Flying probe test equipment
By employing an outer cylinder, adjusting block, slider, and multiple small springs in the flying probe testing equipment, the problem of the inability to adjust the buffer stroke is solved, reducing processing difficulty and cost, and improving the equipment's flexibility of use.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- HUIZHOU WANGTONGDA ELECTRONICS CO LTD
- Filing Date
- 2025-01-20
- Publication Date
- 2026-05-08
AI Technical Summary
The test probe buffer stroke of existing flying probe testing equipment cannot be adjusted, and the buffer spring is relatively thin and long, resulting in high processing difficulty and high cost.
The structure includes an outer cylinder, an adjusting block, a slider, a main probe, a first elastic element, and a second elastic element. By setting multiple small springs inside the outer cylinder and adjusting the distance between the main probe and the adjusting block by rotating the adjusting block, the buffer stroke can be flexibly adjusted.
This technology enables flexible adjustment of the test probe buffer stroke, reducing processing difficulty and cost, and improving the flexibility and economy of equipment use.
Smart Images
Figure CN224216817U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of flying probe testing, and in particular to a flying probe testing device. Background Technology
[0002] A flying probe tester is an instrument used to test PCBs (printed circuit boards) with high component density, many layers, high wiring density, and small test point distances. It mainly tests the insulation and continuity of the circuit board.
[0003] Because the test probes make physical contact with the solder on the vias and test pads, small pits may be left on the solder joints. For some customers, these pits may be considered cosmetic defects, leading to rejection.
[0004] Existing test probes, while incorporating internal buffer springs, suffer from thin and long springs, requiring high precision in the buffer stroke. This necessitates high precision in the testing probe's manufacturing process, increasing its complexity and cost. Furthermore, the buffer stroke of the test probe cannot be adjusted.
[0005] Therefore, this utility model provides a flying probe testing device to solve the problems that the test probe buffer stroke cannot be adjusted and the buffer spring is relatively thin and long, resulting in high cost. Utility Model Content
[0006] To achieve the above objectives, the present invention adopts the following technical solution: a flying probe testing device, comprising a flying probe holder and a test probe detachably disposed on the flying probe holder. The test probe comprises: an outer cylinder, an adjusting block, a slider, a main probe, a first elastic element, and a second elastic element. The upper end of the main probe is slidably disposed inside the outer cylinder, and the lower end of the main probe passes through the lower end of the outer cylinder. The adjusting block is detachably disposed at the upper end of the outer cylinder. The first elastic element, the slider, and the second elastic element are sequentially disposed inside the outer cylinder. At least one slider is slidably disposed between the main probe and the adjusting block. The first elastic element is sandwiched between the adjusting block and the slider, and the second elastic element is sandwiched between the slider and the main probe.
[0007] Preferably, the main probe is composed of a probe body and a probe end connected coaxially from top to bottom. Both the probe body and the probe end are cylindrical. The outer cylinder has an upper through hole and a lower through hole at its upper and lower ends, respectively. The probe body is clearance-fitted with the upper through hole, the probe body is interference-fitted with the lower through hole, and the probe end is clearance-fitted with the lower through hole.
[0008] Preferably, the test probe further includes a wire connected to the end of the probe body away from the probe tip. The adjusting block and the slider are respectively provided with an upper center hole and a lower center hole. The upper center hole and the lower center hole are coaxially arranged with the main probe. The wire passes through the lower center hole and the upper center hole in sequence.
[0009] Preferably, the test probe further includes a third elastic element, and a plurality of sliders are slidably disposed between the main probe and the adjustment block, with the third elastic element sandwiched between two adjacent sliders.
[0010] Preferably, the end of the probe far from the probe body has a protruding tip for contacting the object being measured, and the tip is any one of a cone, a frustum, and a hemisphere.
[0011] Preferably, the first elastic element, the second elastic element, and the third elastic element are all compression springs, and the outer diameter of the compression spring is less than or equal to the inner diameter of the outer cylinder.
[0012] Preferably, a lower protrusion is provided at the center of the upper end face of the probe body and the lower end face of the slider, and the two ends of the second elastic member are respectively sleeved on the two lower protrusions.
[0013] Preferably, a second protrusion is provided at the center of the lower end face of the adjusting block, and an upper protrusion is provided at the center of the upper end face of the slider. The two ends of the first elastic member are respectively sleeved on the second protrusion and the upper protrusion.
[0014] Preferably, a first protrusion is provided at the center of the upper surface of the adjusting block. The first protrusion is hexagonal prism, and a second protrusion is symmetrically arranged with the first protrusion. Because the upper center hole occupies space, the adjusting block is rotated by a sleeve engaging the first protrusion. Furthermore, the adjusting block can be used upside down.
[0015] Preferably, the inner wall of the upper through hole is provided with an internal thread, and the circumferential surface of the adjusting block is provided with an external thread that matches the internal thread.
[0016] The working principle of this invention is as follows: multiple small springs are installed inside the outer cylinder, with adjacent small springs separated by a slider. The slider occupies a certain space, which shortens the total length of the springs. Compared to a complete spring, the length of each small spring is significantly reduced, and the total length of the small springs is also reduced. Furthermore, since the adjusting block is spirally installed at the opening of the outer cylinder, rotating the adjusting block can adjust the distance between the probe body and the adjusting block, allowing for flexible adjustment of the buffer stroke and facilitating the use of small springs of various specifications.
[0017] The beneficial effects of this invention are as follows: Using small springs of various specifications instead of the original slender springs allows for the selection of small springs made of different materials and of different specifications according to the buffer stroke. Sufficient space is maintained inside the outer cylinder, and multiple small springs are installed between the main probe and the adjusting block. Rotating the adjusting block adjusts the distance between the main probe and the adjusting block, allowing for flexible adjustment of the buffer stroke. The impact force is absorbed by the first and second elastic elements, and by the multiple small springs, minimizing the impact. Attached Figure Description
[0018] The accompanying drawings further illustrate the present invention, but the embodiments in the drawings do not constitute any limitation on the present invention.
[0019] Figure 1 A schematic diagram of the structure of a test probe provided in an embodiment of this utility model. Figure 1 ;
[0020] Figure 2 A schematic diagram of the structure of a test probe provided in an embodiment of this utility model. Figure 2 ;
[0021] Includes: 1: outer cylinder; 2: adjusting block; 3: slider; 4: main probe; 5: probe body; 6: probe end; 7: tip; 8: first elastic element; 9: second elastic element; 10: first protrusion; 11: second protrusion; 12: upper protrusion; 13: lower protrusion; 14: third elastic element. Detailed Implementation
[0022] The specific embodiments of this utility model will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit the scope of this utility model.
[0023] It should be noted that, in this utility model, unless otherwise stated, when an element is referred to as "fixed to" or "set on" another element, it can be directly on the other element or an intervening element may be present simultaneously. When an element is referred to as "connected to" another element, it can be directly connected to the other element or an intervening element may be present simultaneously. The directional terms used, such as "up," "down," "left," and "right," generally refer to... Figure 1 The directions shown are up, down, left, and right. "Inner" and "outer" refer to the inner and outer contours of a specific part. "Far" and "near" refer to the distance relative to a certain component. "Protrusion" refers to a component that is integrally formed and connected to another component.
[0024] like Figure 1As shown in the figure, a short-specification flying probe testing device provided by an embodiment of the present invention includes a flying probe holder and a test probe detachably disposed on the flying probe holder. The test probe includes: an outer cylinder 1, an adjusting block 2, a slider 3, a main probe 4, a first elastic element 8, and a second elastic element 9. The upper end of the main probe 4 is slidably disposed inside the outer cylinder 1, and the lower end of the main probe 4 passes through the lower end of the outer cylinder 1. The adjusting block 2 is detachably disposed on the upper end of the outer cylinder 1. The first elastic element 8, the slider 3, and the second elastic element 9 are sequentially disposed inside the outer cylinder 1. The slider 3 is slidably disposed between the main probe 4 and the adjusting block 2. The first elastic element 8 is sandwiched between the adjusting block 2 and the slider 3, and the second elastic element 9 is sandwiched between the slider 3 and the main probe 4.
[0025] The main probe 4 is composed of a probe body 5 and a probe end 6 coaxially connected from top to bottom. Both the probe body 5 and the probe end 6 are cylindrical. The outer cylinder 1 has an upper through hole and a lower through hole at its upper and lower ends, respectively. The probe body 5 is clearance-fitted with the upper through hole and interference-fitted with the lower through hole. The probe end 6 is clearance-fitted with the lower through hole. The inner wall of the upper through hole is provided with an internal thread, and the circumferential surface of the adjusting block 2 is provided with an external thread that matches the internal thread.
[0026] The test probe also includes a wire connected to the end of the probe body 5 away from the probe end 6. The adjustment block 2 and the slider 3 are respectively provided with an upper center hole and a lower center hole. The upper center hole and the lower center hole are coaxially arranged with the main probe 4. The wire passes through the lower center hole and the upper center hole in sequence.
[0027] The probe tip 6, away from the probe body 5, has a protruding tip 7 for contacting the object being measured. The tip 7 can be any one of a cone, a frustum, or a hemisphere.
[0028] The first elastic element 8, the second elastic element 9, and the third elastic element 14 are all compression springs, and the outer diameter of the compression spring is less than or equal to the inner diameter of the outer cylinder 1.
[0029] The upper end face of the probe body 5 and the lower end face of the slider 3 are both provided with a lower protrusion 13 at their center positions, and the two ends of the second elastic member 9 are respectively sleeved on the two lower protrusions 13.
[0030] The center of the lower end face of the adjusting block 2 is provided with a second protrusion 11, and the center of the upper end face of the slider 3 is provided with an upper protrusion 12. The two ends of the first elastic member 8 are respectively sleeved on the second protrusion 11 and the upper protrusion 12.
[0031] The adjustment block 2 has a first protrusion 10 at the center of its upper surface. The first protrusion 10 is hexagonal prism, and the second protrusion 11 is symmetrically arranged with the first protrusion 10. Due to the space occupied by the upper center hole, the adjustment block 2 is rotated by using a sleeve in conjunction with the first protrusion 10. Furthermore, the adjustment block 2 can be used upside down.
[0032] In one embodiment, such as Figure 2 As shown in the figure, a short-specification flying probe testing device provided by an embodiment of the present invention includes a flying probe holder and a test probe detachably disposed on the flying probe holder. The test probe includes: an outer cylinder 1, an adjusting block 2, a slider 3, a main probe 4, a first elastic element 8, and a second elastic element 9. The upper end of the main probe 4 is slidably disposed inside the outer cylinder 1, and the lower end of the main probe 4 passes through the lower end of the outer cylinder 1. The adjusting block 2 is detachably disposed on the upper end of the outer cylinder 1. The first elastic element 8, the slider 3, and the second elastic element 9 are sequentially disposed inside the outer cylinder 1. A plurality of sliders 3 are slidably disposed between the main probe 4 and the adjusting block 2. The first elastic element 8 is sandwiched between the adjusting block 2 and the slider 3. The second elastic element 9 is sandwiched between the slider 3 and the main probe 4. The third elastic element 14 is sandwiched between two adjacent sliders 3.
[0033] The main probe 4 is composed of a probe body 5 and a probe end 6 coaxially connected from top to bottom. Both the probe body 5 and the probe end 6 are cylindrical. The outer cylinder 1 has an upper through hole and a lower through hole at its upper and lower ends, respectively. The probe body 5 is clearance-fitted with the upper through hole and interference-fitted with the lower through hole. The probe end 6 is clearance-fitted with the lower through hole. The inner wall of the upper through hole is provided with an internal thread, and the circumferential surface of the adjusting block 2 is provided with an external thread that matches the internal thread.
[0034] The test probe also includes a wire connected to the end of the probe body 5 away from the probe end 6. The adjustment block 2 and the slider 3 are respectively provided with an upper center hole and a lower center hole. The upper center hole and the lower center hole are coaxially arranged with the main probe 4. The wire passes through the lower center hole and the upper center hole in sequence.
[0035] The probe tip 6, away from the probe body 5, has a protruding tip 7 for contacting the object being measured. The tip 7 can be any one of a cone, a frustum, or a hemisphere.
[0036] The first elastic element 8, the second elastic element 9, and the third elastic element 14 are all compression springs, and the outer diameter of the compression spring is less than or equal to the inner diameter of the outer cylinder 1.
[0037] The upper end face of the probe body 5 and the lower end face of the slider 3 are both provided with a lower protrusion 13 at their center positions, and the two ends of the second elastic member 9 are respectively sleeved on the two lower protrusions 13.
[0038] The center of the lower end face of the adjusting block 2 is provided with a second protrusion 11, and the center of the upper end face of the slider 3 is provided with an upper protrusion 12. The two ends of the first elastic member 8 are respectively sleeved on the second protrusion 11 and the upper protrusion 12.
[0039] The adjustment block 2 has a first protrusion 10 at the center of its upper surface. The first protrusion 10 is hexagonal prism, and the second protrusion 11 is symmetrically arranged with the first protrusion 10. Due to the space occupied by the upper center hole, the adjustment block 2 is rotated by using a sleeve in conjunction with the first protrusion 10. Furthermore, the adjustment block 2 can be used upside down.
[0040] In one embodiment, a first protrusion 10 is provided at the center of the upper end face of the adjusting block 2, and a second protrusion 11 is provided at the center of the lower end face of the adjusting block 2. The first protrusion 10 is a hexagonal prism, and the second protrusion 11 is symmetrically arranged with the first protrusion 10. A circular clamping plate is provided at the upper end of the side wall of the adjusting block 2, and the diameter of the circular clamping plate is greater than or equal to the outer diameter of the outer cylinder 1. The probe card is clamped between the circular clamping plate and the outer cylinder 1, and the excess gap between the probe card and the circular clamping plate is filled by a gasket.
[0041] The technical features of the embodiments described above can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of this utility model, and these should all be considered to be within the scope of this specification.
Claims
1. A flying probe testing device, characterized in that: The device includes a flying probe holder and a test probe detachably mounted on the flying probe holder. The test probe includes an outer cylinder, an adjusting block, a slider, a main probe, a first elastic element, and a second elastic element. The upper end of the main probe is slidably mounted inside the outer cylinder, and the lower end of the main probe passes through the lower end of the outer cylinder. The adjusting block is detachably mounted on the upper end of the outer cylinder. The first elastic element, the slider, and the second elastic element are sequentially mounted inside the outer cylinder. A slider is slidably mounted between the main probe and the adjusting block. The first elastic element is clamped between the adjusting block and the slider, and the second elastic element is clamped between the slider and the main probe.
2. The flying probe testing device according to claim 1, characterized in that: The main probe is composed of a probe body and a probe end connected coaxially from top to bottom. Both the probe body and the probe end are cylindrical. The outer cylinder has an upper through hole and a lower through hole at its upper and lower ends, respectively. The probe body is clearance-fitted with the upper through hole, the probe body is interference-fitted with the lower through hole, and the probe end is clearance-fitted with the lower through hole.
3. The flying probe testing device according to claim 2, characterized in that: The test probe also includes a wire connected to the end of the probe body away from the probe tip. The adjustment block and the slider are respectively provided with an upper center hole and a lower center hole. The upper center hole and the lower center hole are coaxially arranged with the main probe. The wire passes through the lower center hole and the upper center hole in sequence.
4. The flying probe testing device according to claim 1, characterized in that: The test probe also includes a third elastic element, and a plurality of sliders are slidably disposed between the main probe and the adjustment block, with the third elastic element sandwiched between two adjacent sliders.
5. The flying probe testing device according to claim 1, characterized in that: The probe tip, away from the probe body, has a protruding tip for contacting the object being measured. The tip can be any one of a cone, a frustum, or a hemisphere.
6. The flying probe testing device according to claim 5, characterized in that: The first elastic element, the second elastic element, and the third elastic element are all compression springs, and the outer diameter of the compression spring is less than or equal to the inner diameter of the outer cylinder.
7. The flying probe testing device according to claim 6, characterized in that: The upper end face of the probe body and the lower end face of the slider are both provided with a lower protrusion at their center positions, and the two ends of the second elastic element are respectively sleeved on the two lower protrusions.
8. The flying probe testing device according to claim 6, characterized in that: The lower end face of the adjusting block is provided with a second protrusion at the center position, and the upper end face of the slider is provided with an upper protrusion at the center position. The two ends of the first elastic member are respectively sleeved on the second protrusion and the upper protrusion.
9. The flying probe testing device according to claim 8, characterized in that: The center of the upper surface of the adjustment block is provided with a first protrusion, which is a hexagonal prism. The second protrusion is symmetrically arranged with the first protrusion.
10. The flying probe testing device according to claim 3, characterized in that: The inner wall of the upper through hole is provided with an internal thread, and the circumferential surface of the adjusting block is provided with an external thread that matches the internal thread.