High-speed integrated circuit test tool
By introducing adjustable clamping and disassembly components into the integrated circuit test fixture, the problem of poor adaptability to circuit boards of different sizes is solved, achieving rapid fixation and improving testing efficiency and accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- 安徽信诺达微电子有限公司
- Filing Date
- 2025-04-22
- Publication Date
- 2026-04-21
AI Technical Summary
Existing integrated circuit testing fixtures cannot quickly adjust the clamping device to accommodate circuit boards of different sizes, resulting in decreased testing efficiency and accuracy.
It employs adjustable clamping and disassembly components, including sliding columns, chucks, threaded columns, and electric push rods. The clamping components can be quickly adjusted via cranks and levers, and the detection modules can be quickly replaced via threaded connections and disassembly components.
It enables rapid fixation of circuit boards of different sizes, improves the applicability and practicality of the test fixture, and enhances test efficiency and accuracy.
Smart Images
Figure CN224152606U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of integrated circuit testing technology, and in particular to a high-speed integrated circuit testing fixture. Background Technology
[0002] With the continuous development of integrated circuit technology, the complexity and performance requirements of electronic products are increasing, and integrated circuit testing is becoming more and more important. High-speed integrated circuit test fixtures play a crucial role in the electronic manufacturing process. In order to meet the testing needs of integrated circuit boards of different sizes and specifications, test fixtures must have high adaptability and flexibility. Traditional test fixtures are usually designed for circuit boards of a specific size, which often makes them unable to cope with different types and sizes of integrated circuit boards in practical applications, thus affecting test efficiency and test accuracy. Therefore, developing a test fixture that can quickly and conveniently adapt to integrated circuit boards of different sizes has become the key to improving test efficiency and accuracy.
[0003] Currently, most integrated circuit board testing fixtures on the market use mechanical structures based on fixed supports and clamping devices for operation. During testing, the integrated circuit board is fixed on the test platform by the supports and clamping devices, and the electrical performance of the integrated circuit board is tested by conductive probes or electrical connection devices.
[0004] Existing integrated circuit test fixtures often suffer from the problem of not being able to quickly adjust the clamping device when dealing with circuit boards of different sizes. When dealing with circuit boards of different sizes, existing fixtures often need to be changed to different fixtures, which not only increases debugging time but also reduces testing efficiency. To address these issues, a high-speed integrated circuit test fixture is proposed. Utility Model Content
[0005] To overcome the above shortcomings, this utility model provides a high-speed integrated circuit testing fixture, which aims to improve the problem that existing testing fixtures cannot fix circuit boards of different sizes.
[0006] To achieve the above objectives, the present invention adopts the following technical solution: a high-speed integrated circuit testing fixture, including a test bench, a control panel is provided on the outer wall of the test bench, a support block is fixedly connected to the side wall of the test bench, a threaded post is threadedly connected inside the support block, and a clamping assembly is provided on the top of the support block;
[0007] The clamping assembly includes a sliding column and a clamping plate. The sliding column is slidably connected inside the support block. The side wall of the clamping plate is fixedly connected to one end of the sliding column. A trapezoidal block is fixedly connected to the top of the support block. A crank is rotatably connected to the top of the trapezoidal block. A lever is fixedly connected to the top of the crank. A second crank is rotatably connected to the outer wall of the first crank. One end of the second crank is rotatably connected to one end of the sliding column. A limit plate is fixedly connected inside the test platform. An electric push rod is fixedly connected to the top of the test platform. A connecting column is fixedly connected to the output end of the electric push rod. A disassembly assembly is provided at the bottom of the connecting column.
[0008] As a further description of the above technical solution:
[0009] The disassembly assembly includes a hollow column, the top of which is fixedly connected to the bottom of the connecting column.
[0010] As a further description of the above technical solution:
[0011] A fixed column is fixedly connected to one side of the hollow column, and a movable column is slidably connected inside the hollow column.
[0012] As a further description of the above technical solution:
[0013] The movable column is rotatably connected to a threaded column two, which is threadedly connected to the fixed column.
[0014] As a further description of the above technical solution:
[0015] A ring is fixedly connected to the outer wall of the threaded column, and the ring fits against the outer wall of the movable column.
[0016] As a further description of the above technical solution:
[0017] One end of the threaded post is provided with a handle, and the outer wall of the handle is fixedly connected to the inside of the threaded post.
[0018] As a further description of the above technical solution:
[0019] A detection module is installed inside the hollow column, and the detection module is engaged inside the hollow column.
[0020] This utility model has the following beneficial effects:
[0021] 1. In this utility model, by turning the lever, crank one and crank two are rotated, causing the sliding column to drive the clamp to slide inside the support block. Then, the threaded column one is rotated to limit the sliding column, and at the same time, the limiting plate is used for limiting, thereby achieving the effect of fixing integrated circuit boards of different sizes to be tested. This solves the problem that the test fixture cannot fix circuit boards of different sizes, and improves the applicability of the test fixture.
[0022] 2. In this utility model, the moving column slides inside the hollow column by rotating the handle and the ring, and the fixed column rotates in two directions by the threaded column, thereby achieving the effect of disassembling the test module of the test fixture. This solves the problem of difficulty in replacing the test module when testing different types of circuit boards and improves the practicality of the test fixture. Attached Figure Description
[0023] Figure 1 This is a three-dimensional schematic diagram of a high-speed integrated circuit testing fixture proposed in this utility model;
[0024] Figure 2 This is a schematic diagram of the sliding column structure of a high-speed integrated circuit testing fixture proposed in this utility model;
[0025] Figure 3 This is a schematic diagram of a hollow column structure for a high-speed integrated circuit testing fixture proposed in this utility model;
[0026] Figure 4 This is a cross-sectional schematic diagram of the fixing column of a high-speed integrated circuit testing fixture proposed in this utility model.
[0027] Legend:
[0028] 1. Test bench; 2. Control panel; 3. Electric push rod; 4. Support block; 5. Connecting column; 6. Hollow column; 7. Detection module; 8. Limit plate; 9. Trapezoidal block; 10. Crank one; 11. Pulley; 12. Crank two; 13. Sliding column; 14. Clamping plate; 15. Threaded column one; 16. Fixed column; 17. Moving column; 18. Threaded column two; 19. Ring; 20. Rotary handle. Detailed Implementation
[0029] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0030] Reference Figure 1 and Figure 2 The present invention provides an embodiment of a high-speed integrated circuit testing fixture, comprising a test bench 1, a control panel 2 on the outer wall of the test bench 1, the control panel 2 for operating and monitoring the testing process, providing a user-friendly interface for parameter adjustment and display, a support block 4 fixedly connected to the side wall of the test bench 1, a threaded post 15 threadedly connected inside the support block 4, the threaded post 15 for limiting and adjusting the position of the sliding post 13, and a clamping assembly on the top of the support block 4 for precisely fixing the integrated circuit board to be tested, ensuring that it is not disturbed by external factors during the testing process;
[0031] The clamping assembly includes a sliding column 13 and a clamping plate 14. The sliding column 13 is slidably connected inside the support block 4. The position of the sliding column 13 can be adjusted as needed to adapt to integrated circuit boards of different sizes. The side wall of the clamping plate 14 is fixedly connected to one end of the sliding column 13. The clamping plate 14 achieves clamping and fixation by contacting the integrated circuit board. A trapezoidal block 9 is fixedly connected to the top of the support block 4. The trapezoidal block 9 plays a role in stable support and positioning. A crank 10 is rotatably connected to the top of the trapezoidal block 9. The crank 10 is used to drive the adjustment and positioning of the sliding column 13. A lever 11 is fixedly connected to the top of the crank 10. The lever 11 is used to control the rotation of the crank 10 and further adjust the clamping assembly. A crank 2 12 is rotatably connected to the outer wall of the crank 10. One end of the crank 2 12 is rotatably connected to one end of the sliding column 13. The crank 2 12 achieves precise adjustment of the clamping plate 14 by driving the sliding column 13 to move. A limiting plate 8 is fixedly connected inside the test bench 1. The limiting plate 8 is used to ensure that the sliding column 13 maintains an appropriate stroke during the sliding process and avoids excessive sliding. An electric push rod 3 is fixedly connected to the top of the test bench 1. The electric push rod 3 is used to automatically adjust the height or position of the connecting column 5 to adapt to the testing requirements of different circuit boards. The output end of the electric push rod 3 is fixedly connected to the connecting column 5. The connecting column 5 is used to connect with the disassembly component and realize the quick disassembly and replacement of the component. A disassembly component is set at the bottom of the connecting column 5. The disassembly component is used to conveniently disassemble and replace the detection module 7 in the test fixture, thereby improving the testing efficiency and adapting to the needs of different types of circuit boards.
[0032] Reference Figure 1 - Figure 4The disassembly assembly includes a hollow column 6, with its top fixedly connected to the bottom of a connecting column 5. A fixed column 16 is fixedly connected to one side of the hollow column 6. A movable column 17 is slidably connected inside the hollow column 6. A threaded column 18 is rotatably connected inside the movable column 17, threadedly connected to the inside of the fixed column 16. A ring 19 is fixedly connected to the outer wall of the threaded column 18, fitting against the outer wall of the movable column 17. A handle 20 is provided at one end of the threaded column 18, its outer wall fixedly connected to the inside of the threaded column 18. A detection module 7 is located inside the hollow column 6, engaging within it. In this structure, the hollow column 6 provides support and guidance, ensuring the correct positioning and sliding function of other components. The fixed connection between the connecting column 5 and the top of the hollow column 6 provides stability and ensures the overall structure's tightness and stability. The fixed column 16 provides a fixed reference point for the movable column 17. Simultaneously, through its connection with the threaded column 18, the fixed column 16 remains stationary during operation, ensuring smooth threaded transmission. The sliding function of the movable column 17 allows the threaded column 18 to be adjusted along the direction of the fixed column 16. This sliding connection ensures that the threaded column 18 can flexibly adjust its position within the hollow column 6, thereby achieving the required mechanical operation. The threaded column 18 is threadedly connected inside the fixed column 16 and fits against the outer wall of the movable column 17 through a ring 19 fixed to its outer wall, ensuring the stability and symmetry of the movable column 17 while preventing any excessive displacement or unstable operation. The handle 20 provides ease of operation; by rotating the handle 20, the rotation of the threaded column 18 can be effectively controlled, thereby adjusting the movement of the entire disassembly assembly.
[0033] Working principle: When testing integrated circuit boards, the circuit board is first placed inside the test bench 1, so that one side of the circuit board is in parallel contact with the limiting plate 8. Then, by moving the levers 11 on both sides of the test bench 1, the cranks 10 and 12 rotate on the support block 4. The rotation of the crank 12 pushes the sliding column 13, causing the sliding column 13 to drive the clamping plate 14 to slide inside the support block 4. Then, the sliding column 13 is limited by rotating the threaded column 15, thereby achieving the testing of circuit boards of different sizes placed on the fixture. The purpose of fixing is to allow for the replacement of different detection modules 7 when testing different types of circuit boards. By rotating the handle 20, one end of the handle 20 rotates into the fixed post 16, causing the threaded post 18 to move. During the displacement of the threaded post 18, the ring 19 is simultaneously moved. The displacement of the ring 19 pushes the moving post 17 to slide inside the hollow post 6, thereby moving the moving post 17 to one side of the fixed post 16. This achieves the purpose of locking and releasing the detection module 7, thus enabling the rapid replacement of the detection module 7.
[0034] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A high speed integrated circuit test handler comprising a test table (1) characterised in that: The test bench (1) is provided with a control panel (2) on its outer wall, and a support block (4) is fixedly connected to the side wall of the test bench (1). A threaded post (15) is threadedly connected inside the support block (4), and a clamping assembly is provided on the top of the support block (4). The clamping assembly includes a sliding column (13) and a clamping plate (14). The sliding column (13) is slidably connected inside the support block (4). The side wall of the clamping plate (14) is fixedly connected to one end of the sliding column (13). A trapezoidal block (9) is fixedly connected to the top of the support block (4). A crank (10) is rotatably connected to the top of the trapezoidal block (9). A lever (11) is fixedly connected to the top of the crank (10). A crank (2) is rotatably connected to the outer wall of the crank (10). One end of the crank (2) is rotatably connected to one end of the sliding column (13). A limit plate (8) is fixedly connected inside the test platform (1). An electric push rod (3) is fixedly connected to the top of the test platform (1). A connecting column (5) is fixedly connected to the output end of the electric push rod (3). A disassembly assembly is provided at the bottom of the connecting column (5).
2. The high speed integrated circuit test handler of claim 1 wherein: The disassembly assembly includes a hollow column (6), the top of which is fixedly connected to the bottom of the connecting column (5).
3. The high speed integrated circuit test handler of claim 2 wherein: A fixed column (16) is fixedly connected to one side of the hollow column (6), and a movable column (17) is slidably connected inside the hollow column (6).
4. The high speed integrated circuit test handler of claim 3 wherein: The movable column (17) is rotatably connected to a threaded column two (18), which is threadedly connected to the fixed column (16).
5. A high speed integrated circuit test handler according to claim 4 wherein: A ring (19) is fixedly connected to the outer wall of the threaded column (18), and the ring (19) is in contact with the outer wall of the movable column (17).
6. A high speed integrated circuit test handler according to claim 5 wherein: One end of the threaded post 2 (18) is provided with a handle (20), and the outer wall of the handle (20) is fixedly connected to the inside of the threaded post 2 (18).
7. A high speed integrated circuit test handler according to claim 6 wherein: The hollow column (6) is equipped with a detection module (7), which is engaged inside the hollow column (6).