EL probe row for Topcon battery production

Abstract

The utility model discloses an EL probe row used for Topcon battery production, comprising a copper plate and a plurality of elastic probes, the middle part of the copper plate is provided with a plurality of probe grooves along the vertical direction, the probe grooves are distributed at equal intervals and are parallel to each other, the elastic probes pass through the probe grooves, the front end of the copper plate is provided with a front mounting hole, and the rear end of the copper plate is provided with a rear mounting hole. The rear end of the copper plate is provided with a rear mounting hole and a wire hole. According to the EL probe row for Topcon battery production, EL detection is carried out on silicon wafers of Topcon batteries in the production process, elastic probes in the whole row are driven by a copper plate to make contact with the silicon wafers, the silicon wafers are elastically contacted and protected, EL detects the defects such as black spots, scratches, blackening, belt marks, smudginess, black edges, suction cup marks, scratches and flower basket marks of the silicon wafers, grading is carried out after detection, and the production efficiency of the Topcon batteries is improved. And grading information is transmitted to the high-speed sorting machine.

Description

Technical Field

[0001] This utility model relates to the technical field of silicon wafer production, and in particular to an EL probe array for Topcon battery production. Background Technology

[0002] Photovoltaic silicon wafers (hereinafter referred to as silicon wafers) are the core component of solar power generation systems and also the most valuable part. The function of silicon wafers is to convert solar energy into electrical energy, which is then stored in batteries or used directly as a power source. Topcon, short for Tunnel Oxide Passivating Contacts, is a photovoltaic cell technology. During the production of its module silicon wafers, EL testing is required, which involves emitting photons and then performing pattern imaging for detection. This testing requires corresponding EL probe arrays. Utility Model Content

[0003] One objective of this invention is to provide an EL probe array for Topcon battery production, which has stable performance, reasonable structure, and is suitable for use in Topcon battery production testing equipment.

[0004] To achieve this objective, the present invention adopts the following technical solution:

[0005] An EL probe array for Topcon battery production includes a copper plate and several elastic probes. The copper plate has several probe slots arranged vertically in the middle. The probe slots are evenly spaced and parallel to each other. The elastic probes pass through the probe slots. The front end of the copper plate has a front mounting hole, and the rear end of the copper plate has a rear mounting hole and a wire hole.

[0006] As a preferred technical solution, the elastic probe includes a needle sleeve and a needle head. The lower end of the needle sleeve is provided with a mounting position, and the upper end of the needle head is inserted into the mounting position. The needle head moves elastically back and forth.

[0007] As a preferred technical solution, the lower periphery of the needle sleeve is provided with a circular protrusion, which is engaged with the lower end of the copper plate.

[0008] As a preferred technical solution, a wire is connected to the wire hole, and a terminal is installed at the end of the wire.

[0009] As a preferred technical solution, the mounting frame is further provided with a front guide groove at the front end of the mounting frame, a front connecting seat is slidably mounted on the front guide groove, and the front mounting hole is fixedly connected to the front connecting seat. The mounting frame is provided with a rear guide groove at the rear end, a rear connecting seat is slidably mounted on the rear guide groove, and the rear mounting hole is fixedly connected to the rear connecting seat.

[0010] As a preferred technical solution, the mounting frame is provided with a wire groove, and the wire passes through the wire groove.

[0011] The beneficial effects of this utility model are as follows: It provides an EL probe array for Topcon battery production. This EL probe array for Topcon battery production performs EL testing on the silicon wafers of Topcon batteries during the production process. The entire array of elastic probes contacts the silicon wafer under the action of the copper plate, and the elastic contact protects the silicon wafer. Together with the silver array, it is used to detect defects on the silicon wafer, control quality, reduce the number of defective silicon wafers that continue to be processed and produced, and is conducive to improving production quality and increasing production capacity. Attached Figure Description

[0012] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments.

[0013] Figure 1 This is a schematic diagram of the overall structure of an EL probe array used in Topcon battery production, as described in the embodiment.

[0014] Figure 2 This is a front view of an EL probe array used in Topcon battery production, as described in the embodiment.

[0015] Figure 3 This is a cross-sectional view of an EL probe array used in Topcon battery production, as described in the embodiment.

[0016] Figure 4 This is an exploded view of the elastic probe described in the embodiment;

[0017] Figure 5 This is a perspective view of the assembly of the EL probe array and mounting frame as described in the embodiment;

[0018] Figure 6 This is a side view of the assembly of the EL probe array and mounting frame as described in the embodiment.

[0019] Figures 1 to 6 middle:

[0020] 1. Copper plate; 2. Flexible probe; 3. Front mounting hole; 4. Rear mounting hole; 5. Wire hole; 6. Needle sleeve; 7. Needle tip; 8. Mounting position; 9. Circular protrusion; 10. Wire; 11. Terminal; 12. Mounting frame; 13. Front guide groove; 14. Front connector; 15. Rear guide groove; 16. Rear connector; 17. Wire groove. Detailed Implementation

[0021] The technical solution of this utility model will be further described below with reference to the accompanying drawings and specific embodiments.

[0022] like Figures 1 to 6As shown in this embodiment, an EL probe array for Topcon battery production includes a copper plate 1 and several elastic probes 2. Several probe slots are arranged in the middle of the copper plate 1 along the vertical direction. The probe slots are evenly distributed and parallel to each other. The elastic probes 2 pass through the probe slots. A front mounting hole 3 is provided at the front end of the copper plate 1, and a rear mounting hole 4 and a wire hole 5 are provided at the rear end of the copper plate 1.

[0023] A probe slot is made through the copper plate 1, and the elastic probe 2 is passed through the probe slot. After the elastic probe 2 is fixed on the copper plate 1, the wire 10 is connected at the position of the wire hole 5. After the EL probe row is fixed according to the positions of the front mounting hole 3 and the rear mounting hole 4, the elastic probe 2 contacts the silicon wafer along with the copper plate 1 and the signal is connected and output from the wire 10.

[0024] The elastic probe 2 includes a needle sleeve 6 and a needle 7. The lower end of the needle sleeve 6 is provided with a mounting position 8. The upper end of the needle 7 is inserted into the mounting position 8. The needle 7 moves elastically back and forth, and the needle 7 is inserted from the lower end of the needle sleeve 6 to form an elastic structure.

[0025] The lower periphery of the needle sleeve 6 is provided with a circular protrusion 9, which is engaged with the lower end of the copper plate 1, effectively preventing the elastic probe 2 from retracting too far upward and thus limiting its position.

[0026] A wire 10 is connected to the wire hole 5. A terminal 11 is installed at the end of the wire 10. The quick-connect terminal 11 can be directly plugged into the detection mechanism, making installation more convenient.

[0027] The EL probe array also includes a mounting frame 12. The front end of the mounting frame 12 is provided with a front guide groove 13, and a front connector 14 slides laterally on the front guide groove 13. The front mounting hole 3 is fixedly connected to the front connector 14. The rear end of the mounting frame 12 is provided with a rear guide groove 15, and a rear connector 16 slides laterally on the rear guide groove 15. The rear mounting hole 4 is fixedly connected to the rear connector 16. In addition, the mounting frame 12 is provided with a wire groove 17, through which the wire 10 passes.

[0028] Several sets of copper plates 1 are arranged in parallel and distributed at equal intervals, and then assembled onto the front connector 14 and the rear connector 16. The spacing is determined according to the distribution of the gate lines on the silicon wafer. The connecting wires 10 can pass through the wire groove 17, resulting in a better structure.

[0029] It should be stated that the above-described specific embodiments are merely preferred embodiments of this utility model and the technical principles applied thereto. Within the scope of the technology disclosed in this utility model, any variations or substitutions that are easily conceived by those skilled in the art should be covered within the protection scope of this utility model.

Claims

1. An EL probe array for Topcon cell production, characterized by, The utility model relates to a copper plate and a plurality of elastic probes, the middle part of the copper plate is provided with a plurality of probe grooves along the vertical direction, the probe grooves are distributed at equal intervals and are parallel to each other, the elastic probes pass through the probe grooves, the front end of the copper plate is provided with a front mounting hole, and the rear end of the copper plate is provided with a rear mounting hole and a wire hole.

2. An EL probe array for Topcon cell production according to claim 1, characterized in that, The elastic probe comprises a needle sleeve and a needle head, the lower end of the needle sleeve is provided with a mounting position, the upper end of the needle head is inserted into the mounting position, and the needle head elastically reciprocates.

3. An EL probe array for Topcon cell production according to claim 2, characterized in that, The lower end of the needle sleeve is provided with a circular ring protrusion, and the circular ring protrusion is clamped at the lower end of the copper plate.

4. An EL probe array for Topcon cell production according to claim 1, characterized in that, A wire is connected to the wire hole, and a terminal is mounted at the end of the wire.

5. An EL probe array for Topcon cell production according to claim 4, characterized in that, The utility model further comprises a mounting frame, the front end of the mounting frame is provided with a front guide groove, a front connecting seat is transversely slid on the front guide groove, the front mounting hole is fixedly connected with the front connecting seat, the rear end of the mounting frame is provided with a rear guide groove, a rear connecting seat is transversely slid on the rear guide groove, and the rear mounting hole is fixedly connected with the rear connecting seat.

6. An EL probe array for Topcon cell production according to claim 5, characterized in that, A wire groove is arranged on the mounting frame, and the wire passes through the wire groove.

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