Circuit board testing equipment

Abstract

The utility model relates to the field of test equipment, particularly provides circuit board test equipment, and aims to solve the problem of inaccurate test results caused by shaking of test contacts. In order to achieve the purpose, the circuit board testing equipment comprises a base, an overturning cover, an objective table and a moving assembly, an accommodating cavity is formed in the base; a test contact is arranged on the overturning cover; the objective table is arranged on the upper side of the base, and a placing groove for placing a circuit board is formed in the objective table; and the moving assembly is connected with the base, and the moving assembly is arranged to be capable of driving the objective table to move and enabling the electric contacts on the circuit board to be in contact connection with the test contacts. The objective table is driven by the moving assembly to achieve accurate alignment of the circuit board electric contact and the test contact, and the shaking problem caused by the fact that the test contact is directly moved by a traditional driving assembly is avoided.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment, and specifically provides a circuit board testing device. Background Technology

[0002] In daily life, many scenarios require chargers to convert AC power to DC power to meet the power supply needs of electrical devices. Before assembling a charger, its circuit board typically needs to be tested to meet quality standards.

[0003] However, when testing circuit boards, test contacts are typically driven by a drive assembly to make contact with electrical contacts. But because the electrical contacts on the circuit board themselves are small, the test contacts inevitably wobble when the drive assembly moves them, leading to inaccurate test results.

[0004] Accordingly, a new technical solution is needed in this field to solve the above problems. Utility Model Content

[0005] The present invention aims to solve the above-mentioned technical problems, namely, that the electrical contacts of the existing circuit boards are small, and when the drive component drives the test contacts to move, the test contacts will inevitably wobble, which will lead to inaccurate test results.

[0006] This utility model provides a circuit board testing device, including a base, a flip cover, a stage, and a moving component; the base has a cavity; the flip cover has test contacts; the stage is disposed on the upper side of the base, and the stage has a placement groove for placing the circuit board; the moving component is connected to the base, and the moving component is configured to drive the stage to move and make the electrical contacts on the circuit board contact the test contacts.

[0007] By employing the above technical solution, the precise alignment of the circuit board's electrical contacts with the test contacts is achieved through a moving component driving the stage, avoiding the shaking problem caused by directly moving the test contacts using traditional drive components. The stage's movement control ensures the perpendicularity and stability of the contact points, improving the accuracy of test results. The internal cavity in the base optimizes the device's compact structure and reduces external interference.

[0008] In the specific implementation of the circuit board testing equipment described above, the base includes a base body and a base cover. The base body is a box with an open top. The base cover is hinged to the upper side of the base body. The base cover is configured to form an accommodating cavity with the base body.

[0009] With the above technical solution adopted, the hinged design of the base body and the base cover facilitates equipment maintenance and quick repair of internal components. At the same time, the split structure enhances the modularity of the equipment, making it easy to combine and expand functions.

[0010] In a specific embodiment of the circuit board testing equipment described above, the base cover is provided with a through hole, which is configured to allow the moving component to pass through.

[0011] When the above technical solution is adopted, the through hole design allows the moving components to extend and retract freely, avoids mechanical interference, improves the compactness of the equipment, and adapts to the trend of miniaturization.

[0012] In the specific embodiment of the circuit board testing equipment described above, the moving component includes two telescopic drives, which are spaced apart. The fixed parts of the two telescopic drives are connected to the base, and the driving parts of the two telescopic drives are respectively connected to the stage. The components are configured to lift the stage through synchronous telescopic movement and make the electrical contacts contact the test contacts.

[0013] With the above technical solution, the dual telescopic drive synchronous motion ensures the smoothness and synchronization of the stage lifting, meeting the requirements of high dynamics and high precision for circuit board testing.

[0014] In the specific embodiment of the circuit board testing equipment described above, a support column is provided on the upper side of the base, and one end of the flip cover is hinged to the support column.

[0015] With the above technical solution, the hinged structure between the support column and the flip cover simplifies the flipping operation.

[0016] In the specific implementation of the circuit board testing equipment described above, a first hook is provided on the base, and a second hook is provided at the end of the flip cover away from the support column. The second hook is configured to engage with the first hook.

[0017] When the above technical solution is adopted, the locking mechanism of the first hook and the second hook enhances the stability of the device when it is closed and prevents the contact points from separating due to external interference during the test.

[0018] In the specific implementation of the circuit board testing equipment described above, there are two first hooks, which are spaced apart; there are also two second hooks, which are arranged corresponding to the first hooks.

[0019] With the above technical solution, the symmetrical distribution design of the double hooks optimizes the uniformity of the locking force, avoids mechanical fatigue caused by excessive force at a single point, and extends the service life of the equipment.

[0020] In a specific embodiment of the circuit board testing equipment described above, the circuit board testing equipment further includes a handrail fixing plate and a handrail. One side of the handrail fixing plate is fixedly connected to the two second hooks, and the handrail is connected to the side of the handrail fixing plate away from the second hooks.

[0021] With the above technical solution, the combination design of the armrest fixing plate and the armrest makes it easy for the operator to quickly open and close the flip cover, improving the efficiency of human-computer interaction, and is especially suitable for high-frequency testing scenarios.

[0022] In the specific implementation of the circuit board testing equipment described above, a limiting post is provided on the upper side of the platform, and a limiting plate is provided on the side of the handrail fixing plate where the second hook is fixed, and the limiting plate is configured to abut against the limiting post.

[0023] When the above technical solution is adopted, the contact mechanism between the limiting post and the limiting plate can accurately limit the movement of the stage and prevent overshoot from causing damage to the contact points.

[0024] In a specific embodiment of the circuit board testing equipment described above, the circuit board testing equipment further includes a gas spring, one end of which is connected to the support column, and the other end of which is connected to the end of the flip cover away from the support column.

[0025] With the above technical solution, the introduction of gas springs enables the flip cover to open and close slowly, while reducing the physical exertion of the operator and meeting the ease of use requirements of intelligent equipment.

[0026] In the specific embodiment of the circuit board testing equipment described above, a positioning post is provided at the end of the flip cover away from the support post, and one end of the positioning post is configured to abut against the base.

[0027] When the above technical solution is adopted, the design of the positioning post ensures that the flip cover is in the set position when it is in the closed state. Attached Figure Description

[0028] The preferred embodiments of this utility model are described below with reference to the accompanying drawings, in which:

[0029] Figure 1 This is a schematic diagram of the overall structure of an embodiment of the circuit board testing equipment;

[0030] Figure 2 This is a schematic diagram of an embodiment of the flip cover of a circuit board testing equipment;

[0031] Figure 3 This is a schematic diagram of an embodiment inside the base of the circuit board testing equipment;

[0032] Figure 4 This is a schematic diagram of an embodiment of the connection relationship of the flip cover of a circuit board testing device.

[0033] List of reference numerals in the attached diagram: 1-Base; 11-Base body; 12-Base cover; 13-First hook; 14-Support column; 2-Flip cover; 22-Handrail fixing plate; 23-Handrail; 24-Positioning column; 25-Limiting plate; 26-Second hook; 27-Fixed crossbeam; 3-Circuit board; 4-Gas spring; 5-Platform; 51-Limiting column; 6-Telescopic drive. Detailed Implementation

[0034] Preferred embodiments of this application are described below with reference to the accompanying drawings. Those skilled in the art should understand that these embodiments are merely illustrative of the technical principles of this application and are not intended to limit the scope of protection of this application. Those skilled in the art can make adjustments as needed to adapt to specific application scenarios.

[0035] It should be noted that, in the description of this application, unless otherwise explicitly specified and limited, the terms "set," "connect," etc., should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or other type of connection; it can be a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. It should be understood that the terms "upper," "lower," "inner," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0036] like Figures 1-4As shown, to address the problem that existing circuit boards have small electrical contacts, inevitably causing the test contacts to wobble when the drive assembly moves them, leading to inaccurate test results, this invention provides a circuit board testing device, including a base 1, a flip cover 2, a stage 5, and a moving assembly. The base 1 has a cavity; the flip cover 2 has test contacts; the stage 5 is located on the upper side of the base 1 and has a placement groove for placing the circuit board 3; the moving assembly is connected to the base 1 and is configured to drive the stage 5 to move, making the electrical contacts on the circuit board 3 contact the test contacts. Thus, by driving the stage 5 with the moving assembly, precise alignment of the electrical contacts on the circuit board 3 with the test contacts is achieved, avoiding the wobble problem caused by the traditional drive assembly directly moving the test contacts. The movement control of the stage 5 ensures the perpendicularity and stability of the contact, improving the accuracy of the test results. The cavity in the base 1 optimizes the compactness of the device structure and reduces external interference.

[0037] like Figure 1 As shown, in one or more embodiments, the base 1 includes a base body 11 and a base cover 12. The base body 11 is a square box with an open top. Alternatively, the base 1 can also be a box of other shapes. The base cover 12 is hinged to the upper side of the base body 11, and the base cover 12 is configured to form a receiving cavity with the base body 11. This hinged design of the base body 11 and the base cover 12 facilitates equipment maintenance and quick repair of internal components, while the split structure enhances the modularity of the equipment, facilitating combination and functional expansion. In one or more embodiments, the base cover 12 is provided with a through hole, which is configured to allow a moving component to pass through. The through hole design allows the moving component to extend and retract freely, avoiding mechanical interference, improving the compactness of the equipment, and adapting to the trend of miniaturization. Alternatively, a through hole may not be provided, and the moving component may be located in other positions, as long as it can drive the platform 5 to move. Figure 2 As shown, in one or more embodiments, the base cover 12 is provided with two first hooks 13, the two first hooks 13 being located at... Figure 2 The first hook 13 is positioned near the right side and spaced apart. Alternatively, it can also be located on the base body 11. In one or more embodiments, the base cover 12... Figure 2 Two spaced support columns 14 are provided near the left side of the center. Alternatively, the number of support columns 14 can be one.

[0038] like Figure 3 As shown, in one or more embodiments, the moving component includes two telescopic drives 6, which are spaced apart, and one telescopic drive 6 is located at... Figure 3 Another telescopic drive 6 is located in the middle left position. Figure 3Positioned slightly to the right. The fixing parts of the two telescopic drives 6 are connected to the bottom surface of the base body 11, and the driving parts of the two telescopic drives 6 are respectively connected to the stage 5. They are configured to lift the stage 5 through synchronous telescopic movement and make the electrical contacts contact the test contacts. As shown in the figure, the synchronous movement of the two telescopic drives 6 ensures the smoothness and synchronicity of the lifting and lowering of the stage 5, meeting the requirements of high dynamics and high precision for circuit board 3 testing. Alternatively, a single telescopic drive 6 can be used, located near the center of the stage 5.

[0039] like Figure 2 and Figure 4 As shown, in one or more embodiments, the circuit board testing equipment includes a flip cover 2, on which test contacts are provided. A support column 14 is provided on the upper side of the base cover 12, and one end of the flip cover 2 is hinged to the support column 14. Thus, the hinged structure between the support column 14 and the flip cover 2 simplifies the flipping operation. Alternatively, the support column 14 may be omitted, and the flip cover 2 can be connected to other structures to achieve flipping. The flip cover 2 can simply allow the test contacts on it to make contact with and move away from the electrical contacts on the circuit board 3.

[0040] like Figure 2 and Figure 4 As shown, in one or more embodiments, a fixed crossbeam 27 is provided on the end of the flip cover 2 away from the support column 14. Two second hooks 26 are spaced apart on the fixed crossbeam 27. The second hooks 26 are configured to engage with the first hooks 13. There are two second hooks 26, corresponding to the first hooks 13. Thus, the locking mechanism of the first hooks 13 and the second hooks 26 enhances the stability of the device when closed, preventing contact separation due to external interference during testing. The symmetrical distribution of the double hooks optimizes the uniformity of the locking force, avoiding mechanical fatigue caused by excessive force at a single point, and extending the service life of the device. Alternatively, the number of second hooks 26 is the same as the number of first hooks 13; the number of second hooks 26 can be one, three, four, etc. In one or more embodiments, two positioning posts 24 are provided on the end of the flip cover 2 away from the support column 14. One end of each positioning post 24 is configured to abut against the base cover 12. Specifically, when the flip cover 2 is flipped to the position above the base cover 12, as... Figure 1 When in the indicated position, the lower end of the positioning post 24 abuts against the base cover 12. Thus, the design of the positioning post 24 ensures that the flip cover 2 is in the set position when it is closed.

[0041] like Figure 2 and Figure 4 As shown, in one or more embodiments, the circuit board testing equipment further includes a handrail fixing plate 22 and a handrail 23, with one side of the handrail fixing plate 22 ( Figure 4The side facing outwards from the paper surface) is fixedly connected to two second hooks 26, and the side of the handrail 23 and the handrail fixing plate 22 away from the second hooks 26 ( Figure 4 The first hook 13 and the second hook 26 are connected (perpendicular to the paper surface and inward). The handle 23 and the handle fixing plate 22 facilitate the separation of the first hook 13 and the second hook 26 in the hooked state. Thus, the combination design of the handle fixing plate 22 and the handle 23 facilitates the operator to quickly open and close the flip cover 2, improving human-computer interaction efficiency, and is especially suitable for high-frequency testing scenarios. It should be noted that the setting of the handle fixing plate 22 and the handle 23 is not necessary. Those skilled in the art can choose whether to set the handle fixing plate 22 and the handle 23 and the specific structure of the handle fixing plate 22 and the handle 23 based on the specific application scenario. Of course, the handle fixing plate 22 and the handle 23 can also be omitted. In one or more embodiments, a limit plate 25 is provided on the side of the handle fixing plate 22 where the second hook 26 is fixed, and the limit rod extends away from the handle fixing plate 22.

[0042] like Figure 2 and Figure 4 As shown, in one or more embodiments, the stage 5 is mounted on the base cover 12. The stage 5 is connected to the drive units of two telescopic drives 6, and can move vertically through the synchronous telescopic movement of the two telescopic drives 6. In one or more embodiments, two limiting posts 51 are provided on the upper side of the stage 5, and the limiting plate 25 is configured to abut against the limiting posts 51. The limiting plate 25 can limit the highest point of the stage 5's upward movement, accurately limiting the travel of the stage 5 and preventing overshoot that could damage the test contacts.

[0043] like Figure 2 and Figure 4 As shown, in one or more embodiments, the circuit board testing equipment further includes two gas springs 4. One end of each gas spring 4 is connected to one of the two support columns 14, and the other end of each gas spring 4 is connected to the end of the flip cover 2 away from the support column 14. The introduction of the gas springs 4 enables the flip cover 2 to open and close slowly, while reducing the physical exertion of the operator, meeting the usability requirements of intelligent equipment. It should be noted that the specific structure of the gas spring 4 is prior art and will not be described in detail here. It should be further noted that the setting of the gas spring 4 is not mandatory. Those skilled in the art can choose whether to set the gas spring 4 and the specific structure of the gas spring 4 based on the specific application scenario, or of course, the gas spring 4 can be omitted.

[0044] Those skilled in the art will understand that although some embodiments described herein include certain features included in other embodiments but not others, combinations of features from different embodiments are intended to be within the scope of this application and form different embodiments. For example, any of the claimed embodiments in the claims of this application can be used in any combination.

[0045] The technical solution of this utility model has been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it will be readily understood by those skilled in the art that the protection scope of this utility model is obviously not limited to these specific embodiments. Without departing from the principle of this utility model, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will all fall within the protection scope of this utility model.

Claims

1. A circuit board testing device, characterized in that, Includes a base (1), a flip cover (2), a stage (5), and a moving assembly; The base (1) has a cavity for receiving; The flip cover (2) is provided with test contacts; The platform (5) is disposed on the upper side of the base (1), and the platform (5) is provided with a placement groove for placing the circuit board (3); The moving component is connected to the base (1) and is configured to drive the stage (5) to move and make the electrical contacts on the circuit board (3) contact the test contacts.

2. The circuit board testing equipment according to claim 1, characterized in that, The base (1) includes a base body (11) and a base cover (12). The base body (11) is a box with an open top. The base cover (12) is hinged to the upper side of the base body (11). The base cover (12) is configured to form a cavity with the base body (11).

3. The circuit board testing equipment according to claim 2, characterized in that, The base cover (12) is provided with a through hole, which is configured to allow the movable component to pass through.

4. The circuit board testing equipment according to claim 3, characterized in that, The moving component includes two telescopic drives (6) spaced apart. The fixed part of the two telescopic drives (6) is connected to the base (1). The driving part of the two telescopic drives (6) is connected to the stage (5) respectively. The components are configured to lift the stage (5) through synchronous telescopic movement and make the electrical contact contact the test contact.

5. The circuit board testing equipment according to claim 1, characterized in that, A support column (14) is provided on the upper side of the base (1), and one end of the flip cover (2) is hinged to the support column (14).

6. The circuit board testing equipment according to claim 5, characterized in that, The base (1) is provided with a first hook (13), and the flip cover (2) is provided with a second hook (26) at one end away from the support column (14). The second hook (26) is configured to engage with the first hook (13).

7. The circuit board testing equipment according to claim 6, characterized in that, There are two first hooks (13), which are spaced apart; there are two second hooks (26), which are corresponding to the first hooks (13).

8. The circuit board testing equipment according to claim 7, characterized in that, The circuit board testing equipment also includes a handrail fixing plate (22) and a handrail (23). One side of the handrail fixing plate (22) is fixedly connected to the two second hooks (26), and the handrail (23) is connected to the side of the handrail fixing plate (22) away from the second hooks (26).

9. The circuit board testing equipment according to claim 8, characterized in that, The upper side of the platform (5) is provided with a limiting post (51), and the side of the armrest fixing plate (22) where the second hook (26) is fixed is provided with a limiting plate (25). The limiting plate (25) is configured to abut against the limiting post (51).

10. The circuit board testing equipment according to claim 5, characterized in that, The circuit board testing equipment also includes a gas spring (4), one end of which is connected to the support column (14), and the other end of which is connected to the end of the flip cover (2) away from the support column (14); and / or The flip cover (2) is provided with a positioning post (24) at one end away from the support post (14), and one end of the positioning post (24) is configured to abut against the base (1).

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