A contact resistance modular sample separator

Abstract

The utility model discloses a contact resistance modularization sample separator, including machine table and setting separation suite and test suite on machine table, the machine table includes horizontal transverse test track and equipment base, the separation suite includes interval setting at least one separation pedestal and at least two separation object table of equipment base, the separation pedestal can move up and down, the horizontal transverse test track both ends are fixed on separation object table and hang in the above of separation pedestal and separation object table, test suite sliding fixed on horizontal transverse test track. Under the premise of obtaining high performance solar cell, optimization production and manufacturing process, greatly reduce cost and energy consumption, reduce production loss and artificial failure.

Description

Technical Field

[0001] This utility model belongs to the field of solar cell process equipment, specifically relating to a contact resistance modular sample separator. Background Technology

[0002] Solar energy, as a new type of sustainable green energy, is a hot topic now and in the future, with great development potential, and photovoltaic power generation projects are highly favored by capital. The production process of solar cells is the core of photovoltaic power generation; their photoelectric conversion efficiency determines the product's competitiveness, and production speed represents the economic benefits of photovoltaic companies. From its inception to the present, solar cells have undergone continuous technological innovation and rapid product iteration. Surface grid lines have played a crucial role. Whether using high-temperature or low-temperature pastes, to better transport electrons and reduce shading area, grid line development is trending towards low resistance, multiple main grids, and fine sub-grids. Screen printing is an indispensable part of the photovoltaic industry, directly impacting its development.

[0003] In screen printing production processes, measuring battery contact resistance is a common characterization method that directly tests the electrical performance of samples. However, due to its unique measurement method, it requires sample cutting, separation, and measurement. Whether separated manually or in conjunction with production equipment, this device needs to effectively separate the cut samples and perform automated characterization tests. By characterizing the physical data of grid morphology through contact resistance, it can provide a more effective characterization method for laboratory electrical performance testing and R&D personnel. Utility Model Content

[0004] To address the aforementioned issues, the present invention aims to provide a modular contact resistance sample separator that optimizes production and manufacturing processes while achieving high-performance solar cells, thereby significantly reducing costs and energy consumption, production losses, and human error.

[0005] This utility model is achieved through the following technical solution:

[0006] This utility model provides a modular contact resistance sample separator, including a machine base and a separation kit and a test kit disposed on the machine base. The machine base includes a horizontal transverse test track and a device base. The separation kit includes at least one separation base and at least two separation stages spaced apart on the device base. The separation base can move up and down. The two ends of the horizontal transverse test track are fixed to the separation stages and suspended above the separation base and the separation stages. The test kit is slidably fixed on the horizontal transverse test track.

[0007] In an optional embodiment, horizontal longitudinal test tracks are respectively provided at both ends of the horizontal transverse test track. The horizontal longitudinal test tracks are located inside the outermost separation stage. Displacement drive groups are provided at both ends of the horizontal longitudinal test tracks, which can be used to make the horizontal transverse test tracks move up and down.

[0008] In an optional embodiment, the separation base and the separation stage are placed at intervals, with the outermost sides of the parallel arrangement being the separation stage.

[0009] In an optional embodiment, the instrument also includes at least two sample limiters fixed to the outermost separation stage, which can prevent displacement due to human placement errors from affecting normal sample separation testing.

[0010] In an optional embodiment, the machine tool further includes a device controller mounted on the equipment base, which is electrically connected to and controls the separation kit and the test kit, respectively.

[0011] In an optional embodiment, the separation base includes the telescopic kit device and the airflow kit device, the airflow kit device being nested in the telescopic kit device, and the telescopic kit device being nested in the separation base. The airflow kit device can pneumatically drive the telescopic kit device to move up and down on the separation base.

[0012] In an optional embodiment, the separation stage includes a vacuum kit device nested within the separation stage. The vacuum kit device has adsorption holes penetrating the surface of the separation stage, which can be used to create negative pressure by drawing air through an airflow pipe, thereby adsorbing the battery sample onto the surface of the separation stage.

[0013] In an optional embodiment, the separation kit further includes an airflow electrical signal coordinated transmission area disposed on the device base, which connects the airflow kit device and the vacuum kit device via electrical signals. The device controller is electrically connected to the airflow electrical signal coordinated transmission area, thereby driving the adsorption operation of the separation stage and the vertical extension and retraction of the separation base.

[0014] In an optional embodiment, the test kit further includes a tester electrical assembly kit and a test circuit cluster area, a circuit protection layer, a telescopic buffer kit, and a test probe array nested sequentially on the tester electrical assembly kit.

[0015] Furthermore, the tester electrical assembly includes the motion pulley group, which is slidably fixed on the horizontal transverse test track, allowing the test assembly to move along the horizontal transverse test track. The test circuit cluster area and the circuit protection layer are connected to the tester electrical assembly. The test circuit cluster area is nested within the circuit protection layer. The test circuit cluster area is connected to the telescopic buffer assembly, which is connected to the test probe array.

[0016] Compared with the prior art, the present invention has the following beneficial technical effects:

[0017] This utility model discloses a modular sample separator for contact resistance. Due to the specific testing method for contact resistance, samples require varying degrees of pretreatment. After dimensional cutting, the surface-cut samples can be modularly separated for electrical performance testing. Effective separation is achieved through mechanical vacuum adsorption and mechanical movement, protecting the test points and areas of the sample. The automatic sample separation and testing process, using non-contact contact resistance testing, allows for effective measurement of physical parameters without affecting the sample's condition. This avoids damage caused by manual handling, reducing labor and time costs associated with characterization and improving production efficiency. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a top view of the stage of a modular contact resistance sample separator provided in this embodiment of the present invention;

[0020] Figure 2 This is a cross-sectional view of a modular sample separator with contact resistance provided in an embodiment of the present invention.

[0021] Figure 3 This is a cross-sectional schematic diagram of a modular sample separator with contact resistance provided in an embodiment of the present invention;

[0022] Figure 4 This is a schematic diagram of a contact resistance modular sample separator carrying a battery, provided in an embodiment of this utility model.

[0023] 10. Machine tool; 20. Separation kit; 30. Test kit;

[0024] 101. Horizontal transverse test track; 102. Equipment base; 103. Sample limiter; 104. Horizontal longitudinal test track; 1041. Displacement drive assembly;

[0025] 105. Equipment controller; 201. Separation base; 202. Telescopic assembly; 2021. Airflow assembly; 203. Airflow electrical signal coordinated transmission area; 204. Separation stage; 2041. Vacuum assembly;

[0026] 301. Tester electrical assembly kit; 302. Motion pulley assembly; 303. Test circuit cluster area; 304. Circuit protection layer; 305. Telescopic buffer kit; 306. Test probe array. Detailed Implementation

[0027] The present invention will be further described below with reference to embodiments and accompanying drawings, but this is not intended to limit the scope of protection of the claims of this application. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0028] In the description of this utility model, unless otherwise stated, "a plurality of" means two or more; the terms "center," "longitudinal," "lateral," "upper," "lower," "left," "right," "inner," "outer," "front end," "rear end," "head," "tail," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," "third," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0029] Please see Figure 1-3 This utility model provides a modular contact resistance sample separator, including a machine base 10 and a separation kit 20 and a test kit 30 disposed on the machine base 10. The machine base 10 includes a horizontal transverse test track 101 and a device base 102. The separation kit 20 includes at least one separation base 201 spaced apart from the device base 102 and at least two separation stages 204. The separation base 201 can move up and down. The two ends of the horizontal transverse test track 101 are fixed on the separation stages 204 and suspended above the separation base 201 and the separation stages 204. The test kit 30 is slidably fixed on the horizontal transverse test track 101.

[0030] Please see Figure 4 In this application, the separation kit 20 is used to carry the laser-cut solar cell sample. The battery sample is placed on the separation base 201 and the separation stage 204. The separation base 201 is moved up and down to break the sample along the cutting line to obtain several solar cell samples. Then, the obtained battery samples are tested by the test kit above.

[0031] Furthermore, horizontal longitudinal test tracks 104 are respectively provided at both ends of the horizontal transverse test track 101. The horizontal longitudinal test tracks 104 are located inside the outermost separation platform 204. Displacement drive groups 1041 are provided at both ends of the horizontal longitudinal test track 104, which can be used to make the horizontal transverse test track 101 move up and down.

[0032] The equipment base 102 is provided with a plurality of parallelly arranged separation bases 201 and separation platforms 204. The separation bases 201 and separation platforms 204 are placed at intervals, and the outermost parallel ones are all separation platforms 204.

[0033] Furthermore, the instrument 10 also includes at least two sample limiters 103, which are fixed on the outermost separation stage 204. The sample limiters 103 can prevent displacement caused by manual placement errors from affecting normal sample separation testing.

[0034] The machine tool 10 also includes a device controller 105 mounted on the device base 102, which is electrically connected to and controls the separation kit 20 and the test kit 30 respectively.

[0035] Furthermore, the separation base 201 includes the telescopic kit device 202 and the airflow kit device 2021. The airflow kit device 2021 is nested in the telescopic kit device 202, and the telescopic kit device 202 is nested in the separation base 201. The airflow kit device 2021 can pneumatically drive the telescopic kit device 202 to move up and down on the separation base 201.

[0036] Furthermore, the separation stage 204 includes a vacuum kit device 2041, which is nested within the separation stage 204. The vacuum kit device 2041 has adsorption holes penetrating the surface of the separation stage 204, and negative pressure can be formed by drawing air through the airflow pipe to adsorb the battery sample onto the surface of the separation stage 204.

[0037] The separation kit 20 also includes an airflow electrical signal coordinated transmission area 203 disposed on the device base 102, which connects the airflow kit device 2021 and the vacuum kit device 2014 via electrical signals. The device controller is electrically connected to the airflow electrical signal coordinated transmission area 203, thereby driving the adsorption operation of the separation stage 204 and the vertical extension and retraction of the separation base 201.

[0038] Furthermore, the test kit 30 includes a test instrument electrical assembly kit 301 and a test circuit cluster area 303, a circuit protection layer 304, a telescopic buffer kit 305, and a test probe array 306, which are nested sequentially on the test instrument electrical assembly kit 301. The test instrument electrical assembly kit 301 internally contains the motion pulley group 302, which is slidably fixed on the horizontal transverse test track 101, allowing the test kit 30 to move along the horizontal transverse test track 101. The test circuit cluster area 303 and the circuit protection layer 304 are connected to the test instrument electrical assembly kit 301. The test circuit cluster area 303 is nested within the circuit protection layer 304. The test circuit cluster area 303 is connected to the telescopic buffer kit 305, and the telescopic buffer kit 305 is connected to the test probe array 306.

[0039] Please see Figure 2 In this embodiment, the tester electrical assembly 301 internally includes the motion pulley assembly 302, which is mechanically nested within the horizontal test track 101. The motion pulley assembly 302 can move on the horizontal test track 101 via a motor and manual operation. This lateral movement enables the tester electrical assembly 301, the motion pulley assembly 302, the test circuit cluster area 303, the circuit protection layer 304, the telescopic buffer assembly 305, and the test probe array 306 to move horizontally.

[0040] Please see Figure 2In this embodiment, the test circuit cluster area 303 and the circuit protection layer 304 are mechanically connected to the tester electrical assembly 301 while also having an electrical signal connection. The test circuit cluster area 303 is nested within the circuit protection layer 304. The test circuit cluster area 303 and the telescopic buffer assembly 305 are mechanically connected while also having an electrical signal connection. Electrical signals are transmitted from the tester electrical assembly 301, integrated through the test circuit cluster area 303, and then converged into the telescopic buffer assembly 305 to control the telescopic buffer assembly 305. The telescopic buffer assembly is mechanically connected to the test probe array 306. After receiving the electrical signal from the tester electrical assembly 301, the telescopic buffer assembly 305 drives the test probe array 306 to perform mechanical movements such as telescoping, turning, pressing the sample, and testing contact. The telescopic buffer kit 305 can provide efficient test buffering for the test probe array 306, preventing the test probe array from being damaged due to mechanical movement reaching the test limit. In practical applications, the test probe array 306 will directly contact the sample surface and be tested.

[0041] In this embodiment, please refer to Figure 1-3 The separation bases 201 are all in a retracted state, with their tops aligned horizontally with the separation stage 204. These multiple separation bases 201 and stages 204 form a horizontal plane to support the pre-treated sample. The pre-treated sample is positioned on this horizontal plane manually or with the assistance of instruments such as a slide suction device and slide transfer device. The sample's left and right sides are restricted by the sample limiter 103, allowing for proper placement. Through a unified built-in program controlled by an external device, the airflow kit 2021 and vacuum kit 2041 can be operated in unison to perform vacuum suction, ensuring the pre-treated sample is suctioned onto the horizontal plane. Then, while the airflow kit 2021 and vacuum kit 2041 maintain vacuum suction, the telescopic kit 202 performs vertical mechanical movement to separate the pre-treated sample. The sample can then be tested and characterized using the collaborative test probe array 306. The vacuum kit 2041 pauses the vacuum and resumes airflow to remove the remaining separated sample. Finally, after all samples have been tested by the test probe array 306, the airflow kit 2021 pauses the vacuum and resumes the airflow supply to expel gas, and will continue to slowly blow out gas to facilitate sample pickup by the operator. After the measurement is completed, the telescopic kit 202 returns to the initial position of the separation base 201 and returns to the same horizontal plane as the separation stage 204 for the next set of tests.

[0042] In this embodiment, the test probe array 306 measures the surface properties of the sample and transmits the electrical signals to the device controller 105 via the test circuit cluster area 303 and the test instrument electrical assembly 301. The operator outputs signals to the device controller via an external electronic computing device to obtain test results and perform calculations and analyses.

[0043] This utility model provides a modular contact resistance sample separator, including a machine base 10 and a separation kit 20 and a test kit 30 disposed on the machine base 10. The machine base 10 includes a horizontal transverse test track 101 and a device base 102. The separation kit 20 includes a separation base 201 and a separation stage 204 spaced apart on the device base 102. The separation base 201 can move up and down. The two ends of the horizontal transverse test track 101 are fixed to the outermost separation stage 204 and suspended above the separation base 201 and the separation stage 204. The test kit 30 is slidably fixed on the horizontal transverse test track 101. The device pre-processes and cuts samples according to the previous process. It is applicable to all standard-sized silicon wafer test samples on the market, and can effectively separate and automate the process testing of the cut samples. The device also calculates and analyzes the test results and provides feedback to the operator. By separating samples through non-contact contact resistance, it is beneficial to protect the test points and surface morphology of the sample without affecting the sample condition, reduce the randomness and error of human operation, reduce the labor and time costs of characterization, and improve the accuracy of testing.

[0044] The above embodiments are merely preferred embodiments of this utility model. It should be noted that, for those skilled in the art, various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principle of this utility model. All technical solutions after making equivalent substitutions to the claims of this utility model fall within the protection scope of this utility model, which is defined by the appended claims and their equivalents.

Claims

1. A modular sample separator based on contact resistance, characterized in that, The device includes a machine base and a separation kit and a test kit mounted on the machine base. The machine base includes a horizontal transverse test track and a device base. The separation kit includes at least one separation base and at least two separation platforms spaced apart on the device base. The separation base can move up and down. The two ends of the horizontal transverse test track are fixed to the separation platforms and suspended above the separation base and the separation platforms. The test kit is slidably fixed on the horizontal transverse test track.

2. The modular sample separator with contact resistance according to claim 1, characterized in that, The machine also includes a device controller mounted on the equipment base, which is electrically connected to and controls the separation kit and the test kit respectively.

3. A modular sample separator with contact resistance according to claim 2, characterized in that, The separation base includes a telescopic assembly and an airflow assembly. The airflow assembly is nested within the telescopic assembly, which is also nested within the separation base. The airflow assembly uses pneumatic means to drive the telescopic assembly to move up and down on the separation base.

4. A modular sample separator with contact resistance according to claim 3, characterized in that, The separation stage includes a vacuum kit, which is nested inside the separation stage. The vacuum kit has adsorption holes through the surface of the separation stage. By drawing air through the airflow pipe to create negative pressure, the battery sample is adsorbed onto the surface of the separation stage.

5. A modular sample separator with contact resistance according to claim 4, characterized in that, The separation kit also includes an airflow electrical signal coordinated transmission area set on the equipment base, which connects the airflow kit device and the vacuum kit device via electrical signals. The equipment controller is electrically connected to the airflow electrical signal coordinated transmission area, thereby driving the adsorption operation of the separation stage and the vertical extension and retraction of the separation base.

6. A modular sample separator with contact resistance according to claim 1, characterized in that, The horizontal transverse test track is provided at both ends with a horizontal longitudinal test track. The horizontal longitudinal test track is located inside the outermost separation platform. Both ends of the horizontal longitudinal test track are provided with displacement drive groups, which enable the horizontal transverse test track to move up and down.

7. A modular sample separator with contact resistance according to claim 1, characterized in that, The separation base and the separation platform are placed at intervals, with the outermost part being the separation platform.

8. A modular sample separator with contact resistance according to claim 1, characterized in that, The test kit includes a test instrument electrical assembly kit and, nested sequentially within the test instrument electrical assembly kit, a test circuit cluster area, a circuit protection layer, a telescopic buffer kit, and a test probe array.

9. A modular sample separator with contact resistance according to claim 8, characterized in that, The electrical assembly of the tester contains a set of motion pulleys, which are slidably fixed on the horizontal test track.

10. A modular sample separator with contact resistance according to claim 1, characterized in that, The instrument also includes at least two sample limiters, which are fixed to the outermost separation stage.

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