IV test tool

Abstract

According to the IV test tool disclosed by the invention, the penetrating probe guide groove is formed in the sample placement table, so that a probe device can penetrate through the probe guide groove from the back side direction of a battery piece to abut against the back side of the battery piece, and then the position of an electrode on the back side of the battery piece is observed through the probe guide groove; and meanwhile, by adjusting the position of the probe sliding block relative to the sample placing table, the probe can be accurately contacted with the electrode, and the battery piece is fixed by the sample placing table after the probe is contacted in place, so that an IV test can be carried out, the accuracy of test data and the flexible applicability of testing various back side electrode type battery pieces are ensured, and scientific research requirements are met.

Description

Technical Field

[0001] This application relates to the field of photovoltaic cell technology, and in particular to an IV test fixture. Background Technology

[0002] Photovoltaic module IV testing is a core technical method for evaluating the performance of solar cells and modules. Its core principle is to measure the output current of the photovoltaic device under different operating voltages and plot the current-voltage (IV) characteristic curve. The IV curve can intuitively reflect key parameters such as open-circuit voltage (Voc), short-circuit current (Isc), maximum power point (Pmpp), fill factor (FF), and conversion efficiency, thus comprehensively characterizing the electrical performance of the device. The accurate determination of the maximum power point directly affects the accuracy of the system's power generation estimation. Testing is typically conducted under standard test conditions (STC: 1000 W / m², AM1.5 spectrum, 25°C) and requires specialized equipment such as a solar simulator, precision source meter, and temperature control platform.

[0003] Current IV testing fixtures are primarily designed for standardized testing of traditional photovoltaic cells (such as crystalline silicon cells). They typically involve contacting the electrodes on the front side and can only test cells with electrodes that have been pre-exposed or fixed in position. However, for cells with electrodes on the back side, such as back-contact cells and perovskite cells, it is difficult to accurately contact the electrodes, leading to discrepancies between test data and actual operating conditions. ， Furthermore, it cannot meet the research needs of studying the IV performance of individual sub-cells in perovskite solar cells. Utility Model Content

[0004] The purpose of this application is to provide an IV testing fixture that can ensure the accuracy of test data and its flexible applicability for testing various back-side electrode types of solar cells, thus meeting the needs of scientific research.

[0005] The embodiments of this application can be implemented as follows:

[0006] In a first aspect, this utility model provides an IV testing fixture, comprising:

[0007] Support frame;

[0008] A sample placement stage is rotatably connected to the support frame for placing and fixing the battery cells; wherein, the sample placement stage is provided with a through probe guide groove;

[0009] The probe module includes a probe slider and a prober disposed on the probe slider. The probe slider is slidably connected to the side of the sample placement stage, and the sliding direction of the probe slider relative to the sample placement stage is parallel to the length direction of the probe guide groove. The prober passes through the probe guide groove and can abut against the back of the battery cell.

[0010] In an optional embodiment, the prober includes a probe and a probe strip connected to one end of the probe;

[0011] The probe is connected to the probe slider, and the probe passes through the probe guide groove;

[0012] The probe strip is positioned on the sample placement stage so that it can be pressed together by the back of the battery cell and the sample placement stage.

[0013] In an optional implementation, the probe module further includes a first retractable rod and a second retractable rod;

[0014] The first shrink rod is slidably connected to the probe slider, and the sliding direction of the first shrink rod is parallel to the thickness direction of the sample placement stage;

[0015] The second retractable rod is slidably connected to the first retractable rod, and the sliding direction of the second retractable rod is perpendicular to the length direction of the probe guide groove;

[0016] The probe is connected to the second retractor.

[0017] In an optional embodiment, the probe slider is provided with a first sliding cavity, the depth direction of the first sliding cavity being parallel to the thickness direction of the sample placement stage, and the first retraction rod is slidably disposed in the first sliding cavity.

[0018] In an optional embodiment, the first retraction rod is provided with a second sliding cavity, the depth direction of which is perpendicular to the length direction of the probe guide groove;

[0019] The second retractable rod is slidably disposed in the second sliding cavity.

[0020] In an optional embodiment, the probe module further includes a slider operating lever connected to the probe slider;

[0021] And / or,

[0022] The sample placement stage is equipped with a sliding guide rail parallel to the probe guide groove on its side. The probe slider slides in cooperation with the sliding guide rail, and there are sliding stops at both ends of the sliding guide rail.

[0023] In an optional embodiment, the sample placement stage includes an adjacent and perpendicular first side and a second side;

[0024] The first side is rotatably connected to the support frame;

[0025] The probe slider is slidably connected to the second side.

[0026] In an optional embodiment, the sample placement stage further has a third side adjacent to and perpendicular to the second side, the third side being opposite to the first side;

[0027] The first side is connected to a flip handle.

[0028] In an optional embodiment, the support frame includes a tooling platform and a plurality of support plates and support rods vertically connected to the tooling platform; the support plates and support rods are distributed alternately in sequence;

[0029] The first side is rotatably connected to one of the support plates via multiple hinges.

[0030] In an optional embodiment, the sample placement stage has multiple vacuum adsorption holes and an inflation hole and an exhaust hole that are connected to each vacuum adsorption hole.

[0031] Compared with the prior art, the beneficial effects of the embodiments of this application include, for example:

[0032] By setting a through-hole probe guide groove on the sample placement stage, the probe can pass through the probe guide groove from the back side of the solar cell and abut against the back side of the solar cell. Then, the electrode position on the back side of the solar cell can be observed through the probe guide groove. At the same time, by adjusting the position of the probe slider relative to the sample placement stage, the probe can accurately contact the electrode. After contact is made, the sample placement stage fixes the solar cell, and IV testing can be performed to ensure the accuracy of the test data and the flexibility to test various types of solar cells with back-side electrodes. It can also be used to study the IV performance of individual sub-cells in perovskite solar cells, such as perovskite solar cells, to meet scientific research needs. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the test fixture in Embodiment IV of this application;

[0035] Figure 2 for Figure 1 A schematic diagram of the probe module.

[0036] Icons: 10-Tooling platform; 11-Support plate; 12-Support rod; 13-Flip hinge; 20-Sample placement stage; 21-Probe guide groove; 22-Vacuum adsorption hole; 23-Exhaust hole; 24-Inflation hole; 25-Sliding guide rail; 26-Sliding stop; 30-Probe slider; 31-Probe; 32-Probe strip; 33-First retraction rod; 34-Second retraction rod; 36-First sliding cavity; 37-Second sliding cavity; 38-Slider operating rod; 40-Flip handle. Detailed Implementation

[0037] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0038] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0039] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0040] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this application is in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. In addition, the terms "first," "second," and "third," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0041] Furthermore, terms such as "horizontal," "vertical," and "sag" do not imply that components must be absolutely horizontal or suspended, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal relative to "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.

[0042] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "set up," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0043] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0044] refer to Figure 1 and Figure 2 This application discloses an IV testing fixture, which includes a support frame, a sample placement stage 20, and a probe module.

[0045] The support frame mainly serves to bear loads.

[0046] The sample placement stage 20 is mainly used for placing and fixing the battery cells. It is installed on the support frame and is used for placing and fixing the battery cells. The sample placement stage 20 is provided with a through probe guide groove 21.

[0047] The probe module includes a probe slider 30 and a prober disposed on the probe slider 30. The probe slider 30 is slidably connected to the side of the sample placement stage 20, and the sliding direction of the probe slider 30 relative to the sample placement stage 20 is parallel to the length direction of the probe guide groove 21. The prober passes through the probe guide groove 21 and can abut against the back of the battery cell.

[0048] In this way, by setting a through probe guide groove 21 on the sample placement stage 20, the probe can pass through the probe guide groove 21 from the back side of the solar cell and abut against the back side of the solar cell. Then, the position of the motor on the back side of the solar cell can be observed through the probe guide groove 21. At the same time, by adjusting the position of the probe slider 30 relative to the sample placement stage 20, the probe can accurately contact the electrode. After contact is made, the sample placement stage 20 fixes the solar cell, and IV testing can be performed to ensure the accuracy of the test data and the flexibility of testing various types of solar cells with back-side electrodes. It can also be used to study the IV performance of individual sub-cells in perovskite solar cells, such as those in perovskite solar cells, thus meeting scientific research needs.

[0049] It should be noted that perovskite solar cells are mainly divided into three categories: nip structure (TCO / ETL / perovskite / HTL / metal electrode), which commonly uses mesoporous TiO2 to enhance electron transport, resulting in high efficiency but requiring high-temperature processing (e.g., mesoporous structure); pin structure (TCO / HTL / perovskite / ETL / metal electrode), which is prepared at low temperatures, suitable for flexible substrates, and has better stability; and mesoporous structure, where a mesoporous TiO2 layer is introduced into the ETL layer, with perovskite filling the pores to enhance interfacial contact and improve carrier collection efficiency. To break through the Shockley-Queyser limit (SQ) of single-junction cells and reach efficiencies of 40%+, perovskite solar cells need to reduce thermal and transmission losses. Furthermore, the perovskite bandgap is tunable, making it compatible with various base cells (silicon, CIGS, organic photovoltaics, etc.). Therefore, designing perovskite solar cells as a stacked structure with sub-cells connected in series and studying the IV of individual sub-cells is particularly important.

[0050] Current IV tooling requires pre-welding busbars to the sub-cells to enable electrode lead-out. However, perovskite materials are sensitive to high temperatures, and the welding process can lead to material decomposition (e.g., iodine volatilization in the perovskite layer) and interface damage (e.g., carbonization of the hole transport layer). Furthermore, the introduction of busbars alters the stress distribution of the sub-cell, affecting subsequent stability studies (e.g., bending tests or thermal cycling experiments), resulting in discrepancies between test data and actual operating conditions. Because it is impossible to quickly and non-destructively obtain independent sub-cell parameters, researchers struggle to accurately pinpoint the sources of efficiency loss (e.g., interfacial recombination in perovskite sub-cells vs. insufficient light trapping in silicon sub-cells), failing to meet research needs.

[0051] Therefore, in order to better test the IV performance of one or more sub-cells in a perovskite solar cell, in this embodiment, the probe includes a probe 31 and a probe strip 32 connected to one end of the probe 31; the probe 31 is connected to the probe slider 30 and passes through the probe guide groove 21; the probe strip 32 is located on the sample placement stage 20 so that it can be squeezed by the back of the solar cell and the sample placement stage 20 together, so that the probe strip 32 corresponds to one sub-cell, so as to accurately test the IV performance of one or more sub-cells.

[0052] In this embodiment, to facilitate workers' observation of the test location on the back of the battery cell, the sample placement stage 20 can be configured to rotate relative to the support frame. Specifically, the sample placement stage 20 is generally rectangular and includes an adjacent and perpendicular first side and a second side. The first side is rotatably connected to the support frame, and the probe slider 30 is slidably connected to the second side. In this way, the sample placement stage 20 and the battery cell can be flipped up together, so that workers can observe, for example, the location of the sub-battery through the probe guide groove 21. Then, the probe slider 30 is adjusted to align the probe strip 32 with the sub-battery, and the battery cell is fixed. In this way, the battery cell presses down the probe strip 32, and the probe strip 32 cannot move. Then, the sample placement stage 20 is placed back on the support frame to start the IV test.

[0053] In addition, the sample placement stage 20 also has a third side that is adjacent to and perpendicular to the second side, and the third side is opposite to the first side; the first side is connected to a flip handle 40, which can be connected by screws, so that workers can lift the sample placement stage 20 to flip it by holding the flip handle 40, which is more convenient and labor-saving.

[0054] The sample placement stage 20 has multiple vacuum adsorption holes 22 and an inflation hole 24 and an exhaust hole 23 that are connected to each vacuum adsorption hole 22. In this way, by evacuating the exhaust hole 23, negative pressure can be generated in the vacuum adsorption hole 22 to vacuum adsorb and fix the battery cell. After the test, the exhaust hole 23 stops evacuating, and gas is introduced into each vacuum adsorption hole 22 through the inflation hole 24 to break the vacuum and loosen the battery cell.

[0055] The support frame includes a tooling platform 10 and multiple support plates 11 and support rods 12 vertically connected to the tooling platform 10; the support plates 11 and support rods 12 are distributed alternately in sequence, and the first side is rotatably connected to one of the support plates 11 through multiple flip hinges 13, so that each support rod 12 and support plate 11 supports the sample placement stage 20.

[0056] There are four support plates 11 and four support rods 12, which form a rectangular space to better fit the shape of the sample placement stage 20. The four support rods 12 support the four corners of the sample placement stage 20.

[0057] It should also be noted that in some embodiments, the sample placement stage 20 may be directly fixed to the support frame, and the support frame has a clearance window so that employees can directly observe the back of the battery cells from the bottom of the sample placement stage 20.

[0058] In this embodiment, the probe module further includes a first retractable rod 33 and a second retractable rod 34;

[0059] The first shrinking rod 33 is slidably connected to the probe slider 30. The sliding direction of the first shrinking rod 33 is parallel to the thickness direction of the sample placement stage 20. This can change the height of the probe 31 in the thickness direction of the sample placement stage 20, so as to ensure that the probe strip 32 can be pressed well on the sub-cell electrode to be studied.

[0060] The second shrinking rod 34 is slidably connected to the first shrinking rod 33. The sliding direction of the second shrinking rod 34 is perpendicular to the length direction of the probe guide groove 21. The probe is connected to the second shrinking rod 34. This allows for flexible adaptation to the position of the probe guide groove 21 without requiring excessive design dimensions. The second shrinking rod 34 can be adjusted according to the distance between the probe guide groove 21 and the edge of the sample placement stage 20.

[0061] In detail, the probe slider 30 is provided with a first sliding cavity 36, the depth direction of the first sliding cavity 36 is parallel to the thickness direction of the sample placement stage 20, the first shrink rod 33 is slidably disposed in the first sliding cavity 36, the first shrink rod 33 is provided with a second sliding cavity 37, the depth direction of the second sliding cavity 37 is perpendicular to the groove length direction of the probe guide groove 21; the second shrink rod 34 is slidably disposed in the second sliding cavity 37, which can reduce the volume and material usage of the entire probe module.

[0062] In addition, the probe module also includes a slider operating lever 38 vertically connected to the probe slider 30, which allows employees to adjust the position of the probe slider 30 relative to the sample placement stage 20 by means of the slider operating lever 38.

[0063] In order to accurately guide the movement of the probe slider 30 and reduce friction, a sliding guide rail 25 parallel to the probe guide groove 21 is installed on the side of the sample placement stage 20. The probe slider 30 slides in conjunction with the sliding guide rail 25. There are sliding stops 26 at both ends of the sliding guide rail 25 to limit the sliding stroke of the probe slider 30 and prevent the probe slider 30 from derailing.

[0064] The following is an example of the IV testing procedure for perovskite solar cells:

[0065] First, place the battery cell on the sample placement stage 20. The vacuum adsorption holes 22 initially adsorb and fix the battery cell at a low vacuum level. Then, pull the flip handle 40 to flip the sample placement stage 20 at a certain angle, such as 90°, so that the worker can observe the position of each sub-cell on the back of the battery cell through the probe guide groove 21. Then, use the slider operating rod 38 to adjust the probe strip 32 to the position corresponding to the sub-cell to be tested. Next, the vacuum adsorption holes 22 completely fix the battery cell at a high vacuum level. Finally, use the flip handle 40 to pull the sample placement stage 20 back to its original position, and the test can be carried out.

[0066] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An IV test fixture, characterized by, include: Support frame; A sample placement stage (20) is rotatably connected to the support frame for placing and fixing the battery cells; wherein, the sample placement stage (20) is provided with a through probe guide groove (21); The probe module includes a probe slider (30) and a probe disposed on the probe slider (30). The probe slider (30) is slidably connected to the side of the sample placement stage (20), and the sliding direction of the probe slider (30) relative to the sample placement stage (20) is parallel to the length direction of the probe guide groove (21). The probe is disposed in the probe guide groove (21) and can abut against the back of the battery cell.

2. The IV test fixture of claim 1, wherein, The probe includes a probe (31) and a probe strip (32) connected to one end of the probe (31); The probe (31) is connected to the probe slider (30), and the probe (31) passes through the probe guide groove (21); The probe strip (32) is positioned above the sample placement stage (20) so that it can be pressed together by the back of the battery cell and the sample placement stage (20).

3. The IV test fixture of claim 1, wherein, The probe module also includes a first retractable rod (33) and a second retractable rod (34); The first shrink rod (33) is slidably connected to the probe slider (30), and the sliding direction of the first shrink rod (33) is parallel to the thickness direction of the sample placement stage (20); The second retractable rod (34) is slidably connected to the first retractable rod (33), and the sliding direction of the second retractable rod (34) is perpendicular to the groove length direction of the probe guide groove (21); The probe is connected to the second retractor (34).

4. The IV test fixture of claim 3, wherein, The probe slider (30) is provided with a first sliding cavity (36), the depth direction of the first sliding cavity (36) is parallel to the thickness direction of the sample placement stage (20), and the first retraction rod (33) is slidably disposed in the first sliding cavity (36).

5. The IV testing fixture of claim 3, wherein, The first retractable rod (33) is provided with a second sliding cavity (37), the depth direction of the second sliding cavity (37) being perpendicular to the groove length direction of the probe guide groove (21); The second retraction rod (34) is slidably disposed in the second sliding cavity (37).

6. The IV testing fixture of claim 1, wherein, The probe module also includes a slider operation lever (38) connected to the probe slider (30); And / or, The sample placement stage (20) is equipped with a sliding guide rail (25) parallel to the probe guide groove (21) on its side. The probe slider (30) is slidably engaged with the sliding guide rail (25). The sliding guide rail (25) has sliding stops (26) at both ends.

7. The IV testing fixture of claim 1, wherein, The sample placement stage (20) includes an adjacent and perpendicular first side and a second side; The first side is rotatably connected to the support frame; The probe slider (30) is slidably connected to the second side.

8. The IV test fixture of claim 7, wherein, The sample placement stage (20) also has a third side that is adjacent to and perpendicular to the second side, and the third side is opposite to the first side; The first side is connected to a flip handle (40).

9. The IV test fixture of claim 7, wherein, The support frame includes a tooling platform (10) and a plurality of support plates (11) and support rods (12) vertically connected to the tooling platform (10); the support plates (11) and the support rods (12) are distributed alternately in sequence; The first side is rotatably connected to one of the support plates (11) by a plurality of flip hinges (13).

10. The IV testing fixture of claim 1, wherein, The sample placement stage (20) has multiple vacuum adsorption holes (22) and an air filling hole (24) and an air vent (23) that are connected to each vacuum adsorption hole (22).

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