313results about "Temperature compensation modification" patented technology

A system and method in which an overhead high voltage transmission line sensor system is able to measure one or more of temperature, current, and line sag for a conductor within a high voltage transmission line system. The sensor system may be able to clamp to a transmission conductor or splice, harvest power from the transmission line, and / or transmit data corresponding to measurements of current, temperature, and line sag.

The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening elements which respond to changes in temperature in such a way as to counteract thermally induced motion of the probe card is disclosed including rolling elements, slots and lubrication. Various means for allowing radial expansion of a probe card to prevent thermally induced motion of the probe card are also disclosed. A method for detecting thermally induced movement of the probe card and moving the wafer to compensate is also disclosed.

A power meter reader system for automatically reading an indication on a power meter unit having a cyclical property that varies at a rate indicative of power consumption. The system comprises a detection unit that includes a sensor unit for monitoring the cyclical property of the indication and generating a consumption detection signal, a processing unit for generating an information signal based on data related to the consumption detection signal, and a transmitter for transmitting a transmission signal based on the information signal. The processing unit also generates a sensor enable signal to enable the sensor unit for only a portion of the cyclical property of the indication. The system further includes a display unit located remotely with respect to the detection unit for receiving the transmission signal and displaying the power consumption. The detection unit may also employ a prediction model for reducing power consumption in the detection unit.

A power meter reader system for automatically reading an indication on a power meter unit having a cyclical property that varies at a rate indicative of power consumption. The system comprises a detection unit that includes a sensor unit for monitoring the cyclical property of the indication and generating a consumption detection signal, a processing unit for generating an information signal based on data related to the consumption detection signal, and a transmitter for transmitting a transmission signal based on the information signal. The processing unit also generates a sensor enable signal to enable the sensor unit for only a portion of the cyclical property of the indication. The system further includes a display unit located remotely with respect to the detection unit for receiving the transmission signal and displaying the power consumption. The detection unit may also employ a prediction model for reducing power consumption in the detection unit.

A sensor apparatus and sensor apparatus system for use in conjunction with a cassette, including a disposable or replaceable cassette. In some embodiments, the cassette includes a thermal well for permitting the sensing of various properties of a subject media. The thermal well includes a hollow housing of a thermally conductive material. In other embodiments, the cassette includes sensor leads for sensing of various properties of a subject media. The thermal well has an inner surface shaped so as to form a mating relationship with a sensing probe. The mating thermally couples the inner surface with a sensing probe. In some embodiments, the thermal well is located on a disposable portion and the sensing probe on a reusable portion.

The mechanical behavior of wires subjected to axial loading and experiencing bending deformation is used to ensure effective control of the contact pressure in mechanical and / or heat removing devices, and similar structures and systems. An apparatus for taking advantage of the characteristics of wires in packaging of a device, such as a semiconductor device, is disclosed, as well as a test device for identifying the accurate contact pressure required in same. Methods for the prediction of such a behavior for pre-buckling, buckling, and post-buckling conditions in wires, carbon nanotubes (CNTs), and similar wire-grid-array (WGA) structures, for example are also disclosed.

In embodiments of the present invention, a method and system is provided for designing improved intelligent, LED-based lighting systems. The LED based lighting systems may include fixtures with one or more of rotatable LED light bars, integrated sensors, onboard intelligence to receive signals from the LED light bars and control the LED light bars, and a mesh network connectivity to other fixtures.

A battery pack, and more particularly, a temperature compensated current measuring device which can accurately measure an actual current flowing in a circuit of a charging / discharging path in the battery pack. The temperature compensated current measuring device includes a conductor in which current flows, a temperature sensor disposed around the conductor to measure a temperature of the conductor, and a temperature compensated current detection circuit part electrically connected to two positions of the conductor to measure a voltage between the two positions, electrically connected to the temperature sensor to measure a temperature of the conductor, and measuring the current flowing in the conductor by using the measured temperature and the voltage as an input signal. Thus, it is possible to accurately calculate an actual charging / discharging current with the temperature compensated current measuring device and effectively control the charging capacity of the battery pack.

An arrangement for use in a utility meter includes a temperature sensor, a memory device, a communication circuit, and a processing circuit. The processing circuit is operably coupled to receive information representative of temperature measurements from the temperature sensor. The processing circuit is configured to store first temperature information associated with a first time period in a first data record in the memory device, the first temperature information derived from one or more of the temperature measurements. The processing circuit is further configured to store subsequent temperature information associated with corresponding subsequent time periods in corresponding other data records in the memory device. The processing circuit is also configure to periodically cause the communication circuit to communicate information representative of the first temperature information and the subsequent temperature information to an external device.

A method and apparatus for terminating a probe that probes a semiconductor device with a signal cable from a tester is provided to connect layers of the probe to layers of the signal cable side by side. The probe and signal cable can be a co-axial or tri-axial probe and signal cable, respectively. A center conductive probe needle of the probe is disposed side by side with and electrically connects to a center signal conductor of the signal cable. A dielectric layer of the probe is disposed side by side with and connects to a dielectric layer of the signal cable. A conductive guard layer of the probe is disposed side by side with and electrically connects to a conductive dispersion / guard layer of the signal cable, and a sleeve of the probe is disposed side by side with and connects to a sleeve of the signal cable. In a tri-axial embodiment, a second dielectric layer of the probe is disposed side by side with and connects to a second dielectric layer of the signal cable.

A power voltage of a power source circuit is produced by amplifying a threshold voltage difference of an operational amplifier by an amplification factor corresponding to a dividing ratio of a resistance dividing circuit. The power source circuit is integrated on a CMOS substrate together with a computer block. A plurality of analog switches are associated with the resistance dividing circuit to stabilize the power voltage of the power source circuit. One of these switches is selectively closed to change the dividing ratio of the resistance dividing circuit in accordance with actuation data stored in a control register.

A probe card includes a plurality of probes that contacts a plurality of electrodes provided in the semiconductor wafer and that inputs or outputs an electrical signal in or from the electrodes, a probe head that holds the probes, a substrate having a wiring which is provided near the surface of the substrate facing the probe head so as to be contactable with the probe head and is connected to the probes, a core layer formed of a material which is buried in the substrate and has a coefficient of thermal expansion lower than that of the substrate, and a connecting member that electrically connects at least some of the probes with an external device via the wiring.

A method of characterizing a circuit comprises the steps of measuring a first delay associated with the circuit when the circuit is substantially unloaded; measuring a second delay associated with the circuit when the circuit is loaded by a predetermined impedance; determining a difference between the second delay and the first delay, the delay difference corresponding to a switching impedance associated with the circuit; and determining a characterization parameter of the circuit, the characterization parameter being a function of at least the switching impedance associated with the circuit. The methodologies of the present invention are directed primarily to individually evaluating pullup and pulldown delays with substantial precision (e.g., sub-picosecond) for a representative set of circuits in the presence of an arbitrary switching history.

Methods and circuits for reduction of errors in a current shunt are disclosed, for example sensing lines for Kelvin sensing in which the sensing lines are of identical material to the high-resistance portions of the shunt, and welded thereto. This allows application of a current shunt with lower output voltage and thus lower power losses than the contemporary art implementations, while maintaining high accuracy with regard to temperature changes.

A secondary battery testing system comprises a single chip control module, a testing state control module, a data collecting module, a reference voltage module, a charging-discharging module, an inner resistance testing module and an environment temperature testing module. An outputting end of the single chip control module is connected to an inputting end of the testing state control module; the single chip control module is connected to the data collecting module in bidirectional way via data lines and connected to the environment temperature testing module in bidirectional way; outputting ends of the reference voltage module are respectively connected to the inputting end of the testing state control module and the inputting end of the data collecting module; the outputting ends of the testing state control module are respectively connected to the inputting end of the charging-discharging module and the inputting end of the inner resistance testing module; the outputting end of the charging-discharging module and the outputting end of the inner resistance testing module are respectively connected with the inputting end of the data collecting module. The invention can significantly enhance the detctjion accuracy and precision of the battery; the work is stable and reliable with inner resistance testing function, monitoring the inner resistance change of the secondary battery in the discharging process and providing the inner resistance parameter for the selection and match of the secondary battery.

Provided is an intelligent sensor for measuring high current. A large-power sampling resistor (R1) of the intelligent sensor converts current signals into voltage signals. Converted voltage signals are processed and filtered through a signal processing filter circuit and fed to an AD chip (U9). A negative temperature coefficient (NTC) thermal resistor (R23) is adopted by a temperature measurement module to measure the temperature of the large-power sampling resistor so as to be used for temperature compensation for the large-power sampling resistor. The AD chip converts output voltage of the measuring signal processing filter circuit and the temperature value of the NTC thermal resistor into digital signals, digital filtering processing is performed, and digital signals of voltage and the temperature are sent to an external main central processing unit (CPU) through a serial peripheral interface (SPI) communication interface isolated through an optocoupler. Isolation of the SPI communication digital signals is achieved through a digital isolation and direct current (DC) / DC conversion module, and the digital isolation and DC / DC conversion module supplies power to the signal processing filter circuit, the temperature measurement module and an analog to digital (A / D) conversion chip with a CPU processor. The main CPU and a controller area network (CAN) communication module receive external instructions and send digital signals of current measurement values.

A pre-amplifier circuit for connection to an antenna of a human-portable locator includes a differential amplifier / mixer pair and means for allowing a common-mode “phantom” signal to modulate a transfer function of the differential amplifier / mixer pair. The common-mode phantom signal modulates the transfer function of the differential pre-amplifier “onboard” the antenna without the usual requirement for onboard power supply and signal oscillator. This technique uses the same electronic components to provide both pre-amplification and mixing functions, thereby improving circuit performance-to-cost ratio, reducing mixer power consumption, situating the necessary signal oscillator remotely from the mixer, and greatly improving the available system bandwidth by limiting spectral transmission demands to the mixed signal bandwidth alone.

The present invention discloses a method and system compensating for thermally induced motion of probe cards used in testing die on a wafer. A probe card incorporating temperature control devices to maintain a uniform temperature throughout the thickness of the probe card is disclosed. A probe card incorporating bi-material stiffening elements which respond to changes in temperature in such a way as to counteract thermally induced motion of the probe card is disclosed including rolling elements, slots and lubrication. Various means for allowing radial expansion of a probe card to prevent thermally induced motion of the probe card are also disclosed. A method for detecting thermally induced movement of the probe card and moving the wafer to compensate is also disclosed.

An apparatus and method for detecting total voltage of an assembled battery including a number of serially-connected electric cells. Voltages of the respective cells are detected and added up, correlation between the resulting total voltage and a total voltage obtained by detecting the voltage of the assembled battery directly from its terminals is obtained, and a corrective arithmetic operation is carried out inside the device to correct the total voltage obtained through direct detection. The total voltage is detected with a high degree of accuracy without the need for individual adjustment operations using a variable resistance, high-accuracy external tester.

A utility meter having a temperature compensation function provides advantages such as improved time keeping accuracy. According to an exemplary embodiment, a utility meter includes at least one sensor for detecting an ambient temperature at a location corresponding to a component such as a crystal oscillator that enables a time keeping function of the meter, and generating an output signal representative of the detected ambient temperature. A device such as a digital signal processor adjusts at least one clock maintained by the time keeping function of the meter in dependence upon the output signal from the at least one sensor.

The invention provides a constant temperature device required in a battery charge-discharge testing process, and belongs to the technical field of batteries. The constant temperature device comprises a tank body, a temperature controller, a thermoelectric semiconductor refrigeration assembly, a cooling fan, a thermocouple, a dehumidifier, a battery clamp and a power supply power source. The tank body has the heat preservation effect. A front cover plate capable of being opened is arranged on the front side of the tank body, the thermocouple, the cooling fan, the thermoelectric semiconductor refrigeration assembly, the dehumidifier and the battery clamp are arranged in the tank body, the temperature controller is arranged at the top of the outer side of the tank body, and the temperature controller is simultaneously connected with the thermocouple, the thermoelectric semiconductor refrigeration assembly and the cooling fan through holes in the tank body to achieve control over temperature rise and temperature drop. The constant temperature device has the advantages of being easy to operate, practical, convenient to maintain and low in cost, and the constant temperature device is suitable for battery charge-discharge testing.

A low voltage detector (100) includes a power supply voltage monitor circuit (110) that produces a voltage VSP related to a first a power supply voltage, and a voltage generator (105), which includes a plurality of self-cascode MOSFET (SCM) structures (101-103) in a cascade configuration, that generates a reference voltage Vxm. A voltage comparator (140) outputs an output signal in response to a differential between Vxm and VSP, wherein Vxm and VSP have proportional to absolute temperature behavior (PTAT) over temperature with respect to a second power supply voltage. The output signal changes state when the first power supply voltage equals a trip point of the comparator. Each SCM structure is sized to provide a rate of change with temperature of the PTAT behavior of Vxm that matches a rate of change with temperature of the PTAT behavior of VSP.

The invention discloses a battery capacity forecasting method with a self-adaptive temperature compensating function, relates to the battery capacity forecasting method, and aims to solve the problem that the conventional Peukert equation cannot correct a capacity estimating error caused by temperature. The battery capacity forecasting method with the self-adaptive temperature compensating function comprises the following steps: 1, determining the change range of test temperature and a discharge rate; 2, performing battery discharging experiments with the discharge rates of I1, I2, ..., Im at an ambient temperature T1 respectively; 3, changing the ambient temperature into T2, repeating the step 2, and calculating Peukert equation coefficients p (T2) and k (T2); 4, establishing corresponding relationships between the ambient temperature and the Peukert equation coefficient p as well as the Peukert equation coefficient k; 5, in combination with the formula, obtaining a functional relationship between the battery capacity and the temperature as well as the discharge current. The battery capacity forecasting method with a self-adaptive temperature compensating function is applied to the field of lithium battery parameter detection.

Disclosed is a Hall Effect instrument with the capability of compensating for temperature drift consistently, accurately and in real time of operation. The instrument embodies a four-point ohm meter circuit measuring Hall Effect sensor resistance and tracking the effect of temperature on the Hall Effect sensor. The instrument takes into account a relationship between the temperature and a temperature compensation index on a per probe basis, which has exhibited a deterministic difference observed by the present inventor.