Test socket for IC test

Abstract

The utility model provides a test socket used for IC test. The test socket for IC testing includes: a housing; the device comprises a shell and two movable openings, the two movable openings are formed in the two sides of the shell, a butt joint base is installed at the bottom of the inner wall of the shell, a connector is installed on the back face of the butt joint base, sliding rods are fixedly connected to the positions, close to the four corners, of the bottom of the inner wall of the shell through supporting discs, and auxiliary springs are fixedly connected to the outer surfaces of the supporting discs. And movable rings are slidably connected to the outer surfaces of the sliding rods correspondingly, sliding blocks are installed at the tops of the four movable rings correspondingly, a movable plate is fixedly connected between the four sliding blocks, and supporting plates are fixedly connected to the two sides of the movable plate correspondingly. According to the test socket for the IC test provided by the utility model, the IC integrated circuit is clamped into the test socket through the design, so that the test socket is powered off, and the condition that the IC integrated circuit is damaged due to improper operation when the IC integrated circuit is clamped into the test socket in an electrified manner is avoided.

Description

Technical Field

[0001] This utility model relates to the field of IC test socket technology, and in particular to a test socket for IC testing. Background Technology

[0002] IC testing is the testing of integrated circuits. If there were defect-free products, there would be no need for integrated circuit testing. Due to defects in the actual manufacturing process and the materials themselves, no matter how perfect the product is, there will be defective individuals. Therefore, testing has become an indispensable part of integrated circuit manufacturing.

[0003] The main function of IC test sockets is to perform electrical performance tests on integrated circuits, ensuring that the devices can fully realize the functions and performance indicators specified in the design specifications under harsh environmental conditions. They are connected to IC pins through mechanical contact to transmit electrical signals, thereby checking for manufacturing defects and component malfunctions.

[0004] When testing IC integrated circuits, existing IC test sockets typically place the IC integrated circuit on the test socket while it is powered on for convenience. However, if an error occurs during this process, the IC integrated circuit can easily be damaged.

[0005] Therefore, it is necessary to provide a test socket for IC testing to solve the above-mentioned technical problems. Utility Model Content

[0006] This invention provides a test socket for IC testing, which solves the problem that improper operation can easily damage IC integrated circuits during the testing process of placing them in a powered IC test socket.

[0007] To solve the above-mentioned technical problems, the test socket for IC testing provided by this utility model includes: a housing;

[0008] Two movable ports are located on both sides of the housing. A docking seat is installed at the bottom of the inner wall of the housing, and a connector is installed on the back of the docking seat. Slide rods are fixedly connected to the bottom of the inner wall of the housing near the four corners via support plates. An auxiliary spring is fixedly connected to the outer surface of the support plate. Movable rings are slidably connected to the outer surface of each slide rod. A slider is installed on the top of each of the four movable rings. A movable plate is fixedly connected between the four sliders. A support plate is fixedly connected to both sides of the movable plate. A test socket is installed on the top of the movable plate, and a plug is installed at the bottom of the test socket.

[0009] A support base is installed at the bottom of the housing. Telescopic rods are fixedly connected to the top of the support base near both sides. Connecting brackets are installed at the telescopic ends of the two telescopic rods. A top cover is installed on the top of the housing, and an opening is provided on the top of the top cover.

[0010] The auxiliary spring is located on the outer surface of the slide rod, the movable ring moves on the outer surface of the slide rod, the bottom end of the movable ring is connected to the top end of the auxiliary spring, the support plate moves inside the movable port, the plug passes through the movable plate and is inserted into the test socket, and the two telescopic rods are installed in a staggered manner.

[0011] Preferably, a fixing block is installed on both sides of the test socket, and a pressure cover with a handle is installed on the top of the test socket. A mating piece with fixing bolts is installed on both sides of the top of the pressure cover.

[0012] The fixing bolts and fixing blocks are threaded together.

[0013] Preferably, a connecting wire is installed on the back of the connector, and the support base includes a base plate, with internal threaded bolts fixedly connected to the bottom of the base plate near the four corners.

[0014] The connecting cable is for powering the docking socket.

[0015] Preferably, the bottom of the internally threaded bolt is threadedly connected to an adjusting bolt, and the bottom end of the adjusting bolt is fixedly connected to a contact plate;

[0016] The height of the contact plate can be adjusted by rotating the adjusting bolt.

[0017] Preferably, a control box is mounted on the front of the housing, and a door is rotatably connected to the front of the control box;

[0018] The control box contains power switches and controllers for operating the equipment.

[0019] Preferably, a mounting base is mounted on the front of the housing, and an operation screen is mounted on the front of the mounting base.

[0020] Compared with related technologies, the test socket for IC testing provided by this utility model has the following characteristics:

[0021] Beneficial effects:

[0022] This invention provides a test socket for IC testing. To reduce the damage rate of the IC test socket during IC integrated circuit testing, a mating seat is installed at the bottom of the inner wall of the housing, and a plug matching the mating seat is installed at the bottom of the test socket. The test socket is mounted on a movable plate that moves up and down powered by a telescopic rod. The extension and retraction of the telescopic rod allows the plug to be inserted into the mating seat, thereby energizing the test socket. During the up and down movement of the movable plate, auxiliary springs and sliding rods increase stability. This design ensures that when the IC integrated circuit is inserted into the test socket, the power to the test socket is de-energized, preventing damage to the IC integrated circuit caused by improper operation when the IC is inserted while energized. Attached Figure Description

[0023] Figure 1 A schematic diagram of a preferred embodiment of the test socket for IC testing provided by this utility model;

[0024] Figure 2 A schematic diagram of the connector structure is provided for this utility model;

[0025] Figure 3 A structural schematic diagram of the connecting frame is provided for this utility model;

[0026] Figure 4 A schematic diagram of the plug structure is provided for this utility model;

[0027] Figure 5 Provided for this utility model Figure 3 An enlarged view of point A shown.

[0028] The following are the labeling elements in the diagram: 1. Housing, 2. Connecting frame, 3. Top cover, 4. Pressure cover, 5. Operation panel, 6. Mounting base, 7. Door, 8. Support base, 801. Base plate, 802. Internal threaded bolt, 803. Threaded bolt, 804. Contact plate, 9. Control box, 10. Movable port, 11. Telescopic rod, 12. Connecting wire, 13. Connector, 14. Opening, 15. Fixing bolt, 16. Connecting piece, 17. Handle, 18. Fixing block, 19. Test socket, 20. Movable plate, 21. Slider, 22. Support plate, 23. Connecting seat, 24. Plug, 25. Movable ring, 26. Auxiliary spring, 27. Support plate, 28. Slide rod. Detailed Implementation

[0029] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0030] Please refer to the following: Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 ,in, Figure 1A schematic diagram of a preferred embodiment of the test socket for IC testing provided by this utility model; Figure 2 A schematic diagram of the connector structure is provided for this utility model; Figure 3 A structural schematic diagram of the connecting frame is provided for this utility model; Figure 4 A schematic diagram of the plug structure is provided for this utility model; Figure 5 Provided for this utility model Figure 3 An enlarged view of point A is shown. The test socket for IC testing includes: housing 1;

[0031] Two movable ports 10 are located on both sides of the housing 1. A docking seat 23 is installed at the bottom of the inner wall of the housing 1. A connector 13 is installed on the back of the docking seat 23. Slide rods 28 are fixedly connected to the bottom of the inner wall of the housing 1 near the four corners via support plates 27. An auxiliary spring 26 is fixedly connected to the outer surface of the support plate 27. Movable rings 25 are slidably connected to the outer surface of each slide rod 28. A slider 21 is installed on the top of each of the four movable rings 25. A movable plate 20 is fixedly connected between the four sliders 21. A support plate 22 is fixedly connected to both sides of the movable plate 20. A test socket 19 is installed on the top of the movable plate 20. A plug 24 is installed at the bottom of the test socket 19.

[0032] A support base 8 is installed at the bottom of the housing 1. Telescopic rods 11 are fixedly connected to the top of the support base 8 near both sides. Connecting brackets 2 are installed at the telescopic ends of the two telescopic rods 11. A top cover 3 is installed on the top of the housing 1. An opening 14 is provided on the top of the top cover 3.

[0033] The auxiliary spring 26 is located on the outer surface of the slide bar 28. The movable ring 25 moves on the outer surface of the slide bar 28. The bottom end of the movable ring 25 is connected to the top end of the auxiliary spring 26. The support plate 22 moves inside the movable opening 10. The plug 24 passes through the movable plate 20 and is inserted into the test socket 19. The two telescopic rods 11 are installed in a staggered manner. The connecting bracket 2 is Z-shaped and is connected to the bottom of the support plate 22. The opening 14 facilitates the movement of the test socket 19.

[0034] The test socket 19 is equipped with fixing blocks 18 on both sides, and a pressure cover 4 with a handle 17 is installed on the top of the test socket 19. A mating piece 16 with fixing bolts 15 is installed on both sides of the top of the pressure cover 4.

[0035] The fixing bolt 15 and the fixing block 18 are threaded together, and the pressure cover 4 can cover the top of the test socket 19.

[0036] The connector 13 is equipped with a connecting wire 12 on its back. The support base 8 includes a base plate 801. The bottom of the base plate 801 is fixedly connected with internal threaded bolts 802 near the four corners.

[0037] Connector 12 is used to power dock 23.

[0038] The bottom of the internal threaded bolt 802 is threadedly connected to an adjusting bolt 803, and the bottom end of the adjusting bolt 803 is fixedly connected to a contact plate 804.

[0039] The rotation of the adjusting bolt 803 can adjust the height of the contact plate 804, increasing the stability of the base plate 801.

[0040] A control box 9 is mounted on the front of the housing 1, and a door 7 is rotatably connected to the front of the control box 9.

[0041] The door 7 is equipped with a lock, and the control box 9 contains a power switch and a controller for controlling the operation of the equipment.

[0042] The front of the housing 1 is equipped with a mounting base 6, and the front of the mounting base 6 is equipped with an operation screen 5.

[0043] The operation screen 5 can set the operating parameters of the equipment on the support base 8.

[0044] The working principle of the test socket for IC testing provided by this utility model is as follows:

[0045] A docking seat 23 is installed at the bottom of the inner wall of the housing 1, and a plug 24 matching the docking seat 23 is installed at the bottom of the test socket 19. The test socket 19 is mounted on a movable plate 20 that moves up and down powered by a telescopic rod 11. The extension and retraction of the telescopic rod 11 allows the plug 24 to be inserted into the docking seat 23, thereby energizing the test socket 19. During the up and down movement of the movable plate 20, the stability is increased by an auxiliary spring 26 and a sliding rod 28. In actual use, the test socket 19 on the movable plate 20 is first pushed to the top, and then the IC integrated circuit is inserted into the test socket 19. After completion, the telescopic rod 11 is activated to move the movable plate 20 downward. During this process, the slider 21 slides downward on the outer surface of the sliding rod 28 and compresses the auxiliary spring 26, allowing the plug 24 to be accurately inserted into the docking seat 23, energizing the test socket 19, thereby completing the test of the IC integrated circuit. After the test is completed, the movable plate 20 is reset to remove the IC integrated circuit.

[0046] Compared with related technologies, the test socket for IC testing provided by this utility model has the following characteristics:

[0047] Beneficial effects:

[0048] To reduce the damage rate of IC test sockets during IC integrated circuit testing, a mating seat 23 is installed at the bottom of the inner wall of the housing 1, and a plug 24 matching the mating seat 23 is installed at the bottom of the test socket 19. The test socket 19 is mounted on a movable plate 20 that moves up and down powered by a telescopic rod 11. The extension and retraction of the telescopic rod 11 allows the plug 24 to be inserted into the mating seat 23, thereby energizing the test socket 19. During the up and down movement of the movable plate 20, the stability is increased by an auxiliary spring 26 and a sliding rod 28. This design ensures that when the IC integrated circuit is inserted into the test socket 19, the power to the test socket 19 is de-energized, preventing damage to the IC integrated circuit caused by improper operation when the IC is inserted while energized.

[0049] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent structural or procedural transformations made based on the content of this utility model specification and drawings, or direct or indirect applications in other related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. A test socket for IC testing, characterized by, Include: The shell; Two movable mouth, two said movable mouth open in the two sides of the shell, the bottom of the shell wall is equipped with docking seat, the back of the docking seat is equipped with connector, the bottom of the shell wall is close to the position of four corners is fixedly connected with slide rod through support disc, the outer surface of the support disc is fixedly connected with auxiliary spring, the outer surface of the slide rod is slidably connected with movable ring, the top of four said movable ring is equipped with slide block, four said slide block is fixedly connected with movable plate, the both sides of the movable plate is fixedly connected with supporting plate, the top of the movable plate is equipped with test socket, the bottom of the test socket is equipped with plug; Support base, the support base is installed at the bottom of the shell, the top of the support base is fixedly connected with telescopic rod near both sides, the telescopic end of two said telescopic rod is equipped with connecting frame, the top of the shell is equipped with top cover, the top of the top cover is equipped with opening.

2. The test socket for IC testing according to claim 1, wherein, The both sides of the test socket is equipped with fixed block, the top of the test socket is equipped with one lug with handle, the top of the lug is equipped with one docking piece with fixed bolt on both sides.

3. The test socket for IC testing according to claim 1, wherein, The back of the connector is equipped with connecting line, the support base contains bottom plate, the bottom of the bottom plate is fixedly connected with internal thread bolt near four corners.

4. The test socket for IC testing according to claim 3, wherein, The bottom of the internal thread bolt is threadedly connected with adjusting bolt, the bottom end of the adjusting bolt is fixedly connected with contact disc.

5. The test socket for IC testing according to claim 1, wherein, The front of the shell is equipped with control box, the front of the control box is rotatably connected with box door.

6. The test socket for IC testing according to claim 1, wherein, The front of the shell is equipped with mounting base, the front of the mounting base is equipped with operation screen.

Images