Battery pack test interface connecting device

Abstract

The utility model provides a battery pack test interface connecting device, and relates to the technical field of battery testing, the device comprises a test line terminal provided with a first matching structure and a to-be-tested battery pack interface provided with a second matching structure, the first matching structure comprises a central cylinder and a plurality of clamping blocks, each clamping block is provided with a first magnetic part, and the central cylinder is provided with a second magnetic part; the second matching structure comprises an insertion groove and a plurality of clamping grooves perpendicular to the length direction of the insertion groove, second magnetic attraction parts are arranged in the clamping grooves, in the state that the test line terminal is connected with the to-be-tested battery pack interface, the central column body is inserted into the insertion groove, the clamping blocks are located in the corresponding clamping grooves, and the clamping blocks are located in the clamping grooves. The first magnetic attraction part and the second magnetic attraction part attract each other, and the first matching structure and the second matching structure are electrically connected. According to the invention, the dismounting process is simple and rapid, the connection between the test line terminal and the to-be-tested battery pack interface is tight, the reliability is high, and the service life is longer.

Description

Technical Field

[0001] This application belongs to the field of battery testing technology, and in particular relates to a battery pack testing interface connection device. Background Technology

[0002] A battery module, containing multiple individual battery cells, is the basic energy storage unit that constitutes an electrochemical energy storage power station. Its performance directly impacts the overall operational capability of the power station. Therefore, it is crucial to conduct batch sampling tests on battery modules before they are installed in an energy storage power station to determine their performance. Testing the battery pack requires connecting the test leads of the charge / discharge tester to the corresponding electrode interfaces on the battery pack. Currently, two main methods are screw fixing and clamp fixing.

[0003] To ensure a tight connection between the test leads and the battery pack interface during battery testing, two main mechanical connection methods are currently used: threaded connection and clamping.

[0004] Threaded connections use screws to secure terminals, washers, nuts, and other components to the battery pack's electrode interfaces. Complete disassembly is required after testing, and this is a widely used terminal-interface connection method. However, it suffers from drawbacks such as complex installation and disassembly processes, numerous parts, and inconsistent tightening results when manually tightened.

[0005] Clamp connections involve using clamps containing conductive materials and wiring to grip the electrode interface, making installation and removal very convenient. However, clamping also presents significant problems. Because the force originates from its own elastic mechanical structure, the contact force between the clamp and the electrode is relatively small compared to other connection methods, resulting in a slightly less tight connection. Furthermore, the elastic structure providing the force is prone to damage and aging, leading to a shorter service life.

[0006] Therefore, there is an urgent need for a battery pack test interface connection device that can firmly connect the test lead terminals and the battery interface, and has a simple and reliable structure that is easy to install and disassemble. Utility Model Content

[0007] The purpose of this application is to provide a battery pack test interface connection device that can firmly connect the test lead terminals and the battery interface, and has a simple and reliable structure, and is easy to install and disassemble.

[0008] To achieve the above objectives, this application is implemented as follows:

[0009] This application provides a battery pack test interface connection device, including:

[0010] The test lead terminal includes a first mating structure, which includes a central column and a plurality of locking blocks disposed on the side wall of the central column, wherein the plurality of locking blocks are located at one end of the central column and the locking blocks are provided with a first magnetic attraction part.

[0011] The interface of the battery pack under test includes a second mating structure, the second mating structure includes a slot and a plurality of slots communicating with the slot, and the extension direction of the slots is perpendicular to the length direction of the slots. A second magnetic part is provided in the slots, and the slots correspond one-to-one with the card blocks.

[0012] When the test line terminal is connected to the interface of the battery pack under test, the central column is inserted into the slot, the card block is located in the corresponding card slot, the first magnetic part and the second magnetic part are attracted to each other, and the first mating structure and the second mating structure are electrically connected.

[0013] Optionally, a plurality of guide grooves are provided on the inner wall of the slot, the guide grooves extend along the length direction of the slot, the guide grooves correspond one-to-one with the card slots, and the guide grooves are connected to the corresponding card slots;

[0014] The positions of the multiple card blocks on the central column correspond to the positions of the multiple guide grooves in the slots.

[0015] Optionally, the second magnetic suction part is disposed in the card slot at a location outside the projection range of the guide groove along the length direction of the slot.

[0016] Optionally, the multiple slots are interconnected to form an annular groove structure.

[0017] Optionally, the first magnetic attraction part is an iron protrusion, and the second magnetic attraction part is a permanent magnet.

[0018] Optionally, the central column is made of copper, and the bottom wall of the slot is provided with a copper connector for electrical connection with the central column;

[0019] When the test lead terminal is connected to the interface of the battery pack under test, the copper connector is in contact with the end face of the central column.

[0020] Optionally, the diameter of the copper connector is less than or equal to the diameter of the central column.

[0021] Optionally, the inner wall of the card slot facing the slot opening is a magnetic inner wall, the magnetic inner wall is flush with the bottom wall of the slot, and the second magnetic part is disposed inside the magnetic inner wall.

[0022] Optionally, the multiple card blocks are evenly distributed on the side wall of the central column;

[0023] The magnetic inner wall is divided into multiple magnetic regions and multiple non-magnetic regions along the circumference of the slot, and both the magnetic regions and the non-magnetic regions are fan-shaped.

[0024] Wherein, the fan-shaped annular region in the magnetic inner wall that coincides with the projection range of the guide groove along the length direction of the slot is configured as a non-magnetic region, and the fan-shaped annular region in the magnetic inner wall that does not coincide with the projection range of the guide groove along the length direction of the slot is configured as a magnetic region, and the second magnetic part is distributed throughout the magnetic region.

[0025] Optionally, the height of the card block is less than the height of the card slot.

[0026] Beneficial effects:

[0027] In this embodiment of the application, during testing, the test lead terminals and the interface of the battery pack under test are connected. That is, the end of the first mating structure with the locking block is inserted into the slot, and the locking block is driven into the slot by rotating the first mating structure. When the first magnetic part of the locking block and the second magnetic part of the slot approach each other to a certain distance, the first magnetic part and the second magnetic part naturally attract each other. At this time, the test lead terminals and the interface of the battery pack under test are relatively fixed by the limiting between the locking block, the slot, the first magnetic part and the second magnetic part.

[0028] During testing, this device only requires inserting the first mating structure into the slot and rotating it to complete the connection and fixation of the test lead terminals and the interface of the battery pack under test. The assembly and disassembly process is simple and quick. Furthermore, the combination of the locking block, the locking slot, the first magnetic attraction part, and the second magnetic attraction part to fix the test lead terminals and the interface of the battery pack under test results in a tight connection between the test lead terminals and the interface of the battery pack under test, which is highly reliable and has a relatively simple overall structure. Moreover, the mating structure of the locking block, the locking slot, the first magnetic attraction part, and the second magnetic attraction part has a longer service life than the elastic mechanism involved in the fixture, which can ensure the tightness of the connection between the test lead terminals and the interface of the battery pack under test during long-term use. Attached Figure Description

[0029] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0030] Figure 1 This is a schematic diagram of the structure of a battery pack test interface connection device provided in an embodiment of this application;

[0031] Figure 2 This is a schematic diagram of the first mating structure provided in the embodiments of this application;

[0032] Figure 3 This is a top view of the first mating structure provided in the embodiments of this application;

[0033] Figure 4 This is a schematic diagram of the second mating structure provided in the embodiments of this application;

[0034] Figure 5 This is a schematic diagram of the internal structure of the second mating structure provided in the embodiments of this application;

[0035] Figure 6 This is a schematic diagram of the regional distribution of the magnetic inner wall provided in the embodiments of this application.

[0036] Explanation of reference numerals in the attached figures:

[0037] 1-First mating structure, 11-Central column, 12-Card block, 2-Second mating structure, 21-Slot, 22-Card groove, 23-Guide groove, 24-Copper connector, 25-Magnetic inner wall, 251-Magnetic area, 252-Non-magnetic area. Detailed Implementation

[0038] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0039] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0040] The battery pack test interface connection device provided in this application will be described in detail below with reference to the accompanying drawings, through specific embodiments and application scenarios.

[0041] Figure 1 This is a schematic diagram of a battery pack test interface connection device provided in an embodiment of this application.

[0042] See Figure 1A battery pack test interface connection device includes test lead terminals and a battery pack interface to be tested.

[0043] like Figures 2-3 As shown, the test line terminal includes a first mating structure 1, the first mating structure 1 includes a central column 11 and a plurality of locking blocks 12 disposed on the side wall of the central column 11, and the plurality of locking blocks 12 are located at one end of the central column 11, and the locking blocks 12 are provided with a first magnetic attraction part; the charge and discharge test line of the battery test device is connected to the end of the central column 11 without locking blocks.

[0044] like Figures 4-6 As shown, the interface of the battery pack under test includes a second mating structure 2. The second mating structure 2 includes a slot 21 and a plurality of card slots 22 communicating with the slot 21. The extending direction of the card slots 22 is perpendicular to the length direction of the slot 21. A second magnetic attraction part is provided in the card slot 22. The card slots 22 correspond one-to-one with the card blocks 12.

[0045] When the test line terminal is connected to the interface of the battery pack under test, the central column 11 is inserted into the slot 21, the card block 12 is located in the corresponding card slot 22, the first magnetic attraction part and the second magnetic attraction part are attracted to each other, and the first mating structure 1 and the second mating structure 2 are electrically connected.

[0046] In this embodiment, the test lead terminal includes a first mating structure 1, and the interface of the battery pack under test includes a second mating structure 2 with a slot 21. The first mating structure 1 can be inserted into the slot 21 of the second mating structure 2, thereby achieving connection between the test lead terminal and the interface of the battery pack under test. The first mating structure 1 includes a central column 11 and multiple locking blocks 12. The multiple locking blocks 12 are disposed on the side wall of the central column 11 and located at the end of the central column 11. The multiple locking blocks 12 are protruding outwards on the side wall of the central column 11. The slot 21 of the composite structure 2 is provided with multiple slots 22, and the extension direction of the slots 22 is perpendicular to the length direction of the slot 21. When the central column 11 is inserted into the slot 21, the locking block 12 can enter into the slot 22 through the rotation of the first mating structure 1. At this time, the slot 22 can cooperate with the locking block 12 to achieve axial mechanical fixation, thereby preventing the first mating structure 1 from exiting the slot 21 and improving the connection reliability between the test lead terminal and the interface of the battery pack under test. Each locking block 12 is provided with a first magnetic attraction part, and each slot 22 is provided with a second magnetic attraction part. The first and second magnetic suction parts can generate a magnetic force that attracts each other. When the card block 12 enters the card slot 22, the first and second magnetic suction parts are attracted together, thereby achieving axial and circumferential magnetic fixation, preventing the first mating structure 1 from exiting the slot 21, improving the connection reliability between the test line terminal and the interface of the battery pack under test, and preventing the first mating structure 1 from rotating, thereby preventing the card block 12 from exiting the card slot 22 through the rotation of the central column 11, further improving the connection reliability between the test line terminal and the interface of the battery pack under test; the corresponding surfaces of the first mating structure 1 and the second mating structure 2 are provided with a mechanism for electrical connection, wherein the mechanism for electrical connection on the first mating structure 1 is connected to the charge and discharge test line of the battery testing device, and the mechanism for electrical connection on the second mating structure 2 is connected to the corresponding electrode of the battery under test. When the first mating structure 1 is inserted into the slot 21 of the second mating structure 2, the mechanisms for electrical connection in the first mating structure 1 and the second mating structure 2 come into contact, thereby realizing the electrical connection between the first mating structure 1 and the second mating structure 2.

[0047] Specifically, during testing, the test lead terminals and the interface of the battery pack under test are connected. That is, the end of the first mating structure 1 with the locking block 12 is inserted into the slot 21. By rotating the first mating structure 1, the locking block 12 is driven into the slot 22. When the first magnetic part of the locking block 12 and the second magnetic part of the slot 22 approach each other to a certain distance, the first magnetic part and the second magnetic part naturally attract each other. At this time, the test lead terminals and the interface of the battery pack under test are relatively fixed by the limiting between the locking block 12, the slot 22, the first magnetic part and the second magnetic part.

[0048] During testing, this device only requires inserting the first mating structure 1 into the slot 21 and rotating it to complete the connection and fixation of the test lead terminal and the interface of the battery pack under test. The assembly and disassembly process is simple and quick. Furthermore, the test lead terminal and the interface of the battery pack under test are fixed by the cooperation of the card block 12, the card slot 22, the first magnetic part and the second magnetic part, which makes the connection between the test lead terminal and the interface of the battery pack under test relatively tight and reliable, and the overall structure is relatively simple. Moreover, the mating structure of the card block 12, the card slot 22, the first magnetic part and the second magnetic part has a longer service life than the elastic mechanism involved in the fixture, which can ensure the tightness of the connection between the test lead terminal and the interface of the battery pack under test during long-term use.

[0049] The number of card blocks 12 can be two. Preferably, the number of card blocks 12 is three or more, and the three or more card blocks 12 are evenly distributed on the side of the central column 11. Through the cooperation of all card blocks 12 with the card slot 22 and the adsorption of the first magnetic attraction part on the card block 12 and the second magnetic attraction part in the card slot 22, the first mating structure 1 is relatively stable in the slot 21 and is not easy to shake or shift under the action of external force. This reduces the possibility that the first mating structure 1 will shake during the test, causing unstable electrical connection between the first mating structure 1 and the second mating mechanism, and affecting the stability of the test.

[0050] The card block 12 is provided with a first magnetic attraction part. The first magnetic attraction part can be the part of the card block 12 that contacts the second magnetic attraction part, or the entire card block 12 can be used as the first magnetic attraction part.

[0051] The connection between the card block 12 and the central column 11 can be such that the card block 12 is embedded in the side of the central column 11, or the card block 12 and the central column 11 are integrally formed.

[0052] The extension direction of the card slot 22 is perpendicular to the length direction of the slot 21. The card slot 22 can be extended in a straight line perpendicular to the length direction of the slot 21, in which case the card slot 22 is straight; or the card slot 22 can be extended in the circumference of the slot 21, in which case the card slot 22 is arc-shaped.

[0053] The card block 12 can be a cuboid structure, and the cross-section of the card slot 22 can be a rectangle that fits the card block 12.

[0054] Alternatively, in some embodiments, such as Figures 4-5 As shown, a plurality of guide grooves 23 are provided on the inner wall of the slot 21. The guide grooves 23 extend along the length of the slot 21. The guide grooves 23 correspond one-to-one with the card slots 22, and the guide grooves 23 are connected to the corresponding card slots 22. The positions of the plurality of card blocks 12 on the central column 11 correspond to the positions of the plurality of guide grooves 23 in the slot 21.

[0055] In this embodiment, the guide groove 23 extends along the length of the slot 21, one end of the guide groove 23 is exposed at the opening of the slot 21, and the other end of the guide groove 23 is connected to the card slot 22. At this time, the connection structure between the card slot 22 and the guide groove 23 is "L" shaped. The positions of the multiple card blocks 12 on the central column 11 correspond to the positions of the multiple guide grooves 23 in the slot 21. When the first mating structure 1 is placed into the slot 21, the positions of the multiple card blocks 12 and the positions of the multiple guide grooves 23 exposed at the opening of the slot 21 can be aligned. Then, the first mating structure 1 is placed into the slot 21. At this time, the multiple card blocks 12 can move to one end of the card slot 22 under the guidance of the guide groove 23, and then the card blocks 12 enter the card slot 22 by the rotation of the first mating structure 1.

[0056] The guide groove 23 allows the card block 12 to be inserted directly from the slot 21 into the slot 22, and the card block 12 can be inserted into the slot 22 by rotation. The whole process is simple and quick.

[0057] Specifically, the first part of the second magnetic attraction part can be disposed in the card slot 22 within the projection range of the guide groove 23 along the length direction of the slot 21 (for example, when the length direction of the slot 21 is vertical, the area in the card slot 22 directly below the guide groove 23 is the projection range of the guide groove 23 along the length direction of the slot 21), and the second part can be disposed in the card slot 22 within the projection range of the guide groove 23 along the length direction of the slot 21). Outside the projection range along the length direction of the slot 21, when the card block 12 just passes through the guide groove 23 to one end of the slot 22, the first magnetic part on the card block 12 is attracted together with the first part of the second magnetic part. Then, the card block 12 needs to be moved to outside the projection range along the length direction of the slot 21 by rotating the first mating structure 1, and attracted together with the second part of the second magnetic part. At this time, the card block 12, the slot 22, the first magnetic part and the second magnetic part work together to fix the test line terminal and the interface of the battery pack under test.

[0058] Alternatively, the second magnetic part can be placed outside the projection range of the guide groove 23 along the length direction of the slot 21 in the card slot 22, but only in a part of the card slot 22 outside the projection range of the guide groove 23 along the length direction of the slot 21.

[0059] Optionally, in some embodiments, the second magnetic part is disposed in the slot 22 at a location outside the projection range of the guide groove 23 along the length direction of the slot 21.

[0060] In this embodiment, when the card block 12 just passes through the guide groove 23 to one end of the card slot 22, the first magnetic attraction part on the card block 12 will not be excessively hindered by the magnetic attraction force. It can rotate the first mating structure 1 with less force and make the card block 12 penetrate into the card slot 22, thereby completing the engagement of the card block 12 and the card slot 22. This reduces the magnetic attraction force from hindering the engagement of the first mating structure 1 and the second mating structure 2, and improves the smoothness of the disassembly and assembly process during testing.

[0061] Alternatively, one end of the card slot 22 can be connected to the adjacent guide slot 23 while the other end is closed, or both ends of the card slot 22 can be connected to two adjacent card slots 22 respectively.

[0062] Alternatively, in some embodiments, such as Figure 5 As shown, the multiple slots 22 are interconnected to form an annular groove structure.

[0063] In this embodiment, an annular groove formed by multiple interconnected slots 22 surrounds the slot 21. When the first mating structure 1 is inserted into the slot 21, by rotating the first mating structure 1, multiple card blocks 12 can move freely within the annular groove. At this time, the card block 12 and the first magnetic attraction part on the card block 12 can cooperate with any card slot 22 and the second magnetic attraction part therein to fix the test wire terminal and the interface of the battery pack under test, thereby making the disassembly and assembly process of the test simpler and faster.

[0064] Alternatively, the first magnetic attraction part can be a permanent magnet, and the second magnetic attraction part can be an iron component arranged in the slot 22; or the first magnetic attraction part can be an iron protrusion, and the second magnetic attraction part can be a permanent magnet.

[0065] Optionally, in some embodiments, the first magnetic attraction part is an iron protrusion, and the second magnetic attraction part is a permanent magnet.

[0066] In this embodiment, by making the first magnetic attraction part an iron bump, it is possible to prevent the first magnetic attraction part from adhering to other metals when moving the test lead terminal, thus avoiding inconvenience in use. Furthermore, iron bumps are low-cost, allowing for easy replacement of the locking block 12 or the first magnetic attraction part when damaged. By making the second magnetic attraction part a permanent magnet, the permanent magnet can be stored deep within the slot 21, reducing damage or weakening of its magnetism. Therefore, the lifespan of the entire device can be increased, and costs reduced.

[0067] The entire card block 12 is considered as the first magnetic attraction part.

[0068] Optionally, in some embodiments, the central column 11 is made of copper, and the bottom wall of the slot 21 is provided with a copper connector 24 for electrical connection with the central column 11, wherein, when the test line terminal is connected to the interface of the battery pack under test, the copper connector 24 is in contact with the end face of the central column 11.

[0069] In this embodiment, a copper central column 11 serves as an electrical connection mechanism on the first mating structure 1, connected to the charge / discharge test lines of the battery testing device. A copper connector 24 serves as an electrical connection mechanism on the second mating structure 2, connected to the corresponding electrode of the battery under test. The copper connector 24 is arranged on the bottom wall of the slot 21, with the surface of the copper connector 24 in contact with the central column 11 flush with the bottom wall of the slot 21. During testing, the end face of the central column 11 contacts the copper connector 24, achieving electrical connection between the first mating structure 1 and the second mating structure 2. By arranging the copper connector 24 on the bottom surface of the slot 21, friction between the central column 11 and the copper connector 24 during insertion into the slot 21 can be avoided, preventing wear on the copper connector 24. This improves the service life of the copper area, ensures the stability of the electrical connection between the first mating structure 1 and the second mating mechanism, and thus enhances the stability of the test.

[0070] The central column 11 can be a cylinder, which facilitates the rotation of the first mating structure 1 within the slot 21.

[0071] Specifically, the diameter of the inner wall of the slot 21 can be the same as the diameter of the central column 11. By making the diameter of the inner wall of the slot 21 the same as the diameter of the central column 11, the inner wall of the slot 21 can limit the central column 11, preventing the first mating structure 1 from shaking during the test, which would cause the electrical connection between the first mating structure 1 and the second mating mechanism to be unstable and affect the stability of the test.

[0072] Optionally, in some embodiments, the diameter of the copper connector 24 is less than or equal to the diameter of the central column 11.

[0073] In this embodiment, by making the diameter of the copper connector 24 smaller than or equal to the diameter of the central column 11, the end face of the central column 11 can fully cover the copper connector 24, thereby ensuring the reliability of the contact between the central column 11 and the copper connector 24.

[0074] Alternatively, in some embodiments, such as Figure 5 As shown, the inner wall of the slot 22 facing the opening of the slot 21 is a magnetic inner wall 25, which is flush with the bottom wall of the slot 21, and the second magnetic part is disposed inside the magnetic inner wall 25.

[0075] In this embodiment, since the magnetic inner wall 25 is the inner wall of the slot 22 facing the opening of the slot 21, the magnetic attraction force generated by the second magnetic part on the first magnetic part in the magnetic inner wall 25 is directed towards the depth of the slot 21. Furthermore, since the magnetic inner wall 25 is flush with the bottom surface of the inner wall of the slot 21, when the first magnetic part and the second magnetic part are attracted together, the central column 11 can be tightly pressed against the copper connector 24 located on the bottom wall of the slot 21 under the action of the magnetic attraction force in the direction towards the depth of the slot 21. This ensures the stability of the electrical connection between the first mating structure 1 and the second mating mechanism, thereby improving the stability of the test.

[0076] Optionally, in some embodiments, the height of the card block 12 can be less than the height of the card slot 22, so that the card block 12 can be rotated into the card slot 22.

[0077] Optionally, in some embodiments, a plurality of the card blocks 12 are evenly distributed on the sidewall of the central column 11; such as Figure 6 As shown, the magnetic inner wall 25 is divided into multiple magnetic regions 251 and multiple non-magnetic regions 252 along the circumference of the slot 21. Both the magnetic regions 251 and the non-magnetic regions 252 are fan-shaped.

[0078] The annular region in the magnetic inner wall 25 that overlaps with the projection range of the guide groove 23 along the length direction of the slot 21 is configured as a non-magnetic region 252, and the annular region in the magnetic inner wall 25 that does not overlap with the projection range of the guide groove 23 along the length direction of the slot 21 is configured as a magnetic region 251, and the second magnetic part is distributed throughout the magnetic region 251.

[0079] In this embodiment, multiple card blocks 12 are evenly distributed on the sidewall of the central column 11, meaning that the spacing between the multiple card blocks 12 is the same. For example, when there are three card blocks 12, the line connecting the three card blocks 12 forms an equilateral triangle. The magnetic inner wall 25 is divided into multiple non-magnetic regions 252 without a second magnetic part and multiple magnetic regions 251 with a second magnetic part distributed throughout. The magnetic regions 251 with a second magnetic part distributed throughout mean that each magnetic region 251 can generate a magnetic attraction force on the first magnetic part. For example, the entire magnetic region 251 is composed of permanent magnets. Both the magnetic regions 251 and the non-magnetic regions 252 are fan-shaped. The number of card blocks 12, magnetic regions 251, and non-magnetic regions 252 is the same, and the central angles of the multiple magnetic regions 251 are equal. The multiple magnetic regions 251 are evenly and spaced apart.

[0080] By setting up magnetic region 251 and non-magnetic region 252, no matter how the first mating structure 1 is rotated, multiple card blocks 12 can be moved simultaneously into different magnetic regions 251, ensuring that the first magnetic attraction part of multiple card blocks 12 is always subjected to magnetic attraction force at the same time. This ensures that the first mating structure 1 and the second mating mechanism are always subjected to a relatively stable magnetic connection, thereby improving the stability of the electrical connection between the first mating structure 1 and the second mating mechanism, and thus improving the stability of the test.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A battery pack testing interface connection device, characterized in that, include: The test line terminal includes a first mating structure (1), the first mating structure (1) includes a central column (11) and a plurality of locking blocks (12) disposed on the side wall of the central column (11), and the plurality of locking blocks (12) are located at one end of the central column (11), and the locking blocks (12) are provided with a first magnetic attraction part; The interface of the battery pack under test includes a second mating structure (2), the second mating structure (2) includes a slot (21) and a plurality of card slots (22) communicating with the slot (21), and the extension direction of the card slots (22) is perpendicular to the length direction of the slot (21). A second magnetic suction part is provided in the card slot (22), and the card slots (22) correspond one-to-one with the card blocks (12). When the test line terminal is connected to the interface of the battery pack under test, the central column (11) is inserted into the slot (21), the card block (12) is located in the corresponding card slot (22), the first magnetic part and the second magnetic part are attracted to each other, and the first mating structure (1) and the second mating structure (2) are electrically connected.

2. The battery pack test interface connection device according to claim 1, characterized in that, The inner wall of the slot (21) is provided with a plurality of guide grooves (23), the guide grooves (23) extend along the length direction of the slot (21), the guide grooves (23) correspond one-to-one with the card slots (22), and the guide grooves (23) are connected to the corresponding card slots (22); The positions of the multiple card blocks (12) on the central column (11) correspond to the positions of the multiple guide grooves (23) in the slot (21).

3. The battery pack test interface connection device according to claim 2, characterized in that, The second magnetic suction part is disposed in the card slot (22) at a position outside the projection range of the guide groove (23) along the length direction of the slot (21).

4. The battery pack test interface connection device according to claim 1, characterized in that, Multiple slots (22) are interconnected to form an annular groove structure.

5. A battery pack testing interface connection device according to claim 1, characterized in that, The first magnetic attraction part is an iron protrusion, and the second magnetic attraction part is a permanent magnet.

6. A battery pack testing interface connection device according to claim 2, characterized in that, The central column (11) is made of copper, and the bottom wall of the slot (21) is provided with a copper connector (24) for electrical connection with the central column (11). When the test line terminal is connected to the interface of the battery pack under test, the copper connector (24) is in contact with the end face of the central column (11).

7. A battery pack test interface connection device according to claim 6, characterized in that, The diameter of the copper connector (24) is less than or equal to the diameter of the central column (11).

8. A battery pack test interface connection device according to claim 6, characterized in that, The inner wall of the side of the slot (22) facing the opening of the slot (21) is a magnetic inner wall (25), which is flush with the bottom wall of the slot (21), and the second magnetic part is disposed inside the magnetic inner wall (25).

9. A battery pack test interface connection device according to claim 8, characterized in that, Multiple card blocks (12) are evenly distributed on the side wall of the central column (11); The magnetic inner wall (25) is divided into multiple magnetic regions (251) and multiple non-magnetic regions (252) along the circumference of the slot (21), and both the magnetic regions (251) and the non-magnetic regions (252) are fan-shaped. Among them, the fan-shaped annular region in the magnetic inner wall (25) that coincides with the projection range of the guide groove (23) along the length direction of the slot (21) is configured as a non-magnetic region (252), and the fan-shaped annular region in the magnetic inner wall (25) that does not coincide with the projection range of the guide groove (23) along the length direction of the slot (21) is configured as a magnetic region (251), and the second magnetic part is distributed throughout the magnetic region (251).

10. A battery pack testing interface connection device according to claim 1, characterized in that, The height of the card block (12) is less than the height of the card slot (22).

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