Electronic probe test bench convenient to replace

Abstract

The utility model discloses an electronic probe test bed convenient to replace. An electric push rod is installed on the upper surface of a test bed body, a transverse plate is installed on the end portion of the telescopic end of the electric push rod, a sliding block is installed on the upper surface of the transverse plate through a translation mechanism, a fixing column is installed on the outer surface of the sliding block, and a disc is rotationally installed on the outer surface of the fixing column. Four connectors are coaxially mounted on the outer surface of the disc at equal angles, and probes are mounted at the ends of the connectors through connecting mechanisms; and four positioning holes are coaxially formed in the outer surface of the disc around the fixed column at equal angles. The four probes of different models are installed on the disc at a time, and the purpose of randomly switching the probes for use can be achieved through positioning cooperation of the fixing bolts and the positioning holes, so that repeated disassembly and assembly operation is not needed when the probes are replaced every time, switching of the probes among different test requirements becomes very fast, and the test efficiency is improved. The experiment efficiency is obviously improved, and the use is very flexible.

Description

TECHNICAL FIELD

[0001] The utility model relates to electronic probe test bench technical field especially, relates to a kind of electronic probe test bench of convenient replacement. BACKGROUND

[0002] Electronic probe test bench is a kind of precision instrument for material micro area composition analysis, and the element type and content are analyzed by high-energy electron beam bombarding sample surface, exciting characteristic X-ray.Its core includes electron optics system, X-ray detector and signal processing system, and is suitable for material science, geology, biology and other fields, with high precision, high resolution characteristics, can be qualitative and quantitative analysis to small area, is the important tool of research and industrial detection.

[0003] At present, when using electronic probe to carry out experiment, due to the performance requirement of different experimental samples to electronic probe, different models of probe are often replaced to meet experimental demand.However, the existing electronic probe is usually fixed on the equipment by screw, and the replacement process is not only cumbersome to operate, but also needs the aid of tool, greatly increases the difficulty and time cost of replacement.

[0004] In addition, dismounting operation needs to be repeated every time when replacing probe, and the process is complex and time-consuming, which seriously affects experimental efficiency, and is not flexible to use. UTILITY MODEL CONTENT

[0005] In order to solve the above technical problems, the utility model provides a kind of electronic probe test bench convenient to replace.

[0006] The utility model provides the following technical scheme: a kind of electronic probe test bench convenient to replace, including test bench body, the upper surface of test bench body is equipped with electric push rod, the end of electric push rod telescopic end is equipped with transverse plate, the upper surface of transverse plate is equipped with sliding block by translation mechanism, the outer surface of sliding block is equipped with fixed column, the outer surface of fixed column is rotatably installed with disc.The outer surface of disc is coaxially installed with four connecting heads at equal angles, and the end of connecting head is equipped with probe by connecting mechanism.Four positioning holes are set on the outer surface of disc around fixed column coaxial line at equal angles, fixed plate is installed on the outer surface of fixed column, fixed bolt is installed in fixed plate, and fixed bolt is matched with positioning hole.

[0007] Preferably, translation mechanism includes two vertical plates installed on the upper surface of transverse plate, two mutually parallel slide rods are installed between two vertical plates, sliding block is slidably installed on two slide rods, threaded rod is rotatably installed between two vertical plates, threaded rod penetrates the inside of sliding block and is screw-threaded with it, the outer surface of one side vertical plate is equipped with servo motor, and the end of servo motor output shaft is connected with threaded rod.

[0008] Preferably, the connecting mechanism includes a connecting sleeve installed on the outer surface of the probe, the surface of the connecting sleeve having a through hole, a connecting rod installed on the outer surface of the connector, the surface of the connecting rod having a mounting hole, and a push rod installed inside the mounting hole via a spring A, the push rod being adapted to the through hole.

[0009] Preferably, four fixing blocks are installed coaxially and at equal angles on the outer surface of the disc, and a tactile switch is installed on the outer surface of the fixing block, and the tactile switch is electrically connected to the connector.

[0010] Preferably, a telescopic rod is installed on the outer surface of the fixed block, a round head is installed at the end of the telescopic rod, a spring B is sleeved on the outer surface of the telescopic rod, the two ends of the spring B abut against the fixed block and the round head respectively, and a pressure rod is installed on the outer surface of the round head.

[0011] Preferably, sliding sleeves are installed on both outer surfaces of the upright plate, and limit rods are slidably installed inside the sliding sleeves, with the bottom of the limit rods connected to the upper surface of the test bench body.

[0012] Compared with existing technologies, the beneficial effects of this utility model are:

[0013] (1) This utility model can quickly install the probe by inserting the connecting rod into the connecting sleeve and pushing the top rod into the through hole under the push of the spring A. The probe can be removed by simply pressing the top rod into the connecting sleeve. No tools are needed for disassembly and assembly, which can greatly reduce the difficulty and time cost of probe replacement and is convenient to use.

[0014] (2) This utility model can achieve the purpose of switching between probes at will by installing four different types of probes on the disc at one time and by positioning the fixing bolts and positioning holes. This eliminates the need to repeat the disassembly and assembly operation every time the probe is replaced, making the switching of probes between different testing needs extremely fast, significantly improving experimental efficiency and making it very flexible to use. Attached Figure Description

[0015] Figure 1 This is a three-dimensional schematic diagram of the overall structure of this utility model;

[0016] Figure 2 This is a schematic diagram of the translation mechanism in this utility model;

[0017] Figure 3 This is a schematic diagram of the structure of the disc in this utility model;

[0018] Figure 4 for Figure 3 Enlarged diagram of A in the middle;

[0019] Figure 5 This is a schematic diagram of the connecting mechanism in this utility model. DETAILED DESCRIPTION

[0020] As Figures 1 to 5 shown, a convenient replacement electronic probe test bench, including test bench body 100, electric push rod 101, cross plate 102, sliding block 103, fixed column 104, disc 105, connecting head 106, probe 107, positioning hole 108, fixed plate 109, fixed bolt 110, translation mechanism 200, vertical plate 201, sliding rod 202, threaded rod 203, servo motor 204, connecting mechanism 300, connecting sleeve 301, through hole 302, connecting rod 303, mounting hole 304, spring A 305, jacking rod 306, fixed block 400, micro switch 401, telescopic rod 500, round head 501, spring B 502, pressing rod 503, sliding sleeve 600, limiting rod 601.

[0021] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all the embodiments.

[0022] In the description of the present application, unless otherwise specified, the meaning of "multiple" is two or more than two; the orientations or position relationships indicated by the terms "upper", "lower", "left", "right", "inner", "outer", "front end", "rear end", "head", "tail" and the like are based on the orientations or position relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and are not intended to indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second", "third" and the like are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0023] In the description of the present application, it should be noted that, unless otherwise specified and limited, the terms "connected", "connected" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0024] As Figures 1 to 5As shown, the upper surface of the test bench body 100 is provided with an electric push rod 101, the end of the telescopic end of the electric push rod 101 is provided with a horizontal plate 102, the upper surface of the horizontal plate 102 is provided with a sliding block 103 through a translation mechanism 200, the translation mechanism 200 can drive the disc 105 to move along the horizontal direction, which is convenient for detecting different positions of electronic products, the outer surface of the sliding block 103 is provided with a fixed column 104, and the outer surface of the fixed column 104 is rotatably provided with the disc 105. The outer surface of the disc 105 is coaxially and equally angularly provided with four connecting heads 106, the end of the connecting head 106 is provided with a probe 107 through a connecting mechanism 300, the disc 105 can rotate on the outer surface of the fixed column 104, so that different models of probes 107 can be selected for use, the probes 107 can be quickly switched, and the probes 107 can be quickly replaced through the arrangement of the connecting mechanism 300. According to the experimental requirements, after four different models of probes 107 are quickly installed, different probes 107 can be flexibly switched during the experiment, so that the experimental efficiency is improved. Four positioning holes 108 are formed in the outer surface of the disc 105 around the coaxial line of the fixed column 104 at equal angles, the outer surface of the fixed column 104 is provided with a fixed plate 109, the inside of the fixed plate 109 is provided with a fixed bolt 110, and the fixed bolt 110 is matched with the positioning hole 108. By screwing the fixed bolt 110 into the positioning hole 108, the disc 105 can be fixed, and the purpose of switching the probe 107 is achieved.

[0025] The translation mechanism 200 comprises two vertical plates 201 installed on the upper surface of the horizontal plate 102, two mutually parallel slide rods 202 are installed between the two vertical plates 201, the sliding block 103 is slidingly installed on the two slide rods 202, a threaded rod 203 is rotatably installed between the two vertical plates 201, the threaded rod 203 penetrates the inside of the sliding block 103 and is threadedly connected therewith, the outer surface of one of the vertical plates 201 is provided with a servo motor 204, the end of the output shaft of the servo motor 204 is connected with the threaded rod 203, when the servo motor 204 is started, the output shaft drives the threaded rod 203 to rotate. Since the slide rod 202 limits the sliding block 103, under the driving of the threaded connection, the sliding block 103 can move along the length direction of the threaded rod 203, and the purpose of driving the disc 105 to move horizontally is achieved, and the detection position of the electronic product can be flexibly changed. The outer surfaces of the two vertical plates 201 are provided with slide sleeves 600, the inside of the slide sleeve 600 is slidingly provided with a limiting rod 601, and the bottom of the limiting rod 601 is connected with the upper surface of the test bench body 100. Through the arrangement of the slide sleeve 600 and the limiting rod 601, the horizontal plate 102 is more stable and smooth when lifting, and has higher structural strength.

[0026] The connecting mechanism 300 comprises a connecting sleeve 301 mounted on the outer surface of the probe 107, the surface of the connecting sleeve 301 is provided with a through hole 302, the outer surface of the connecting head 106 is provided with a connecting rod 303, the surface of the connecting rod 303 is provided with a mounting hole 304, the inside of the mounting hole 304 is provided with a jacking rod 306 through a spring A 305, the jacking rod 306 is matched with the through hole 302, the probe 107 is connected with the connecting head 106, at the same time, the jacking rod 306 is pressed into the mounting hole 304 first, then the connecting rod 303 is inserted into the connecting sleeve 301, when the probe 107 is completely connected with the connecting head 106, the position of the jacking rod 306 is moved to the through hole 302, at this time, the jacking rod 306 is no longer blocked by the inner wall of the connecting sleeve 301, and under the elastic pushing of the mounting hole 304, the jacking rod 306 can be inserted into the through hole 302, so as to achieve the purpose of quickly and fixedly connecting the probe 107 with the connecting head 106.

[0027] The outer surface of the disc 105 is coaxially provided with four fixed blocks 400 at equal angles, the outer surface of the fixed block 400 is provided with a tactile switch 401, and the tactile switch 401 is electrically connected with the connecting head 106, the power switch of the probe 107 is controlled through the tactile switch 401, so that the four probes 107 can be controlled individually, unnecessary energy waste is avoided, and the situation that the body is hurt due to accidental touch of the probe 107 at other positions during the experiment is avoided. The outer surface of the fixed block 400 is provided with an extension rod 500, the end of the extension rod 500 is provided with a round head 501, the outer surface of the extension rod 500 is provided with a spring B 502, the two ends of the spring B 502 are respectively abutted with the fixed block 400 and the round head 501, the outer surface of the round head 501 is provided with a pressing rod 503, when the disc 105 is rotated to drive the probe 107 to be used to move to the position directly below, the end of the fixed plate 109 is just extruded to the round head 501 in this direction, the extension rod 500 and the spring B 502 are compressed by extrusion, and the pressing rod 503 is driven to contact with the tactile switch 401, so as to achieve the purpose of automatically opening the power switch, and the three pressing rods 503 at other positions are not in contact with the tactile switch 401 under the elastic pushing of the spring B 502, so that the other three probes 107 are not connected with the power supply, therefore, the experimenters do not need to control the tactile switch 401 individually each time, the probe 107 to be used can be ensured to have power, and the other three probes 107 have no power, so the complexity of operation is reduced, and it is safer, and the situation that the body is hurt due to accidental touch is avoided.

[0028] It needs to be explained that the inside of the disc 105 is provided with a main circuit, which is connected with four sub-circuits, and the four sub-circuits are connected with the four connecting heads 106 respectively, and the light touch switch 401 is connected in series on the sub-circuit, so as to control the opening or closing of the connecting head 106, so that the power supply of the four probes 107 can be controlled individually, which is a common circuit connection mode in the prior art, and the utility model does not make any improvement, so it is not necessary to make a detailed description here.

[0029] The working principle of the utility model is as follows:

[0030] In use, the experimental personnel can select the four different models of probes 107 required to be used according to the experimental requirements and install them on the four connecting heads 106 through the connecting mechanism 300, place the electronic product on the surface of the test table body 100, and then drive the probes 107 to descend through the electric push rod 101, so that the electronic product can be detected, and in the detection process, the servo motor 204 can be started to drive the threaded rod 203 to rotate, so that the disc 105 can be horizontally moved, the detection position of the probes 107 on the electronic product can be flexibly changed, and when it is required to switch the probes 107, the fixing bolt 110 is only required to be screwed out of the current positioning hole 108, then the disc 105 is rotated, when the probe 107 required to be used is moved to the position directly below, the end of the fixed plate 109 is just extruded to the round head 501 in the position, the round head 501 is driven to compress the telescopic rod 500 and the spring B 502 through extrusion, and the pressure rod 503 is driven to contact the light touch switch 401, so that the purpose of automatically opening the power switch is achieved, and the three pressure rods 503 in other positions are not in contact with the light touch switch 401 under the elastic pushing of the spring B 502, so that the other three probes 107 are not connected with the power supply, then the fixing bolt 110 is screwed into the positioning hole 108 to fix the disc 105, and the detection can be continued through the electric push rod 101 to drive the probes 107 to descend.

[0031] The above is only a preferred specific embodiment of the utility model, but the protection scope of the utility model is not limited to this, any skilled person in the technical field can make equivalent replacement or change according to the technical scheme and the utility model concept of the utility model within the technical range disclosed by the utility model, which should be covered in the protection scope of the utility model.

Claims

1. An easily replaceable electron probe test stand, comprising a test stand body (100), characterized in that: An electric push rod (101) is mounted on the upper surface of the test bench body (100). A horizontal plate (102) is mounted on the end of the telescopic end of the electric push rod (101). A slider (103) is mounted on the upper surface of the horizontal plate (102) via a translation mechanism (200). A fixed column (104) is mounted on the outer surface of the slider (103). A disc (105) is rotatably mounted on the outer surface of the fixed column (104). Four discs (105) are mounted coaxially and at equal angles on the outer surface of the disc (105). A connector (106) is provided, and a probe (107) is installed at the end of the connector (106) through a connecting mechanism (300). Four positioning holes (108) are provided on the outer surface of the disc (105) at equal angles to the coaxial axis of the fixing post (104). A fixing plate (109) is installed on the outer surface of the fixing post (104). A fixing bolt (110) is installed inside the fixing plate (109), and the fixing bolt (110) is adapted to the positioning holes (108).

2. The easily replaceable electron probe test stand according to claim 1, characterized in that: The translation mechanism (200) includes two vertical plates (201) installed on both sides of the upper surface of the horizontal plate (102). Two parallel sliding rods (202) are installed between the two vertical plates (201). The slider (103) is slidably installed on the two sliding rods (202). A threaded rod (203) is rotatably installed between the two vertical plates (201). The threaded rod (203) passes through the interior of the slider (103) and is threadedly connected to it. A servo motor (204) is installed on the outer surface of one of the vertical plates (201). The end of the output shaft of the servo motor (204) is connected to the threaded rod (203).

3. The easily replaceable electron probe test stand according to claim 1, characterized in that: The connecting mechanism (300) includes a connecting sleeve (301) installed on the outer surface of the probe (107). The surface of the connecting sleeve (301) is provided with a through hole (302). The outer surface of the connector (106) is provided with a connecting rod (303). The surface of the connecting rod (303) is provided with a mounting hole (304). A push rod (306) is installed inside the mounting hole (304) by means of a spring A (305). The push rod (306) is adapted to the through hole (302).

4. The easily replaceable electron probe test stand according to claim 1, characterized in that: Four fixing blocks (400) are installed coaxially and at equal angles on the outer surface of the disk (105). A tactile switch (401) is installed on the outer surface of the fixing block (400), and the tactile switch (401) is electrically connected to the connector (106).

5. The easily replaceable electron probe test stand according to claim 4, characterized in that: A telescopic rod (500) is installed on the outer surface of the fixed block (400). A round head (501) is installed at the end of the telescopic rod (500). A spring B (502) is sleeved on the outer surface of the telescopic rod (500). The two ends of the spring B (502) abut against the fixed block (400) and the round head (501) respectively. A pressure rod (503) is installed on the outer surface of the round head (501).

6. The easily replaceable electron probe test stand according to claim 2, characterized in that: Sliding sleeves (600) are installed on both outer surfaces of the upright plate (201). A limiting rod (601) is slidably installed inside the sliding sleeve (600), and the bottom of the limiting rod (601) is connected to the upper surface of the test bench body (100).

Images