MOS antistatic function detection device

Abstract

The utility model discloses an MOS antistatic function detection device, and specifically relates to the MOS detection technology field, comprising a work bench, the top end of the work bench is fixedly provided with a fixed seat, the outer side wall of the fixed seat is provided with a PWM square wave signal generator, the top of the front end of the fixed seat is fixedly connected with an arch-shaped frame, the inner side of the top of the arch-shaped frame is movably connected with a pressing rod, and the pressing rod is fixedly connected with the fixed seat. A sliding sleeve is fixedly connected to the bottom end of the arch-shaped frame, a sliding rod is arranged on the inner side of the sliding sleeve in a penetrating mode in the vertical direction, a hinged shaft wall is movably connected to the top end of the sliding rod, and the top end of the hinged shaft wall is movably connected with the end of the pressing rod. According to the utility model, limitation of a traditional measuring tool on MOS tube function detection can be effectively overcome, whether the MOS function is intact can be rapidly and effectively detected, whether the antistatic capability of the MOS is compliant can be checked by cooperating with an electrometer, whether the MOS is abnormal can be found only by function test after SMT pasting of the MOS, and the detection efficiency is improved. And the abnormal occurrence frequency and the abnormal product rejection rate are reduced.

Description

Technical Field

[0001] This utility model relates to the field of MOS testing technology, and more specifically, to a device for testing the anti-static function of MOS. Background Technology

[0002] In the vast field of semiconductor manufacturing and electronic component production, MOSFETs (Metal-Oxide-Semiconductor) are a key electronic component whose performance stability and reliability directly affect the quality and lifespan of the entire electronic product. However, a long-standing challenge in the production and distribution of MOSFETs is how to efficiently and accurately test their functionality and anti-static properties before raw materials enter the factory.

[0003] Traditionally, functional testing of MOSFETs has relied on conventional measuring tools such as multimeters. However, given the tiny size of MOSFETs (typically only 2mm x 2mm) and the small size of their solder pads (0.2mm x 0.2mm), these traditional tools are inadequate. On the one hand, the tiny size of the MOSFET pins makes it difficult to accurately align the measuring probes of multimeters and other tools (especially critical pins such as G, D, and S), thus increasing the difficulty and error rate of measurement. On the other hand, traditional measurement methods lack intelligence and automation in data processing and result judgment, resulting in low testing efficiency and failing to meet the rapid testing needs of large-scale production lines. Utility Model Content

[0004] In order to overcome the above-mentioned defects of the prior art, this utility model provides a MOS anti-static function testing device.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a MOS anti-static function testing device, comprising a workbench, a fixed base fixedly mounted on the top of the workbench, a PWM square wave signal generator mounted on the outer wall of the fixed base, and an arched frame fixedly connected to the top front end of the fixed base. A pressure rod is movably connected to the inner side of the top of the arched frame, and a sliding sleeve is fixedly connected to the bottom end of the arched frame. A sliding rod is vertically threaded through the inner side of the sliding sleeve, and a hinge wall is movably connected to the top end of the sliding rod. The top end of the hinge wall is movably connected to the end of the pressure rod. A fixture mounting plate is connected to the bottom end of the sliding rod. A support platform is provided at the top of the workbench below the fixture mounting plate. A MOS placement platform for placing MOS is provided at the top of the support platform below the fixture mounting plate. A PCB adapter board is mounted at the bottom of the support platform. A high-frequency probe is mounted on the top of the support platform, and the probe of the high-frequency probe penetrates the support platform and extends to the top of the PCB adapter board.

[0006] As a further improvement to the technical solution of this utility model, a test button is provided at the front end of the workbench, and an indicator light is provided on the top of the workbench near the test button. Support feet are provided at the bottom of the workbench near the four corners.

[0007] As a further improvement to the technical solution of this utility model, the bow-shaped frame and the front end of the fixed base are fixedly connected by bolts.

[0008] As a further improvement to the technical solution of this utility model, the sliding sleeve is welded and fixed to the bottom end of the bow-shaped frame, and the end of the pressure rod is movably connected to the inner top of the bow-shaped frame through a rotating shaft.

[0009] As a further improvement to the technical solution of this utility model, the two ends of the hinge shaft wall are movably connected to the top of the slide rod and the end of the pressure rod through a rotating shaft, and the inner diameter of the cross-section of the sliding sleeve is larger than the outer diameter of the cross-section of the slide rod.

[0010] As a further improvement to the technical solution of this utility model, the top of the workbench is fixedly connected with guide posts inserted into both ends of the fixture mounting plate along the vertical direction, and both ends of the fixture mounting plate are provided with holes for the guide posts to pass through.

[0011] As a further improvement to the technical solution of this utility model, the bottom of the support platform is provided with a groove for inserting the PCB adapter board, and the interior of the MOS placement platform is provided with a slot for placing the MOS above the high-frequency probe.

[0012] The beneficial effects of this utility model are:

[0013] This invention not only effectively overcomes the limitations of traditional measuring tools in MOSFET function testing, but also quickly and effectively detects whether the MOSFET function is intact. Furthermore, when used with an electrostatic meter, it can also check whether the MOSFET's anti-static capability complies with regulations. This can prevent the discovery of MOSFET abnormalities only after SMT surface mount technology has been applied, thereby reducing the frequency of abnormalities and the scrap rate of defective products. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of this utility model.

[0015] Figure 2 This is a side view of the present invention.

[0016] Figure 3 This is a schematic diagram of the installation structure of the PCB adapter board at the bottom of the support platform in this utility model.

[0017] Figure 4 This is a schematic diagram of the contact structure of the high-frequency probe on the PCB adapter board of this utility model.

[0018] Figure 5 This is a schematic diagram of the structure of the high-frequency probe in this utility model.

[0019] The attached diagram is labeled as follows: 1. Workbench; 2. Fixture; 3. PWM square wave signal generator; 4. Bow-shaped frame; 5. Pressure rod; 6. Hinge wall; 7. Slide rod; 8. Slide sleeve; 9. Fixture mounting plate; 10. Guide column; 11. Bearing platform; 12. MOS placement platform; 13. Test button; 14. Indicator light; 15. PCB adapter board; 16. Support foot; 17. Groove; 18. High-frequency probe. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] As attached Figure 1-3 The MOS anti-static function testing device shown includes a workbench 1, a fixed base 2 fixedly mounted on the top of the workbench 1, a PWM square wave signal generator 3 mounted on the outer wall of the fixed base 2, an arched frame 4 fixedly connected to the top front end of the fixed base 2, a pressure rod 5 movably connected to the inner side of the top of the arched frame 4, a sliding sleeve 8 fixedly connected to the bottom end of the arched frame 4, a sliding rod 7 passing through the inner side of the sliding sleeve 8 in a vertical direction, a hinge wall 6 movably connected to the top end of the sliding rod 7, a movably connected top end of the hinge wall 6 and the end of the pressure rod 5, a fixture mounting plate 9 connected to the bottom end of the sliding rod 7, a support platform 11 located below the fixture mounting plate 9 at the top of the workbench 1, a MOS placement platform 12 for placing MOS located below the fixture mounting plate 9 at the top of the support platform 11, a PCB adapter board 15 mounted at the bottom of the support platform 11, a high-frequency probe 18 mounted at the top of the support platform 11, the probe of the high-frequency probe 18 penetrating the support platform 11 and extending to the top of the PCB adapter board 15.

[0022] As attached Figure 1-2 As shown, a test button 13 is provided at the front end of the workbench 1, and an indicator light 14 is provided on the top of the workbench 1 near the test button 13. Support feet 16 are provided at the bottom of the workbench 1 near the four corners to facilitate operation by the operator.

[0023] As attached Figure 1-2 As shown, the bow-shaped frame 4 and the front end of the fixed base 2 are fixedly connected by bolts, which facilitates the connection and fixation of the bow-shaped frame 4 on the outer wall of the fixed base 2.

[0024] As attached Figure 1 As shown, the sliding sleeve 8 is welded and fixed to the bottom end of the bow-shaped frame 4, which facilitates the connection and fixation between the sliding sleeve 8 and the bow-shaped frame 4. The end of the pressure rod 5 is movably connected to the inner top of the bow-shaped frame 4 through a rotating shaft.

[0025] As attached Figure 1 As shown, both ends of the hinge wall 6 are movably connected to the top of the slide rod 7 and the end of the pressure rod 5 via rotating shafts. The inner diameter of the cross-section of the sliding sleeve 8 is larger than the outer diameter of the cross-section of the slide rod 7, which facilitates the sliding sleeve 8 to move up and down stably outside the slide rod 7.

[0026] As attached Figure 1 As shown, the top of the workbench 1 is fixedly connected to the guide posts 10 inserted into both ends of the fixture mounting plate 9 in the vertical direction. Both ends of the fixture mounting plate 9 are provided with holes for the guide posts 10 to pass through, so as to limit the vertical movement of the fixture mounting plate 9 and keep the position stable during the movement.

[0027] As attached Figure 1 and attached Figure 3 As shown, the bottom of the support platform 11 is provided with a groove 17 for inserting the PCB adapter board 15, and the interior of the MOS placement platform 12 is provided with a slot for placing the MOS above the high-frequency probe 18.

[0028] Working principle: This utility model designs a MOS anti-static function detection device, the specific structure of which is shown in the attached instruction manual. Figure 1-5 As shown, when using this technical solution, press the test button, and use the pressure rod 5 to drive the fixture mounting plate 9 to descend to start the test. Use the probe to introduce the 6 solder pins of the MOS onto the PCB adapter board 15. The PCB adapter board 15 is used to route the corresponding D (source +) pin, S (drain -) pin, and G (gate) pin PAD for easy electrostatic discharge. After the G pin of the MOS is subjected to static electricity, power is supplied to the MOS and the LED indicator 14 is observed under the condition of (10K, 10Hz) by the PWM square wave signal generator 3 to determine whether the MOS is statically broken down. If it is flashing, the MOS function is normal. If it is constantly lit or not lit, the MOS function is faulty.

[0029] In the accompanying drawings of the embodiments disclosed in this utility model, only the structures involved in the embodiments of this utility model are shown. Other structures can be referred to with ordinary design. In the absence of conflict, the same embodiment and different embodiments of this utility model can be combined with each other.

[0030] Finally: The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A MOS antistatic function detection device, comprising a workbench (1), characterized in that: The top end of the workbench (1) is fixedly provided with a fixed seat (2), the outer side wall of the fixed seat (2) is provided with a PWM square wave signal generator (3), and the front end top of the fixed seat (2) is fixedly connected with an arc-shaped frame (4), the top inner side of the arc-shaped frame (4) is movably connected with a pressing rod (5), and the bottom end of the arc-shaped frame (4) is fixedly connected with a sliding sleeve (8), the inner side of the sliding sleeve (8) is vertically provided with a sliding rod (7), the top end of the sliding rod (7) is movably connected with a hinge shaft wall (6), the top end of the hinge shaft wall (6) is movably connected with the end of the pressing rod (5), and the bottom end of the sliding rod (7) is connected with a jig mounting plate (9), the top end of the workbench (1) is provided with a bearing table (11) below the jig mounting plate (9), the top of the bearing table (11) is provided with a MOS placing table (12) below the jig mounting plate (9) for placing MOS, and the bottom of the bearing table (11) is provided with a PCB adapter plate (15), the top of the bearing table (11) is provided with a high-frequency probe (18), and the probe of the high-frequency probe (18) penetrates the bearing table (11) and extends to the top of the PCB adapter plate (15).

2. The MOS antistatic function detection device according to claim 1, characterized by: The front end of the workbench (1) is provided with a test button (13), and the top of the workbench (1) is provided with an indicator light (14) on one side close to the test button (13), and the bottom of the workbench (1) is provided with a supporting leg (16) close to the four corner positions.

3. The MOS antistatic function detection device according to claim 1, characterized by: The arc-shaped frame (4) and the front end of the fixed seat (2) are fixedly connected by bolts.

4. The MOS antistatic function detection device according to claim 1, characterized by: The sliding sleeve (8) and the bottom end of the arc-shaped frame (4) are welded and fixed, and the end of the pressing rod (5) and the inner side of the top of the arc-shaped frame (4) are movably connected by a rotating shaft.

5. The MOS antistatic function detection device according to claim 1, characterized by: The two ends of the hinge shaft wall (6) and the top of the sliding rod (7) and the end of the pressing rod (5) are movably connected by rotating shafts, and the cross-sectional inner diameter of the sliding sleeve (8) is greater than the cross-sectional outer diameter of the sliding rod (7).

6. The MOS antistatic function detection device according to claim 1, characterized by: The top of the workbench (1) is fixedly connected with a guide column (10) inserted into the two ends of the jig mounting plate (9) in the vertical direction, and the two ends of the jig mounting plate (9) are provided with holes for the guide column (10) to pass through.

7. The MOS antistatic function detection device according to claim 1, characterized by: The bottom of the bearing table (11) is provided with a groove (17) for placing the PCB adapter plate (15), and the inside of the MOS placing table (12) is provided with a groove for placing MOS above the high-frequency probe (18).

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