Integrated circuit packaging current testing device
The automated loading and unloading mechanism of the integrated circuit package current testing device solves the problems of positional deviation and repeated adjustments caused by manual operation, realizes efficient automated testing of circuit packages, and meets the needs of the modern semiconductor industry for efficient and stable testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-20
- Publication Date
- 2026-04-07
AI Technical Summary
Existing integrated circuit packaging current testing equipment relies on manual operation, which leads to instability in manual chip handling, positional deviations, and repeated adjustments, making it impossible to achieve efficient and continuous testing and limiting the testing needs of mass production.
An integrated circuit package current testing device was designed, which adopts an automated loading and unloading mechanism. Through the cooperation of toothed plates, gears and electric telescopic rods, the automated transfer and precise positioning of circuit packages are realized. The device includes a combination of loading reciprocating plate, moving plate and clamping plate to ensure stable chip picking and pushing.
It achieves highly efficient automation of current testing for circuit packages, avoiding positional deviations and repeated adjustments in manual operation, improving testing efficiency, and is suitable for the automation and stable testing needs in mass production environments.
Smart Images
Figure CN224095956U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to integrated circuit package current test technical field especially relates to a kind of integrated circuit package current test device. BACKGROUND
[0002] Integrated circuit (IC) is a kind of electronic components such as transistor, resistance, capacitance, diode and its interconnection line are integrated on semiconductor substrate, form the circuit unit with specific function.Its manufacture uses photolithography, diffusion, ion implantation, thin film deposition, etching etc.Microelectronic processing technology, constructs nanoscale electronic components on silicon wafer or other semiconductor materials, and is interconnected by wire, realizes signal transmission and processing, and the test after integrated circuit package is important link to ensure its electrical performance stability and quality reliability, and current test can be used to evaluate the power consumption characteristics, leakage condition and overall performance of circuit package under different working conditions.
[0003] The existing cable package current test device relies on manual operation, and the tester needs to manually take and place the chip before each test, and place it on the clamping seat for testing, and when clamping the chip, manual operation may cause unstable clamping, position deviation and other problems, resulting in repeated adjustment of the chip to meet the test requirements.In addition, after the test is completed, the tester also needs to manually take out the chip, and then place and test the next chip, and the whole process has a large number of manual operation steps, cannot realize efficient continuous test, seriously restricts the test demand in large-batch production environment, limits the overall production capacity, and is difficult to meet the requirements of modern semiconductor industry for efficient, stable and automatic test. UTILITY MODEL CONTENTS
[0004] Therefore, the utility model aims at providing an integrated circuit package current test device to solve the problem that the tester needs to manually take and place the chip and place it on the clamping seat for testing, and the whole process has a large number of manual operation steps, cannot realize efficient continuous test, and seriously restricts the test demand in large-batch production environment.
[0005] To achieve the above purpose, the utility model provides an integrated circuit package current test device, which comprises a test table, a concave clamping base is fixedly connected in the test table, an upper conveying belt and a lower conveying belt are arranged on the both sides of the concave clamping base respectively, a supporting plate is fixedly connected in the test table, the shape of the supporting plate is L-shaped, an electric telescopic rod is fixedly connected to the side wall of the supporting plate, the output end of the electric telescopic rod penetrates the side wall of the supporting plate and is fixedly connected with a toothed plate, and an upper and lower feeding mechanism for feeding is arranged in the test table.
[0006] Preferably, the feeding and discharging mechanism comprises a gear rotatably connected to the side wall of the support plate, the outer wall of the gear and the outer wall of the toothed plate are in meshing engagement, the shaft portion of the gear penetrates through the side wall of the support plate and is fixedly connected with a rotating rod, one end of the rotating rod is rotatably connected with a feeding reciprocating plate, the feeding reciprocating plate is L-shaped, the side wall of the support plate is provided with a first sliding groove, the first sliding groove is slidably connected with a sliding block, the feeding reciprocating plate is slidably connected inside the sliding block, the bottom end of the feeding reciprocating plate is fixedly connected with a moving plate, and the bottom of the moving plate is provided with a suction nozzle at four corners.
[0007] Preferably, the side wall of the concave clamping base is provided with a second sliding groove, the top of the concave clamping base is provided with two through grooves, the bottom of the through groove is in communication with the second sliding groove, the inside of the second sliding groove is slidably connected with a discharging plate, the discharging plate is L-shaped, the feeding reciprocating plate is in contact with the side wall of the discharging plate during feeding, the side wall of the discharging plate is fixedly connected with a return spring, one end of the return spring is fixedly connected to the outer wall of the concave clamping base, the top of the discharging plate is rotatably connected with two pushing plates, the pushing plates are in the through grooves, the side wall of the pushing plate is fixedly connected with a first spring, one end of the first spring is fixedly connected to the top of the second sliding groove, and the top of the second sliding groove is fixedly connected with a limiting plate close to the side wall of the pushing plate.
[0008] Preferably, the top of the concave clamping base is slidably connected with a sliding rod on both sides, the outer wall of the sliding rod is sleeved with a second spring, and opposite ends of the sliding rod are fixedly connected with clamping plates.
[0009] Preferably, the top end of the pushing plate extends out of the inside of the through groove.
[0010] Preferably, the clamping plate is arc-shaped.
[0011] The utility model discloses the beneficial effect:
[0012] The integrated circuit package current test device, the feeding and discharging mechanism significantly improves the efficiency of the circuit package current test through automatic transmission and accurate positioning, firstly, the automatic feeding and discharging mechanism drives the gear to rotate through the toothed plate, the gear drives the feeding reciprocating plate to reciprocate, then the feeding reciprocating plate drives the circuit package piece adsorbed at the bottom of the moving plate, and the circuit package piece is stably sucked and sent to the concave clamping base, so that the manual feeding operation is avoided, and the position deviation problem caused by feeding is also avoided, and the position problem of repeated adjustment is avoided, secondly, the feeding reciprocating plate drives the discharging plate to move in the discharging process, and then the pushing plate pushes the tested circuit package piece to one end of the discharging conveying belt, so that the circuit package piece is smoothly discharged and sent to the next link, the whole process is automatically operated, manual intervention is greatly reduced, efficient and continuous feeding and discharging operation is realized, production efficiency is improved, and the device is suitable for large-batch production environment and meets the needs of modern semiconductor industry for automation, high efficiency and stable test. BRIEF DESCRIPTION OF DRAWINGS
[0013] In order to more clearly illustrate the technical scheme of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiment or the prior art description. Obviously, the drawings in the following description are only the present application, and those skilled in the art can obtain other drawings according to these drawings without creative labor.
[0014] Figure 1 It is a whole three-dimensional structure schematic diagram of the present application;
[0015] Figure 2 It is a three-dimensional structure schematic diagram of the feeding and discharging mechanism of the present application;
[0016] Figure 3 It is a three-dimensional structure schematic diagram of the concave clamping base of the present application;
[0017] Figure 4 It is a three-dimensional structure schematic diagram of the second sliding groove and the pushing plate of the present application;
[0018] Figure 5 It is a three-dimensional structure schematic diagram of the pushing plate of the present application.
[0019] In the drawing, the marks are:
[0020] 1, test bench; 2, concave clamping base; 3, feeding transmission belt; 4, discharging transmission belt; 5, support plate; 6, electric telescopic rod; 7, toothed plate; 8, gear; 9, rotating rod; 10, feeding reciprocating plate; 11, first sliding groove; 12, sliding block; 13, moving plate; 14, suction nozzle; 15, second sliding groove; 16, discharging plate; 17, pushing plate; 18, first spring; 19, limiting plate; 20, sliding rod; 21, second spring; 22, clamping plate; 23, through slot; 24, return spring. DETAILED DESCRIPTION
[0021] In order to make the purpose, technical scheme and advantages of the present application more clear, the present application will be further described in detail below with specific examples.
[0022] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the present application should be understood as the usual meaning understood by those skilled in the art to which the present application belongs. The terms "first", "second" and similar terms used in the present application do not represent any order, quantity or importance, but are only used to distinguish different components. The terms "include" or "contain" and similar terms mean that the elements or objects before the term cover the elements or objects listed after the term and their equivalents, without excluding other elements or objects. The terms "connect" or "connected" and similar terms are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. The terms "up", "down", "left", "right" and the like are only used to represent relative positional relationships, which may change accordingly when the absolute position of the described object changes.
[0023] As shown in Figures 1 to 5 An integrated circuit package current test device, comprising a test bench 1, a concave clamping base 2 is fixedly connected inside the test bench 1, feeding transmission belts 3 and discharging transmission belts 4 are arranged on both sides of the concave clamping base 2 respectively, a support plate 5 is fixedly connected inside the test bench 1, the shape of the support plate 5 is L-shaped, electric telescopic rods 6 are fixedly connected to the side wall of the support plate 5, the output ends of the electric telescopic rods 6 penetrate through the side wall of the support plate 5 and are fixedly connected with toothed plates 7, and an upper and lower feeding mechanism for feeding and discharging is arranged inside the test bench 1.
[0024] Further, with reference to the accompanying Figures 2 to 5As shown, the feeding and discharging mechanism comprises a gear 8 rotatably connected to the side wall of the support plate 5, the outer wall of the gear 8 and the outer wall of the toothed plate 7 are meshed with each other, the shaft part of the gear 8 penetrates through the side wall of the support plate 5 and is fixedly connected with a rotating rod 9, one end of the rotating rod 9 is rotatably connected with a feeding reciprocating plate 10, the feeding reciprocating plate 10 is in the shape of L, the side wall of the support plate 5 is provided with a first sliding groove 11, a sliding block 12 is slidably connected in the first sliding groove 11, the feeding reciprocating plate 10 is slidably connected in the sliding block 12, the bottom end of the feeding reciprocating plate 10 is fixedly connected with a moving plate 13, suction nozzles 14 are arranged on the four corners of the bottom of the moving plate 13, a second sliding groove 15 is formed in the side wall of the concave clamping base 2, two through grooves 23 are formed in the top of the concave clamping base 2, the bottom of the through groove 23 is in communication with the second sliding groove 15, a discharging plate 16 is slidably connected in the second sliding groove 15, the discharging plate 16 is in the shape of L, the side wall of the feeding reciprocating plate 10 will be in contact with the side wall of the discharging plate 16 during feeding, the side wall of the discharging plate 16 is fixedly connected with a return spring 24, one end of the return spring 24 is fixedly connected to the outer wall of the concave clamping base 2, two pushing plates 17 are rotatably connected to the top of the discharging plate 16, the pushing plates 17 are in the through grooves 23, the top end of the pushing plates 17 extends out of the inside of the through grooves 23, the side wall of the pushing plates 17 is fixedly connected with first springs 18, one end of the first springs 18 is fixedly connected to the top of the second sliding groove 15, the top of the second sliding groove 15 is fixedly connected with a limiting plate 19 near the side wall of the pushing plate 17;
[0025] Before the feeding and discharging mechanism operates, first turn on the power supply, and start the feeding conveying belt 3 and the discharging conveying belt 4 through the external driving source, then place the assembled circuit package on the feeding conveying belt 3, and convey it to the bottom of the moving plate 13 by the conveying belt, at this time, start the electric telescopic rod 6, the output end drives the toothed plate 7 to extend forward, the toothed plate 7 drives the gear 8 to rotate, the gear 8 further drives the rotating rod 9 to rotate, thereby driving the feeding reciprocating plate 10 to move horizontally;
[0026] During the movement of the feeding reciprocating plate 10, the sliding block 12 slides along the first sliding groove 11, effectively limiting the feeding reciprocating plate 10, avoiding the situation that the feeding reciprocating plate 10 rotates with the rotating rod 9, making the feeding reciprocating plate 10 move in an arc trajectory, when the feeding reciprocating plate 10 moves to the top of the feeding conveying belt 3, the bottom end drives the moving plate 13 to move downward, making the moving plate 13 accurately align with the top of the circuit package;
[0027] Subsequently, the output end of the external vacuum pump is connected with the suction nozzle 14, the suction nozzle 14 forms suction force at four corners of the circuit package, ensures stable extraction of the circuit package, at this time, the electric telescopic rod 6 is retracted, the toothed plate 7 is reversely moved, the toothed plate 7 reversely rotates the gear 8, and further reversely rotates the rotating rod 9, so that the feeding reciprocating plate 10 is moved back, when the circuit package is transported to the upper side of the concave clamping base 2, the two sides of the moving plate 13 extrude the clamping plate 22, so that the clamping plate 22 drives the slide rod 20 to move to both sides, then the vacuum pump is turned off, the suction nozzle 14 releases the suction force, and the circuit package is accurately dropped into the concave clamping base 2;
[0028] At this time, the electric telescopic rod 6 is started again, the toothed plate 7 continues to extend forward, the moving plate 13 leaves the concave clamping base 2, and the next circuit package is prepared to be sucked, at the same time, the clamping plate 22 stably clamps the circuit package, waits for the worker to test, after the test is completed, the electric telescopic rod 6 is started, the feeding operation is repeated, and the discharging transmission process is triggered at the same time;
[0029] When the feeding reciprocating plate 10 moves to the direction of the discharging conveying belt 4, the discharging plate 16 is pushed, the discharging plate 16 slides along the second sliding groove 15, and drives the pushing plate 17 to move forward, at the same time, the return spring 24 is compressed, the pushing plate 17 pushes the side wall of the circuit package when moving forward, and the movement angle of the pushing plate 17 is ensured to be accurate through the limiting plate 19, and finally the circuit package is pushed to one end of the discharging conveying belt 4. Subsequently, the discharging conveying belt 4 transports the circuit package to the next link, and completes the entire discharging process;
[0030] In addition, after each feeding operation is completed, the return spring 24 releases the spring force, so that the discharging plate 16 returns to the initial position. When the discharging plate 16 is reset, the pushing plate 17 contacts the side wall of the circuit package, and the first spring 18 is compressed under the action of the circuit package, so that the pushing plate 17 is swung outward, so as to avoid hindering the resetting of the discharging plate 16, and ensure the smoothness and stability of the entire feeding and discharging process;
[0031] The feeding and discharging mechanism improves the efficiency of the current test of the circuit package by automatic transmission and accurate positioning. Firstly, the automatic feeding and discharging mechanism drives the gear 8 to rotate by the toothed plate 7, and the gear 8 drives the feeding reciprocating plate 10 to reciprocate, then the feeding reciprocating plate 10 drives the circuit package adsorbed on the bottom of the moving plate 13 to be stably sucked and sent to the concave clamping base 2, avoiding the operation of manual feeding and the position deviation problem caused by feeding, and avoiding the position problem of repeated adjustment. Secondly, the feeding reciprocating plate 10 drives the discharging plate 16 to move and then drives the pushing plate 17 to move during the discharging process, then the pushing plate 17 pushes the tested circuit package to one end of the discharging conveying belt 4, ensuring smooth discharging and sending to the next link. The whole process is automatically operated, greatly reducing manual intervention, realizing efficient and continuous feeding and discharging operation, improving production efficiency, and being suitable for large-batch production environment and meeting the needs of modern semiconductor industry for automation, high efficiency and stable test.
[0032] Further, referring to the accompanying drawings Figure 4 As shown in the drawings, the top of the concave clamping base 2 is slidably connected with a slide rod 20 on both sides, the outer wall of the slide rod 20 is sleeved with a second spring 21, the opposite end of the slide rod 20 is fixedly connected with a clamping plate 22, the second spring 21 is fixedly connected on the side wall of the clamping plate 22, the other end of the second spring 21 is fixedly connected on the side wall of the concave clamping base 2, the shape of the clamping plate 22 is arc-shaped, the clamping plate 22 is pushed to move to the side wall of the circuit package and clamped by the spring force of the second spring 21, avoiding the displacement affecting the detection of the circuit package during detection.
[0033] Those skilled in the art will understand that the above discussion of any embodiment is only exemplary and is not intended to limit the scope of the present application (including claims) to these examples; the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other changes of different aspects of the present application as described above. In order to be brief, they are not provided in detail.
[0034] The present application is intended to cover all such alternatives, modifications and variations as fall within the broad scope of the appended claims. Accordingly, any and all such alternatives, modifications and variations are intended to be encompassed by the appended claims.
Claims
1. An integrated circuit package current testing device, comprising a test bench (1), characterized in that: The test bench (1) is fixedly connected to a concave clamping base (2). The concave clamping base (2) is provided with a feeding conveyor belt (3) and a discharging conveyor belt (4) on both sides. The test bench (1) is fixedly connected to a support plate (5). The support plate (5) is L-shaped. An electric telescopic rod (6) is fixedly connected to the side wall of the support plate (5). The output end of the electric telescopic rod (6) passes through the side wall of the support plate (5) and is fixedly connected to a toothed plate (7). The test bench (1) is provided with a loading and unloading mechanism for loading and unloading materials.
2. The integrated circuit package current testing device according to claim 1, characterized in that, The loading and unloading mechanism includes a gear (8) rotatably connected to the side wall of the support plate (5). The outer wall of the gear (8) meshes with the outer wall of the toothed plate (7). The shaft of the gear (8) passes through the side wall of the support plate (5) and is fixedly connected to a rotating rod (9). One end of the rotating rod (9) is rotatably connected to a loading reciprocating plate (10). The loading reciprocating plate (10) is L-shaped. The side wall of the support plate (5) is provided with a first sliding groove (11). A slider (12) is slidably connected inside the first sliding groove (11). The loading reciprocating plate (10) is slidably connected inside the slider (12). A moving plate (13) is fixedly connected to the bottom end of the loading reciprocating plate (10). A suction nozzle (14) is provided at each of the four corners of the bottom of the moving plate (13).
3. The integrated circuit package current testing device according to claim 2, characterized in that, The concave clamping base (2) has a second sliding groove (15) on its side wall. The top of the concave clamping base (2) has two through grooves (23). The bottom of the through grooves (23) is connected to the second sliding groove (15). A feeding plate (16) is slidably connected inside the second sliding groove (15). The feeding plate (16) is L-shaped. When the feeding reciprocating plate (10) feeds, it will contact the side wall of the feeding plate (16). A return spring (24) is fixedly connected to the side wall of the feeding plate (16). One end of the reset spring (24) is fixedly connected to the outer wall of the concave clamping base (2). The top of the feed plate (16) is rotatably connected to two push plates (17). The push plates (17) are located in the through groove (23). The side wall of the push plate (17) is fixedly connected to a first spring (18). One end of the first spring (18) is fixedly connected to the top of the second slide groove (15). The top of the second slide groove (15) is fixedly connected to the side wall of the push plate (17) with a limit plate (19).
4. The integrated circuit package current testing device according to claim 1, characterized in that, The concave clamping base (2) has sliding rods (20) slidably connected to both sides of its top. The outer wall of the sliding rod (20) is fitted with a second spring (21). The opposite ends of the sliding rod (20) are fixedly connected to a clamping plate (22). The second spring (21) is fixedly connected to the side wall of the clamping plate (22). The other end of the second spring (21) is fixedly connected to the side wall of the concave clamping base (2).
5. The integrated circuit package current testing device according to claim 3, characterized in that, The top of the pusher plate (17) extends into the interior of the through groove (23).
6. The integrated circuit package current testing device according to claim 4, characterized in that, The clamping plate (22) is arc-shaped.