Probe implanting jig for test socket
By designing a probe implantation fixture for testing sockets, rapid and accurate probe implantation was achieved, solving the problem of low probe replacement efficiency in existing technologies and improving production efficiency and testing quality.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-10
- Publication Date
- 2026-03-10
AI Technical Summary
In the existing technology, replacing the probes of the test socket requires 3 days of man-hours, which cannot respond to production conditions in real time and is inefficient.
Design a probe implantation fixture for testing sockets, which enables rapid probe implantation through through holes and positioning holes on a support plate and substrate, ensuring positional accuracy and stability.
This improves probe replacement efficiency, ensures test sockets keep pace with production, avoids probe damage, improves test quality, and optimizes resource allocation.
Smart Images
Figure CN223986146U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model belongs to the chip test technical field, and specifically relates to a probe implantation fixture for testing socket. BACKGROUND
[0002] Before the chip is formally shipped, relevant electrical tests need to be carried out on the test socket. In order to adapt to the super large packaging product, the number of pogo pins (spring probes) required by the test socket can reach 29,000 at most, and the existing probe replacement mode needs 3 days of working hours, which cannot respond to the production status in real time.
[0003] Therefore, in view of the above technical problems, it is necessary to provide a probe implantation fixture for testing socket. CONTENT OF THE UTILITY MODEL
[0004] The utility model aims at providing a probe implantation fixture for testing socket, which can quickly implant probes for the test socket.
[0005] In order to achieve the above-mentioned purpose, the technical scheme provided by a specific embodiment of the utility model is as follows:
[0006] A probe implantation fixture for testing socket, the probe implantation fixture comprises a support plate and a substrate fixedly installed above the support plate, a plurality of through holes are arranged in the thickness direction on the substrate;
[0007] The test socket is provided with an opening for accommodating the probe, the through holes are arranged in an array and correspond to the openings one by one, and the through holes are used for placing the probes to be implanted into the openings.
[0008] In one or more embodiments of the utility model, a plurality of positioning holes matched with positioning pins on the test socket are arranged on the substrate, the positioning holes are clamped with the positioning pins to make the through holes coaxial with the corresponding openings during the probe implantation process.
[0009] In one or more embodiments of the utility model, the substrate comprises a main body part and an extension part extending outward from the main body part, the through holes are located on the main body part, and the positioning holes are located on the extension part.
[0010] In one or more embodiments of the utility model, a first groove is formed in the upper surface of the main body part, a second groove is formed in the lower surface of the main body part, the upper surface and the lower surface are oppositely arranged, and the upper surface is the side of the main body part away from the support plate;
[0011] The through holes pass through the first groove and the second groove.
[0012] In one or more embodiments of this utility model, the edge of the support plate is provided with a plurality of first fixing holes, and the extension of the substrate is provided with a plurality of second fixing holes corresponding to the first fixing holes. Fixing members can be installed in the first fixing holes and the second fixing holes to fix the substrate to the support plate.
[0013] In one or more embodiments of this utility model, the support plate has a mounting groove on the side opposite to the substrate;
[0014] The first fixing hole is located inside the mounting groove, and the depth of the mounting groove is greater than or equal to the thickness of the exposed portion of the fastener.
[0015] In one or more embodiments of this utility model, the fastener is a bolt.
[0016] In one or more embodiments of this utility model, the depth of the mounting groove is greater than or equal to the thickness of the nut in the bolt.
[0017] In one or more embodiments of the present invention, the support plate is provided with a plurality of positioning grooves on the side facing the substrate, and the positioning grooves correspond one-to-one with the through holes for carrying the probes in the through holes.
[0018] In one or more embodiments of this utility model, the positioning grooves are arranged in an array at intervals.
[0019] Compared with the prior art, the probe implantation fixture for test sockets of this utility model accommodates probes through through holes on the substrate. The probes that need to be replaced are pre-placed in the probe implantation fixture, and the required probes can be implanted into the test socket in one go.
[0020] The positioning holes ensure the accuracy of the probe placement fixture, allowing the probe to be accurately implanted into the test socket, avoiding damage to the probe and improving test quality.
[0021] The support plate has a mounting groove on the side opposite to the substrate to ensure that the probe implantation fixture can be placed stably.
[0022] This invention improves the efficiency of probe replacement, avoids the test socket being idle for a long time during probe replacement, ensures that the test socket can keep up with the production rhythm and respond to various production dynamics in real time. In addition, this invention can make use of the idle time of maintenance personnel to achieve optimal resource allocation. Attached Figure Description
[0023] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0024] Figure 1 This is a schematic diagram of the probe implantation fixture for testing sockets in one embodiment of the present invention;
[0025] Figure 2 This is a top view of a probe implantation fixture for testing sockets according to an embodiment of the present invention;
[0026] Figure 3 This is a left view of a probe implantation fixture for testing sockets according to an embodiment of the present invention;
[0027] Figure 4 This is a schematic diagram of the first and second grooves of the substrate in one embodiment of the present invention;
[0028] Figure 5 This is a top view of the substrate in one embodiment of the present invention;
[0029] Figure 6 This is a top view of the support plate in one embodiment of the present invention;
[0030] Figure 7 This is a top view of the support plate in one embodiment of the present invention. Detailed Implementation
[0031] To enable those skilled in the art to better understand the technical solutions of this utility model, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of this utility model.
[0032] Unless otherwise expressly stated, throughout the specification and claims, the term "comprising" or its variations such as "including" or "comprises" shall be understood to include the stated elements or components without excluding other elements or other components.
[0033] The terms "coupled," "connected," or "linked" in this specification include both direct and indirect connections. An indirect connection is a connection made through an intermediate medium, such as an electrical conduction medium, which may have parasitic inductance or capacitance. Indirect connections may also include connections made through other active or passive devices to achieve the same or similar functional purpose, such as connections through switches, follower circuits, or other circuits or components. Furthermore, in this invention, terms such as "first" and "second" are primarily used to distinguish one technical feature from another, and do not necessarily require or imply any actual relationship, quantity, or order between these technical features.
[0034] In the detailed description of this specification, reference is made to the accompanying drawings, which form a part thereof, wherein like reference numerals always denote like parts, and wherein exemplary embodiments are shown by way of example that may be implemented. It should be understood that other embodiments may be utilized, and structural or logical changes may be made, without departing from the scope of this application. Therefore, the following detailed description should not be considered limiting.
[0035] The various operations in the specification may be described sequentially as multiple discrete actions or operations in a manner most conducive to understanding the claimed subject matter. However, the order of description should not be construed as implying that these operations must be sequentially related. Specifically, these operations may not be performed in the order presented. The described operations may be performed in a different order than in the described embodiments. Various additional operations may be performed in additional embodiments and / or the described operations may be omitted.
[0036] For the purposes of this application, the phrase "A and / or B" means (A), (B), or (A and B). For the purposes of this application, the phrase "A, B and / or C" means (A), (B), (C), (A and B), (A and C), (B and C), or (A, B and C).
[0037] Various components and devices may be referred to or shown in the singular (e.g., “MOS transistor”, “transistor”, “switch”, etc.) in this document, but only for the convenience of discussion, and any element referred to in the singular may include multiple such elements as taught herein.
[0038] The description uses the phrases "in this embodiment," "in other embodiments," or "in some embodiments," each of which may refer to one or more of the same or different embodiments. Furthermore, the terms "comprising," "including," "having," etc., used in relation to embodiments of this application are synonymous.
[0039] like Figure 1 and Figure 2As shown, one embodiment of this application provides a probe implantation fixture for a test socket. The probe implantation fixture includes a support plate 20 and a base plate 10 fixedly mounted above the support plate 20. The base plate 10 has a plurality of through holes 111 extending through the thickness direction. The test socket has an opening for accommodating probes. The through holes 111 are arranged in an array at intervals and correspond one-to-one with the openings. The through holes 111 are used to place the probe to be implanted into the opening of the test socket.
[0040] Understandably, the maximum thickness of the substrate 10 is less than the length of the probe, so that after the probe is placed in the through hole 111, a part of the probe can extend out of the probe implantation fixture.
[0041] It is understood that the test socket includes a probe socket and a guide pin, and an opening for accommodating the probe is provided on the probe socket. The arrangement position and density of the through holes 111 on the substrate 10 correspond to the arrangement position and density of the openings on the probe socket in the test socket to which the probe is to be implanted.
[0042] like Figure 1 and Figure 2 As shown, the substrate 10 has multiple positioning holes 13 that mate with positioning pins on the test socket. The positioning holes 13 engage with the positioning pins to ensure that the through holes 111 are coaxial with the corresponding openings during probe implantation. The positioning holes 13 correspond to the positioning pins in the test socket. When using this probe implantation fixture, it ensures that the probe implantation fixture is placed accurately so that the through holes 111 on the substrate 10 correspond one-to-one with the openings on the probe sockets in the test sockets to be implanted with the probes. This controls the accurate implantation of the probes into the test sockets and prevents damage to the probes.
[0043] like Figures 1 to 3 As shown, in some embodiments of this application, the substrate 10 includes a main body 11 and an extension 12 extending outward from the main body 11. The area of the main body 11 of the substrate 10 is smaller than the area of the support plate 20. Both the main body 11 and the extension 12 are fixedly mounted on the support plate 20, that is, the projection of the substrate 10 is within the support plate 20.
[0044] In some embodiments of this application, such as Figure 1 and Figure 2 As shown, the through hole 111 is located on the main body 11, and the positioning hole 13 is located on the extension 12.
[0045] like Figure 4 As shown, a first groove 101 is formed on the upper surface of the main body 11, and a second groove 102 is formed on the lower surface of the main body 11. The upper and lower surfaces are arranged opposite to each other, and the upper surface is the side of the main body 11 facing away from the support plate 20. The first groove 101 and the second groove 102 are arranged opposite to each other. Figure 2The through hole 111 penetrates the first groove 101 and the second groove 102. It should be noted that... Figure 4 This is a schematic diagram for the purpose of understanding the first groove 101 and the second groove 102, and it should not limit the scope of protection of this application.
[0046] like Figure 5 As shown, in one embodiment, the main body 11 of the substrate 10 is rectangular, and each of the four corners of the main body 11 is provided with an outwardly extending extension 12.
[0047] Furthermore, at least two extensions 12 are provided with positioning holes 13, preferably, three extensions 12 are provided with positioning holes 13 respectively. In one embodiment, the extensions 12 of the substrate 10 are provided with a plurality of second fixing holes 14.
[0048] like Figure 6 As shown, the edge of the support plate 20 is provided with a plurality of first fixing holes 23. The support plate 20 includes a first surface and a second surface disposed opposite to each other, wherein the first surface of the support plate 20 abuts against the substrate 10.
[0049] Furthermore, the first fixing hole 23 corresponds to the second fixing hole 14 on the extension 12 of the substrate 10, and a fixing member can be installed in the first fixing hole 23 and the second fixing hole 14 to fix the substrate 10 on the support plate 20.
[0050] like Figure 1 and Figure 3 As shown, the support plate 20 has a mounting groove 21 on the side opposite to the base plate 10, that is, the second surface of the support plate 20 has a mounting groove 21. The first fixing hole 23 is located in the mounting groove 21, and the depth of the mounting groove 21 is greater than or equal to the thickness of the exposed portion of the fastener. Here, the exposed portion of the fastener refers to the part of the fastener that is still exposed on the mounting groove 21 after it has been installed in the first fixing hole 23 and the second fixing hole 14.
[0051] In one embodiment, the fixing element is a bolt, which includes a shank and a nut, with the nut located within the mounting groove 21. The depth of the mounting groove 21 is greater than or equal to the thickness of the nut in the bolt. It is understood that when the base plate 10 and the support plate 20 are connected by bolts, to prevent the nut from protruding from the support plate 20, the mounting groove 21 on the second surface of the support plate 20 ensures that the probe implantation fixture can be stably placed during operation.
[0052] In one embodiment, the support plate 20 is rectangular, and the support plate 20 has mounting grooves 21 at each of its four corners on the side away from the base plate 10.
[0053] like Figure 7As shown, in another embodiment, the support plate 20 has a plurality of positioning grooves 22 on the side facing the substrate 10. That is, a plurality of positioning grooves 22 are provided on the first surface of the support plate 20. The positioning grooves 22 are arranged in an array at intervals, and each positioning groove 22 corresponds to a through hole 111. The positioning grooves 22 are used to support the probe in the through hole 111. When the probe is inserted into the through hole 111 on the substrate 10, the first end of the probe is embedded in the positioning groove 22 on the support plate 20, preventing the first end of the probe from sliding on the surface of the support plate 20. It can be understood that the depth of the positioning groove 22 is relatively shallow, and the diameter of the positioning groove 22 is slightly smaller than the diameter of the through hole 111.
[0054] The working principle of this application includes: placing the probe implantation fixture horizontally, inserting the probe to be implanted (e.g., a spring-loaded pogo pin) into the through hole 111 on the substrate 10, inverting the test socket into which the probe needs to be implanted, aligning it with the substrate 10, and engaging it. Specifically, inserting the positioning pin on the test socket into the positioning hole 13 of the substrate 10, at which point a portion of the probe is embedded in the opening of the probe socket in the test socket. Flipping the engaged probe implantation fixture and the test socket, at which point the probe implantation fixture is located on top of the test socket, and removing the probe implantation fixture, thus completing the operation of implanting the probe in the test socket.
[0055] As can be seen from the above technical solutions, this utility model has the following beneficial effects:
[0056] This invention is applicable to large-scale packaging products. The probes that need to be replaced are pre-placed in the probe implantation fixture, which allows the required probes to be implanted into the test socket in one go. This significantly improves the efficiency of probe replacement and avoids the test socket being idle for a long time during the probe replacement process. This ensures that the test socket can keep up with the production rhythm and respond to various production dynamics in real time. At the same time, this invention can make use of the idle time of maintenance personnel to achieve optimal resource allocation.
[0057] This invention ensures the accuracy of the probe implantation fixture placement through the positioning hole 13, enabling the probe to be accurately implanted into the test socket, avoiding damage to the probe, and improving test quality.
[0058] This invention ensures that the probe implantation fixture can be placed stably by setting the mounting groove 21.
[0059] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.
[0060] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
Claims
1. A probe implantation jig for testing a socket, characterized by, The probe implantation jig comprises a support plate and a base plate fixedly installed above the support plate; The base plate is provided with a plurality of through holes in the thickness direction; the test socket is provided with an opening for accommodating a probe; the through holes are arranged in an array and correspond to the openings one by one; the through holes are used for placing the probes to be implanted into the openings; and the support plate is used for bearing the probes in the through holes. The probe implantation jig further comprises positioning holes provided on the base plate; the positioning holes are engaged with positioning pins on the test socket to make the through holes coaxial with the corresponding openings during the probe implantation process.
2. The probe implantation gauge for testing a socket according to claim 1, wherein, The base plate comprises a main body and an extension extending outward from the main body; the through holes are located on the main body; and the positioning holes are located on the extension.
3. The probe implantation gauge for testing a socket according to claim 2, wherein, A first recess is formed on the upper surface of the main body; a second recess is formed on the lower surface of the main body; the upper surface and the lower surface are oppositely arranged; and the upper surface is the surface of the main body facing away from the support plate. The through holes pass through the first recess and the second recess.
4. The probe implantation gauge for testing socket according to claim 2, wherein, The edge of the support plate is provided with a plurality of first fixing holes; the extension of the base plate is provided with a plurality of second fixing holes corresponding to the first fixing holes; and fixing members can be installed in the first fixing holes and the second fixing holes to fix the base plate to the support plate.
5. The probe implantation gauge for testing a socket according to claim 4, wherein, The side of the support plate facing away from the base plate is provided with a mounting groove. The first fixing holes are located in the mounting groove; and the depth of the mounting groove is greater than or equal to the thickness of the exposed part of the fixing member.
6. The probe implantation gauge for testing a socket according to claim 5, wherein, The fixing member is a bolt.
7. The probe implantation gauge for testing a socket according to claim 6, wherein, The depth of the mounting groove is greater than or equal to the thickness of the nut in the bolt.
8. The probe implantation gauge for testing a socket according to claim 1, wherein, The side of the support plate facing the base plate is provided with a plurality of positioning recesses corresponding to the through holes, which are used for bearing the probes in the through holes.
9. The probe implantation gauge for testing a socket according to claim 8, wherein, The positioning recesses are arranged in an array.