Power aging test fixture

By designing a power aging test fixture with multiple connectors and microstrip lines, the problem of low testing efficiency in existing technologies has been solved, and efficient and reliable power device aging testing has been achieved.

CN224203369UActive Publication Date: 2026-05-05CHENGDU GUOQIANG YUXING ELECTRONIC TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
CHENGDU GUOQIANG YUXING ELECTRONIC TECH CO LTD
Filing Date
2025-05-16
Publication Date
2026-05-05

AI Technical Summary

Technical Problem

The lack of efficient power device aging test fixtures in the existing technology results in low test efficiency.

Method used

A power aging test fixture was designed, which uses a variety of connectors and microstrip lines for electrical connection, and achieves reliable clamping through a support base, socket cover and locking structure, and is used in conjunction with the power supply circuit for testing.

Benefits of technology

This improves the reliability and efficiency of testing, ensuring the accuracy and efficient installation and removal of power devices.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a power aging test fixture, which comprises a lower mounting plate, a plurality of supporting legs arranged at the lower part of the lower mounting plate, a PCB (Printed Circuit Board) fixed on the lower mounting plate, a first coaxial connector and a second coaxial connector which are arranged on the PCB, and a plurality of power device sockets arranged on the PCB, the first connecting micro-strip and the second connecting micro-strip are arranged between the first coaxial connector and the power device socket, and the third connecting micro-strip and the fourth connecting micro-strip are arranged between the second coaxial connector and the power device socket. The power supply circuit is arranged on the PCB and provides direct-current power supply for the power device to be tested in the power device socket; a power device to be tested is arranged in the power device socket. Through the scheme, the power aging test device has the advantages of simple structure, high efficiency and reliability in test and the like, and has very high practical value and popularization value in the technical field of power aging test.
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Description

Technical Field

[0001] This utility model relates to the field of power aging test technology, and in particular to a power aging test fixture. Background Technology

[0002] This technology involves aging tests on power (chip) devices, a method for evaluating the reliability and performance changes of power devices during long-term use. Currently, there are no corresponding test fixtures in existing technologies, and the testing still relies on manual connection of test leads, resulting in low testing efficiency.

[0003] Therefore, there is an urgent need to propose a power aging test fixture that is simple in structure, efficient and reliable in testing. Utility Model Content

[0004] To address the above problems, the purpose of this utility model is to provide a power aging test fixture. The technical solution adopted by this utility model is as follows:

[0005] A power aging test fixture for holding a power device under test includes a lower mounting plate, several support feet disposed on the lower part of the lower mounting plate, a PCB board fixed on the lower mounting plate, a first coaxial connector and a second coaxial connector disposed on the PCB board, several power device sockets disposed on the PCB board, a first connecting microstrip and a second connecting microstrip disposed between the first coaxial connector and the power device sockets, a third connecting microstrip and a fourth connecting microstrip disposed between the second coaxial connector and the power device sockets, and a power supply circuit disposed on the PCB board that provides DC power to the power device under test in the power device sockets; the power device under test is disposed in the power device sockets.

[0006] Furthermore, the power device socket includes a lower support fixed on the PCB board, a device electrical connection socket assembly embedded in the lower support and electrically connected to the power device under test, an upper socket cover connected to the lower support on one side by a pivot, and a latch located on the other side of the upper socket cover and fastened to the lower support; a device mounting slot is formed in the device electrical connection socket assembly; the power device under test is placed in the device mounting slot and electrically connected to the second connecting microstrip and the fourth connecting microstrip.

[0007] Furthermore, the power device socket also includes a lower pressure block embedded in the upper socket cover, a pressing knob that is threadedly connected to the upper socket cover and presses the lower pressure block; the lower pressure block is placed on the upper part of the power device under test in the device electrical connection socket assembly.

[0008] Furthermore, the squeeze knob is provided with several knob protrusions.

[0009] Furthermore, the bottom of the lower mounting plate is provided with a first connector, a second connector, a third connector, and a fourth connector; the first connector is electrically connected to the fourth connecting microstrip; the fourth connector is electrically connected to the second connecting microstrip; the second connector and the third connector are connected to the power device socket; the first connector is electrically connected to the second connector, and the third connector is electrically connected to the fourth connector.

[0010] Compared with the prior art, the present invention has the following beneficial effects:

[0011] (1) This utility model sets up a power device socket and clamps the power device to be tested. It uses a first coaxial connector, a second coaxial connector, a first connecting microstrip, a second connecting microstrip, a third connecting microstrip and a fourth connecting microstrip to make electrical connections, ensuring the reliability of the test. In addition, its installation and disassembly are efficient and reliable.

[0012] (2) This utility model is equipped with a lower support base, a device electrical connection socket assembly, an upper socket cover and a latch. It is connected by a latch and a rotating shaft, and its installation and disassembly are reliable.

[0013] (3) By setting up a pressure block, a squeezing knob and a knob protrusion, the present invention ensures that the power device under test makes reliable contact with the device electrical connection socket assembly by rotating the squeezing knob, thus ensuring the accuracy of the test.

[0014] In summary, this utility model has the advantages of simple structure and efficient and reliable testing, and has high practical and promotional value in the field of power aging test technology. Attached Figure Description

[0015] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope of protection. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a structural schematic diagram of the present invention from a first angle.

[0017] Figure 2 This is a structural schematic diagram of the present invention from a second angle.

[0018] Figure 3 This is a structural schematic diagram of the power device socket in this utility model from the first angle.

[0019] Figure 4 This is a schematic diagram of the second angle of the power device socket in this utility model.

[0020] Figure 5 This is a schematic diagram of the power device socket after removing the upper socket cover and the latch of this utility model.

[0021] Figure 6 This is a structural schematic diagram of the lower support base and the electrical connection socket assembly of the device in this utility model.

[0022] Figure 7 This is a cross-sectional schematic diagram of the power device socket in this utility model.

[0023] Figure 8 This is a schematic diagram of the first power supply circuit of this utility model.

[0024] In the above figures, the component names corresponding to the reference numerals are as follows:

[0025] 1. Support foot; 2. Lower mounting plate; 3. PCB board; 4. First coaxial connector; 5. Second coaxial connector; 6. First connecting microstrip; 7. Second connecting microstrip; 8. Third connecting microstrip; 9. Fourth connecting microstrip; 10. Power device socket; 11. First connector; 12. Second connector; 13. Third connector; 14. Fourth connector; 101. Lower support base; 102. Device electrical connection socket assembly; 103. Upper socket cover; 104. Locking latch; 105. Lower pressure block; 106. Press knob; 107. Knob protrusion; 1021. Device mounting slot. Detailed Implementation

[0026] To make the objectives, technical solutions, and advantages of this application clearer, the present invention will be further described below with reference to the accompanying drawings and embodiments. The embodiments of this utility model include, but are not limited to, the following embodiments. All other embodiments obtained by those skilled in the art based on the embodiments in this application without inventive effort are within the scope of protection of this application.

[0027] In this embodiment, the term "and / or" is merely a description of the relationship between related objects, indicating that there can be three relationships. For example, A and / or B can represent three situations: A exists alone, A and B exist simultaneously, and B exists alone.

[0028] The terms "first" and "second," etc., used in the specification and claims of this embodiment are used to distinguish different objects, not to describe a specific order of objects. For example, "first target object" and "second target object," etc., are used to distinguish different target objects, not to describe a specific order of target objects.

[0029] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0030] In the description of the embodiments in this application, unless otherwise stated, "multiple" means two or more. For example, multiple processing units means two or more processing units; multiple systems means two or more systems.

[0031] like Figures 1 to 8 As shown, this embodiment provides a power aging test fixture for clamping the power device under test and performing aging tests.

[0032] Here, the power aging test fixture includes a lower mounting plate 2, several support feet 1 located at the lower part of the lower mounting plate 2, a PCB board 3 fixed on the lower mounting plate 2, a first coaxial connector 4 and a second coaxial connector 5 located on the PCB board 3, several power device sockets 10 located on the PCB board 3, a first connecting microstrip 6 and a second connecting microstrip 7 located between the first coaxial connector 4 and the power device sockets 10, a third connecting microstrip 8 and a fourth connecting microstrip 9 located between the second coaxial connector 5 and the power device sockets 10, a power supply circuit located on the PCB board 3 that provides DC power to the power device under test in the power device sockets 10, and a first connector 11, a second connector 12, a third connector 13, and a fourth connector 14 located at the bottom of the lower mounting plate 2. The power device under test is located within the power device sockets 10. Here, the first connector 11 is electrically connected to the fourth connecting microstrip 9, the fourth connector 14 is electrically connected to the second connecting microstrip 7, and the second connector 12 and the third connector 13 are connected to the power device socket 10. The first connector 11 is electrically connected to the second connector 12, and the third connector 13 is electrically connected to the fourth connector 14, thereby achieving electrical connection between the first coaxial connector 4, the second coaxial connector 5, and the power device socket 10. Here, the power supply circuit is electrically connected to the device electrical connection socket assembly 102 and provides DC power to the power device under test.

[0033] Here, the power device socket 10 includes a lower support base 101 fixed on the PCB board 3, a device electrical connection socket assembly 102 embedded in the lower support base 101 and electrically connected to the power device under test, an upper socket cover 103 connected to the lower support base 101 on one side by a pivot, a latch 104 provided on the other side of the upper socket cover 103 and fastened to the lower support base 101, a lower pressure block 105 embedded in the upper socket cover 103, and a pressing knob 106 threadedly connected to the upper socket cover 103 and pressing the lower pressure block 105. Here, a device mounting slot 1021 is formed in the device electrical connection socket assembly 102, and the power device under test is placed in the device mounting slot 1021. In addition, several knob protrusions 107 are provided on the squeeze knob 106 to facilitate rotating the squeeze knob 106 so that the lower pressure block 105 presses against the upper part of the power device under test in the device electrical connection socket assembly 102, ensuring the reliability of the electrical connection between the power device under test and the device electrical connection socket assembly 102.

[0034] The above embodiments are merely preferred embodiments of this utility model and are not intended to limit the scope of protection of this utility model. Any changes made based on the design principles of this utility model, or any non-creative changes made on this basis, shall fall within the scope of protection of this utility model.

Claims

1. A power aging test fixture for clamping a power device to be tested, characterized in that, The device includes a lower mounting plate (2), several support feet (1) disposed at the lower part of the lower mounting plate (2), a PCB board (3) fixed on the lower mounting plate (2), a first coaxial connector (4) and a second coaxial connector (5) disposed on the PCB board (3), several power device sockets (10) disposed on the PCB board (3), a first connecting microstrip (6) and a second connecting microstrip (7) disposed between the first coaxial connector (4) and the power device sockets (10), a third connecting microstrip (8) and a fourth connecting microstrip (9) disposed between the second coaxial connector (5) and the power device sockets (10), and a power supply circuit disposed on the PCB board (3) and providing DC power to the power device under test in the power device sockets (10); the power device under test is disposed in the power device sockets (10).

2. The power aging test fixture according to claim 1, characterized in that, The power device socket (10) includes a lower support base (101) fixed on the PCB board (3), a device electrical connection socket assembly (102) embedded in the lower support base (101) and electrically connected to the power device to be tested, an upper socket cover plate (103) connected to the lower support base (101) on one side by a pivot, and a latch (104) set on the other side of the upper socket cover plate (103) and fastened to the lower support base (101); a device mounting slot (1021) is opened in the device electrical connection socket assembly (102); the power device to be tested is placed in the device mounting slot (1021) and electrically connected to the second connecting microstrip (7) and the fourth connecting microstrip (9).

3. The power aging test fixture according to claim 2, characterized in that, The power device socket (10) also includes a lower pressure block (105) embedded in the upper socket cover (103), and a pressing knob (106) that is threadedly connected to the upper socket cover (103) and presses the lower pressure block (105); the lower pressure block (105) is placed on the upper part of the power device to be tested in the device electrical connection socket assembly (102).

4. The power aging test fixture according to claim 3, characterized in that, The squeeze knob (106) is provided with several knob protrusions (107).

5. A power aging test fixture according to any one of claims 1 to 4, characterized in that, The bottom of the lower mounting plate (2) is provided with a first connector (11), a second connector (12), a third connector (13) and a fourth connector (14); the first connector (11) is electrically connected to the fourth connecting microstrip (9); the fourth connector (14) is electrically connected to the second connecting microstrip (7); the second connector (12) and the third connector (13) are connected to the power device socket (10); the first connector (11) is electrically connected to the second connector (12), and the third connector (13) is electrically connected to the fourth connector (14).