Discharge detection device
By using a small integrated discharge detection device with an all-optical non-metallic design, the problem of lacking integrated Rydberg atom detection for partial discharge in existing technologies has been solved, achieving sensitive and real-time detection of partial discharge, which is suitable for high-voltage equipment.
Patent Information
- Application Number
- CN202520431499.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-12
- Publication Date
- 2026-02-27
- Estimated Expiration
- 2035-03-12
AI Technical Summary
The lack of integrated Rydberg atom-based partial discharge detection products in the current technology limits their development and application in partial discharge signal detection.
A discharge detection device was designed, which adopts an all-optical non-metallic design and integrates a cesium atom gas chamber, a probe light introduction component, a probe light extraction component, and a coupling light introduction component into a small size. This achieves a sensitive response to electromagnetic fields and a large response bandwidth, and can be built into high-voltage equipment for in-situ, online, real-time detection.
It achieves sensitive detection of partial discharge phenomena, has a large response bandwidth, can monitor in real time without affecting high-voltage equipment, and has high-efficiency detection capabilities.
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Figure CN223955731U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to a discharge detection technical field especially, relate to a discharge detection device. BACKGROUND
[0002] Partial discharge refers to that when the electric field intensity exceeds the partial electric field tolerance limit of material, ionization phenomenon will occur in the micro area of insulating medium, and the electric charge will be discharged locally and temporarily, but the discharge is not enough to cause complete breakdown. Specifically, partial discharge usually occurs in the air gap inclusions or uneven edges of insulating materials. These areas reduce the partial breakdown voltage due to electric field distortion or weak electric concentration, so that discharge will occur under normal working voltage. Since partial discharge can accelerate the aging of surrounding insulating medium, it will eventually lead to insulation breakdown. If it is not discovered in time, it will cause serious damage to the power system. Therefore, timely detection of partial discharge signal is crucial.
[0003] At present, the methods for detecting partial discharge signals mainly include high-frequency current coupling method, ultrasonic method, chemical method, optical measurement method, UHF detection method, etc. The high-frequency current coupling method can directly provide electrical parameters and is suitable for quantitative analysis, but it is easy to be affected by electromagnetic interference and has low sensitivity; the ultrasonic detection method can accurately locate the partial discharge position, but the signal will be severely attenuated during propagation and will be affected by environmental noise; the chemical method can quantify the severity of partial discharge by detecting the gas composition near the insulator, but the measurement period is too long and cannot be detected in real time; the optical measurement method can be built into high-voltage equipment for detection, but the optical signal is linearly propagated and is easy to be blocked by obstacles; the UHF detection method can achieve high sensitivity, but the measurement bandwidth is limited by the size of the antenna, and the metal material cannot be built into high-voltage equipment for measurement. As can be seen, the traditional measurement methods still have some defects.
[0004] In recent years, the radio frequency field detection technology based on Rydberg atomic quantum effect has been continuously developed, and rich research results have been achieved in the field of microwave detection. Rydberg atom refers to an excited state atom with high principal quantum number. The higher the principal quantum number, the farther the electron is from the nucleus, so the Rydberg atom has many excellent properties, including sensitive response to external field, long radiation lifetime, maximum response bandwidth, and largest electric dipole transition dipole moment. These advantages make it have great application potential in the fields of quantum computing, quantum communication, quantum sensing, etc.
[0005] The basic principle of detecting partial discharge by Rydberg atom is shown in Figure 1 , taking cesium atom gas chamber 22 filled with cesium atoms as a sensing element, and 852nm wavelength detection light 103 excites cesium atoms from ground state (6S 1 / 2 ) to excited state (6P 3 / 2), the 510nm wavelength coupling light 104 will excite the cesium atom from the excited state (6P 3 / 2 ) to the Rydberg state, when the coupling light power is much stronger than the probe light power, the quantum destructive interference will occur, and the original absorption of the probe light becomes transparent to the probe light (EIT effect). At this time, the electromagnetic field 101 generated by the partial discharge acts on the cesium atom, and under the action of the external electromagnetic field, the cesium atom level moves (AC-Stark effect), thereby affecting the EIT phenomenon, and the absorption of the probe light changes again. By detecting the change of the probe light intensity, the partial discharge signal is detected.
[0006] However, there is no integrated product based on the principle of detecting partial discharge by Rydberg atom in the prior art, so its development and application are restricted.
[0007] Therefore, the utility model is proposed. Utility model content
[0008] To solve one of the above technical problems, the application embodiment provides a discharge detection device.
[0009] The utility model adopts the following technical scheme:
[0010] A discharge detection device comprises:
[0011] A carrier, which is an integral structure;
[0012] A cesium atom chamber, which is arranged in the middle of the carrier;
[0013] A probe light line introduction assembly, which is arranged in the carrier;
[0014] A probe light line introduction assembly, which is arranged in the carrier, and the probe light line introduction assembly and the probe light line introduction assembly are located on the opposite sides of the cesium atom chamber, and the probe light emitted from the probe light line introduction assembly is incident to the probe light line introduction assembly after passing through the cesium atom chamber;
[0015] A coupling light line introduction assembly, which is arranged in the carrier, and the coupling light line introduction assembly and the probe light line introduction assembly are located on the opposite sides of the cesium atom chamber, and the coupling light line introduction assembly and the probe light line introduction assembly are sequentially and spacedly arranged along the width direction of the carrier, and the light emitted from the coupling light line introduction assembly can be incident to the cesium atom chamber.
[0016] 7, optionally, the probe light line introduction assembly comprises:
[0017] A probe light sleeve collimator;
[0018] a probe light polarization maintaining optical fiber connected to the probe light jacketed collimator;
[0019] a probe light polarization beam splitting prism located between the probe light jacketed collimator and the cesium atom cell, the probe light emitted from the probe light jacketed collimator being incident to the cesium atom cell after passing through the probe light polarization beam splitting prism;
[0020] the coupling light line introduction assembly comprises:
[0021] a coupling light jacketed collimator located on the opposite side of the cesium atom cell from the probe light jacketed collimator;
[0022] a coupling light polarization maintaining optical fiber connected to the coupling light jacketed collimator;
[0023] a coupling light polarization beam splitting prism located between the coupling light jacketed collimator and the cesium atom cell, the probe light emitted from the coupling light jacketed collimator being incident to the cesium atom cell after passing through the coupling light polarization beam splitting prism.
[0024] Optionally, the probe light line introduction assembly and the probe light line introduction assembly are located on opposite sides of the cesium atom cell;
[0025] the probe light line introduction assembly comprises a first dichroic mirror, an introduction high reflection lens, an introduction jacketed collimator and an introduction polarization maintaining optical fiber, the introduction jacketed collimator and the introduction polarization maintaining optical fiber being connected;
[0026] the probe light emitted from the cesium atom cell is reflected to the introduction high reflection lens via the first dichroic mirror, and is reflected to the introduction jacketed collimator via the introduction high reflection lens;
[0027] wherein the beam waist position of the probe light emitted from the probe light jacketed collimator is located at a middle position of the light path from the probe light jacketed collimator to the introduction jacketed collimator.
[0028] Optionally, the beam waist position of the probe light is coincident with the center of the cesium atom cell.
[0029] Optionally, the discharge detection device comprises a probe light detection assembly;
[0030] the probe light detection assembly is arranged on the carrier;
[0031] the probe light detection assembly comprises a probe light polarization beam splitting prism, a probe light high reflection mirror, a probe light detection jacketed collimator and a probe light detection polarization maintaining optical fiber, the probe light detection jacketed collimator and the probe light detection polarization maintaining optical fiber being connected;
[0032] The probe light beam splitter prism is located between the probe light polarization beam splitter prism and the cesium atom cell;
[0033] The probe light detection sleeve collimator and the probe light sleeve collimator are parallel;
[0034] After the probe light beam is incident to the probe light polarization beam splitter prism and then to the probe light beam splitter prism, part of the light beam is reflected to the probe light high reflector and then to the probe light detection sleeve collimator, and part of the light beam is incident to the cesium atom cell.
[0035] Optionally, the probe light beam splitter prism and the probe light high reflector are symmetrically arranged with a first symmetry line as a center line;
[0036] In a direction along the first symmetry line, the distance between the probe light sleeve collimator and the probe light beam splitter prism is greater than the distance between the probe light detection sleeve collimator and the probe light high reflector.
[0037] Optionally, the discharge detection device comprises a coupling light detection assembly;
[0038] The coupling light detection assembly is arranged on the carrier;
[0039] The coupling light detection assembly comprises a coupling light beam splitter prism, a coupling light high reflector, a coupling light detection sleeve collimator and a coupling light detection polarization maintaining optical fiber, and the coupling light detection sleeve collimator and the coupling light detection polarization maintaining optical fiber are connected;
[0040] The coupling light beam splitter prism is located between the coupling light polarization beam splitter prism and the cesium atom cell;
[0041] After the coupling light beam is incident to the coupling light polarization beam splitter prism and then to the coupling light beam splitter prism, part of the light beam is reflected to the coupling light high reflector and then to the coupling light detection sleeve collimator, and part of the light beam is incident to the cesium atom cell.
[0042] Optionally, the coupling light beam splitter prism and the coupling light high reflector are symmetrically arranged with a second symmetry line as a center line;
[0043] In a direction along the second symmetry line, the distance between the coupling light beam sleeve collimator and the coupling light beam splitter prism is greater than the distance between the coupling light detection sleeve collimator and the coupling light high reflector.
[0044] Optionally, the full-optical partial discharge detection device comprises a first light blocking plate and a second light blocking plate;
[0045] The first light blocking plate and the second light blocking plate are arranged on the carrier;
[0046] The first light barrier and the second light barrier are arranged on two sides of the cesium atom cell respectively.
[0047] The coupling light emitted by the cesium atom cell is incident on the first light barrier.
[0048] Two light beams emitted by the coupling light polarization beam splitter, one of which is incident on the cesium atom cell, and the other of which is incident on the second light barrier.
[0049] Optionally, the all-optical partial discharge detection device comprises a second dichroic mirror.
[0050] The second dichroic mirror is arranged on the carrier, and is located between the detection light beam splitter and the cesium atom cell.
[0051] The first dichroic mirror is arranged between the coupling light beam splitter and the cesium atom cell, and transmits the coupling light beam of the coupling light beam splitter.
[0052] By adopting the above technical scheme, the all-optical partial discharge detection device has the following beneficial effects:
[0053] The all-optical partial discharge detection device adopts all-optical non-metal design, and integrates the cesium atom cell, a detection light beam introduction assembly, a detection light beam extraction assembly and a coupling light beam introduction assembly.
[0054] The specific embodiments of the all-optical partial discharge detection device will be further described in detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS
[0055] The accompanying drawings are part of the present application and serve to provide a further understanding of the all-optical partial discharge detection device, and the schematic embodiments and the descriptions thereof serve to explain the all-optical partial discharge detection device, but do not constitute an improper limitation on the all-optical partial discharge detection device. Obviously, the accompanying drawings described below are only some embodiments, and other drawings can be obtained by those skilled in the art without creative labor. In the accompanying drawings:
[0056] Figure 1 A principle diagram of the all-optical partial discharge monitoring based on Rydberg atoms is shown.
[0057] Figure 2 A structure schematic diagram of the discharge detection device provided by the embodiment of the application is shown.
[0058] Figure 3 An EIT signal spectrum diagram measured by the detection light output by the detection light lead-out assembly of the discharge detection device provided by the embodiment of the application is shown.
[0059] In the figure: 1, detection light polarization maintaining optical fiber; 2, detection light detection polarization maintaining optical fiber; 3, lead-out polarization maintaining optical fiber; 4, coupling light detection polarization maintaining optical fiber; 5, coupling light polarization maintaining optical fiber; 6, detection light sleeve collimator; 7, detection light detection sleeve collimator; 8, lead-out sleeve collimator; 9, coupling light detection sleeve collimator; 10, coupling light sleeve collimator; 11, detection light polarization beam splitter prism; 12, coupling light polarization beam splitter prism; 13, detection light beam splitter prism; 14, coupling light beam splitter prism; 15, detection light high reflection mirror; 16, coupling light high reflection mirror; 17, coupling light high reflection mirror; 18, second dichroic mirror; 19, first dichroic mirror; 20, second light barrier; 21, first light barrier; 22, cesium atom cell; 23, carrier; 101, electromagnetic field; 103, detection light; 104, coupling light.
[0060] It should be noted that the drawings and the written description are not intended to limit the scope of the present application in any way, but are merely to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION
[0061] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the technical scheme in the embodiments will be described clearly and completely below in conjunction with the drawings of the embodiments of the present application, and the following embodiments are used to illustrate the present application, but not to limit the scope of the present application.
[0062] In the description of the present application, it should be noted that the terms "upper", "lower", "inner", "outer" and the like indicate the orientation or positional relationship shown in the drawings, and are merely for the convenience of describing the present application and simplifying the description, and are not intended to indicate or imply that the devices or components referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.
[0063] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "mounting", "connection" should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrally connected; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through an intermediate medium. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.
[0064] See Figure 2 and Figure 3 As shown in the illustration, this application provides a discharge detection device, including: a carrier 23, a cesium atom gas chamber 22, a detection light introduction component, a detection light extraction component, and a coupling light introduction component. The carrier 23 is an integral structure. The cesium atom gas chamber 22 is disposed in the middle of the carrier 23. The detection light introduction component and the detection light extraction component are disposed on the carrier 23, located on opposite sides of the cesium atom gas chamber 22. Detection light emitted from the detection light introduction component passes through the cesium atom gas chamber 22 and then enters the detection light extraction component. The coupling light introduction component is disposed on the carrier 23, and the coupling light introduction component and the detection light introduction component are located on opposite sides of the cesium atom gas chamber 22, spaced apart sequentially along the width direction of the carrier 23. Light emitted through the coupling light introduction component (coupled light) can enter the cesium atom gas chamber 22.
[0065] In this embodiment of the application, the carrier 23 is an integral structure, which can be understood as the carrier 23 being an integrally molded part. The carrier 23 can also be an integral structure formed by multiple parts being fixed together by a connecting structure. In short, the carrier 23 cannot be composed of multiple separate parts.
[0066] The all-optical partial discharge detection device of this application adopts an all-optical non-metallic design, and integrates the cesium atom gas chamber 22, the detection beam introduction component, the detection beam extraction component, and the coupling beam introduction component into a small size. It is highly sensitive to the electromagnetic field 101 and has a large response bandwidth. It can be built into high-voltage equipment and can realize in-situ, online real-time detection of partial discharge phenomena without affecting the high-voltage equipment.
[0067] like Figure 2 As shown, the probe light introduction assembly includes: a probe light collimator 6, a probe light polarization-maintaining fiber 1, and a probe light polarization beam splitter 11. The probe light polarization-maintaining fiber 1 is connected to the probe light collimator 6, and the probe light polarization beam splitter 11 is located between the probe light collimator 6 and the cesium atom gas cell 22. The probe light emitted from the probe light collimator 6 passes through the probe light polarization beam splitter 11 and then enters the cesium atom gas cell 22.
[0068] The coupling light introduction assembly comprises a coupling light jacketed collimator 10, a coupling light polarization maintaining optical fiber 5 and a coupling light polarization beam splitter prism 12. The coupling light jacketed collimator and the probe light jacketed collimator are located on opposite sides of the cesium atom cell 22. The coupling light polarization maintaining optical fiber 5 is connected to the coupling light jacketed collimator 10, and the coupling light polarization beam splitter prism 12 is located between the coupling light jacketed collimator 10 and the cesium atom cell 22. The probe light emitted by the coupling light jacketed collimator 10 enters the cesium atom cell 22 after passing through the coupling light polarization beam splitter prism 12.
[0069] The probe light can be 852 nm probe light, the probe light jacketed collimator 6 is a 852 nm glass jacketed collimator, the probe light emitted by the 852 nm glass jacketed collimator (probe light jacketed collimator 6) is spatial light, and the spot diameter is about 200 μm. The probe light polarization maintaining optical fiber 1 is a 852 nm polarization maintaining optical fiber, and the probe light polarization beam splitter prism 11 can be a 852 nm PBS (polarization beam splitter prism). The coupling light can be 510 nm coupling light, the coupling light jacketed collimator 10 can be a 510 nm glass jacketed collimator, the coupling light polarization maintaining optical fiber 5 can be a 510 nm polarization maintaining optical fiber, and the coupling light polarization beam splitter prism 12 can be a 510 nm PBS (polarization beam splitter prism). The polarization beam splitter prism is used for purifying the polarization direction of the light, so that the polarization of the light is determined during the working process of the all-optical partial discharge detection device.
[0070] In some possible embodiments, the probe light introduction assembly and the probe light introduction assembly are located on opposite sides of the cesium atom cell 22, the probe light introduction assembly comprises a first dichroic mirror 19, an introduction high-refraction lens 16, an introduction jacketed collimator 8 and an introduction polarization maintaining optical fiber 3, the introduction jacketed collimator 8 and the introduction polarization maintaining optical fiber 3 are connected, the probe light emitted by the cesium atom cell 22 is reflected to the introduction high-refraction lens 16 through the first dichroic mirror 19, and then is reflected to the introduction jacketed collimator 8 through the introduction high-refraction lens 16, wherein the beam waist position of the probe light emitted by the probe light jacketed collimator 6 is located at the middle position of the light path from the probe light jacketed collimator 6 to the introduction jacketed collimator 8. The introduction polarization maintaining optical fiber 3 is used for connecting a detection device, and the detection device can detect a partial discharge signal by detecting the probe light signal emitted by the introduction polarization maintaining optical fiber 3. Figure 3 The EIT signal spectrum diagram obtained by detecting the probe light signal emitted by the introduction polarization maintaining optical fiber 3 of the detection device.
[0071] The beam waist position of the probe light rays exiting the probe light sleeve collimator 6 is the center of the geometric path of the spatial light propagation of the probe light in the EIT main light path. The light beams on both sides of the beam waist position are symmetrical, so that the spot diameters of the probe light rays at the probe light sleeve collimator 6 and the lead-out sleeve collimator 8 are equal, which is beneficial to achieve higher probe light utilization efficiency.
[0072] In some possible embodiments, the beam waist position of the probe light rays coincides with the center of the cesium atom cell 22. The arrangement of the structural members of the probe light lead-in assembly and the probe light lead-out assembly is configured such that the beam waist position of the probe light rays is located at the center of the cesium atom cell 22, the beam waist position is symmetrically expanded to both ends, the light rays are symmetrical, so that the spot diameters of the probe light at the sleeve collimator 6 and the lead-out sleeve collimator 8 are consistent, so that the lead-out sleeve collimator 8 has a higher coupling efficiency, thereby better utilizing the light rays and avoiding waste. By locating the beam waist position of the probe light rays at the center of the cesium atom cell 22, the distribution of the probe light rays in the cesium atom cell 22 is more symmetrical, which is beneficial to improve the reliability.
[0073] In some possible embodiments, the discharge detection device comprises a probe light detection assembly arranged on the carrier 23. The probe light detection assembly comprises a probe light beam splitter prism 13, a probe light high reflector 15, a probe light detection sleeve collimator 7, and a probe light detection polarization maintaining optical fiber 2. The probe light detection sleeve collimator 7 and the probe light detection polarization maintaining optical fiber 2 are connected. The probe light beam splitter prism 13 is located between the probe light polarization beam splitter prism 11 and the cesium atom cell 22. The probe light detection sleeve collimator 7 is parallel to the probe light sleeve collimator 6. After the probe light rays enter the probe light beam splitter prism 13 from the probe light polarization beam splitter prism 11, part of the light rays are reflected to the probe light high reflector 15 and then to the probe light detection sleeve collimator 7, and part of the light rays enter the cesium atom cell 22.
[0074] The output end of the probe light detection polarization maintaining optical fiber 2 can be connected to a power monitoring device for monitoring whether the power of the probe light rays is stable, thereby forming a power feedback mechanism. The probe light polarization maintaining optical fiber 1 can be connected to a probe light ray emitter. The power monitoring device can be in data connection with the probe light ray emitter. The power monitoring device is used to feed back the power change, and the probe light ray emitter adjusts in real time according to the power change, that is, PID control is realized, so that the power of the probe light rays is kept as constant as possible.
[0075] The probe light splitting prism 13 can be a BS (90:10) splitting prism for 852 nm, that is, 90% of the incident light can pass through the probe light splitting prism 13, and 10% of the light is reflected to the probe light high reflector 15. The probe light splitting prism 13 and the probe light high reflector 15 are both at an angle of 45 degrees with the first symmetry line. The probe light detection sleeve collimator 7 can be a 852 nm glass sleeve collimator, and the probe light detection polarization maintaining fiber 2 can be a 852 nm polarization maintaining fiber.
[0076] In some possible embodiments, the probe light splitting prism 13 and the probe light high reflector 15 are symmetrically arranged with the first symmetry line as the center line. In the direction along the first symmetry line, the distance between the probe light sleeve collimator 6 and the probe light splitting prism 13 is greater than the distance between the probe light detection sleeve collimator 7 and the probe light high reflector 15.
[0077] The probe light detection sleeve collimator 7 is closer to the cesium atom cell 22 than the probe light sleeve collimator 6. The probe light emitted by the probe light sleeve collimator 6 gradually decreases in spot diameter within a certain range (before the beam waist position). By arranging the probe light detection sleeve collimator 7 inward, although the probe light detection sleeve collimator 7 and the probe light sleeve collimator 6 cannot be aligned, the light is reduced in aggregation, so that the spot is not too thin before being coupled out.
[0078] In some possible embodiments, the discharge detection device comprises a coupling light detection assembly arranged on the carrier 23. The coupling light detection assembly comprises a coupling light splitting prism 14, a coupling light high reflector 17, a coupling light detection sleeve collimator 9, and a coupling light detection polarization maintaining fiber 4. The coupling light detection sleeve collimator 9 and the coupling light detection polarization maintaining fiber 4 are connected. The coupling light splitting prism 14 is located between the coupling light polarization splitting prism 12 and the cesium atom cell 22. After the coupling light is incident on the coupling light splitting prism 14 through the coupling light polarization splitting prism 12, part of the light is reflected to the coupling light high reflector 17 and is reflected to the coupling light detection sleeve collimator 9, and part of the light is incident on the cesium atom cell 22.
[0079] The coupling light detection assembly and the probe light detection assembly have substantially the same principle. The output end of the coupling light detection polarization maintaining fiber 4 can be connected to a power monitoring device for monitoring whether the power of the coupling light is stable, so as to form a power feedback mechanism. The coupling light polarization maintaining fiber 5 can be connected to a coupling light emitter. The power monitoring device can be in data connection with the coupling light emitter. The power monitoring device is used to feed back the power change, and the coupling light emitter adjusts in real time according to the power change, that is, PID control is realized, so that the power of the coupling light is kept as constant as possible.
[0080] The coupling light beam splitter 14 can be a 510nm BS (90:10) beam splitter, meaning that 90% of the incident light can pass through the coupling light beam splitter 14, and 10% of the light will be reflected to the coupling light high reflectivity mirror 17. Both the coupling light high reflectivity mirror 17 and the coupling light beam splitter 14 form an angle of 45 degrees with the second symmetry line. The coupling light detection sleeve collimator 9 can be a 510nm glass sleeve collimator, and the coupling light detection polarization-maintaining fiber 4 can be a 510nm polarization-maintaining fiber. The first symmetry line and the second symmetry line are parallel.
[0081] In some possible implementations, the coupling light beam splitter 14 and the coupling light high reflectivity mirror 17 are symmetrically arranged with a second line of symmetry as the center line. In the direction along the second line of symmetry, the distance between the coupling light sleeve collimator 10 and the coupling light beam splitter 14 is greater than the distance between the coupling light detection sleeve collimator 9 and the coupling light high reflectivity mirror 17.
[0082] The coupling light detection sleeve collimator 9 is closer to the cesium atom gas cell 22 than the coupling light ray sleeve collimator 10. The diameter of the coupled light emitted from the coupling light ray sleeve collimator 10 decreases within a certain range (up to the beam waist). By setting the coupling light detection sleeve collimator 9 further inward, although the coupling light detection sleeve collimator 9 and the coupling light ray sleeve collimator 10 are no longer aligned, the light convergence is reduced, so that the light spot is not too fine before coupling out.
[0083] In some possible implementations, such as Figure 2 As shown, the all-optical partial discharge detection device includes a first light-blocking plate 21 and a second light-blocking plate 20. Both the first light-blocking plate 21 and the second light-blocking plate 20 are disposed on the carrier 23. The first light-blocking plate 21 and the second light-blocking plate 20 are respectively disposed on both sides of the cesium atom gas chamber 22. The coupled light emitted from the cesium atom gas chamber 22 is incident on the first light-blocking plate 21. Of the two light rays emitted from the coupled light polarization beam splitter 12, one light ray (detection light ray) is directed toward the cesium atom gas chamber 22, and the other light ray is incident on the second light-blocking plate 20.
[0084] By setting the first light-blocking plate 21 and the second light-blocking plate 20, all light rays in the all-optical partial discharge detection device can be absorbed and blocked, and there will be no problem of light leakage.
[0085] In some possible solutions, the all-optical partial discharge detection device includes a second dichroic mirror 18 arranged on the carrier 23, located between the detection light beam splitter prism 13 and the cesium atom cell 22, and the detection light beam of the detection light beam splitter prism 13 is transmitted through the second dichroic mirror 18 to be incident on the cesium atom cell 22, and the coupling light beam emitted by the cesium atom cell 22 is reflected by the second dichroic mirror 18 to be incident on the first light barrier 21. A first dichroic mirror 19 is arranged between the coupling light beam splitter prism 14 and the cesium atom cell 22, and the coupling light beam of the coupling light beam splitter prism 14 is transmitted through the first dichroic mirror 19 to be incident on the cesium atom cell 22.
[0086] In this embodiment, the components on each carrier 23 are integrated, the second dichroic mirror 18 is arranged between the detection light beam splitter prism 13 and the cesium atom cell 22, and the first dichroic mirror 19 is arranged between the coupling light beam splitter prism 14 and the cesium atom cell 22, which makes full use of the space of the carrier 23, but at the same time, the problem of blocking light beams occurs. In view of this, the application selects a dichroic mirror to solve the corresponding problem and realizes compact integration design. Specifically, the second dichroic mirror 18 is a 852nm high-transmission 510nm high-reflection dichroic mirror, the detection light beam can pass through the second dichroic mirror 18 to be incident on the cesium atom cell 22, and the influence of the second dichroic mirror 18 on the detection light beam is very small. The second dichroic mirror 18 is located on the light path of the coupling light beam, and the coupling light beam emitted by the cesium atom cell 22 is reflected by the second dichroic mirror 18 to the first light barrier 21. Similarly, the first dichroic mirror 19 is a 510nm high-transmission 852nm high-reflection dichroic mirror, and the coupling light beam can directly transmit through the first dichroic mirror 19 to be incident on the cesium atom cell 22. The first dichroic mirror 19 is located on the light path of the detection light beam, and the detection light beam emitted by the cesium atom cell 22 can directly be incident on the first dichroic mirror 19, and the first dichroic mirror 19 reflects the detection light beam to the extraction high-reflection lens 16.
[0087] In the embodiment of the application, the 852nm detection light emitted by the detection light introduction assembly excites the cesium atoms in the cesium atom cell 22 from a ground state (6S 1 / 2 ) to an excited state (6P 3 / 2 ), and the 510nm coupling light passes through the cesium atom cell 22 to excite the cesium atoms from the excited state (6P 3 / 2) excitation to the Rydberg state, two light coincident reverse and polarization direction consistent through cesium atomic gas chamber 22, when the coupling light power is far stronger than the detection light power, quantum destructive interference will occur, so that the 852nm detection light will not be absorbed by the atom even at the resonant frequency (EIT effect), which is specifically manifested as the change of the detection light intensity after passing through the cesium atomic gas chamber 22. As shown in Figure 3 When the discharge detection device is placed in the electromagnetic field 101 generated by the partial discharge, the energy level of the cesium atom in the cesium atomic gas chamber 22 will move under the action of the external electromagnetic field 101 (AC-Stark effect), which will further affect the EIT phenomenon, which is specifically manifested as the change of the detection light intensity after passing through the cesium atomic gas chamber 22. By detecting the detection light signal emitted by the 852nm polarization maintaining optical fiber (outgoing polarization maintaining optical fiber 3), the partial discharge signal can be detected.
[0088] The above is only the preferred embodiment of the present application, and is not intended to limit the present application in any form. Although the present application has been disclosed as above with the preferred embodiment, it is not intended to limit the present application. Any skilled person in the art can make some changes or modifications to the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple modification, equivalent change and modification of the above-mentioned technical content without departing from the technical solution of the present application, and any simple
Claims
1. A discharge detecting device characterized by comprising: include: The carrier is an integral structure; A cesium atom gas chamber, wherein the cesium atom gas chamber is disposed in the middle of the carrier; A probe light introduction component is disposed on the carrier; A probe light extraction component is disposed on the carrier. The probe light extraction component and the probe light introduction component are located on opposite sides of the cesium atom gas chamber. The probe light emitted from the probe light introduction component passes through the cesium atom gas chamber and then enters the probe light extraction component. A coupling light introduction component is disposed on the carrier. The coupling light introduction component and the probe light introduction component are located on opposite sides of the cesium atom gas chamber. The coupling light introduction component and the probe light extraction component are arranged alternately along the width direction of the carrier. The light emitted through the coupling light introduction component can enter the cesium atom gas chamber.
2. The discharge detection apparatus according to claim 1, characterized by The probe light introduction component includes: Detection optical sleeve collimator; A probe optical polarization-maintaining fiber is connected to the probe optical sleeve collimator. A probe light polarization beam splitter is located between the probe light collimator and the cesium atom gas cell. The probe light emitted from the probe light collimator passes through the probe light polarization beam splitter and then enters the cesium atom gas cell. The coupling light introduction component includes: A coupling beam collimator and a probe beam collimator are located on opposite sides of the cesium atom gas cell; A coupling optical polarization-maintaining fiber, wherein the coupling optical polarization-maintaining fiber is connected to the coupling optical sleeving collimator; A coupled light polarization beam splitter is located between the coupled light tube collimator and the cesium atom gas cell. The probe light emitted from the coupled light tube collimator passes through the coupled light polarization beam splitter and then enters the cesium atom gas cell.
3. The discharge detection apparatus according to claim 2, characterized by The probe light extraction assembly includes: a first dichroic mirror, an extraction high-reflection lens, an extraction sleeve collimator, and an extraction polarization-maintaining fiber, wherein the extraction sleeve collimator and the extraction polarization-maintaining fiber are connected. The probe light emitted from the cesium atom gas cell is reflected by the first dichroic mirror to the high-reflection lens, and then reflected by the high-reflection lens to the collimator of the lead-out sleeve; The beam waist of the probe light emitted from the probe light sleeve collimator is located at the midpoint of the optical path from the probe light sleeve collimator to the lead-out sleeve collimator.
4. The discharge detection apparatus according to claim 3, characterized by The waist of the probe beam coincides with the center of the cesium atom gas chamber.
5. The electric discharge detecting apparatus according to claim 3, characterized by Including the detection light detection component; The detection light assembly is disposed on the carrier; The probe light detection assembly includes a probe light beam splitter prism, a probe light high reflectivity mirror, a probe light detection sleeve collimator, and a probe light detection polarization-maintaining fiber, wherein the probe light detection sleeve collimator and the probe light detection polarization-maintaining fiber are connected. The probe light beam splitter is located between the probe light polarization beam splitter and the cesium atom gas cell; The collimator of the detection light detection sleeve is parallel to the collimator of the detection light sleeve; The probe light is incident on the probe light beam splitter prism through the probe light polarizing beam splitter prism, part of the light is reflected to the probe light high reflector, and is reflected to the probe light detection sleeve collimator, and part of the light is incident on the cesium atom cell.
6. The discharge detection apparatus according to claim 5, characterized by The probe light beam splitter prism and the probe light high reflector are symmetrically arranged with the first symmetry line as the center line; In the direction along the first symmetry line, the distance between the probe light sleeve collimator and the probe light beam splitter prism is greater than the distance between the probe light detection sleeve collimator and the probe light high reflector.
7. The electric discharge detecting apparatus according to claim 5, characterized by The coupling light detection assembly is arranged on the carrier; The coupling light detection assembly includes a coupling light beam splitter prism, a coupling light high reflector, a coupling light detection sleeve collimator and a coupling light detection polarization maintaining optical fiber, and the coupling light detection sleeve collimator and the coupling light detection polarization maintaining optical fiber are connected; The coupling light beam splitter prism is located between the coupling light polarizing beam splitter prism and the cesium atom cell. The coupling light is incident on the coupling light beam splitter prism through the coupling light polarizing beam splitter prism, part of the light is reflected to the coupling light high reflector, and is reflected to the coupling light detection sleeve collimator, and part of the light is incident on the cesium atom cell. The coupling light beam splitter prism and the coupling light high reflector are symmetrically arranged with the second symmetry line as the center line; 8. The electric discharge detecting apparatus according to claim 7, characterized by In the direction along the second symmetry line, the distance between the coupling light line sleeve collimator and the coupling light beam splitter prism is greater than the distance between the coupling light detection sleeve collimator and the coupling light high reflector. The first light blocking plate and the second light blocking plate are arranged on the carrier; 9. The electric discharge detecting apparatus according to claim 8, characterized by The first light blocking plate and the second light blocking plate are arranged on the carrier; The first light blocking plate and the second light blocking plate are arranged on the carrier; The coupling light emitted from the cesium atom cell is incident on the first light blocking plate; Among the two light beams emitted from the coupling light polarizing beam splitter, one light beam is directed towards the cesium atom cell, and the other light beam is incident on the second light blocking plate. The second dichroic mirror is arranged on the carrier, and the second dichroic mirror is located between the probe light beam splitter prism and the cesium atom cell.
10. The electric discharge detecting apparatus according to claim 9, characterized by The second dichroic mirror is arranged on the carrier, and the second dichroic mirror is located between the probe light beam splitter prism and the cesium atom cell. The coupling light emitted from the cesium atom cell is incident on the first light blocking plate; Among the two light beams emitted from the coupling light polarizing beam splitter, one light beam is directed towards the cesium atom cell, and the other light beam is incident on the second light blocking plate. The second dichroic mirror is arranged on the carrier, and the second dichroic mirror is located between the probe light beam splitter prism and the cesium atom cell.