaging recess 52. The engaging protrusion 51 is selectively provided in one of the positioning block 4 and the test seat 1, while the engaging recess 52 is selectively provided in the other. That is, one of the positioning block 4 and the test seat 1 can be provided with the engaging protrusion 51, and correspondingly, the other of the positioning block 4 and the test seat 1 is provided with the engaging recess 52. The engaging protrusion 51 can be a raised edge or a cylindrical protrusion, while the engaging recess 52 is a corresponding groove or concave space. When the positioning block 4 is installed at the end of the test seat 1, the engaging protrusion 51 inserts into the engaging recess 52, achieving a tight fit between the positioning block 4 and the test seat 1.

[0045] In the embodiments of this utility model, please refer to Figure 4 and Figure 5 Both the positioning block 4 and the test base 1 are provided with threaded holes 41. A bolt is threaded into the threaded holes 41 to fix the test base 1 and the positioning block 4. After the positioning block 4 and the test base 1 are snapped together, in order to further increase the connection strength, a threaded hole 41 can be provided at the center position of the positioning block 4 and the test base 1. The bolt is threaded into the threaded hole 41 to firmly fix the test base 1 and the positioning block 4, which enhances the stability of the overall structure. During the installation process, the bolt passes through the threaded hole 41 on the positioning block 4 and then screws into the threaded hole 41 on the test base 1. The positioning block 4 is fixed by tightening the bolt. In specific implementation, if the size of the memory module 8 is different, the position of the positioning block 4 can be finely adjusted by adjusting the tightness of the bolt to adapt to different testing requirements.

[0046] In the embodiments of this utility model, please refer to Figure 5 The positioning block 4 has a guide groove 42, which is located on the side of the positioning block 4 facing the slot 11. When the memory module 8 is inserted into the slot 11, the end of the memory module 8 is located within the guide groove 42. The guide groove 42 is a groove structure on the positioning block 4 facing the slot 11, used to guide the end of the memory module 8 into the slot 11. The bottom of the guide groove 42 can be a smooth curve or a straight line to guide the end of the memory module 8 smoothly into the slot 11; the two side walls of the groove can be designed to be vertical or slightly inclined to provide additional guidance and protection.

[0047] In the embodiments of this utility model, please refer to Figure 2 and Figure 5The inner diameter of the guide groove 42 gradually decreases from the end furthest from the test socket 1 to the end closest to the test socket 1. Thus, the groove is conical in shape, and its inner diameter gradually decreases along the insertion direction of the memory module 8. When the end of the memory module 8 is first inserted, it is surrounded by a large groove space. As the memory module 8 is inserted deeper, the internal space of the groove gradually decreases, forming a smooth guide surface. This reduces friction and resistance during insertion of the memory module 8, making insertion smoother.

[0048] In the embodiments of this utility model, please refer to Figure 5 The positioning block 4 has an extending inclined surface 43, which is located on the side of the positioning block 4 facing the memory module 8 to guide the memory module 8 into the guide groove 42. The extending inclined surface 43 can be a plane that gradually slopes from the outside of the positioning block 4 towards the guide groove 42. The inclination angle and length of this inclined surface are set according to the shape and size of the memory module 8 to ensure that the memory module 8 can smoothly transition from one side of the positioning block 4 into the guide groove 42 along the inclined surface, optimizing the insertion process of the memory module 8. This inclined surface setting provides a clear path for the memory module 8 during insertion, while providing sufficient space to accommodate the insertion angle of the memory module 8. The surface of the extending inclined surface 43 can be designed to be smooth to reduce friction, and a special coating can be added to the surface of the inclined surface to improve wear resistance and reduce noise during the insertion of the memory module 8.

[0049] In the embodiments of this utility model, please refer to Figure 6 The receiving slot 12 includes two sub-slots 121 spaced apart along the length of the test socket 1; the test device 100 also includes a limiting block 6, which is disposed between the two sub-slots 121, and at least a portion of the limiting block 6 extends into the slot 11. The limiting block 6 can be an L-shaped or T-shaped block structure, with one part fixed between the two sub-slots 121 and the other part extending into the slot 11. The extended portion of the limiting block 6 can be a protrusion that matches the shape of the groove on the memory module 8, so that when the memory module 8 is inserted, the memory module 8 can only be fully inserted into the slot 11 when the groove and the protrusion are correctly aligned. The setting of the limiting block 6 can restrict the installation direction and position of the memory module 8 and prevent the memory module 8 from being inserted backwards.

[0050] In the embodiments of this utility model, please refer to Figure 6The test socket 1 is also provided with two limiting holes 13 spaced apart along its width, and the two ends of the limiting block 6 are respectively fixed in the limiting holes 13. In this way, only two small limiting holes 13 need to be made on the test socket 1, avoiding the need for a large through hole to pass through the test socket 1, and ensuring that the structural strength of the test socket 1 is not significantly damaged. The limiting holes 13 can be circular or rectangular, and their size is slightly larger than the fixed part of the limiting block 6 to ensure that the limiting block 6 can be smoothly inserted and fixed. The two ends of the limiting block 6 are respectively fixed in the limiting holes 13 to limit the position of the memory module 8 and ensure that it is correctly aligned with the terminal assembly 3 during insertion.

[0051] In the embodiments of this utility model, please refer to Figure 5 The slot 11 has a guide ramp 111 at its opening, and the diameter of the slot 11 gradually increases from the end near the terminal assembly 3 to the end away from the terminal assembly 3. The guide ramp 111 is a ramp provided at the opening of the slot 11 to guide the memory module 8 smoothly into the slot 11. This ramp is usually located at the entrance of the slot 11, and its inclination angle and length are designed according to the shape and size of the memory module 8 to ensure that the memory module 8 can slide smoothly into the slot. For example, the guide ramp 111 can be set as a 45-degree ramp, and its length is sufficient to cover the initial stage when the memory module 8 is inserted. This design allows the memory module 8 to first contact the guide ramp 111 when inserted, and then smoothly slide into the slot 11 until its gold fingers are aligned with the contact points of the terminal assembly 3.

[0052] In the embodiments of this utility model, please refer to Figure 1 and Figure 2 The testing device 100 also includes a push rod assembly 7, which is rotatably mounted at the end of the testing base 1. The push rod assembly 7 can be designed as an L-shaped or T-shaped metal arm, with one end fixed to the end of the testing base 1 and the other end forming the end of the slot 11. The rotation of the push rod assembly 7 can be achieved manually or automatically. For example, the push rod assembly 7 includes a push rod, a positioning pin, a bearing, etc. The proximal end of the push rod near the memory module 8 extends into the receiving slot 12 and abuts against the bottom surface of the memory module 8. The bearing is installed at the distal end of the push rod away from the memory module 8. After testing, the pressure head on the external device rolls and rubs against the bearing, pressing down on the distal end of the push rod while the proximal end of the push rod moves upward to eject the memory module 8. The positioning pin passes through the end of the testing base 1 and rotates synchronously with the positioning pin when the push rod is subjected to downward pressure. Optionally, the push rod assembly 7 also includes a spring, which is installed on the side of the push rod facing the memory module 8 to reset the memory module 8 after it is ejected.

[0053] The above description is merely an exemplary embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structural transformations made based on the technical concept of the present utility model and the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.

Claims

1. A testing device for use with a circuit board, characterized in that, The testing apparatus includes: The test socket has a connected receiving slot and a slot for inserting a memory module; A terminal assembly is disposed within the receiving slot and is used for electrically connecting the memory module and the circuit board; A positioning block, installed at the end of the test fixture; and A concave-convex structure is provided between the positioning block and the test seat, and the positioning block and the test seat are engaged by the concave-convex structure.

2. The testing apparatus as described in claim 1, characterized in that, The concave-convex structure includes a matching snap-fit ​​protrusion and a snap-fit ​​recess. The snap-fit ​​protrusion is provided in one of the positioning block and the test seat, and the snap-fit ​​recess is provided in the other.

3. The testing apparatus as described in claim 1, characterized in that, Both the positioning block and the test seat are provided with threaded holes, and the test seat and the positioning block are fixed by threading a bolt into the threaded holes.

4. The testing apparatus as described in claim 1, characterized in that, The positioning block is provided with a guide groove, which is located on the side of the positioning block facing the slot, and the end of the memory module is located in the guide groove when the memory module is inserted into the slot.

5. The testing apparatus as described in claim 4, characterized in that, The inner diameter of the guide groove gradually decreases from the end furthest from the test seat to the end closest to the test seat.

6. The testing apparatus as described in claim 5, characterized in that, The positioning block is provided with an extended inclined surface, which is located on one side of the positioning block facing the memory module, so as to guide the memory module to be inserted into the guide groove.

7. The testing apparatus as described in claim 1, characterized in that, The receiving slot includes two sub-slots spaced apart along the length of the test seat; the test device also includes a limiting block disposed between the two sub-slots, and at least a portion of the limiting block extends into the slot.

8. The testing apparatus as described in claim 7, characterized in that, The test stand is also provided with two limiting holes spaced apart along its width direction, and the two ends of the limiting block are respectively fixed in the limiting holes.

9. The testing apparatus as described in any one of claims 1 to 8, characterized in that, The slot has a guide slope at the opening, and the diameter of the slot opening gradually increases from the end closer to the terminal assembly to the end farther away from the terminal assembly.

10. The testing apparatus as described in any one of claims 1 to 8, characterized in that, The testing device also includes a push rod assembly, which is rotatably mounted at the end of the testing seat.

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