Bicrystal probe assembly capable of being quickly disassembled and assembled and automatic wheel flaw detection equipment

Abstract

The utility model discloses a bicrystal probe assembly capable of being quickly disassembled and assembled and automatic wheel flaw detection equipment. The bicrystal probe assembly comprises a base, a probe, an elastic component, an auxiliary plate and a cover plate, the base is provided with two rows of inserting holes which are evenly arranged at intervals in the length direction of the base, and the inserting holes in the upper row and the inserting holes in the lower row are arranged in a staggered mode. The probe is inserted into each insertion hole of the base; the elastic component is arranged between the probe and the base and is used for vertically and upwards jacking the probe; the auxiliary plate is detachably mounted on the base, a plurality of dismounting holes in one-to-one correspondence with the probes are formed in the auxiliary plate, the probes are arranged in the dismounting holes in a penetrating manner, and mounting and dismounting of the probes are completed through the dismounting holes; the cover plates are located above the auxiliary plate, one cover plate corresponds to one probe, through holes are formed in the cover plates, the upper portions of the probes can stretch out of the through holes, and the cover plates are detachably connected with the auxiliary plate. According to the utility model, probe consumption and damage can be effectively reduced, and probe damage can be efficiently treated.

Description

Technical Field

[0001] This utility model relates to a dual-crystal probe assembly that can be quickly assembled and disassembled, belonging to the technical field of automatic wheel flaw detection equipment. Background Technology

[0002] In the field of online automatic flaw detection for railway freight car wheels, the detection probes contact the wheels to perform detection when the wheels pass by. Because the equipment is frequently impacted by the wheels, the probes will suffer periodic damage. There are many probes in a single device. Although the redundant design allows the equipment to accept a certain number of single probe failures without affecting the function of the equipment, maintenance still requires the entire device to be disassembled and the probes replaced after reaching the critical value, which is time-consuming and labor-intensive. Since the detection system in standby mode is located on the side of the track, the space for maintenance in normal mode is small, which is not conducive to disassembly and installation, making maintenance difficult.

[0003] There is a need for a protective device to extend the service life of the probe, shorten the repair time when the probe is damaged and needs repair, facilitate quick repair by maintenance personnel, extend the overall online detection time of the equipment, and improve efficiency. Summary of the Invention

[0004] This invention provides a dual-crystal probe assembly that can be quickly assembled and disassembled, which can effectively reduce probe consumption and damage, and efficiently handle probe damage.

[0005] This utility model is achieved according to the following technical solution:

[0006] In a first aspect, this utility model provides a dual-crystal probe assembly that can be quickly assembled and disassembled, comprising:

[0007] The base has two rows of evenly spaced insertion holes along its length, with the insertion holes in the upper row and the insertion holes in the lower row arranged alternately.

[0008] The probe is inserted into each of the insertion holes in the base;

[0009] An elastic component is arranged between the probe and the base for vertically lifting the probe upwards;

[0010] An auxiliary plate is detachably mounted on the base, and the auxiliary plate is provided with multiple mounting and dismounting holes corresponding to the probes. The probes are inserted into the mounting and dismounting holes, and the probes are installed and removed through the mounting and dismounting holes.

[0011] A cover plate is located above the auxiliary plate. Each cover plate corresponds to one probe. The cover plate has a through hole, through which the upper part of the probe can extend. The cover plate is detachably connected to the base.

[0012] In some embodiments, the disassembly hole on the auxiliary plate is an irregularly shaped hole for pressing down the elastic component and limiting the probe in the insertion hole; the probe can rotate circumferentially in the irregularly shaped hole, and when rotated to a preset angle, the probe can pass through or out of the irregularly shaped hole.

[0013] In some embodiments, the probe is divided into an upper rectangular block and a lower inverted truncated cone. On the two opposite sides of the rectangular block, a protrusion extends horizontally outward from the bottom surface. The probe is rotated to change the position of the protrusions on both sides. When the protrusions on both sides fall completely into the irregular hole, the probe can pass through or out of the irregular hole.

[0014] In some embodiments, the through hole on the cover plate is a rectangular hole, the size of which is adapted to the size of the rectangular block on the upper part of the probe. After the probe is inserted into the through hole of the cover plate, it cannot be rotated circumferentially.

[0015] In some embodiments, the elastic component is a spring, which is fitted onto the chamfered frustum of the probe. The insertion hole on the base is a stepped hole that is wider at the top and narrower at the bottom. The lower part of the spring is inserted into the stepped hole to limit the lower position of the spring. The connection between the rectangular block and the chamfered frustum serves as the upper position of the spring.

[0016] In some embodiments, a plurality of auxiliary plate studs are fixed on the base, and the auxiliary plate is provided with a plurality of mounting holes corresponding one-to-one with the auxiliary plate studs. The auxiliary plate is fixed by screws cooperating with the mounting holes and the auxiliary plate studs.

[0017] In some embodiments, the auxiliary plate has at least two threaded holes in the area surrounding each disassembly hole, and the cover plate has an assembly hole arranged coaxially with the threaded holes. The cover plate is fixed by screws that engage with the assembly holes and the threaded holes.

[0018] In some embodiments, the auxiliary plate is provided with at least two guide rods in the area surrounding each disassembly hole, and the cover plate is provided with an assembly hole arranged coaxially with the guide rod. The guide rod passes through the assembly hole of the cover plate, and the cover plate is fixed by inserting a cotter pin into the pin hole on the guide rod located above the cover plate.

[0019] Secondly, this utility model provides an automatic wheel flaw detection device, comprising:

[0020] The aforementioned dual-crystal probe assembly, which can be quickly assembled and disassembled, is arranged on the side of the rail along the extension direction of the rail.

[0021] The probe array automatic lifting system is fixed to the side of the rail, and the dual-crystal probe assembly is installed on the probe array automatic lifting system.

[0022] In some embodiments, the automatic lifting system for the probe array includes a protective cover and a lifting device and a driving device placed inside the protective cover, with the dual-crystal probe assembly mounted on the lifting device.

[0023] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0024] This invention provides a dual-crystal probe assembly that can be quickly assembled and disassembled. When the probe is damaged and needs repair, it shortens the repair time, facilitates quick repair by maintenance personnel, extends the overall online testing time of the equipment, and improves efficiency. Attached Figure Description

[0025] The accompanying drawings, as part of this utility model, are used to provide a further understanding of the present utility model. The illustrative embodiments and descriptions of the present utility model are used to explain the present utility model, but do not constitute an undue limitation of the present utility model. Obviously, the drawings described below are merely some embodiments; those skilled in the art can obtain other drawings based on these drawings without any creative effort.

[0026] In the attached diagram:

[0027] Figure 1 This is an exploded view of a dual-crystal probe assembly capable of quick assembly and disassembly according to the present invention.

[0028] Figure 2 This is a schematic diagram illustrating the disassembly and assembly process of a dual-crystal probe assembly capable of rapid disassembly and assembly according to this utility model.

[0029] Figure 3 This is a distribution diagram of the dual-crystal probe assembly of this utility model installed on the railway track;

[0030] Figure 4 This is a schematic diagram of the automatic wheel flaw detection device of this utility model;

[0031] Figure 5 This is a schematic diagram of the detection status of the automatic wheel flaw detection equipment of this utility model;

[0032] Figure 6 This is a schematic diagram of the standby state of the automatic wheel flaw detection equipment of this utility model.

[0033] Attached diagram labels: 2-1-Dual crystal probe assembly, 2-2-Railway, 2-3-Lifting device, 2-4-Protective cover, 2-5-Transmission device, 51-Probe, 52-Cover plate, 53-Auxiliary plate, 54-Screw, 55-Auxiliary plate stud, 56-Elastic component, 57-Base.

[0034] It should be noted that these accompanying drawings and textual descriptions are not intended to limit the scope of the present invention in any way, but rather to illustrate the concept of the present invention to those skilled in the art by referring to specific embodiments. Detailed Implementation

[0035] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions in the embodiments will be clearly and completely described below with reference to the accompanying drawings. The following embodiments are used to illustrate this utility model, but are not intended to limit the scope of this utility model.

[0036] In the description of this utility model, it should be noted that the terms "upper", "lower", "front", "rear", "left", "right", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0037] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0038] In the existing technology (application number 202420693551.X, publication number CN222713489U), the cover plate is designed as a single plate, with the same shape as the auxiliary plate, and the cover plate and the auxiliary plate share screws for fastening. The following problems arise when disassembling the cover plate: First, when replacing a probe, all screws must be removed to remove the cover plate before the probe can be replaced; second, after removing the cover plate, the auxiliary plate also loses all screws and becomes movable. Under the action of springs, all probes move upwards, changing the original probe positions. When fixing the auxiliary plate again, the probes need to be repositioned, which undoubtedly increases the disassembly and assembly time and fails to achieve the purpose of rapid disassembly and assembly.

[0039] like Figure 1As shown, a quick-assembly and disassembly dual-crystal probe assembly includes a base 57, a probe 51, an elastic component 56, an auxiliary plate 53, and a cover plate 52. The base 57 has two rows of evenly spaced insertion holes along its length, with the upper row of insertion holes staggered with the lower row. The probe 51 is inserted into each insertion hole of the base 57. The elastic component 56 is arranged between the probe 51 and the base 57 to vertically lift the probe 51 upwards. The auxiliary plate 53 is detachably mounted on the base 57 and has multiple disassembly holes corresponding to the probe 51. The probe 51 passes through the disassembly holes, allowing for installation and disassembly. The cover plate 52 is located above the auxiliary plate 53, with one cover plate 52 corresponding to one probe 51. The cover plate 52 has through holes through which the upper part of the probe 51 can extend. The cover plate 52 is detachably connected to the auxiliary plate 53.

[0040] It should be noted that when the probe array needs to be repaired, the dual-crystal probe assembly provided by this utility model, which allows for quick disassembly and reassembly, enables maintenance personnel to quickly remove and reinstall one or more probes.

[0041] The specific structure of the auxiliary plate and cover plate mentioned above will be further explained below.

[0042] Continue to refer to Figure 1 As shown, the disassembly hole on the auxiliary plate 53 is an irregularly shaped hole used to press down the elastic component 56 and limit the probe 51 in the insertion hole; the probe 51 can rotate circumferentially in the irregularly shaped hole, and when rotated to a preset angle, the probe 51 can pass through or out of the irregularly shaped hole.

[0043] Further plans will continue to be considered. Figure 1 As shown, the probe 51 is divided into two parts: an upper rectangular block and a lower inverted truncated cone. On the two opposite sides of the rectangular block, a protrusion extends horizontally outward from the bottom surface. Rotating the probe 51 changes the position of the protrusions on both sides. When the protrusions on both sides fall completely into the irregular hole, the probe 51 can penetrate into or out of the irregular hole.

[0044] Further plans will continue to be considered. Figure 1 As shown, the through hole on the cover plate 52 is a rectangular hole, the size of which is adapted to the size of the rectangular block on the upper part of the probe 51. After the probe 51 is inserted into the through hole of the cover plate 52, the probe 51 cannot be rotated circumferentially.

[0045] It should be noted that a single irregular hole cannot effectively press and fix the probe 51 and the matching elastic component 56, and it is easy to jump off during use. Therefore, a cover plate 52 is added on the basis of the auxiliary plate 53.

[0046] Further plans will continue to be considered. Figure 1As shown, a plurality of auxiliary plate studs 55 are fixed on the base 57, and a plurality of mounting holes corresponding one-to-one with the auxiliary plate studs 55 are provided on the auxiliary plate 53. The auxiliary plate 53 is fixed by screws cooperating with the mounting holes and the auxiliary plate studs 55.

[0047] Further plans will continue to be considered. Figure 1 As shown in Embodiment 1: The auxiliary plate 53 has at least two threaded holes in the area surrounding each disassembly hole, and the cover plate 52 has an assembly hole arranged coaxially with the threaded hole. The cover plate 52 is fixed by screws 54 cooperating with the assembly hole and the threaded hole.

[0048] Example 2: The auxiliary plate 53 is provided with at least two guide rods in the area surrounding each disassembly hole. The cover plate 52 is provided with assembly holes arranged coaxially with the guide rods. The guide rods pass through the assembly holes of the cover plate 52 and the cover plate 52 is fixed by inserting cotter pins into the pin holes on the guide rods located above the cover plate 52.

[0049] The specific structure of the aforementioned elastic component will be further explained below.

[0050] Continue to refer to Figure 1 As shown, the elastic component 56 is a spring, which is fitted onto the chamfered platform of the probe 51. The insertion hole on the base 57 is a stepped hole that is wider at the top and narrower at the bottom. The lower part of the spring is inserted into the stepped hole to limit the lower position of the spring. The connection between the rectangular block and the chamfered platform is used as the upper position of the spring.

[0051] The following describes the repair process for the aforementioned dual-crystal probe assembly that can be quickly disassembled and assembled.

[0052] 1. Remove the cover plate corresponding to the damaged probe.

[0053] 2. Replace the damaged probe. Slightly press down on the probe, twist it clockwise by about 20°, and then push it outwards to cause the spring to push the probe out. Remove the probe, spring, and signal cable. The disassembly top view is shown below. Figure 2 As shown.

[0054] 3. Insert the new probe spring and signal wire along the auxiliary plate, and pull out the signal wire from the 20mm gap between the base and the auxiliary plate.

[0055] 4. After ensuring that all probes are in their corresponding positions, reinstall the cover plate.

[0056] The automatic wheel flaw detection device provided by this utility model is described below. The automatic wheel flaw detection device described below can be referred to in correspondence with the dual crystal probe assembly described above.

[0057] like Figure 3 , Figure 4As shown, the present invention provides an automatic wheel flaw detection device, including the aforementioned quick-release dual-crystal probe assembly 2-1 and an automatic probe array lifting system; multiple dual-crystal probe assemblies 2-1 are arranged along the extension direction of the rail 2-2 on the side of the rail 2-2, with one set on each of the left and right rails 2-2; the automatic probe array lifting system is fixed on the side of the rail 2-2, and the dual-crystal probe assembly 2-1 is mounted on the automatic probe array lifting system.

[0058] Further options, such as Figure 4 As shown, the automatic lifting system for the probe array includes a protective cover 2-4, a lifting device 2-3 and a transmission device 2-5 placed inside the protective cover 2-4, and a dual-crystal probe assembly 2-1 mounted on the lifting device 2-3.

[0059] It should be noted that the aforementioned automatic lifting system for the probe array is existing technology, and can be referenced to the published patent (application number 202220507326.3, announcement number CN216943106U). When a train passes through a test track containing flaw detection equipment, the lifting device drives the probe array to rise to a designated height via a transmission device, and the dual-crystal probe assembly begins to measure the passing wheelsets. When all the vehicles under test have left the test track, the test is completed, the lifting device descends via a transmission device, and the dual-crystal probe assembly sinks into a standby state.

[0060] It should be further noted that, since the detection system in standby mode is located on the inner side of the track, when it is necessary to repair the probe array and replace some damaged probes, the limited space makes disassembly and installation difficult. Therefore, when repair is required, the lifting characteristics of the automatic lifting system of the probe array are used to raise it to a height above the horizontal track surface to assist in the disassembly and installation of the probe array.

[0061] Numerous specific details are set forth in the specification provided herein. However, it will be understood that embodiments of the present invention may be practiced without these specific details. In some instances, well-known methods, structures, and techniques have not been shown in detail so as not to obscure the understanding of this specification.

[0062] Furthermore, those skilled in the art will understand that although some embodiments described herein include certain features found in other embodiments but not others, combinations of features from different embodiments are also within the scope of protection of this invention and form different embodiments. For example, in the embodiments described above, those skilled in the art can use them in combination based on known technical solutions and the technical problems to be solved by this application.

[0063] The above description is merely a preferred embodiment of the present utility model and is not intended to limit the present utility model in any way. Although the present utility model has been disclosed above with reference to a preferred embodiment, it is not intended to limit the present utility model. Any person skilled in the art can make some modifications or alterations to the above-described technical content to create equivalent embodiments without departing from the scope of the present utility model. Any simple modifications, equivalent changes, and alterations made to the above embodiments based on the technical essence of the present utility model without departing from the scope of the present utility model shall still fall within the scope of the present utility model.

Claims

1. A dual-crystal probe assembly capable of quick assembly and disassembly, characterized in that, include: The base has two rows of evenly spaced insertion holes along its length, with the insertion holes in the upper row and the insertion holes in the lower row arranged alternately. The probe is inserted into each of the insertion holes in the base; An elastic component is arranged between the probe and the base for vertically lifting the probe upwards; An auxiliary plate is detachably mounted on the base, and the auxiliary plate is provided with multiple mounting and dismounting holes corresponding to the probes. The probes are inserted into the mounting and dismounting holes, and the probes are installed and removed through the mounting and dismounting holes. A cover plate is located above the auxiliary plate. Each cover plate corresponds to one probe. The cover plate has a through hole, through which the upper part of the probe can extend. The cover plate is detachably connected to the auxiliary plate.

2. The dual-crystal probe assembly capable of quick assembly and disassembly according to claim 1, characterized in that: The mounting and dismounting hole on the auxiliary plate is an irregularly shaped hole used to press down the elastic component and limit the probe in the insertion hole; the probe can rotate circumferentially in the irregularly shaped hole, and when rotated to a preset angle, the probe can pass through or out of the irregularly shaped hole.

3. The dual-crystal probe assembly capable of quick assembly and disassembly according to claim 2, characterized in that: The probe is divided into two parts: an upper rectangular block and a lower inverted truncated cone. On the two opposite sides of the rectangular block, a protrusion extends horizontally outward from the bottom surface. Rotating the probe changes the position of the protrusions on both sides. When the protrusions on both sides fall completely into the irregular hole, the probe can pass through or out of the irregular hole.

4. The dual-crystal probe assembly capable of quick assembly and disassembly according to claim 3, characterized in that: The through hole on the cover plate is a rectangular hole, the size of which is adapted to the size of the rectangular block on the upper part of the probe. After the probe is inserted into the through hole of the cover plate, it cannot be rotated circumferentially.

5. A dual-crystal probe assembly capable of quick assembly and disassembly according to claim 3, characterized in that: The elastic component is a spring, which is fitted onto the chamfered platform of the probe. The insertion hole on the base is a stepped hole that is wider at the top and narrower at the bottom. The lower part of the spring is inserted into the stepped hole to limit the spring. The connection between the rectangular block and the chamfered platform is used as the upper limit of the spring.

6. A dual-crystal probe assembly capable of quick assembly and disassembly according to claim 1, characterized in that: The base is fixed with multiple auxiliary plate studs, and the auxiliary plate is provided with multiple mounting holes that correspond one-to-one with the auxiliary plate studs. The auxiliary plate is fixed by screws cooperating with the mounting holes and auxiliary plate studs.

7. A dual-crystal probe assembly capable of quick assembly and disassembly according to claim 1, characterized in that: The auxiliary plate has at least two threaded holes in the area surrounding each disassembly hole, and the cover plate has assembly holes arranged coaxially with the threaded holes. The cover plate is fixed by screws that cooperate with the assembly holes and threaded holes.

8. A dual-crystal probe assembly capable of quick assembly and disassembly according to claim 1, characterized in that: The auxiliary plate has at least two guide rods in the area surrounding each disassembly hole. The cover plate has assembly holes arranged coaxially with the guide rods. The guide rods pass through the assembly holes of the cover plate and the cover plate is fixed by inserting cotter pins into the pin holes on the guide rods located above the cover plate.

9. An automatic wheel flaw detection device, characterized in that, include: The quick-assembly dual-crystal probe assembly according to any one of claims 1 to 8 is arranged on the side of the rail along the extension direction of the rail. The probe array automatic lifting system is fixed to the side of the rail, and the dual-crystal probe assembly is installed on the probe array automatic lifting system.

10. An automatic wheel flaw detection device according to claim 9, characterized in that: The automatic lifting system for the probe array includes a protective cover and a lifting device and a drive device placed inside the protective cover. The dual-crystal probe assembly is mounted on the lifting device.

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