One-stop BITS / H2 aging voltage bias test system

The voltage pull-off test system, which integrates a central control module and a high-precision timer, solves the problems of limited functionality and complex operation of existing test systems, and achieves efficient and accurate testing of electronic equipment, meeting the rapid testing needs of large-scale production.

CN224052311UActive Publication Date: 2026-03-27金士通智能科技(东莞)有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-01-21
Publication Date
2026-03-27

AI Technical Summary

Technical Problem

Existing electronic equipment testing systems are limited in function and complex in operation, making it difficult to achieve comprehensive one-stop testing. This results in low testing efficiency and fails to meet the rapid testing needs of large-scale production.

Method used

A one-stop BITS/H2 aging voltage bias test system was designed, integrating a central control module, a time setting module, a voltage regulation component, a voltage detection unit, a wireless communication module, and a display and control terminal. It adopts a high-precision SVI crystal oscillator timer and an independent voltage regulation module to support diverse test requirements, and interacts with the display terminal through the wireless communication module.

Benefits of technology

It significantly reduces the complexity of device connections, improves the accuracy and repeatability of test results, meets diverse testing needs, and enhances user experience and testing efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of electronic equipment testing, in particular to a one-stop BITS / H2 aging voltage bias test system, which comprises a central control module, a time setting module, a voltage regulation and control assembly, a voltage detection unit, a wireless communication module, a display and control terminal and a plurality of plug boards, the time setting module, the voltage regulation and control assembly, the voltage detection unit and the wireless communication module are electrically connected with the central control module through data transmission lines respectively, and each plug disc is provided with a plurality of disc position connection interfaces used for being connected with SSDs; according to the one-stop BITS / H2 aging voltage bias test system, the central control module, the time setting module, the voltage regulation and control assembly, the voltage detection unit, the wireless communication module, the display and control terminal and the plurality of plug boards are highly integrated, so that the equipment connection complexity is remarkably reduced, and the fault risk caused by compatibility is reduced; small-batch testing in research and development laboratories and large-scale detection in production lines are facilitated
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Description

TECHNICAL FIELD

[0001] The utility model relates to electronic equipment test technical field especially relates to a system that can complete BITS H2 aging voltage pull -off test in one station. BACKGROUND

[0002] In the research and development and production process of electronic equipment, it is crucial to ensure the stability and reliability of the equipment under different working conditions. For equipment involving BITS / H2 technology, aging voltage pull-off test is a key link to evaluate its performance. However, the existing test system has many drawbacks, such as single function, unable to meet diversified testing needs; complex operation, increasing the work difficulty and time cost of test personnel; difficult to realize one-stop comprehensive test, resulting in low test efficiency, unable to meet the requirements of rapid detection of products in large-scale production environment. Therefore, an innovative test system is needed to solve these problems. SUMMARY

[0003] The utility model aims at providing a technical scheme that can solve the above problems.

[0004] A one-stop BITS / H2 aging voltage pull-off test system, comprising a central control module, a time setting module, a voltage regulation component, a voltage detection unit, a wireless communication module, a display and control terminal, and a plurality of plug-in boards, the time setting module, the voltage regulation component, the voltage detection unit, and the wireless communication module are respectively electrically connected to the central control module through data transmission lines, and each plug-in board is provided with a plurality of board position connection interfaces for connecting SSDs.

[0005] The time setting module is provided with a timer and a data storage unit, and the timer and the data storage unit are respectively electrically connected to the central control module through data transmission lines; the voltage regulation component comprises a plurality of voltage regulation modules, each voltage regulation module is electrically connected to the corresponding plug-in board through an independent voltage output line; the voltage detection unit is provided with a plurality of voltage sensors for detecting 5.0V voltage, and each voltage sensor is electrically connected to the corresponding plug-in board through a wire; the wireless communication module is electrically connected to the central control module through a data transmission line, so that the central control module interacts with the display and control terminal through the wireless communication module; the display and control terminal has an APP display interface, and the display and control terminal is provided with a display driving line and a touch sensing line connected to the APP display interface, and the display and control terminal is further provided with a data processing and transmission line to interact with the wireless communication module.

[0006] Preferably, the central control module comprises a control chip of STM32H7 type and a voltage stabilizing circuit electrically connected to the control chip.

[0007] Preferably, the timer employs an SVI crystal oscillator as a clock source.

[0008] Preferably, the insert disc is provided with 80, and each insert disc is provided with 7 disc position connection interfaces.

[0009] Compared with the prior art, the utility model has the beneficial effects that:

[0010] The one-stop BITS / H2 aging voltage pull-off test system highly integrates the central control module, the time setting module, the voltage regulation component, the voltage detection unit, the wireless communication module, the display and control terminal and multiple insert discs, significantly reduces the equipment connection complexity, reduces the fault risk caused by compatibility, and facilitates small-batch testing of research and development laboratories and large-scale detection of production lines. The timer employing the high-precision SVI crystal oscillator in the time setting module provides accurate time reference for testing, guarantees the consistency of test conditions, and improves the accuracy and repeatability of results. The independent module of the voltage regulation component can accurately regulate the voltage of each insert disc, meet various testing requirements, and ensure the purity and stability of the output voltage. The voltage detection unit monitors the insert disc voltage in real time, provides data for the central control module, ensures that the voltage deviation is within the allowable range, and guarantees the reliability and safety of testing. The wireless communication module cooperates with the APP display interface of the display and control terminal, facilitates users to set parameters, monitor the testing process in real time and view the results, and improves the user experience.

[0011] The additional aspects and advantages of the utility model will be partially given in the following description, partially will become obvious from the following description, or will be understood through the practice of the utility model. BRIEF DESCRIPTION OF DRAWINGS

[0012] In order to more clearly illustrate the technical scheme in the embodiments of the utility model or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description, and obviously, the drawings in the following description are only some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained according to these drawings without paying the creative labor.

[0013] Fig. 1 It is a structural schematic diagram of the utility model;

[0014] Fig. 2 It is a module connection block diagram of the utility model;

[0015] Fig. 3 It is another module connection block diagram of the utility model.

[0016] The reference signs and names in the drawings are as follows:

[0017] The central control module 10, the time setting module 11, the timer 111, the data storage unit 112, the voltage regulation assembly 12, the voltage regulation module 121, the voltage detection unit 13, the voltage sensor 131, the wireless communication module 14, the display and control terminal 15, the plugboard 16, and the disc position connection interface 17. DETAILED DESCRIPTION

[0018] The technical solutions in the embodiments of the utility model will be described clearly and completely below. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all the other embodiments obtained by those skilled in the art without creative labor belong to the protection scope of the utility model.

[0019] Please refer to Figs. 1-3 In the embodiments of the utility model, a one-stop BITS / H2 aging voltage pull-off test system includes a central control module 10, a time setting module 11, a voltage regulation assembly 12, a voltage detection unit 13, a wireless communication module 14, a display and control terminal 15, and multiple plugboards 16. The central control module 10 includes a control chip with a model of STM32H7 and a voltage stabilizing circuit electrically connected to the control chip. The time setting module 11, the voltage regulation assembly 12, the voltage detection unit 13, and the wireless communication module 14 are electrically connected to the central control module 10 through data transmission lines. Each plugboard 16 is provided with multiple disc position connection interfaces 17 for connecting SSDs. Preferably, each plugboard 16 is provided with 80 disc position connection interfaces 17, and each plugboard 16 is provided with 7 disc position connection interfaces 17, which can provide 560 disc position connection interfaces 17 to connect 60 SSDs for testing at one time. Wherein:

[0020] The time setting module 11 is provided with a timer 111 and a data storage unit 112, the timer 111 adopts an SVI crystal oscillator as a clock source, and the timer 111 and the data storage unit 112 are electrically connected with the central control module 10 through data transmission lines; the voltage regulation component 12 includes a plurality of voltage regulation modules 121, each voltage regulation module 121 is electrically connected with the corresponding plug-in disc 16 through an independent voltage output line; the voltage detection unit 13 is provided with a plurality of voltage sensors 131 for detecting 5.0V voltage, each voltage sensor 131 is electrically connected with the corresponding plug-in disc 16 through a wire; the wireless communication module 14 is electrically connected with the central control module 10 through a data transmission line, so that the central control module 10 interacts with the display and control terminal 15 through the wireless communication module 14; the display and control terminal 15 has an APP display interface, and the display and control terminal 15 is provided with a display driving line and a touch sensing line connected to the APP display interface, and the display and control terminal 15 is also provided with a data processing and transmission line to interact with the wireless communication module 14.

[0021] In actual operation, first, the hardware connection work of the equipment is carried out, and it is ensured that the SSD is connected firmly and correctly. After completing the hardware connection, the user operates through the APP display interface of the display and control terminal 15, and the user can easily input the required voltage pull-off time and other test parameters on the interface. These parameters are quickly and accurately transmitted to the wireless communication module 14 through the data processing and transmission line of the display and control terminal 15, and the wireless communication module 14 adopts a Wi-Fi communication protocol or a Bluetooth communication protocol, etc., to transmit the data to the central control module 10 in a wireless manner;

[0022] After the central control module 10 receives the test parameters, the control chip with the model number STM32H7 is matched with a voltage stabilizing circuit, which has overvoltage protection, undervoltage protection and ripple suppression functions, so as to ensure that the working voltage of the control chip is stable within a specific voltage range and the control chip operates stably and efficiently; the central control module 10 issues an instruction to the time setting module 11 through a data transmission line with the time setting module 11 according to the received time parameters; the timer 111 in the time setting module 11 uses an SVI crystal oscillator as a clock source. The SVI crystal oscillator is an environmentally friendly crystal oscillator and belongs to a voltage-controlled crystal oscillator. It has the characteristics of high-precision and ultra-small surface mount technology. Its frequency range is 1.000MHz~80.000MHz, the frequency stability can reach ±20ppm, ±25ppm, ±30ppm, ±50ppm, ±100ppm, etc., the power supply voltage supports +2.5V, +3.3V, +5.0V, the working temperature range is -20℃~+70℃ or -40℃~+85℃, and the aging rate is ±3ppm / year maximum. It can meet the requirements of the timer 111 for different frequencies and accuracies and is suitable for various test equipment. At the same time, the data storage unit 112 of the time setting module 11 is used to store the time parameters set by the user and the test records generated subsequently and other information, so as to facilitate subsequent query and analysis.

[0023] In terms of voltage regulation, the central control module 10 issues an instruction to the voltage regulation assembly 12 according to the preset test procedure. Each voltage regulation module 121 of the voltage regulation assembly 12 includes a voltage conversion chip, a power amplifier and a filter circuit connected in sequence. The voltage conversion chip uses LM2596. When it is necessary to adjust the voltage, the voltage conversion chip first converts the input voltage to an appropriate level, the power amplifier can amplify the voltage, and the filter circuit can ensure the stability of the output voltage. Each voltage regulation module 121 is electrically connected to the corresponding plug-in board 16 through an independent voltage output line. This design allows independent and accurate regulation of the voltage of each plug-in board 16, meeting the diversified demand for voltage in different test scenarios.

[0024] During the entire test process, the voltage detection unit 13 is equipped with multiple voltage sensors 131 for detecting 5.0V voltage. The voltage detection unit 13 feeds back the real-time monitored plug-in board 16 voltage data to the central control module 10 through a data transmission line, the central control module 10 records these data in real time, and transmits the data to the display and control terminal 15 through the wireless communication module 14. The voltage change is displayed in the form of a real-time curve on the APP display interface, which is convenient for the user to monitor at any time.

[0025] When the voltage detection unit 13 detects that the voltage of the plug-in board 16 reaches 5.0V, the central control module 10 operates according to the preset test procedure.

[0026] Specifically, the voltage pull-off test procedure includes the following procedure:

[0027] Voltage pull-off test procedure one:

[0028] The central control module 10 sends instructions to the voltage regulation component 12 to stabilize the voltage at 5.0V BIT state, while the time setting module 11 starts timing, and this state lasts for 5 minutes. During these 5 minutes, the voltage detection unit 13 continuously monitors the voltage, and the central control module 10 compares the monitoring data with the target voltage 5.0V in real time. If the deviation exceeds the preset value, an alarm mechanism is triggered immediately, and the display and control terminal 15 sends alarm information to the display and control terminal 15 through the wireless communication module 14, and the display and control terminal 15 reminds the operator in the form of a pop-up window and sound to handle it in time. At the same time, the system automatically records this abnormal situation, including the abnormal time, actual voltage value, deviation, etc.

[0029] After 5 minutes, the central control module 10 sends instructions to the voltage regulation component 12 to adjust the voltage to 4.75V BIT, and the time setting module 11 re-timing, and maintains this state for 5 minutes. Similarly, voltage monitoring and abnormal comparison and processing are continuously carried out during this period.

[0030] Then, according to the above procedure, the voltage is adjusted to 5.25V BIT and maintained for 5 minutes, and the same monitoring and processing operation is carried out.

[0031] Finally, the voltage is restored to 5.0V BIT, and continues until the user sets the time or the number of laps in the APP. During the whole process, the switching of each voltage state and the recording of the duration are stored in detail in the data storage unit 112 of the time setting module 11, and the corresponding voltage data is also recorded completely for subsequent analysis.

[0032] Voltage pull-off test procedure two:

[0033] When it is detected that the voltage of the plug-in disc 16 reaches 5.0V, the central control module 10 instructs the voltage regulation component 12 to set the voltage to 3.3V BIT, and the time setting module 11 timing, and maintains for 5 minutes. During this period, the voltage is strictly monitored, and once the actual voltage deviates from 3.3V by more than the preset value, the alarm and abnormal recording program is started immediately.

[0034] After 5 minutes, the voltage is adjusted to 3.135V BIT and maintained for 5 minutes, and the same strict voltage monitoring and abnormal processing is carried out.

[0035] Subsequently, the voltage is adjusted to 3.465V BIT and maintained for 5 minutes, and the monitoring and abnormal processing procedure is repeated.

[0036] Finally, the voltage is restored to 3.3VBIT until a set time or number of turns is reached. The data recording and storage in the entire process is consistent with the process.

[0037] Through the above series of detailed and rigorous operation processes, the one-stop BITS / H2 aging voltage bias test system can efficiently and accurately complete the aging voltage bias test work of a large number of SSD devices, and fully demonstrates its significant advantages and practical value in the field of electronic device testing.

[0038] It is apparent for a person skilled in the art that the present application is not limited to the details of the above exemplary embodiments, but can be implemented in other concrete forms without departing from the spirit or essential characteristics of the present application. Therefore, the embodiments should be considered as exemplary and non-limiting, and the scope of the present application is defined by the appended claims rather than the above description, and all changes falling within the meaning and scope of the equivalent elements of the claims are intended to be included in the present application.

Claims

1. A one-stop BITS / H2 burn-in voltage pull-off test system, characterized in that, The application relates to a central control module (10), a time setting module (11), a voltage regulation assembly (12), a voltage detection unit (13), a wireless communication module (14), a display and control terminal (15) and a plurality of plug-in plates (16), the time setting module (11), the voltage regulation assembly (12), the voltage detection unit (13) and the wireless communication module (14) are electrically connected with the central control module (10) through data transmission lines respectively, a plurality of disc position connection interfaces (17) for connecting SSDs are arranged on each plug-in plate (16); wherein: The time setting module (11) is provided with a timer (111) and a data storage unit (112), the timer (111) and the data storage unit (112) are electrically connected with the central control module (10) through data transmission lines respectively; the voltage regulation assembly (12) comprises a plurality of voltage regulation modules (121), each voltage regulation module (121) is electrically connected with the corresponding plug-in plate (16) through an independent voltage output line; the voltage detection unit (13) is provided with a plurality of voltage sensors (131) for detecting 5.0V voltage, each voltage sensor (131) is electrically connected with the corresponding plug-in plate (16) through a wire; the wireless communication module (14) is electrically connected with the central control module (10) through a data transmission line, so that the central control module (10) carries out data interaction with the display and control terminal (15) through the wireless communication module (14); the display and control terminal (15) has an APP display interface, and the display and control terminal (15) is provided with a display driving line and a touch sensing line connected with the APP display interface, and the display and control terminal (15) is further provided with a data processing and transmission line to carry out data interaction with the wireless communication module (14).

2. A one-stop BITS / H2 burn-in voltage pull-off test system, characterized in that, The central control module (10) comprises a control chip with a model of STM32H7 and a voltage stabilizing circuit electrically connected with the control chip.

3. A one-stop BITS / H2 burn-in voltage pull-off test system, characterized in that, The timer (111) adopts an SVI crystal oscillator as a clock source.

4. A one-stop BITS / H2 burn-in voltage pull-off test system, characterized in that, The plug-in plate (16) is provided with 80 plug-in plates (16), and each plug-in plate (16) is provided with seven disc position connection interfaces (17).