Device aging control system

Abstract

The utility model relates to the technical field of thermal aging tests, in particular to a device aging control system, which comprises a temperature sampling unit, a temperature transmitter, a controller, a data transmission unit, an upper computer, a temperature control unit, an alarm module and a power supply module, the temperature sampling unit is composed of a plurality of first temperature sensors arranged in the controlled aging test box, the temperature sampling unit is connected with the controller through a temperature transmitter, the data transmission unit is connected with the controller, and the temperature control unit is connected with the controller and controlled by the controller. The alarm module is connected with the controller and is controlled by the controller, and the power supply module is connected with the controller and is controlled by the controller; the system further comprises a data storage unit, and the data storage unit is connected with the controller through an SPI interface. According to the utility model, temperature monitoring errors can be reduced, requirements of high-precision aging tests on temperature stability and uniformity can be satisfied, and device performance evaluation distortion caused by temperature deviation can be avoided.

Description

Technical Field

[0001] This utility model relates to the field of thermal aging test technology, and more specifically, to a device aging control system. Background Technology

[0002] In industries such as electronics, semiconductors, and electrical engineering, device aging tests are a crucial step in ensuring product quality. By simulating long-term, high-load operating environments, aging tests can accelerate the exposure of potential device defects, providing a basis for product performance optimization. However, numerous problems exist in current device aging control systems, severely impacting the accuracy and reliability of test results.

[0003] Insufficient accuracy in temperature control is a core challenge facing the industry. Traditional aging control systems struggle to fully cover the complex temperature field within the test chamber, and unreasonable sampling point layouts prevent real-time, accurate acquisition of the true internal temperature, resulting in significant temperature monitoring errors. Furthermore, when the temperature inside the test chamber deviates from the set value, existing systems exhibit slow adjustment responses, failing to quickly and accurately regulate the temperature. This leads to large temperature fluctuations within the chamber, failing to meet the stringent requirements for temperature stability and consistency in device aging tests. Consequently, the reliability of aging test results is affected, potentially causing biases in device performance evaluations.

[0004] Therefore, there is an urgent need for a device aging control system that can achieve high-precision temperature control, which is of great practical significance for improving the level of device aging tests in the industry and ensuring product quality. Utility Model Content

[0005] The purpose of this invention is to provide a device aging control system. By arranging a temperature sampling unit composed of several primary temperature sensors inside the controlled aging test chamber, and combining this with a real-time signal feedback mechanism from a temperature transmitter and controller, the system can comprehensively cover the complex temperature field within the test chamber. This solves the monitoring blind spot problem caused by traditional single-point or sparse sampling, reducing temperature monitoring errors. Based on high-density temperature monitoring signals and combined with intelligent control commands from a host computer, the controller drives the temperature control unit to dynamically adjust the temperature inside the chamber, significantly reducing temperature fluctuations. This meets the stringent requirements of high-precision aging tests for temperature stability and uniformity, effectively avoiding distortion in device performance evaluation caused by temperature deviations. This addresses the technical problem of achieving high-precision temperature control for device aging.

[0006] This utility model is achieved through the following technical solution: a device aging control system, the system including a temperature sampling unit, a temperature transmitter, a controller, a data transmission unit, a host computer, a temperature control unit, an alarm module, and a power supply module;

[0007] The temperature sampling unit consists of several first temperature sensors installed inside the controlled aging test chamber. The temperature sampling unit is connected to the controller via a temperature transmitter to feed back the temperature monitoring signal collected by the first temperature sensors to the controller. The data transmission unit is connected to the controller to feed back the temperature monitoring signal to the host computer and input the control command signal output by the host computer to the controller. The temperature control unit is connected to and controlled by the controller to adjust the temperature inside the corresponding controlled aging test chamber. The alarm module is connected to and controlled by the controller to activate the alarm. The power supply module is connected to and controlled by the controller to supply power to the controller and simultaneously supply power to the temperature sampling unit, temperature transmitter, data transmission unit, temperature control unit, and alarm module through the controller.

[0008] The system also includes a data storage unit, which is connected to the controller via an SPI interface to store the temperature monitoring signal locally.

[0009] According to a preferred embodiment, the data storage unit is a TF card, an SD card, or the cloud.

[0010] According to a preferred embodiment, the temperature control unit consists of a second temperature sensor and a heating tube, both of which are located inside the controlled aging test chamber. A solid-state relay is provided on the power supply line of the heating tube.

[0011] According to a preferred embodiment, the first temperature sensor is a PT100 platinum resistance temperature sensor.

[0012] According to a preferred embodiment, the PT100 platinum resistance temperature sensor is connected to a temperature transmitter via an RS485 bus.

[0013] According to a preferred embodiment, the controller employs an STM32 microcontroller.

[0014] According to a preferred embodiment, the data transmission unit adopts a wireless communication method, and the data transmission unit is equipped with an ESP32-WROOM Wi-Fi module.

[0015] According to a preferred embodiment, the data transmission unit interacts with the controller via the UART protocol and communicates with the host computer via the MQTT protocol.

[0016] According to a preferred embodiment, the alarm module includes a buzzer and / or an indicator light.

[0017] According to a preferred embodiment, an LM2596 step-down module is configured on the output circuit of the power module.

[0018] The technical solution of the device aging control system provided by this utility model has at least the following advantages and beneficial effects: By arranging a temperature sampling unit composed of several first temperature sensors inside the controlled aging test chamber, and cooperating with the real-time signal feedback mechanism of the temperature transmitter and controller, this utility model can fully cover the complex temperature field inside the test chamber, solve the monitoring blind zone problem caused by traditional single-point or sparse sampling, and reduce temperature monitoring errors; Based on the high-density temperature monitoring signal, combined with the intelligent control instructions of the host computer, the controller drives the temperature control unit to dynamically adjust the temperature inside the chamber, which can significantly reduce the temperature fluctuation amplitude, so as to meet the stringent requirements of high-precision aging tests for temperature stability and uniformity, and effectively avoid device performance evaluation distortion caused by temperature deviation. Attached Figure Description

[0019] Figure 1 This is a structural block diagram of a device aging control system provided in Embodiment 1 of the present invention;

[0020] Figure 2 This is a structural block diagram of a device aging control system provided in Embodiment 2 of this utility model. Detailed Implementation

[0021] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0022] Example 1

[0023] See Figure 1 As shown, Figure 1 This is a structural block diagram of the device aging control system provided in an embodiment of the present invention. More specifically, the device aging control system includes a temperature sampling unit, a temperature transmitter, a controller, a data transmission unit, a host computer, a temperature control unit, an alarm module, and a power supply module; in this embodiment, the controller uses an STM32 microcontroller.

[0024] The temperature sampling unit consists of several first temperature sensors arranged inside the controlled aging test chamber. In a preferred embodiment of this example, the first temperature sensors are PT100 platinum resistance temperature sensors. Several PT100 platinum resistance temperature sensors are evenly distributed on the inner wall of the aging test chamber to sample the temperature monitoring signals at different locations inside the aging test chamber in real time and accurately, thereby realizing multi-point sampling of temperature monitoring signals and fully covering the complex temperature field inside the aging test chamber.

[0025] Furthermore, the PT100 platinum resistance temperature sensor is connected to the temperature transmitter via an RS485 bus, and then connected to the controller via the temperature transmitter. The temperature transmitter converts the temperature monitoring signal into a standard industrial signal for stable long-distance transmission, reducing signal attenuation and interference. The converted temperature monitoring signal is then fed back to the controller. In addition, the temperature transmitter provides signal amplification and filtering functions to optimize the quality of the original temperature monitoring signal, thereby improving temperature sampling accuracy.

[0026] The data transmission unit is connected to the controller to feed back the temperature monitoring signal to the host computer, so as to realize the real-time feedback of temperature monitoring data, enabling the operator to obtain temperature monitoring data remotely in real time and realize the real-time monitoring of the aging test chamber. In a preferred embodiment of this example, the data transmission unit adopts a wireless communication method. The data transmission unit is equipped with an ESP32-WROOM Wi-Fi module. The data transmission unit interacts with the controller through the UART protocol and communicates with the host computer through the MQTT protocol.

[0027] In addition, the data transmission unit is also used to input control command signals output by the host computer to the controller. The host computer generates control commands based on temperature monitoring data, such as heating, cooling, and starting / stopping the equipment, and then sends them to the controller for execution through the data transmission unit, forming a closed-loop control link of data monitoring-decision-execution. In some preferred embodiments, the entire process does not require manual intervention. The host computer adjusts the temperature based on threshold judgment logic, thereby achieving automatic temperature control. This not only improves control accuracy and response speed but also reduces labor costs, making it suitable for automation scenarios with high real-time requirements. In another embodiment, temperature control is performed manually, which will not be elaborated on here.

[0028] The temperature control unit is connected to and controlled by the controller to adjust the internal temperature of the corresponding controlled aging test chamber. In this embodiment, the controller adjusts the temperature control unit according to the control command signal so that the internal temperature of the aging test chamber can quickly reach and be maintained within the set value range.

[0029] The alarm module is connected to and controlled by the controller to activate the alarm. In this embodiment, the alarm module includes a buzzer and / or an indicator light. When the difference between the temperature monitoring signal and the preset temperature value is greater than a preset threshold, such as 2°C, the alarm module is triggered to alert the staff to intervene in a timely manner.

[0030] The power module is connected to and controlled by the controller to supply power to the controller and simultaneously supply power to the temperature sampling unit, temperature transmitter, data transmission unit, temperature control unit, and alarm module. In this embodiment, the power module includes a 24V DC power adapter. In addition, an LM2596 step-down module is configured on the output circuit of the power module to supply power to each unit, for example, providing 5V to the controller and 3.3V to the data transmission unit. Further details are omitted here.

[0031] The system also includes a data storage unit, which is connected to the controller via an SPI interface to locally store the temperature monitoring signals. In this embodiment, the data storage unit ensures continuous temperature data recording even during network interruptions or host computer failures, guaranteeing data integrity. In this embodiment, the data storage unit can be a TF card, SD card, or cloud-based system; no specific limitations are imposed.

[0032] In addition, this embodiment also includes a display screen, which is connected to the controller to display the real-time temperature inside the aging test chamber.

[0033] In summary, this invention, by arranging a temperature sampling unit composed of several first temperature sensors inside the controlled aging test chamber, and in conjunction with the real-time signal feedback mechanism of the temperature transmitter and controller, can comprehensively cover the complex temperature field inside the test chamber, solve the monitoring blind spot problem caused by traditional single-point or sparse sampling, and reduce temperature monitoring errors. Based on the high-density temperature monitoring signal and combined with the intelligent control instructions of the host computer, the controller drives the temperature control unit to dynamically adjust the temperature inside the chamber, which can significantly reduce the temperature fluctuation range, meet the stringent requirements of high-precision aging tests for temperature stability and uniformity, and effectively avoid device performance evaluation distortion caused by temperature deviation.

[0034] Example 2

[0035] This embodiment further explains the temperature control unit based on the technical solution provided in Embodiment 1:

[0036] See Figure 2 As shown, in this embodiment, the temperature control unit consists of a second temperature sensor and a heating tube, both of which are installed inside the controlled aging test chamber. The second temperature sensor is located at the hot air outlet and is used to measure the hot air outlet temperature. The controller adjusts the heating power according to the hot air outlet temperature to ensure that the hot air can reach the set value and avoid the decrease in heating efficiency caused by air duct blockage or fan / heating tube failure.

[0037] In addition, a solid-state relay is installed on the power supply line of the heating tube. When the temperature is abnormal, such as when a partial short circuit occurs, the power supply line of the heating tube is cut off by the solid-state relay to ensure the reliability of the aging test chamber.

[0038] The above are merely preferred embodiments of this utility model and are not intended to limit the scope of this utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A device aging control system, characterized by, The system includes a temperature sampling unit, a temperature transmitter, a controller, a data transmission unit, a host computer, a temperature control unit, an alarm module, and a power supply module; The temperature sampling unit consists of several first temperature sensors installed inside the controlled aging test chamber. The temperature sampling unit is connected to the controller via a temperature transmitter to feed back the temperature monitoring signal collected by the first temperature sensors to the controller. The data transmission unit is connected to the controller to feed back the temperature monitoring signal to the host computer and input the control command signal output by the host computer to the controller. The temperature control unit is connected to and controlled by the controller to adjust the temperature inside the corresponding controlled aging test chamber. The alarm module is connected to and controlled by the controller to activate the alarm. The power supply module is connected to and controlled by the controller to supply power to the controller and simultaneously supply power to the temperature sampling unit, temperature transmitter, data transmission unit, temperature control unit, and alarm module through the controller. The system also includes a data storage unit, which is connected to the controller via an SPI interface to store the temperature monitoring signal locally.

2. The device aging control system of claim 1, wherein, The data storage unit is a TF card, SD card, or cloud.

3. The device aging control system of claim 1, wherein, The temperature control unit consists of a second temperature sensor and a heating tube. Both the second temperature sensor and the heating tube are installed inside the controlled aging test chamber. A solid-state relay is installed on the power supply line of the heating tube.

4. The device aging control system of claim 1, wherein, The first temperature sensor is a PT100 platinum resistance temperature sensor.

5. The device aging control system of claim 4, wherein, The PT100 platinum resistance temperature sensor is connected to the temperature transmitter via an RS485 bus.

6. The device aging control system as described in claim 1, characterized in that, The controller uses an STM32 microcontroller.

7. The system of claim 1, wherein, The data transmission unit adopts wireless communication and is equipped with an ESP32-WROOM Wi-Fi module.

8. The system of claim 1, wherein, The data transmission unit interacts with the controller via the UART protocol and communicates with the host computer via the MQTT protocol.

9. The system of claim 1, wherein, The alarm module includes a buzzer and / or an indicator light.

10. The system of claim 1, wherein, The power module's output circuit is equipped with an LM2596 step-down module.

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