A metal probe current resistance testing device
By designing a temperature sensor and sensing element to monitor the probe temperature, and combining it with a pressing mechanism and insulating materials, the problem of low accuracy in traditional testing methods is solved, enabling accurate evaluation and safe testing of the probe's current withstand performance.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU LANGRUI ELECTRONICS TECH CO LTD
- Filing Date
- 2025-05-29
- Publication Date
- 2026-06-09
AI Technical Summary
Traditional metal probe testing methods are limited by the structural design and ease of operation of the testing equipment, resulting in low testing accuracy and an inability to accurately measure the temperature change of the probe under different current conditions. This leads to inaccurate current withstand performance evaluation and affects product quality.
A metal probe current withstand test device was designed. It uses a temperature sensor and a temperature sensing element to monitor the temperature change of the probe, fixes the probe by pressing down, adjusts the position of the probe and the needle tail, uses insulating material to improve safety, and observes the test process through a transparent protective cover.
This enables accurate evaluation of the probe's current withstand capability, improves the accuracy and safety of testing, avoids current leakage and the risk of electric shock to operators, and ensures the reliability of test results.
Smart Images
Figure CN224341611U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of probe testing technology, and in particular to a metal probe withstand current testing device. Background Technology
[0002] In the modern electronics industry, metal probes are used as key connection and testing components in many fields such as semiconductor manufacturing, circuit board inspection, and component performance testing. Among them, metal probes are made of copper metal material, and it is necessary to test the maximum current range under which the metal probe will not melt and be damaged.
[0003] Traditional metal probe testing methods are often limited by factors such as the structural design and ease of operation of the testing device, resulting in low testing accuracy. They cannot accurately measure the temperature change of the probe under different current conditions, leading to inaccurate evaluation of the probe's current withstand performance. This can easily allow some substandard probes to enter the subsequent production process, affecting product quality.
[0004] Therefore, this application provides a metal probe current withstand test device. Utility Model Content
[0005] To address the shortcomings of existing technologies, this application provides a metal probe current withstand test device, which overcomes the deficiencies of existing technologies. It aims to solve the problem that traditional metal probe testing methods are often limited by factors such as the structural design and ease of operation of the testing device, resulting in low testing accuracy and the inability to accurately measure the temperature change of the probe under different current conditions. This leads to inaccurate evaluation of the probe's current withstand performance, which can easily allow some substandard probes to enter the subsequent production process, affecting product quality.
[0006] To achieve the above objectives, this application provides the following technical solution: a metal probe withstand current testing device, comprising a mounting base and a power supply. A probe fixing box is fixedly installed on the top of the mounting base, a fixing frame is placed on one side of the mounting base, and a needle tail fixing box is fixedly installed on the top of the fixing frame. The needle tail fixing box and the probe fixing box are arranged opposite to each other. A temperature sensor is fixedly installed on the top of the power supply. Both the needle tail fixing box and the probe fixing box have slots inside, and temperature sensing elements are fixedly installed in the slots. The two sets of temperature sensing elements are electrically connected to the two sets of signal terminals of the temperature sensor. A pressing mechanism is provided above the temperature sensing elements.
[0007] By adopting the above technical solution, the probe is placed into the slot in the probe fixing box, and the auxiliary needle tail is placed into the slot in the needle tail fixing box. They are fixed by a pressing mechanism. The power supply equipment's wires are connected to the probe's pillow and the auxiliary needle tail to form a circuit. The power supply equipment is set with test cycles and current values at different stages, and the power is applied back and forth for testing. The temperature of the needle during the test is sensed by a temperature sensor and two sets of temperature sensing elements. When the temperature of the needle exceeds 40 degrees Celsius, it indicates that the product cannot withstand the current test current. Through ingenious structural design, the temperature sensor can accurately monitor the temperature change of the probe under different current conditions, improving the accuracy of the probe's current resistance performance assessment.
[0008] As a preferred technical solution of this application, a movable base plate is fixedly installed at the bottom of the fixed base, and a base is provided at the bottom of the movable base plate. Two sets of sliding grooves are opened inside the movable base plate. Two sets of fixing bolts are connected between the movable base plate and the base, and the fixing bolts pass through the corresponding sliding grooves. A fixing rod is fixedly installed on one side of the movable base plate, and a pull rod is slidably connected inside the fixing rod. One end of the pull rod is fixedly installed on one side of the fixed base.
[0009] By adopting the above technical solution, the moving base plate is released by adjusting the two sets of fixing bolts upwards. Pulling the pull rod drives the fixed seat and the moving base plate and probe fixing box connected to it to move, thereby adjusting the distance between the probe fixing box and the needle tail fixing box, so as to adjust the position of the probe relative to the needle tail, which is conducive to more accurate and stable testing.
[0010] As a preferred technical solution of this application, the pressing mechanism includes a screw, which is threadedly connected to the top of the probe fixing box or fixing frame, and a pressing block is rotatably connected to the bottom end of the screw, which is slidably connected to the slot.
[0011] By adopting the above technical solution, by rotating the two sets of screws respectively, the position of the pressure blocks connected to them is moved down, and the probe and the needle tail are fixed respectively. The pressure blocks are made of metal. The power supply wires of the power supply equipment are connected to the two sets of pressure blocks, so that the current can pass through the probe pillow and the auxiliary needle tail to form a circuit.
[0012] As a preferred technical solution of this application, the fixing seat, probe fixing box, fixing frame, movable base plate, base and pull rod are all made of insulating material.
[0013] By adopting the above technical solution, with the fixed base, probe fixing box, fixing frame, movable base plate, base, and pull rod all made of insulating materials, current leakage during the test is effectively prevented, avoiding electric shock to operators. At the same time, the impact on the test results is reduced, and the safety and reliability of the device are improved.
[0014] As a preferred technical solution of this application, a protective cover is installed on the outer periphery of the base, a number of sets of screws are installed at the connection between the fixing frame and the protective cover, and an opening and closing cover is hinged to the top of the protective cover.
[0015] By adopting the above technical solution, and using PC board as the material for the protective cover, which has an insulating effect, the protective cover separates the staff from the device inside the cover, preventing the staff from being electrocuted and improving the safety during use. The easy opening and closing of the cover also improves its practicality during use.
[0016] As a preferred technical solution of this application, both the protective cover and the opening / closing cover are made of transparent material.
[0017] By adopting the above technical solution, and with both the protective cover and the opening / closing cover made of transparent material, operators can easily observe the testing process inside the protective cover without opening the opening / closing cover.
[0018] As a preferred embodiment of this application, a rotating cap is fixedly installed at the top end of the screw.
[0019] By adopting the above technical solution, the screw can be easily adjusted by rotating the cap, thus improving its practicality during use.
[0020] The beneficial effects of this application are:
[0021] 1. Place the probe into the slot in the probe holder and the auxiliary needle tail into the slot in the needle tail holder. Secure them with a pressing mechanism. Connect the power supply wire to the probe pillow and the auxiliary needle tail to form a circuit. Set the test cycle and current values for different stages using the power supply and perform repeated power-on tests. The temperature of the needle during the test is sensed by a temperature sensor and two sets of temperature sensing elements. If the temperature of the needle exceeds 40 degrees Celsius, it indicates that the product cannot withstand the current test current. Through ingenious structural design, the temperature sensor can accurately monitor the temperature change of the probe under different current conditions, improving the accuracy of the probe's current resistance assessment.
[0022] 2. By adjusting the two sets of fixing bolts upwards to release the restriction on the movable base plate, pulling the pull rod drives the fixed seat and the movable base plate and probe fixing box connected to it to move, thereby adjusting the distance between the probe fixing box and the needle tail fixing box, so as to adjust the position of the probe relative to the needle tail, which is conducive to more accurate and stable testing. Attached Figure Description
[0023] Figure 1 This is a schematic diagram of the overall structure of this application;
[0024] Figure 2 This is a partial structural diagram of this application;
[0025] Figure 3 for Figure 2 Enlarged structural diagram at point A in the middle;
[0026] Figure 4 This is a schematic diagram of the probe fixing box adjustment structure.
[0027] In the diagram: 1. Mounting base; 2. Power supply; 3. Probe mounting box; 4. Mounting frame; 5. Temperature sensor; 6. Slot; 7. Temperature sensing element; 8. Pressing mechanism; 801. Screw; 802. Pressing block; 9. Movable base plate; 10. Base; 11. Fixing rod; 12. Pull rod; 13. Slide groove; 14. Fixing bolt; 15. Screw; 16. Protective cover; 17. Opening and closing cover; 18. Needle tail mounting box; 19. Rotating cap. Detailed Implementation
[0028] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0029] Reference Figure 1-4 A metal probe withstand current testing device includes a mounting base 1 and a power supply 2. A probe fixing box 3 is fixedly installed on the top of the mounting base 1. A fixing frame 4 is placed on one side of the mounting base 1. A needle tail fixing box 18 is fixedly installed on the top of the fixing frame 4. The needle tail fixing box 18 is arranged opposite to the probe fixing box 3. A temperature sensor 5 is fixedly installed on the top of the power supply 2. Both the needle tail fixing box 18 and the probe fixing box 3 are provided with slots 6. Temperature sensing elements 7 are fixedly installed in the slots 6. The two sets of temperature sensing elements 7 are electrically connected to the two sets of signal terminals of the temperature sensor 5. A pressing mechanism 8 is provided above the temperature sensing elements 7. The pressing mechanism 8 includes a screw 801, which is threaded to the top of the probe fixing box 3 or the fixing frame 4. A pressing block 802 is rotatably connected to the bottom end of the screw 801. The pressing block 802 is slidably connected to the slot 6.
[0030] The probe is placed into the slot 6 of the probe fixing box 3, and the auxiliary needle tail is placed into the slot 6 of the needle tail fixing box 18. They are then fixed by the pressing mechanism 8. The power supply device 2 connects the probe's pillow and the auxiliary needle tail to form a circuit. The power supply device 2 is used to set the test cycle and current values for different stages, and the test is repeated. The temperature of the needle during the test is sensed by the temperature sensor 5 and two sets of temperature sensing elements 7. When the temperature of the needle exceeds 40 degrees Celsius, it indicates that the product cannot withstand the current test current. Through ingenious structural design, the temperature sensor 5 accurately monitors the temperature change of the probe under different current conditions, improving the accuracy of the probe's current resistance assessment. By rotating the two sets of screws 801, the position of the connected pressing blocks 802 is moved downwards, fixing the probe and needle tail respectively. The pressing blocks 802 are made of metal. The power supply device 2's wires are connected to the two pressing blocks 802, allowing current to flow through the probe's pillow and the auxiliary needle tail, forming a circuit.
[0031] Reference Figure 2-4 A movable base plate 9 is fixedly installed at the bottom of the fixed base 1. A base 10 is provided at the bottom of the movable base plate 9. Two sets of sliding grooves 13 are opened inside the movable base plate 9. Two sets of fixing bolts 14 are connected between the movable base plate 9 and the base 10, and the fixing bolts 14 pass through the corresponding sliding grooves 13. A fixing rod 11 is fixedly installed on one side of the movable base plate 9. A pull rod 12 is slidably connected inside the fixing rod 11. One end of the pull rod 12 is fixedly installed on one side of the fixed base 1. The fixed base 1, probe fixing box 3, fixing frame 4, movable base plate 9, base 10, and pull rod 12 are all made of insulating material.
[0032] By adjusting the two sets of fixing bolts 14 upwards to release the restriction on the movable base plate 9, the pull rod 12 is pulled to move the fixed seat 1, the movable base plate 9 connected to it, and the probe fixing box 3, thereby adjusting the distance between the probe fixing box 3 and the needle tail fixing box 18, achieving the purpose of adjusting the position of the probe relative to the needle tail, which is conducive to more accurate and stable testing. Since the fixed seat 1, probe fixing box 3, fixed frame 4, movable base plate 9, base 10, and pull rod 12 are all made of insulating materials, current leakage during testing is effectively prevented, avoiding electric shock to operators, while reducing the impact on test results and improving the safety and reliability of the device.
[0033] Reference Figure 1-3A protective cover 16 is installed on the outer periphery of the base 10. Several sets of screws 15 are installed at the connection between the fixing frame 4 and the protective cover 16. The top of the protective cover 16 is hinged with an opening and closing cover 17. A rotating cap 19 is fixedly installed on the top of the screw 801. The protective cover 16 is made of PC board, which has an insulating effect. The protective cover 16 separates the staff from the device inside the protective cover 16, avoiding electric shock to the staff and improving safety during use. The opening and closing cover 17 makes it easy to open and close, improving the practicality during use. The rotating cap 19 makes it easy to adjust the screw 801, improving the practicality during use.
[0034] Reference Figure 1 Both the protective cover 16 and the hinged cover 17 are made of transparent material; the fact that both the protective cover 16 and the hinged cover 17 are made of transparent material makes it easy for operators to observe the testing process inside the protective cover 16 without opening the hinged cover 17.
[0035] Working principle: The probe is placed into the slot 6 of the probe fixing box 3, and the auxiliary needle tail is placed into the slot 6 of the needle tail fixing box 18. It is fixed by the pressing mechanism 8. The power supply device 2 connects the probe pillow and the auxiliary needle tail to form a circuit. The power supply device 2 sets the test cycle and the current value of different stages, and the power is applied back and forth for testing. The temperature of the needle is sensed by the temperature sensor 5 and two sets of temperature sensing elements 7 during the test. When the temperature of the needle exceeds 40 degrees, it means that the product cannot withstand the current test current. The two sets of fixing bolts 14 are adjusted upward to release the restriction on the moving base plate 9. The pull rod 12 is pulled to move the fixing seat 1 and the moving base plate 9 and the probe fixing box 3 connected to it, thereby adjusting the distance between the probe fixing box 3 and the needle tail fixing box 18.
[0036] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.
Claims
1. A metal probe withstand current testing device, comprising a mounting base (1) and a power supply device (2), characterized in that, A probe fixing box (3) is fixedly installed on the top of the fixing base (1). A fixing frame (4) is placed on one side of the fixing base (1). A needle tail fixing box (18) is fixedly installed on the top of the fixing frame (4). The needle tail fixing box (18) and the probe fixing box (3) are arranged opposite to each other. A temperature sensor (5) is fixedly installed on the top of the power supply device (2). A slot (6) is provided inside both the needle tail fixing box (18) and the probe fixing box (3). A temperature sensing element (7) is fixedly installed in the slot (6). The two sets of temperature sensing elements (7) are electrically connected to the two sets of signal terminals of the temperature sensor (5). A pressing mechanism (8) is provided above the temperature sensing element (7).
2. The metal probe withstand current testing device according to claim 1, characterized in that, A movable base plate (9) is fixedly installed at the bottom of the fixed base (1). A base (10) is provided at the bottom of the movable base plate (9). Two sets of sliding grooves (13) are provided inside the movable base plate (9). Two sets of fixing bolts (14) are connected between the movable base plate (9) and the base (10). The fixing bolts (14) pass through the corresponding sliding grooves (13). A fixing rod (11) is fixedly installed on one side of the movable base plate (9). A pull rod (12) is slidably connected inside the fixing rod (11). One end of the pull rod (12) is fixedly installed on one side of the fixed base (1).
3. The metal probe withstand current testing device according to claim 1, characterized in that, The pressing mechanism (8) includes a screw (801), which is threaded to the top of the probe fixing box (3) or the fixing frame (4). The bottom end of the screw (801) is rotatably connected to a pressing block (802), which is slidably connected to the slot (6).
4. The metal probe withstand current testing device according to claim 1, characterized in that, The fixed base (1), probe fixing box (3), fixing frame (4), movable base plate (9), base (10), and pull rod (12) are all made of insulating material.
5. The metal probe withstand current testing device according to claim 2, characterized in that, A protective cover (16) is installed on the outer periphery of the base (10), and several sets of screws (15) are installed at the connection between the fixing frame (4) and the protective cover (16). A hinged cover (17) is hinged to the top of the protective cover (16).
6. The metal probe withstand current testing device according to claim 5, characterized in that, Both the protective cover (16) and the hinged cover (17) are made of transparent material.
7. The metal probe withstand current testing device according to claim 3, characterized in that, A rotating cap (19) is fixedly installed at the top of the screw (801).