An FPC electrical testing fixture

Abstract

This application relates to the field of flexible printed circuit boards (FPCs), and more particularly to an FPC electrical testing fixture, which includes a worktable, a lower mold, an upper mold, and a spring-loaded probe assembly. The lower mold is disposed on the worktable, and the worktable is provided with a mounting bracket located above the lower mold. The upper mold is vertically slidably connected to the mounting bracket and has a plurality of test probes. The spring-loaded probe assembly includes probes and an elastic element. A plurality of probes are disposed and slidably connected to the upper mold in a vertical direction. The first elastic element forces the probes to slide downwards so that the lower end face of the probe is lower than the lower end face of the test pin. The positions of the plurality of probes correspond to the edge positions of the flexible printed circuit board mounted on the lower mold. This application has the effect of reducing the possibility of missed tests.

Description

Technical Field

[0001] This application relates to the field of flexible circuit boards, and more particularly to an FPC electrical testing fixture. Background Technology

[0002] Flexible printed circuit boards (FPCs) are widely used in electronic products due to their lightweight and bendable characteristics. Electrical parameter testing is a crucial step in ensuring product quality during FPC production. Currently, the industry primarily uses electrical testing fixtures to perform electrical performance testing on FPCs. Existing technologies mainly employ two methods for FPC electrical testing: one is to directly contact the FPC test points with a fixed probe array. This method is fast but cannot effectively identify whether all test points are covered; the other is to install a vision inspection system on the test fixture, using a camera to capture the contact status of the test points. While this method reduces missed tests, it is costly and has lower testing efficiency. Utility Model Content

[0003] To reduce the possibility of missed tests, this application provides an FPC electrical testing fixture.

[0004] This application provides an FPC electrical testing fixture, which adopts the following technical solution:

[0005] An FPC electrical testing fixture includes a worktable, a lower mold, an upper mold, and a spring-loaded probe assembly. The lower mold is disposed on the worktable, and the worktable is provided with a mounting frame located above the lower mold. The upper mold is vertically slidably connected to the mounting frame and is provided with a plurality of test probes. The spring-loaded probe assembly includes probes and a first elastic element. A plurality of probes are provided, and the probes are vertically slidably connected to the upper mold. The first elastic element forces the probes to slide downwards so that the lower end face of the probe is lower than the lower end face of the test probe. The positions of the plurality of probes correspond to the positions of the edges of the flexible circuit board mounted on the lower mold.

[0006] By adopting the above technical solution, the upper mold moves downward so that the test probe abuts against the flexible circuit board on the lower mold, thereby testing the flexible circuit board. Since the upper mold is equipped with a probe, the first elastic element forces the probe to slide downward so that the lower end face of the probe is lower than the lower end face of the test probe. When the upper mold moves downward, the probe first abuts against the flexible circuit board. When the test probe abuts against the flexible circuit board, the probe forms an imprint on the flexible circuit board as a mark of test coverage, thereby reducing the possibility of missed tests.

[0007] Optionally, the lower mold is provided with a plurality of positioning pins.

[0008] By adopting the above technical solution, a positioning pin is provided, which is then fixed onto the flexible circuit board to achieve the positioning and installation of the flexible circuit board.

[0009] Optionally, the upper mold is provided with a sliding plate, which slides vertically and is connected to the upper mold. The sliding plate is provided with a plurality of probes, each corresponding to a plurality of probes. The probes are disposed on the sliding plate. The first elastic element is a spring, one end of which is connected to the upper mold and the other end of which is connected to the sliding plate.

[0010] By adopting the above technical solution, several sliding plates and springs are provided, so that several probes are relatively independent and do not affect each other.

[0011] Optionally, a mounting platform is detachably connected above the lower mold, and the positioning pin is mounted on the mounting platform.

[0012] By adopting the above technical solution, a mounting platform is provided, and positioning pins are set on the mounting platform, so that different flexible circuit boards can be tested by changing different mounting platforms.

[0013] Optionally, the upper surface of the lower mold is provided with an installation groove, the mounting platform is slidably engaged in the installation groove, and the lower mold is provided with a limiting component, which is located at the opening of the installation groove to limit the mounting platform.

[0014] By adopting the above technical solution, when installing the mounting platform, the mounting platform is locked in the mounting slot, thereby...

[0015] Optionally, the limiting component includes a rotating rod, a blocking plate, and a second elastic element. The blocking plate is rotatably connected to the lower mold via the rotating rod, and the second elastic element forces the blocking plate to rotate to a position that prevents the mounting platform from disengaging from the mounting groove.

[0016] By adopting the above technical solution, the mounting platform is blocked by the baffle plate, so that the mounting platform is installed in the mounting groove. When it is necessary to remove the mounting platform, the baffle plate is rotated so that the baffle plate rotates to a position that does not hinder the sliding of the mounting platform.

[0017] Optionally, the second elastic element is a torsion spring, the upper surface of the upper mold is provided with a rotating groove, the rotating rod is rotatably connected to the bottom wall of the rotating groove, the torsion spring is coaxially arranged in the rotating groove, one end of the torsion spring is connected to the blocking plate, and the other end of the torsion spring is connected to the bottom wall of the rotating groove.

[0018] In summary, this application includes at least one of the following beneficial technical effects:

[0019] 1. The upper mold moves downward so that the test probe abuts against the flexible circuit board on the lower mold, thereby testing the flexible circuit board. Since the upper mold is equipped with a probe, the first elastic element forces the probe to slide downward so that the lower end face of the probe is lower than the lower end face of the test probe. When the upper mold moves downward, the probe first abuts against the flexible circuit board. When the test probe abuts against the flexible circuit board, the probe forms an imprint on the flexible circuit board as a mark of test coverage, thereby reducing the possibility of missed tests.

[0020] 2. The mounting platform is blocked by a baffle plate, so that the mounting platform is installed in the mounting groove. When it is necessary to remove the mounting platform, the baffle plate is rotated to a position that does not obstruct the sliding of the mounting platform. Attached Figure Description

[0021] Figure 1 This is a structural schematic diagram of Example 1;

[0022] Figure 2 This is a schematic diagram of the spring pressure probe in Example 1;

[0023] Figure 3 This is a schematic diagram of the lower mold in Example 2.

[0024] Explanation of reference numerals in the attached drawings: 1. Worktable; 2. Mounting bracket; 21. Drive component; 3. Lower mold; 31. Positioning pin; 32. Mounting platform; 33. Limiting assembly; 331. Blocking plate; 332. Rotating rod; 333. Torsion spring; 34. Rotating groove; 35. Mounting groove; 4. Upper mold; 41. Test pin; 42. Spring pressure probe assembly; 421. Probe; 422. Spring; 43. First sliding groove; 44. Sliding plate. Detailed Implementation

[0025] The following is in conjunction with the appendix Figure 1-3 This application will be described in further detail.

[0026] Example 1:

[0027] This embodiment discloses an FPC electrical testing fixture, referring to... Figure 1 and Figure 2 The system includes a worktable 1, a lower mold 3, an upper mold 4, and a spring pressure probe assembly 42. The lower mold 3 is fixedly mounted on the worktable 1, and a mounting frame 2 is fixedly mounted above the worktable 1. The mounting frame 2 is horizontally positioned along its length and is located above the lower mold 3. The upper mold 4 is slidably connected to the mounting frame 2 in a vertical direction. Several test probes 41 for testing flexible circuit boards are fixedly connected to the upper mold 4, and a driving component 21 for driving the upper mold 4 to slide is fixedly connected to the mounting frame 2.

[0028] Reference Figure 1 and Figure 2The spring-loaded probe assembly 42 includes probes 421 and a first elastic element. Several probes 421 are provided, each corresponding to a number of test pins 41. When the upper mold 4 moves above the lower mold 3, the positions of the probes 421 correspond to the edge positions of the flexible circuit boards mounted on the lower mold 3. Several first sliding grooves 43 are formed within the upper mold 4, each corresponding to a number of probes 421. The upper mold 4 is provided with a sliding plate 44, which slides vertically and is connected to the first sliding grooves 43. The upper end of the probe 421 is fixedly connected to the lower surface of the sliding plate 44. The first elastic element forces the probe 421 to slide downwards, causing the lower end face of the probe 421 to be lower than the lower end face of the test pin 41.

[0029] Reference Figure 1 and Figure 2 The first elastic element is a spring 422, which is located in the first sliding groove 43. One end of the spring 422 is fixedly connected to the upper groove wall of the first sliding groove 43, and the other end of the spring 422 is fixedly connected to the upper surface of the sliding plate 44.

[0030] Reference Figure 1 and Figure 2 The lower mold 3 is provided with a number of positioning pins 31, which correspond to the positioning holes on the flexible circuit board.

[0031] The implementation principle of Embodiment 1 of this application is as follows: the upper mold 4 moves downward so that the test needle 41 abuts against the flexible circuit board on the lower mold 3, thereby testing the flexible circuit board. Since the upper mold 4 is provided with a probe 421, the first elastic member forces the probe 421 to slide downward so that the lower end face of the probe 421 is lower than the lower end face of the test needle 41. When the upper mold 4 moves downward, the probe 421 first abuts against the flexible circuit board. When the test needle 41 abuts against the flexible circuit board, the probe 421 forms an imprint on the flexible circuit board as a mark of test coverage, thereby reducing the possibility of missed tests.

[0032] Example 2:

[0033] The difference between Example 2 and Example 1 is that, referring to Figure 3 A mounting platform 32 is detachably connected to the upper part of the lower mold 3, and a positioning pin 31 is mounted on the mounting platform 32. A mounting groove 35 is vertically formed on the upper surface of the lower mold 3, and the mounting platform 32 is slidably engaged in the mounting groove 35. The lower mold 3 is provided with a limit component 33, which has two sides. The two sets of limit components 33 are located on both sides of the mounting groove 35, and the limit components 33 limit the mounting platform 32.

[0034] Reference Figure 3The limiting component 33 includes a rotating rod 332, a blocking plate 331, and a second elastic element. The upper surface of the lower mold 3 is provided with a rotating groove 34 in the vertical direction. The rotating rod 332 is located in the rotating groove 34. The rotating rod 332 and the rotating groove 34 are coaxially arranged. The rotating rod 332 is rotatably connected to the bottom wall of the rotating groove 34. The lower surface of the blocking plate 331 is fixedly connected to the upper end of the rotating rod 332. The second elastic element forces the blocking plate 331 to rotate to a position that prevents the mounting platform 32 from disengaging from the mounting groove 35.

[0035] The second elastic element is a torsion spring 333, which is coaxially arranged in the rotating groove 34 and sleeved on the rotating rod 332. The upper end of the torsion spring 333 is fixedly connected to the baffle plate 331, and the lower end of the torsion spring 333 is fixedly connected to the bottom wall of the rotating groove 34.

[0036] The implementation principle of Example 2 is as follows: a mounting platform 32 is provided, and a positioning pin 31 is set on the mounting platform 32, so that different flexible circuit boards can be tested by changing different mounting platforms 32.

[0037] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An FPC electrical testing fixture, characterized in that: The device includes a workbench (1), a lower mold (3), an upper mold (4), and a spring-loaded probe assembly (42). The lower mold (3) is mounted on the workbench (1). The workbench (1) is equipped with a mounting bracket (2). The mounting bracket (2) is located above the lower mold (3). The upper mold (4) is vertically slidably connected to the mounting bracket (2). The upper mold (4) is equipped with a plurality of test pins (41). The spring-loaded probe assembly (42) includes a probe (421) and a first elastic element. A plurality of probes (421) are provided. The probes (421) are vertically slidably connected to the upper mold (4). The first elastic element forces the probes (421) to slide downward so that the lower end face of the probes (421) is lower than the lower end face of the test pins (41). The positions of the plurality of probes (421) correspond to the positions of the edges of the flexible circuit board mounted on the lower mold (3).

2. The FPC electrical testing fixture according to claim 1, characterized in that: The lower mold (3) is provided with a number of positioning pins (31).

3. The FPC electrical testing fixture according to claim 1, characterized in that: The upper mold (4) is provided with a sliding plate (44), which slides vertically and is connected to the upper mold (4). The sliding plate (44) is provided with a plurality of probes (421) respectively, and the probes (421) are provided on the sliding plate (44). The first elastic element is a spring (422), one end of the spring (422) is connected to the upper mold (4), and the other end of the spring (422) is connected to the sliding plate (44).

4. The FPC electrical testing fixture according to claim 2, characterized in that: A mounting platform (32) is detachably connected above the lower mold (3), and the positioning pin (31) is mounted on the mounting platform (32).

5. The FPC electrical testing fixture according to claim 4, characterized in that: The lower mold (3) has an installation groove (35) on its upper surface. The mounting platform (32) is slidably locked in the installation groove (35). The lower mold (3) is provided with a limiting component (33). The limiting component (33) is located at the opening of the installation groove (35) to limit the mounting platform (32).

6. The FPC electrical testing fixture according to claim 5, characterized in that: The limiting component (33) includes a rotating rod (332), a blocking plate (331) and a second elastic member. The blocking plate (331) is rotatably connected to the lower mold (3) via the rotating rod (332). The second elastic member forces the blocking plate (331) to rotate to a position that prevents the mounting platform (32) from disengaging from the mounting groove (35).

7. The FPC electrical testing fixture according to claim 6, characterized in that: The second elastic element is a torsion spring (333). The upper surface of the upper mold (4) is provided with a rotating groove (34). The rotating rod (332) is rotatably connected to the bottom wall of the rotating groove (34). The torsion spring (333) is coaxially arranged in the rotating groove (34). One end of the torsion spring (333) is connected to the baffle plate (331), and the other end of the torsion spring (333) is connected to the bottom wall of the rotating groove (34).

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