A clip-on device for use with a test fixture
By designing a clamping device on the insertion test equipment, flexible switching between insertion and clamping test methods is achieved, solving the problem of bent pins caused by circuit differences and reducing test costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- WUXI TONGZHI MICROELECTRONICS CO LTD
- Filing Date
- 2025-08-13
- Publication Date
- 2026-08-04
AI Technical Summary
Existing insertion-type testing equipment cannot quickly change the test structure according to circuit differences, resulting in circuit bending problems and increased costs.
Design a clamp testing device that, without altering the original translational sorting machine, allows for flexible switching between insertion and clamp testing modes by installing adapters or sockets on the upper testing position and lower clamp, and utilizes the cooperation between the cage mechanism and the gold fingers for testing.
This allows for flexible switching of testing methods based on circuit requirements without increasing costs, reducing circuit bend issues and improving the practicality and accuracy of the testing equipment.
Smart Images
Figure CN224594778U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of semiconductor IC testing technology, specifically a clamping device suitable for insertion-type testing equipment. Background Technology
[0002] During IC testing, a sorting machine is needed to move the circuit to the test position for testing. Existing automatic test and sorting equipment for dual in-line package (DIP) circuits uses a suction nozzle to transfer and press the circuit to the test position. There are two testing methods: socket insertion and gold finger clamp testing. Figure 1 As shown.
[0003] Insertion testing offers advantages in circuit contact, while clamp testing offers advantages in circuit appearance. Each method has its pros and cons, and generally, once the mechanism is fixed, the choice cannot be made. However, when testing circuits, due to differences in circuit design and varying requirements for contact or appearance, a testing device cannot rely solely on one method. Therefore, a suitable device is needed that can quickly change the test structure according to circuit variations.
[0004] Currently used translational sorting machines only have one method for testing circuits by inserting them into a fixed socket. The socket is mounted on the lower clamp, and a lifting platform moves the lower clamp and socket up and down to align them with the sorting machine's testing position. The testing position has a cutout in the center; the IC circuit to be tested extends from this cutout and is inserted into the socket. Figure 2 As shown, the upper part is the sorting machine's testing position, and the lower part is the lower clamp. While the existing insertion-type structure offers tight contact and good performance, it has low fault tolerance, which can lead to problems such as bent leads in the circuit. Figure 3 As shown.
[0005] Purchasing another gold finger clamp-type sorting machine to reduce the occurrence of bent feet would increase testing costs. Summary of the Invention
[0006] To address the aforementioned technical problems, this utility model provides a clamping device suitable for insertion-type testing equipment, which can switch between two testing modes: insertion-type testing and clamping-type testing, thereby improving practicality and reducing costs.
[0007] The technical solution is as follows: A clamping device suitable for insertion-type testing equipment includes an upper testing position and a lower clamp. The upper testing position is connected to a translation drive mechanism, and the lower clamp is connected to a lifting platform. The lower clamp is characterized by having a clamping opening containing an adapter or socket. The bottom of the upper testing position has a mounting hole for connecting to a cage mechanism, on which a gold finger is mounted. When using an insertion-type testing method, the socket is inserted into the clamping opening, and the upper testing position is not connected to the cage mechanism. When using a clamping-type testing method, the adapter is inserted into the clamping opening, the upper testing position is connected to the cage mechanism, and the adapter is connected to the gold finger via an adapter cable.
[0008] A further feature is that the cage mechanism includes a cage top plate, a cage bottom plate, and a threaded rod connecting the cage top plate and the cage bottom plate. A base bracket and a pneumatic gripper are installed on the cage bottom plate. A base is installed on the base bracket. The gold fingers are respectively installed on the left and right sides of the base. Clamping elements for gathering the gold fingers are respectively installed on the two grippers of the pneumatic gripper. An insulating block is installed on the clamping head of the clamping element. A hollow opening is provided in the middle of the cage top plate.
[0009] By adopting this utility model, without modifying the original translational sorting machine, only an opening is made at the upper test position to add a clamping test device with gold fingers. Without changing the original movement mode of the circuit or other structures of the equipment, by replacing the adapter or socket on the clamp, the two detection modes of insertion test and clamping test can be switched, which improves the practicality of the device. One sorting machine can complete two tests, effectively reducing costs. Attached Figure Description
[0010] Figure 1 Schematic diagrams for socket insertion type and gold finger clip type;
[0011] Figure 2 A schematic diagram showing the offset that occurs when an IC circuit pin is inserted into a socket;
[0012] Figure 3 This is a schematic diagram of an existing plug-in socket device;
[0013] Figure 4 This is a schematic diagram of the installation of the cage mechanism of this utility model;
[0014] Figure 5 This is a schematic diagram of the hoisting cage mechanism;
[0015] Figure 6 This is a longitudinal sectional view of the cage mechanism. Detailed Implementation
[0016] See Figure 3 , Figure 4 , Figure 5 , Figure 6 As shown, a clamping device suitable for insertion testing equipment includes an upper testing position 1 and a lower clamp 2. The upper testing position 1 is connected to a translation drive mechanism, and the lower clamp 2 is connected to a lifting platform. The upper testing position 1 has a cutout, through which the IC circuit to be tested is fed downwards. The translation and lifting are functions built into existing sorting machines. The lower clamp 2 has a clamping port, in which an adapter 3 or a socket 4 is placed. The bottom of the upper testing position 1 has a mounting hole for connecting a cage mechanism 5. The cage mechanism 5 includes a cage top plate 5-1, a cage bottom plate 5-2, and a threaded rod 5-10 connecting the cage top plate 5-1 and the cage bottom plate 5-2. A base bracket 5-3 and a pneumatic gripper 5-4 are mounted on the cage bottom plate 5-2. A base 5-5 is mounted on the base bracket 5-3. A positioning seat 5-9 is set in the middle of the base 5-5. The top of the positioning seat 5-9 has a vacuum adsorption port. After the IC circuit 6 is placed on the base 5-5, it can be adsorbed. Gold fingers 5-6 are installed on the left and right sides of the base 5-5 respectively. Clamping parts 5-7 for gathering the gold fingers 5-6 are installed on the two jaws of the pneumatic gripper 5-4. An insulating block 5-8 is installed on the clamping head of the clamping part 5-7. A cutout is opened in the middle of the top plate 5-1 of the cage. The cutout allows the clamping part 5-7, gold fingers 5-6 and positioning seat 5-9 to pass through, and its size corresponds to the convex plate 7 at the bottom of the upper test position 1. The cage mechanism 5 uses the convex plate 7 and the cutout of the top plate 5-1 of the cage to achieve precise positioning. At the same time, it aligns the positioning seat 5-9 with the cutout of the upper test position 1 so that the IC circuit can be placed smoothly on the positioning seat 5-9.
[0017] When using the insertion-type testing method, the socket 4 is inserted into the clamping port, and the upper test position 1 is not connected to the cage mechanism 5, such as... Figure 3 As shown, the upper test position 1 is moved horizontally above the socket 4, and the socket 4 rises with the lifting platform, allowing the IC circuit to be smoothly inserted into the socket 4 to begin testing.
[0018] When using a clamp-on testing method, adapter 3 is inserted into the clamping port. Adapter 3 is typically inserted directly into the clamping port, but can also be plugged into a socket within the clamping port. The upper test position 1 is connected to the cage mechanism 5. The cage mechanism 5 is connected and fixed to the mounting hole of the upper test position 1 via a threaded rod 5-10. Adapter 3 is connected to the gold fingers 5-6 via an adapter cable 8. Figures 4 to 6 As shown, IC circuit 6 is placed downwards on positioning seat 5-9 and held in place by vacuum suction port. Pneumatic gripper 5-4 operates to drive clamping member 5-7 to retract inwards, allowing gold fingers 5-6 to clamp the pins of IC circuit 6 inwards. At this point, testing can begin.
[0019] Using the structure of this application, a socket insertion test method can be selected for applications with high contact impedance requirements, improving measurement accuracy; while a gold finger clamp test method can be selected for applications with high aesthetic requirements, reducing the occurrence of bent leads. This allows for flexible replacement of the test structure according to on-site needs, eliminating the need to purchase a new sorting machine and effectively reducing costs.
Claims
1. A clip testing device suitable for use in a probe testing apparatus, comprising an upper testing station connected to a translational drive mechanism and a lower clip connected to a lifting platform, characterised in that, The lower clamp is provided with a clamping opening, in which an adapter or socket is placed. The bottom of the upper test position is provided with a mounting hole for connecting to the cage mechanism. A gold finger is installed on the cage mechanism. When using the insertion test method, the socket is inserted into the clamping opening, and the upper test position is not connected to the cage mechanism. When using the clamp test method, the adapter is inserted into the clamping opening, the upper test position is connected to the cage mechanism, and the adapter is connected to the gold finger through an adapter cable.
2. The clip-on device for use with a test equipment according to claim 1, wherein, The cage mechanism includes a cage top plate, a cage bottom plate, and a threaded rod connecting the cage top plate and the cage bottom plate. A base bracket and pneumatic grippers are installed on the cage bottom plate. A base is installed on the base bracket. The gold fingers are respectively installed on the left and right sides of the base. Clamping elements for gathering the gold fingers are respectively installed on the two jaws of the pneumatic grippers. An insulating block is installed on the clamping head of the clamping element. A hollow opening is provided in the middle of the cage top plate.