Switching test card for NVME electronic disk

Abstract

The utility model relates to the field of computer accessories, in particular to a switching test card for an NVME electronic disk, which comprises a PCB (printed circuit board), an adjusting component, a heat conduction silicon strip, a switching plug and a test socket are arranged on the PCB, a T-shaped column is mounted on the adjusting component, a tensioning component is arranged on the lower surface of the PCB, the adjusting component is slidably mounted on the tensioning component, and the testing socket is mounted on the T-shaped column. According to the utility model, the position of the T-shaped column can be adjusted according to the lengths of NVME electronic disks of different models, the NVME electronic disks of different models can be plugged, the pressing plate can move up and down through the limiting springback assembly, and meanwhile, the test pins are driven to move in the test socket, so that the test pins can be ensured to fully contact golden fingers of the NVME electronic disks, and the test efficiency of the NVME electronic disks is improved. Hard contact between the NVME electronic disk and the test pins is prevented, the service life of the transfer test card is prolonged, the tensioning assembly can apply pressure to the NVME electronic disk through the T-shaped column, the T-shaped column corresponds to the mounting notch in the rear side of the NVME electronic disk, the NVME electronic disk is prevented from being separated from the test card, and the test stability is improved.

Description

Technical Field

[0001] This utility model relates to the field of computer accessories, and more particularly to an adapter test card for NVME electronic disks. Background Technology

[0002] NVMe protocol dedicated solid-state storage media can fully leverage the advantages of solid-state storage media such as high performance, low power consumption, and high concurrency. NVMe protocol-based solid-state electronic disks (SSDs) are widely used in high-speed data acquisition and storage systems. A single NVMe electronic disk has broken through the continuous sequential read and write bandwidth of no less than 2GB / s.

[0003] When testing the lifespan of an NVMe hard drive, an adapter test card is required. This involves plugging the NVMe hard drive into the adapter test card, which in turn connects to the storage device, thus enabling the lifespan test of the NVMe hard drive.

[0004] However, existing NVMe electronic disk adapter test cards cannot be plugged into different types of NVMe electronic disks during actual testing. Traditional testing methods require frequent plugging and unplugging, and the hard contact between the NVMe electronic disk and the test pins can easily damage the interface of the adapter test card and reduce the service life of the adapter test card.

[0005] Therefore, it is necessary to further improve the NVME electronic disk adapter test card. Utility Model Content

[0006] The technical problem to be solved by this utility model is to overcome the existing defects and provide an adapter test card for NVME electronic disks, which can be plugged into different models of NVME electronic disks, prevents the NVME electronic disks from making hard contact with the test pins, improves the service life of the adapter test card, and can effectively solve the problems in the background art.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a test adapter for NVME electronic disks, comprising a PCB board, wherein an adjustment component, a thermally conductive silicon strip, an adapter plug, and a test socket are provided on the PCB board; a T-shaped post is mounted on the adjustment component; a tensioning component is provided on the lower surface of the PCB board; the adjustment component is slidably mounted on the tensioning component; a pressure plate is provided in the mounting cavity of the test socket; the left and right sides of the pressure plate are connected to the test socket through a limiting and rebounding component; test pins are distributed in the pressure plate array; the lower ends of the test pins pass through the test socket and extend into the slot of the test socket; a trapezoidal pressure block is provided on the upper surface of the pressure plate; a cover plate is installed on the test socket; a moving groove is opened on the upper surface of the cover plate; a lever and a spring are provided inside the moving groove; a release component is provided on the lever; a clamping component is installed at the lower end of the lever; and a fixing component is installed on the clamping component.

[0008] Preferably, the adjustment component includes a slider and a groove. The groove is formed on the left side of the upper surface of the PCB board, the slider is slidably installed inside the groove, and the T-shaped post is set on the upper surface of the slider.

[0009] Preferably, the tensioning assembly includes a spring, a guide post, and a mounting plate. The spring is fitted on the outside of the guide post. The mounting plate is provided at both ends of the guide post and is connected to the PCB board. The guide post is disposed in the sliding hole of the slider. The two ends of the spring are respectively connected to the slider and the mounting plate located on the left side.

[0010] Preferably, the release component includes an L-shaped pressure strip, a first limiting groove, and a second limiting groove. The L-shaped pressure strip is installed on the push post, and the first and second limiting grooves are arrayed on the cover plate. The L-shaped pressure strip is correspondingly set with the first limiting groove.

[0011] Preferably, the limiting rebound assembly includes a spring and limiting posts. The limiting post array is distributed in the mounting cavity of the test socket, and the limiting posts are installed inside the limiting holes of the pressure plate. The spring is fitted onto the limiting posts.

[0012] Preferably, the clamping assembly includes a guide block, a trapezoidal pressure block II, and a connector. The guide block is installed in a guide groove on the lower surface of the cover plate. The guide block is set on the trapezoidal pressure block II, which is connected to the connector. The push pin is set on the upper surface of the connector. The trapezoidal pressure block II is set in correspondence with the trapezoidal pressure block I.

[0013] Preferably, the fixing component includes an elastic strip and a wedge-shaped stop, the elastic strip and the wedge-shaped stop are disposed on the elastic strip and are engaged in the limiting groove, and the elastic strip is disposed on the connector.

[0014] The working principle and usage principle of this utility model are as follows: the test card is inserted into the test equipment through the adapter plug. According to the length of different models of NVME electronic disks, the T-shaped column is moved so that the slider can slide inside the slide groove. The position of the T-shaped column is adjusted so that the NVME electronic disk is inserted into the slot of the test socket. When the slider moves along the guide column, the spring is compressed and the spring applies a reverse pressure to the slider to ensure that the T-shaped column can clamp the NVME electronic disk and prevent the NVME electronic disk from falling out of the slot of the test socket.

[0015] The movable pin can drive the second trapezoidal pressure block to move through the connecting piece. The second trapezoidal pressure block can drive the guide block to move in the guide groove on the lower surface of the cover plate, preventing the second trapezoidal pressure block from swinging when moving. The inclined surface of the second trapezoidal pressure block is in contact with the inclined surface of the first trapezoidal pressure block. When the second trapezoidal pressure block moves, it can make the first trapezoidal pressure block move downward, thereby causing the pressure plate to move downward.

[0016] The pressure plate can move along the limiting post, which limits the pressure plate to move only up and down. When the pressure plate moves downward under force, the spring three is compressed, which can act as a buffer. At the same time, the pressure plate drives the test pin to move within the test socket, ensuring that the test pin can fully contact the gold fingers of the NVME electronic disk and improve test stability. When the pressure plate is no longer under force, the spring three can reset the pressure plate and the test pin moves upward and disengages from the gold fingers of the NVME electronic disk.

[0017] The movement of the pusher can drive the movement of the connector, which in turn drives the movement of the elastic strip. The wedge-shaped stop can be locked inside the limiting groove 2, thereby fixing the position of the connector and ensuring that the trapezoidal pressure block 2 continuously applies pressure to the trapezoidal pressure block 1.

[0018] Pressing the L-shaped pressure strip will push the wedge-shaped stop out from inside the second limiting groove. The connecting piece will drive the second trapezoidal pressure block to reset, the pressure plate will no longer be under force, and the pressure plate will return to its initial position. At this time, the NVME electronic disk can be removed from the slot of the test socket.

[0019] Compared with the prior art, the beneficial effects of this utility model are as follows: the position of the T-post can be adjusted according to the length of different models of NVME electronic disks, allowing for the insertion of different models of NVME electronic disks; the pressure plate can move up and down through the limiting and rebound assembly, simultaneously driving the test pins to move within the test socket, ensuring that the test pins can fully contact the gold fingers of the NVME electronic disk, preventing hard contact between the NVME electronic disk and the test pins, and improving the service life of the adapter test card; the tensioning assembly can apply pressure to the NVME electronic disk through the T-post, which corresponds to the mounting slot on the rear side of the NVME electronic disk, preventing the NVME electronic disk from detaching from the test card and improving test stability. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 This is a bottom view of the present invention;

[0022] Figure 3 This is a schematic diagram of the internal structure of the test socket of this utility model;

[0023] Figure 4 This is an enlarged schematic diagram of part A of this utility model;

[0024] Figure 5 This is a partial cross-sectional schematic diagram of the test socket of this utility model;

[0025] Figure 6 This is a partial cross-sectional schematic diagram of the cover plate of this utility model.

[0026] Explanation of reference numerals in the attached diagram: 1. PCB board; 2. T-shaped post; 3. Adjustment assembly; 301. Slider; 302. Slide groove; 4. Thermal conductive silicone strip; 5. Adapter plug; 6. Test socket; 7. Tensioning assembly; 701. Spring 1; 702. Guide post; 703. Mounting plate; 8. Pressure plate; 9. Cover plate; 10. Test pin; 11. Trapezoidal pressure block 1; 12. Release assembly; 1201. L-shaped pressure strip; 1202. Limiting groove 1; 1203. Limiting groove 2; 13. Toggle post; 14. Moving groove; 15. Spring 2; 16. Limiting rebound assembly; 1601. Spring 3; 1602. Limiting post; 17. Pressing assembly; 1701. Guide block; 1702. Trapezoidal pressure block 2; 1703. Connector; 18. Fixing assembly; 1801. Elastic strip; 1802. Wedge-shaped stop. Detailed Implementation

[0027] To make the technical means, creative features, objectives and effects of the embodiments of this application easier to understand, the embodiments of this application are further described below in conjunction with the figures and specific embodiments. It should be understood that the specific embodiments described herein are only used to explain the embodiments of this application and are not intended to limit the embodiments of this application.

[0028] Please see Figure 1-6 This utility model provides a technical solution: a test adapter for NVMe electronic disks, including a PCB board 1. The PCB board 1 is provided with an adjustment assembly 3, a thermally conductive silicone strip 4, an adapter plug 5, and a test socket 6. A T-shaped post 2 is mounted on the adjustment assembly 3. A tensioning assembly 7 is provided on the lower surface of the PCB board 1. The adjustment assembly 3 is slidably mounted on the tensioning assembly 7. A pressure plate 8 is provided inside the mounting cavity of the test socket 6. The left and right sides of the pressure plate 8 are connected to the test socket 6 via limiting and rebounding assemblies 16. Next, the pressure plate 8 is arrayed with test pins 10. The lower end of the test pin 10 passes through the test socket 6 and extends into the slot of the test socket 6. The upper surface of the pressure plate 8 is provided with a trapezoidal pressure block 11. The test socket 6 is equipped with a cover plate 9. The upper surface of the cover plate 9 is provided with a moving groove 14. The moving groove 14 is provided with a lever 13 and a spring 15. The lever 13 is provided with a release component 12. The lower end of the lever 13 is equipped with a clamping component 17. The clamping component 17 is equipped with a fixing component 18.

[0029] Specifically, the thermally conductive silicon strip 4 is set to correspond with the test socket 6. The thermally conductive silicon strip 4 can conduct the heat generated by the NVME electronic disk during testing and reduce the temperature of the NVME electronic disk. The adjustment component 3 can adjust the position of the T-shaped post 2 according to the length of different models of NVME electronic disks. The tensioning component 7 can apply pressure to the NVME electronic disk through the T-shaped post 2. The T-shaped post 2 corresponds to the mounting slot on the back of the NVME electronic disk to prevent the NVME electronic disk from falling off the test card.

[0030] The pressure plate 8 can move up and down through the limiting and rebounding assembly 16, while simultaneously moving the test pin 10 within the test socket 6, ensuring that the test pin 10 can fully contact the gold fingers of the NVME electronic disk and ensuring the stability of the test.

[0031] Move the lever 13 so that it moves inside the moving groove 14. The spring 15 is compressed by the force. The lever 13 drives the pressing assembly 17 to move. The pressing assembly 17 can apply downward pressure to the pressure plate 8, causing the pressure plate 8 to move downward. When the pressing assembly 17 moves laterally, it can drive the fixing assembly 18 to engage in the release assembly 12. The release assembly 12 can disengage the fixing assembly 18 from the cover plate 9, and reset the pressing assembly 17.

[0032] Furthermore, the adjustment component 3 includes a slider 301 and a groove 302. The groove 302 is formed on the left side of the upper surface of the PCB board 1. The slider 301 is slidably installed inside the groove 302. The T-shaped post 2 is set on the upper surface of the slider 301.

[0033] Specifically, moving the T-shaped column 2 allows the slider 301 to slide inside the groove 302, facilitating the adjustment of the position of the T-shaped column 2 according to the length of different NVME electronic disk models.

[0034] Furthermore, the tensioning assembly 7 includes a spring 701, a guide post 702, and a mounting plate 703. The spring 701 is fitted on the outside of the guide post 702. The mounting plate 703 is provided at both ends of the guide post 702 and is connected to the PCB board 1. The guide post 702 is provided in the sliding hole of the slider 301. The two ends of the spring 701 are respectively connected to the slider 301 and the mounting plate 703 located on the left side.

[0035] Specifically, when the slider 301 moves along the guide post 702, it can compress the spring 701 and at the same time, the spring 701 applies a reverse pressure to the slider 301 to ensure that the T-shaped post 2 can clamp the NVME electronic disk.

[0036] Furthermore, the release component 12 includes an L-shaped pressure strip 1201, a first limiting groove 1202 and a second limiting groove 1203. The L-shaped pressure strip 1201 is installed on the push post 13, and the first limiting groove 1202 and the second limiting groove 1203 are arrayed on the cover plate 9. The L-shaped pressure strip 1201 is correspondingly set with the first limiting groove 1202.

[0037] Specifically, the movement of the detonator 13 can move the L-shaped pressure strip 1201. The first limiting groove 1202 and the second limiting groove 1203 are respectively set to correspond to the two ends of the moving groove 14, ensuring that when the detonator 13 moves inside the moving groove 14, the end of the L-shaped pressure strip 1201 away from the detonator 13 can be pressed into the first limiting groove 1202 and the second limiting groove 1203.

[0038] Furthermore, the limit rebound assembly 16 includes a spring 1601 and a limit post 1602. The limit posts 1602 are arrayed in the mounting cavity of the test socket 6, and the limit posts 1602 are installed inside the limit holes of the pressure plate 8. The spring 1601 is fitted onto the limit post 1602.

[0039] Specifically, the pressure plate 8 can move along the limiting post 1602. The limiting post 1602 limits the pressure plate 8. When the pressure plate 8 moves downward under force, the spring 1601 is compressed and can also play a buffering role. When the pressure plate 8 is no longer under force, the spring 1601 can reset the pressure plate 8.

[0040] Furthermore, the clamping assembly 17 includes a guide block 1701, a trapezoidal pressure block 2 1702, and a connector 1703. The guide block 1701 is installed in the guide groove on the lower surface of the cover plate 9. The guide block 1701 is disposed on the trapezoidal pressure block 2 1702. The trapezoidal pressure block 2 1702 is connected to the connector 1703. The push pin 13 is disposed on the upper surface of the connector 1703. The trapezoidal pressure block 2 1702 is correspondingly disposed to the trapezoidal pressure block 11.

[0041] Specifically, when the pusher 13 moves, it can drive the trapezoidal pressure block 1702 to move through the connector 1703. The trapezoidal pressure block 1702 can drive the guide block 1701 to move in the guide groove on the lower surface of the cover plate 9, preventing the trapezoidal pressure block 1702 from swinging when it moves. The inclined surface of the trapezoidal pressure block 1702 contacts the inclined surface of the trapezoidal pressure block 11. When the trapezoidal pressure block 1702 moves, it can make the trapezoidal pressure block 11 move downward, thereby causing the pressure plate 8 to move downward.

[0042] Furthermore, the fixing component 18 includes an elastic strip 1801 and a wedge-shaped stop 1802. The elastic strip 1801 and the wedge-shaped stop 1802 are disposed on the elastic strip 1801 and are engaged in the limiting groove 1202. The elastic strip 1801 is disposed on the connector 1703.

[0043] Specifically, when the connector 1703 moves, it can drive the elastic strip 1801 to move. The wedge-shaped stop 1802 can be locked inside the first limiting groove 1202 or the second limiting groove 1203, thereby fixing the connector 1703. The L-shaped pressure strip 1201 can press the wedge-shaped stop 1802 out from inside the second limiting groove 1203.

[0044] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An adapter test card for NVME electronic disks, comprising a PCB board (1), characterized in that: The PCB board (1) is provided with an adjustment component (3), a thermally conductive silicon strip (4), an adapter plug (5), and a test socket (6). A T-shaped post (2) is installed on the adjustment component (3). A tensioning component (7) is provided on the lower surface of the PCB board (1). The adjustment component (3) is slidably installed on the tensioning component (7). A pressure plate (8) is provided in the mounting cavity of the test socket (6). The left and right sides of the pressure plate (8) are connected to the test socket (6) through a limiting spring-loaded component (16). Test pins (10) are distributed in an array on the pressure plate (8). The lower end of the pin (10) passes through the test socket (6) and extends into the slot of the test socket (6). A trapezoidal pressure block (11) is provided on the upper surface of the pressure plate (8). A cover plate (9) is installed on the test socket (6). A moving groove (14) is opened on the upper surface of the cover plate (9). A push pin (13) and a spring (15) are provided inside the moving groove (14). A release component (12) is provided on the push pin (13). A clamping component (17) is installed at the lower end of the push pin (13). A fixing component (18) is installed on the clamping component (17).

2. The test adapter card for NVMe SSDs of claim 1, wherein: The adjustment component (3) includes a slider (301) and a groove (302). The groove (302) is opened on the left side of the upper surface of the PCB board (1). The slider (301) is slidably installed inside the groove (302). The T-shaped column (2) is set on the upper surface of the slider (301). 3.The test adapter card for NVME SSDs according to claim 1 or 2, characterized in that: The tensioning assembly (7) includes a spring (701), a guide post (702), and a mounting plate (703). The spring (701) is fitted on the outside of the guide post (702). The mounting plate (703) is provided at both ends of the guide post (702) and is connected to the PCB board (1). The guide post (702) is provided in the sliding hole of the slider (301). The two ends of the spring (701) are respectively connected to the slider (301) and the mounting plate (703) located on the left side.

4. The test adapter card for NVMe SSDs of claim 1, wherein: The release component (12) includes an L-shaped pressure strip (1201), a first limiting groove (1202) and a second limiting groove (1203). The L-shaped pressure strip (1201) is installed on the push post (13). The first limiting groove (1202) and the second limiting groove (1203) are arrayed on the cover plate (9). The L-shaped pressure strip (1201) is correspondingly set with the first limiting groove (1202).

5. The test adapter card for NVMe SSDs of claim 1, wherein: The limiting rebound assembly (16) includes a spring three (1601) and a limiting post (1602). The limiting posts (1602) are arrayed in the mounting cavity of the test socket (6), and the limiting posts (1602) are installed inside the limiting holes of the pressure plate (8). The spring three (1601) is fitted on the limiting post (1602).

6. The test adapter card for NVMe SSDs of claim 1, wherein: The clamping assembly (17) includes a guide block (1701), a trapezoidal clamping block two (1702), and a connector (1703). The guide block (1701) is installed in the guide groove on the lower surface of the cover plate (9). The guide block (1701) is set on the trapezoidal clamping block two (1702). The trapezoidal clamping block two (1702) is connected to the connector (1703). The push pin (13) is set on the upper surface of the connector (1703). The trapezoidal clamping block two (1702) is correspondingly set with the trapezoidal clamping block one (11).

7. The test adapter card for NVMe SSDs of claim 1 or 6, wherein: The fixing component (18) includes an elastic strip (1801) and a wedge-shaped stop (1802). The elastic strip (1801) and the wedge-shaped stop (1802) are disposed on the elastic strip (1801) and are engaged in the limiting groove (1202). The elastic strip (1801) is disposed on the connector (1703).

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