Diode power-on testing device

Abstract

The utility model belongs to the technical field of diode testing, and particularly relates to a diode power-on testing device, which comprises a universal meter main body, the universal meter main body is electrically connected with two testing meter pens through wires, each testing meter pen comprises a meter pen main body, one end of each meter pen main body is provided with a metal probe rod, one end of each metal probe rod is fixedly connected with a C-shaped elastic clamp, and the other end of each metal probe rod is fixedly connected with a wire. The universal meter comprises a universal meter body, a C-shaped elastic clamp is arranged on the universal meter body, clamping plates are fixedly connected to two ends of the C-shaped elastic clamp, conductive parts electrically connected with the universal meter body are fixedly connected to the sides, close to each other, of the two clamping plates, each conductive part comprises two clamping protruding blocks installed on the inner wall of the corresponding clamping plate, and the two clamping protruding blocks are vertically arranged. According to the utility model, the test meter can be directly positioned at the outer side of the rod-shaped electrode of the diode in a clamping manner, the electrical connection stability of the test meter pen and the diode is improved, the hands of a user are liberated in the measurement process, and the measurement operation of the user is facilitated.

Description

Technical Field

[0001] This utility model belongs to the field of diode testing technology, and specifically relates to a diode energization testing device. Background Technology

[0002] In the research, development, production, and maintenance of electronic equipment, diodes are a fundamental and crucial electronic component, and their performance testing is of paramount importance. Traditional diode conduction testing methods mostly rely on operators holding test leads and making contact between the metal probes and the diode leads to establish an electrical connection. This method has several drawbacks. For example, prolonged hand holding of the test leads can easily lead to hand fatigue, resulting in unstable contact between the test leads and the diode leads. This can cause frequent brief separations or poor contact between the test leads and the diode leads, thus affecting the accuracy of the test results. Utility Model Content

[0003] The purpose of this invention is to provide a diode energization testing device that can directly position the test probe on the outside of the diode's rod-shaped electrode by clamping, thereby improving the electrical connection stability between the test probe and the diode, freeing the user's hands during the measurement process, and facilitating the user's measurement operation.

[0004] The specific technical solution adopted by this utility model is as follows:

[0005] A diode conduction testing device includes a multimeter body. The multimeter body is electrically connected to two test probes via wires. Each test probe includes a probe body, with a metal probe rod mounted at one end. A C-shaped spring clip is fixedly connected to one end of the metal probe rod. Clamping plates are fixedly connected to both ends of the C-shaped spring clip. Conductive parts electrically connected to the multimeter body are fixedly connected to the sides of the two clamping plates that are close to each other.

[0006] Furthermore, the conductive part includes two clamping protrusions mounted on the inner wall of the clamping plate, and the two clamping protrusions are arranged vertically.

[0007] Furthermore, the two clamping protrusions on the same clamping plate are a fixed clamping protrusion and a movable clamping protrusion, respectively. The fixed clamping protrusion is fixedly connected to the lower part of one side of the clamping plate, and the movable clamping protrusion is installed on the upper side of the fixed clamping protrusion through a vertical moving assembly.

[0008] Furthermore, the vertical moving assembly includes a threaded rod fixedly connected to the outside of the metal probe rod, a threaded sleeve threadedly connected to the outside of the threaded rod, a connecting plate rotatably connected to the outside of the threaded sleeve, two connecting rods fixedly connected to the lower side of the connecting plate, and vertically arranged through slots provided on both clamping plates. The lower end of the connecting rod passes through the through slot and is fixedly connected to a movable clamping protrusion.

[0009] Furthermore, the metal probe is rotatably connected to the probe body, a fixed magnet is fixedly connected to the lower end of the probe body, and a movable magnet is fixedly connected to the outer side of the metal probe, with the movable magnet and the fixed magnet attracting each other magnetically.

[0010] The technical effects achieved by this utility model are as follows:

[0011] This utility model discloses a diode energization testing device. By applying a force to the clamping plates through the two ends of a C-shaped elastic clamp, the two clamping plates can clamp the rod-shaped electrode of the diode, improving the electrical connection stability between the test probe and the diode. It also allows the test probe to be directly positioned by clamping, freeing the user's hands during the measurement process and facilitating the user's measurement operation. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the structure of this utility model;

[0013] Figure 2 This is a schematic diagram of the structure of the test probe of this utility model;

[0014] Figure 3 This is a front view of the structure of the test pen of this utility model.

[0015] The attached diagram lists the components represented by each number as follows:

[0016] 1. Multimeter body; 2. Test probes; 3. Test probe body; 4. Metal probe rod; 5. C-shaped spring clip; 6. Clamping plate; 7. Fixed clamping protrusion; 8. Movable clamping protrusion; 9. Guide rail; 10. Through groove; 11. Connecting rod; 12. Threaded rod; 13. Threaded sleeve; 14. Connecting plate; 15. Movable magnet; 16. Fixed magnet. Detailed Implementation

[0017] To make the objectives and advantages of this utility model clearer, the following detailed description is provided in conjunction with embodiments. It should be understood that the following text is merely used to describe one or more specific embodiments of this utility model and does not strictly limit the scope of protection specifically claimed by this utility model.

[0018] like Figures 1-3 As shown, a diode energization test device includes a multimeter body 1, and the multimeter body 1 is electrically connected to two test probes 2 via wires.

[0019] Forward conduction test principle:

[0020] The multimeter body 1 has a DC power supply inside. When measuring the forward characteristics of a diode, the positive terminal of the power supply inside the multimeter body 1 is connected to the anode of the diode and the negative terminal is connected to the cathode of the diode through the test probe 2, so as to provide a forward voltage to the diode.

[0021] When the forward voltage reaches the diode's forward voltage, the diode begins to conduct, forming a forward current. The measuring circuit in the multimeter body 1 can detect this current and convert the current signal into a corresponding voltage signal based on parameters such as the resistance in the circuit.

[0022] When the diode is conducting, the multimeter body 1 will measure the voltage drop across the diode, i.e., the forward voltage drop. Since the forward characteristic curve of a diode has a certain slope, the forward voltage drop of different types of diodes is relatively fixed when conducting. By measuring the forward voltage drop, the type of diode and whether it is working properly can be determined. For example, when a normal silicon diode is conducting, its forward voltage drop is usually between 0.6V and 0.7V. If the measured value deviates too much from this range, it may indicate that the diode is faulty.

[0023] Reverse cutoff test principle:

[0024] Connect the positive terminal of the internal power supply of the multimeter body 1 to the cathode of the diode and the negative terminal to the anode of the diode to apply a reverse voltage to the diode;

[0025] Ideally, a diode is in the cutoff state under reverse voltage, with only a tiny reverse leakage current flowing through it. The measuring circuit of the multimeter body 1 can detect this tiny current and display the corresponding value. Generally speaking, the reverse leakage current of a normal diode is very small, usually in the microamp (μA) or even nanoamp (nA) range.

[0026] If the measured reverse current is too large and exceeds the normal reverse leakage current range of this type of diode, it indicates that the reverse characteristics of the diode may be poor, and there may be problems such as reverse leakage or breakdown.

[0027] The above-mentioned parts are mature existing technologies, and will not be described in detail in this technical solution.

[0028] The core of this technical solution lies in the structural improvement of the test probe 2, specifically as follows: Figures 1-3As shown, the test probe 2 includes a probe body 3. One end of the probe body 3 is equipped with a metal probe rod 4, which can be installed in a fixed connection or a rotating connection. One end of the metal probe rod 4 is fixedly connected to a C-shaped spring clip 5. Both ends of the C-shaped spring clip 5 are fixedly connected to clamping plates 6. The C-shaped spring clip 5 and the clamping plates 6 form a U-shaped structure. The sides of the two clamping plates 6 that are close to each other are fixedly connected to conductive parts that are electrically connected to the multimeter body 1. At this time, the two ends of the C-shaped spring clip 5 apply a force to the clamping plates 6, allowing the two clamping plates 6 to clamp the rod-shaped electrode of the diode, improving the electrical connection stability between the test probe 2 and the diode, and allowing the test probe 2 to be directly positioned by clamping. This frees the user's hands during the measurement process and facilitates the user's measurement operation.

[0029] Among them, the C-shaped elastic clip 5 can be a U-shaped structure, and its material can be copper, plastic, etc., which have elastic restoring properties.

[0030] Furthermore, the cross-section of the clamping plate 6 is a flat rectangular structure. Compared with the circular clamping plate 6, the rectangular clamping plate 6 can stably clamp the outside of the rod-shaped electrode of the diode.

[0031] like Figures 2-3 As shown, the conductive part includes two clamping protrusions installed on the inner wall of the clamping plate 6. The two clamping protrusions are arranged vertically, and the longitudinal cross-sectional dimension of the clamping protrusions gradually decreases from the side closer to the clamping plate 6 to the side farther away from the clamping plate 6, so that the upper and lower sides of the clamping protrusions form inclined surfaces. At this time, when the two clamping plates 6 are located on the upper side of the rod-shaped electrode of the diode, pressing the test probe 2 downward with force will cause the two fixed clamping protrusions 7 to drive the two clamping plates 6 to expand under the pushing force until the rod-shaped electrode of the diode enters between the four clamping protrusions. The rod-shaped electrode of the diode can be stably clamped by the four clamping protrusions, and the four clamping protrusions can be clamped on the outside of the rod-shaped electrode of the diode in a relatively convenient way.

[0032] The two clamping protrusions on the same clamping plate 6 are a fixed clamping protrusion 7 and a movable clamping protrusion 8. The fixed clamping protrusion 7 is fixedly connected to the lower part of one side of the clamping plate 6, and the movable clamping protrusion 8 is installed on the upper side of the fixed clamping protrusion 7 by a vertical moving assembly. At this time, by adjusting the distance between the fixed clamping protrusion 7 and the movable clamping protrusion 8, the rod-shaped electrodes of diodes of different diameters can be better adapted.

[0033] like Figures 2-3As shown, the vertical moving assembly includes a threaded rod 12 fixedly connected to the outside of the metal probe 4. A threaded sleeve 13 is threadedly connected to the outside of the threaded rod 12. A connecting plate 14 is rotatably connected to the outside of the threaded sleeve 13. Two connecting rods 11 are fixedly connected to the lower side of the connecting plate 14. Each of the two clamping plates 6 has a vertically arranged through groove 10. The lower end of the connecting rod 11 passes through the through groove 10 and is fixedly connected to the movable clamping protrusion 8. At this time, by rotating the threaded sleeve 13 to adjust its height, the movable clamping protrusion 8 can be moved together by the connecting rod 11. Adjusting the height of the movable clamping protrusion 8 adjusts the distance between the fixed clamping protrusion 7 and the movable clamping protrusion 8, and locking it after adjustment.

[0034] Furthermore, a guide rail 9 is fixedly connected to the side wall of the clamping plate 6, and the movable clamping protrusion 8 is slidably connected to the guide rail 9 to improve the stability of the movable clamping protrusion 8.

[0035] like Figures 1-2 As shown, the metal probe 4 can be fixedly connected to the probe body 3 or rotatably connected to the probe body 3. In this technical solution, a rotatable connection is preferred. During operation, the angle of the clamping plate 6 can be adjusted by rotating the probe body 3, so that the angle of the clamping plate 6 matches the rod-shaped electrode of the diode. Since the outer side of the probe body 3 can be provided with a groove or other buttons that conform to the shape of the palm during production, directly rotating the metal probe 4 can bring greater convenience to the user than rotating the probe body 3.

[0036] Furthermore, a fixed magnet 16 is fixedly connected to the lower end of the probe body 3, and a movable magnet 15 is fixedly connected to the outer side of the metal probe 4. The movable magnet 15 and the fixed magnet 16 attract each other magnetically, and the metal probe 4 can be positioned by the magnetic force between the movable magnet 15 and the fixed magnet 16.

[0037] The above description is merely a preferred embodiment of this utility model. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of this utility model, and these improvements and modifications should also be considered within the scope of protection of this utility model. Structures, devices, and operating methods not specifically described or explained in this utility model, unless otherwise specified or limited, shall be implemented using conventional methods in the field.

Claims

1. A diode conduction test device, comprising a multimeter main body (1), the multimeter main body (1) is electrically connected with two test probes (2) through wires, characterized in that: The test pen (2) comprises a pen body (3), one end of the pen body (3) is equipped with a metal probe rod (4), one end of the metal probe rod (4) is fixedly connected with a C-shaped elastic clamp (5), both ends of the C-shaped elastic clamp (5) are fixedly connected with clamping plates (6), and the side of the two clamping plates (6) close to each other is fixedly connected with conductive parts electrically connected with the main body (1) of the multimeter.

2. A diode power test apparatus as claimed in claim 1, wherein: The cross section of the clamping plate (6) is a flat rectangular structure.

3. The diode power-on testing apparatus of claim 1, wherein: The conductive part comprises two clamping protruding blocks mounted on the inner wall of the clamping plate (6), and the two clamping protruding blocks are vertically arranged.

4. A diode power test apparatus as claimed in claim 3, wherein: The longitudinal cross-sectional dimension of the clamping protruding block gradually decreases from the side close to the clamping plate (6) to the side away from the clamping plate (6).

5. A diode power test apparatus as claimed in claim 3, wherein: The two clamping protruding blocks on the same clamping plate (6) are a fixed clamping protruding block (7) and a movable clamping protruding block (8), the fixed clamping protruding block (7) is fixedly connected to the lower side of the clamping plate (6), and the movable clamping protruding block (8) is mounted on the upper side of the fixed clamping protruding block (7) through a vertical moving group.

6. A diode power test apparatus as claimed in claim 5, wherein: The vertical moving group comprises a threaded rod (12) fixedly connected to the outer side of the metal probe rod (4), a threaded sleeve (13) threadedly connected to the outer side of the threaded rod (12), a connecting plate (14) rotatably connected to the outer side of the threaded sleeve (13), two connecting rods (11) fixedly connected to the lower side of the connecting plate (14), two clamping plates (6) each having a vertically arranged through slot (10), and the lower end of the connecting rod (11) is fixedly connected with the movable clamping protruding block (8) penetrating through the through slot (10).

7. The diode power-on testing apparatus of claim 1, wherein: The metal probe rod (4) is rotatably connected to the pen body (3), the lower end of the pen body (3) is fixedly connected with a fixed magnet (16), the outer side of the metal probe rod (4) is fixedly connected with a movable magnet (15), and the movable magnet (15) and the fixed magnet (16) are magnetically attracted to each other.

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