Intelligent burn-in board fault inspection board card

Abstract

The utility model provides an intelligent burn-in board fault inspection board card, and the board card comprises a terminal welding region which comprises a welding point position for welding a connection terminal, and the connection terminal is used for being connected with a golden finger of a to-be-detected burn-in board; the intelligent inspection area comprises a programmable inspection chip and at least one expansion chip, the programmable inspection chip is provided with an inspection port and an expansion port, the expansion chip is provided with an expansion detection port and an expansion communication port, and the expansion communication port is connected with the expansion port. And the inspection port and the expansion detection port are connected with the welding point so as to detect the burn-in board to be detected through the welding point and the connection terminal. The programmable inspection chip can detect the to-be-detected burn-in board connected with the connecting terminal, so that automatic detection of the to-be-detected burn-in board is realized, and the detection efficiency is improved.

Description

Technical Field

[0001] This application relates to the field of component testing technology, and in particular to an intelligent inspection board for faults in old refining boards. Background Technology

[0002] The gold finger connection method of the aging board is the basis of the relatively mature component aging system in the industry. In order to ensure the efficiency and reliability of component aging tests, it is necessary to regularly inspect the gold finger faults of newly processed and serviced aging boards.

[0003] Currently, the old refining plate fault intelligent inspection instrument is used to achieve rapid detection and fault diagnosis. The old refining plate fault intelligent inspection instrument is an assembly and integration based on products on the market. It is not only large in size, but also requires an external power supply. Moreover, it can only be detected by wiring. Its detection module also has functional redundancy, resulting in low inspection efficiency for old refining plates. Utility Model Content

[0004] In view of this, the purpose of this application is to propose an intelligent inspection board for old refining plates to solve the problem of low inspection efficiency for old refining plates.

[0005] To achieve the above objectives, this application provides an intelligent inspection board for faults in old refining plates, comprising:

[0006] The terminal soldering area includes soldering points for soldering connecting terminals, which are used to connect to the gold fingers of the aging board to be tested.

[0007] The intelligent inspection area includes a programmable inspection chip and at least one expansion chip. The programmable inspection chip has an inspection port and an expansion port. The expansion chip has an expansion detection port and an expansion communication port. The expansion communication port is connected to the expansion port. Both the inspection port and the expansion detection port are connected to the welding point to detect the aging board to be inspected through the welding point and the connection terminal.

[0008] Furthermore, the welding points are provided in multiple ways, and the types of welding points include a first type and a second type. The welding points of the first type are connected to the inspection port, and the welding points of the second type are connected to the extended detection port.

[0009] Furthermore, the programmable inspection chip has multiple inspection ports, and the expansion chip has multiple expansion detection ports. Each inspection port is connected to a welding point of the first type, and each expansion detection port is connected to a welding point of the second type.

[0010] Furthermore, the terminal welding area also includes a spare point connected to the welding point. The arrangement direction of the spare point and the welding point is the same as the extension direction of the aging plate to be tested. The spare point is used to weld spare terminals, and the spare terminals are used to connect to the gold fingers.

[0011] Furthermore, the intelligent inspection board also includes a touch display connection area for connecting to the touch display screen, the touch display connection area having communication pins, the programmable inspection chip having an inspection communication port, and the inspection communication port being connected to the communication pins.

[0012] Furthermore, the intelligent inspection board also includes a serial port connection area, which includes a serial port chip. The serial port chip has a chip connection port, and the programmable inspection chip has a serial port protocol port. The chip connection port is connected to the serial port protocol port.

[0013] Furthermore, the intelligent inspection board also includes a power supply area for connecting to a power source. The power supply area has power transmission pins. The programmable inspection chip has a first power supply port, the expansion chip has a second power supply port, and the serial port chip has a third power supply port. The first power supply port, the second power supply port, and the third power supply port are all connected to the power transmission pins.

[0014] Furthermore, the intelligent inspection board also includes a power connection cable, which is connected to the power transmission pin. The first power supply port, the second power supply port, and the third power supply port are all connected to the power connection cable to be connected to the power transmission pin via the power connection cable.

[0015] Furthermore, the intelligent inspection board also includes a power reset area, which includes a reset button. The two ends of the reset button are respectively connected to the power transmission pin and the power connection line.

[0016] Furthermore, the serial port connection area has a power connection pin, which is connected to the power transmission pin to charge the power supply in the power supply area through the serial port connection area.

[0017] Furthermore, the intelligent inspection board also includes a power detection area, the programmable inspection chip has a power communication port, the input end of the power detection area is connected to the power connection line, and the output end of the power detection area is connected to the power communication port.

[0018] Based on the same inventive concept, this application also provides an intelligent inspection system for faults in old refining plates, comprising:

[0019] The upper support includes an intelligent inspection board for old refining plate faults as described in any of the preceding claims. The board is provided with a connection terminal, which is used to connect to the gold fingers of the old refining plate to be inspected. The board is used to inspect the old refining plate to be inspected.

[0020] The lower support portion is stacked on top of the upper support portion and rotatably connected. The lower support portion has a support area on the side near the upper support portion, and the support area is disposed opposite to the connecting terminal.

[0021] The upper support portion rotates away from the lower support portion until an opening is formed between the connecting terminal and the support area, so that the gold fingers of the aging plate to be tested can fit against the support area through the opening; or...

[0022] The upper support rotates toward the lower support until the connecting terminal abuts against the gold fingers of the old plate to be tested.

[0023] Furthermore, the support area is provided with a support protrusion extending toward the connection terminal, the support protrusion being used to support at least a portion of the gold fingers of the old tempering plate to be tested.

[0024] Furthermore, the lower support portion has a positioning protrusion on the side near the upper support portion, and the positioning protrusion is connected to the support area to position the gold finger located on the support area.

[0025] Based on the same inventive concept, this application also provides an intelligent inspection method for faults in old refining boards, applied to the programmable inspection chip as described in any of the preceding claims, the method comprising:

[0026] In response to the determination that a detection command has been received, the type of the old refining plate to be detected connected to the inspection port is determined;

[0027] The detection mode is determined based on the type of the old smelting plate to be detected;

[0028] The old refurbished board to be tested is tested according to the aforementioned testing mode, and the test results are generated and stored.

[0029] Furthermore, after testing the old steel plate to be tested according to the aforementioned testing mode, generating and storing the test results, the method further includes:

[0030] The detection result is sent to the touch screen so that the touch screen displays the detection result.

[0031] Based on the same inventive concept, this disclosure also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable by the processor, wherein the processor implements the method described above when executing the computer program.

[0032] Based on the same inventive concept, this disclosure also provides a non-transitory computer-readable storage medium that stores computer instructions for causing a computer to perform the method described above.

[0033] As can be seen from the above, the intelligent inspection board for aging refining board faults provided in this application includes a terminal soldering area and an intelligent inspection area. Soldering points are set in the terminal soldering area to facilitate the connection between the terminal and the terminal soldering area. The terminal is connected to the gold fingers of the aging refining board to be inspected, thus achieving the connection between the terminal soldering area and the aging refining board. A programmable inspection chip and an expansion chip are connected to each other in the intelligent inspection area, and both the programmable inspection chip and the expansion chip are connected to the soldering points. This allows the programmable inspection chip to inspect the aging refining board connected to the terminal, thereby achieving automatic inspection of the aging refining board and improving inspection efficiency. Furthermore, the soldering points, the programmable inspection chip, and the expansion chip are all integrated on the same board, reducing the redundancy of the intelligent inspection board and avoiding the complex inspection steps caused by integrating numerous structures together, further improving inspection efficiency. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a schematic diagram of the structure of the intelligent inspection board for old refining plate faults in an embodiment of this application;

[0036] Figure 2 This is a schematic diagram of the main structure of the intelligent inspection system for old refining plate faults in this application embodiment;

[0037] Figure 3 This is a rear view structural diagram of the intelligent inspection system for old refining plate faults according to an embodiment of this application;

[0038] Figure 4 This is a three-dimensional structural diagram of the intelligent inspection system for old refining plate faults according to an embodiment of this application;

[0039] Figure 5 This is a schematic diagram of the usage method of the intelligent inspection system for old refining plate faults in this application embodiment;

[0040] Figure 6 This is a schematic diagram of the process structure of the intelligent inspection method for old refining plate faults in an embodiment of this application;

[0041] Figure 7 This is a schematic diagram of the electronic device.

[0042] In the diagram: 10. Terminal soldering area; 11. Soldering point; 12. Spare point; 20. Intelligent inspection area; 21. Programmable inspection chip; 22. Expansion chip; 30. Touch screen connection area; 40. Serial port connection area; 41. Serial port chip; 42. Power connection pin; 50. Power supply area; 60. Power connection cable; 70. Power reset area; 80. Power supply detection area; 100. Upper support; 110. Connection terminal. ; 120, Connecting ear; 130, Touch screen; 200, Lower support; 210, Support area; 211, First area; 212, Second area; 220, Support protrusion; 230, Positioning protrusion; 231, First protrusion; 232, Second protrusion; 233, Third protrusion; 240, Support ear; 250, Buffer zone; 251, Buffer element; 251-1, Elastic element; 251-2, Guide post; 300, Connecting rod. Detailed Implementation

[0043] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.

[0044] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0045] As described in the background section, the current method of using an intelligent inspection instrument for old refining plates to achieve rapid detection and fault diagnosis is based on the assembly and integration of products on the market. This method is not only bulky but also requires an external power supply and can only perform detection through a wired connection. Furthermore, its detection module has functional redundancy, resulting in low inspection efficiency for old refining plates.

[0046] Based on this, this application proposes an intelligent inspection board, system and method for old refining plate faults, so as to realize fully automatic and rapid detection of old refining plate faults and automatic generation of inspection reports on a single board, which greatly improves the detection efficiency of old refining plates.

[0047] The embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0048] In some embodiments, an intelligent inspection board for faults in old refining plates, such as Figure 1 As shown, it includes:

[0049] The terminal welding area 10 includes welding points 11 for welding connecting terminals 110, which are used to connect to the gold fingers of the aging plate to be tested.

[0050] The intelligent inspection area 20 includes a programmable inspection chip 21 and at least one expansion chip 22. The programmable inspection chip 21 has an inspection port and an expansion port. The expansion chip 22 has an expansion detection port and an expansion communication port. The expansion communication port is connected to the expansion port. Both the inspection port and the expansion detection port are connected to the welding point 11 to detect the old annealing board to be inspected through the welding point 11 and the connection terminal 110.

[0051] Specifically, the gold fingers of the old refining plate to be tested are located at the same end of the old refining plate to be tested, arranged side by side with a gap, and integrally connected with the old refining plate to be tested. There are multiple gold fingers on the old refining plate to be tested. The number and arrangement of gold fingers on different types of old refining plates are different.

[0052] The welding points 11 are multiple in number and are arranged in the same way as the gold fingers on the aging plate to be tested. They are arranged side by side with equal spacing to ensure that the connecting terminals 110 welded at the welding points 11 abut against the gold fingers.

[0053] It should be noted that the intelligent inspection board is configured to detect several specific types of aged tungsten plates (the specific settings of the aged tungsten plates can be adjusted according to actual needs). The arrangement of the welding points 11 is the same as the arrangement of the gold fingers of these types of aged tungsten plates, so that the intelligent inspection board can detect these types of aged tungsten plates and improve the applicability and practicality of the intelligent inspection board.

[0054] Specifically, the programmable inspection chip 21 is the main component of the intelligent inspection board, capable of automatically performing inspections on the old refining board to be inspected. The expansion chip 22 is an expansion device of the programmable inspection chip 21, increasing the inspection ports of the programmable inspection chip 21. That is, the expansion inspection ports of the expansion chip 22 have the same function as the inspection ports of the programmable inspection chip 21, both used to connect to the gold fingers of the old refining board to be inspected, so that the programmable inspection chip 21 can connect to all the gold fingers of the old refining board to be inspected, thereby realizing the inspection of the old refining board to be inspected.

[0055] The software development of the programmable inspection chip 21 is based on the Keil programming environment and uses C language. The detection algorithm is written to automatically judge the three types of old refining boards. Different algorithm logic is designed for different types of old refining boards. At the same time, detection and judgment logic is designed so that the programmable inspection chip 21 can support the automated fault judgment and detection of three types of old refining boards: integrated circuits, three-terminal voltage regulators, and power modules. After automatically identifying the type of old refining board, the corresponding detection mode is switched to detect the old refining board.

[0056] It should be noted that one of the inspection ports is connected to one of the welding points 11, so that the programmable inspection chip 21 can determine the position of the gold finger of the old tempering board to be inspected through the inspection port, so that the programmable inspection chip 21 can mark the inspection result of each gold finger when outputting the inspection result.

[0057] In this embodiment, by setting welding points 11 in the terminal welding area 10, the connection between the terminal 110 and the terminal welding area 10 is facilitated. The terminal 110 is connected to the gold fingers of the aging board to be tested, thereby realizing the connection between the terminal welding area 10 and the aging board to be tested. By setting programmable inspection chip 21 and expansion chip 22 connected to each other in the intelligent inspection area 20, and both programmable inspection chip 21 and expansion chip 22 are connected to welding points 11, the programmable inspection chip 21 can detect the aging board to be tested connected to the terminal 110, thereby realizing automatic detection of the aging board to be tested, which is beneficial to improving detection efficiency. In addition, the welding points 11, programmable inspection chip 21 and expansion chip 22 are all integrated on the same board, which can reduce the redundancy of the intelligent inspection board and avoid the integration of many structures, which would lead to complicated detection steps, and further improve detection efficiency.

[0058] In some embodiments, there are multiple welding points 11, and the types of welding points 11 include a first type and a second type. The welding points 11 of the first type are connected to the inspection port, and the welding points 11 of the second type are connected to the extended detection port.

[0059] Specifically, both the first and second type of solder points 11 are used to connect to the connection terminal 110, and then to the gold fingers of the aging board to be tested. Dividing the solder points 11 into the first and second types allows the programmable inspection chip 21 to connect to some of the gold fingers through the inspection port, and to connect to other gold fingers through the expansion port and the expansion chip 22, increasing the number of gold fingers connected to the programmable inspection chip 21. This improves the detection redundancy of the intelligent inspection board and avoids the limitation of the number of inspection ports of the programmable inspection chip 21 on the number of types of aging boards it can detect, thus improving the practicality of the intelligent inspection board.

[0060] In some embodiments, the programmable inspection chip 21 has multiple inspection ports, the expansion chip 22 has multiple expansion detection ports, each inspection port is connected to a first type of welding point 11, and each expansion detection port is connected to a second type of welding point 11.

[0061] Specifically, each of the aforementioned solder points 11 is used to connect to the gold fingers on the aging board to be tested. Therefore, by setting each of the aforementioned solder points 11 to connect to a port (a first type of solder point 11 is connected to an inspection port, and a second type of solder point 11 is connected to an extended inspection port), the programmable inspection chip 21 can easily obtain the detection status of each of the gold fingers, thereby obtaining detection results accurate to the gold fingers. This improves the detection efficiency of the intelligent inspection board, perfects the detection results, and is conducive to improving practicality and widespread application.

[0062] It should be noted that the arrangement of the welding points 11 on the intelligent inspection board is adapted to the type of old refining plate that the intelligent inspection board can detect, so that the intelligent inspection board can detect the old refining plate.

[0063] For example, the welding points 11 have 100, with 50 located on the left side of the center of the intelligent inspection board and 50 located on the right side of the center of the intelligent inspection board.

[0064] In some embodiments, the terminal welding area 10 further includes a spare point 12 connected to the welding point 11. The arrangement direction of the spare point 12 and the welding point 11 is the same as the extension direction of the aging plate to be tested. The spare point 12 is used to weld spare terminals, and the spare terminals are used to connect to the gold fingers.

[0065] Specifically, the spare points 12 and the soldering points 11 are arranged one-to-one in the extension direction of the gold finger and connected to each other, so that the spare terminals used for soldering on them and the connecting terminals 110 soldered on the soldering points 11 are connected to the gold finger together. This ensures that the inspection port or extended detection port connected to the soldering points 11 can be connected to the gold finger, avoiding the impact of abnormal connection between the connecting terminals 110 and the gold finger on the detection of the programmable inspection chip 21 on the old board to be tested, which is beneficial to improving the reliability of the intelligent inspection board.

[0066] It should be noted that, in order to reduce the wear on the gold fingers caused by the connection between the connecting terminal 110 and the spare terminal and the gold fingers, both the connecting terminal 110 and the spare terminal are spring pins. That is, the intelligent inspection board connects to the gold fingers through the contact of the spring pins with the gold fingers, which can avoid displacement between the gold fingers and the connecting terminal 110 and the spare terminal, thereby preventing wear on the gold fingers. This helps to extend the service life of the gold fingers of the aging board to be inspected and improves the practicality of the intelligent inspection board.

[0067] In some embodiments, the intelligent inspection board further includes a touch display screen 130 connection area 30 for connecting to the touch display screen 130, the touch display screen 130 connection area 30 having communication pins, the programmable inspection chip 21 having an inspection communication port, and the inspection communication port being connected to the communication pins.

[0068] Specifically, the programmable inspection chip 21 is connected to the connection area 30 of the touch display screen 130 through the inspection communication port, thereby realizing communication with the touch display screen 130. The touch display screen 130 is the user interaction tool of the programmable inspection chip 21. Users can send detection commands to the programmable inspection chip 21 through the touch display screen 130, and can view the detection results of the programmable inspection chip 21 on the old refining board to be tested through the touch display screen 130.

[0069] In some embodiments, the intelligent inspection board further includes a serial port connection area 40, the serial port connection area 40 includes a serial port chip 41, the serial port chip 41 has a chip connection port, the programmable inspection chip 21 has a serial port protocol port, and the chip connection port is connected to the serial port protocol port.

[0070] Specifically, the serial port connection area 40 is used to connect to a serial port, which can be a TYPE-C serial port or other serial ports. Users can connect to the serial port chip 41 through the serial port, and then connect to the programmable inspection chip 21 through the chip connection port of the serial port chip 41 and the serial protocol port of the programmable inspection chip 21 to obtain the detection results stored in the programmable inspection chip 21. The setting of the serial port connection area 40 can facilitate users to obtain the detection results of the intelligent inspection board in batches, thereby enabling batch analysis and processing of the detection results, which is beneficial for the intelligent inspection board to perform batch detection of the old refining board to be tested.

[0071] In some embodiments, the intelligent inspection board further includes a power supply area 50 for connecting to a power source. The power supply area 50 has power transmission pins. The programmable inspection chip 21 has a first power supply port, the expansion chip 22 has a second power supply port, and the serial port chip 41 has a third power supply port. The first power supply port, the second power supply port, and the third power supply port are all connected to the power transmission pins.

[0072] Specifically, the power supply area 50 is used to connect to the power supply. The power transmission pins are connected to the programmable inspection chip 21, the expansion chip 22, and the serial port chip 41, so that the power supply can simultaneously supply power to the programmable inspection chip 21, the expansion chip 22, and the serial port chip 41, ensuring the normal operation of the programmable inspection chip 21, the expansion chip 22, and the serial port chip 41, and playing an operational guarantee role in the use of the intelligent inspection board.

[0073] In some embodiments, the intelligent inspection board further includes a power connection cable 60, which is connected to the power transmission pin. The first power supply port, the second power supply port, and the third power supply port are all connected to the power connection cable 60 to be connected to the power transmission pin through the power connection cable 60.

[0074] Specifically, the power connection line 60 is a conductive area that connects to the power transmission pin, which increases the number of connection points of the power transmission pin. This facilitates the connection of the power transmission pin with the programmable inspection chip 21, expansion chip 22 and serial port chip 41 located in different positions, simplifies wiring, reduces the area of ​​the intelligent inspection board, and realizes the integrated setup of the intelligent inspection board.

[0075] In some embodiments, the intelligent inspection board further includes a power reset area 70, which includes a reset button. The two ends of the reset button are respectively connected to the power transmission pin and the power connection line 60.

[0076] Specifically, the reset button connects the power transmission pin and the power connection line 60. When the reset button is on, the power transmission pin is connected to the power connection line 60. When the reset button is off, the power transmission pin is disconnected from the power connection line 60. Correspondingly, the programmable inspection chip 21, the expansion chip 22, and the serial port chip 41 are all disconnected from the power supply and are in an inoperable state. The reset button is used to start or stop the intelligent inspection board and is a switching device. When the intelligent inspection board is in use, the reset button is on; when the intelligent inspection board is idle, the reset button is off.

[0077] In some embodiments, the serial port connection area 40 has a power connection pin 42, which is connected to the power transmission pin to charge the power supply on the power supply area 50 through the serial port connection area 40.

[0078] Specifically, the power connection pin 42 enables the serial port connected to the serial port connection area 40 to charge the power supply on the power supply area 50, ensuring the effectiveness of the power supply. Furthermore, the power connection pin 42 also enables the intelligent inspection board to operate without the power supply, connecting to an external power source through the serial port to power the programmable inspection chip 21, expansion chip 22, and serial port chip 41, ensuring the normal operation of the intelligent inspection board.

[0079] In some embodiments, the intelligent inspection board further includes a power detection area 80, the programmable inspection chip 21 has a power communication port, the input end of the power detection area 80 is connected to the power connection line 60, and the output end of the power detection area 80 is connected to the power communication port.

[0080] Specifically, the power detection area 80 is equipped with a power identification circuit, whose input end is connected to the power connection line 60 and whose output end is connected to the power communication port, so as to send the measured power level to the programmable inspection chip 21. The programmable inspection chip 21 sends the received power level to the touch screen 130 for display, so that the user can understand the power level and avoid the normal operation of the intelligent inspection board due to insufficient power.

[0081] In addition, when the programmable inspection chip 21 has the function of detecting power supply level, the power circuit detection area serves to connect the power connection line 60 to the power communication port of the programmable inspection chip 21 so as to obtain the power supply level itself.

[0082] Based on the same inventive concept, this application also provides an intelligent inspection system for faults in old refining plates, such as... Figure 2 As shown, it includes:

[0083] The upper support 100 includes an intelligent inspection board for old refining plate faults as described in any of the preceding claims. The board is provided with a connection terminal 110, which is used to connect to the gold fingers of the old refining plate to be inspected. The board is used to inspect the old refining plate to be inspected.

[0084] The lower support portion 200 is stacked on top of the upper support portion 100 and rotatably connected. The lower support portion 200 has a support area 210 on the side near the upper support portion 100. The support area 210 is disposed opposite to the connecting terminal 110.

[0085] The upper support portion 100 rotates away from the lower support portion 200 until an opening is formed between the connecting terminal 110 and the support area 210, so that the gold fingers of the refurbished plate to be tested fit against the support area 210 through the opening; or,

[0086] The upper support 100 rotates toward the lower support 200 until the connecting terminal 110 abuts against the gold fingers of the old plate to be tested.

[0087] Specifically, the board is located on the upper support portion 100 and moves with the upper support portion 100, thereby causing the connecting terminal 110 to move away from or closer to the lower support portion 200. This ensures that the gold fingers of the aging plate to be tested are located between the connecting terminal 110 and the support area 210, and connected to the connecting terminal 110. This prevents the gold fingers of the aging plate to be tested from being connected to the connecting terminal 110 through plug-in, which would cause wear on the gold fingers, affecting the connection effect with the connecting terminal 110 and the service life of the gold fingers.

[0088] The connecting terminal 110 protrudes relative to the board and the upper support 100 to shorten the distance between it and the gold fingers of the old tempering board to be tested, so as to achieve a tight contact between the two and improve the connection stability between the connecting terminal 110 and the gold fingers.

[0089] It should be noted that the board includes a microcontroller, which can automatically detect the old refurbished board to be tested based on preset software. The board enables intelligent inspection of the old refurbished board to be tested, which can greatly improve the detection efficiency.

[0090] In addition, in the arrangement direction of the gold fingers of the old refining plate to be inspected, there are multiple connecting terminals 110. The gap between two adjacent connecting terminals 110 is the same as the gap between two adjacent gold fingers, so as to ensure that each gold finger is connected to a connecting terminal 110 and that each gold finger can be detected, which is beneficial to improving the detection accuracy and practicality of the intelligent inspection system.

[0091] For example, in the arrangement direction of the gold fingers of the old refining plate to be tested, there are 100 connecting terminals 110 and 100 gold fingers of the old refining plate to be tested, which are in one-to-one contact with the connecting terminals 110, so that the board can detect each gold finger of the old refining plate to be tested.

[0092] Furthermore, in the extension direction of the gold fingers of the old refurbished plate to be tested, there are two or more connecting terminals 110. These two or more connecting terminals 110 are connected to ensure that the board can be connected to the gold fingers through the connecting terminals 110, so as to avoid the connection between the connecting terminals 110 and the gold fingers being affected by the length of the gold fingers, thereby affecting the board's detection of the old refurbished plate to be tested.

[0093] For example, the connection terminals 110 are arranged in two rows in the extension direction of the gold finger, and 100 of them are arranged in the step direction of the gold finger. Two opposite connection terminals 110 in the extension direction of the gold finger are connected to each other to form 100 pairs of connection terminals 110, and each pair of connection terminals 110 is connected to one of the gold fingers.

[0094] In this embodiment, the intelligent inspection system includes an upper support portion 100 and a lower support portion 200 rotatably connected. The upper support portion 100 is equipped with a board, and the board's connection terminal 110 is used to connect to the gold fingers of the aged steel plate to be inspected, enabling the board to inspect the plate. The lower support portion 200 is equipped with a support area 210 to support the gold fingers of the aged steel plate to be inspected. This ensures that the gold fingers stably abut against the connection terminal 110 under the combined action of the upper support portion 100 and the support area 210, facilitating the board's inspection of the aged steel plate and improving the inspection stability and practicality of the intelligent inspection system. Furthermore, the upper support portion... The rotatable connection between the 100 and the lower support 200 allows the spacing between the connecting terminal 110 and the support area 210 to be adjustable. This facilitates the contact and release of the gold fingers of the aging board under test with the connecting terminal 110 without causing wear on the gold fingers, thus extending the service life of the gold fingers of the aging board under test and improving the practicality of the intelligent inspection system. Finally, the aging board under test is used to connect with multiple electronic components. The board connects to multiple electronic components on the aging board under test through the gold fingers of the aging board under test, thereby performing aging tests on these multiple electronic components, realizing intelligent inspection of multiple electronic components, and improving inspection efficiency.

[0095] In some embodiments, such as Figure 2 As shown, the support area 210 is provided with a support protrusion 220 extending toward the connection terminal 110, the support protrusion 220 being used to support at least a portion of the gold fingers of the old refining plate to be tested.

[0096] Specifically, the support protrusion 220 is used to shorten the distance between the support area 210 and the connection terminal 110, thereby enhancing the contact between the gold fingers and the connection terminal 110. This helps to improve the connection stability between the connection terminal 110 and the gold fingers of the old refining plate to be tested, and thus improves the connection stability between the intelligent inspection system and the old refining plate to be tested. On this basis, it can further improve the detection efficiency of the intelligent inspection system, thereby enhancing the practicality of the intelligent inspection system.

[0097] The gold fingers and the aging board to be inspected are integrally connected and are plate-shaped structures (PCB boards) with a certain strength. The support protrusion 220 is provided in the support area 210, and the area of ​​the support protrusion 220 on the support area 210 is smaller than that of the support area 210. Some of the gold fingers are located on the support protrusion 220, while the other gold fingers are suspended. Under the support and driving action of the support protrusion and some of the gold fingers, they abut against the connecting terminal, which can keep them flat. This can prevent all the gold fingers of the aging board to be inspected from being located on the surface of the support area 210. Because the surface of the support area 210 is uneven, it will affect the contact between the connecting terminal 110 and the gold fingers of the aging board to be inspected, and thus affect the inspection of the aging board to be inspected by the intelligent inspection system. Furthermore, this setting can also reduce the requirements for the surface flatness of the support area, which is beneficial to reducing production costs, and does not affect the contact between the aging board to be inspected and the connecting terminal 110.

[0098] Some of the gold fingers on the aging plate to be tested are located on the support protrusion 220. Under the support of the support protrusion 220, they abut against the connection terminal 110. Due to the plate-like structure of the gold fingers, the remaining gold fingers that are not in contact with the support protrusion 220 can also be positioned close to the connection terminal 110 along with the gold fingers located on the support protrusion 220 to abut against the connection terminal 110. The support protrusion 220 does not need to correspond to all the connection terminals to drive all the gold fingers to abut against the connection terminal 110. Furthermore, some of the gold fingers are suspended and abut against the connection terminal 110, which can disperse the abutting force applied by the connection terminal 110 to the gold fingers. This avoids the gold fingers of the aging plate to be tested from cracking with the aging plate under the abutting force of multiple connection terminals, affecting the normal use of the aging plate to be tested, and thus preventing the intelligent inspection system from damaging the aging plate to be tested, which is beneficial to improving the practicality of the intelligent inspection system.

[0099] In some embodiments, the support protrusion 220 is provided with a buffer layer on the side near the upper support portion 100.

[0100] Specifically, the side of the support protrusion 220 near the upper support portion 100 is the side used to support the gold finger of the old refining plate to be inspected. The buffer layer is provided on it, which can buffer the contact between the connecting terminal 110 and the gold finger, thereby reducing the force of the connecting terminal 110 on the gold finger, preventing the gold finger from deforming or wearing under the contact of the connecting terminal 110, improving the service life of the gold finger, and enhancing the practicality of the intelligent inspection system.

[0101] For example, the connecting terminal 110 is a spring pin. The buffer layer is provided so that the spring pin abuts against the buffer layer, or the gold finger abuts against the buffer layer. This can buffer the elastic force of the spring pin, preventing the spring pin from losing its elasticity or its elastic force from decreasing, which would affect the abutment between the spring pin and the gold finger. The buffer layer helps to improve the service life of the spring pin.

[0102] In some embodiments, such as Figure 2 As shown, the lower support portion 200 has a positioning protrusion 230 on the side near the upper support portion 100. The positioning protrusion 230 is connected to the support area 210 to position the gold finger located on the support area 210.

[0103] Specifically, the positioning protrusion 230 is used to distinguish the support area 210, so that the gold fingers of the old refining plate to be tested can be promptly identified under the action of the positioning protrusion 230, which facilitates the rapid installation of the old refining plate to be tested on the intelligent inspection system.

[0104] In addition, the positioning protrusion 230 can also limit the gold fingers of the old refining plate to be tested, preventing them from moving on the lower support 200 under the action of external force, which would cause the connection between the old refining plate to be tested and the connection terminal 110 to be unstable. This helps to improve the connection stability between the detection terminal and the gold fingers, thereby improving the detection reliability and practicality of the intelligent inspection system.

[0105] In some embodiments, such as Figure 2 As shown, the support area 210 includes a first area 211 and a second area 212 with a gap between them. The positioning protrusion 230 includes a first protrusion 231, a second protrusion 232 and a third protrusion 233. The first protrusion 231 is connected to the side of the first area 211 away from the second area 212. The second protrusion 232 is located between the first area 211 and the second area 212 and is connected to the first area 211 and the second area 212. The third protrusion 233 is connected to the side of the second area 212 away from the first area 211.

[0106] Specifically, the gold fingers of some of the aged steel plates to be tested are not equidistantly spaced, but rather comprise two regions, each containing multiple gold fingers spaced apart. Based on this, the support area 210 is configured as a first region 211 and a second region 212 spaced apart. The first region 211 is adapted to the width of the gold fingers in one region of the aged steel plate to be tested, and the second region 212 is adapted to the width of the gold fingers in another region of the aged steel plate to be tested, in order to support all the gold fingers of the aged steel plate to be tested. Correspondingly, the connecting terminal 110 is also located in two regions and is respectively configured to correspond to the first region 211 and the second region 212, in order to ensure the connection between the connecting terminal 110 and the gold fingers.

[0107] Based on this, the positioning protrusion 230 includes a first protrusion 231, a second protrusion 232 and a third protrusion 233, so as to clearly distinguish the first area 211 and the second area 212 of the support area 210, so as to facilitate the quick setting of the gold fingers of the old plate to be tested on the support area 210, and also to ensure the connection between the gold fingers and the connecting terminal 110, thereby achieving the technical effect of quick positioning and quick installation.

[0108] In some embodiments, such as Figure 2 As shown, the board has a first connection area and a second connection area. Multiple connection terminals 110 are provided and located on the first connection area and the second connection area. The first connection area is opposite to the first area 211, and the second connection area is opposite to the second area 212.

[0109] Specifically, both the first connection area and the second connection area are provided with a plurality of connection terminals 110. The connection terminals 110 on the first connection area are used to abut against the gold fingers located on the first area 211, and the connection terminals 110 on the second connection area are used to abut against the gold fingers located on the second area 212.

[0110] For example, the first connection area and the second connection area are of the same size, and each is provided with 50 connection terminals 110 for contacting 50 gold fingers.

[0111] In addition, 50 pairs of connection terminals 110 can be provided on the first connection area and the second connection area, that is, two connection terminals 110 are provided in the extension direction of one of the gold fingers. The two connection terminals 110 in this direction are used to abut against one of the gold fingers to enhance the connection performance between the connection terminals 110 and the gold fingers.

[0112] In some embodiments, such as Figure 3As shown, the upper support portion 100 is provided with a connecting ear 120 on the side near the lower support portion 200, and the lower support portion 200 is provided with a support ear 240 on the side near the upper support portion 100. The connecting rod 300 is provided through the connecting ear 120 and the support ear 240 so that the lower support portion 200 and the upper support portion 100 are rotatably connected.

[0113] Specifically, the upper support portion 100 and the lower support portion 200 are rotatably connected by the connecting ear 120 and the supporting ear 240 through the connecting rod 300. The relative arrangement of the connecting ear 120 and the supporting ear 240 ensures that the upper support portion 100 and the lower support portion 200 are stacked and relative to each other, so that the connecting terminal 110 abuts against the gold finger. It also allows the upper support portion 100 to rotate relative to the lower support portion 200 so that the gold finger of the old plate to be inspected can enter the support area 210, thereby improving the practicality of the intelligent inspection system.

[0114] It should be noted that the upper support portion 100 and the lower support portion 200 are spaced apart under the action of the connecting ear 120 and the support ear 240, which is beneficial to the stability of the upper support portion 100 and the lower support portion 200.

[0115] In addition, both the support ear 240 and the connecting ear 120 are provided in multiple quantities to further enhance the connection stability of the upper support portion 100 and the lower support portion 200.

[0116] For example, there are 3 connecting ears 120, and adjacent connecting ears 120 are equidistantly arranged. There are 6 supporting ears 240, which are arranged in pairs to form 3 support groups. Each support group corresponds to one connecting ear 120. The connecting ear 120 is located between two supporting ears 240 in a support group, and the distance between the two supporting ears 240 is adapted to the width of the connecting ear 120 to limit the connecting ear 120 and prevent it from sliding on the connecting rod 300. This helps to further enhance the connection stability of the upper support part 100 and the lower support part 200. In addition, the fact that two supporting ears 240 correspond to one connecting ear 120 can enhance the support strength of the supporting ears 240 for the connecting ear 120, ensure the service life of the supporting ears 240, and thus ensure the service life of the intelligent inspection system.

[0117] In some embodiments, such as Figure 3As shown, the lower support portion 200 is provided with a buffer zone 250 on the side near the upper support portion 100. The buffer zone 250 is provided with a plurality of buffer members 251, which are arranged facing the upper support portion 100. The connecting rod 300 is located between the buffer zone 250 and the support area 210.

[0118] When the upper support portion 100 rotates relative to the lower support portion 200 to be close to the buffer member 251, the buffer member 251 is used to buffer the force between the upper support portion 100 and the lower support portion 200.

[0119] Specifically, the upper support 100 rotates around the connecting rod 300. The support area 210 and the buffer zone 250 are located on both sides of the connecting rod 300. When the upper support 100 rotates until the connecting terminal 110 on it moves away from the support area 210, the upper support 100 moves closer to the buffer zone 250. Multiple buffers 251 provided on the buffer zone 250 are used to buffer the force exerted when the upper support 100 moves closer to the buffer zone 250, thereby preventing the upper support 100 from exerting an impact force on the buffer zone 250 when it moves closer to the buffer zone 250, which would damage both the upper support 100 and the buffer zone 250 and affect the service life of the intelligent inspection system. The provision of the buffers 251 helps to enhance the service life of the intelligent inspection system.

[0120] It should be noted that the buffer 251 is evenly arranged along the length of the connecting rod 300 so that the buffer 251 can apply a uniform buffering force to the upper support 100, thereby avoiding the impact on the service life of the intelligent inspection system due to uneven buffering.

[0121] In some embodiments, such as Figure 3 As shown, the buffer 251 includes an elastic member 251-1 and a guide post 251-2 that are sleeved and connected. One end of the elastic member 251-1 is connected to the lower support part 200, and the other end is connected to the upper support part 100. The guide post 251-2 is located on the lower support part 200.

[0122] Specifically, the guide post 251-2 is located on the buffer zone 250 and is positioned towards the upper support portion 100. The elastic element 251-1 is sleeved around the guide post 251-2 to achieve elastic expansion and contraction under the action of the guide post 251-2, thereby preventing the elastic element 251-1 from deforming under the action of external force and failing to perform the buffering function.

[0123] In addition, the upper support portion 100 can maintain a stacked and opposite arrangement with the lower support portion 200 under the rebound action of the elastic member 251-1, which is conducive to the stable contact between the connecting terminal 110 and the gold finger of the old plate to be tested. Under the action of external force, the upper support portion 100 applies a compressive force to the elastic member 251-1 to move closer to the buffer zone 250, so that an opening appears between the connecting terminal 110 and the support area 210, which facilitates the gold finger to enter into the support area 210 or move away from the support area 210.

[0124] In some embodiments, such as Figure 4 As shown, the upper support portion 100 also includes a touch display screen 130, which is located on the side of the upper support portion 100 away from the lower support portion 200 and is electrically connected to the board. It is used to send detection commands to the board and display the detection results of the board on the old refurbished board to be tested.

[0125] Specifically, the touch screen 130 is a user interaction device. The user sends a detection command to the board through the touch screen 130, and the board sends its detection result to the touch screen 130 for display so that the user can view the detection result. The touch screen 130 is located on the side of the upper support 100 away from the lower support 200, which facilitates interaction with the user and improves the practicality of the intelligent inspection system.

[0126] For example, the touch display 130 is a 3.7-inch smart electronic touch screen with a resolution of 960x240, high screen contrast, low power consumption, wide viewing angle, and support for Chinese display.

[0127] Based on the same inventive concept, this application also provides a method for applying the above-mentioned intelligent inspection system for old refining plates faults, such as... Figure 5 As shown, it includes:

[0128] Step S100: Rotate the upper support portion 100 so that the connecting terminal 110 moves away from the lower support portion 200;

[0129] Specifically, when using the intelligent inspection system to inspect the old smelting plate, the user first places the gold fingers of the old smelting plate on the support area 210 of the lower support 200. In order to avoid relative displacement between the connecting terminal 110 and the gold fingers, which could damage the gold fingers, the upper support 100 is rotated so that the connecting terminal 110 moves away from the lower support 200. That is, an opening is created between the connecting terminal 110 and the support area 210 so that the gold fingers of the old smelting plate can enter the support area 210.

[0130] Step S200: Place the gold fingers of the old refurbished plate to be tested on the support area 210, and rotate the upper support part 100 so that the connecting terminal 110 abuts against the gold fingers of the old refurbished plate to be tested.

[0131] Specifically, after the upper support portion 100 is rotated to create a larger opening between the connecting terminal 110 and the support area 210, the gold fingers of the old refining plate to be tested can be placed on the support area 210 through this opening. Then, the upper support portion 100 is rotated so that the upper support portion 100 is opposite to the lower support portion 200, so that the connecting terminal 110 abuts against the gold fingers on the support area 210, thereby realizing the connection between the board and the old refining plate to be tested.

[0132] Step S300: Start the board to test the old refurbished board to be tested.

[0133] Specifically, after the old smelting board to be tested is installed on the intelligent inspection system, the board is activated to test the old smelting board.

[0134] For example, the board is connected to a start button, which is located on the upper support 100 or the lower support 200. The user can start the board by pressing the start button, so that the board can test the old refurbished board to be tested.

[0135] In this embodiment, the upper support portion 100 and the lower support portion 200 can support the aging plate to be tested, so that the aging plate to be tested can be connected to the connection terminal 110 of the board, so that the board can test the aging plate to be tested. The aging plate to be tested is provided with multiple components to be tested. The board can realize the inspection of multiple components to be tested, which is beneficial to improving the testing efficiency. At the same time, the intelligent inspection system has a small structure, is easy to place and has low redundancy, is easy for users to operate, and is conducive to the promotion and application of the intelligent inspection system.

[0136] In some embodiments, step S300: activating the board to detect the aged board to be tested includes:

[0137] Step S301: Send a detection command to the board through the touch display screen 130;

[0138] Specifically, the touch screen 130 is equipped with a virtual start button. Users can send a detection command to the board by pressing the virtual start button on the touch screen 130, so that the board can detect the old refining board to be tested.

[0139] Step S302: When the board receives the detection command, it determines the type of the old refining board to be detected.

[0140] Specifically, after receiving the detection command, the board first determines the type of the old refining board to be detected that it is connected to.

[0141] For example, the board determines the type of the old refining board to be tested by judging the effective number and position of the gold fingers connected to the detection terminal, that is, the number and position of the connected gold fingers.

[0142] Step S303: The board performs detection on the old refurbished board to be detected based on the type of the old refurbished board to be detected, obtains the detection result, and sends it to the touch display screen 130;

[0143] Specifically, after determining the type of the old refining board to be tested, the board performs tests on the old refining board according to the detection module corresponding to that type to determine whether there are any abnormalities in the circuit on the old refining board to be tested.

[0144] For example, the aging board to be tested has 5 valid gold fingers. The board outputs a high-level signal to the connection terminal 110 where the 5 gold fingers abut, and then outputs a low-level signal to the connection terminal 110 where one of the gold fingers is connected. Then, the signals of the other connection terminals 110 except the connection terminal 110 that outputs the low-level signal are detected in turn to obtain the electrical signal detection result. If a low-level signal is detected, it is determined that the gold finger abutting the connection terminal 110 is in a conducting state; otherwise, it is in an open-circuit state. According to the type of the aging board to be tested, its corresponding pre-stored on / off rule is determined. The on / off rule is compared with the detection result. If they are consistent, the aging board to be tested is determined to be normal. If they are inconsistent, the aging board to be tested is determined to be abnormal. The inconsistent connection terminal 110 is recorded and stored to obtain the detection result of the aging board to be tested. Then, it is stored and sent to the touch display screen 130.

[0145] In step S304, the touch display screen 130 receives and displays the detection result.

[0146] Specifically, the touch display screen 130 displays the detection results of the old refining board to be detected for the user to view, thereby enabling interaction with the user.

[0147] In this embodiment, the board is controlled to perform detection through the touch screen 130, and the detection results of the board are viewed through the touch screen 130. This improves the ease of use of the intelligent inspection system and enables quick interaction with the user. It also avoids connecting the board to the host computer, thus enhancing the practicality of the intelligent inspection system.

[0148] Based on the same inventive concept, this application also provides an intelligent inspection method for faults in an old refining board, applied to the programmable inspection chip described in any of the preceding claims, such as... Figure 6 As shown, the method includes:

[0149] Step S100': In response to determining that a detection command has been received, the type of the old refining plate to be detected connected to the inspection port is determined;

[0150] Specifically, after receiving the detection command sent by the touch display screen 130, the programmable inspection chip 21 performs the old refining board type determination work. The programmable inspection chip 21 determines the type of the old refining board to be detected by judging the number of valid gold fingers of the old refining board to be detected connected to it.

[0151] For example, the programmable inspection chip 21 sequentially sends a high-level signal to the connection terminal 110 and detects signals from other connection terminals 110. If a signal can be detected on other connection terminals 110, the gold finger connected to the connection terminal 110 that sent the high-level signal is determined to be a valid gold finger. If no signal can be detected on other connection terminals 110, the gold finger connected to the connection terminal 110 that sent the high-level signal is determined to be an invalid gold finger.

[0152] Step S200': Determine the detection mode based on the type of the old smelting plate to be detected;

[0153] Specifically, after determining the type of the old refining board to be tested, the programmable inspection chip 21 determines the detection mode applicable to that type of old refining board, so as to perform detection for that type, which is beneficial to the detection accuracy of the programmable inspection chip 21.

[0154] Step S300': Detect the old refurbished plate to be tested according to the detection mode, generate the detection result and store it.

[0155] Specifically, the programmable inspection chip 21 calls the normal inspection conditions applicable to the old refining board to be inspected based on the detection mode. After inspecting the old refining board to be inspected, the detection conditions for each gold finger are compared with the normal inspection conditions. If the comparison is consistent, the gold finger is determined to be normal. If the comparison is inconsistent, the gold finger is determined to be abnormal. After the comparison is completed, the results are merged to form the detection results of the old refining board to be inspected and stored.

[0156] In this embodiment, the programmable inspection chip 21 can perform type detection on the old refining board connected to it, and generate corresponding detection results based on the type of the old refining board, thereby realizing automatic detection of different types of old refining boards and greatly improving detection efficiency.

[0157] In some embodiments, after step S300': the old steel plate to be tested is tested according to the detection mode, the test result is generated and stored, the method further includes:

[0158] Step S400': Send the detection result to the touch screen 130 so that the touch screen 130 displays the detection result.

[0159] Specifically, after generating the detection result, the programmable inspection chip 21 not only stores it but also sends it to the touch screen 130 for display, allowing the user to view the detection result instantly. This is convenient for the user and greatly enhances the practicality of the intelligent inspection board.

[0160] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the task. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the method described.

[0161] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0162] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the inspection method described in any of the above embodiments.

[0163] Figure 7 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.

[0164] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.

[0165] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is called and executed by the processor 1010.

[0166] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.

[0167] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).

[0168] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.

[0169] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.

[0170] The electronic devices described above are used to implement the corresponding inspection methods in any of the foregoing embodiments and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0171] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium that stores computer instructions for causing the computer to execute the inspection method as described in any of the above embodiments.

[0172] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.

[0173] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute the inspection method as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0174] Based on the same concept, corresponding to any of the above embodiments, this application also provides a computer program product, including computer program instructions, which, when run on a computer, cause the computer to perform the method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.

[0175] It is understood that before using the technical solutions of the various embodiments in this disclosure, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.

[0176] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations of this disclosed technical solution.

[0177] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.

[0178] It is understood that the above notification and user authorization process are merely illustrative and do not constitute a limitation on the implementation of this disclosure. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.

[0179] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in detail for the sake of brevity.

[0180] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.

[0181] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.

[0182] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the claims of this application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.

Claims

1. A smart inspection board for faults in old refining plates, characterized in that, include: The terminal soldering area includes soldering points for soldering connecting terminals, which are used to connect to the gold fingers of the aging board to be tested. The intelligent inspection area includes a programmable inspection chip and at least one expansion chip. The programmable inspection chip has an inspection port and an expansion port. The expansion chip has an expansion detection port and an expansion communication port. The expansion communication port is connected to the expansion port. Both the inspection port and the expansion detection port are connected to the welding point to detect the aging board to be inspected through the welding point and the connection terminal.

2. The intelligent inspection board for old refining plate faults according to claim 1, characterized in that, The welding points are provided in multiple ways, and the types of welding points include a first type and a second type. The welding points of the first type are connected to the inspection port, and the welding points of the second type are connected to the extended detection port.

3. The intelligent inspection board for old refining plate faults according to claim 2, characterized in that, The programmable inspection chip has multiple inspection ports, and the expansion chip has multiple expansion detection ports. Each inspection port is connected to a welding point of the first type, and each expansion detection port is connected to a welding point of the second type.

4. The intelligent inspection board for old refining plate faults according to claim 1, characterized in that, The terminal welding area also includes a spare point connected to the welding point. The arrangement direction of the spare point and the welding point is the same as the extension direction of the aging plate to be tested. The spare point is used to weld spare terminals, and the spare terminals are used to connect to the gold fingers.

5. The intelligent inspection board for old refining plate faults according to claim 1, characterized in that, It also includes a touch display connection area for connecting to the touch display screen, the touch display connection area having communication pins, the programmable inspection chip having an inspection communication port, and the inspection communication port being connected to the communication pins.

6. The intelligent inspection board for old refining plate faults according to claim 1, characterized in that, It also includes a serial port connection area, which includes a serial port chip. The serial port chip has a chip connection port, and the programmable inspection chip has a serial port protocol port. The chip connection port is connected to the serial port protocol port.

7. The intelligent inspection board for old refining plate faults according to claim 6, characterized in that, It also includes a power supply area for connecting to a power source, the power supply area having power transmission pins, the programmable inspection chip having a first power supply port, the expansion chip having a second power supply port, and the serial port chip having a third power supply port, the first power supply port, the second power supply port, and the third power supply port being connected to the power transmission pins.

8. The intelligent inspection board for old refining plate faults according to claim 7, characterized in that, It also includes a power connection cable, which is connected to the power transmission pin. The first power supply port, the second power supply port, and the third power supply port are all connected to the power connection cable to be connected to the power transmission pin through the power connection cable.

9. The intelligent inspection board for old refining plate faults according to claim 8, characterized in that, It also includes a power reset area, which includes a reset button. The two ends of the reset button are respectively connected to the power transmission pin and the power connection line.

10. The intelligent inspection board for old refining plate faults according to claim 7, characterized in that, The serial port connection area has a power connection pin, which is connected to the power transmission pin to charge the power supply in the power area through the serial port connection area.

11. The intelligent inspection board for old refining plate faults according to claim 8, characterized in that, It also includes a power detection area. The programmable inspection chip has a power communication port. The input end of the power detection area is connected to the power connection line, and the output end of the power detection area is connected to the power communication port.

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