Simulation device, debugging device and test system for performance debugging of inertial device
By designing a simulation device to perform multiple debugging operations on MEMS inertial devices, the problem of low testing accuracy in existing technologies has been solved, and efficient and accurate inertial device testing has been achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-23
- Publication Date
- 2026-03-24
AI Technical Summary
Existing MEMS inertial devices suffer from offset errors during three-axis turntable testing, resulting in inaccurate test results and low precision, which cannot meet daily needs.
Design an analog device including components such as a digital-to-analog converter, an operational amplifier, a signal modulator, and a signal demodulator. Optimize the performance of inertial devices through multiple debugging sessions to improve testing accuracy and efficiency.
Through repeated debugging, the testing accuracy and efficiency of inertial devices were improved, ensuring that inertial devices were tested when their performance was optimal, thus improving the accuracy of test results.
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Figure CN224034673U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of inertial devices, and more particularly, to a simulation device for performance debugging of inertial devices, a debugging device and a test system. BACKGROUND
[0002] MEMS inertial devices have the advantages of small volume, light weight, low cost, good reliability and wide measurement range. Existing inertial device test methods mostly use a three-axis turntable to directly place the MEMS inertial device on the three-axis turntable for testing. However, the MEMS inertial device often has a large offset error, and these offset errors often result in inaccurate test results and low result accuracy, which cannot meet daily needs. CONTENT OF THE INVENTION
[0003] In view of at least one defect or improvement demand of the prior art, the present application provides a simulation device for performance debugging of inertial devices, a debugging device and a test system, which are used for performance debugging optimization before formal performance testing of inertial devices, so as to improve the test accuracy of inertial devices.
[0004] To achieve the above-mentioned purpose, in a first aspect, the present application provides a simulation device for performance debugging of inertial devices, comprising:
[0005] A digital-to-analog converter, the input end of which can be connected to the output end of a digital device capable of sending signal control instructions for debugging inertial devices, and the output end of which is connected to the input end of an operational amplifier;
[0006] The operational amplifier, the output end of which can be connected to one or more inertial devices, and the orthogonal tuning control signal generated by the digital-to-analog converter is derived;
[0007] A signal modulator, the input end of which can be connected to one or more inertial devices, and the detection displacement signal fed back by the inertial device is introduced, and the output end of which is connected to the input end of a signal demodulator;
[0008] The signal demodulator, the output end of which is connected to the input end of an analog-to-digital converter;
[0009] The analog-to-digital converter, the output end of which can be connected to the input end of the digital device, and the generated displacement detection signal can be derived.
[0010] Further comprising:
[0011] A carrier circuit, the output end of which can be connected to one or more inertial devices, and the orthogonal tuning control signal is loaded onto a carrier signal of a preset frequency and derived.
[0012] Further, the digital-to-analog converter comprises a plurality of digital-to-analog converter sub-circuits, and the operational amplifier comprises a plurality of operational amplifier sub-circuits.
[0013] Each of the digital-to-analog converter sub-circuits is connected to one of the operational amplifier sub-circuits and can be connected to a corresponding inertial device through the operational amplifier sub-circuit.
[0014] Further, the signal control instruction comprises one or more of a frequency tuning signal, an excitation control signal, and a quadrature suppression signal.
[0015] Further, the quadrature tuning control signal comprises one or more of a drive frequency tuning signal, a detection frequency tuning signal, a drive excitation signal, a detection excitation signal, an A-direction quadrature suppression signal, and a B-direction quadrature suppression signal.
[0016] Further, the displacement detection signal comprises one or more of a drive displacement detection signal and a detection displacement detection signal.
[0017] In a second aspect, the present application provides a debugging device for debugging the performance of an inertial device, comprising:
[0018] The analog device of any of the preceding aspects;
[0019] The digital device is capable of connecting the input end of the digital-to-analog converter through the output end, and exporting a signal control instruction for debugging the inertial device; and the input end is capable of connecting the output end of the analog-to-digital converter, and importing the displacement detection signal.
[0020] The digital device is capable of processing the displacement detection signal to generate a signal control instruction for debugging the inertial device.
[0021] Further, the debugging device further comprises a connector.
[0022] The output end of the digital device is connected to the input end of the digital-to-analog converter through the connector.
[0023] The input end of the digital device is connected to the output end of the analog-to-digital converter through the connector.
[0024] Further, the digital device further comprises a communication interface capable of connecting a host computer.
[0025] The host computer is used to display the debugging result of the inertial device.
[0026] In a third aspect, the present application provides an inertial device performance testing system, comprising:
[0027] The debugging device of any one of the preceding aspects is used to debug the performance of the inertial device to make the performance of the inertial device optimal.
[0028] An inertial device performance testing device is used to test the performance of the inertial device after the inertial device is debugged via the debugging device.
[0029] Overall, compared with the prior art, the above technical solutions conceived by the present application can achieve the following beneficial effects:
[0030] (1) The present application can repeatedly debug the inertial device before testing the inertial device by the structural design of the simulation device, and the inertial device can be tested when the performance is optimal, thereby improving the testing accuracy of the inertial device.
[0031] (2) The simulation device of the present application is provided with a plurality of digital-to-analog converter sub-circuits and a plurality of operational amplifier sub-circuits, each digital-to-analog converter sub-circuit is connected to one operational amplifier sub-circuit, and can be connected to one corresponding inertial device through the operational amplifier sub-circuit, so that a plurality of inertial devices can be simultaneously debugged, thereby greatly improving the debugging efficiency of the inertial device. BRIEF DESCRIPTION OF DRAWINGS
[0032] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0033] Figure 1 A structural block diagram of a debugging device for performance debugging of an inertial device is provided for the embodiments of the present application. DETAILED DESCRIPTION
[0034] In order to make the purpose, technical solutions and advantages of the present application more clear, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not to limit the present application. In addition, the technical features involved in each embodiment of the present application described below can be combined with each other as long as they do not conflict with each other.
[0035] The terms "comprising" or "having," and any variations thereof, in the specification, claims, or drawings of this application are intended to cover a non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the steps or units listed, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to such processes, methods, products, or apparatus.
[0036] As described in the background section of this specification, most existing inertial device testing methods employ a three-axis turntable, placing the MEMS inertial device directly on it for testing. However, MEMS inertial devices often exhibit significant offset errors, which frequently lead to inaccurate test results and low precision, failing to meet daily needs. Therefore, this application proposes a simulation device, debugging device, and testing system for inertial device performance debugging, used to optimize performance before formal performance testing of inertial devices, thereby improving the testing accuracy.
[0037] refer to Figure 1 One embodiment of this application provides a simulation device for performance tuning of inertial devices (i.e., Figure 1 The analog board, the analog device includes at least a signal processing circuit and a capacitor-to-voltage conversion circuit.
[0038] Signal processing circuitry is used to receive digital signals (i.e., ... Figure 1 The digital board sends signal control commands (including one or more of frequency tuning signals, excitation control signals, and quadrature suppression signals) to the inertial device for debugging, processes the signals, and sends the quadrature tuning control signals (including one or more of drive frequency tuning signals, detection frequency tuning signals, drive excitation signals, detection excitation signals, A-axis quadrature suppression signals, and B-axis quadrature suppression signals) generated after signal processing to the inertial device to achieve the debugging of the inertial device performance.
[0039] The capacitor-to-voltage conversion circuit is used to receive the detected displacement signal fed back by the inertial device and, after processing, generate a displacement detection signal (including one or more of the drive displacement detection signal and the detected displacement detection signal) to be sent to the digital device.
[0040] The signal processing circuit is also used to receive encoded signal control commands (including one or more of frequency tuning signals, excitation control signals, and quadrature suppression signals) sent by the digital device for debugging inertial devices. The signal control commands are generated by the digital device after receiving the displacement detection signals (including one or more of drive displacement detection signals and detection displacement detection signals) generated by the capacitor-voltage conversion circuit and encoding them.
[0041] The signal processing circuit is also configured to process the signal control instructions for debugging the inertial device after encoding, and send the generated corresponding quadrature tuning control signals (including one or more of the drive frequency tuning signal, the detection frequency tuning signal, the drive excitation signal, the detection excitation signal, the A-to-quadrature rejection signal, and the B-to-quadrature rejection signal) to the inertial device to achieve re-debugging of the performance of the inertial device.
[0042] More specifically, referring to Figure 1 , the signal processing circuit can include one or more signal processing sub-circuits, each of which includes a digital-to-analog converter sub-circuit (DAC chip) and an operational amplifier sub-circuit.
[0043] The digital-to-analog converter sub-circuit is configured to convert the signal control instructions from digital signals to corresponding analog signals. The operational amplifier sub-circuit is configured to perform operational amplification on the analog signals generated by the digital-to-analog converter sub-circuit to generate the quadrature tuning control signals.
[0044] Each signal processing sub-circuit includes an inertial device connection interface, which is a component disposed Figure 1 on the right side of the operational amplifier, and is either a physical structure interface or a port on the operational amplifier. Each inertial device connection interface can be connected to an inertial device. The signal processing sub-circuit can transmit the quadrature tuning control signals to the corresponding inertial device through the inertial device connection interface.
[0045] The C / V circuit (capacitance-to-voltage conversion circuit) includes a signal modulator, a signal demodulator, and an ADC (analog-to-digital converter) chip. The C / V circuit is the core circuit in a micro-mechanical sensor (such as a MEMS gyroscope or accelerometer), and is responsible for converting the small capacitance changes of the sensor's sensitive structure into measurable voltage signals.
[0046] The signal modulator is configured to convert the detection displacement signals fed back by the inertial device from analog signals to corresponding digital signals suitable for transmission or storage. The signal demodulator is configured to convert the digital signals via the signal modulator into analog signals that can be displayed as images. The analog-to-digital converter is configured to convert the analog signals via the signal demodulator into digital signal type displacement detection signals that are convenient for data processing and analysis.
[0047] Preferably, Figure 1The analog device can further include a carrier circuit for loading the quadrature tuning control signal onto a carrier signal of a preset frequency to achieve effective transmission of the signal. The carrier circuit is a communication technology that loads the original information signal onto the carrier of a specific frequency through the modulation and demodulation process, so as to achieve effective transmission of the signal. The carrier signal can be a sine wave or other waveform, which carries information by adjusting its amplitude, frequency or phase. The carrier circuit is mainly responsible for generating and modulating the carrier signal, which can include oscillators (such as crystal oscillators), amplifiers and filters, etc. The crystal oscillator circuit provides a reference frequency, and the follower is used for signal buffering or amplification, for example, the role of the emitter follower in radio frequency modulation.
[0048] The application can repeatedly test and debug the inertial device before testing the inertial device, so that the inertial device can be tested when its performance is better, thereby improving the testing accuracy of the inertial device. The analog device of the application is provided with a plurality of digital-to-analog converter sub-circuits and a plurality of operational amplifier sub-circuits, each digital-to-analog converter sub-circuit is connected to an operational amplifier sub-circuit, and can be connected to a corresponding inertial device through the operational amplifier sub-circuit, so that a plurality of inertial devices can be debugged at the same time, thereby greatly improving the debugging efficiency of the inertial device.
[0049] Reference Figure 1 Another embodiment of the application provides a debugging device for performance debugging of an inertial device, which comprises at least a digital device (i.e. Figure 1 digital board) and the analog device (i.e. Figure 1 analog board) of the foregoing embodiment.
[0050] The digital device is used to send a signal control instruction (including one or more of a frequency tuning signal, an excitation control signal and a quadrature suppression signal) for debugging the inertial device, receive and encode the displacement detection signal (including one or more of a driving displacement detection signal and a detection displacement detection signal) generated by the foregoing analog device, and then send the signal control instruction for debugging the performance of the inertial device after the encoding to the foregoing analog device.
[0051] Reference Figure 1 More specifically, the debugging device can include a digital board (digital device), a connector and an analog board (analog device). The digital board is connected to the analog board through the connector, and the analog board can be connected to at least one inertial device, which is a gyroscope and / or an accelerometer.
[0052] The digital board can include a power supply, a FLASH chip ( Figure 1The Flash chip is a non-volatile memory, which mainly functions to store data and can retain the stored content after power failure. The Flash chip realizes long-term data storage through charge storage technology, and the specific working principle is based on the MOSFET (Insulated Gate Field Effect Transistor) and the floating gate structure. Figure 1 The FPGA in the FPGA chip (Field-Programmable Gate Array) is a programmable logic chip with high flexibility and configurability, which can realize specific logic functions through programming. FPGA is widely used in multiple fields, including communication, electronics, video signal processing, aerospace, and communication interface. The FGPA chip is connected to the FLASH chip and the communication interface; the FLASH chip is used to import programs into the FPGA chip, and the communication interface is used to connect the host computer, which displays the debugging results of the inertial device. The communication interface includes a network port and a serial port.
[0053] The analog board can include a power supply, a carrier circuit, a signal processing circuit, and a C / V circuit. The carrier circuit can include a crystal oscillator circuit and a follower. The signal processing circuit can include multiple groups of DAC chips and operational amplifiers. The C / V circuit can include a signal modulator, a signal demodulator, and an ADC chip.
[0054] The FPGA chip of the digital board sends signal control instructions, which are divided into frequency tuning signals, excitation control signals, and quadrature suppression signals. After being processed by the signal processing circuit of the analog board, the signals generate drive frequency tuning and detection frequency tuning signals, drive excitation and detection excitation signals, and A-to-quadrature suppression and B-to-quadrature suppression signals, which are then sent to at least one inertial device. The at least one inertial device generates a detection displacement signal based on the received signals and feeds back to the C / V circuit of the analog board. After processing by the C / V circuit, drive displacement detection signals and detection displacement detection signals are generated and fed back to the FPGA chip. The FPGA chip sends signal control instructions again based on the received drive displacement detection signals and detection displacement detection signals, which are processed by the analog board and then sent to the inertial device. After multiple debugging feedback and re-debugging, the inertial device can achieve optimal performance.
[0055] The FPGA chip can encode the signals and send the encoded signal control instructions to the at least one inertial device. After receiving the signal control instructions, each inertial device feeds back the corresponding encoded offset signal (the aforementioned detection displacement signal) to the FPGA chip. The FPGA chip sends signal control instructions to the corresponding inertial device again based on the corresponding encoded offset signal, thereby realizing the debugging of the at least one inertial device and greatly improving the debugging efficiency.
[0056] The specific technical details of the simulation board and the specific technical functions of the debugging device can refer to the specific embodiments of the simulation device described above, and will not be described here.
[0057] Yet another embodiment of the present application provides an inertial device performance testing system, which can include the debugging device mentioned in the foregoing embodiments and an inertial device performance testing device.
[0058] The foregoing debugging device is used to debug the performance of the inertial device to make it optimal. The specific technical details can refer to the specific embodiments of the debugging device and the simulation device described above, and will not be described here.
[0059] The inertial device performance testing device is used to test the performance of the inertial device after debugging by the debugging device.
[0060] Those skilled in the art can understand that the technical features described in various embodiments and / or claims of the present application can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present application. In particular, the technical features described in various embodiments and / or claims of the present application can be combined and / or combined in various ways without departing from the spirit and teachings of the present application, and all such combinations and / or combinations fall within the scope of the present application.
[0061] Although the present application has been shown and described with reference to certain exemplary embodiments thereof, it should be understood by those skilled in the art that various changes in form and detail can be made therein without departing from the spirit and scope of the present application as defined by the appended claims and their equivalents. Therefore, the scope of the present application should not be limited to the above-described embodiments, but should be determined only by the appended claims, and should be defined by the equivalents of the appended claims.
Claims
1. An analog device for inertial device performance commissioning, characterized by, comprising: a digital-to-analog converter, an input end of which is connectable to an output end of a digital device capable of sending signal control instructions for debugging an inertial device, and an output end of which is connected to an input end of an operational amplifier; the operational amplifier, an output end of which is connectable to one or more inertial devices, and which is capable of leading out quadrature tuning control signals generated by the digital-to-analog converter; a signal modulator, an input end of which is connectable to one or more inertial devices, and which is capable of leading in detection displacement signals fed back by the inertial devices, and an output end of which is connected to an input end of a signal demodulator; the signal demodulator, an output end of which is connected to an input end of an analog-to-digital converter; the analog-to-digital converter, an output end of which is connectable to an input end of the digital device, and which is capable of leading out generated displacement detection signals.
2. The simulation apparatus of claim 1, wherein further comprising: a carrier circuit, an output end of which is connectable to one or more inertial devices, and which is capable of leading out the quadrature tuning control signals loaded onto carrier signals of preset frequencies.
3. The simulation device of claim 1, wherein: the digital-to-analog converter comprises a plurality of digital-to-analog converter sub-circuits, and the operational amplifier comprises a plurality of operational amplifier sub-circuits; each digital-to-analog converter sub-circuit is connected to one operational amplifier sub-circuit.
4. The simulation apparatus of claim 1, wherein the signal control instructions comprise one or more of frequency tuning signals, excitation control signals, and quadrature suppression signals.
5. The simulation apparatus of claim 1, wherein the quadrature tuning control signals comprise one or more of drive frequency tuning signals, detection frequency tuning signals, drive excitation signals, detection excitation signals, A-direction quadrature suppression signals, and B-direction quadrature suppression signals.
6. The simulation apparatus of claim 1, wherein the displacement detection signals comprise one or more of drive displacement detection signals and detection displacement detection signals.
7. A debugging apparatus for debugging performance of an inertial device, characterized by comprising: comprising: the simulation device of any one of claims 1-6; a digital device, an output end of which is connectable to an input end of the digital-to-analog converter, and which is capable of leading out signal control instructions for debugging the inertial device; an input end of which is connectable to an output end of the analog-to-digital converter, and which is capable of leading in the displacement detection signals; the digital device is capable of processing the displacement detection signals to generate signal control instructions for debugging the inertial device.
8. The debugging apparatus of claim 7, wherein further comprising: a connector; an output end of the digital device is connected to an input end of the digital-to-analog converter through the connector; an input end of the digital device is connected to an output end of the analog-to-digital converter through the connector.
9. The debugging apparatus of claim 7, wherein the digital device further comprises a communication interface connectable to a host computer; the host computer is used to display debugging results of the inertial device.
10. An inertial device performance testing system, characterized by, comprising: the debugging device of any one of claims 7-9, which is used to debug performance of the inertial device to make the performance optimal; an inertial device performance testing device, which is used to test performance of the inertial device after debugging via the debugging device.