Placing table for chip quality detection

Abstract

The utility model discloses a placement table for chip quality detection, which belongs to the field of chip detection and comprises a substrate, a display screen fixedly mounted at one end of the substrate and a control button arranged at the corner of one end, far away from the display screen, of the substrate, and a detection seat is fixedly mounted on the substrate. The placement table for chip quality detection is simple in structure and convenient to use, the clamping plates and the ratchet wheels are arranged, the spindle rotates to drive the clamping plates to slide, chips are clamped, the use of the clamping plates enables the chips to be taken up when the cover plate is lifted up, it is ensured that the chips can be rapidly discharged, when the spindle rotates, the clamping plates can be close to each other, and the clamping plates are convenient to use. The locking state is achieved in the opposite direction, so that the chip is fixed through the clamping plate, the stability and accuracy of the chip in the rotating process of the cover plate are ensured, when limiting is relieved, the pawl is driven to be separated from the ratchet wheel by rotating the rotating shaft, the clamping plate can slide in the opposite direction to reset, and operation is easy and convenient.

Description

A placement stage for chip quality inspection Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a placement stage for chip quality testing. Background Technology

[0002] A chip, usually referring to an integrated circuit chip, also called an IC, is a tiny, thin wafer-like silicon-based material on which electronic components, such as transistors, resistors, and capacitors, are integrated. It is a fundamental component of electronic devices. The process of manufacturing a chip involves using photolithography to form circuit patterns on a silicon wafer, then forming electronic components through processes such as deposition, etching, and diffusion, and finally packaging them into a complete chip.

[0003] Currently, chip quality testing typically involves placing the chips in testing slots on a placement table. However, due to the generally small size of the chips, even with hand grips provided, it is still inconvenient for staff to handle them while wearing gloves, making the process rather cumbersome.

[0004] Therefore, this utility model provides a placement stage for chip quality inspection to solve the above problems. Summary of the Invention

[0005] (a) Technical problems to be solved

[0006] This invention provides a chip quality inspection platform, which aims to solve the problems mentioned in the background art, such as the inconvenience of removing chips after inspection.

[0007] (II) Technical Solution

[0008] To achieve the above objectives, the present invention provides the following technical solution: a chip quality inspection platform, comprising a substrate, a display screen fixedly mounted on one end of the substrate, and a control button disposed at a corner of the substrate away from the display screen. A detection seat is fixedly mounted on the substrate, a cover plate is hinged to one end of the detection seat, a detection groove is formed on the detection seat, and a fixing frame for limiting the chip is fixedly mounted in the detection groove.

[0009] The cover plate has an inner cavity with two openings communicating with the outside. A main shaft is rotatably mounted inside the inner cavity, and a gear is fitted on the main shaft. The end of the main shaft away from the gear passes axially through the inner cavity. Two racks that mesh with the gear are slidably mounted inside the inner cavity. A clamping plate is slidably mounted in the openings and is fixedly connected to the racks. A torsion spring is fitted on the main shaft, and the two ends of the torsion spring are fixedly connected to the main shaft and the inner cavity, respectively.

[0010] Preferably, the inner cavity is provided with a limiting mechanism for locking the spindle.

[0011] Preferably, the limiting mechanism includes a ratchet mounted on the main shaft, a rotating shaft passing through the inner cavity, a pawl fixedly installed at one end of the rotating shaft located in the inner cavity, and a second torsion spring mounted on the rotating shaft. The pawl engages with the ratchet, and the two ends of the second torsion spring are fixedly connected to the rotating shaft and the inner cavity, respectively.

[0012] Preferably, a clamping mechanism is provided at the end of the clamping plate away from the cover plate.

[0013] Preferably, the clamping mechanism includes a support plate fixedly installed at the end of the clamping plate and a plurality of rubber strips arranged in a linear array fixedly installed at the end of the support plate away from the clamping plate.

[0014] Preferably, a gasket corresponding to the fixing frame is fixedly installed on the cover plate.

[0015] (III) Beneficial Effects

[0016] This chip quality inspection placement stage has a simple structure and is easy to use. By setting up clamping plates and ratchet, the rotation of the spindle drives the clamping plates to slide, thereby clamping the chip. The use of clamping plates allows the chip to be lifted when the cover is lifted, ensuring that the chip can be quickly unloaded. When the spindle rotates, the clamping plates can move closer to each other and lock in the opposite direction, thus fixing the chip and ensuring the stability and accuracy of the chip during the rotation of the cover. When the limit is released, the rotation of the shaft drives the pawl and ratchet to separate, and the clamping plates can slide in the opposite direction to reset. The operation is simple and convenient. Attached Figure Description

[0017] Figure 1 is a schematic diagram of the overall structure of a chip quality inspection stage;

[0018] Figure 2 is a schematic diagram of the structure at point A in Figure 1;

[0019] Figure 3 is a schematic diagram of the overall multi-angle structure of a chip quality inspection stage;

[0020] Figure 4 is a schematic diagram of the structure at point B in Figure 3.

[0021] In the diagram: 1. Base plate; 11. Display screen; 12. Control button; 2. Detection seat; 21. Cover plate; 211. Gasket; 212. Inner cavity; 213. Through port; 22. Detection groove; 221. Fixing frame; 3. Main shaft; 31. Gear; 32. Rack; 33. Clamping plate; 34. Clamping mechanism; 341. Support plate; 342. Adhesive strip; 35. Torsion spring one; 4. Limiting mechanism; 41. Ratchet; 42. Rotating shaft; 421. Pawl; 422. Torsion spring two. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] This utility model provides a chip quality inspection platform, as shown in Figures 1-4. The platform includes a substrate 1, a display screen 11 fixedly installed at one end of the substrate 1, and a control button 12 located at the corner of the substrate 1 away from the display screen 11. A detection seat 2 is fixedly installed on the substrate 1. A cover plate 21 is hinged to one end of the detection seat 2. A detection groove 22 is opened on the detection seat 2. A fixing frame 221 for limiting the chip is fixedly installed in the detection groove 22.

[0024] The cover plate 21 has an inner cavity 212, and the inner cavity 212 has two openings 213 that communicate with the outside. A main shaft 3 is rotatably installed in the inner cavity 212, and a gear 31 is mounted on the main shaft 3. The end of the main shaft 3 away from the gear 31 passes axially through the inner cavity 212. Two racks 32 that mesh with the gear 31 are slidably installed in the inner cavity 212. A clamping plate 33 is slidably installed in the opening 213 and is fixedly connected to the racks 32. A torsion spring 35 is mounted on the main shaft 3, and the two ends of the torsion spring 35 are fixedly connected to the main shaft 3 and the inner cavity 212, respectively.

[0025] When using the chip, the chip can be placed in the fixed frame 221 in the detection slot 22, and then the cover plate 21 can be closed to start the detection. After the detection is completed, the spindle 3 can be rotated to drive the gear 31 to rotate. The gear 31 meshes with the rack 32, so the rack 32 can slide along the through 213 and drive the clamping plate 33 to slide, thereby clamping the chip. At this time, the cover plate 21 can be opened.

[0026] Furthermore, a limiting mechanism 4 for locking the main shaft 3 is provided in the inner cavity 212. The limiting mechanism 4 includes a ratchet 41 mounted on the main shaft 3, a rotating shaft 42 passing through the inner cavity 212, a pawl 421 fixedly mounted on one end of the rotating shaft 42 located in the inner cavity 212, and a torsion spring 422 mounted on the rotating shaft 42. The pawl 421 engages with the ratchet 41, and the two ends of the torsion spring 422 are fixedly connected to the rotating shaft 42 and the inner cavity 212, respectively. Under the action of the torsion spring 35, the two clamping plates 3 When the two plates 33 are in a state of mutual distance, rotating the spindle 3 will bring the two clamping plates 33 closer together. At this time, the rotation direction of the spindle 3 is the free state of the ratchet 41 and the pawl 421. After the clamping plate 33 clamps the chip, it releases the spindle 3. Under the action of the torsion spring 35, the spindle 3 has a tendency to reverse. In this direction, the ratchet 41 and the pawl 421 are locked, which realizes the limitation of the spindle 3 and the clamping plate 33 and the fixation of the chip. When the limitation is released, the rotating shaft 42 can be rotated to drive the pawl 421 to separate from the ratchet 41, so that the clamping plate 33 can slide in the opposite direction to reset.

[0027] Furthermore, a clamping mechanism 34 is provided at the end of the clamping plate 33 away from the cover plate 21. The clamping mechanism 34 includes a support plate 341 fixedly installed at the end of the clamping plate 33 and a plurality of adhesive strips 342 arranged in a linear array fixedly installed at the end of the support plate 341 away from the clamping plate 33. During the movement of the clamping plate 33, the chip can be clamped by the support plate 341 and the adhesive strips 342, and the adhesive strips 342 can increase the friction between the support plate 341 and the chip, ensuring greater stability when the chip is clamped.

[0028] Furthermore, a gasket 211 corresponding to the fixing frame 221 is fixedly installed on the cover plate 21; when the cover plate 21 is closed, the gasket 211 can be located directly above the chip, ensuring greater stability during the chip testing process.

[0029] The above description is only a preferred embodiment of the present utility model, but the protection scope of the present utility model is not limited thereto. Any equivalent substitutions or changes made by those skilled in the art within the technical scope disclosed in the present utility model, based on the technical solution and the inventive concept of the present utility model, should be included within the protection scope of the present utility model.

Claims

1. A chip quality inspection platform, comprising a substrate (1), a display screen (11) fixedly mounted on one end of the substrate (1), and a control button (12) disposed at a corner of the substrate (1) away from the display screen (11), wherein a detection seat (2) is fixedly mounted on the substrate (1), a cover plate (21) is hinged to one end of the detection seat (2), a detection groove (22) is formed on the detection seat (2), and a fixing frame (221) for limiting the chip is fixedly mounted in the detection groove (22); characterized in that: The cover plate (21) has an inner cavity (212) with two openings (213) communicating with the outside. A main shaft (3) is rotatably installed in the inner cavity (212). A gear (31) is mounted on the main shaft (3). The end of the main shaft (3) away from the gear (31) passes axially through the inner cavity (212). Two racks (32) that mesh with the gear (31) are slidably installed in the inner cavity (212). A clamp (33) is slidably installed in the opening (213). The clamp (33) is fixedly connected to the rack (32). A torsion spring (35) is mounted on the main shaft (3). The two ends of the torsion spring (35) are fixedly connected to the main shaft (3) and the inner cavity (212) respectively.

2. The chip quality inspection stage according to claim 1, characterized in that: The inner cavity (212) is provided with a limiting mechanism (4) for locking the main shaft (3).

3. The chip quality inspection stage according to claim 2, characterized in that: The limiting mechanism (4) includes a ratchet (41) mounted on the main shaft (3), a rotating shaft (42) passing through the inner cavity (212), a pawl (421) fixedly mounted on one end of the rotating shaft (42) located in the inner cavity (212), and a second torsion spring (422) mounted on the rotating shaft (42). The pawl (421) meshes with the ratchet (41), and the two ends of the second torsion spring (422) are fixedly connected to the rotating shaft (42) and the inner cavity (212) respectively.

4. The placement stage for chip quality inspection according to claim 1, characterized in that: A clamping mechanism (34) is provided at the end of the clamping plate (33) away from the cover plate (21).

5. The chip quality inspection stage according to claim 4, characterized in that: The clamping mechanism (34) includes a support plate (341) fixedly installed at the end of the clamping plate (33) and a plurality of rubber strips (342) arranged in a linear array fixedly installed at the end of the support plate (341) away from the clamping plate (33).

6. The placement stage for chip quality inspection according to claim 1, characterized in that: A gasket (211) corresponding to the fixing frame (221) is fixedly installed on the cover plate (21).

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