Chip electrical property test clamp and device

Abstract

The utility model relates to the technical field of chip electrical testing, and provides a chip electrical testing clamp and device.The clamp comprises a base, a placing table arranged on the base and used for placing a product, a mounting plate connected to the base in a sliding mode and a driving assembly used for pushing the mounting plate to move in the direction close to the product; the placing table is provided with a placing groove for placing a product, the placing groove extends to the surface, close to the mounting plate, of the placing table, the mounting plate is used for mounting an electric probe, and the electric probe moves along with the mounting plate so as to abut against the product and detect the electrical performance of the product; the driving assembly comprises a cam rotationally connected to the workbench, a driving piece for driving the cam to rotate and a first reset piece for driving the mounting plate to reset, and the cam abuts against the mounting plate. The method has the beneficial effect of improving the precision of the detection position of the product so as to reduce the influence on the detection result.

Description

A chip electrical testing fixture and device Technical Field

[0001] This application relates to the technical field of chip electrical testing, and in particular to a chip electrical testing fixture and apparatus. Background Technology

[0002] In the production of electronic components and other products, testing is one of the key processes. Especially in the chip electrical testing stage, achieving fast, stable, and repeatable testing directly impacts product yield and production cycle.

[0003] In existing technologies, to perform electrical testing on chips, manual clamps or simple mechanical devices are typically used to fix the product and bring it into contact with electrical probes. Specifically, common methods include using spring-loaded clamping mechanisms to bring the probes into contact with the product, manually adjusting the probe position using a knob, or using a cylinder to push the probes for testing. However, for some relatively small products, the required precision of the test position is relatively high, and the above methods may affect the clamping effect, thus requiring further improvement. Summary of the Invention

[0004] To address the above problems, this application provides a chip electrical testing fixture and apparatus.

[0005] This application provides a chip electrical testing fixture and apparatus, which adopts the following technical solution:

[0006] A chip electrical testing fixture and apparatus includes a base, a placement stage disposed on the base for placing a product, a mounting plate slidably connected to the base, and a drive assembly for pushing the mounting plate toward the product. The placement stage has a placement slot for placing the product, the placement slot extending to the surface of the placement stage near the mounting plate. The mounting plate is equipped with power probes, and the power probes move with the mounting plate to abut against the product and test its electrical performance. The drive assembly includes a cam rotatably connected to the worktable, a drive member for driving the cam to rotate, and a first reset member for resetting the mounting plate. The cam abuts against the mounting plate.

[0007] By adopting the above technical solution, the driving component is activated to drive the cam to rotate forward. As the cam abuts against the mounting plate, it causes the mounting plate to slide. The rotation of the cam pushes the mounting plate closer to the placement stage, causing the electrical probe to contact the product for electrical performance testing. After the test, the cam rotates in the reverse direction, allowing the mounting plate to reset under the action of the first reset component, releasing its contact with the product, thus completing the product test. The rotation of the cam and the first reset component drive the mounting plate in a reciprocating linear motion, which provides relatively high accuracy in the required detection position of the product and reduces the impact on the test results.

[0008] Preferably, the drive assembly further includes a limiting member for restricting the rotation of the cam.

[0009] By adopting the above technical solution, the position of the mounting plate will be different for products of different sizes. To address this, by setting a limiting component, the rotation of the cam is restricted, thereby limiting the range of sliding of the mounting plate and reducing the possibility of the cam rotating excessively and causing the mounting plate to move beyond the predetermined range.

[0010] Preferably, the limiting member is a limiting rod on the base and an abutting rod on the outer peripheral wall of the cam. The base is provided with a plurality of limiting holes at intervals on the rotation path of the cam. The limiting rod is inserted into the limiting hole and the abutting rod is used to abut against the limiting rod.

[0011] By adopting the above technical solution, the multiple limiting holes on the base allow the limiting rod to be inserted into different limiting holes according to actual needs, thereby adjusting the maximum rotation angle of the cam. This design effectively reduces the possibility of the mounting plate moving beyond the predetermined stroke due to excessive rotation of the cam, thereby reducing the problem of poor contact or damage between the electric probe and the product, and improving the stability and reliability of the detection process.

[0012] Preferably, the driving component includes a drive motor for driving the cam to rotate, a pressure sensor (443) is provided on the limit rod, the pressure sensor (443) is electrically connected to the host computer, the host computer is electrically connected to a controller, and the drive motor is electrically connected to the controller.

[0013] By adopting the above technical solution, the drive motor rotates the cam, realizing the precise reciprocating motion of the mounting plate, thereby pushing the electrical probe to accurately contact the product for testing, significantly improving testing efficiency and accuracy. The pressure sensor on the limit rod monitors the force state of the cam in real time and transmits the signal to the host computer. The host computer, through the controller, precisely adjusts the operating parameters of the drive motor to improve the precise control of the cam's rotation angle and position, further enhancing the stability and reliability of the testing.

[0014] Preferably, the placement platform is provided with a clamping component for clamping against the product.

[0015] By adopting the above technical solution and incorporating a clamping component, the product can be kept fixed during the testing process, reducing interference from external factors and improving the stability of the product during testing.

[0016] Preferably, the placement platform has rotating grooves on the side walls of the placement slot. The clamping assembly includes a rotating rod that rotatably passes through the rotating groove, a rotating wheel fixedly sleeved on the rotating rod, a rotating sleeve coaxially disposed on the lower surface of the cam, a connecting rope connecting the rotating wheel and the rotating sleeve, and a second reset member disposed on the rotating rod to drive the rotating wheel to reset. The outer peripheral wall of the rotating wheel is wrapped with an elastic layer. The rotating wheel abuts against the product. The rotating rod extends to the side of the placement platform away from the mounting plate. The base is rotatably connected to a pulley for the connecting rope to be wound around. The connecting rope is used to be wound around the rotating rod. The base has a through groove for the connecting rope to pass through. The rotating sleeve is rotatably connected to the base.

[0017] By adopting the above technical solution, a rotating groove is opened on the side wall of the placement tank. The rotating rod passes through the rotating groove and clamps the product with a rotating wheel, ensuring the product remains stable during the inspection process and reducing the possibility of inspection errors caused by positional deviation. The elastic layer on the outer circumference of the rotating wheel increases friction with the product while protecting the product surface. A connecting rope connects the rotating wheel to the rotating sleeve, allowing the cam to rotate and drive the rotating wheel to rotate via the rotating sleeve, thus tightening the connecting rope and driving the rotating wheel to rotate, improving automatic clamping of the product. When the tension on the connecting rope is released, the rotating rod and rotating wheel are reset by the action of the second reset component, preparing for the next inspection.

[0018] Preferably, there are two rotating wheels, which are respectively disposed on opposite side walls of the placement groove, and the two rotating wheels rotate in opposite directions.

[0019] By adopting the above technical solution, the two rotating wheels are respectively set on opposite side walls of the placement slot and rotate in opposite directions. This allows for even force application from both sides to firmly press the product against the placement table, ensuring product stability during testing and preventing product displacement or tilting due to unilateral force, thereby improving testing accuracy and reliability. Furthermore, during the rotation of the two rotating wheels, the product can be moved closer to the bottom wall of the placement slot to improve placement efficiency. Under the action of the second reset component, the product can be moved away from the bottom wall of the placement slot for removal, facilitating the placement of the next product.

[0020] A chip electrical testing device includes a worktable, a fixture disposed on the worktable, an electrical probe disposed on the fixture, and a control system electrically connected to the electrical probe.

[0021] Preferably, it also includes a detection fiber optic mechanism for real-time detection of whether the product is in place, the detection fiber optic mechanism being electrically connected to the control system.

[0022] By adopting the above technical solution and using a fiber optic detection module to monitor the product status in real time, the possibility of false detection or missed detection caused by premature removal of the product is reduced, thereby improving the reliability and stability of the detection.

[0023] In summary, this utility model has the following beneficial effects:

[0024] 1. The mounting plate is moved precisely by a motor-driven cam, enabling the electrical probe to contact the product quickly and accurately, significantly improving detection efficiency and accuracy;

[0025] 2. The stroke of the mounting plate can be flexibly adjusted by adjusting the cam parameters to adapt to the testing needs of products of different sizes, thereby enhancing the versatility and adaptability of the device;

[0026] 3. In conjunction with the detection fiber optic module, monitor the product status in real time to avoid false or missed detections caused by premature removal of the product, thereby improving the reliability and stability of the detection. Attached Figure Description

[0027] Figure 1 is a schematic diagram of the overall structure of Embodiment 1 of this application;

[0028] Figure 2 is a schematic diagram of the structure of the electrical probe in Embodiment 1 of this application;

[0029] Figure 3 is a schematic diagram of a chip electrical testing device according to Embodiment 1 of this application;

[0030] Figure 4 is a schematic diagram of the overall structure of Embodiment 2 of this application;

[0031] Figure 5 is a schematic diagram of the clamping component in Embodiment 2 of this application;

[0032] Figure 6 is a cross-sectional view of the base in Embodiment 2 of this application.

[0033] Explanation of reference numerals in the attached drawings: 1. Base; 11. Slide rail; 12. Limiting hole; 13. Through slot; 14. Pulley; 2. Placement platform; 21. Placement slot; 22. Rotation slot; 3. Mounting plate; 31. Sliding part; 32. Abutting part; 33. Mounting part; 4. Drive assembly; 41. Cam; 42. Drive component; 43. First reset component; 431. Spring; 432. Connecting rod; 44. Limiting component; 441. Limiting rod; 442. Abutting rod; 443. Pressure sensor; 5. Product; 6. Electrical probe; 7. Clamping assembly; 71. Rotating rod; 72. Rotating wheel; 73. Rotating sleeve; 74. Connecting rope; 75. Second reset component; 8. Worktable; 81. Control system; 82. Detection fiber optic mechanism. Detailed Implementation

[0034] The present application will be further described in detail below with reference to Figures 1-6.

[0035] This application discloses a chip electrical testing fixture and apparatus.

[0036] Example 1:

[0037] A chip electrical testing fixture, referring to Figures 1 and 2, includes a base 1, a placement platform 2 disposed on the base 1 for placing a product 5, a mounting plate 3 slidably connected to the base 1, and a drive assembly 4 for pushing the mounting plate 3 toward the product 5.

[0038] The base 1 is rectangular, and the placement platform 2 is located near one end of the base 1. The upper surface of the placement platform 2 has a placement groove 21 for placing the product 5, which extends to the surface of the base 1 near the mounting plate 3. In this embodiment, the placement platform 2 is detachably connected to the base 1, specifically by bolts to install the placement platform 2 onto the base 1, so that placement platforms 2 with different sizes of placement grooves 21 can be replaced to adapt to products 5 of different sizes.

[0039] The base 1 has a slide rail 11 along its length on its upper surface. The mounting plate 3 includes a sliding part 31 slidably connected to the slide rail 11, an abutment part 32 detachably connected to the sliding part 31, and a mounting part 33 located at one end of the abutment part 32 near the placement platform 2. The length direction of the abutment part 32 is parallel to the length direction of the sliding part 31, and the length direction of the mounting part 33 is parallel to the width direction of the abutment part 32. The mounting part 33 is used for mounting the power supply probes 6. The power probes 6 are fixedly inserted into the mounting part 33. Several power probes 6 are spaced apart along the length direction of the mounting part 33. It should be noted that the abutment part 32 is detachably connected to the sliding part 31, and the mounting part 33 is detachably connected to the abutment part 32, both connected by bolts.

[0040] It should be noted that the probe head of the electrical probe 6 can be a probe head with an elastic element to improve the contact effect with the product 5 and reduce the possibility of poor contact. Since the electrical probe 6 is existing technology, it will not be described in detail here.

[0041] The electrical probe 6 moves with the mounting plate 3 to abut against the product 5 and detect its electrical performance. For the movement of the mounting plate 3, the drive assembly 4 includes a cam 41 rotatably connected to the worktable, a drive member 42 driving the cam 41 to rotate, a first reset member 43 resetting the mounting plate 3, and a limiting member 44 restricting the rotation of the cam 41. In this embodiment, the cam 41 is located on the side of the base 1 away from the placement table 2 and abuts against the abutment portion 32. The base 1 is provided with a rotating seat for the cam 41 to rotate, and the cam 41 is mounted on the rotating seat via a rotating shaft. Specifically, the drive member 42 is a drive motor that drives the cam 41 to rotate. The drive motor is connected to the base 1. Since the drive motor is existing technology, it will not be described in detail here.

[0042] The first reset component 43 includes a spring 431 and connecting rods 432 disposed at both ends of the spring 431. The two connecting rods 432 are respectively connected to the abutment part 32 and the cam 41, so that after the drive motor drives the cam 41 to reset, the spring itself will drive the mounting plate 3 to reset.

[0043] The limiting component 44 specifically includes a limiting rod 441 mounted on the base 1 and an abutment rod 442 mounted on the outer peripheral wall of the cam 41. The base 1 has several limiting holes 12 spaced apart along the rotation path of the cam 41. The limiting rod 441 is inserted into the limiting hole 12, and the abutment rod 442 abuts against the limiting rod 441. The lower end of the abutment rod 442 can be threadedly connected to the limiting hole 12 to reduce the possibility of slippage and disengagement. A pressure sensor 443 is mounted on the limiting rod 441. The pressure sensor 443 is electrically connected to a host computer, which is electrically connected to a controller. The drive motor is electrically connected to the controller.

[0044] When the limit rod 441 abuts against the pressure sensor 443 to apply pressure to the pressure sensor 443, the pressure sensor 443 transmits the corresponding pressure data to the host computer. Then, the host computer determines based on the data that the drive motor needs to be turned off to stop the cam 41 from rotating.

[0045] The implementation principle of a chip electrical testing fixture according to an embodiment of this application is as follows: The drive unit 42 is activated to drive the cam 41 to rotate forward. As the cam 41 abuts against the mounting plate 3, the mounting plate 3 slides. The rotation of the cam 41 pushes the mounting plate 3 towards the placement stage 2, causing the electrical probe 6 to abut against the product 5 for electrical performance testing. After the test, the cam 41 rotates in the reverse direction, causing the mounting plate 3 to reset under the action of the first reset unit 43, releasing the pressure on the product 5, thus completing the test on the product 5. The rotation of the cam 41 and the first reset unit 43 drive the mounting plate 3 to perform reciprocating linear motion, which provides relatively high accuracy in the required detection position of the product 5, reducing the impact on the test results.

[0046] This application also discloses a chip electrical testing device. Referring to FIG3, it includes a worktable 8, a fixture disposed on the worktable 8, an electrical probe 6 disposed on the fixture, a control system 81 electrically connected to the electrical probe 6, and a detection fiber optic mechanism 82 for real-time detection of whether the product 5 is in place. The detection fiber optic mechanism 82 is electrically connected to the control system 81. Since the control system 81 and the detection fiber optic mechanism 82 are both prior art, they will not be described in detail here.

[0047] Example 2:

[0048] Referring to Figures 4, 5, and 6, the difference from Embodiment 1 is that the placement platform 2 is provided with a clamping component 7 for clamping against the product 5. Specifically, the side wall of the placement platform 2 located in the placement groove 21 is provided with a rotating groove 22. The clamping component 7 specifically includes a rotating rod 71 that rotates through the rotating groove 22, a rotating wheel 72 that is fixedly sleeved on the rotating rod 71, a rotating sleeve 73 that is coaxially arranged on the lower surface of the cam 41, a connecting rope 74 that connects the rotating wheel 72 and the rotating sleeve 73, and a second reset member 75 that is provided on the rotating rod 71 to drive the rotating wheel 72 to reset.

[0049] The outer peripheral wall of the rotating wheel 72 is wrapped with an elastic layer, which is made of rubber or plastic, depending on the requirements. The elastic layer is partially exposed in the rotating groove 22 to abut against the product 5. In this embodiment, there are two rotating wheels 72, which are respectively set on opposite side walls of the placement groove 21, and the two rotating wheels 72 rotate in opposite directions. One end of the rotating rod 71 extends to the side of the placement platform 2 away from the mounting plate 3. The base 1 is rotatably connected to a pulley 14 for the connecting rope 74 to be wound. The connecting rope 74 is used to be wound around the rotating rod 71. The ends of the two connecting ropes 74 away from the rotating rod 71 are fixed together. The base 1 has a through groove 13 for the connecting rope 74 to pass through. The rotating sleeve 73 is rotatably connected to the base 1. It should be noted that the two connecting ropes 74 are wound in opposite directions on the two rotating rods 71 ​​in order to drive the two rotating rods 71 ​​to rotate in different directions.

[0050] The second reset component 75 is a torsion spring, which is coaxially sleeved on the rotating rod 71. The two ends of the torsion spring are connected to the rotating rod 71 and the placement platform 2, respectively.

[0051] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A chip electrical testing fixture, characterized in that: The device includes a base (1), a placement platform (2) disposed on the base (1) for placing a product (5), a mounting plate (3) slidably connected to the base (1), and a drive assembly (4) for pushing the mounting plate (3) to move toward the product (5). The placement platform (2) has a placement slot (21) for placing the product (5), and the placement slot (21) extends to the surface of the placement platform (2) near the mounting plate (3). The mounting plate (3) is equipped with a power probe (6), and the power probe (6) moves with the mounting plate (3) to abut against the product (5) and detect its electrical performance. The drive assembly (4) includes a cam (41) rotatably connected to the worktable, a drive member (42) for driving the cam (41) to rotate, and a first reset member (43) for driving the mounting plate (3) to reset. The cam (41) abuts against the mounting plate (3).

2. The chip electrical testing fixture according to claim 1, characterized in that: The drive assembly (4) also includes a limiter (44) for limiting the rotation of the cam (41).

3. The chip electrical testing fixture according to claim 2, characterized in that: The limiting member (44) is provided on the base (1) with a limiting rod (441) and an abutting rod (442) on the outer peripheral wall of the cam (41). The base (1) is provided with a plurality of limiting holes (12) at intervals on the rotation path of the cam (41). The limiting rod (441) is inserted into the limiting hole (12), and the abutting rod (442) is used to abut against the limiting rod (441).

4. A chip electrical testing fixture according to claim 3, characterized in that: The driving component (42) includes a drive motor for driving the cam (41) to rotate. A pressure sensor (443) is provided on the limit rod (441). The pressure sensor (443) is electrically connected to the host computer. The host computer is electrically connected to a controller. The drive motor is electrically connected to the controller.

5. A chip electrical testing fixture according to claim 1, characterized in that: The placement platform (2) is provided with a clamping component (7) for clamping against the product (5).

6. A chip electrical testing fixture according to claim 5, characterized in that: The placement platform (2) has rotating grooves (22) on the side walls of the placement slot (21). The clamping assembly (7) includes a rotating rod (71) that rotates through the rotating groove (22), a rotating wheel (72) that is fixedly sleeved on the rotating rod (71), a rotating sleeve (73) that is coaxially arranged on the lower surface of the cam (41), a connecting rope (74) that connects the rotating wheel (72) and the rotating sleeve (73), and a second reset member (75) that is arranged on the rotating rod (71) to drive the rotating wheel (72) to reset. The outer peripheral wall of the rotating wheel (72) is provided with an elastic layer. The rotating wheel (72) abuts against the product (5). The rotating rod (71) extends to the side of the placement platform (2) away from the mounting plate (3). The base (1) is rotatably connected to a pulley (14) for winding the connecting rope (74). The connecting rope (74) is used to wind around the rotating rod (71). The base (1) has a through groove (13) for the connecting rope (74) to pass through. The rotating sleeve (73) is rotatably connected to the base (1).

7. A chip electrical testing fixture according to claim 6, characterized in that: Two rotating wheels (72) are provided and are respectively provided on the opposite side walls of the placement groove (21), and the two rotating wheels (72) rotate in opposite directions.

8. A chip electrical testing device, characterized in that: The device includes a worktable (8), a fixture disposed on the worktable (8), an electrical probe (6) disposed on the fixture, and a control system (81) electrically connected to the electrical probe (6), wherein the fixture is the fixture described in any one of claims 1-7.

9. A chip electrical testing device according to claim 8, characterized in that: It also includes a detection fiber optic mechanism (82) for real-time detection of whether the product (5) is in place, the detection fiber optic mechanism (82) being electrically connected to the control system (81).

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