An apparatus for chip handler defect detection

Abstract

The utility model relates to a kind of equipment for chip fixture defect detection, including bottom plate, the bottom plate upper end is equipped with chip fixture detection tooling platform, the left side of the bottom plate upper end is equipped with chip fixture detection tooling platform front end and locates the chip fixture detection tooling platform front end and locates the right side and is equipped with at least two placing box, the bottom plate upper end is located above chip fixture detection tooling platform and is respectively provided with front transverse transmission platform and rear transverse transmission platform from front to back, the front transverse transmission platform is equipped with the lifting transfer device that can be moved up and down, the rear transverse transmission platform is equipped with D laser detection device.The utility model realizes more efficient, more accurate defect identification and control, to comprehensively improve the intelligent level of production line and product quality stability.

Description

Technical Field

[0001] This utility model relates to the field of chip fixture testing technology, and in particular to a device for detecting defects in chip fixtures. Background Technology

[0002] As chip products continue to miniaturize, quality issues such as silver halo and misalignment are becoming increasingly prominent. The primary cause of these problems lies in the quality of the chip fixtures. Current chip fixture defect detection processes heavily rely on manual visual inspection, which is not only inefficient but also susceptible to human error. To actively respond to the call for intelligent manufacturing and effectively promote the implementation of error-proofing mechanisms, a completely new automated defect detection device for chip fixtures needs to be developed. Summary of the Invention

[0003] The technical problem to be solved by this utility model is to provide a device for detecting defects in chip fixtures, so as to achieve more efficient and accurate defect identification and control, thereby comprehensively improving the intelligence level of the production line and the stability of product quality.

[0004] The technical solution adopted by this utility model to solve its technical problem is as follows: A device for detecting defects in chip fixtures is provided, including a base plate. A chip fixture testing platform is mounted on the upper end of the base plate. A chip fixture supply platform is mounted on the left side of the front end of the chip fixture testing platform on the upper end of the base plate. At least two placement boxes are mounted side-by-side on the right side of the front end of the chip fixture testing platform on the upper end of the base plate. A front transverse transmission platform and a rear transverse transmission platform are respectively arranged from front to back on the upper end of the base plate above the chip fixture testing platform. A lifting and transferring device that can move up and down is mounted on the front transverse transmission platform, and a D-laser detection device is mounted on the rear transverse transmission platform. The chip fixture testing platform includes a longitudinal transmission platform, a longitudinal moving support, a chip fixture testing table, and a chip fixture correction device. The longitudinal moving support is slidably mounted on the longitudinal transmission platform. The chip fixture correction device and the chip fixture testing table are sequentially installed from bottom to top on the upper end of the longitudinal moving support. The chip fixture correction device includes a magnetic field generator and a vertical moving cylinder that controls the up and down movement of the magnetic field generator. When the chip fixture correction device is working, the vertical moving cylinder drives the magnetic field generator to move upward, so that the magnetic field generator is close to the chip fixture testing table. When the magnetic field generator is activated, the magnetic force generated by the magnetic field generator penetrates the chip fixture testing table, causing the chip fixture to be tested to be tightly attracted to the chip fixture testing table.

[0005] As a supplement to the technical solution described in this utility model, the chip fixture supply platform includes a lifting drive device, a lifting platform, and an L-shaped plate. Four L-shaped plates arranged in a rectangular pattern are installed on the upper part of the base plate, and the four L-shaped plates form a storage box. The lifting platform is installed inside the storage box, and a lifting drive device for controlling the up and down movement of the lifting platform is installed on the lower part of the base plate. The lifting drive device is a pneumatic cylinder or an electric cylinder.

[0006] As a supplement to the technical solution described in this utility model, a sensor is installed on each of the front and rear sides of the storage box. The sensor is used to sense whether the chip fixture to be tested has risen to the required height.

[0007] As a supplement to the technical solution described in this utility model, two vertically arranged guide rods are installed at the diagonal lower end of the lifting platform, and a straight bearing is sleeved on the outer side of each guide rod on the base plate.

[0008] As a supplement to the technical solution described in this utility model, the front transverse transmission platform and the rear transverse transmission platform have the same structure, both being transversely arranged electric cylinders, and each of the two sides of the lower end of the electric cylinder is respectively equipped with a vertical support foot connected to the base plate.

[0009] As a supplement to the technical solution described in this utility model, the lifting and transferring device includes a horizontal moving support and a vertical moving support. The horizontal moving support is slidably installed on the front horizontal transmission platform. A vertically movable support is installed on the upper part of the front end of the horizontal moving support. Two pick-up and place supports and corresponding upper and lower cylinders for controlling the vertical movement of the pick-up and place supports are symmetrically arranged on both sides of the front end of the vertically movable support. A pick-up and place device, which is a robotic arm or a suction cup, is installed at the bottom of the pick-up and place support.

[0010] As a supplement to the technical solution described in this utility model, the D laser detection device includes a laser moving support and a D laser detection instrument. The laser moving support is slidably mounted on the rear transverse transmission platform, and the laser moving support is controlled to slide back and forth laterally by the rear transverse transmission platform. The D laser detection instrument is installed on the lower part of the front end of the laser moving support.

[0011] As a supplement to the technical solution described in this utility model, the placement box includes an L-shaped plate and a placement platform. Four L-shaped plates arranged in a rectangular pattern are installed on the upper end of the bottom plate, and the four L-shaped plates form a storage box. The placement platform is installed at the bottom of the storage box on the upper end of the bottom plate.

[0012] As a supplement to the technical solution described in this utility model, a second sensing sensor is installed on each of the front and rear sides of the storage box. The second sensing sensor is used to sense whether the chip fixture placed inside the storage box is full.

[0013] As a supplement to the technical solution described in this utility model, the chip fixture testing station includes a testing station body and a marble plate. A transverse groove is provided in the middle of the upper end of the testing station body. A through hole for inserting a magnetic field generator is provided in the middle of the transverse groove. A marble plate is fixedly installed in the transverse groove, and the marble plate seals the upper port of the through hole.

[0014] As a supplement to the technical solution described in this utility model, a buckle plate is installed on each side of the upper end of the main body of the testing platform. The buckle plate has an inverted L-shaped plate structure. The buckle plate is connected and fixed to the side wall of the main body of the testing platform with fasteners. The two buckle plates respectively fasten to both sides of the marble plate.

[0015] Beneficial Effects: This utility model relates to a device for defect detection of chip fixtures. The chip fixture is separated on a chip fixture supply platform, and simultaneously moved to a chip fixture inspection platform by a lifting and transferring device. A chip fixture correction device is activated, using a vertically moving cylinder to move a magnetic field generator upwards, bringing it close to the chip fixture inspection table. The magnetic field generator then penetrates the marble plate of the inspection table, causing the chip fixture to adhere tightly to it. After inspection by a 3D laser inspection device, the qualified and unqualified types are sorted and placed into placement boxes. This automation reduces manual operation and inspection, improving work efficiency. This utility model increases the automation level of the equipment and saves labor costs. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the structure of this utility model;

[0017] Figure 2 This is a schematic diagram of the chip fixture testing platform described in this utility model;

[0018] Figure 3 This is a schematic diagram of the lifting and transferring device described in this utility model;

[0019] Figure 4 This is a schematic diagram of the chip fixture correction device described in this utility model;

[0020] Figure 5 This is a schematic diagram of the structure of the 3D laser detection device described in this utility model;

[0021] Figure 6 This is a schematic diagram of the front transverse transmission platform described in this utility model;

[0022] Figure 7 This is a schematic diagram of the structure of the placement box described in this utility model;

[0023] Figure 8 This is a schematic diagram of the structure of the chip-to-be-tested fixture supply platform described in this utility model;

[0024] Figure 9 This is a schematic diagram of the structure of the longitudinal moving support and chip fixture testing station described in this utility model;

[0025] Figure 10 This is a schematic diagram of the main body of the testing station described in this utility model.

[0026] Illustration: 1. Base plate; 2. Chip fixture inspection platform; 3. Front transverse transmission platform; 4. Lifting and transfer device; 5. 3D laser inspection device; 6. Chip fixture supply platform; 7. Placement box; 8. Rear transverse transmission platform; 9. Longitudinal transmission platform; 10. Longitudinal transmission platform support; 11. Longitudinal moving support; 12. Chip fixture inspection table; 13. Chip fixture correction device; 14. Pick-and-place support; 15. Upper and lower cylinders; 16. Upper and lower moving support; 17. Vacuum generator; 18. Transverse moving support; 19. Pick-and-place device. 0. Up and down moving cylinder; 21. Cylinder support; 22. Magnetic field generator; 23. 3D laser detection instrument; 24. Laser moving support; 25. Vertical support leg; 26. Locking bolt; 27. L-shaped plate two; 28. Lifting drive device; 29. ​​Linear bearing; 30. L-shaped plate one; 31. Induction sensor one; 32. Lifting platform; 33. Detection platform body; 34. Guide rod; 35. Induction sensor two; 36. Placement platform; 37. Marble plate; 38. Buckle plate; 39. Horizontal groove; 40. Through hole; 41. Column; 42. Hoop. Detailed Implementation

[0027] The present invention will be further illustrated below with reference to specific embodiments. It should be understood that these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Furthermore, it should be understood that after reading the teachings of this invention, those skilled in the art can make various alterations or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims.

[0028] The embodiments of this utility model relate to a device for detecting defects in chip fixtures, such as... Figure 1-10As shown, a chip fixture testing platform 2 is mounted on the upper end of the base plate 1. A chip fixture supply platform 6 is mounted on the left side of the front end of the chip fixture testing platform 2 on the upper end of the base plate 1. At least two placement boxes 7 are mounted side-by-side on the right side of the front end of the chip fixture testing platform 2 on the upper end of the base plate 1. A front transverse transmission platform 3 and a rear transverse transmission platform 8 are respectively arranged from front to back on the upper end of the base plate 1 above the chip fixture testing platform 2. A lifting and transferring device 4 that can move up and down is mounted on the front transverse transmission platform 3. A 3D laser detection device 5 is mounted on the rear transverse transmission platform 8. The chip fixture testing platform 2 includes a longitudinal transmission platform 9, a longitudinal moving support 11, a chip fixture testing table 12, and a chip fixture correction device 13. Both ends of the bottom of the longitudinal transmission platform 9 are connected to the base plate 1 via longitudinal transmission platform supports 10. The longitudinal moving support 11 is slidably mounted on the longitudinal transmission platform 9. The longitudinal transmission platform 9 controls the longitudinal moving support 11 to slide back and forth. The upper end of the longitudinal moving support 11 is equipped with a chip fixture correction device 13 and a chip fixture testing platform 12 from bottom to top. The chip fixture correction device 13 includes a cylinder support 21, a magnetic field generator 22, and a vertical moving cylinder 20 that controls the vertical movement of the magnetic field generator 22. The vertical moving cylinder 20 is vertically fixed to the base plate 1 by the cylinder support 21. When the chip fixture correction device 13 is working, the vertical moving cylinder 20 drives the magnetic field generator 22 to move upward, so that the magnetic field generator 22 is close to the chip fixture testing platform 12. The magnetic field generator 22 is activated, and the magnetic force generated by the magnetic field generator 22 penetrates the chip fixture testing platform 12, so that the chip fixture to be tested is tightly attracted to the chip fixture testing platform 12.

[0029] Reference Figure 8 As shown, the chip fixture supply platform 6 includes a lifting drive device 28, a lifting platform 32, and an L-shaped plate 30. Four L-shaped plates 30 arranged in a rectangle are installed on the upper end of the base plate 1. The four L-shaped plates 30 form a storage box. The storage box has a large gap around its perimeter, which facilitates the lifting and transfer device 4 to remove the chip fixture to be tested. The lifting platform 32 is installed inside the storage box. The lifting drive device 28, which controls the up and down movement of the lifting platform 32, is installed on the lower end of the base plate 1. The lifting drive device 28 is a cylinder or an electric cylinder.

[0030] As a preferred embodiment of the storage box, a sensor 31 is installed on each of the front and rear sides of the storage box. The sensor 31 is used to sense whether the chip fixture to be tested has risen to the required height.

[0031] Reference Figure 8As shown, two vertically arranged guide rods 34 are installed at the diagonal lower end of the lifting platform 32. A linear bearing 29 is sleeved on the base plate 1 on the outside of each guide rod 34. The linear bearing 29 is connected and fixed to the base plate 1 by fasteners, which are generally bolts or screws. Through the cooperation of the guide rods 34 and the linear bearings 29, the lifting platform 32 can move up and down stably.

[0032] Reference Figure 6 As shown, the front transverse transmission platform 3 and the rear transverse transmission platform 8 have the same structure, both being transversely arranged electric cylinders. Each electric cylinder has a vertical support leg 25 connected to the base plate 1 installed on both sides of its lower end. The longitudinal transmission platform 9 is a longitudinally arranged electric cylinder. The electric cylinder is a modular product integrating a servo motor and a lead screw, converting the rotational motion of the servo motor into linear motion. It also transforms the servo motor's best advantages—precise speed control, precise revolution control, and precise torque control—into precise speed control, precise position control, and precise thrust control. The electric cylinder is an existing component and can be directly purchased from the market.

[0033] Reference Figure 3 As shown, the lifting and transferring device 4 includes a horizontal moving support 18 and a vertical moving support 16. The horizontal moving support 18 is slidably mounted on the front horizontal transmission platform 3. The vertically moving support 16 is mounted on the upper part of the front end of the horizontal moving support 18. Two pick-and-place supports 14 and corresponding vertical cylinders 15 for controlling the vertical movement of the pick-and-place supports 14 are symmetrically arranged on both sides of the front end of the vertically moving support 16. A pick-and-place device 19 is installed at the bottom of the pick-and-place support 14. The pick-and-place device 19 is a robotic arm or a suction cup. Generally, a suction cup is preferred. If a suction cup is selected, a vacuum generator 17 that cooperates with the suction cup will also be installed on the horizontal moving support 18. The purpose of the vacuum generator 17 is to cooperate with the suction cup to adsorb various materials.

[0034] Reference Figure 5 As shown, the 3D laser inspection device 5 includes a laser moving support 24 and a 3D laser inspection instrument 23. The laser moving support 24 is slidably mounted on the rear transverse transmission platform 8. The rear transverse transmission platform 8 controls the laser moving support 24 to slide back and forth laterally. The 3D laser inspection instrument 23 is installed on the lower part of the front end of the laser moving support 24.

[0035] Reference Figure 7As shown, the placement box 7 includes an L-shaped plate 27 and a placement platform 36. Four L-shaped plates 27 arranged in a rectangular shape are installed on the upper end of the base plate 1. The four L-shaped plates 27 form a storage box. The storage box formed in this way has a large gap around its perimeter, which facilitates the subsequent lifting and transfer device 4 to put the tested chip fixture into the corresponding storage box. The placement platform 36 is installed on the upper end of the base plate 1 at the bottom of the storage box. The tested chip fixture is supported by the placement platform 36.

[0036] As a preferred embodiment of the storage box, a second sensor 35 is installed on each of the front and rear sides of the storage box. The second sensor 35 is used to sense whether the chip fixture placed inside the storage box is full.

[0037] like Figure 9 and Figure 10 As shown, the chip fixture testing station 12 includes a testing station body 33 and a marble plate 37. A transverse groove 39 is provided in the middle of the upper end of the testing station body 33. A through hole 40 for inserting a magnetic field generator 22 is provided in the middle of the transverse groove 39. The marble plate 37 is fixedly installed in the transverse groove 39. The marble plate 37 seals the upper port of the through hole 40. The through hole 40 allows the magnetic field generator 22 to be closer to the marble plate 37. The chip fixture testing station 12 uses the marble plate 37 with good flatness as a support platform. The chip fixture to be tested is placed on the marble plate 37 to improve the detection accuracy of the tested object.

[0038] At each of the four corners of the lower end of the main body 33 of the testing platform, a column 41 is vertically installed. The upper end of the longitudinal moving support 11 is provided with a clamp 42 corresponding to the column 41. The side of the clamp 42 is provided with a locking bolt 26 to control the clamp 42. The lower end of the column 41 is inserted into the corresponding clamp 42 and the locking bolt 26 is tightened so that the inner hole of the clamp 42 clamps the column 41, thereby realizing the rapid fixation of the main body 33 of the testing platform.

[0039] like Figure 10 As shown, a buckle plate 38 is installed on each side of the upper end of the main body 33 of the testing platform. The buckle plate 38 has an inverted L-shaped plate structure. The buckle plate 38 is connected and fixed to the side wall of the main body 33 of the testing platform with fasteners. The two buckle plates 39 respectively fasten to the two sides of the marble plate 37.

[0040] The specific process for equipment testing is as follows:

[0041] First, the chip fixture supply platform 6 starts working. Multiple chip fixtures to be tested are stacked from bottom to top in the storage box formed by four L-shaped plates 30. The lifting drive device 28 controls the lifting platform 32 to move up one position, so that the uppermost chip fixture inside the storage box reaches the position of the lifting and transfer device 4 to pick up the material.

[0042] Next, the lifting and transfer device 4 starts to work. The lifting and transfer device 4 has two pick-up and place devices 19. The left pick-up and place device 19 is used to pick up and place the chip fixture to be tested, and the right pick-up and place device 19 is used to pick up and place the chip fixture after testing. The upper and lower cylinders 15 control the pick-up and place support 14 and the pick-up and place device 19 to move up and down. The horizontal transmission platform 3 controls the pick-up and place support 14 and the pick-up and place device 19 to move horizontally. The left pick-up and place device 19 takes away the chip fixture at the top inside the storage box and places it on the marble plate 37 of the chip fixture testing table 12.

[0043] Then, the chip fixture correction device 13 is activated, and the magnetic field generator 22 is moved upward by the up-and-down moving cylinder 20, so that the magnetic field generator 22 is close to the chip fixture testing platform 12. Then, the magnetic field generator 22 is activated, and the magnetic force generated by the magnetic field generator 22 penetrates the marble plate 37 of the chip fixture testing platform 12, so that the chip fixture to be tested is tightly attached to the marble plate 37.

[0044] Next, the longitudinal transmission platform 9 is started, and the longitudinal transmission platform 9 controls the chip fixture detection stage 12 to move backward until the chip fixture on the upper end of the marble plate 37 moves to below the 3D laser detection device 5.

[0045] The 3D laser inspection instrument 23 is started to inspect the chip fixture on the upper end of the marble plate 37. Then the horizontal transmission platform 8 controls the 3D laser inspection instrument 23 to slide back and forth horizontally to achieve full inspection by the 3D laser inspection instrument 23. After the inspection is completed, the vertical transmission platform 9 controls the chip fixture inspection table 12 to move forward and return to the initial position. The magnetic field generator 22 is turned off. The pick-and-place device 19 on the right puts the inspected chip fixture into the corresponding placement box 7. There are at least two placement boxes 7, one for qualified chip fixtures and the other for unqualified chip fixtures.

[0046] This invention facilitates the separation of chip fixtures on the chip fixture supply platform. Simultaneously, the separated chip fixtures are moved to the chip fixture testing platform for placement and adsorption via the lifting and transfer device 4. After inspection by the 3D laser detection device 5, the qualified and unqualified types are sorted into the placement box in sequence. This automation reduces manual operation and inspection, and improves work efficiency.

[0047] In the description of this utility model, it should be understood that the directional terms such as "front, back, up, down, left, right", "horizontal, vertical, horizontal" and "top, bottom" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description. Unless otherwise stated, these directional terms do not indicate or imply that the device or element referred to must have a specific orientation or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the scope of protection of this utility model. The directional terms "inner" and "outer" refer to the inner and outer contours of each component itself.

[0048] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein will be interpreted accordingly.

[0049] Furthermore, it should be noted that the use of terms such as "first" and "second" to define components is merely for the purpose of distinguishing the corresponding components. Unless otherwise stated, the above terms have no special meaning and therefore cannot be construed as limiting the scope of protection of this utility model.

[0050] The above provides a detailed description of the device for detecting defects in chip fixtures provided in this application. Specific examples have been used to illustrate the principles and implementation methods of this application. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of this application. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of this application. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A device for detecting defects in chip fixtures, comprising a base plate (1), characterized in that: A chip fixture testing platform (2) is installed on the upper end of the base plate (1). A chip fixture supply platform (6) is installed on the left side of the front end of the chip fixture testing platform (2) on the upper end of the base plate (1). At least two placement boxes (7) are installed side by side on the right side of the front end of the chip fixture testing platform (2) on the upper end of the base plate (1). A front transverse transmission platform (3) and a rear transverse transmission platform (8) are respectively arranged from front to back on the upper end of the base plate (1) above the chip fixture testing platform (2). A lifting and transfer device (4) that can move up and down is installed on the front transverse transmission platform (3). A 3D laser detection device (5) is installed on the rear transverse transmission platform (8). The chip fixture testing platform (2) includes a longitudinal transmission platform (9), a longitudinal moving support (11), and a chip fixture testing table ( 12) and chip fixture correction device (13), the longitudinal moving support (11) is slidably installed on the longitudinal transmission platform (9), the chip fixture correction device (13) and the chip fixture testing table (12) are installed sequentially from bottom to top on the upper end of the longitudinal moving support (11), the chip fixture correction device (13) includes a magnetic field generator (22) and a vertical moving cylinder (20) for controlling the vertical movement of the magnetic field generator (22). When the chip fixture correction device (13) is working, the vertical moving cylinder (20) drives the magnetic field generator (22) to move upward, so that the magnetic field generator (22) is close to the chip fixture testing table (12). The magnetic field generator (22) is started, and the magnetic force generated by the magnetic field generator (22) penetrates the chip fixture testing table (12) so that the chip fixture to be tested is tightly adsorbed on the chip fixture testing table (12).

2. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The chip fixture supply platform (6) includes a lifting drive device (28), a lifting platform (32), and an L-shaped plate (30). Four L-shaped plates (30) arranged in a rectangular shape are installed on the upper end of the base plate (1). The four L-shaped plates (30) form a storage box. The lifting platform (32) is installed inside the storage box. The lifting drive device (28) that controls the up and down movement of the lifting platform (32) is installed on the lower end of the base plate (1). The lifting drive device (28) is a cylinder or an electric cylinder.

3. The device for detecting defects in chip fixtures according to claim 2, characterized in that: A sensor (31) is installed on each of the front and rear sides of the storage box. The sensor (31) is used to sense whether the chip fixture to be tested has risen to the required height.

4. The device for detecting defects in chip fixtures according to claim 2, characterized in that: Two vertically arranged guide rods (34) are installed at the diagonal lower end of the lifting platform (32), and a straight bearing (29) is sleeved on the bottom plate (1) on the outside of each guide rod (34).

5. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The front transverse transmission platform (3) and the rear transverse transmission platform (8) have the same structure, both being transversely arranged electric cylinders. Each of the two sides of the lower end of the electric cylinder is equipped with a vertical support leg (25) connected to the base plate (1).

6. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The lifting and transferring device (4) includes a horizontal moving support (18) and a vertical moving support (16). The horizontal moving support (18) is slidably installed on the front horizontal transmission platform (3). The upper part of the front end of the horizontal moving support (18) is equipped with a vertically moving support (16). Two pick-and-place supports (14) and corresponding upper and lower cylinders (15) for controlling the vertical movement of the pick-and-place supports (14) are symmetrically arranged on both sides of the front end of the vertically moving support (16). The bottom of the pick-and-place support (14) is equipped with a pick-and-place device (19), which is a robotic arm or a suction cup.

7. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The 3D laser detection device (5) includes a laser moving support (24) and a 3D laser detection instrument (23). The laser moving support (24) is slidably mounted on the rear transverse transmission platform (8). The rear transverse transmission platform (8) controls the laser moving support (24) to slide back and forth laterally. The 3D laser detection instrument (23) is installed on the lower part of the front end of the laser moving support (24).

8. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The placement box (7) includes an L-shaped plate (27) and a placement platform (36). Four L-shaped plates (27) arranged in a rectangular shape are installed on the upper end of the base plate (1). The four L-shaped plates (27) form a storage box. The placement platform (36) is installed on the upper end of the base plate (1) at the bottom of the storage box.

9. The device for detecting defects in chip fixtures according to claim 1, characterized in that: The chip fixture testing station (12) includes a testing station body (33) and a marble plate (37). A transverse groove (39) is provided in the middle of the upper end of the testing station body (33). A through hole (40) for inserting a magnetic field generator (22) is provided in the middle of the transverse groove (39). The marble plate (37) is fixedly installed in the transverse groove (39) and the marble plate (37) seals the upper port of the through hole (40).

10. The device for detecting defects in chip fixtures according to claim 9, characterized in that: A buckle plate (38) is installed on each side of the upper end of the main body (33) of the testing platform. The buckle plate (38) has an inverted L-shaped plate structure. The buckle plate (38) is connected and fixed to the side wall of the main body (33) of the testing platform with fasteners. The two buckle plates (38) respectively fasten to the two sides of the marble plate (37).

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