Wafer adapting support mechanism
By designing a wafer adapter support mechanism and using a synchronous belt and synchronous wheel system to automatically adjust the swing arm distance, the problem of adapting wafers of different sizes was solved, the detection efficiency and accuracy were improved, and the shortcomings of existing technologies were overcome.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI QIANSHI INTELLIGENT TECH CO LTD
- Filing Date
- 2025-08-27
- Publication Date
- 2026-06-26
AI Technical Summary
Existing technologies struggle to quickly adapt to wafers of different sizes in semiconductor wafer inspection without changing tooling or requiring manual intervention, resulting in low inspection efficiency and difficulty in guaranteeing accuracy.
A wafer adapter support mechanism was designed. The drive unit drives the synchronous belt to rotate the synchronous wheel. The sliding component slides in the slide groove and drives the swing arm to rotate. The distance between the swing arms can be adjusted to accommodate wafers of different sizes. Combined with components such as bearings, sensors and tension wheels, accurate positioning is ensured.
It enables rapid adaptation to wafers of different sizes without changing tooling or manual intervention, improving testing efficiency and accuracy while reducing operational complexity and errors.
Smart Images

Figure CN224419249U_ABST