Test switching device and test system
By combining conductive probe holes and limiting structures, the difficulty of testing small packaged devices using traditional oscilloscope probe grounding methods is solved, achieving efficient and reliable grounding connections, simplifying operation and improving test accuracy and stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-26
- Publication Date
- 2026-03-27
AI Technical Summary
Traditional oscilloscope probe grounding methods have problems such as large ground interference, cumbersome operation, easy short circuit, difficulty in making reliable contact, need for manual control of force, and potential damage to circuits when testing small packaged devices.
The test adapter uses conductive probe holes, conductive elastic structures, and limiting structures. The conductive elastic structure serves as a bridge between the ground electrode of the oscilloscope probe and the ground terminal of the component under test, while the limiting structure fixes the movable end, avoiding welding and manual force control, thus achieving a reliable connection.
It simplifies testing operations, reduces testing errors, improves the accuracy and consistency of test results, reduces the risk of damage to the tested components, and adapts to the testing needs of various small-packaged devices.
Smart Images
Figure CN224052274U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of electronic circuit testing, in particular to a test adapter and a test system. BACKGROUND
[0002] In the research and development, production and debugging process of electronic devices, an oscilloscope is a widely used test instrument for measuring and analyzing various characteristics of electrical signals. In order to accurately measure the signal, the oscilloscope probe (probe) needs to be reliably connected to the signal end and the ground end of the measured circuit (component). For small packaged devices such as 0201, 0402, etc., due to their small size, the traditional test method has many problems.
[0003] The common oscilloscope probe grounding methods currently include using a grounding ring and a grounding clip, or using a grounding spring. When using a grounding ring and a grounding clip, a long tail ground line is needed, which will introduce a large ground interference, affecting the accuracy of the test results. Especially for small packaged devices, the flying line operation is not only cumbersome, but also easy to cause short circuit and damage the device when the flying line is miscontacted. While the related grounding spring reduces the ground interference to a certain extent, since it is a flexible device, the position is uncertain during placement and removal. When testing small packaged devices, it is difficult to ensure reliable contact with the reference ground, the operation is difficult, and it is easy to contact other elements and cause damage. In addition, in the traditional test method, the force may need to be controlled manually to ensure good contact during the test, which not only increases the complexity of the operation, but also may cause the test results to be inaccurate due to human factors. Moreover, for some test scenarios, the measured circuit may need to be welded to achieve ground connection, which is a destructive operation that will cause irreversible changes to the measured circuit, and an additional process is needed to repair the circuit after the test is completed. CONTENT OF THE INVENTION
[0004] The test adapter and the test system provided by the present application can improve the accuracy and consistency of the test results.
[0005] In a first aspect, the present application provides a test adapter, which comprises: a conductive probe hole, the conductive probe hole is used for a test pole of an external test probe to pass through, the test pole is used for contacting a signal end of a measured component; a hole wall of the conductive probe hole is used for electrically connecting with a ground pole of the test probe, the ground pole is arranged at an outer periphery of the test pole and is mutually insulated with the test pole; a conductive elastic structure, the conductive elastic structure comprises a fixed end and a movable end, the fixed end is electrically connected with the hole wall of the conductive probe hole, and the movable end is used for contacting a ground end on the measured component; a limiting structure, the limiting structure is used for fixing the movable end when the movable end contacts the ground end on the measured component.
[0006] The conductive elastic structure comprises a conductive elastic piece, and a test adapter probe.
[0007] The conductive elastic piece is a spring.
[0008] The test adapter probe comprises a test adapter piece in the shape of a rod and a first limiting piece in the shape of a rod.
[0009] The first limiting piece is provided with at least two protruding parts at intervals, and the different protruding parts are matched with the limiting structure to fix the test adapter piece at different positions.
[0010] The test adapter device further comprises a platform provided with a hollow area, and the movable end is arranged in the hollow area and can move in the hollow area.
[0011] The limiting structure comprises a plurality of second limiting pieces arranged on the platform at intervals along the extension direction of the conductive elastic structure and located outside the hollow area.
[0012] Each second limiting piece comprises two limiting protrusions located on both sides of the hollow area.
[0013] The platform comprises a support table provided with the hollow area and a support column arranged below the support table.
[0014] In the second aspect, the application provides a test system comprising an oscilloscope and the test adapter device provided in the first aspect.
[0015] The test adapter device and the test system provided by the application use the conductive probe hole and the conductive elastic structure as a bridge between the ground pole of the external test probe and the ground end of the measured component, so that the ground pole of the external test probe and the measured component do not need to be welded, reducing the damage to the measured component.
[0016] And the platform provides support for the conductive probe hole, the conductive elastic structure and the limiting structure, so as to ensure the stability of the whole device during the test. BRIEF DESCRIPTION OF DRAWINGS
[0017] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor. Among them:
[0018] Figure 1 is a structural schematic diagram of an embodiment of the test switching device provided by the present application;
[0019] Figure 2 is a left view of Figure 1 ;
[0020] Figure 3 is a top view of Figure 1 ;
[0021] Figure 4 is a partial structural schematic diagram of the test switching device provided by the present application;
[0022] Figure 5 is a structural schematic diagram of an embodiment of the test system provided by the present application. DETAILED DESCRIPTION
[0023] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the drawings of the embodiments of the present application. It can be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application. In addition, it should be noted that only the parts related to the present application are shown in the drawings, but not all the structures. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
[0024] In this paper, "embodiment" means that the specific features, structures or characteristics described in combination with the embodiment can be included in at least one embodiment of the present application. The phrase appears at various places in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment to other embodiments. Those skilled in the art explicitly and implicitly understand that the embodiments described herein can be combined with other embodiments.
[0025] In the research and development, production and debugging process of electronic devices, oscilloscope is a widely used test instrument for measuring and analyzing various characteristics of electrical signals. In order to accurately measure the signal, the oscilloscope probe (probe) needs to be reliably connected to the signal end and the ground end of the measured circuit (component). For small packaged devices such as 0201, 0402, etc., due to their small size, there are many problems with traditional testing methods.
[0026] The common oscilloscope probe grounding methods at present include using grounding ring and grounding clamp, or using grounding spring. When using grounding ring and grounding clamp, long tail ground wire needs to be used, which will introduce large ground interference and affect the accuracy of test results. Especially for small packaged devices, the flying wire operation is not only cumbersome, but also easy to cause short circuit and damage the equipment when the flying wire is miscontacted. While the related grounding spring reduces the ground interference to a certain extent, but since it is a flexible device, the position is uncertain during placement and removal. When testing small packaged devices, it is difficult to ensure reliable contact with the reference ground, and the operation is difficult, and it is easy to contact other elements and cause damage. In addition, the traditional testing method may need to control the force manually to ensure good contact during the testing process, which not only increases the complexity of the operation, but also may cause inaccurate test results due to human factors. Moreover, for some test scenarios, it may be necessary to weld the measured circuit to achieve ground connection, which is a destructive operation that will cause irreversible changes to the measured circuit, and an additional process is needed to repair the circuit after the test is completed.
[0027] Based on this, the test adapter and test system provided by the application use the conductive probe hole and the conductive elastic structure as the bridge between the ground pole of the external test probe and the ground end of the measured component, so that the ground pole of the external test probe and the measured component do not need to be welded, reducing the damage to the measured component, and when the movable end of the conductive elastic structure contacts the ground end on the measured component, the movable end is fixed by the limiting structure, without the need for test personnel to manually control the force to ensure good contact, not only simplifying the test operation, but also reducing the test error caused by improper human force control, and improving the accuracy and consistency of the test results. For specific technical solutions, please refer to any of the following embodiments.
[0028] Referring to Figures 1 to 4 The test adapter includes a conductive probe hole 4, a conductive elastic structure, a limiting structure 8 and a platform.
[0029] The conductive probe hole 4 is used for a test probe of an external tester to pass through, and the test probe is used to contact a signal terminal of a device under test. A hole wall of the conductive probe hole is used to be electrically connected with a ground terminal of the test probe, and the ground terminal is arranged at an outer periphery of the test probe and is insulated from the test probe. The test probe can be a test probe of an oscilloscope. In some embodiments, an outer side wall of the test probe can be used as the ground terminal of the test probe, that is, the ground terminal of the test probe is arranged at the outer periphery of the test probe and is insulated from the test probe. In a test process, the test probe of the oscilloscope can be inserted into the conductive probe hole 4, and the ground terminal of the test probe is electrically connected with the hole wall of the conductive probe hole 4. The test terminal of the test probe passes through the conductive probe hole 4 and contacts the signal terminal on the device under test. The test terminal of the test probe can be in the form of a signal pin.
[0030] The conductive elastic structure includes a fixed end and a movable end. The fixed end is electrically connected with the hole wall of the conductive probe hole 4, and the movable end is used to contact a ground terminal on the device under test. When the signal pin of the test probe contacts the signal terminal on the device under test, and the movable end of the conductive elastic structure contacts the ground terminal on the device under test, a test loop is formed, and the oscilloscope can perform corresponding signal acquisition.
[0031] In some embodiments, the fixed end is electrically connected with the outside of the hole wall of the conductive probe hole. As shown in FIG. 1, the conductive elastic structure can include a conductive elastic member 5 and a test adapter probe. The test adapter probe can be composed of a conductive metal. Figure 1
[0032] The first end of the conductive elastic member 5 is connected with the hole wall of the conductive probe hole 4 as the fixed end. The conductive elastic member 5 is a spring. The spring can provide different distance changes by using its elastic expansion and contraction capability, so that the test adapter probe contacts different ground terminals.
[0033] The test adapter probe is connected with the second end of the conductive elastic member 5 and contacts the ground terminal on the device under test as the movable end. It can be understood that the test adapter probe has conductivity.
[0034] Further, the test adapter probe includes a test adapter member 6 and a first limiting member 7.
[0035] The test adapter member 6 can be in the form of a rod and is connected with the second end of the conductive elastic member 5. The test adapter member 6 has conductivity.
[0036] The first limiting member 7 can be in the shape of a rod, connected to the test adapter 6, and used to be fixed by the limiting structure 8 when the test adapter 6 contacts the ground terminal on the device under test. For example, the limiting structure 8 fixes the test adapter 6. In some embodiments, the first limiting member 7 can or can not have conductivity. For example, the first limiting member 7 and the test adapter 6 are connected at an angle, such as perpendicular to each other, i.e., the first limiting member 7 and the test adapter 6 are at 90 degrees. For example, the first limiting member 7 and the test adapter 6 can be at an angle of 45 degrees, 60 degrees, 100 degrees, or 120 degrees, etc.
[0037] In some embodiments, at least two protruding parts (not shown in the figure) are arranged on the first limiting member 7 at intervals, and different protruding parts cooperate with the limiting structure 8 to fix the test adapter 6 at different positions. In this way, the first limiting member 7 can be moved in the first direction to cope with the case that the device under test has multiple ground terminals in the first direction, and to complete the contact with the ground terminal in the first direction. The first direction is perpendicular to the length direction of the conductive elastic member 5.
[0038] In some embodiments, the test adapter 6 is a ground pin, and the first limiting member 7 is a horizontal rod.
[0039] The limiting structure 8 is arranged on the platform, and is used to fix the movable end when it contacts the ground terminal on the device under test. In some embodiments, the ground terminal can be a ground position (ground terminal) of the device under test or a signal terminal. The ground position (ground terminal) of the device under test is used for grounding in the subsequent use of the device under test. The device under test can refer to a circuit board or the like. Multiple ground positions (ground terminals) can be arranged on the circuit board.
[0040] The platform is provided with a hollow area, the conductive probe hole 4 is arranged on the side wall of the hollow area, the conductive elastic structure can be stretched and contracted in the hollow area, and the limiting structure 8 is arranged on the platform along the length direction of the conductive elastic structure. The movable end of the conductive elastic structure can be composed of two parts. The first part is used to contact the ground terminal on the device under test. The second part is used to contact the limiting structure 8, so that the limiting structure 8 can constrain the conductive elastic structure and fix it to stabilize the test. That is, the platform is provided with a hollow area, the movable end of the conductive elastic structure is arranged in the hollow area and can move in the hollow area, and the lower part of the hollow area is used to place the device under test during the test.
[0041] In some embodiments, the platform includes a support table 1 and a support column 2. The support table 1 is provided with a hollow area 3. The support column 2 is arranged below the support table 1, and the number of support columns 2 can be arranged according to the actual situation, such as four support columns 2, which are arranged at different positions below the support table 1, so that there is a space between the plane where the support table 1 and the support column 2 are located.
[0042] In some embodiments, during the testing process, such as Figure 2 As shown, the component under test (DUT) 9 is placed below the cutout area 3 (e.g., directly below). It can be understood that the DUT 9 can be moved and repositioned during testing. That is, the DUT 9 is positioned on the plane of the support column 2. During testing, the user can see the DUT 9 below and its grounding terminal from above the cutout area 3. Based on this, by adjusting the position of the conductive elastic structure on the defined structure, contact with the grounding terminal is achieved. The signal pin of the test probe passes through the conductive probe hole 4 and contacts the signal terminal on the DUT, thereby enabling the testing of the DUT 9.
[0043] In this embodiment, the conductive probe hole 4 and the conductive elastic structure serve as a bridge between the ground electrode of the oscilloscope's test probe and the ground terminal of the component under test 9. This eliminates the need to solder the ground electrode of the oscilloscope's test probe to the component under test, reducing damage to the component under test. Furthermore, when the movable end contacts the ground terminal on the component under test, the limiting structure 8 secures the movable end, eliminating the need for manual force control by the tester to ensure good contact. This simplifies the testing operation, reduces testing errors caused by improper force control, and improves the accuracy and consistency of the test results. The platform also provides support for the conductive probe hole 4, the conductive elastic structure, and the limiting structure 8, ensuring the stability of the entire device during the testing process.
[0044] In some embodiments, the limiting structure 8 includes a plurality of second limiting members (not shown), which are spaced apart on the platform along the extension and contraction direction of the conductive elastic structure and located outside the hollow area. Each second limiting member includes two limiting protrusions, which are respectively located on both sides of the hollow area (e.g., Figure 1 (The protrusion corresponding to the middle limiting structure 8). In some embodiments, the second limiting member can be presented as a limiting bead, a clamping member, or a similar structure. When the second limiting member is a clamping member, it can clamp the first limiting member to fix it. By setting at least two second limiting members at intervals on the platform, the test adapter probe can be fixed in at least two positions. Therefore, when there are at least two grounding terminals on the component under test, the test can be completed by changing the fixed position of the test adapter probe, thereby improving test efficiency.
[0045] In one application scenario, taking the aforementioned platform as the test platform, the conductive elastic structure as a spring and a grounding pin, and the limiting structure 8 as a limiting bead as an example, the following explanation will be provided.
[0046] The test platform supports and carries other components. The test platform is provided with a hole (conductive probe hole 4) for placing the test probe of the oscilloscope, which provides an accurate placement position for the test probe of the oscilloscope. The test platform is also provided with a groove (hollow area 3), and the hole for placing the probe of the oscilloscope is arranged in the groove. The test platform is supported by four supports (support columns 2), which ensures the stability of the entire device during the test process.
[0047] Spring and grounding pin: in the groove, connected to the hole of the test probe of the oscilloscope is a spring, and the other end of the spring is connected to a grounding pin. This connection allows the grounding pin to have a certain elastic expansion capability under the action of the spring. When the grounding pin contacts the ground terminal of the measured circuit, the spring can provide appropriate force to ensure good contact between the grounding pin and the ground terminal, while avoiding damage to the measured circuit due to excessive pressure.
[0048] Limiting beads: limiting beads are arranged on both sides above the groove. The distance between the limiting beads and the center of the hole of the test probe of the oscilloscope is specially designed to meet the packaging requirements of typical components, such as 0402, 0201, etc. During testing, the measured component is placed on the test platform, with the ground terminal of the component located below the test platform, and then the test probe of the oscilloscope is inserted into the corresponding hole. By moving the grounding pin, the grounding pin contacts the ground terminal of the component. When the grounding pin contacts the ground terminal of the measured component, the grounding pin can be clamped in the appropriate position by the limiting beads, thereby achieving stable testing of the ground terminal of the measured component. Since the position of the limiting beads is designed according to typical component packaging, it can adapt to the testing needs of various common small packaging components without frequent adjustment of the structure of the device.
[0049] During the test process, the measured component does not need to be welded, and the force of the grounding pin contacting the ground terminal does not need to be manually controlled. The tester only needs to operate the oscilloscope for signal measurement and analysis. After the test is completed, the probe of the oscilloscope is pulled out of the hole (conductive probe hole 4) of the test platform, and a test operation is completed. For different types of small packaging components, as long as their packaging conforms to the typical packaging types designed by the limiting beads, they can be tested according to the above steps without additional adjustment or replacement of components.
[0050] Reference Figure 5 , Figure 5 is a structural schematic diagram of an embodiment of the test system provided by the present application, which includes an oscilloscope 20 and a test switching device 10. The test switching device 10 is any one of the test switching devices described above.
[0051] In summary, the test adapter provided by the application can directly and reliably connect with the ground end of the measured circuit (measured component) through the cooperation of the probe and the spring and the positioning effect of the limiting bead, without the need for welding operation on the measured circuit, thereby avoiding damage to the measured circuit and saving time and cost of welding and subsequent repair of the circuit.
[0052] In addition, the elastic property of the spring in the test adapter enables the ground pin to automatically provide appropriate pressure when contacting the ground end of the measured circuit, without the need for human control of the force to ensure good contact. This not only simplifies the test operation, but also reduces test errors caused by improper human force control, thereby improving the accuracy and consistency of the test results.
[0053] In addition, the limiting bead distance design meets the packaging requirements of typical components such as 0402, 0201, etc., so that the device can be widely used in the testing of various common small packaging components, has strong versatility, reduces the need to replace the test device due to differences in packaging of different components, and improves the testing efficiency.
[0054] In addition, the test adapter of the application can improve the testing stability: the test platform is supported by four supports, which ensures the stability of the entire device during the testing process. At the same time, the connection structure of the spring and the ground pin and the positioning effect of the limiting bead enable the ground pin to stably contact the ground end of the measured circuit during the testing process, and it is not easy to be displaced or poorly contacted due to external interference, thereby improving the stability of the testing.
[0055] The above-mentioned 0201 (0.6mm x 0.3mm): ultra-small packaging, suitable for high-frequency circuits (such as RF modules), capacity range 0.5pF-1000pF (capacitance) or resistance range 0.1Ω-20MΩ (resistance), power usually 1 / 20W-1 / 8W.
[0056] The above-mentioned 0402 (1.0mm x 0.5mm): medium-capacity packaging, capacitance up to 1μF-10μF, resistance error 1% or 5%, suitable for power filtering and decoupling.
Claims
1. A test adapter, characterized in that, The test adapter includes: A conductive probe hole is provided for the test electrode of an external test probe to pass through, and the test electrode is used to contact the signal terminal of the component under test; the hole wall of the conductive probe hole is used to electrically connect with the ground electrode of the test probe, and the ground electrode is located on the outer periphery of the test electrode and is insulated from the test electrode. A conductive elastic structure includes a fixed end and a movable end. The fixed end is electrically connected to the wall of the conductive probe hole, and the movable end is used to contact the grounding terminal on the component under test. A limiting structure is provided to fix the movable end when it contacts the grounding terminal on the component under test.
2. The test adapter according to claim 1, characterized in that, The conductive elastic structure includes: A conductive elastic element, wherein the first end of the conductive elastic element serves as the fixed end and is connected to the hole wall of the conductive probe hole; A test adapter probe is connected to the second end of the conductive elastic element and serves as the movable end to contact the ground terminal on the component under test.
3. The test adapter according to claim 2, characterized in that, The conductive elastic element is a spring.
4. The test adapter according to claim 2, characterized in that, The test adapter probe includes: The test adapter is rod-shaped and connects to the second end of the conductive elastic element; The first limiting member is rod-shaped and is connected at an angle to the test adapter. It is used to fix the test adapter to the grounding terminal on the device under test by the limiting structure.
5. The test adapter according to claim 4, characterized in that, The first limiting member has at least two protrusions spaced apart, and different protrusions cooperate with the limiting structure to fix the test adapter in different positions.
6. The test adapter according to claim 1, characterized in that, The test adapter also includes a platform with a hollowed-out area. The movable end passes through the hollowed-out area and can move within the hollowed-out area. During the test, the area below the hollowed-out area is used to place the component under test.
7. The test adapter according to claim 6, characterized in that, The limiting structure includes a plurality of second limiting members, which are spaced apart on the platform along the extension and retraction direction of the conductive elastic structure and located outside the hollow area.
8. The test adapter according to claim 7, characterized in that, Each of the second limiting members includes two limiting protrusions, which are located on both sides of the hollowed-out area.
9. The test adapter according to claim 8, characterized in that, The platform includes: A support platform, wherein the support platform is provided with the hollowed-out area; A support column is provided below the support platform.
10. A testing system, characterized in that, The test system includes an oscilloscope and a test adapter as described in any one of claims 1-9.