An insertion test mechanism for memory chip testing
By designing an insertion test mechanism with a protective cover and protective plate, the problem of external factors affecting memory chip testing was solved, achieving structural protection and stability, and ensuring the accuracy of test results and ease of operation.
CN224287787UActive Publication Date: 2026-05-26SHENZHEN HUAZHISHENG TECHNOLOGY CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN HUAZHISHENG TECHNOLOGY CO LTD
- Filing Date
- 2025-08-15
- Publication Date
- 2026-05-26
AI Technical Summary
Technical Problem
Conventional insertion testing mechanisms lack structural protection during memory chip testing, which allows external factors to affect the test results.
Method used
An insertion test mechanism comprising a protective cover and a protective plate was designed. The docking assembly is achieved using a support frame and a combined insertion peg structure. The structure is protected by a transparent plate and a damping hinge. The stability and flexibility of the chip during the testing process are ensured by the design of a movable seat and a stabilizing frame.
Benefits of technology
It effectively protects memory chips from external interference, ensures the accuracy of test results, and provides convenient observation and operation.
✦ Generated by Eureka AI based on patent content.
Smart Images
Figure CN224287787U_ABST
Abstract
This utility model discloses an insertion test mechanism for memory chip testing, relating to the field of memory chip testing technology. It includes a stage component and a protective cover. A functional testing machine is mounted on the top center of the stage component, and movable seats are provided on both the left and right sides of the functional testing machine. A stabilizing frame is horizontally mounted on the top of the movable seats. The protective cover is mounted on the top of the stage component, and a protective plate is connected and installed on the front side of the protective cover. This insertion test mechanism for memory chip testing, by providing a protective cover and protective plate, ensures good structural protection for the memory chip during testing. It avoids unnecessary impact from external factors on the memory chip without affecting the operator's observation. Furthermore, the structural design of the movable seats and stabilizing frame facilitates the docking of the memory chip with the functional testing machine while providing good structural stability to ensure the effectiveness of the testing.
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