A quantum chip port impedance testing device

By introducing electromagnetic protection and adjustment components into the quantum chip port impedance testing device, the impact of electromagnetic interference on the lock-in amplifier and relay array switching circuit is resolved, achieving higher testing accuracy and reliability.

CN224500829UActive Publication Date: 2026-07-14深圳科盾量子信息科技有限公司

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
深圳科盾量子信息科技有限公司
Filing Date
2025-05-08
Publication Date
2026-07-14

AI Technical Summary

Technical Problem

Existing quantum chip port impedance testing devices suffer from electromagnetic interference, which affects the measurement accuracy and reliability of lock-in amplifiers and relay array switching circuits, leading to errors in port impedance calculations.

Method used

A quantum chip port impedance testing device was designed, comprising an electromagnetic protection component, an electromagnetic shielding cover, and an electromagnetic shielding adjustment component. Through the cooperation of these components, external electromagnetic signal interference is effectively shielded, ensuring that the lock-in amplifier receives a pure signal and switches the circuit stably, adapting to different models of lock-in amplifiers and relays.

Benefits of technology

It improves the accuracy and reliability of test data, expands the scope of application of the device, and ensures accurate signal transmission and stable circuit switching.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to quantum chip port impedance test technical field especially for a kind of quantum chip port impedance test device, including test board, the one side of test board is fixedly connected with electromagnetic shield side plate, the one side of electromagnetic shield side plate is slidably connected with electromagnetic protection component, the outside of test board is slidably connected with electromagnetic shield cover, the inside of electromagnetic shield cover is installed with electromagnetic shield adjusting component;Electromagnetic protection component includes metal electromagnetic shield plate, the both sides of metal electromagnetic shield plate are fixedly connected with composite electromagnetic shield plate, the outside of composite electromagnetic shield plate is fixedly connected with connecting plate, and cable perforation is established in the bottom of connecting plate, in the utility model, effectively block outside electromagnetic signal interference, promote shielding effect, device can adapt to different models of lock-in amplifier and relay, effectively expand the range of use, ensure that lock-in amplifier receives pure signal, improve the accuracy and reliability of test data.
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Description

Technical Field

[0001] This utility model relates to the field of quantum chip port impedance testing technology, specifically a quantum chip port impedance testing device. Background Technology

[0002] With the continuous development of quantum technology, the requirements for testing accuracy and stability are becoming increasingly stringent. As the core component of quantum computing systems, the accurate measurement of the port impedance of quantum chips is crucial for chip performance evaluation, optimization design, and subsequent production and manufacturing quality control. However, existing testing devices face many challenges in practical applications, among which electromagnetic interference seriously restricts the accuracy and reliability of testing.

[0003] In existing quantum chip port impedance testing devices, lock-in amplifiers and relay array switching circuits are the core components. Lock-in amplifiers are used to provide small voltage outputs and measure weak signals. They are extremely sensitive to electromagnetic interference. Even the slightest electromagnetic interference can cause deviations in the measurement results. For example, when there is electromagnetic radiation generated by other electronic devices in the vicinity, the signal received by the lock-in amplifier will be mixed with noise, causing errors in the measured voltage and current data, which in turn affects the accuracy of the port impedance calculation. Therefore, a quantum chip port impedance testing device is proposed to address the above problems. Utility Model Content

[0004] The purpose of this invention is to provide a quantum chip port impedance testing device to address the problem that the lock-in amplifier and relay array switching circuit are the core components of quantum chip port impedance testing. The lock-in amplifier is responsible for outputting a small voltage and measuring a weak signal. Because it is extremely sensitive to electromagnetic interference, even the slightest electromagnetic radiation, such as interference from surrounding electronic devices, can cause noise to be mixed into the received signal, leading to errors in voltage and current measurement data, and ultimately affecting the accuracy of port impedance calculation.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] A quantum chip port impedance testing device includes a test platform. An electromagnetic shielding side plate is fixedly connected to one side of the test platform, and an electromagnetic protection component is slidably connected to one side of the electromagnetic shielding side plate. An electromagnetic shielding cover is slidably connected to the outer side of the test platform, and an electromagnetic shielding adjustment component is installed on the inner side of the electromagnetic shielding cover. The electromagnetic protection component includes a metal electromagnetic shielding plate, and composite electromagnetic shielding plates are fixedly connected to both sides of the metal electromagnetic shielding plate. A connecting plate is fixedly connected to the outer side of the composite electromagnetic shielding plate. A cable through hole is opened at the bottom of the connecting plate, and a grooved fixing sleeve is fixedly installed on the inner side of the cable through hole. An adjustment piece is slidably connected to the outer surface of the connecting plate, and a positioning groove is opened at the rear end of the connecting plate.

[0007] As a further optimization of this utility model, the following features are provided: an electromagnetic shielding rod is fixedly connected to the bottom end of the adjusting plate; the electromagnetic shielding rod is parallel to the connecting plate; the electromagnetic shielding rod is located below the grooved fixing sleeve; a dovetail block is fixedly connected to the rear end face of the adjusting plate; and the dovetail block is slidably connected to the connecting plate.

[0008] As a further optimization of this utility model, the electromagnetic shielding adjustment assembly includes an adjustment track, which is fixedly installed at the top of the inner side of the electromagnetic shielding cover. A lead screw is rotatably connected to the inner side of the adjustment track, and a lead screw nut is threadedly connected to the outer side of the lead screw. An electromagnetic shielding drive block is fixedly connected to the outer side of the lead screw nut. The electromagnetic shielding drive block is slidably connected to the adjustment track. A connecting pin is fixedly connected to one side of the bottom of the adjustment track, and the outer side of the connecting pin is inserted into the inner side of the positioning groove.

[0009] As a further optimization of this utility model, the electromagnetic shielding drive block is slidably engaged with the metal electromagnetic shielding plate, and an adjusting rod is rotatably connected to one side of the electromagnetic shielding cover. The adjusting rod extends into the interior of the electromagnetic shielding cover, and one end of the adjusting rod passes through the interior of the adjusting track and is fixedly connected to one end of the lead screw.

[0010] As a further optimization of this utility model, the inner side of the cable perforation is connected to the inner side of the metal electromagnetic shielding plate, and the number of cable perforations is set to multiple, with the multiple cable perforations arranged linearly at equal intervals.

[0011] As a further optimization of this utility model, wherein: a lock-in amplifier body is fixedly connected to one side of the upper surface of the test platform by bolts, a relay body is fixedly connected to the other side of the upper surface of the test platform by bolts, and the electromagnetic protection component is located between the lock-in amplifier body and the relay body.

[0012] As a further optimization of this utility model, the electromagnetic shielding cover and the electromagnetic shielding side plate are parallel to each other, and a wiring groove for adapting the relay body is provided on the outer side of the electromagnetic shielding cover away from the electromagnetic shielding side plate.

[0013] Compared with the prior art, the beneficial effects of this utility model are:

[0014] In this invention, the combination of the electromagnetic protection component, the electromagnetic shielding cover, and the electromagnetic shielding adjustment component effectively blocks external electromagnetic signal interference, improving the shielding effect. The electromagnetic shielding adjustment component allows for external adjustment of the electromagnetic protection component, reducing the risk of external electromagnetic interference entering the device. Placing the electromagnetic protection component between the lock-in amplifier body and the relay body shields interference between the two and from the outside, ensuring accurate signal transmission and stable circuit switching. The flexible adjustment of the electromagnetic protection component in conjunction with the electromagnetic shielding adjustment component allows the device to adapt to different models of lock-in amplifiers and relays, effectively expanding its application range, ensuring that the lock-in amplifier receives clean signals, and improving the accuracy and reliability of test data. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0016] Figure 2 This is a side view of the overall structure of this utility model;

[0017] Figure 3 This is a schematic diagram of the electromagnetic protection component of this utility model;

[0018] Figure 4 This is a schematic diagram of the structure of the metal electromagnetic shielding plate of this utility model;

[0019] Figure 5 This is a schematic diagram of the structure of the adjusting plate of this utility model;

[0020] Figure 6 This is a schematic diagram of the electromagnetic shielding adjustment component of this utility model;

[0021] Figure 7 This is a top view of the electromagnetic shielding adjustment component of this utility model.

[0022] In the diagram: 1. Test bench; 2. Electromagnetic shielding side plate;

[0023] 3. Electromagnetic protection components; 31. Metal electromagnetic shielding plate; 32. Composite electromagnetic shielding plate; 33. Connecting plate; 34. Cable through hole; 35. Grooved fixing sleeve; 36. Adjusting plate; 37. Positioning groove; 38. Electromagnetic shielding rod; 39. Dovetail block;

[0024] 4. Electromagnetic shielding cover;

[0025] 5. Electromagnetic shielding adjustment assembly; 51. Adjustment rail; 52. Lead screw; 53. Lead screw nut; 54. Electromagnetic shielding drive block; 55. Connecting pin; 56. Adjustment rod;

[0026] 6. Lock-in amplifier body; 7. Relay body; 8. Wiring slot. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0028] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0029] Please see Figure 1-7 This utility model provides a technical solution:

[0030] A quantum chip port impedance testing device includes a test platform 1. An electromagnetic shielding side plate 2 is fixedly connected to one side of the test platform 1. An electromagnetic protection component 3 is slidably connected to one side of the electromagnetic shielding side plate 2. An electromagnetic shielding cover 4 is slidably connected to the outside of the test platform 1. An electromagnetic shielding adjustment component 5 is installed on the inside of the electromagnetic shielding cover 4. The electromagnetic protection component 3 includes a metal electromagnetic shielding plate 31. A composite electromagnetic shielding plate 32 is fixedly connected to both sides of the metal electromagnetic shielding plate 31. The composite electromagnetic shielding plate 32 is designed to provide good shielding effect for electromagnetic fields of different frequencies. A connecting plate 33 is fixedly connected to the outside of the composite electromagnetic shielding plate 32. A cable through hole 34 is opened at the bottom of the connecting plate 33. The inside of the cable through hole 34 is connected to the inside of the metal electromagnetic shielding plate 31. Multiple cable through holes 34 are arranged linearly at equal intervals. A grooved fixing sleeve 35 is fixedly installed on the inside of the cable through hole 34. An adjustment piece 36 is slidably connected to the outer surface of the connecting plate 33. A positioning groove 37 is opened at the rear end of the connecting plate 33.

[0031] As a further implementation of this solution, an electromagnetic shielding rod 38 is fixedly connected to the bottom of the adjusting plate 36. The electromagnetic shielding rod 38 is parallel to the connecting plate 33 and is located below the slotted fixing sleeve 35. A dovetail block 39 is fixedly connected to the rear end face of the adjusting plate 36. The dovetail block 39 is slidably connected to the connecting plate 33. When the cable passes through the slotted fixing sleeve 35, the electromagnetic shielding rod 38 can block any gaps or openings that may exist below the slotted fixing sleeve 35, preventing external electromagnetic signals from interfering with the internal signal transmission through these areas, thus significantly improving the electromagnetic shielding effect. The sliding connection between the dovetail block 39 and the connecting plate 33 makes the movement of the adjusting plate 36 smoother and more stable, allowing operators to flexibly adjust the position of the electromagnetic shielding rod 38 according to the actual cable specifications and location.

[0032] As a further implementation of this solution, the electromagnetic shielding adjustment assembly 5 includes an adjustment track 51, which is fixedly installed at the top of the inner side of the electromagnetic shielding cover 4. A lead screw 52 is rotatably connected to the inner side of the adjustment track 51, and a lead screw nut 53 is threadedly connected to the outer side of the lead screw 52. An electromagnetic shielding drive block 54 is fixedly connected to the outer side of the lead screw nut 53, and the electromagnetic shielding drive block 54 is slidably connected to the adjustment track 51. A connecting pin 55 is fixedly connected to one side of the bottom of the adjustment track 51, and the outer side of the connecting pin 55 is inserted into the inner side of the positioning groove 37. An adjusting rod 56 is rotatably connected to one side of the electromagnetic shielding cover 4. The adjusting rod 56 extends into the interior of the electromagnetic shielding cover 4. One end of the adjusting rod 56 passes through the interior of the adjusting track 51 and is fixedly connected to one end of the lead screw 52. The electromagnetic shielding drive block 54 slides with the metal electromagnetic shielding plate 31, which makes it convenient for operators to adjust the electromagnetic protection component 3 from the outside of the device without opening the electromagnetic shielding cover 4, reducing the risk of external electromagnetic interference entering. At the same time, when the electromagnetic shielding cover 4 is opened, the electromagnetic shielding adjustment component 5 can also be smoothly separated from the electromagnetic protection component 3, improving the convenience of operation.

[0033] As a further implementation of this solution, a lock-in amplifier body 6 is fixedly connected to one side of the upper surface of the test bench 1 by bolts, and a relay body 7 is fixedly connected to the other side of the upper surface of the test bench 1 by bolts. The electromagnetic protection component 3 is located between the lock-in amplifier body 6 and the relay body 7. By placing the electromagnetic protection component 3 between the lock-in amplifier body 6 and the relay body 7, electromagnetic interference from each other and from the outside can be effectively shielded when both are working, ensuring that the lock-in amplifier body 6 accurately outputs and receives signals, and the relay body 7 stably performs circuit switching, thereby improving the accuracy and reliability of the test data.

[0034] As a further implementation of this solution, the electromagnetic shielding cover 4 and the electromagnetic shielding side plate 2 are parallel to each other. The side of the electromagnetic shielding cover 4 away from the electromagnetic shielding side plate 2 is provided with a wiring groove 8 for adapting the relay body 7, so that the connection cable between the relay body 7 and the external computing device can pass through.

[0035] Workflow: The lock-in amplifier body 6 and the relay body 7 are fixedly installed on the upper surface of the test bench 1 with bolts, ensuring that the installation is firm and the electrical connection is normal. At the same time, the electromagnetic shielding side plate 2 is fixed to one side of the test bench 1 to form a basic electromagnetic protection space. Rotate the adjusting rod 56 to drive the lead screw 52 to rotate. The lead screw nut 53 moves along the axial direction of the lead screw 52, ​​thereby pushing the electromagnetic shielding drive block 54 to move. When the "L"-shaped electromagnetic shielding drive block 54 moves, it cooperates with the connecting positioning groove 37 on the metal electromagnetic shielding plate 31 through the connecting pin 55, so that the electromagnetic shielding drive block 54 drives the electromagnetic protection component 3 to move synchronously. Adjust the metal electromagnetic shielding plate 31 to a suitable position. This operation allows the metal electromagnetic shielding plate 31 to be adapted to lock-in amplifier bodies 6 and relay bodies 7 of different models and sizes. The connecting plate 33 is fixed to the metal electromagnetic shielding plate 31 through the composite electromagnetic shielding plate 32, together with the electromagnetic shielding drive block 54 and the electromagnetic shielding side plate 2, to form a complete electromagnetic protection structure.

[0036] The cable connecting the quantum chip and the test device is passed through the cable hole 34 on the metal electromagnetic shielding plate 31 and fixed securely with the slotted fixing sleeve 35 to prevent shaking from affecting signal transmission. The electromagnetic shielding rod 38 is pushed down the slotted fixing sleeve 35 by the adjusting piece 36 to block the space below the fixing sleeve and further improve the shielding effect.

[0037] After completing the above installation and adjustment steps, the lock-in amplifier body 6 starts working, outputting a weak voltage signal to the quantum chip port and receiving the returned weak signal. During this process, the protective structure composed of the electromagnetic protection component 3, the electromagnetic shielding drive block 54, the electromagnetic shielding cover 4, and the electromagnetic shielding side plate 2 effectively shields external electromagnetic interference, ensuring the purity of the signal received by the lock-in amplifier body 6. The relay body 7 switches the circuit according to the test requirements, and works with the lock-in amplifier body 6 to collect voltage and current signals at different states of the quantum chip port. The data acquisition cable is transmitted to the external computing device through the wiring slot 8. The impedance value of the quantum chip port is finally obtained by calculating the port impedance according to the port impedance calculation formula Z=U / I, where Z represents impedance, U represents voltage, and I represents current.

[0038] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A quantum chip port impedance testing device, comprising a test stand (1), characterized in that: An electromagnetic shielding side plate (2) is fixedly connected to one side of the test bench (1), an electromagnetic protection component (3) is slidably connected to one side of the electromagnetic shielding side plate (2), an electromagnetic shielding cover (4) is slidably connected to the outside of the test bench (1), and an electromagnetic shielding adjustment component (5) is installed on the inside of the electromagnetic shielding cover (4). The electromagnetic protection component (3) includes a metal electromagnetic shielding plate (31), and a composite electromagnetic shielding plate (32) is fixedly connected to both sides of the metal electromagnetic shielding plate (31). A connecting plate (33) is fixedly connected to the outer side of the composite electromagnetic shielding plate (32). A cable through hole (34) is provided at the bottom of the connecting plate (33). A grooved fixing sleeve (35) is fixedly installed on the inner side of the cable through hole (34). An adjusting piece (36) is slidably connected to the outer surface of the connecting plate (33). A positioning groove (37) is provided at the rear end of the connecting plate (33).

2. The quantum chip port impedance testing device according to claim 1, characterized in that: An electromagnetic shielding rod (38) is fixedly connected to the bottom end of the adjusting plate (36). The electromagnetic shielding rod (38) is parallel to the connecting plate (33). The electromagnetic shielding rod (38) is located below the grooved fixing sleeve (35). A dovetail block (39) is fixedly connected to the rear end face of the adjusting plate (36). The dovetail block (39) is slidably connected to the connecting plate (33).

3. The quantum chip port impedance testing device according to claim 1, characterized in that: The electromagnetic shielding adjustment assembly (5) includes an adjustment track (51), which is fixedly installed at the top of the inner side of the electromagnetic shielding cover (4). A lead screw (52) is rotatably connected to the inner side of the adjustment track (51), and a lead screw nut (53) is threadedly connected to the outer side of the lead screw (52). An electromagnetic shielding drive block (54) is fixedly connected to the outer side of the lead screw nut (53). The electromagnetic shielding drive block (54) is slidably connected to the adjustment track (51). A connecting pin (55) is fixedly connected to one side of the bottom of the adjustment track (51), and the outer side of the connecting pin (55) is inserted into the inner side of the positioning groove (37).

4. The quantum chip port impedance testing device according to claim 3, characterized in that: The electromagnetic shielding drive block (54) is slidably engaged with the metal electromagnetic shielding plate (31). An adjusting rod (56) is rotatably connected to one side of the electromagnetic shielding cover (4). The adjusting rod (56) extends into the interior of the electromagnetic shielding cover (4). One end of the adjusting rod (56) passes through the interior of the adjusting track (51) and is fixedly connected to one end of the lead screw (52).

5. The quantum chip port impedance testing device according to claim 1, characterized in that: The inner side of the cable perforation (34) is connected to the inner side of the metal electromagnetic shielding plate (31). The cable perforation (34) is provided in multiple ways, and the multiple cable perforations (34) are arranged linearly at equal intervals.

6. The quantum chip port impedance testing device according to claim 1, characterized in that: One side of the upper surface of the test bench (1) is fixedly connected to the lock-in amplifier body (6) by bolts, and the other side of the upper surface of the test bench (1) is fixedly connected to the relay body (7) by bolts. The electromagnetic protection component (3) is located between the lock-in amplifier body (6) and the relay body (7).

7. The quantum chip port impedance testing device according to claim 1, characterized in that: The electromagnetic shielding cover (4) and the electromagnetic shielding side plate (2) are parallel to each other. The electromagnetic shielding cover (4) has a wiring groove (8) for adapting the relay body (7) on the side away from the electromagnetic shielding side plate (2).