Glass substrate detection equipment

Abstract

The utility model relates to the technical field of quality detection, and particularly discloses glass substrate detection equipment which comprises a rack, a tray, a horizontal driving assembly, a first light source assembly, a second light source assembly and an image acquisition assembly, the image acquisition assembly comprises a lifting driving assembly mounted in the detection chamber and an image collector driven by the lifting driving assembly to lift; according to the equipment, the first light source assembly and the image acquisition assembly are matched to detect the reflective quality of the glass substrate, and the second light source assembly and the image acquisition assembly are matched to detect the transmissive quality of the glass substrate, so that the closed and multi-mode quality detection of the glass substrate is realized, and the influence of external environment light on a detection result is reduced; the detection efficiency and accuracy are remarkably improved, and the labor cost and the misjudgment rate are reduced.

Description

Technical Field

[0001] This application relates to the field of quality inspection technology, and more specifically, to a glass substrate inspection device. Background Technology

[0002] With the rapid development of display technology, glass substrates, as a key raw material for display devices such as LCD panels and OLED panels, directly determine the performance and yield of display products. Therefore, defect detection of glass substrates is becoming increasingly important.

[0003] Currently, most companies still rely on manual inspection of glass substrate defects. However, the glass substrate production process is complex and prone to various small defects such as particles, scratches, and micro-cracks. Manual inspection is inefficient, difficult to match the pace of high-speed production, and the inspection accuracy is difficult to guarantee, easily leading to missed detections and misjudgments. Some companies still use automated inspection equipment, but these devices are only equipped with a single light source for single-mode quality inspection and generally do not have a closed structure, making them susceptible to the influence of external ambient light. This results in insufficient inspection efficiency and low inspection accuracy.

[0004] There is currently no effective technical solution to the above problems. Utility Model Content

[0005] The purpose of this application is to provide a glass substrate inspection device that improves inspection efficiency and accuracy, and reduces labor costs and error rate.

[0006] This application provides a glass substrate inspection device for inspecting the surface quality and optical performance of lenses. The glass substrate inspection device includes: a frame, a tray, a horizontal drive assembly, a first light source assembly, a second light source assembly, and an image acquisition assembly. The frame is provided with an inspection chamber. The tray is used to carry the glass substrate to be inspected. The horizontal drive assembly is installed in the inspection chamber and is used to drive the tray to move horizontally within the inspection chamber. The first light source assembly and the image acquisition assembly are both installed in the inspection chamber and are located above the tray. The image acquisition assembly includes a lifting drive assembly installed in the inspection chamber and an image acquisition device driven to move up and down by the lifting drive assembly. The second light source assembly is installed in the tray and is located below the glass substrate to be inspected carried by the tray.

[0007] The glass substrate inspection equipment of this application can perform reflectivity quality inspection on glass substrates in a closed inspection chamber using a first light source component and an image acquisition component, and perform transmittance quality inspection on glass substrates using a second light source component and an image acquisition component. This achieves closed, multi-mode quality inspection of glass substrates, reduces the influence of external ambient light on the inspection results, significantly improves inspection efficiency and accuracy, and reduces labor costs and error rate.

[0008] The glass substrate testing equipment further includes a gantry frame, which is fixed in the testing chamber. The lifting drive assembly is detachably fixed in the middle of the crossbeam of the gantry frame. The first light source assembly is detachably fixed on the crossbeam of the gantry frame and located on one side of the lifting drive assembly. The illumination direction of the first light source assembly is tilted downward toward the material tray.

[0009] In this example, the first light source assembly is fixed on the crossbeam of the gantry and located on one side of the lifting drive assembly. The illumination direction of the first light source assembly is tilted downward toward the material tray. This illumination angle enables the light to shine on the surface of the glass substrate and generate reflection. The reflected light is received by the image acquisition unit located above, thereby acquiring an image for reflectivity quality detection.

[0010] The glass substrate testing equipment, wherein the frame has a window at the top corresponding to the testing chamber, and a fan filter unit covering the window is installed on the top of the frame.

[0011] The glass substrate testing equipment is provided with lighting at the top of the testing chamber.

[0012] The glass substrate testing equipment is provided in the middle of the tray, which is provided with a limiting groove for limiting the bearing position of the glass substrate to be tested. The second light source assembly is located below the limiting groove, and the limiting groove has slots on both sides to facilitate the picking and placing of the glass substrate to be tested.

[0013] The glass substrate testing equipment includes a frame comprising a base frame and a top frame, with the testing chamber located on the top frame. The top frame is detachably mounted on the base frame. The bottom of the top frame has a wire-passing hole, and the base frame has a power supply terminal inside. The wiring terminals of the horizontal drive assembly, the first light source assembly, the second light source assembly, and the image acquisition assembly are all connected to the power supply terminal through the wire-passing hole.

[0014] The glass substrate testing equipment is provided with adjustable feet and casters at the bottom of the frame.

[0015] The glass substrate testing equipment, wherein the horizontal driving component includes a vertical driving component and a horizontal driving component, the horizontal driving component is mounted on the movable end of the vertical driving component, the vertical driving component is fixed to the bottom of the testing chamber and is used to drive the horizontal driving component to move vertically, the tray is fixed on the movable end of the horizontal driving component and the horizontal driving component is used to drive the tray to move horizontally.

[0016] In the glass substrate inspection equipment, a limiting component is provided on one side of the longitudinal drive component, and the limiting component includes a plurality of limit switches for limiting the movement range of the movable end of the longitudinal drive component.

[0017] In the glass substrate testing equipment, the lifting drive assembly, the longitudinal drive assembly, and the transverse drive assembly are all electric linear modules.

[0018] As can be seen from the above, the glass substrate inspection equipment provided in this application can perform reflectivity quality inspection on the glass substrate in a closed inspection chamber by using the first light source component and the image acquisition component together, and perform transmittance quality inspection on the glass substrate by using the second light source component and the image acquisition component together. This achieves closed, multi-mode quality inspection of the glass substrate, reduces the influence of external ambient light on the inspection results, significantly improves inspection efficiency and accuracy, and reduces labor costs and error rate. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the structure of the glass substrate testing equipment provided in the embodiments of this application.

[0020] Figure 2 This is a schematic diagram of the glass substrate inspection device provided in the embodiments of this application, hidden behind a door.

[0021] Figure 3 for Figure 2 Enlarged view of point A in the middle.

[0022] Figure 4 This is a schematic diagram of the glass substrate inspection device provided in the embodiments of this application from another angle after the door is hidden.

[0023] Figure 5 This is a schematic diagram of the material tray structure.

[0024] Reference numerals: 1. Frame; 2. Tray; 3. Horizontal drive assembly; 4. First light source assembly; 5. Second light source assembly; 6. Image acquisition assembly; 7. Fan and filter unit; 8. Lighting lamp; 9. Glass substrate to be tested; 61. Lifting drive assembly; 62. Image acquisition device; 11. Top frame; 12. Base frame; 21. Limiting slot; 22. Slot; 31. Longitudinal drive assembly; 32. Lateral drive assembly; 33. Limit switch; 111. Testing chamber; 112. Gantry frame; 113. Wire hole; 121. Power supply terminal; 122. Adjustable foot; 123. Caster wheel. Detailed Implementation

[0025] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.

[0026] In the description of this utility model, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," and "counterclockwise," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description. They do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, features defined with "first" and "second" may explicitly or implicitly include one or more of the stated features. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0027] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection, an electrical connection, or a connection that allows for communication; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0028] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0029] The following disclosure provides many different embodiments or examples for implementing various structures of this invention. To simplify the disclosure, specific examples of components and arrangements are described below. These are merely examples and are not intended to limit the scope of the invention. Furthermore, reference numerals and / or letters may be repeated in different examples; such repetition is for simplification and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. In addition, examples of various specific processes and materials are provided in this invention, but those skilled in the art will recognize the application of other processes and / or the use of other materials.

[0030] Please refer to Figures 1-5 This application provides a glass substrate inspection device for inspecting the surface quality and optical performance of lenses. The glass substrate inspection device includes: a frame 1, a tray 2, a horizontal drive assembly 3, a first light source assembly 4, a second light source assembly 5, and an image acquisition assembly 6. The frame 1 is provided with an inspection chamber 111. The tray 2 is used to carry the glass substrate 9 to be inspected. The horizontal drive assembly 3 is installed in the inspection chamber 111 and is used to drive the tray 2 to move horizontally within the inspection chamber 111. The first light source assembly 4 and the image acquisition assembly 6 are both installed in the inspection chamber 111 and are located above the tray 2. The image acquisition assembly 6 includes a lifting drive assembly 61 installed in the inspection chamber 111 and an image acquisition device 62 driven to move up and down by the lifting drive assembly 61. The second light source assembly 5 is installed in the tray 2 and is located below the glass substrate 9 to be inspected carried by the tray 2.

[0031] Specifically, the frame 1 constructs the overall framework of the equipment and forms an enclosed space for inspection, namely the inspection chamber 111. The tray 2 is located within the inspection chamber 111 and serves to hold the glass substrate 9 to be inspected. A horizontal drive assembly 3 is installed inside the inspection chamber 111 and its function is to move the tray 2 horizontally, allowing different areas of the glass substrate to be scanned and inspected. The first light source assembly 4 and the image acquisition assembly 6 are both located above the tray 2 for inspecting the glass substrate from above. The image acquisition assembly 6 includes a lifting drive assembly 61 and an image acquisition unit 62. The lifting drive assembly 61 controls the vertical movement of the image acquisition unit 62 to adjust the focus or inspection height. The second light source assembly 5 is located inside the tray 2, below the position holding the glass substrate, and is used to illuminate the glass substrate from below. The light emitted by the first light source assembly 4 is reflected after hitting the surface of the glass substrate, and the reflected light is received by the image acquisition assembly 6 for detecting defects or quality problems on the surface of the glass substrate. The light emitted by the second light source assembly 5 penetrates the glass substrate, and the transmitted light is received by the image acquisition assembly 6 for detecting the internal quality or optical performance of the glass substrate. Therefore, by combining horizontal movement, vertical adjustment, and both reflective and transmissive illumination methods, the equipment can achieve automated inspection of the surface and interior of glass substrates.

[0032] More specifically, this glass substrate inspection equipment integrates multiple functional modules to achieve automated inspection of the surface quality and optical performance of glass substrates, solving the problems of low efficiency and poor accuracy of manual inspection, as well as the large size and inflexible adjustment of existing automated equipment. First, the glass substrate to be inspected is placed on the tray 2. After receiving a control signal, the horizontal drive component 3 moves the tray 2 along a preset path on the horizontal plane within the inspection chamber 111, for example, performing row-by-row or area-by-area scanning. During the horizontal movement, the first light source component 4, located above the tray 2, emits light to illuminate the surface of the glass substrate, and the image acquisition component 6 simultaneously acquires the reflected image of the glass substrate surface. By analyzing the reflected image, defects such as scratches, particles, and stains on the glass substrate surface can be detected. Subsequently, or at different scanning stages, the second light source component 5, located below the tray 2, emits light that penetrates the glass substrate, and the image acquisition component 6 acquires the transmitted image of the glass substrate. By analyzing the transmitted image, optical performance indicators such as bubbles, stress lines, and uniformity within the glass substrate can be detected. The lifting drive component 61 in the image acquisition component 6 can adjust the height of the image acquisition unit 62 according to different inspection requirements or the thickness of the glass substrate to obtain a clear image. The entire testing process is conducted within the enclosed testing chamber 111, minimizing the impact of external ambient light on the test results. This automated, multi-mode testing method significantly improves testing efficiency and accuracy, while reducing labor costs and the false judgment rate.

[0033] The glass substrate inspection equipment of this application embodiment can perform reflectivity quality inspection on the glass substrate in a closed inspection chamber 111 by using the first light source component 4 and the image acquisition component 6 together, and perform transmittance quality inspection on the glass substrate by using the second light source component 5 and the image acquisition component 6 together. This achieves closed, multi-mode quality inspection of the glass substrate, reduces the influence of external ambient light on the inspection results, significantly improves inspection efficiency and accuracy, and reduces labor costs and error rate.

[0034] It should be noted that the testing room 111 is equipped with a door that can be opened and closed.

[0035] In some preferred embodiments, the glass substrate testing equipment further includes a gantry 112, which is fixed inside the testing chamber 111. The lifting drive assembly 61 is detachably fixed to the middle of the crossbeam of the gantry 112. The first light source assembly 4 is detachably fixed to the crossbeam of the gantry 112 and located on one side of the lifting drive assembly 61. The illumination direction of the first light source assembly 4 is tilted downward toward the tray 2.

[0036] Specifically, the crossbeam of the gantry 112 provides a mounting platform for the lifting drive assembly 61, enabling the image acquisition unit 62 to move vertically. The first light source assembly 4 is fixed to the crossbeam of the gantry 112 and located on one side of the lifting drive assembly 61. The illumination direction of the first light source assembly 4 is tilted downwards towards the tray 2. This illumination angle allows light to shine onto the surface of the glass substrate and generate reflection. The reflected light is received by the image acquisition unit 62 located above, enabling the acquisition of images for reflectivity quality inspection. The detachable fixing method of the lifting drive assembly 61 and the first light source assembly 4 facilitates equipment maintenance and component replacement.

[0037] More specifically, when the first light source assembly 4 emits light that illuminates the surface of the glass substrate, the light is reflected at the surface. The image acquisition unit 62 located above receives these reflected rays and acquires a reflection image of the glass substrate surface. By analyzing these reflection images, defects on the glass substrate surface can be detected.

[0038] In some preferred embodiments, the frame 1 has a window at the top corresponding to the test chamber 111, and a fan filter unit 7 covering the window is installed on the top of the frame 1.

[0039] Specifically, the window is located at the top of the testing chamber 111. The fan-filter unit 7 preferably uses an aluminum-bladed FFU fan. The fan-filter unit 7 draws in outside air, which is then filtered through its filter element to remove suspended particulate matter. The filtered clean air is then delivered into the testing chamber 111 through the fan-filter unit 7 covering the window. This improves the air cleanliness inside the testing chamber 111, reducing the scattering and absorption of particulate matter on the optical detection path (reflected or transmitted light). This prevents particulate matter from being misidentified as defects in the glass substrate during image acquisition, improving the accuracy of reflective and transmissive quality detection. The cooperation between the window and the fan-filter unit 7 achieves cleanliness control of the internal environment of the testing chamber 111, effectively maintaining its cleanliness and ensuring the testing performance of the equipment.

[0040] In some preferred embodiments, the top of the testing chamber 111 is also provided with a lighting lamp 8.

[0041] Specifically, the lighting lamp 8 provides illumination into the testing chamber 111, thereby providing a clear view for the operator when handling glass substrates inside the chamber. When the operator needs to place or remove the glass substrate 9 from the tray 2, insufficient light inside the testing chamber 111 affects the operator's vision, causing inconvenience. By installing the lighting lamp 8 at the top of the testing chamber 111, illumination is provided into the chamber. This allows the operator to see the position of the tray 2 and the glass substrates during handling, thus enabling the operation to be completed.

[0042] In some preferred embodiments, the tray 2 has a limiting groove 21 in the middle for defining the bearing position of the glass substrate 9 to be tested, the second light source assembly 5 is located below the limiting groove 21, and the limiting groove 21 has slots 22 on both sides to facilitate the picking and placing of the glass substrate 9 to be tested.

[0043] Specifically, the limiting groove 21 preferably adopts a stepped groove structure to provide stable support or edge support for the glass substrate. This fixes the placement position of the glass substrate, improving detection accuracy. The second light source assembly 5 is arranged below the limiting groove 21 to cooperate with the image acquisition assembly 6 for transmittance quality detection. Placing the second light source assembly 5 below the limiting groove 21 ensures a fixed relative position between the light source and the glass substrate, which is beneficial to the stability and accuracy of transmittance detection. Furthermore, slots 22 are provided on both sides of the limiting groove 21, providing operational space for the placement and removal of the glass substrate, making the handling more convenient and improving the efficiency of the equipment.

[0044] In some preferred embodiments, the frame 1 includes a base frame 12 and a top frame 11. The detection chamber 111 is located on the top frame 11. The top frame 11 is detachably mounted on the base frame 12. The bottom of the top frame 11 has a wire hole 113. The base frame 12 is provided with a power supply terminal 121. The wiring terminals of the horizontal drive assembly 3, the first light source assembly 4, the second light source assembly 5, and the image acquisition assembly 6 are all connected to the power supply terminal 121 through the wire hole 113.

[0045] Specifically, the rack 1 is designed with two parts: a base frame 12 and a top frame 11. The testing chamber 111 and its main internal electrical components are mounted on the top frame 11. The top frame 11 is detachably mounted on the base frame 12, facilitating equipment assembly and maintenance of internal components. The bottom of the top frame 11 has wiring holes 113, providing dedicated wiring channels from the electrical components on the top frame 11 to the power supply terminal 121 located inside the base frame 12. Connections via these wiring holes 113 allow for orderly management of electrical wiring, preventing tangled wiring and improving wiring standardization and safety. The base frame 12 houses the power supply terminal 121, separate from the testing components on the top frame 11, which contributes to space layout and safety.

[0046] More specifically, the split design and dedicated wiring channels effectively simplify the complex electrical wiring process inside the equipment, resulting in a neater and more standardized wiring layout, reducing wiring difficulty and the probability of errors. Furthermore, when it is necessary to inspect, repair, or replace components on the top frame 11, the top frame 11 can be easily removed from the base frame 12 for convenient operation, eliminating the need for complex disassembly and wiring work in a confined space, thus greatly improving equipment maintenance efficiency.

[0047] In some preferred embodiments, the bottom of the frame 1 is provided with adjustable feet 122 and casters 123.

[0048] Specifically, the frame 1 is equipped with casters 123 at its bottom, allowing the equipment to move in all directions on the ground, facilitating transportation to a predetermined location or rough positioning within the testing area. The frame 1 also has adjustable feet 122 at its bottom. These feet can be lowered after the equipment has been moved into position using the casters 123, transferring the equipment's weight from the casters 123 to the feet for stable support. The combination of these features solves the problems of equipment positioning, movement, and leveling.

[0049] In some preferred embodiments, the horizontal drive assembly 3 includes a longitudinal drive assembly 31 and a transverse drive assembly 32. The transverse drive assembly 32 is mounted on the movable end of the longitudinal drive assembly 31. The longitudinal drive assembly 31 is fixed to the bottom of the detection chamber 111 and is used to drive the transverse drive assembly 32 to move longitudinally. The material tray 2 is fixed on the movable end of the transverse drive assembly 32 and is used to drive the material tray 2 to move laterally.

[0050] Specifically, the longitudinal drive assembly 31 is fixed to the bottom of the detection chamber 111, providing linear movement capability in one direction. The transverse drive assembly 32 is mounted on the movable end of the longitudinal drive assembly 31, providing linear movement capability in another direction perpendicular to the longitudinal movement direction. The tray 2 is directly connected to the movable end of the transverse drive assembly 32. The movement of the longitudinal drive assembly 31 drives the transverse drive assembly 32 to move longitudinally as a whole, while the movement of the transverse drive assembly 32 itself drives the tray 2 to move laterally, thereby achieving two-dimensional positioning of the tray 2 in the horizontal plane. Through this two-axis linkage, the tray 2 can perform precise two-dimensional positioning and scanning movement within the entire horizontal area defined by the travel range of the longitudinal and transverse drive assemblies 32. This allows any area of ​​the glass substrate 9 to be inspected to be moved below the field of view of the image acquisition assembly 6, enabling comprehensive reflection or transmission detection in conjunction with the light source assembly. This solves the technical problem that relying solely on a horizontal drive assembly 3 with an undefined structure may not be able to achieve comprehensive scanning detection, thus improving the detection coverage and efficiency.

[0051] In some preferred embodiments, a limiting component is provided on one side of the longitudinal drive component 31, and the limiting component includes a plurality of limit switches 33 for limiting the range of movement of the movable end of the longitudinal drive component 31.

[0052] Specifically, such as Figure 3 As shown, two photoelectric limit switches 33 are arranged along the moving direction of the movable end of the longitudinal drive assembly 31. When the movable end of the longitudinal drive assembly 31 moves to a predetermined position, the corresponding limit switch 33 is triggered. By monitoring the trigger signals of these limit switches 33, the control system can determine the current position of the movable end of the longitudinal drive assembly 31 and stop or adjust its movement as needed, thereby limiting the movement range of the movable end to a safe and operationally necessary area. This prevents the movable end from exceeding the preset range, improving positioning accuracy and equipment operational reliability.

[0053] In some preferred embodiments, the lifting drive assembly 61, the longitudinal drive assembly 31, and the lateral drive assembly 32 are all electric linear modules.

[0054] Specifically, the lifting drive assembly 61 is installed inside the detection chamber 111, driving the image acquisition unit 62 to move vertically. The longitudinal drive assembly 31 is fixed to the bottom of the detection chamber 111, driving the transverse drive assembly 32 to move horizontally. The transverse drive assembly 32 is installed on the movable end of the longitudinal drive assembly 31, driving the tray 2 to move in another horizontal direction perpendicular to the longitudinal movement direction. The image acquisition unit 62 is installed on the movable end of the lifting drive assembly 61. The tray 2 is fixed on the movable end of the transverse drive assembly 32. Thus, through the precise control of the electric linear module, the precise position adjustment of the image acquisition unit 62 and the tray 2 is achieved. The electric linear module integrates drive, guide, and control functions, providing high-precision, high-speed, and high-repeatability linear motion, solving the problems of inaccurate positioning, unstable movement, and low automation that may occur when using other drive methods, thereby improving the detection efficiency and accuracy of the equipment.

[0055] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of this utility model. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0056] The above descriptions are merely some embodiments of this utility model. For those skilled in the art, various modifications and improvements can be made without departing from the inventive concept of this utility model, and all such modifications and improvements fall within the protection scope of this utility model.

Claims

1. A glass substrate inspection device for inspecting the surface quality and optical performance of lenses, characterized in that, The glass substrate inspection equipment includes: a frame, a tray, a horizontal drive assembly, a first light source assembly, a second light source assembly, and an image acquisition assembly. The frame is equipped with an inspection chamber. The tray is used to carry the glass substrate to be inspected. The horizontal drive assembly is installed in the inspection chamber and is used to drive the tray to move horizontally within the inspection chamber. The first light source assembly and the image acquisition assembly are both installed in the inspection chamber and are located above the tray. The image acquisition assembly includes a lifting drive assembly installed in the inspection chamber and an image acquisition device that is driven to move up and down by the lifting drive assembly. The second light source assembly is installed inside the tray and is located below the glass substrate to be inspected carried by the tray.

2. The glass substrate testing equipment according to claim 1, characterized in that, The glass substrate testing equipment also includes a gantry frame, which is fixed in the testing chamber. The lifting drive assembly is detachably fixed in the middle of the crossbeam of the gantry frame. The first light source assembly is detachably fixed on the crossbeam of the gantry frame and located on one side of the lifting drive assembly. The illumination direction of the first light source assembly is tilted downward toward the tray.

3. The glass substrate testing equipment according to claim 1, characterized in that, The frame has a window at the top corresponding to the testing chamber, and a fan filter unit covering the window is installed on the top of the frame.

4. The glass substrate testing equipment according to claim 1, characterized in that, The testing chamber is also equipped with lighting on the top.

5. The glass substrate testing equipment according to claim 1, characterized in that, The tray has a limiting groove in the middle for defining the bearing position of the glass substrate to be tested. The second light source assembly is located below the limiting groove. The limiting groove has slots on both sides to facilitate the picking and placing of the glass substrate to be tested.

6. The glass substrate testing equipment according to claim 1, characterized in that, The frame includes a base frame and a top frame. The detection chamber is located on the top frame. The top frame is detachably mounted on the base frame. The bottom of the top frame has a wire hole. The base frame has a power supply terminal inside. The wiring terminals of the horizontal drive assembly, the first light source assembly, the second light source assembly, and the image acquisition assembly are all connected to the power supply terminal through the wire hole.

7. The glass substrate testing equipment according to claim 1, characterized in that, The bottom of the frame is equipped with adjustable feet and casters.

8. The glass substrate testing equipment according to claim 1, characterized in that, The horizontal drive assembly includes a longitudinal drive assembly and a transverse drive assembly. The transverse drive assembly is mounted on the movable end of the longitudinal drive assembly. The longitudinal drive assembly is fixed to the bottom of the detection chamber and is used to drive the transverse drive assembly to move longitudinally. The material tray is fixed on the movable end of the transverse drive assembly and is used to drive the material tray to move laterally.

9. The glass substrate testing equipment according to claim 8, characterized in that, A limiting component is provided on one side of the longitudinal drive component, and the limiting component includes a plurality of limit switches for limiting the movement range of the movable end of the longitudinal drive component.

10. The glass substrate testing equipment according to claim 8, characterized in that, The lifting drive assembly, the longitudinal drive assembly, and the lateral drive assembly are all electric linear modules.

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