A sensor high-low temperature conditioning test pipeline

Abstract

The utility model relates to sensor production test equipment field discloses a sensor high and low temperature conditioning test assembly line, including sensor test tray, the first transmission line and the second transmission line who sets up side by side and respectively to the opposite direction transmission sensor test tray, with the first transmission line and the second transmission line one end butt joint's loading and unloading mechanism, the transplanting mechanism that shifts sensor test tray at the first transmission line and the second transmission line other end, the first transmission line and the second transmission line are respectively arranged gradually between loading and unloading mechanism and transplanting mechanism respectively and are used for normal temperature conditioning and normal temperature test first product's normal temperature conditioning test equipment, high temperature conditioning and high temperature test product's first high temperature conditioning test equipment, high temperature conditioning and high temperature test product's second high temperature conditioning test equipment, low temperature conditioning and low temperature test product's low temperature conditioning test equipment. Reduced equipment quantity, reduced product transmission path, saved larger space and conditioning detection efficiency effectively improved.

Description

Technical Field

[0001] This utility model relates to the field of sensor production and testing equipment, and in particular to a sensor high and low temperature conditioning and testing production line. Background Technology

[0002] ESC sensors are increasingly widely used in the automotive industry. While the demand for ESC sensors is increasing, the quality requirements are also rising, leading to increasingly fierce competition among ESC sensor manufacturers. To ensure quality, ESC sensors generally require high and low temperature conditioning tests after assembly. Existing ESC sensor high and low temperature conditioning testing procedures include sequentially performing batch automated conditioning at room temperature, high temperature, low temperature, high temperature, cooling, and room temperature, requiring room temperature conditioning equipment, high temperature conditioning equipment, low temperature conditioning testing equipment, high temperature testing equipment, cooling lines, and room temperature testing equipment. This results in a large number of conditioning and testing devices, long product transport paths, a large footprint, and relatively low efficiency. Utility Model Content

[0003] This invention provides a high and low temperature conditioning test production line for sensors, which solves the technical problems of existing high and low temperature conditioning test equipment for ESC sensors having a large number of devices, long product transmission paths, large area occupation, and low efficiency.

[0004] The technical solution adopted by this utility model to solve its technical problem is: a sensor high and low temperature conditioning test production line, including a sensor test tray, a first transmission line and a second transmission line arranged in parallel and respectively transporting the sensor test tray in opposite directions, a loading and unloading mechanism connected to one end of the first transmission line and the second transmission line, and a transfer mechanism for transferring the sensor test tray at the other end of the first transmission line and the second transmission line. The first transmission line is used to transport the sensor test tray from the loading and unloading mechanism to the transfer mechanism, and the second transmission line is used to transport the sensor test tray from the transfer mechanism to the loading and unloading mechanism. Between the loading and unloading mechanism and the transfer mechanism, there are sequentially arranged room temperature conditioning test equipment for conditioning products in the sensor test tray on the first transmission line at room temperature and testing products in the sensor test tray on the second transmission line at room temperature, a first high temperature conditioning test equipment for conditioning products in the sensor test tray on the first transmission line at high temperature and testing products in the sensor test tray on the second transmission line at high temperature, a second high temperature conditioning test equipment for conditioning products in the sensor test tray on the first transmission line at high temperature and testing products in the sensor test tray on the second transmission line at high temperature, and a low temperature conditioning test equipment for conditioning products in the sensor test tray on the first transmission line at low temperature and testing products in the sensor test tray on the second transmission line at low temperature. It reduces the number of devices, shortens the product transmission path, saves a lot of space, and effectively improves conditioning and testing efficiency.

[0005] Furthermore, the temperature of the product conditioned by the first high-temperature conditioning test equipment is lower than that of the product conditioned by the second high-temperature conditioning test equipment. The process of gradually increasing the temperature for conditioning followed by gradually decreasing the temperature for testing results in high accuracy and low energy consumption.

[0006] Furthermore, a tray buffer cooling mechanism is installed between the second high-temperature conditioning test device and the low-temperature conditioning test device on the first transmission line. Tray buffer cooling mechanisms are also installed between the second high-temperature conditioning test device and the first high-temperature conditioning test device, and between the first high-temperature conditioning test device and the room-temperature conditioning test device on the second transmission line. This effectively improves the overall conditioning and testing efficiency.

[0007] Furthermore, tray transfer buffer mechanisms are installed between the room temperature conditioning test equipment and the first high temperature conditioning test equipment, and between the first high temperature conditioning test equipment and the second high temperature conditioning test equipment on the first transmission line. A tray transfer buffer mechanism is also installed between the low temperature conditioning test equipment and the second high temperature conditioning test equipment on the second transmission line. This centralized testing output and input ensures good stability.

[0008] Furthermore, the sensor test tray is equipped with multiple product placement slots for positioning and securing the product. Each product placement slot has a through-hole at its bottom, and multiple vertically penetrating second ventilation holes are located beside the product placement slots on the sensor test tray. This effectively improves heat dissipation efficiency in practical implementation.

[0009] Furthermore, the tray buffer cooling mechanism includes a cooling cover for shielding the first or second transmission line and a streamlined blocker located within the cover to block the buffer sensor test tray. A cooling fan assembly is disposed at the lower part of the cover, a heat dissipation fan is disposed at the upper part of the cover, and a heat dissipation duct communicating with the outside is disposed above the cover. Multiple temperature sensors for detecting the temperature of the products in the test tray are disposed inside the cover. The heat dissipation convection is rapid, resulting in fast product cooling and high efficiency.

[0010] Furthermore, the cooling fan assembly includes multiple cooling fans arranged in an array. The array arrangement provides uniform and rapid heat dissipation.

[0011] Furthermore, both the first and second high-temperature conditioning and testing equipment are equipped with pre-test buffer stations on both sides to buffer the sensor test trays input on the first and second transmission lines, respectively. This allows for batch buffering and environmental preheating of the input products undergoing conditioning or testing, improving conditioning and testing efficiency.

[0012] Furthermore, the low-temperature conditioning testing equipment is equipped with a defrosting and warming buffer station on the side near the second high-temperature conditioning testing equipment. This station pre-defrosts and warms the products on the sensor test tray transmitted from the second transmission line, preventing moisture on the products from affecting the subsequent high-temperature testing. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the operating structure of this utility model.

[0014] The components in the diagram are labeled as follows: sensor test tray 100, first transmission line 210, second transmission line 220, tray transmission buffer mechanism 230, tray buffer cooling mechanism 240, loading and unloading mechanism 300, transplanting mechanism 400, ambient temperature conditioning test equipment 500, first high temperature conditioning test equipment 600, second high temperature conditioning test equipment 700, and low temperature conditioning test equipment 800. Detailed Implementation

[0015] The present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0016] like Figure 1 The illustrated sensor high and low temperature conditioning testing production line includes a sensor test tray 100, a first transmission line 210 and a second transmission line 220 arranged side by side and moving in opposite directions to transport the sensor test tray 100, a loading / unloading mechanism 300 connected to one end of the first transmission line 210 and the second transmission line 220, and a transfer mechanism 400 for transferring the sensor test tray 100 at the other end of the first transmission line 210 and the second transmission line 220. The first transmission line 210 is used to transport the sensor test tray 100 from the loading / unloading mechanism 300 to the transfer mechanism 400, and the second transmission line 220 is used to transport the sensor test tray 100 from the transfer mechanism 400 to the loading / unloading mechanism 300. A room temperature conditioning mechanism is sequentially arranged between the loading / unloading mechanism 300 and the transfer mechanism 400. The equipment includes: a room temperature conditioning test device 500 for testing products in sensor test tray 100 on the first transmission line 210 and testing products in sensor test tray 100 on the second transmission line 220 at room temperature; a first high temperature conditioning test device 600 for testing products in sensor test tray 100 on the first transmission line 210 and testing products in sensor test tray 100 on the second transmission line 220 at high temperature; a second high temperature conditioning test device 700 for testing products in sensor test tray 100 on the first transmission line 210 and testing products in sensor test tray 100 on the second transmission line 220 at high temperature; and a low temperature conditioning test device 800 for testing products in sensor test tray 100 on the first transmission line 210 and testing products in sensor test tray 100 on the second transmission line 220 at low temperature.

[0017] In this specific embodiment, both the first transmission line 210 and the second transmission line 220 include multiple independent transmission mechanisms. Each transmission mechanism includes a frame and a belt transmission mechanism mounted on the frame for limiting the linear movement of the sensor test tray 100 in the horizontal direction. The transfer mechanism 400 includes a transfer frame, a multi-axis manipulator mounted on the transfer frame, and a contour gripper mounted on the manipulator for picking up and transferring the sensor test tray 100. In practice, the product is scanned and loaded onto the sensor test tray 100 at the loading station of the loading / unloading mechanism 300, and then loaded onto the first transmission line 210. The first transmission line 210 then transports the sensor test tray. The sensor test tray 100 is transferred to a room temperature conditioning test device 500, where the product in the sensor test tray 100 is conditioned. Then, the first transmission line 210 transfers the sensor test tray 100 to a first high temperature conditioning test device 600, where the product in the sensor test tray 100 is conditioned. Next, the first transmission line 210 transfers the sensor test tray 100 to a second high temperature conditioning test device 700, where the product in the sensor test tray 100 is conditioned. Finally, the first transmission line 210 transfers the sensor test tray 100 to a low temperature... Within the conditioning and testing equipment 800, the low-temperature conditioning and testing equipment 800 conditions the product within the sensor test tray 100; then, the transfer mechanism 400 transfers the sensor test tray 100 from the first transmission line 210 to the second transmission line 220; then, the second transmission line 220 transfers the sensor test tray 100 to the low-temperature conditioning and testing equipment 800, where the product within the sensor test tray 100 is tested; then, the second transmission line 220 transfers the sensor test tray 100 to the second high-temperature conditioning and testing equipment 700, where the product within the sensor test tray 100 is tested. The process involves several steps: First, the second transmission line 220 transfers the sensor test tray 100 to the first high-temperature conditioning test equipment 600, where the products in the sensor test tray 100 are tested. Then, the second transmission line 220 transfers the sensor test tray 100 to the room-temperature conditioning test equipment 500, where the products in the sensor test tray 100 are tested. Next, the second transmission line 220 transfers the sensor test tray 100 to the loading / unloading mechanism 300, where a manual scanner scans the products in the sensor test tray 100 and then sorts and unloads them according to the test results.

[0018] In practice, the room temperature conditioning and testing equipment 500 simultaneously conditions the products in the sensor test tray 100 on the first transmission line 210 at room temperature and performs room temperature testing on the products in the sensor test tray 100 on the second transmission line 220. The first high temperature conditioning and testing equipment 600 simultaneously conditions the products in the sensor test tray 100 on the first transmission line 210 at high temperature and performs high temperature testing on the products in the sensor test tray 100 on the second transmission line 220. The second high temperature conditioning and testing equipment 700 simultaneously conditions the products in the sensor test tray 100 on the first transmission line 210 at high temperature and performs high temperature testing on the products in the sensor test tray 100 on the second transmission line 220. The low temperature conditioning and testing equipment 800 simultaneously conditions the products in the sensor test tray 100 on the first transmission line 210 at low temperature and performs low temperature testing on the products in the sensor test tray 100 on the second transmission line 220. Conditioning and testing are performed simultaneously on the same equipment, reducing the number of devices, shortening the product transmission path, saving a lot of space, and effectively improving conditioning and testing efficiency.

[0019] Based on the above, such as Figure 1 As shown, the temperature of the product tested by the first high-temperature conditioning test equipment 600 is lower than the temperature of the product tested by the second high-temperature conditioning test equipment 700. In this specific embodiment, both the first high-temperature conditioning and testing device 600 and the second high-temperature conditioning and testing device 700 are high-temperature tunnel furnaces with a temperature performance of 30℃ to 150℃. The first high-temperature conditioning and testing device 600 conditions and tests the product at a temperature of 85℃, with a temperature deviation of ≤±3℃. The second high-temperature conditioning and testing device 700 conditions and tests the product at a temperature of 125℃, with a temperature deviation of ≤±3℃. Both the first high-temperature conditioning and testing device 600 and the second high-temperature conditioning and testing device 700 are provided with windows through which the first transmission line 210 and the second transmission line 220 transmit the sensor test tray 100, and are internally provided with conditioning stations and testing stations. Both the first high-temperature conditioning and testing device 600 and the second high-temperature conditioning and testing device 700 can buffer the sensor test tray 100 at the conditioning station and the testing station, thereby conditioning and testing the product in the sensor test tray 100, gradually increasing the temperature for conditioning and then gradually decreasing the temperature for testing, resulting in high testing accuracy and low energy consumption.

[0020] Based on the above, such as Figure 1As shown, a tray buffer cooling mechanism 240 is provided between the second high-temperature conditioning test device 700 and the low-temperature conditioning test device 800 on the first transmission line 210. Similarly, tray buffer cooling mechanisms 240 are provided between the second high-temperature conditioning test device 700 and the first high-temperature conditioning test device 600, and between the first high-temperature conditioning test device 600 and the normal-temperature conditioning test device 500 on the second transmission line 220. In practical implementation, when performing the next step of conditioning or testing at a lower temperature, the tray buffer cooling mechanism 240 provides active and efficient cooling, effectively improving the overall conditioning and testing efficiency.

[0021] Based on the above, such as Figure 1 As shown, a tray transfer buffer mechanism 230 is provided between the room temperature conditioning test device 500 and the first high temperature conditioning test device 600, and between the first high temperature conditioning test device 600 and the second high temperature conditioning test device 700 on the first transmission line 210. A tray transfer buffer mechanism 230 is also provided between the low temperature conditioning test device 800 and the second high temperature conditioning test device 700 on the second transmission line 220.

[0022] In this specific embodiment, the tray transfer buffer mechanism 230 includes a cover for shielding the first transmission line 210 or the second transmission line 220 and a streamlined blocker (an automatically adjustable blocking structure) located on the cover for blocking the sensor test tray 100 from moving on the first transmission line 210 or the second transmission line 220, or removing the blocker to allow the sensor test tray 100 to move on the first transmission line 210 or the second transmission line 220, buffering the tray, centralizing test output and input, and providing good stability.

[0023] Based on the above, such as Figure 1 As shown, the sensor test tray 100 is provided with multiple product placement holes for positioning and placing the product. A first through-hole is provided at the bottom of each product placement hole, and multiple second through-holes are provided next to the product placement holes on the sensor test tray 100. In practical implementation, this effectively improves heat dissipation efficiency.

[0024] Based on the above, such as Figure 1As shown, the tray buffer cooling mechanism 240 includes a cooling cover for shielding the first transmission line 210 or the second transmission line 220, and a streamlined blocker located on the cover to block the buffer sensor test tray 100. A cooling fan assembly is disposed at the lower part of the cover, and a heat exhaust fan is disposed at the upper part of the cover. A heat exhaust duct communicating with the outside is disposed at the upper part of the cover. Multiple temperature sensors for detecting the temperature of the products inside the sensor test tray 100 are disposed inside the cover. In this specific embodiment, the temperature sensors are infrared temperature sensors; the combination of cooling air blowing from above and below and hot air exhausting from above, combined with the through-and-through structure on the sensor test tray 100, results in rapid heat dissipation and convection, fast product cooling speed, and high efficiency.

[0025] Based on the above, such as Figure 1 As shown, the cooling fan assembly includes multiple cooling fans arranged in an array. In this specific embodiment, the cooling fans are commercially available small-volume, high-speed fans, and the array arrangement provides uniform and rapid heat dissipation.

[0026] Based on the above, such as Figure 1 As shown, both sides of the first high-temperature conditioning and testing equipment 600 and the second high-temperature conditioning and testing equipment 700 are respectively provided with tray pre-test buffering stations for buffering the sensor test trays 100 input from the first transmission line 210 and the second transmission line 220. In specific implementation, batch buffering and environmental preheating are performed on the products input for conditioning or testing to improve conditioning and testing efficiency.

[0027] Based on the above, such as Figure 1 As shown, the low-temperature conditioning test equipment 800 is equipped with a defrosting and heating buffer station on the side near the second high-temperature conditioning test equipment 700, which defrosts and heats the products on the sensor test tray 100 that are transmitted and output via the second transmission line 220. In specific implementation, a hot air fan is used to blow hot air onto the sensor test tray 100 to defrost and heat the products before proceeding to the next high-temperature test, thus avoiding the influence of moisture on the products on the subsequent high-temperature test.

[0028] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of this utility model. It should be understood that the above descriptions are merely specific embodiments of this utility model and are not intended to limit this utility model. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A sensor high and low temperature conditioning test production line, characterized in that: The system includes a sensor test tray (100), a first transmission line (210) and a second transmission line (220) arranged in parallel and transporting the sensor test tray (100) in opposite directions, a loading / unloading mechanism (300) connected to one end of the first transmission line (210) and the second transmission line (220), and a transfer mechanism (400) transferring the sensor test tray (100) from the other end of the first transmission line (210) and the second transmission line (220). The first transmission line (210) is used to transport the sensor test tray (100) from the loading / unloading mechanism (300) to the transfer mechanism (400), and the second transmission line (220) is used to transport the sensor test tray (100) from the transfer mechanism (400) to the loading / unloading mechanism (300). A first transmission line (210) for room temperature conditioning is arranged between the loading / unloading mechanism (300) and the transfer mechanism (400). 10) A room temperature conditioning test device (500) for products in the sensor test tray (100) and room temperature test of the second transmission line (220) for sensor test tray (100), a first high temperature conditioning test device (600) for products in the sensor test tray (100) on the first high temperature conditioning first transmission line (210) and high temperature test of the second transmission line (220) for sensor test tray (100), a second high temperature conditioning test device (700) for products in the sensor test tray (100) on the first high temperature conditioning first transmission line (210) and high temperature test of the second transmission line (220) for sensor test tray (100), and a low temperature conditioning test device (800) for products in the sensor test tray (100) on the first low temperature conditioning first transmission line (210) and low temperature test of the second transmission line (220) for sensor test tray (100).

2. The sensor high and low temperature conditioning test production line according to claim 1, characterized in that: The temperature of the product tested by the first high-temperature conditioning test equipment (600) is lower than the temperature of the product tested by the second high-temperature conditioning test equipment (700).

3. The sensor high and low temperature conditioning test production line according to claim 2, characterized in that: A tray buffer cooling mechanism (240) is provided between the second high temperature conditioning test device (700) and the low temperature conditioning test device (800) on the first transmission line (210). A tray buffer cooling mechanism (240) is also provided between the second high temperature conditioning test device (700) and the first high temperature conditioning test device (600) and between the first high temperature conditioning test device (600) and the normal temperature conditioning test device (500) on the second transmission line (220).

4. The sensor high and low temperature conditioning test production line according to claim 2, characterized in that: A tray transfer buffer mechanism (230) is provided between the room temperature conditioning test device (500) and the first high temperature conditioning test device (600) on the first transmission line (210), and between the first high temperature conditioning test device (600) and the second high temperature conditioning test device (700). A tray transfer buffer mechanism (230) is also provided between the low temperature conditioning test device (800) and the second high temperature conditioning test device (700) on the second transmission line (220).

5. The sensor high and low temperature conditioning test production line according to claim 2, characterized in that: The sensor test tray (100) is provided with a plurality of product placement acupoints for limiting and placing the product. The bottom of the product placement acupoint is provided with a through first heat dissipation hole. The sensor test tray (100) is provided with a plurality of vertical through second heat dissipation holes next to the product placement acupoints.

6. The sensor high and low temperature conditioning test production line according to claim 3, characterized in that: The tray buffer cooling mechanism (240) includes a cooling cover for shielding the first transmission line (210) or the second transmission line (220) and a streamlined blocker located in the cover for blocking the buffer sensor test tray (100). A cooling fan assembly is provided at the bottom inside the cover, a heat exhaust fan is provided at the top inside the cover, and a heat exhaust duct communicating with the outside is provided at the top of the cover. Multiple temperature sensors for detecting the temperature of the products in the sensor test tray (100) are provided inside the cover.

7. A sensor high and low temperature conditioning test production line according to claim 6, characterized in that: The cooling fan assembly includes multiple cooling fans arranged in an array.

8. A sensor high and low temperature conditioning test production line according to claim 2, characterized in that: Both sides of the first high-temperature conditioning test equipment (600) and the second high-temperature conditioning test equipment (700) are respectively provided with a tray pre-test buffer station for buffering the sensor test tray (100) transmitted from the first transmission line (210) and the sensor test tray (100) transmitted from the second transmission line (220).

9. A sensor high and low temperature conditioning test production line according to claim 2, characterized in that: The low-temperature conditioning test equipment (800) is provided with a defrosting and heating buffer station on the side near the second high-temperature conditioning test equipment (700) to defrost and heat up the products on the sensor test tray (100) that is uploaded and output by the second transmission line (220).

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