High-temperature nitrogen blowing test probe card capable of being quickly disassembled and assembled

Abstract

The utility model belongs to the technical field of high-temperature nitrogen blowing test probe cards, and discloses a high-temperature nitrogen blowing test probe card capable of being quickly disassembled and assembled, which comprises a probe card mechanism, a circuit board is arranged on the surface of the probe card mechanism, a quick disassembly assembly is arranged on the surface of the circuit board, and the quick disassembly assembly comprises a clamping plate. Clamping plates are symmetrically mounted on the surface of the circuit board, groove plates are symmetrically mounted on the surface of the probe card mechanism, the clamping plates are clamped in the groove plates, T-shaped plates are mounted on the surfaces of the clamping plates, adjusting grooves matched with the T-shaped plates are formed in the surfaces of the groove plates, and the probe card mechanism is arranged in the adjusting grooves. The T-shaped plate is slidably connected to the interior of the adjusting groove, a positioning pin is inserted into a through hole formed in the surface of the T-shaped plate, and one end of the positioning pin penetrates through the T-shaped plate. The device has the advantages that a circuit board, an aluminum block and a probe can be quickly disassembled and assembled, and the use effect of the device is further improved.

Description

A quick-assembly and disassembly high-temperature nitrogen blowing test probe card Technical Field

[0001] This utility model belongs to the technical field of high-temperature nitrogen blowing test probe cards, specifically a high-temperature nitrogen blowing test probe card that is quick to install and disassemble. Background Technology

[0002] A probe card is a test interface primarily used for testing bare chips. It connects to a tester and the chip, transmitting signals to test chip parameters. The probes on the probe card directly contact the solder pads or bumps on the chip to extract chip signals. Combined with peripheral test instruments and software control, this achieves automated measurement. Probe cards are used before IC packaging for functional testing of bare chips, screening out defective products before subsequent packaging. They are also commonly used for high-temperature nitrogen blowing testing.

[0003] Meanwhile, application number CN212674986U, entitled "An Ultra-High Probe Height Pin Card," describes an ultra-high probe height pin card comprising a circuit board, an aluminum block, ceramic, and a probe. The lower end of the circuit board is connected to the aluminum block, and a countersunk screw is provided at the connection between the circuit board and the aluminum block. The lower end of the aluminum block is ceramic, and a ceramic resin adhesive layer is provided at the connection between the aluminum block and the ceramic. A probe is connected to the lower base surface of the ceramic, and resin is provided at the connection between the ceramic and the probe. However, during production, the probe is easily damaged, resulting in a high scrap rate, and current processes cannot meet customers' ultra-high probe height requirements. This paper modifies the original assembly structure of the epoxy probe card, making the structure more robust during assembly with the circuit board and reducing the scrap rate in the production workshop. The probe is an epoxy probe card type, and the use of the aluminum block increases the probe height, meeting the height requirements of more customers and resulting in a better overall effect.

[0004] The above-mentioned technical solution has the following drawbacks during use: the circuit board, aluminum block, and probe are connected by countersunk screws, which are prone to rusting after prolonged use. This makes it difficult to disassemble the circuit board, aluminum block, and probe, and also requires considerable effort to install them. Therefore, it is impossible to achieve quick disassembly and quick assembly of the circuit board, aluminum block, and probe.

[0005] Therefore, a high-temperature nitrogen blowing test probe card that can be quickly disassembled and assembled is proposed to address the above problems. Summary of the Invention

[0006] To address the problems mentioned in the background art, this utility model provides a quick-release high-temperature nitrogen blowing test probe card, which has the advantage of enabling quick disassembly and assembly of circuit boards, aluminum blocks, and probes, thereby further improving the effectiveness of the device.

[0007] To achieve the above objectives, this utility model provides the following technical solution: a quick-release high-temperature nitrogen blowing test probe card, comprising a probe card mechanism, wherein a circuit board is mounted on the surface of the probe card mechanism, and a quick-release assembly is mounted on the surface of the circuit board;

[0008] The quick-release assembly includes a snap-fit ​​plate. Snap-fit ​​plates are symmetrically mounted on the surface of the circuit board. Grooved plates are symmetrically mounted on the surface of the probe clip mechanism. The snap-fit ​​plate snaps into the interior of the grooved plate. A T-shaped plate is mounted on the surface of the snap-fit ​​plate. An adjustment groove adapted to the T-shaped plate is formed on the surface of the grooved plate. The T-shaped plate is slidably connected inside the adjustment groove. A positioning pin is inserted into a through hole on the surface of the T-shaped plate. One end of the positioning pin passes through the T-shaped plate and is inserted into a positioning hole on the surface of the grooved plate. A positioning component is mounted on the surface of the snap-fit ​​plate.

[0009] Preferably, a movable rod is rotatably connected inside the grooved plate, and a shaped block is installed on the surface of the movable rod, the shaped block abutting against the snap-fit ​​plate.

[0010] Preferably, a torsion spring is fitted on the surface of the movable rod, one end of the torsion spring is connected to the irregular block, and the other end of the torsion spring is installed inside the groove plate.

[0011] Preferably, the irregularly shaped block is configured with an "irregularly shaped inclined surface structure" and is adapted to the snap-fit ​​plate.

[0012] Preferably, the two irregularly shaped blocks are located on both sides of the snap-fit ​​plate to stabilize the position of the snap-fit ​​plate.

[0013] Preferably, the positioning component includes positioning rods, and positioning rods are symmetrically installed on one side surface of the groove plate. A mounting plate is slidably connected between the two positioning rods. A positioning block is installed on the side surface of the mounting plate near the snap-fit ​​plate. A positioning groove adapted to the positioning block is opened on the surface of the snap-fit ​​plate, and the positioning block is snapped into the inside of the positioning groove.

[0014] Preferably, a return spring is sleeved on the surface of the positioning rod, one end of the return spring is connected to the positioning rod, and the other end of the return spring is connected to the mounting plate.

[0015] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0016] 1. This utility model incorporates a quick-release assembly. When disassembling the circuit board and probe card mechanism, first pull the positioning pin to disengage it from the positioning hole on the surface of the grooved plate. Then, pull the snap-fit ​​plate to slide inside the grooved plate. During this sliding motion, the snap-fit ​​plate moves the T-shaped plate inside the adjustment groove. The movable rod rotates the irregular block inside the grooved plate, stabilizing the position of the snap-fit ​​plate and preventing positional shift during use. At this point, the snap-fit ​​plate disengages from the grooved plate, thus achieving quick disassembly of the circuit board and probe card mechanism. Subsequent operations are the reverse of the quick-release operation, enabling quick assembly of the circuit board and probe card mechanism.

[0017] 2. This utility model incorporates a positioning component. When the snap-fit ​​plate is pulled, the mounting plate is pulled first, causing it to slide on the surface of the positioning rod. The positioning rod guides the movement of the mounting plate, preventing positional displacement. As the mounting plate slides on the positioning rod, it compresses the return spring, causing deformation and repositioning the mounting plate. This facilitates operation. When the mounting plate moves, it disengages the positioning block from the positioning groove. Pulling the snap-fit ​​plate then disengages it from the groove plate. This process effectively positions the snap-fit ​​plate, preventing displacement during use and further improving the device's stability. Attached Figure Description

[0018] Figure 1 is a schematic diagram of the overall structure of this utility model;

[0019] Figure 2 is a schematic diagram of the structure of the snap-fit ​​plate and groove plate of this utility model;

[0020] Figure 3 is a schematic diagram of the structure of the T-shaped plate and snap-fit ​​plate of this utility model;

[0021] Figure 4 is a schematic diagram of the structure of the irregular block and movable rod of this utility model.

[0022] In the diagram: 1. Probe card mechanism; 12. Circuit board; 2. Quick-release assembly; 21. Snap-fit ​​plate; 22. Groove plate; 23. T-shaped plate; 24. Adjustment groove; 25. Positioning pin; 26. Movable rod; 27. Irregular block; 28. Torsion spring; 3. Positioning assembly; 31. Positioning rod; 32. Mounting plate; 33. Positioning block; 34. Positioning groove; 35. Return spring. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] As shown in Figures 1 to 4, this utility model provides a quick-release high-temperature nitrogen blowing test probe card, including a probe card mechanism 1, a circuit board 12 mounted on the surface of the probe card mechanism 1, and a quick-release component 2 mounted on the surface of the circuit board 12.

[0025] The quick-release assembly 2 includes a snap-fit ​​plate 21. The snap-fit ​​plate 21 is symmetrically mounted on the surface of the circuit board 12. The probe snap-fit ​​mechanism 1 is symmetrically mounted on the surface of the groove plate 22. The snap-fit ​​plate 21 is snapped into the inside of the groove plate 22. A T-shaped plate 23 is mounted on the surface of the snap-fit ​​plate 21. An adjustment groove 24 adapted to the T-shaped plate 23 is opened on the surface of the groove plate 22. The T-shaped plate 23 is slidably connected inside the adjustment groove 24. A positioning pin 25 is inserted into the through hole opened on the surface of the T-shaped plate 23. One end of the positioning pin 25 passes through the T-shaped plate 23 and is inserted into the positioning hole opened on the surface of the groove plate 22. A positioning assembly 3 is mounted on the surface of the snap-fit ​​plate 21.

[0026] Specifically, as shown in Figure 1, a movable rod 26 is rotatably connected inside the grooved plate 22. A shaped block 27 is installed on the surface of the movable rod 26. The shaped block 27 abuts against the snap-fit ​​plate 21. A torsion spring 28 is sleeved on the surface of the movable rod 26. One end of the torsion spring 28 is connected to the shaped block 27, and the other end of the torsion spring 28 is installed inside the grooved plate 22. The shaped block 27 is set in the form of an "irregular inclined surface structure" and is adapted to the snap-fit ​​plate 21. The two shaped blocks 27 are located on both sides of the snap-fit ​​plate 21 to stabilize the position of the snap-fit ​​plate 21.

[0027] In this implementation scheme: When disassembling the circuit board 12 and the probe card mechanism 1, first pull the positioning pin 25 to disengage it from the positioning hole on the surface of the groove plate 22. Then, pull the snap-fit ​​plate 21 to slide inside the groove plate 22. During the sliding process, the snap-fit ​​plate 21 drives the T-shaped plate 23 to move inside the adjustment groove 24. As it moves, the irregular block 27 gradually separates from the snap-fit ​​plate 21, and the torsion spring 28 continuously resets, thereby driving the irregular block 27 through the movable rod 26. Rotating inside the grooved plate 22, the irregularly shaped block 27 can stabilize the position of the snap-fit ​​plate 21 and prevent positional displacement during use. At this time, the snap-fit ​​plate 21 disengages from the grooved plate 22, thereby realizing quick disassembly of the circuit board 12 and the probe card mechanism 1. When installing, the snap-fit ​​plate 21 continuously pushes the irregularly shaped block 27, causing the irregularly shaped block 27 to drive the movable rod 26 to rotate. The torsion spring 28 is then pushed and deformed. Subsequent operations are the reverse of the above quick disassembly operation, thus realizing quick assembly of the circuit board 12 and the probe card mechanism 1.

[0028] Please refer to Figures 1, 2 and 4 for Embodiment 2. The difference between this embodiment and Embodiment 1 is that the positioning component 3 includes a positioning rod 31. The positioning rod 31 is symmetrically installed on one side surface of the groove plate 22. The two positioning rods 31 are slidably connected to a mounting plate 32. A positioning block 33 is installed on the side surface of the mounting plate 32 near the snap-fit ​​plate 21. The surface of the snap-fit ​​plate 21 is provided with a positioning groove 34 that matches the positioning block 33. The positioning block 33 is snapped into the inside of the positioning groove 34.

[0029] Specifically, as shown in Figures 1-4, a return spring 35 is sleeved on the surface of the positioning rod 31. One end of the return spring 35 is connected to the positioning rod 31, and the other end of the return spring 35 is connected to the mounting plate 32.

[0030] In this implementation scheme: When the snap-fit ​​plate 21 is pulled, the mounting plate 32 is pulled first, causing the mounting plate 32 to slide on the surface of the positioning rod 31. The positioning rod 31 can guide the movement of the mounting plate 32, preventing the mounting plate 32 from shifting position during movement. When the mounting plate 32 slides on the surface of the positioning rod 31, it compresses the return spring 35, causing the return spring 35 to deform. The return spring 35 can reset the position of the mounting plate 32, making it convenient for operators to use. When the mounting plate 32 moves, it drives the positioning block 33 to disengage from the positioning groove 34. Then, the snap-fit ​​plate 21 is pulled, causing the snap-fit ​​plate 21 to disengage from the inside of the groove plate 22. In this way, the position of the snap-fit ​​plate 21 can be positioned, preventing position displacement during use and further improving the stability of the device.

[0031] It should be noted that the probe card mechanism 1 and circuit board 12 in this device are mature existing technologies, and are based on the same principle as the published patent CN212674986U, "An Ultra-High Probe Height Needle Card". For specific operation, please refer to the published patent.

[0032] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0033] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A quick-assembly and disassembly high-temperature nitrogen blowing test probe card, comprising a probe card mechanism (1), characterized in that: The probe card mechanism (1) is mounted with a circuit board (12), and the circuit board (12) is mounted with a quick-release assembly (2). The quick-release assembly (2) includes a snap-fit ​​plate (21). The circuit board (12) is symmetrically mounted with snap-fit ​​plates (21). The probe card mechanism (1) is symmetrically mounted with grooved plates (22). The snap-fit ​​plate (21) snaps into the inside of the grooved plate (22). The snap-fit ​​plate (21) is mounted with a T-shaped plate (23). The grooved plate (22) is provided with an adjustment groove (24) that matches the T-shaped plate (23). The T-shaped plate (23) is slidably connected to the inside of the adjustment groove (24). A positioning pin (25) is inserted into a through hole on the surface of the T-shaped plate (23). One end of the positioning pin (25) passes through the T-shaped plate (23) and is inserted into a positioning hole on the surface of the grooved plate (22). The snap-fit ​​plate (21) is mounted with a positioning assembly (3).

2. The high-temperature nitrogen blowing test probe card with quick assembly and disassembly according to claim 1, characterized in that: The groove plate (22) is rotatably connected to a movable rod (26), and a shaped block (27) is installed on the surface of the movable rod (26). The shaped block (27) abuts against the snap-fit ​​plate (21).

3. The high-temperature nitrogen blowing test probe card with quick assembly and disassembly according to claim 2, characterized in that: The surface of the movable rod (26) is fitted with a torsion spring (28), one end of which is connected to the irregular block (27), and the other end of which is installed inside the groove plate (22).

4. The high-temperature nitrogen blowing test probe card with quick assembly and disassembly according to claim 3, characterized in that: The irregular block (27) is configured with an "irregular inclined surface structure" and is adapted to the snap-fit ​​plate (21).

5. A quick-assembly and disassembly high-temperature nitrogen blowing test probe card according to claim 4, characterized in that: The two irregular blocks (27) are located on both sides of the snap-fit ​​plate (21) to stabilize the position of the snap-fit ​​plate (21).

6. A quick-assembly and disassembly high-temperature nitrogen blowing test probe card according to claim 1, characterized in that: The positioning component (3) includes positioning rods (31). Positioning rods (31) are symmetrically installed on one side surface of the groove plate (22). A mounting plate (32) is slidably connected between the two positioning rods (31). A positioning block (33) is installed on the side surface of the mounting plate (32) near the snap-fit ​​plate (21). A positioning groove (34) adapted to the positioning block (33) is opened on the surface of the snap-fit ​​plate (21). The positioning block (33) is snapped into the inside of the positioning groove (34).

7. A quick-assembly and disassembly high-temperature nitrogen blowing test probe card according to claim 6, characterized in that: A return spring (35) is sleeved on the surface of the positioning rod (31). One end of the return spring (35) is connected to the positioning rod (31), and the other end of the return spring (35) is connected to the mounting plate (32).

Images