Precise semiconductor part high-voltage test fixture

Abstract

The utility model discloses a precision semiconductor part high-voltage test fixture, and belongs to the technical field of semiconductor high-voltage test, the precision semiconductor part high-voltage test fixture comprises a main body module and a reciprocating pressing module, the main body module comprises a support frame, and the top of the support frame is fixedly connected with two hollow plates; a high-pressure detector main body is slidably connected between the interiors of the two hollow plates, springs are fixedly connected between the high-pressure detector main body and the bottoms of the inner walls of the two hollow plates, and the reciprocating pressing module comprises two mechanical adjusting assemblies arranged on the two hollow plates correspondingly; through the arrangement of the driving assembly, the transverse push rod, the hollow T-shaped frame and the high-pressure detector main body, the mechanical adjusting assembly can be directly adjusted by a worker, so that the descending height of the high-pressure detector main body is changed, lifting tests with different requirements are facilitated, the mechanical adjusting mode is more direct and clear, and the working efficiency is improved. And therefore, the whole device is more convenient for workers to operate.

Description

TECHNICAL FIELD

[0001] The application relates to the technical field of semiconductor high-voltage testing, in particular to a precision semiconductor part high-voltage testing fixture. BACKGROUND

[0002] Semiconductor parts are various basic components constituting semiconductor devices and related manufacturing, testing and packaging systems, and play a key role in various links of the semiconductor industry. In the production process of semiconductor devices, a series of complex and tedious detection needs to be performed on the semiconductor devices, for example, high-voltage detection is an indispensable part.

[0003] According to the search, the patent No. CN214539872U discloses a semiconductor high-voltage testing fixture, which comprises a mounting frame, a base, an electric hydraulic push rod, a high-voltage tester and a limiting plate. The high-voltage tester is fixedly installed in the inner side of the fixed frame through bolts. The output end of the high-voltage tester is uniformly fixedly installed with a test probe penetrating through the fixed frame through bolts. The two sides of the bottom of the fixed frame are fixedly installed with telescopic springs through bolts. The bottom of the telescopic spring is fixedly installed with a limiting plate through bolts. The end of the test probe away from the high-voltage tester penetrates through the limiting plate. The limiting plate is expanded by the telescopic spring, so as to expand the distance between the limiting plate and the fixed frame. At the same time, the test probe is retracted to the inside of the limiting plate. The test probe is protected by the limiting plate, which avoids the danger of touching the test probe by the staff and prevents the test probe from being damaged due to collision, thereby ensuring the sensitivity of the test probe.

[0004] For the related technology in the above, the high-voltage detection device can realize the detection of the semiconductor parts. However, since the electric push rod is used to realize the lifting of the semiconductor parts, the lifting process of the cylinder is fixed each time, and the lifting height is uniform each time. However, when the probe needs to be lifted to different heights for testing, the staff needs to adjust the electric push rod by numerical control, change the parameters and change the lifting height. However, such adjustment is not convenient to operate, the adjustment process is complex, the adjustment is not simple and clear, and the machine is not easy to use. Therefore, we propose a precision semiconductor part high-voltage testing fixture. Content of the utility model

[0005] In order to solve the above problems, the application provides a precision semiconductor part high-voltage testing fixture, which adopts the following technical scheme:

[0006] The utility model provides a kind of precision semiconductor parts high pressure test fixture, including main module and reciprocating down module, the main module includes support frame, the top of the support frame is fixedly connected with two hollow plates, the inside of two the hollow plate is slidably connected with high pressure detector main body, the bottom of the high pressure detector main body and the inner wall of two hollow plates are fixedly connected with spring, the reciprocating down module includes two mechanical adjustment components respectively arranged on two hollow plates, transverse push rod is arranged between two the mechanical adjustment components, the top of the high pressure detector main body is fixedly connected with hollow T-shaped frame, the transverse push rod is movably connected in the inside of hollow T-shaped frame, the side of two the hollow plate is away from each other is provided with drive assembly, two the drive assembly is respectively matched with two mechanical adjustment components, the two sides between the inner wall of the support frame are provided with conveying assembly connected with drive assembly, conveying assembly is connected with multiple fixed seats on it.

[0007] Further, the mechanical adjustment component includes a central rod rotatably connected inside one of the hollow plates, one end of the central rod is fixedly connected with a flip disc, one side of the flip disc is provided with a strip-shaped slot, a threaded rod is rotatably connected inside the strip-shaped slot, the threaded rod extends outside the flip disc, one side of the flip disc is provided with a plurality of numerical grooves, and the plurality of numerical grooves are located above the threaded rod.

[0008] Further, the mechanical adjustment component further includes a ratchet fixedly connected to the outer surface of the central rod, one side of one of the hollow plates is movably connected with a thorn, one end of the thorn is movably connected to the outer surface of the ratchet, and the other end of the central rod is fixedly connected with a first pinion.

[0009] Further, the transverse push rod is slidably connected inside the strip-shaped slot, and the transverse push rod is threadedly connected to the outer surface of the threaded rod.

[0010] Further, the drive assembly includes a drive motor fixedly installed on one side of one of the hollow plates, an output shaft of the drive motor is fixedly connected with an incomplete gear, an outer surface of the incomplete gear is adapted to an outer surface of the first pinion, one of the hollow plates is fixedly connected with a mounting block, one side of the mounting block is fixedly connected with a rotating rod, an outer surface of the rotating rod is fixedly connected with a second pinion, and the second pinion is adapted to the outer surface of the incomplete gear.

[0011] Further, the conveying assembly includes two conveying rollers rotatably connected between the inner walls of the support frame, a conveying belt is drivingly connected between the outer surfaces of the two conveying rollers, multiple fixed seats are fixedly connected to the outer surface of the conveying belt, a support plate is fixedly connected between the two sides of the inner wall of the support frame, and the top of the support plate is in contact with the top of the inner surface of the conveying belt.

[0012] Further, the conveying assembly further comprises two transmission rollers respectively fixedly connected to one end of one of the conveying rollers and the outer surface of the rotating rod, and the outer surfaces of the two transmission rollers are drivingly connected with a transmission belt.

[0013] To sum up, the present application has the following beneficial technical effects:

[0014] (1) The present application sets the driving assembly, the horizontal push rod, the hollow T-shaped frame and the high-voltage detector body, so that the mechanical adjustment assembly can be directly adjusted by the staff, thereby changing the descending height of the high-voltage detector body, facilitating the lifting test of different needs, and the mechanical adjustment mode is more direct and clear, thereby making the whole more convenient for the staff to operate.

[0015] (2) The present application sets the conveying assembly, which can cooperate with the mechanical adjustment assembly, so that the conveying assembly does not need additional driving facilities for driving, reduces the overall cost, and at the same time enables the two components to cooperate with each other, and the whole can be more coherent. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is the overall structure schematic diagram of the present application;

[0017] Figure 2 It is the overall cross-sectional structure schematic diagram of the present application;

[0018] Figure 3 It is the mechanical adjustment assembly structure schematic diagram of the present application;

[0019] Figure 4 It is the explosion structure schematic diagram of the driving assembly of the present application;

[0020] Figure 5 It is the Figure 4 enlarged structure schematic diagram of A in the present application.

[0021] Explanation of reference numerals in the drawing:

[0022] 100, main body module; 110, support frame; 120, hollow plate; 130, high-voltage detector body; 140, spring;

[0023] 200, reciprocating pressing module; 210, mechanical adjustment assembly; 211, center rod; 212, turnover disc; 213, threaded rod; 214, numerical groove; 215, ratchet wheel; 216, ratchet; 217, first pinion; 220, horizontal push rod; 230, hollow T-shaped frame; 240, driving assembly; 241, driving motor; 242, incomplete gear; 243, rotating rod; 244, second pinion; 250, conveying assembly; 251, conveying roller; 252, conveying belt; 253, support plate; 254, transmission roller; 255, transmission belt; 260, fixed seat. DETAILED DESCRIPTION

[0024] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative work fall within the protection scope of the present application.

[0025] In the description of the present application, it should be noted that the terms "upper", "lower", "inner", "outer", "top / bottom end" and the like indicate the orientation or positional relationship shown in the drawings, and are only used for the purpose of facilitating the description of the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0026] In the description of the present application, it should be noted that unless otherwise explicitly specified and limited, the terms "mounting", "provided with", "sleeved / connected", "connected" and the like should be understood in a broad sense. For example, "connected" can be fixedly connected, or can be detachably connected, or integrally connected; can be mechanically connected, or can be electrically connected; can be directly connected, or can be indirectly connected through an intermediate medium; can be the communication inside two elements. For a person of ordinary skill in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0027] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative work fall within the protection scope of the present application. Figures 1-5 The present application will be further described in detail.

[0028] Please refer to Figures 1-5The utility model provides a kind of precision semiconductor parts high pressure test fixture, including main module 100 and reciprocating down module 200, main module 100 includes support frame 110, the top of support frame 110 is fixedly connected with two hollow plates 120, the inside of two hollow plates 120 is slidably connected with high pressure detector main body 130, high pressure detector main body 130 is fixedly connected with spring 140 between the bottom of two hollow plates 120 inner wall, reciprocating down module 200 includes two mechanical adjustment assemblies 210 respectively arranged on two hollow plates 120, transverse push rod 220 is arranged between two mechanical adjustment assemblies 210, hollow T-shaped frame 230 is fixedly connected to the top of high pressure detector main body 130, transverse push rod 220 is movably connected in the inside of hollow T-shaped frame 230, the opposite side of two hollow plates 120 is uniformly provided with drive assembly 240, two drive assemblies 240 are respectively matched with two mechanical adjustment assemblies 210, the two sides between the inner wall of support frame 110 are provided with conveying assembly 250 connected with drive assembly 240, conveying assembly 250 is connected with a plurality of fixed seats 260.

[0029] In use, the staff will need to be placed into the fixed seat 260 inside semiconductor parts of high pressure detection, then staff opens two drive assemblies 240, one of drive assemblies 240 will first drive conveying assembly 250, conveying assembly 250 will be tested semiconductor parts of need to move to the below of high pressure detector main body 130, then two drive assemblies 240 drive two mechanical adjustment assemblies 210, two mechanical adjustment assemblies 210 will drive high pressure detector main body 130 to rise, descend and rise movement, when high pressure detector main body 130 is tested semiconductor parts, after testing one of drive assemblies 240 continues to drive another set of semiconductor parts moves to the below of high pressure detector main body 130, continue to carry out cyclic test, and mechanical adjustment assembly 210 can be directly adjusted by staff, to change the lifting height of high pressure detector main body 130 driven by, to make the whole more convenient to operate.

[0030] The mechanical adjustment assembly 210 comprises a center rod 211 rotatably connected inside one of the hollow plates 120, one end of the center rod 211 is fixedly connected with a turnover disc 212, one side of the turnover disc 212 is provided with a strip-shaped groove, a threaded rod 213 is rotatably connected inside the strip-shaped groove, the threaded rod 213 extends to the outside of the turnover disc 212, a plurality of numerical grooves 214 are formed in one side of the turnover disc 212, and the plurality of numerical grooves 214 are located above the threaded rod 213; the mechanical adjustment assembly 210 further comprises a ratchet wheel 215 fixedly connected to the outer surface of the center rod 211, one side of one of the hollow plates 120 is movably connected with a ratchet 216, one end of the ratchet 216 is movably connected to the outer surface of the ratchet wheel 215, the other end of the center rod 211 is fixedly connected with a first pinion 217, a horizontal push rod 220 is slidably connected inside the strip-shaped groove, and the horizontal push rod 220 is threadedly connected to the outer surface of the threaded rod 213; the driving assembly 240 comprises a driving motor 241 fixedly installed on one side of one of the hollow plates 120, an output shaft of the driving motor 241 is fixedly connected with an incomplete gear 242, the outer surface of the incomplete gear 242 is matched with the outer surface of the first pinion 217, and one of the hollow plates 120 is fixedly connected with a mounting block, one side of the mounting block is fixedly connected with a rotating rod 243, the outer surface of the rotating rod 243 is fixedly connected with a second pinion 244, and the second pinion 244 is matched with the outer surface of the incomplete gear 242.

[0031] The two incomplete gears 242 drive the two first pinions 217, the two first pinions 217 drive the center rod 211 and the turnover disc 212 to rotate, the turnover disc 212 drives the hollow T-shaped frame 230 to move and drive the hollow T-shaped frame 230 through the horizontal push rod 220, at this time, the ratchet 216 moves on the outer surface of the ratchet wheel 215, the hollow T-shaped frame 230 drives the high-voltage detector main body 130 to move upwards, downwards and upwards, the semiconductor parts are tested when the high-voltage detector main body 130 moves downwards, the center rod 211 is locked through the ratchet wheel 215 and the ratchet 216 when the high-voltage detector main body 130 resets, after the test is completed, one of the incomplete gears 242 continues to drive the second pinion 244, so that another group of semiconductor parts moves to the lower side of the high-voltage detector main body 130, and the cycle test is continued, and before use, the threaded rod 213 can be rotated to drive the horizontal push rod 220 to move, and the horizontal push rod 220 changes the position in the hollow T-shaped frame 230, thereby changing the height of the subsequent transmission high-voltage detector main body 130, so as to facilitate different needs of lifting test, and the mechanical adjustment assembly 210 can be directly adjusted by the staff, thereby making the whole more convenient to operate.

[0032] The conveying assembly 250 comprises two conveying rollers 251, each rotatably connected between the inner walls of the support frame 110, and a conveying belt 252 drivingly connected between the outer surfaces of the two conveying rollers 251, a plurality of fixing seats 260 are fixedly connected to the outer surface of the conveying belt 252, a support plate 253 is fixedly connected between the inner walls of the support frame 110, the top of the support plate 253 is in contact with the top of the inner surface of the conveying belt 252, and the conveying assembly 250 further comprises two driving rollers 254, each fixedly connected to one end of one of the conveying rollers 251 and the outer surface of the rotating rod 243, and a transmission belt 255 drivingly connected between the outer surfaces of the two driving rollers 254.

[0033] When the two driving motors 241 are turned on, the driving motors 241 will drive the incomplete gear 242 to rotate, and when the incomplete gear 242 rotates, it will first drive the second pinion 244 to rotate, and then drive the rotating rod 243 to rotate through the second pinion 244, and then drive one of the conveying rollers 251 to rotate through the transmission belt 255, and then drive the conveying belt 252 to roll through the conveying roller 251, and then drive one group of semiconductor parts to be tested to move to the lower side of the high-voltage detector main body 130.

[0034] The implementation principle of the embodiment of the present application is: in use, the worker puts the semiconductor parts that need to be tested into the inside of the fixed seat 260, then the worker turns on the two drive motors 241, the drive motors 241 will drive the incomplete gears 242 to rotate, when the incomplete gears 242 rotate, they will first drive the second pinions 244, the second pinions 244 drive the rotating rods 243 to rotate, one of the conveying rollers 251 is driven to rotate through the transmission belt 255, the conveying roller 251 drives the conveying belt 252 to roll, so that the conveying belt 252 drives a group of semiconductor parts that need to be tested to move below the high-voltage detector main body 130, then the two incomplete gears 242 drive the two first pinions 217, the first pinions 217 will drive the center rod 211 and the turnover disc 212 to rotate, the turnover disc 212 drives the hollow T-shaped frame 230 to move in the hollow T-shaped frame 230 through the horizontal push rod 220 and drives the hollow T-shaped frame 230, at this time the thorn 216 moves on the outer surface of the ratchet wheel 215, the hollow T-shaped frame 230 will drive the high-voltage detector main body 130 to move up, down and up, when the high-voltage detector main body 130 descends, the semiconductor parts are tested, when the high-voltage detector main body 130 resets, the center rod 211 is locked through the ratchet wheel 215 and the thorn 216, after the test is completed, one of the incomplete gears 242 continues to drive the second pinion 244, so that another group of semiconductor parts moves below the high-voltage detector main body 130, and the cycle test is continued, and before use, the horizontal push rod 220 can be moved by rotating the threaded rod 213 to drive the horizontal push rod 220 to move, and the horizontal push rod 220 will change position in the hollow T-shaped frame 230, thereby changing the height of the subsequent transmission high-voltage detector main body 130, facilitating different needs of lifting test, the mechanical adjustment assembly 210 can be directly adjusted by the worker, thereby making the whole more convenient to operate.

[0035] The above are preferred embodiments of the present application, and do not limit the protection scope of the present application, therefore: equivalent changes made according to the structure, shape, principle of the present application should be covered within the protection scope of the present application.

Claims

1. A precision semiconductor component high-voltage test fixture, comprising a main body module (100) and a reciprocating pressing module (200), characterized in that: The main module (100) includes a support frame (110), the top of the support frame (110) is fixedly connected with two hollow plates (120), the interiors of the two hollow plates (120) are slidably connected with a high-voltage detector main body (130), and the high-voltage detector main body (130) is fixedly connected with springs (140) at the bottoms of the inner walls of the two hollow plates (120). The reciprocating downward pressing module (200) includes two mechanical adjusting assemblies (210) arranged on the two hollow plates (120) respectively, a transverse push rod (220) is arranged between the two mechanical adjusting assemblies (210), the top of the high-voltage detector main body (130) is fixedly connected with a hollow T-shaped frame (230), the transverse push rod (220) is movably connected in the interior of the hollow T-shaped frame (230), and the sides, away from each other, of the two hollow plates (120) are both provided with driving assemblies (240), the two driving assemblies (240) are adapted to the two mechanical adjusting assemblies (210) respectively, and conveying assemblies (250) connected with the driving assemblies (240) are arranged between the two sides of the inner wall of the support frame (110), and a plurality of fixing bases (260) are connected to the conveying assemblies (250).

2. The high voltage testing fixture for precision semiconductor components according to claim 1, wherein: The mechanical adjusting assembly (210) includes a center rod (211) rotatably connected in the interior of one of the hollow plates (120), one end of the center rod (211) is fixedly connected with a turnover disc (212), one side of the turnover disc (212) is provided with a strip-shaped groove, the interior of the strip-shaped groove is rotatably connected with a threaded rod (213), the threaded rod (213) extends to the exterior of the turnover disc (212), and a plurality of numerical grooves (214) are formed in the side of the turnover disc (212), and the plurality of numerical grooves (214) are all located above the threaded rod (213).

3. The high voltage testing fixture for precision semiconductor components of claim 2, wherein: The mechanical adjusting assembly (210) further includes a ratchet wheel (215) fixedly connected to the outer surface of the center rod (211), one side of one of the hollow plates (120) is movably connected with a ratchet (216), one end of the ratchet (216) is movably connected to the outer surface of the ratchet wheel (215), and the other end of the center rod (211) is fixedly connected with a first pinion (217).

4. The high voltage testing fixture for precision semiconductor components of claim 3, wherein: The transverse push rod (220) is slidably connected in the interior of the strip-shaped groove, and the transverse push rod (220) is threadedly connected to the outer surface of the threaded rod (213).

5. The high voltage testing fixture for precision semiconductor components of claim 4, wherein: The driving assembly (240) includes a driving motor (241) fixedly installed on one side of one of the hollow plates (120), the output shaft of the driving motor (241) is fixedly connected with an incomplete gear (242), the outer surface of the incomplete gear (242) is adapted to the outer surface of the first pinion (217), one of the hollow plates (120) is fixedly connected with a mounting block, one side of the mounting block is fixedly connected with a rotating rod (243), the outer surface of the rotating rod (243) is fixedly connected with a second pinion (244), and the second pinion (244) is adapted to the outer surface of the incomplete gear (242).

6. The high voltage testing fixture for precision semiconductor components of claim 5, wherein: The conveying assembly (250) comprises two conveying rollers (251) rotatably connected between the inner walls of the support frame (110), the outer surfaces of the two conveying rollers (251) are drivingly connected with a conveying belt (252), a plurality of the fixing bases (260) are fixedly connected to the outer surface of the conveying belt (252), the inner walls of the support frame (110) are fixedly connected with a support plate (253), and the top of the support plate (253) is in contact with the top of the inner surface of the conveying belt (252).

7. The high voltage testing fixture for precision semiconductor components of claim 6, wherein: The conveying assembly (250) further comprises two transmission rollers (254) fixedly connected to one end of one of the conveying rollers (251) and the outer surface of the rotating rod (243) respectively, and the outer surfaces of the two transmission rollers (254) are drivingly connected with a transmission belt (255).

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