Connection and reversing mechanism and transfer conveying equipment
By combining the baffle and stripper design of the reversing mechanism, the problems of inconsistent position and damage of capacitors during motion conversion are solved, achieving efficient and stable capacitor reversing and transportation.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN MUEN TECHNOLOGY CO LTD
- Filing Date
- 2025-07-04
- Publication Date
- 2026-06-30
AI Technical Summary
When converting a capacitor from circular motion to linear motion, existing technologies that adjust the adsorption pressure or use a traditional pressure bar can affect detection efficiency, lead to inconsistent positioning, and potentially damage the capacitor.
The system employs a reversing mechanism, including a combination of baffles, strippers, and trays. It achieves stable reversing and transport of capacitors through a negative pressure adsorption turntable. The baffles and strippers support the capacitor's pins and body from above and below, respectively, ensuring consistent positioning and preventing damage during the transfer process.
It improves the commutation and conveying efficiency of capacitors, maintains the consistency of capacitor position, reduces the risk of damage, enhances the versatility and adaptability of equipment, and reduces production cycle and cost.
Smart Images
Figure CN224429217U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of detection and transmission, and in particular to connection and reversing mechanisms and transfer and conveying equipment. Background Technology
[0002] When transferring the capacitors being inspected from circular motion to linear motion, adjusting the adsorption pressure can affect other capacitors, thus reducing inspection efficiency. Using a traditional pressure bar can easily damage the capacitors and alter their orientation, resulting in inconsistencies in orientation before and after the transition from circular to linear motion. Utility Model Content
[0003] Therefore, it is necessary to provide a connection and reversing mechanism and a transfer and conveying device.
[0004] One embodiment of this application is a connection reversing mechanism, which includes a baffle, a stripper and a support plate;
[0005] The baffle and the peeling plate are respectively connected to the support plate, and the baffle and the peeling plate together form a transfer position;
[0006] The peeling plate is used in conjunction with the negative pressure adsorption turntable to hold the capacitor to be tested adsorbed by the negative pressure adsorption turntable at the transfer position, so as to peel the capacitor to be tested off the negative pressure adsorption turntable.
[0007] The baffle is used in conjunction with the negative pressure adsorption turntable and the peeling plate. When the peeling plate is holding the capacitor to be tested, the baffle is held against the pin of the capacitor to be tested at the transfer position, so as to work together with the peeling plate to peel the capacitor to be tested off the negative pressure adsorption turntable.
[0008] The aforementioned reversing mechanism, through the cooperation of baffles, peeling plates, and support plates, can be applied to the reversing and conveying of capacitors under test on a negative pressure adsorption turntable. On one hand, it facilitates the detachment of the capacitors under test from the negative pressure adsorption turntable at pre-set transfer positions, without affecting capacitors under test at other positions on the turntable. On the other hand, during the detachment process, the baffles and peeling plates cooperate to support different positions of the capacitors under test, applying auxiliary forces to detach them from the negative pressure adsorption turntable. This facilitates coordination with other transfer equipment to transfer capacitors under test from circular motion to other motions for visual inspection. Furthermore, during and after the detachment process, it helps maintain the position and orientation of the capacitors under test in coordination with other transfer equipment, ensuring consistency in their position and orientation before and after the transition from circular motion to other motions.
[0009] In some embodiments, while the negative pressure adsorption turntable is rotating, the peeling plate abuts against the capacitor to be tested from above the negative pressure adsorption turntable at the transfer position, and the baffle abuts against the pin of the capacitor to be tested from below the negative pressure adsorption turntable at the transfer position.
[0010] In some embodiments, the baffle is provided with an arc-shaped retaining edge;
[0011] At the transfer position, the baffle abuts against the pin of the capacitor to be tested via the arc-shaped baffle.
[0012] In some embodiments, the connection reversing mechanism further includes a support base, the baffle is disposed on the support base, and is connected to the tray via the support base; or...
[0013] The connecting reversing mechanism further includes an adjusting block, the stripper plate is disposed on the adjusting block, and is connected to the support plate through the adjusting block; or...
[0014] The peeling plate has a shape-fitting area at the position where it abuts the capacitor to be tested.
[0015] In some embodiments, the tray has clearance grooves; or,
[0016] The tray has an installation groove, the adjustment block is partially embedded in the installation groove, and the peeling plate position is adjustablely set on the adjustment block.
[0017] In some embodiments, the connecting reversing mechanism further includes a fixing plate, which is connected to the support plate and together with the support plate, the connecting reversing mechanism is fixedly installed.
[0018] In some embodiments, the connection reversing mechanism further includes a limiting structure and a tray frame;
[0019] The pallet frame is connected to the pallet, and the limiting structure is disposed under the pallet frame. The limiting structure has a linear limiting passage area on one side of the pallet.
[0020] The peeling plate is adjacent to the limiting structure, and the transfer position is adjacent to the linear limiting passage area;
[0021] The peeling plate is used to transfer the capacitor to be tested into the linear limiting passage area by means of a magnetic suction device while the capacitor to be tested is being peeled off from the negative pressure adsorption turntable.
[0022] In some embodiments, the limiting structure includes a first limiting block and a second limiting block, and the first limiting block and the second limiting block are separately disposed to form the linear limiting passage area between the first limiting block and the second limiting block;
[0023] The first limiting block is closer to the baffle than the second limiting block, and the second limiting block is provided with a guide slope at the transfer position.
[0024] In some embodiments, a transfer and conveying device includes a negative pressure adsorption turntable, a magnetic suction device, and a connection and reversing mechanism as described in any embodiment;
[0025] The negative pressure adsorption turntable is used to adsorb the capacitor to be tested by negative pressure adsorption at the circumference;
[0026] The magnetic attraction device is used to magnetically attract the pins of the capacitor to be tested at the transfer position of the reversing mechanism.
[0027] The connection reversing mechanism is used to detach the capacitor to be tested from the negative pressure adsorption turntable at the transfer position.
[0028] In some embodiments, the transfer conveying device further includes a conveying track, on which the magnetic attraction device is disposed;
[0029] The conveying track is used to move the magnetic suction device to adjust the position of the magnetic suction device during the process of the connecting reversing mechanism peeling off the capacitor to be tested, so that the magnetic suction device is linked with the peeling plate of the connecting reversing mechanism, and the capacitor to be tested is transported by the magnetic suction device after the connecting reversing mechanism has completed peeling off the capacitor to be tested. Attached Figure Description
[0030] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0031] Figure 1 This is a schematic diagram of an embodiment of the reversing mechanism described in this application.
[0032] Figure 2 for Figure 1 Another schematic diagram of the embodiment shown.
[0033] Figure 3 for Figure 2 Another schematic diagram of the embodiment shown.
[0034] Figure 4 for Figure 3 Another schematic diagram of the embodiment shown.
[0035] Figure 5 for Figure 4 Another schematic diagram of the embodiment shown.
[0036] Figure 6 for Figure 5 The illustrated embodiment is shown in the following diagram.
[0037] Figure 7 for Figure 6 Another schematic diagram of the embodiment shown.
[0038] Figure 8 for Figure 5 Another schematic diagram of the embodiment shown.
[0039] Figure 9 for Figure 8 Another schematic diagram of the embodiment shown.
[0040] Figure 10 for Figure 9 Another schematic diagram of the embodiment shown.
[0041] Figure 11 for Figure 10 The illustrated embodiment is shown as an exploded view of the structure from another direction.
[0042] Figure 12 for Figure 9 The illustrated embodiment is shown in the following diagram.
[0043] Figure 13 for Figure 10 An enlarged schematic diagram of the application of some structures in the illustrated embodiment.
[0044] Figure 14 This is a schematic diagram of an embodiment of the transfer and conveying equipment described in this application.
[0045] Figure 15 for Figure 14 A partial structural schematic diagram of the embodiment shown.
[0046] Figure 16 for Figure 15 Another schematic diagram of the embodiment shown.
[0047] Figure 17 for Figure 16 The illustrated embodiment is shown as a partial enlarged structural diagram in another direction.
[0048] Figure 18 for Figure 14An enlarged schematic diagram of the application of some structures in the illustrated embodiment.
[0049] Reference numerals: negative pressure adsorption turntable (100), capacitor to be tested (200), pin (210), connection reversing mechanism (300), transfer position (301), limiting structure (310), first limiting block (311), second limiting block (312), linear limiting passage area (313), guide slope (314), baffle (320), arc-shaped baffle (321), peeling plate (330), shape adaptation area (331), tray (340), clearance groove (341), mounting groove (342), tray frame (350), support seat (360), adjusting block (370), fixing plate (380), magnetic suction device (400), conveying track (500), transfer conveying equipment (600). Detailed Implementation
[0050] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0051] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.
[0052] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0053] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0054] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and or" as used in this application includes any and all combinations of one or more of the associated listed items.
[0055] This application discloses a reversing mechanism and a transfer conveying device, which includes some or all of the technical features of the following embodiments; that is, the reversing mechanism and the transfer conveying device include some or all of the following structures. In one embodiment of this application, a reversing mechanism includes a baffle, a peeling plate, and a support plate; the baffle and the peeling plate are respectively connected to the support plate, and the baffle and the peeling plate together form a transfer position; the peeling plate is used to cooperate with a negative pressure adsorption turntable, and at the transfer position, it abuts against the capacitor to be tested adsorbed by the negative pressure adsorption turntable, so as to peel the capacitor to be tested off from the negative pressure adsorption turntable; the baffle is used to cooperate with the negative pressure adsorption turntable and the peeling plate, and when the peeling plate abuts against the capacitor to be tested, the baffle abuts against the pin of the capacitor to be tested at the transfer position, so as to cooperate with the peeling plate to peel the capacitor to be tested off from the negative pressure adsorption turntable. The aforementioned reversing mechanism, through the cooperation of baffles, peeling plates, and support plates, can be applied to the reversing and conveying of capacitors under test on a negative pressure adsorption turntable. On one hand, it facilitates the detachment of the capacitors under test from the negative pressure adsorption turntable at pre-set transfer positions, without affecting capacitors under test at other positions on the turntable. On the other hand, during the detachment process, the baffles and peeling plates cooperate to hold the capacitors under test at different positions, applying auxiliary forces to detach them from the negative pressure adsorption turntable. Therefore, it is beneficial to coordinate with other transfer equipment to transfer capacitors under test from circular motion to other motions for visual inspection. Furthermore, during and after detachment, it helps to maintain the position and orientation of the capacitors under test in conjunction with other transfer equipment, ensuring consistency in their position and orientation before and after the transition from circular motion to other motions. The following section will further elaborate on this. Figures 1 to 18The connecting and reversing mechanism and the transfer and conveying equipment are described in detail.
[0056] In some embodiments, a connection switching mechanism 300, such as Figure 1 and Figure 2 As shown, it includes a baffle 320, a peeling plate 330, and a support plate 340; combined with Figure 3 The baffle 320 and the peeling plate 330 are respectively connected to the support plate 340, and as shown... Figure 4 and Figure 5 As shown, the baffle 320 and the peeling plate 330 together form the transfer position 301; combined with Figure 15 and Figure 16 The peeling plate 330 is used in conjunction with the negative pressure adsorption turntable 100, and is combined with it. Figure 6 and Figure 7 The peeling plate 330 abuts against the capacitor 200 to be tested adsorbed by the negative pressure adsorption turntable 100 at the transfer position 301 to peel the capacitor 200 to be tested off the negative pressure adsorption turntable 100; the baffle 320 is used to cooperate with the negative pressure adsorption turntable 100 and the peeling plate 330. When the peeling plate 330 abuts against the capacitor 200 to be tested, the baffle 320 abuts against the pin 210 of the capacitor 200 to be tested at the transfer position 301 to cooperate with the peeling plate 330 to peel the capacitor 200 to be tested off the negative pressure adsorption turntable 100. This structural design, through the cooperation of baffle 320, peeling plate 330, and support plate 340, can be applied to the reversing transport of the capacitor 200 to be tested on the negative pressure adsorption turntable 100. On the one hand, it facilitates the peeling of the capacitor 200 to be tested from the negative pressure adsorption turntable 100 at the pre-set transfer position 301, without affecting the capacitors 200 to be tested at other positions on the negative pressure adsorption turntable 100. On the other hand, during the peeling process, baffle 320 and peeling plate 330 cooperate to hold the capacitor 200 to be tested at different positions, thereby applying an auxiliary force to the capacitor 200 to be tested to detach from the negative pressure adsorption turntable 100 at different positions. Therefore, it is beneficial to cooperate with other transfer equipment to transfer the capacitor 200 to be tested for appearance inspection from circular motion to other motion. Furthermore, during and after the peeling process, it is beneficial to cooperate with other transfer equipment to maintain the position and posture of the capacitor 200 to be tested, so as to ensure the consistency of the position and posture of the capacitor 200 to be tested before and after the transfer from circular motion to other motion.
[0057] In each embodiment, combined with Figure 5 and Figure 17 The baffle 320 and the peeling plate 330 are respectively connected to the support plate 340, and the baffle 320 and the peeling plate 330 together form a transfer position 301; in some embodiments, combined with Figure 7 and Figure 16While the negative pressure adsorption turntable 100 is rotating, the peeling plate 330 abuts against the capacitor 200 to be tested from above the negative pressure adsorption turntable 100 at the transfer position 301, and the baffle plate 320 abuts against the pin 210 of the capacitor 200 to be tested from below the negative pressure adsorption turntable 100 at the transfer position 301. This structural design, by having the peeling plate 330 abut against the capacitor 200 from above and the baffle plate 320 abut against its pin 210 from below, allows for precise peeling of the capacitor 200 from the turntable during rotation, preventing capacitor displacement or damage caused by turntable movement, thereby improving the accuracy and reliability of the peeling process. On the other hand, through the synergistic effect of the peeling plate 330 and the baffle 320, the capacitor 200 to be tested can be quickly and stably peeled off from the negative pressure adsorption turntable 100 at the transfer position 301, reducing possible jamming or repeated adjustments during the peeling process, thereby significantly improving the reversing transport efficiency of the capacitor 200 to be tested. Furthermore, during the peeling process, the peeling plate 330 and the baffle 320 support the capacitor 200 to be tested from different directions, effectively dispersing the stress during the peeling process and preventing excessive squeezing or pulling of the capacitor 200 to be tested, thus protecting the structural integrity of the capacitor 200 to be tested and reducing the risk of component damage caused by the peeling operation. Moreover, the cooperation of the baffle 320 and the peeling plate 330 not only peels the capacitor 200 to be tested from the negative pressure adsorption turntable 100, but also maintains the capacitor's position after peeling, ensuring that it maintains a consistent orientation and posture during subsequent transfers, providing a stable component state for subsequent testing or other operations, and ensuring the smooth operation of the entire production process.
[0058] In each embodiment, combined with Figure 15 and Figure 18 The peeling plate 330 is used in conjunction with the negative pressure adsorption turntable 100 to hold the capacitor 200 to be tested adsorbed by the negative pressure adsorption turntable 100 at the transfer position 301, so as to peel the capacitor 200 to be tested from the negative pressure adsorption turntable 100; in some embodiments, such as Figure 10 and Figure 11As shown, the peeling plate 330 has a shape adaptation area 331 at the position where it abuts the capacitor 200 to be tested. As an example, the shape adaptation area 331 is used to adapt to the outer peripheral surface of the capacitor 200 to ensure that the capacitor 200 is subjected to uniform force when the peeling plate 330 abuts against it, thus avoiding damage to the capacitor 200. Furthermore, the design of the shape adaptation area 331 also facilitates the peeling plate 330's adaptation to a wider range of capacitors 200 to be tested, thereby improving the adaptability of the connection reversing mechanism 300. For example, one peeling plate 330 can adapt to multiple capacitors 200 to be tested; only four or five peeling plates 330 are needed to adapt to eight or nine commonly used capacitors 200 to be tested. In other embodiments, a dedicated peeling plate 330 can be configured for each type of capacitor 200 to be tested. Furthermore, this structural design, on the one hand, by setting a shape-adapting area 331 at the abutment position of the peeling plate 330, ensures that the capacitor under test 200 is evenly stressed during the peeling process, avoiding deformation, scratches, or other mechanical damage to the capacitor under test 200 caused by excessive local stress, thereby ensuring the integrity and reliability of the capacitor under test 200. On the other hand, the shape-adapting area 331 closely fits the outer peripheral surface of the capacitor under test 200, providing more stable support and fixation during the peeling process, reducing the shaking or displacement of the capacitor under test 200 during peeling, thereby improving the stability and consistency of the peeling operation. Moreover, the design of the shape-adapting area 331 allows the peeling plate 330 to adapt to various specifications of the capacitor under test 200. This means that the connecting reversing mechanism 300 can adapt to capacitors under test 200 of different sizes and shapes without needing to replace the peeling plate 330 for each specification of the capacitor under test 200, thus significantly improving the versatility and flexibility of the connecting reversing mechanism 300, and reducing production costs and equipment maintenance difficulty. On the other hand, since the shape adaptation area 331 ensures that the capacitor under test 200 is uniformly stressed and stably fixed during the peeling process, peeling failures or repeated operations caused by uneven or unstable stress on the capacitor under test 200 can be reduced, thereby improving the efficiency of the entire reversing conveying process and shortening the production cycle. Furthermore, since the peeling plate 330 and the shape adaptation area 331 ensure that the capacitor under test 200 maintains a consistent stress state and posture during the peeling process, product quality differences caused by the peeling operation can be reduced, thereby improving the consistency and stability of product quality and contributing to enhancing the overall product quality and market competitiveness.
[0059] In each embodiment, combined with Figure 12 and Figure 13The baffle 320 is used to cooperate with the negative pressure adsorption turntable 100 and the peeling plate 330. With the peeling plate 330 abutting against the capacitor 200 to be tested, the baffle 320 abuts against the pin 210 of the capacitor 200 to be tested at the transfer position 301, so as to cooperate with the peeling plate 330 to peel the capacitor 200 to be tested from the negative pressure adsorption turntable 100. In some embodiments, such as... Figure 4 and Figure 5 As shown, the baffle 320 is provided with an arc-shaped retaining edge 321; at the transfer position 301, combined with Figure 6 and Figure 7The baffle 320 abuts against the pin 210 of the capacitor 200 to be tested via the arc-shaped baffle 321. As an example, the arc-shaped baffle 321 is configured to have the same arc shape as the outer periphery of the negative pressure adsorption turntable 100, and protrudes beyond the outer periphery of the negative pressure adsorption turntable 100. This allows the arc-shaped baffle 321 to abut against the pin 210 of the capacitor 200 while the negative pressure adsorption turntable 100 is adsorbing the capacitor 200, i.e., adsorbing the body of the capacitor 200. This structural design, on the one hand, provides precise support to the pin 210 by abutting against it with the arc-shaped baffle 321, preventing the pin 210 from bending or being damaged due to uneven force during the peeling process. This design is particularly suitable for situations where the pin 210 of the capacitor 200 to be tested is relatively fragile or delicate, effectively protecting the integrity of the pin. On the other hand, the arc-shaped baffle 321 matches the shape of the outer periphery of the negative pressure adsorption turntable 100 and protrudes beyond the outer periphery of the turntable. This design allows the baffle 320 to more stably support the pin 210 during the peeling process and works in conjunction with the peeling plate 330 to ensure that the capacitor under test 200 remains stable during peeling, reducing the risk of peeling failure due to pin 210 shaking or shifting. Furthermore, the arc-shaped baffle 321 design allows the baffle 320 to more accurately position and support the pin 210, reducing the adjustment and correction time for the pin 210 during peeling, thereby improving peeling efficiency. At the same time, this design also reduces the peeling failure rate caused by improper force on the pin 210, improving the reliability of the entire reversing conveying process. On the other hand, the shape of the arc-shaped baffle 321 matches the outer perimeter of the negative pressure adsorption turntable 100. This design allows the baffle 320 to adapt to capacitors 200 of different sizes. Especially when there are differences in the position and length of the pins 210 of the capacitors 200, the arc-shaped baffle 321 can still effectively provide support and protection, thereby enhancing the adaptability of the connection reversing mechanism 300 to various specifications of capacitors 200. Furthermore, during and after the peeling process, the arc-shaped baffle 321 can continuously support the pins 210, thereby maintaining the positional stability of the capacitors 200. This design helps ensure that the capacitors 200 maintain a consistent orientation and posture during subsequent transfer and testing, avoiding problems such as testing errors or the need for retesting due to changes in posture.
[0060] In some of these embodiments, such as Figure 8 and Figure 9 As shown, the connecting reversing mechanism 300 also includes a support base 360, the baffle 320 is disposed on the support base 360, and is connected to the tray 340 through the support base 360; combined with Figure 10 and Figure 11In some embodiments, the connection reversing mechanism 300 further includes an adjusting block 370, on which the stripping plate 330 is disposed and connected to the support plate 340; in some embodiments, the connection reversing mechanism 300 further includes a support base 360, on which the baffle 320 is disposed and connected to the support plate 340; and the connection reversing mechanism 300 further includes an adjusting block 370, on which the stripping plate 330 is disposed and connected to the support plate 340. Other embodiments follow the same principle and will not be described in detail. This structural design, on the one hand, provides a stable support base for the baffle 320 with the support base 360, ensuring that the baffle maintains sufficient rigidity and stability when abutting against the pin 210 of the capacitor 200 to be tested. This stable support helps reduce vibration or deformation of the baffle 320 during the stripping process, thereby improving the reliability of the stripping operation. On the other hand, the adjusting block 370 provides additional support and connection for the peeling plate 330, enabling the peeling plate 330 to apply force more stably when holding the capacitor 200 under test, avoiding peeling failure or damage to the capacitor 200 under test due to the instability of the peeling plate 330. Furthermore, through the connection between the support base 360 and the tray 340, the position and angle of the baffle 320 can be finely adjusted. This adjustment capability allows the baffle 320 to better adapt to capacitors 200 of different specifications, especially when there are differences in the position and length of the pins 210. The contact position and angle between the baffle 320 and the pins 210 can be optimized by adjusting the support base 360. Moreover, the design of the adjusting block 370 allows for flexible adjustment of the position and angle of the peeling plate 330. This adjustment function allows the stripper plate 330 to more precisely fit the outer peripheral surface of the capacitor 200 under test. Especially when handling capacitors 200 of different sizes or shapes, the contact position and angle between the stripper plate 330 and the capacitor 200 can be optimized by adjusting the adjusting block 370. Furthermore, this design allows the connecting reversing mechanism 300 to adapt to various specifications of capacitors 200 under test by simply adjusting the support base 360 and the adjusting block 370. This flexibility reduces the need for equipment replacement or modification due to changes in the specifications of the capacitor 200 under test, thereby improving the equipment's versatility and adaptability. Moreover, the design of the support base 360 and the adjusting block 370 allows for precise adjustment of the position and angle of the baffle 320 and the stripper plate 330, ensuring more accurate contact with the pins 210 and outer peripheral surface of the capacitor 200 under test during the stripping process. This precise positioning helps improve the success rate of the stripping operation, reduces repetitive operations due to inaccurate positioning, and thus improves operational efficiency.Furthermore, through the adjustment functions of the support base 360 and the adjustment block 370, the connection reversing mechanism 300 can adapt to various specifications of the capacitors 200 to be tested. It can replace the baffle 320 or the stripper 330 for each specification of the capacitors 200 to be tested, or it can share a stripper 330 for several capacitors 200 with similar specifications, thereby reducing the replacement cost and maintenance difficulty of the equipment.
[0061] In some of these embodiments, such as Figure 2 and Figure 3 As shown, the tray 340 has a recessed groove 341, which forms a workspace for use by other equipment. As an example, the recessed groove 341 serves as a camera path for an industrial camera to photograph the capacitor 200 under test. In some embodiments, such as... Figure 10 As shown, the tray 340 has a mounting groove 342, and the adjusting block 370 is partially embedded in the mounting groove 342. The peeling plate 330 is adjustablely positioned on the adjusting block 370, allowing the peeling plate 330 to accommodate capacitors 200 of more specifications. This structural design, by creating a clearance groove 341 on the tray 340, provides working space for other equipment such as industrial cameras, enabling the connecting and reversing mechanism 300 to be seamlessly integrated with other testing or auxiliary equipment. This design not only optimizes the spatial layout of the equipment but also improves the coordination between equipment, reduces interference between equipment, and ensures the smooth operation of the entire production process. For example, the clearance groove 341 serves as a shooting channel, providing a clear field of view for the industrial camera, allowing the camera to accurately aim at the capacitor 200 to be tested. This design helps improve testing accuracy and efficiency, ensuring that the appearance inspection of the capacitor can be completed accurately.
[0062] In some of these embodiments, such as Figure 9 and Figure 10As shown, the reversing mechanism 300 also includes a fixing plate 380, which is connected to the support plate 340 and together with the support plate 340, securely mounts the reversing mechanism 300. This structural design provides, on the one hand, stable support for the reversing mechanism 300 through the connection between the fixing plate 380 and the support plate 340, distributing stress and reducing the impact of vibration or external forces on the mechanism, ensuring stable operation of the reversing mechanism 300. On the other hand, the cooperation between the fixing plate 380 and the support plate 340 makes the reversing mechanism 300 more securely installed, reducing displacement or loosening caused by unstable installation, and improving the safety and reliability of the reversing mechanism 300's operation. Furthermore, the design of the fixing plate 380 makes the installation and disassembly of the reversing mechanism 300 more convenient, reducing installation difficulty and maintenance costs, and improving equipment maintenance efficiency. Finally, the fixing plate 380 enhances the anti-interference capability of the reversing mechanism 300, enabling it to operate stably in complex industrial environments and adapt to various working scenarios.
[0063] In some of these embodiments, such as Figure 2 and Figure 3 As shown, the connecting reversing mechanism 300 also includes a limiting structure 310 and a tray frame 350; the tray frame 350 is connected to the tray 340, the limiting structure 310 is disposed under the tray frame 350, and the limiting structure 310 has a linear limiting passage area 313 on one side of the tray 340; combined with Figure 4 and Figure 5 The peeling plate 330 is adjacent to the limiting structure 310, and the transfer position 301 is adjacent to the linear limiting passage area 313; combined with Figure 12 and Figure 13 The peeling plate 330 is used to transfer the capacitor 200 to be tested into the linear limiting passage area 313 via the magnetic suction device 400 while the capacitor 200 is being peeled from the negative pressure adsorption turntable 100. This structural design provides a precise path for the transfer of the capacitor 200, ensuring it moves along a predetermined trajectory during transfer and preventing deviation or jamming. Furthermore, the cooperation between the limiting structure 310 and the linear limiting passage area 313 provides stable constraint to the capacitor 200 during transfer, reducing swaying caused by vibration or external forces and ensuring a smooth transfer process. Finally, combined with the magnetic suction device 400, the peeling plate 330 can automatically peel the capacitor 200 from the negative pressure adsorption turntable 100 and transfer it into the linear limiting passage area 313 of the limiting structure 310, achieving automated operation and improving production efficiency. On the other hand, the limiting structure 310 is set under the pallet frame 350, making reasonable use of space and making the overall layout of the connecting reversing mechanism 300 more compact, saving the space occupied by the equipment.
[0064] In some embodiments, combined Figure 4 and Figure 5 The limiting structure 310 includes a first limiting block 311 and a second limiting block 312, which are separately disposed to form a linear limiting passage area 313 between the first limiting block 311 and the second limiting block 312. The first limiting block 311 is closer to the baffle 320 than the second limiting block 312, and the second limiting block 312 has a guide slope 314 at the transfer position 301. As an example, the guide slope 314 is used to regulate the direction of the capacitor 200 to be tested entering the linear limiting passage area 313. As an example, the first limiting block 311 and the second limiting block 312 have parallel edges to form a straight linear limiting passage area 313. This structural design, on the one hand, allows the guide slope 314 to regulate the direction of the capacitor 200 to be tested entering the linear limiting passage area 313, ensuring that the capacitor can accurately enter the limiting area and improving the accuracy of the transfer. On the other hand, the first limiting block 311 and the second limiting block 312 are separately arranged to form a linear limiting passage area 313, which can stably constrain the capacitor 200 under test during the transfer process, preventing the capacitor 200 under test from shifting or shaking during movement, ensuring the stability of the transfer process, and thus ensuring the positional consistency and stability of the capacitor 200 under test. Furthermore, the parallel edge design of the first limiting block 311 and the second limiting block 312 allows the linear limiting passage area 313 to have a certain width adjustment range, accommodating capacitors 200 of different sizes under test, enhancing the versatility and adaptability of the overall connection reversing mechanism 300. Moreover, the limiting area is formed by a simple block structure, eliminating the need for complex mechanical devices or sensors, simplifying the connection reversing mechanism 300, and reducing its manufacturing cost and maintenance difficulty.
[0065] In some embodiments, a transfer conveying device 600, such as... Figure 15 As shown, it includes a negative pressure adsorption turntable 100, a magnetic suction device 400, and a connection and reversing mechanism 300 as described in any embodiment. Since the connection and reversing mechanism 300 described in any embodiment is used, the transfer and conveying equipment 600 also has the beneficial technical effects of the connection and reversing mechanism 300, which will not be elaborated here.
[0066] As an example, combined Figure 16 and Figure 18The negative pressure adsorption turntable 100 is used to adsorb the capacitor 200 to be tested circumferentially using negative pressure adsorption, that is, the capacitor 200 to be tested is arranged in a circle on the negative pressure adsorption turntable 100. It can be understood that in the illustrated embodiment, the negative pressure adsorption turntable 100 has a groove partially accommodating the capacitor 200 to be tested, but this does not affect the understanding of those skilled in the art that the capacitor 200 to be tested is arranged in a circle on the negative pressure adsorption turntable 100, and that this circle is used as the circumference formed by the adsorption of the negative pressure adsorption turntable 100. Combined with... Figure 13 and Figure 17 The magnetic attraction device 400 is used to magnetically attract the pins 210 of the capacitor 200 to be tested at the transfer position 301 of the connection reversing mechanism 300; the connection reversing mechanism 300 is used to detach the capacitor 200 to be tested from the negative pressure adsorption turntable 100 at the transfer position 301. This structural design ensures that the capacitors 200 are stably and neatly arranged on the negative pressure adsorption turntable 100 by arranging them in a circular pattern, facilitating subsequent detachment and transfer operations. Furthermore, the connection reversing mechanism 300, in conjunction with the magnetic attraction device 400, precisely detaches the capacitor 200 from the negative pressure adsorption turntable 100 at the transfer position 301 and achieves stable transfer by magnetically attracting the pins 210, improving the accuracy and reliability of the operation. On the other hand, the magnetic adsorption device 400 avoids direct contact with the body of the capacitor 200 under test by magnetically adsorbing the pin 210, reducing the risk of mechanical damage to the capacitor 200 under test during the peeling and transfer process, and protecting the integrity of the capacitor 200 under test. Furthermore, the entire process is automated, from adsorption and arrangement to peeling and transfer, reducing manual intervention, improving production efficiency, and reducing labor intensity.
[0067] In some of these embodiments, such as Figure 18As shown, the transfer and conveying device 600 also includes a conveying track 500, on which the magnetic suction device 400 is disposed. The conveying track 500 is used to move the magnetic suction device 400 to adjust its position during the process of the reversing mechanism 300 peeling off the capacitor 200 to be tested. This allows the magnetic suction device 400 to be linked with the peeling plate 330 of the reversing mechanism 300, and the magnetic suction device 400 to transport the capacitor 200 to be tested after the reversing mechanism 300 has completed peeling off the capacitor 200. This structural design, on the one hand, allows the position of the magnetic suction device 400 to be precisely adjusted by the conveying track 500 to adapt to the peeling operation of the reversing mechanism 300, ensuring that the magnetic suction device 400 can attract the capacitor 200 to be tested at the correct time and position. On the other hand, the magnetic suction device 400 is linked with the peeling plate 330 of the connecting and reversing mechanism 300, making the peeling and transfer process of the capacitor 200 under test smoother, thereby improving the efficiency of the entire production process. Furthermore, after the connecting and reversing mechanism 300 completes the peeling, the magnetic suction device 400 can stably transport the capacitor 200 under test, reducing the risk of damage to the capacitor 200 during transfer and ensuring the stability, reliability, and consistency of the capacitor 200's position. Moreover, the conveying track 500 allows the movement path of the magnetic suction device 400 to be flexibly adjusted to adapt to different production layouts and needs, improving the versatility and adaptability of the transfer and conveying equipment 600.
[0068] As an example, the number of magnetic suction devices 400 is consistent with the number of capacitors 200 to be tested adsorbed by the negative pressure adsorption turntable 100, that is, consistent with the number of adsorption positions of the negative pressure adsorption turntable 100. During the detection process, the moving speed of the magnetic suction devices 400 on the conveying track 500, that is, the speed at which the conveying track 500 drives the magnetic suction devices 400 to move, which can also be called the moving rhythm or step distance of the magnetic suction devices 400 on the conveying track 500, is synchronized with each rotation angle of the negative pressure adsorption turntable 100. Each magnetic suction device 400 corresponds to one capacitor 200 to be tested adsorbed by the negative pressure adsorption turntable 100, thereby achieving automated production. This structural design, on the one hand, ensures that the number of magnetic suction devices 400 is consistent with the number of adsorption positions of the negative pressure adsorption turntable 100, and that their moving speed is synchronized with the rotation angle of the negative pressure adsorption turntable 100, which helps to ensure that each magnetic suction device 400 can accurately correspond to one capacitor 200 to be tested, thereby facilitating efficient peeling and transfer operations. On the other hand, through precise synchronous control, the magnetic suction device 400 can promptly and accurately attract and transfer capacitors each time the negative pressure adsorption turntable 100 rotates, thereby reducing waiting time and operating steps, and significantly improving production efficiency. Furthermore, this design achieves full automation from adsorption and peeling to transfer, reducing manual intervention, lowering labor intensity, and improving production stability and consistency. Moreover, the synchronous operation of the magnetic suction device 400 and the negative pressure adsorption turntable 100 avoids the omission or damage of the capacitors 200 to be tested due to improper operation or equipment asynchrony, reducing the error rate in the production process. Furthermore, the one-to-one correspondence between the magnetic suction device 400 and the adsorption position of the negative pressure adsorption turntable 100 ensures that the transfer and conveying equipment 600 maintains high efficiency during operation, avoiding equipment idleness or resource waste.
[0069] It should be noted that other embodiments of this application also include a docking and reversing mechanism and a transfer and conveying device formed by combining the technical features of the above embodiments.
[0070] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0071] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.
Claims
1. A connecting reversing mechanism (300), characterized in that, Includes a baffle (320), a peeler (330), and a support plate (340); The baffle (320) and the peeling plate (330) are respectively connected to the support plate (340), and the baffle (320) and the peeling plate (330) together form a transfer position (301). The peeling plate (330) is used in conjunction with the negative pressure adsorption turntable (100) to hold the capacitor to be tested (200) adsorbed by the negative pressure adsorption turntable (100) at the transfer position (301) so as to peel the capacitor to be tested (200) from the negative pressure adsorption turntable (100). The baffle (320) is used in conjunction with the negative pressure adsorption turntable (100) and the peeling plate (330). When the peeling plate (330) is holding the capacitor to be tested (200), the baffle (320) holds the pin (210) of the capacitor to be tested (200) at the transfer position (301) so as to work together with the peeling plate (330) to peel the capacitor to be tested (200) off the negative pressure adsorption turntable (100).
2. The connecting reversing mechanism (300) according to claim 1, characterized in that, While the negative pressure adsorption turntable (100) is rotating, the peeling plate (330) abuts against the capacitor to be tested (200) from above the negative pressure adsorption turntable (100) at the transfer position (301), and the baffle (320) abuts against the pin (210) of the capacitor to be tested (200) from below the negative pressure adsorption turntable (100) at the transfer position (301).
3. The connecting reversing mechanism (300) according to claim 1, characterized in that, The baffle (320) is provided with an arc-shaped retaining edge (321); At the transfer position (301), the baffle (320) abuts against the pin (210) of the capacitor to be tested (200) through the arc-shaped baffle (321).
4. The connecting reversing mechanism (300) according to claim 1, characterized in that, The connecting reversing mechanism (300) further includes a support base (360), the baffle (320) is disposed on the support base (360), and is connected to the tray (340) through the support base (360); or, The connecting reversing mechanism (300) further includes an adjusting block (370), the peeling plate (330) is disposed on the adjusting block (370), and is connected to the support plate (340) through the adjusting block (370); or, The peeling plate (330) has a shape-fitting area (331) at the position where it abuts the capacitor (200) to be tested.
5. The connecting reversing mechanism (300) according to claim 4, characterized in that, The tray (340) is provided with a clearance groove (341); or, The tray (340) has an installation groove (342), the adjustment block (370) is partially embedded in the installation groove (342), and the peeling plate (330) is adjustablely positioned on the adjustment block (370).
6. The connecting reversing mechanism (300) according to claim 1, characterized in that, The connecting reversing mechanism (300) also includes a fixing plate (380), which is connected to the support plate (340) and together with the support plate (340) is fixedly installed on the connecting reversing mechanism (300).
7. The connection reversing mechanism (300) according to any one of claims 1 to 6, characterized in that, The connecting reversing mechanism (300) also includes a limiting structure (310) and a tray frame (350). The pallet frame (350) is connected to the pallet (340), and the limiting structure (310) is disposed under the pallet frame (350). The limiting structure (310) has a linear limiting passage area (313) on one side of the pallet (340). The peeling plate (330) is adjacent to the limiting structure (310), and the transfer position (301) is adjacent to the linear limiting passage area (313). The peeling plate (330) is used to transfer the capacitor to be tested (200) into the linear limiting passage area (313) by means of a magnetic suction device (400) while the capacitor to be tested (200) is peeled off from the negative pressure adsorption turntable (100).
8. The connecting reversing mechanism (300) according to claim 7, characterized in that, The limiting structure (310) includes a first limiting block (311) and a second limiting block (312), and the first limiting block (311) and the second limiting block (312) are separately arranged to form the linear limiting passage area (313) between the first limiting block (311) and the second limiting block (312). The first limiting block (311) is closer to the baffle (320) than the second limiting block (312), and the second limiting block (312) is provided with a guide slope (314) at the transfer position (301).
9. A transfer and conveying device (600), characterized in that, It includes a negative pressure adsorption turntable (100), a magnetic suction device (400), and a connection and reversing mechanism (300) as described in any one of claims 1 to 8. The negative pressure adsorption turntable (100) is used to adsorb the capacitor (200) to be tested by negative pressure adsorption at the circumference. The magnetic attraction device (400) is used to magnetically attract the pin (210) of the capacitor to be tested (200) at the transfer position (301) of the connection reversing mechanism (300). The connection reversing mechanism (300) is used to detach the capacitor to be tested (200) from the negative pressure adsorption turntable (100) at the transfer position (301).
10. The transfer and conveying device (600) according to claim 9, characterized in that, The transfer conveying equipment (600) further includes a conveying track (500), and the magnetic suction device (400) is disposed on the conveying track (500); The conveying track (500) is used to move the magnetic suction device (400) to adjust the position of the magnetic suction device (400) during the process of the connecting reversing mechanism (300) peeling off the capacitor to be tested (200), so that the magnetic suction device (400) is linked with the peeling plate (330) of the connecting reversing mechanism (300), and the capacitor to be tested (200) is transported by the magnetic suction device (400) after the connecting reversing mechanism (300) has completed peeling off the capacitor to be tested (200).