A flexible cleaning probe structure for ICT test bed

By designing an elastic cleaning probe structure for ICT test needle beds, and using protective covers and sponge strips to automatically clean foreign objects from the probes, the problem of probes being contaminated with dust and oil is solved, improving testing efficiency and probe protection.

CN224456799UActive Publication Date: 2026-07-03SHENZHEN ANTALI TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN ANTALI TECH CO LTD
Filing Date
2025-07-09
Publication Date
2026-07-03

AI Technical Summary

Technical Problem

The probes of existing ICT test beds are prone to getting dust and oil during use, which can lead to poor contact and affect test results. In addition, manual cleaning is inefficient.

Method used

Design an elastic cleaning probe structure for ICT test needle beds, including a probe body, a protective cover, an elastic rubber band ring, and a sponge strip. The protective cover protects the probe, the sponge strip cleans foreign objects, and the combination of the telescopic movement of the moving column and the bellows enables automated cleaning.

Benefits of technology

It achieves automated probe cleaning, reduces the impact of foreign objects on detection, improves cleaning efficiency, protects probes from damage by foreign objects, and is adaptable to test points at different heights.

✦ Generated by Eureka AI based on patent content.

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    Figure CN224456799U_ABST
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Abstract

This utility model discloses an elastic cleaning probe structure for an ICT test probe bed, including a probe body, a first protective cover, a second protective cover, an elastic band ring, a limiting plate, and a guide groove. The probe body is externally provided with the first and second protective covers, which can form a hollow cylindrical structure. The first and second protective covers are positioned opposite each other and are secured together using the elastic band ring. A limiting plate is located on one side above the first and second protective covers, and is fixed to the frame of the test probe bed. A guide groove is provided on the limiting plate, allowing the first and second protective covers to move along the groove. This utility model has a reasonable design; the first and second protective covers can shield and protect the probe body when it is not in use.
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Description

Technical Field

[0001] This utility model belongs to the field of ICT test bed, and particularly relates to an elastic cleaning probe structure for an ICT test bed. Background Technology

[0002] In ICT testing, probes are key components that need to maintain good electrical contact with test points on the circuit board under test. In actual use, probe heads are prone to getting contaminated with dust, oil, and residual flux from the circuit board under test. These foreign objects can affect the contact between the probe and the test point, thus affecting the subsequent test results. Currently, probes in ICT test beds are mostly cleaned manually with brushes, which is a waste of a lot of time. Utility Model Content

[0003] The purpose of this invention is to provide an elastic cleaning probe structure for an ICT test bed to solve the above-mentioned technical problems.

[0004] To achieve the above objectives, the present invention adopts the following technical solution:

[0005] An elastic cleaning probe structure for an ICT test bed includes a probe body, a first protective cover, a second protective cover, an elastic band ring, a limiting plate, and a guide groove. The probe body is provided with the first and second protective covers, which can form a hollow cylindrical structure. The first and second protective covers are arranged opposite to each other and are fastened by the elastic band ring after being combined. A limiting plate is provided on one side above the first and second protective covers and is fixed to the frame of the test bed. A guide groove is provided on the limiting plate, and the first and second protective covers can move along the guide groove.

[0006] Preferably, the probe body includes a probe post and a movable post. The movable post is installed below the probe post and can move up and down in the vertical direction. The probe post has a hollow interior design. A spring with screws is installed at the top of the movable post. The top of the spring is connected to the top of the probe post. The probe post, spring, and movable post are all made of conductive materials.

[0007] Preferably, the probe body is fitted with a corrugated tube, which is tapered to fit the shape of the probe body. The inner wall of the corrugated tube is provided with a sponge strip bonded to it. The sponge strip is in contact with the probe body. There are two sponge strips, which are symmetrically arranged along the center of the corrugated tube.

[0008] Preferably, the first protective cover and the second protective cover are provided with a shaft on one side, the shaft is connected to the slider, the slider is installed in the guide groove, and an integrally formed extension block is provided on one side of the slider. The extension block is provided with a threaded fastening screw, which can limit and fix the slider.

[0009] Compared with the prior art, this utility model has the following advantages: The design of this utility model is reasonable; the design of the first and second protective covers can shield and protect the probe body when it is not in use, reducing damage to the probe body from external impacts; the moving column can move up and down under the action of a spring, thus meeting the testing needs of test points at different heights; the corrugated tube and sponge strip can reduce dust adsorption on the probe body, and the sponge strip inside the corrugated tube can clean foreign objects from the probe body by manually rotating the corrugated tube, reducing the impact of foreign objects on the detection; the first and second protective covers can rotate along the axis, and the slider can move along the guide groove, so that when the probe body needs to be used, the first and second protective covers can be moved away from the probe body and rotated, ensuring that the first and second protective covers do not affect the use of the probe body. Attached Figure Description

[0010] Figure 1 This is a schematic diagram of the elastic cleaning probe structure of the ICT test bed of this utility model.

[0011] Figure 2 This is an exploded view of the elastic cleaning probe structure of the ICT test bed of this utility model.

[0012] Figure 3 This is a partial schematic diagram of the second protective cover of the elastic cleaning probe structure of the ICT test needle bed of this utility model.

[0013] Figure 4 This is a cross-sectional view of the probe body of the elastic cleaning probe structure of the ICT test needle bed of this utility model.

[0014] Figure 5 This is a cross-sectional view of the bellows in the elastic cleaning probe structure of the ICT test needle bed of this utility model. Detailed Implementation

[0015] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0016] like Figures 1-5As shown, an elastic cleaning probe structure for an ICT test needle bed includes a probe body 1, a first protective cover 2, a second protective cover 3, an elastic band ring 4, a limiting plate 5, and a guide groove 6. The probe body 1 is externally provided with the first protective cover 2 and the second protective cover 3, which can form a hollow cylindrical structure. The first protective cover 2 and the second protective cover 3 are arranged opposite to each other and are secured by the elastic band ring 4 after combination. A limiting plate 5 is provided on one side above the first protective cover 2 and the second protective cover 3, and the limiting plate 5 is fixed to the frame of the test needle bed. A guide groove 6 is provided on the limiting plate 5, allowing the first protective cover 2 and the second protective cover 3 to move along the guide groove 6. The probe body 1 includes a probe post 7 and a movable post 8. The movable post 8 is installed below the probe post 7 and can move vertically. The probe column 7 is hollow inside and moves up and down. The top of the moving column 8 is equipped with a spring 13 with screws. The top of the spring 13 is connected to the top of the probe column 7. The probe column 7, spring 13 and moving column 8 are all made of conductive material. The probe body 1 is covered with a bellows 11. The bellows 11 is tapered to adapt to the shape of the probe body 1. The inner wall of the bellows 11 is provided with a sponge strip 14. The sponge strip 14 is in contact with the probe body 1. There are two sponge strips 14. The two sponge strips 14 are symmetrically arranged along the center of the bellows 11. The first protective cover 2 and the second protective cover 3 are provided with a shaft 9 on one side. The shaft 9 is connected to the slider 10. The slider 10 is installed in the guide groove 6. The slider 10 is provided with an integrally formed extension block on one side. The extension block is provided with a threaded fastening screw 12. The fastening screw 12 can limit and fix the slider 10.

[0017] The working principle of this utility model is as follows: When the probe body is needed for testing, firstly, manually move the first and second protective covers away from the probe body, and simultaneously rotate the first and second protective covers to a position parallel to the limiting plate. Fix the slider with fastening screws, and use the pull rope to keep the first and second protective covers parallel to the limiting plate. The moving column on the probe body can be height adjusted under the action of the spring to adapt to test points of different heights. At the same time, the bellows on the probe body can extend and retract with the probe body. If there are foreign objects adhering to the probe body, the bellows can be manually rotated, and the sponge strip inside the bellows can be used to clean the foreign objects. When the probe body is not in use, the fastening screws can be loosened to move the slider along the guide groove. The first and second protective covers on the slider move closer to the probe body, and at the same time, rotate the first and second protective covers to wrap around the probe body. Finally, the first and second protective covers are reinforced with elastic band rings.

[0018] The above description is a preferred embodiment of the present utility model. For those skilled in the art, any changes, modifications, substitutions and variations made to the implementation methods without departing from the principles and spirit of the present utility model, based on the teachings of the present utility model, still fall within the protection scope of the present utility model.

Claims

1. A flexible cleaning probe structure of ICT test needle bed, comprising a probe body (1), a first protective cover (2), a second protective cover (3), a flexible rubber band ring (4), a limiting plate (5), a guide groove (6), characterized in that, The probe body (1) is provided with a first protective cover (2) and a second protective cover (3) on the outside. The first protective cover (2) and the second protective cover (3) can form a hollow cylindrical structure. The first protective cover (2) and the second protective cover (3) are arranged opposite to each other. After the first protective cover (2) and the second protective cover (3) are combined, they are fastened by an elastic rubber band ring (4). A limiting plate (5) is provided on one side above the first protective cover (2) and the second protective cover (3). The limiting plate (5) is fixed on the frame of the test needle bed. A guide groove (6) is opened on the limiting plate (5). The first protective cover (2) and the second protective cover (3) can move along the guide groove (6).

2. The flexible cleaning probe structure of an ICT test needle bed according to claim 1, characterized in that, The probe body (1) includes a probe column (7) and a movable column (8). The movable column (8) is installed below the probe column (7). The movable column (8) can move up and down in the vertical direction. The probe column (7) has a hollow interior. The top of the movable column (8) is equipped with a spring (13) installed with screws. The top of the spring (13) is connected to the top of the probe column (7). The probe column (7), spring (13) and movable column (8) are all made of conductive materials.

3. The flexible cleaning probe structure of an ICT test needle bed according to claim 1, characterized in that, The probe body (1) is fitted with a corrugated tube (11) on the outside. The corrugated tube (11) is tapered to adapt to the shape of the probe body (1). The inner wall of the corrugated tube (11) is provided with a sponge strip (14) bonded to it. The sponge strip (14) is in contact with the probe body (1). There are two sponge strips (14), and the two sponge strips (14) are symmetrically arranged along the center of the corrugated tube (11).

4. The flexible cleaning probe structure of an ICT test needle bed according to claim 1, characterized in that, The first protective cover (2) and the second protective cover (3) are provided with a shaft (9) on one side. The shaft (9) is connected to the slider (10). The slider (10) is installed in the guide groove (6). The slider (10) is provided with an integrally formed extension block on one side. The extension block is provided with a threaded fastening screw (12). The fastening screw (12) can limit and fix the slider (10).