Dynamic testing device compatible with various driving modules
By designing a dynamic testing device compatible with multiple driver modules, the problem of insufficient compatibility of existing equipment was solved, the flexibility and versatility of the testing system were improved, the operation process was simplified, and the debugging cost was reduced.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-17
- Publication Date
- 2026-04-03
Smart Images

Figure CN224081701U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of driver module testing, and in particular to a dynamic testing device compatible with multiple driver modules. Background Technology
[0002] Power devices are increasingly used in modern power electronic equipment, especially in high-efficiency inverters, motor drive systems, and electric vehicles. To fully understand the dynamic performance of power devices in actual operation, particularly under high voltage, high current, and high-speed switching conditions, dynamic testing has become a crucial method for performance evaluation. Traditional dynamic testing of power devices typically relies on dedicated testing equipment, which is often only compatible with specific types of drive modules. Different drive modules exhibit significant differences in voltage, current, control methods, and response characteristics, making it impossible for existing testing equipment to provide consistent test results when dealing with multiple drive modules. Furthermore, this process is complex to debug and has high maintenance costs.
[0003] With the continuous development of power electronics technology, various types of power devices and drive modules have emerged in the market. These drive modules have their own unique drive voltage, current waveforms, and control logic, leading to limitations in the compatibility and adaptability of existing testing systems. Therefore, developing a dynamic testing device for power devices that is compatible with multiple drive modules has become particularly important. This testing device can automatically adjust test parameters according to the characteristics of different drive modules, ensuring the accuracy and stability of the test, thereby providing a more reliable testing platform for the research, development, production, application, and performance optimization of power devices. Utility Model Content
[0004] The main objective of this invention is to provide a dynamic testing device compatible with multiple driving modules, which can effectively solve the problems in the background art.
[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows:
[0006] A dynamic testing device compatible with multiple drive modules includes a power supply module, a signal input circuit, a drive switching circuit, a drive configuration circuit, a test circuit, a high-voltage circuit, a drive module, and a power module. The input terminal of the drive switching circuit is electrically connected to the output terminals of the power supply module, the signal input circuit, and the drive configuration circuit. The output terminal of the drive switching circuit is electrically connected to the input terminal of the test circuit. The output terminal of the test circuit is electrically connected to the input terminal of the high-voltage circuit.
[0007] Preferably, the power supply module is the power supply circuit for the test equipment, with an input voltage compatible with 9-36V DC power and an output voltage of 15V DC power.
[0008] Preferably, the signal input circuit includes two BNC sockets, a minimum pulse suppression circuit, a level conversion chip, and a level selection jumper. The signal input circuit is responsible for receiving external signals and transmitting the signals to the drive switching circuit.
[0009] Preferably, the drive switching circuit includes four independent drive switching units, which are compatible with four different drive packages and multiple drive models, and can be plug-and-play without additional switching operations. The drive switching circuit is used to transmit the input signal to the drive module and output the drive voltage signal adapted to the target power period to the power period.
[0010] Preferably, the drive configuration circuit consists of jumpers and resistor bases, and is responsible for configuring various functional parameters of the drive module, including desaturation detection function and active clamping function. The drive configuration circuit supports multiple drive common configuration circuits.
[0011] Preferably, the test circuit includes a high-current terminal and a power module fixed terminal for receiving high-voltage, high-current input from the high-current terminal and transmitting it to the power module; the high-voltage circuit includes a gate signal detection socket, a current detection jumper, and a high-voltage detection terminal. The gate signal detection socket is used to detect the gate-source signal, the current detection jumper is used to detect the current in the circuit in real time, and the high-voltage detection terminal is used to detect the drain-source voltage of the power module.
[0012] Compared with the prior art, the present invention has the following beneficial effects:
[0013] This dynamic test device, compatible with multiple driver modules, can accommodate more than ten different types of power device drivers, significantly improving the flexibility and versatility of the test system. It also effectively enhances test efficiency and is easy to operate. The functionality of more than ten drivers can be configured through jumper settings without any changes to the software or hardware. By achieving compatibility with multiple power device drivers and simplifying operation, it improves test efficiency, reduces debugging time and costs, and enhances the flexibility and versatility of the test system. Attached Figure Description
[0014] Figure 1 This is a structural diagram of the device of this utility model;
[0015] Figure 2 This is the PCB diagram of this utility model;
[0016] Figure 3 This is a flowchart of the present invention;
[0017] Figure 4 This is the circuit diagram of the power supply of this utility model;
[0018] Figure 5 This is the signal input diagram of this utility model;
[0019] Figure 6 This is the gate circuit diagram of this utility model;
[0020] Figure 7 This is the logic level conversion diagram of this utility model;
[0021] Figure 8 This is the driving circuit diagram of this utility model;
[0022] Figure 9 This is a circuit diagram of the configuration of this utility model;
[0023] Figure 10 This is the active clamping diagram of this utility model;
[0024] Figure 11 This is a diagram of the supporting capacitor of this utility model.
[0025] In the diagram: 1. Power supply module; 2. Signal input circuit; 3. Drive switching circuit; 4. Drive configuration circuit; 5. Test circuit; 6. High-voltage circuit. Detailed Implementation
[0026] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.
[0027] like Figures 1-11As shown, a dynamic testing device compatible with multiple drive modules includes a power supply module 1, a signal input circuit 2, a drive switching circuit 3, a drive configuration circuit 4, a test circuit 5, a high-voltage circuit 6, a drive module, and a power module. The input terminal of the drive switching circuit 3 is electrically connected to the output terminals of the power supply module 1, the signal input circuit 2, and the drive configuration circuit 4. The output terminal of the drive switching circuit 3 is electrically connected to the input terminal of the test circuit 5. The output terminal of the test circuit 5 is electrically connected to the input terminal of the high-voltage circuit 6. The power supply module 1 is the power supply circuit for the testing device, with an input voltage compatible with 9-36V DC power and an output voltage of 15V DC power. The signal input circuit 2 includes two BNC sockets, a minimum pulse suppression circuit, a level conversion chip, and a level selection jumper. The signal input circuit 2 is responsible for receiving external signals and transmitting them to the drive switching circuit 3. The drive switching circuit 3 contains four independent drive switching units. It is compatible with four different driver packages and multiple driver models, and can be used plug-and-play without additional switching operations. The driver switching circuit 3 is used to transmit the input signal to the driver module and output the drive voltage signal adapted to the target power period to the power period. The driver configuration circuit 4 consists of jumpers and resistor bases, and is responsible for configuring various functional parameters of the driver module, including desaturation detection function and active clamping function. The driver configuration circuit 4 supports multiple common configuration circuits for drivers. The test circuit 5 includes a high current terminal and a power module fixed terminal, which is used to receive high voltage and high current input from the high current terminal and transmit it to the power module. The high-voltage circuit 6 includes a gate signal detection socket, a current detection jumper and a high voltage detection terminal. The gate signal detection socket is used to detect the gate-source signal, the current detection jumper is used to detect the current in the loop in real time, and the high voltage detection terminal is used to detect the drain-source voltage of the power module.
[0028] It is compatible with more than ten different types of power device drivers, which significantly improves the flexibility and versatility of the test system and effectively enhances test efficiency. It is also easy to operate, and the function configuration of more than ten drivers can be achieved through jumper settings without any changes to the software or hardware. By achieving compatibility with multiple power device drivers and simplifying operation, it can improve test efficiency, reduce debugging time and cost, and enhance the flexibility and versatility of the test system.
[0029] It should be noted that this utility model is a dynamic testing device compatible with multiple drive modules. When using it, it means that the power device drive module supported by this device is installed into the drive switching circuit 3.
[0030] By using jumpers and resistor bases in the drive configuration circuit 4, the various functional parameters of the drive module can be set, and the level of the input signal can be selected.
[0031] Install the power device to be tested onto the equipment and secure it with three screws;
[0032] Connect the high-voltage terminals of the test equipment to the high-voltage output, connect the 9-36V DC power supply to the power input terminal, connect the signal generator to the signal input circuit, and connect the test probe to test circuit 5. At this point, you can start testing the power device.
[0033] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.
Claims
1. A dynamic testing device compatible with multiple drive modules, comprising a power supply module (1), a signal input circuit (2), a drive switching circuit (3), a drive configuration circuit (4), a test circuit (5), a high-voltage circuit (6), a drive module, and a power module, characterized in that: The input terminal of the drive switching circuit (3) is electrically connected to the output terminals of the power supply module (1), the signal input circuit (2) and the drive configuration circuit (4). The output terminal of the drive switching circuit (3) is electrically connected to the input terminal of the test circuit (5). The output terminal of the test circuit (5) is electrically connected to the input terminal of the high-voltage circuit (6).
2. The dynamic testing device compatible with multiple drive modules according to claim 1, characterized in that: The power module (1) is the power supply circuit for the test equipment. The input voltage is compatible with 9-36V DC power supply, and the output voltage is 15V DC power supply.
3. The dynamic testing device compatible with multiple drive modules according to claim 1, characterized in that: The signal input circuit (2) includes two BNC sockets, a minimum pulse suppression circuit, a level conversion chip, and a level selection jumper. The signal input circuit (2) is responsible for receiving external signals and transmitting the signals to the drive switching circuit (3).
4. The dynamic testing device compatible with multiple driving modules according to claim 1, characterized in that: The drive switching circuit (3) includes four independent drive switching units, which are compatible with four different drive packages and multiple drive models, and can be plug-and-play without additional switching operations. The drive switching circuit (3) is used to transmit the input signal to the drive module and output the drive voltage signal that is adapted to the target power period to the power period.
5. The dynamic testing device compatible with multiple drive modules according to claim 1, characterized in that: The drive configuration circuit (4) consists of jumpers and resistor bases and is responsible for configuring various functional parameters of the drive module, including desaturation detection function and active clamping function. The drive configuration circuit (4) supports multiple drive common configuration circuits.
6. The dynamic testing device compatible with multiple driving modules according to claim 1, characterized in that: The test circuit (5) includes a high-current terminal and a power module fixed terminal, which are used to receive high-voltage high current input from the high-current terminal and transmit it to the power module; the high-voltage circuit (6) includes a gate signal detection socket, a current detection jumper and a high-voltage detection terminal. The gate signal detection socket is used to detect the gate-source signal, the current detection jumper is used to detect the current in the circuit in real time, and the high-voltage detection terminal is used to detect the drain-source voltage of the power module.