A lamp-lighting test device and a lamp-lighting test board

Abstract

This application relates to the technical field of lighting effect testing, and more particularly to a lighting test device and lighting test board. It includes: a power module, a DIP switch module, several lighting array units, a lighting array switch module, and a positioning hole structure. Each lighting array unit contains a lighting array with the same number of rows and columns, and the lamp spacing of the lighting arrays in different lighting array units is different. The positioning hole structure is disposed on the outer peripheral edge of the lighting array unit for stacking optical structure layers. The first end of each lighting array unit is electrically connected to the first end of the corresponding lighting array switch module, and the second end of each lighting array switch module is electrically connected to the first end of the power module. The lighting array switch module controls the power supply state of the corresponding lighting array unit. The second and third ends of the power module are connected in series with all lighting array units through the DIP switch module to form a closed loop. The DIP switch module controls the lighting on / off of the lamps at the same point in each lighting array unit. By coordinating the conduction states of the DIP switch module and the lighting array switch module, combined with the stacked optical structure layers, batch synchronous testing of multiple lighting effects is achieved.

Description

Technical Field

[0001] This application relates to the technical field of lighting effect testing, and in particular to a lighting test device and a lighting test board. Background Technology

[0002] In the fields of optics and electronics, lighting test devices are widely used, especially in the performance testing of optoelectronic devices and lighting equipment. While existing lighting test devices can test single or small arrays of lamps, they suffer from limitations in terms of test variety and flexibility. This is particularly problematic when performing large-scale batch testing with varying luminous efficiencies, failing to meet the requirements for flexibility and adaptability. Therefore, designing a lighting test device capable of batch testing with different luminous efficiencies is of great significance.

[0003] Typically, lighting testing devices need to be able to precisely control the on / off state of each lamp element to achieve different light output effects. To simplify the control system, existing devices often employ a single control method, such as only changing the on / off state of the lamp elements, which is insufficient for tests requiring further adjustment of luminous efficacy. In existing technologies, some devices attempt to adjust luminous efficacy by changing the thickness of the support frame or the OD (optical density) value of the film material; however, these adjustment methods are relatively simple and, in practical applications, are limited by physical structure and materials, making it difficult to achieve flexible combinations of multiple parameters for testing.

[0004] Therefore, existing technologies suffer from insufficient flexibility in testing light efficacy and difficulty in efficiently testing different light efficacy in batches. There is an urgent need for a new lighting testing device to meet the needs of different application scenarios and improve testing efficiency and flexibility. Utility Model Content

[0005] To overcome the shortcomings of the prior art, this application provides a lighting test device and a lighting test board to meet the needs of different application scenarios and improve testing efficiency and flexibility.

[0006] The technical solution adopted by this application to solve its technical problem is:

[0007] In a first aspect, this application provides a lighting test device, including: a power module, a DIP switch module, several lamp array units, a lamp array switch module and a positioning hole structure, each of the lamp array units includes a lamp array with the same number of rows and columns, and the lamp spacing of the lamp arrays in different lamp array units is different.

[0008] The positioning hole structure is disposed on the outer peripheral edge of the lamp array unit for stacking optical structure layers;

[0009] The first end of each lamp array unit is electrically connected to the first end of the corresponding lamp array switch module, and the second end of each lamp array switch module is electrically connected to the first end of the power supply module. The power supply status of the corresponding lamp array unit is controlled by the lamp array switch module.

[0010] The second and third terminals of the power module are connected in series with all the lamp array units through the DIP switch module to form a closed loop. The DIP switch module controls the lighting and extinguishing of the lamps at the same point in each lamp array unit.

[0011] By coordinating the conduction states of the DIP switch module and the lamp array switch module, and combining the stacked optical structure layers, batch synchronous testing of multiple lighting effects can be achieved.

[0012] Optionally, it also includes: a total voltage test module, which is electrically connected between the first end of the power supply module and the second end of all the lamp array units, and is used to monitor the total voltage value of the parallel circuit of each lamp array unit by sampling the voltage signal of the total voltage test module in real time.

[0013] Optionally, a plurality of lamp array voltage testing modules are provided, with one lamp array voltage testing module corresponding to each lamp array unit, for monitoring the independent voltage value of the corresponding lamp array unit in real time by sampling the lamp array voltage testing module.

[0014] Optionally, it also includes: a plurality of lamp array current testing modules, each of the lamp array units being provided with a corresponding lamp array current testing module, used to monitor the independent current value of the corresponding lamp array unit in real time by sampling the lamp array current testing module.

[0015] Optionally, the power module integrates a master switch unit;

[0016] The first end of the main switch unit is electrically connected to an external power source, and the second end is electrically connected to each lamp array switch module and DIP switch module, respectively, for centralized control of the overall power supply of the lighting test device.

[0017] Optionally, the power module further includes a protection unit;

[0018] The protection unit is connected in series between the second end of the main switch unit and the power supply connection node of each lamp array switch module and DIP switch module, and is used to perform overcurrent protection and short circuit protection for the lighting test device.

[0019] Optionally, the optical structure layer includes a support frame of different thicknesses and a film material with different OD values;

[0020] By coordinating the adjustment of the thickness of the support frame, the OD value of the membrane material, the on / off state of a single lamp, and the voltage and current parameters of the power module, a multi-parameter combined luminous efficacy test can be achieved.

[0021] Secondly, this application provides a lighting test board equipped with the aforementioned lighting test device.

[0022] The beneficial effects of this application are as follows: it includes a power supply module, a DIP switch module, several lamp array units, a lamp array switch module, and a positioning hole structure. The power supply module is responsible for providing a stable operating power supply, ensuring that each lamp array unit can work normally. The DIP switch module is used to control the on / off state of the lamps at the same position in the array of all activated lamp array units by changing the conduction state of the internal circuit. Each lamp array unit includes a lamp array with the same number of rows and columns, and the lamp spacing between different lamp array units is different, thereby simulating diverse light output effects. The positioning hole structure is located on the outer periphery of the lamp array unit and is used to stack optical structure layers to adjust the light output characteristics during testing. The lamp array switch module is used to control the power supply state of the corresponding lamp array unit, ensuring that each unit can work independently or work online as needed. By coordinating the conduction states of the DIP switch module and the lamp array switch module, different optoelectronic devices or lighting equipment can be tested simultaneously in batches under different light effect modes, achieving efficient and flexible light effect testing. Attached Figure Description

[0023] Figure 1 This is a first principle block diagram of the lamp testing device provided in the embodiments of this application;

[0024] Figure 2 This is a second principle block diagram of the lighting test device provided in the embodiments of this application. Detailed Implementation

[0025] The present application will be further described below with reference to the accompanying drawings and embodiments.

[0026] The following will clearly and completely describe the concept, specific structure, and resulting technical effects of this application in conjunction with embodiments and accompanying drawings, so as to fully understand the purpose, features, and effects of this application. Obviously, the described embodiments are only a part of the embodiments of this application, not all of them. Other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are all within the scope of protection of this application. Furthermore, all connections / linkages involved in the patent do not simply refer to direct contact between components, but rather to the ability to form a better connection structure by adding or reducing connecting accessories according to specific implementation conditions. The various technical features in this application can be combined interactively without contradicting each other.

[0027] Reference Figure 1 , Figure 1This is a first principle block diagram of the lighting test device provided in this application embodiment, which shows that the lighting test device provided in this application embodiment includes a power supply module, a DIP switch module, several lamp array units, a lamp array switch module, and a positioning hole structure (positioning hole structure diagram not shown). The following is in conjunction with... Figure 1 Please provide a detailed explanation:

[0028] Regarding the power module: The power module integrates a master switch unit;

[0029] The first end of the main switch unit is electrically connected to an external power source, and the second end is electrically connected to each lamp array switch module and DIP switch module, respectively, for centralized control of the overall power supply of the lighting test device.

[0030] Specifically, the power module integrates a master switch unit, which is electrically connected to an external power source (such as a DC or AC power supply system) via its first terminal to introduce electrical energy, and electrically connected to each lamp array switch module (a switch component that independently controls the power supply to each lamp array unit) and a DIP switch module (a digital switch component used to encode and control the lighting logic of the lamps) via its second terminal, forming the main power supply path. Furthermore, in this embodiment, to facilitate access to an external power source, the power output uses either soldering or pin headers for selection.

[0031] In addition, the power module also includes a protection unit;

[0032] The protection unit is connected in series between the second end of the main switch unit and the power supply connection node of each lamp array switch module and DIP switch module, and is used to perform overcurrent protection and short circuit protection for the lighting test device.

[0033] Specifically, the power module further includes a protection unit (such as a fuse, overcurrent protection circuit, etc.). This protection unit is connected in series between the second terminal of the main switch unit and the power supply connection node of each lamp array switch module and DIP switch module, forming a safety barrier on the power transmission path. Specifically, the protection unit monitors the current and voltage status in the circuit in real time. When overcurrent, short circuit, or other conditions are detected, it automatically disconnects the power connection between the main switch unit and the downstream modules (lamp array switch modules, DIP switch modules), thereby avoiding equipment damage or safety hazards caused by current overload or line short circuit.

[0034] Regarding the light array unit: Each of the light array units contains a light array with the same number of rows and columns, and the light spacing of the light arrays in different light array units is different;

[0035] For example, refer to Figure 2 , Figure 2This is a second principle block diagram of the lighting test device provided in the embodiments of this application. Specifically, in one embodiment, the lighting test device is provided with nine lamp array units with different lamp spacings. The lamp spacings of these lamp array units are as follows: 4×4MM, 5×5MM, 6×6MM, 7×7MM, 8×8MM, 9×9MM, 10×10MM, 11×11MM, and 12×12MM.

[0036] Regarding the light array switch module: the first end of each light array unit is electrically connected to the first end of the corresponding light array switch module, and the second end of each light array switch module is electrically connected to the first end of the power supply module. The power supply status of the corresponding light array unit is controlled by the light array switch module.

[0037] Specifically, each lamp array unit is equipped with an independent lamp array switch module that controls the opening and closing of the lamp array unit. When the lamp array switch module is operated, the state of its internal contacts (on or off) directly determines whether the corresponding lamp array unit is connected to the power circuit. For example, when the switch module is closed, the current flows from the first end of the power module through the switch module to the lamp array unit, activating its lighting array; when it is open, the power supply to the unit is cut off, thereby realizing the start and stop control of a single lamp array unit.

[0038] For example, refer to Figure 2 When testing is required using light arrays 2, 6, and 8, turn on light array switches 2, 6, and 8 respectively, and turn off all other light array switches. In this case, adjusting the brightness of the lights by controlling the DIP switch module described below will only be performed in the light array units where the light array switches are turned on.

[0039] Furthermore, between the lamp array unit and the power supply module, there is also a total voltage test module, which is electrically connected between the first end of the power supply module and the second end of all the lamp array units, and is used to monitor the total voltage value of the parallel circuit of each lamp array unit by sampling the voltage signal of the total voltage test module in real time.

[0040] Specifically, based on the above settings, by sampling the voltage of the total voltage test module, the total voltage of all the lights on the current device can be tested, so as to calculate the power consumption during the test.

[0041] Furthermore, to facilitate testing the current and voltage values ​​of each individual lamp array, this embodiment of the application further includes a lamp array voltage testing module and a lamp array current testing module, specifically:

[0042] A plurality of lamp array voltage testing modules are provided, with one lamp array voltage testing module corresponding to each lamp array unit, for monitoring the independent voltage value of the corresponding lamp array unit in real time by sampling the lamp array voltage testing module;

[0043] A plurality of lamp array current testing modules are provided, with one lamp array current testing module corresponding to each lamp array unit, for monitoring the independent current value of the corresponding lamp array unit in real time by sampling the lamp array current testing module.

[0044] Specifically, the device is equipped with multiple lamp array voltage testing modules, one of which is installed on each lamp array unit. Its function is to monitor the unique voltage value of the corresponding lamp array unit in real time and with high accuracy by collecting data from the lamp array voltage testing modules. Simultaneously, an equal number of lamp array current testing modules are also provided, one for each lamp array unit. These modules monitor the unique current value of their respective lamp array units in real time through sampling.

[0045] Regarding the DIP switch module: The second and third terminals of the power module are connected in series with all the lamp array units through the DIP switch module to form a closed loop, and the DIP switch module controls the lighting and extinguishing of the lamps at the same point in each lamp array unit.

[0046] Specifically, the DIP switch module is equipped with multiple DIP switches. Since the device provided in this application has multiple light array units with the same number of rows and columns, each DIP switch is used to control the on / off state of the lights at the same position in all the light array units. For example, suppose a certain DIP switch is used to control the on / off state of the light in the second row and second column. When this switch is turned on, the lights in the second row and second column of all the light array units that can be lit will light up.

[0047] More specifically, in the embodiments of this application, based on the rated current limit of the DIP switch and its fragile characteristics (suitable only for controlling the on / off state of a single lamp), its operation logic is the opposite of that of the lamp array switch: before the test, all DIP switches need to be preset to the closed state, and after the test, they also need to be kept in the closed state to avoid contact wear caused by frequent switching, thereby extending the service life of the switch components.

[0048] Regarding the positioning hole structure: The positioning hole structure is disposed on the outer peripheral edge of the lamp array unit for stacking optical structure layers;

[0049] The optical structure layer includes a support frame of different thicknesses and a film material with different OD values;

[0050] By coordinating the adjustment of the thickness of the support frame, the OD value of the membrane material, the on / off state of a single lamp, and the voltage and current parameters of the power module, a multi-parameter combined luminous efficacy test can be achieved.

[0051] Specifically, the positioning holes on the outer periphery of the device plate can be used to place support frames of different thicknesses. In this embodiment, a plastic frame is used as an example. At the same time, a modular reusable support frame (i.e., a "shared plastic frame") can also be designed to integrate and fix optical film materials such as diffuser plates (transparent plates for uniformly scattering light sources), diffuser films (films with surface microstructures to reduce direct light exposure), and brightness enhancement films (functional film materials with prism structures to improve brightness uniformity) into the same frame. Quick assembly and disassembly can be achieved through standardized buckles or magnetic interfaces, avoiding damage or contamination of film materials due to frequent individual handling, thereby reducing material consumption and testing costs during the research and development stage.

[0052] Furthermore, this application embodiment also proposes that by preparing two basic frames with thicknesses of 1.0 mm and 1.5 mm (or a single 0.5 mm thick frame), multiple layers can be stacked and combined according to the target OD value (optical density) requirement to achieve convenient adjustment of the OD value for evaluating brightness and lighting effect.

[0053] Secondly, this application provides a lighting test board, which is equipped with the aforementioned lighting test device.

[0054] Specifically, the pad design of this test board can share Osram 1515, Jufeng / Refond 2016, and Refond 3030, without any restrictions.

[0055] The above is a detailed description of the preferred embodiments of this application. However, the invention of this application is not limited to the embodiments described. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of this application. All such equivalent modifications or substitutions are included within the scope defined by the claims of this application.

Claims

1. A light test device, characterized by, include: The system includes a power module, a DIP switch module, several lamp array units, a lamp array switch module, and a positioning hole structure. Each lamp array unit contains a lamp array with the same number of rows and columns, and the lamp spacing of the lamp arrays in different lamp array units is different. The positioning hole structure is disposed on the outer peripheral edge of the lamp array unit for stacking optical structure layers; The first end of each lamp array unit is electrically connected to the first end of the corresponding lamp array switch module, and the second end of each lamp array switch module is electrically connected to the first end of the power supply module. The power supply status of the corresponding lamp array unit is controlled by the lamp array switch module. The second and third terminals of the power module are connected in series with all the lamp array units through the DIP switch module to form a closed loop. The DIP switch module controls the lighting and extinguishing of the lamps at the same point in each lamp array unit. By coordinating the conduction states of the DIP switch module and the lamp array switch module, and combining the stacked optical structure layers, batch synchronous testing of multiple lighting effects can be achieved.

2. The device of claim 1, wherein Also includes: A total voltage test module is electrically connected between the first end of the power supply module and the second end of all lamp array units. It is used to monitor the total voltage value of the parallel circuit of each lamp array unit by sampling the voltage signal of the total voltage test module in real time.

3. The device of claim 1, wherein Also includes: A plurality of lamp array voltage testing modules are provided, with one lamp array voltage testing module corresponding to each lamp array unit, for monitoring the independent voltage value of the corresponding lamp array unit in real time by sampling the lamp array voltage testing module.

4. The device of claim 1, wherein Also includes: A plurality of lamp array current testing modules are provided, with one lamp array current testing module corresponding to each lamp array unit, for monitoring the independent current value of the corresponding lamp array unit in real time by sampling the lamp array current testing module.

5. The lighting test device according to claim 1, characterized in that, The power module integrates a master switch unit; The first end of the main switch unit is electrically connected to an external power source, and the second end is electrically connected to each lamp array switch module and DIP switch module, respectively, for centralized control of the overall power supply of the lighting test device.

6. The device of claim 5, wherein the light source is a light emitting diode. The power module also includes a protection unit; The protection unit is connected in series between the second end of the main switch unit and the power supply connection node of each lamp array switch module and DIP switch module, and is used to perform overcurrent protection and short circuit protection for the lighting test device.

7. The device of claim 1, wherein The optical structure layer includes support frames of different thicknesses and film materials with different OD values; By coordinating the adjustment of the thickness of the support frame, the OD value of the membrane material, the on / off state of a single lamp, and the voltage and current parameters of the power module, a multi-parameter combined luminous efficacy test can be achieved.

8. A light test board, characterized by It is equipped with a lighting test device as described in any one of claims 1-7.

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