An integrated detection device for perovskite solar cells

Abstract

The application relates to the technical field of photovoltaic device detection, and particularly relates to an integrated detection device for perovskite solar cells. The device comprises a box body, a sample table and an optical imaging assembly, and is integrated with a photoluminescence module, an electroluminescence module and a back light imaging module in the box body. Through the integrated design, the workpiece to be detected can complete imaging in three modes in situ without moving, so that the photoluminescence (PL), electroluminescence (EL) and back light images which are completely registered in spatial position are obtained. The application solves the pain point that the prior art cannot accurately associate materials, electrical defects and physical holes due to the lack of back light imaging, realizes accurate attribution of defect sources, and can realize automatic detection through a cooperative controller, and significantly improves the detection efficiency and the accuracy of analysis.

Description

Technical Field

[0001] This utility model relates to the field of photovoltaic device testing technology, and in particular to an integrated testing device for perovskite solar cells. Background Technology

[0002] In defect analysis of perovskite solar cells, the standard approach is to comprehensively utilize multiple non-destructive testing techniques. Currently, testing equipment integrating photoluminescence (PL mapping) and electroluminescence (EL mapping) functions is available on the market, enabling comprehensive analysis from both the material's inherent quality and the device's electrical performance dimensions.

[0003] However, existing integration solutions generally neglect the integration of backlight transmission imaging functionality. Backlight imaging can identify pores in the perovskite functional layer film. These micron-sized pores can form severe leakage channels, directly leading to a significant decrease in the open-circuit voltage of the device. Due to the lack of integrated backlight imaging capabilities, researchers cannot accurately correlate the performance degradation areas revealed by PL / EL images with the physical pores captured by the backlight images in situ. This makes it difficult to accurately determine the cause of defects in perovskite solar cells, seriously affecting the subsequent repair and use of perovskite solar cells.

[0004] Based on the above, this application proposes an integrated testing device for perovskite solar cells, which can effectively solve the above problems. Utility Model Content

[0005] To address the problem that existing technologies cannot accurately determine the causes of defects in perovskite solar cells due to incomplete integration of imaging functions, this application proposes an integrated detection device for perovskite solar cells.

[0006] An integrated testing device for perovskite solar cells, comprising: The enclosure, the optical imaging components housed within the enclosure, and the sample stage for holding the workpiece to be inspected; In addition, it also includes: A photoluminescence module is configured to emit excitation light toward a workpiece on the sample stage to generate a photoluminescence signal; An electroluminescent module is configured to apply an electrical bias voltage to a workpiece on the sample stage to generate an electroluminescent signal; A backlight imaging module is configured to emit a light beam that penetrates the workpiece on the sample stage; The photoluminescence module, electroluminescence module, and backlight imaging module are integrated with the sample stage and the optical imaging component within the housing. This allows the optical imaging component to sequentially acquire PL, EL, and backlight images generated by the aforementioned three modules while the workpiece remains in a fixed position on the sample stage, thereby enabling correlation analysis of defects at the same workpiece location.

[0007] In one embodiment, the photoluminescence module includes a PL excitation source and a beam splitter disposed in the optical path between the optical imaging component and the sample stage, and configured to: reflect the excitation light emitted by the PL excitation source to the workpiece on the sample stage; and allow the photoluminescence signal emitted from the workpiece to be transmitted through the beam splitter to the optical imaging component.

[0008] In one embodiment, the backlight imaging module includes a backlight source, and the backlight source and the optical imaging component are respectively disposed on both sides of the sample stage to achieve transmissive imaging of the workpiece. In this process, the backlight light penetrates the workpiece until it is captured and imaged by the optical imaging component, which can clearly highlight physical holes, cracks or opaque contaminants in the workpiece, with high imaging contrast and intuitive and reliable defect identification.

[0009] In one embodiment, a bandpass filter is also provided in the optical path of the optical imaging component. The transmission band of the bandpass filter matches the characteristic band of the photoluminescence signal of the workpiece, which can effectively filter out the reflected stray light of the PL excitation light and other stray light in the environment, allowing only the PL signal of a specific wavelength emitted by the workpiece to pass through, which greatly improves the signal-to-noise ratio and imaging quality of the PL image.

[0010] In one embodiment, both the backlight imaging module and the PL excitation source of the photoluminescence module are LED arrays. LED arrays, as light sources, offer advantages such as low power consumption, long lifespan, fast response speed, and good light intensity uniformity. Furthermore, unlike ordinary lasers, they do not cause damage to the workpiece due to excessively high power, making them ideal for applications requiring rapid switching and stable illumination.

[0011] In one embodiment, the device further includes a coordinating controller electrically connected to the photoluminescence module, the electroluminescence module, the backlight imaging module, and the optical imaging component. The coordinating controller is configured to automatically trigger the photoluminescence module, the electroluminescence module, and the backlight imaging module to operate sequentially according to a preset timing sequence, and control the optical imaging component to perform image acquisition in the corresponding time window. The user only needs to start the system with one click, and the system can automatically, quickly, and continuously complete the image acquisition of the three modes, avoiding the errors and inefficiencies caused by manual switching and ensuring the repeatability of the test.

[0012] In one embodiment, the photoluminescence module further includes an optical path block disposed along the optical path. The PL excitation source and the beam splitter are integrated within the optical path block. A heat sink is connected to the side of the optical path block closest to the PL excitation source to dissipate the heat generated by the PL excitation source, ensuring the power stability of the PL excitation source and avoiding light intensity drift due to overheating, thereby ensuring the accuracy and consistency of the PL test results. Furthermore, the side wall of the enclosure is also equipped with a heat dissipation air inlet and a cooling fan to efficiently dissipate heat from all electrical components inside the enclosure, ensuring the service life of each component.

[0013] In one embodiment, the housing also includes a power control structure comprising an EL power supply and an independent power supply. The EL power supply is configured to apply an electrical bias voltage to the workpiece via the electroluminescent module, and the independent power supply is configured to power the PL excitation light source, backlight, and optical imaging components. The two power supplies avoid electromagnetic interference between different modules, ensuring the stability of their respective operations and the reliability of the test data.

[0014] In one embodiment, the outer wall of the housing is further provided with a monitoring module, which is electrically connected to the electroluminescent module. The monitoring module is configured to monitor the voltage and current values ​​applied to the workpiece by the electroluminescent module in real time, so that the IV information of the device can be acquired in real time while performing electroluminescence (EL) imaging, and the image information can be correlated with electrical parameters, providing richer data dimensions for defect analysis.

[0015] In one embodiment, the housing further includes a drawer-type sample compartment, within which the sample stage holding the workpiece to be tested is disposed. The drawer-type design significantly improves the convenience and safety of workpiece retrieval, eliminating the need for operators to reach into the complex equipment and reducing the risk of accidental damage to the equipment or workpiece.

[0016] The integrated testing device for perovskite solar cells provided in this application can achieve the following technical effects: 1. By integrating the photoluminescence module, electroluminescence module, and backlight imaging module into a closed enclosure, non-destructive testing of the workpiece under test can be performed in three modes under in-situ and same-point conditions. This fundamentally ensures the spatial registration of image data, enabling physical holes, material defects, and areas of electrical performance degradation to correspond precisely, solving the pain point of existing technologies being unable to accurately correlate and analyze these defects, and achieving accurate attribution of defect sources.

[0017] 2. By introducing a collaborative controller, the detection of the three modes can be completed automatically and in an orderly manner, which greatly shortens the detection cycle. At the same time, it avoids the positioning error caused by repeated sample clamping and the risk of sample contamination or damage, ensuring the reliability of test data in different modes.

[0018] 3. By selecting an LED array as the PL excitation source and backlight, since the power density of LED light is much lower than that of commonly used lasers, and its nature is a surface light source, it can provide large-area, highly uniform, and gentle illumination, effectively avoiding damage to perovskite workpieces, ensuring the non-destructive nature of the inspection, and also reducing the cost of the equipment's light source system.

[0019] 4. By designing a drawer-type sample compartment, the convenience and safety of sample retrieval and placement are improved, the user operation process is optimized, and the integrated box-type design is compact and saves experimental space. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the overall structure of an integrated testing device for perovskite solar cells provided in this application.

[0021] Figure 2 This is a schematic diagram of the external housing structure of an integrated testing device for perovskite solar cells provided in this application.

[0022] Figure 3 Provided for this application Figure 1 The diagram shows the internal structure of the device after part of the enclosure has been removed.

[0023] Figure 4 This is a schematic diagram of the photoluminescence module in an integrated detection device for perovskite solar cells provided in this application.

[0024] Figure 5 This is a schematic diagram of the electroluminescent module in an integrated testing device for perovskite solar cells provided in this application.

[0025] Figure 6 This is a schematic diagram of the optical path of the photoluminescence module in an integrated detection device for perovskite solar cells provided in this application.

[0026] Figure 7 A functional block diagram of the collaborative controller in an integrated testing device for perovskite solar cells provided in this application.

[0027] Explanation of reference numerals in the attached figures: 1. Housing; 10. Workpiece; 11. Heat dissipation air inlet; 12. Cooling fan; 13. Monitoring module; 14. Power button; 15. Status indicator light; 2. Optical imaging assembly; 21. Bandpass filter; 3. Sample stage; 31. Drawer-type sample compartment; 4. Photoluminescence module; 41. PL excitation light source; 42. Beam splitter; 43. Optical path block; 44. Heat sink; 5. Electroluminescence module; 6. Backlight imaging module; 61. Backlight source; 7. Cooperative controller; 8. Power control structure; 81. EL power supply; 82. Independent power supply; 9. Host computer. Detailed Implementation

[0028] The following is in conjunction with the appendix Figure 1-7 This application provides a more detailed description of an integrated testing device for perovskite solar cells.

[0029] This application discloses an integrated testing device for perovskite solar cells. In this embodiment, the overall structure of the device is integrated into a housing 1, which provides a stable and light-proof testing environment for all functional modules. An optical imaging component 2 is fixedly installed at the upper center of the housing 1, and a sample stage 3 for supporting the workpiece 10 to be tested is arranged directly below it. This application integrates the three major functional units—photoluminescence module 4, electroluminescence module 5, and backlight imaging module 6—along with the optical imaging component 2 and the sample stage 3, into the housing 1. This integrated layout ensures that after the workpiece 10 to be tested is clamped on the sample stage 3 once, it can be imaged sequentially by the optical imaging component 2 in PL, EL, and backlight modes without any movement, thereby achieving pixel-level image registration and laying the foundation for subsequent defect correlation analysis.

[0030] In this embodiment, to improve imaging quality, the optical imaging component 2 preferably employs a high-sensitivity near-infrared camera (with at least 1 million pixels) paired with a near-infrared enhancement lens with a focal length range of 12-25mm. Specifically, a bandpass filter 21 is installed in front of the lens. This bandpass filter 21 has a center wavelength of 800nm ​​and a bandwidth of ±100nm (i.e., a transmission band of 750-900nm). This range perfectly matches the typical fluorescence emission band of perovskite materials. Its function is to efficiently filter out excitation light (such as 450nm or 532nm) and other ambient stray light reflected from the sample surface in PL mode, allowing only useful PL signals to enter the camera, thereby greatly improving the signal-to-noise ratio of the PL image.

[0031] In this embodiment, the photoluminescence module 4 includes a PL excitation source 41 and a beam splitter 42. The PL excitation source 41 preferably has a wavelength of 450 nm or 532 nm. The beam splitter 42 is a coated glass with approximately 50% reflection and 50% transmission characteristics in the 400-700 nm wavelength range, and is positioned in the main optical path between the optical imaging assembly 2 and the sample stage 3. The beam splitter 42 serves two purposes: first, it reflects the beam from the PL excitation source 41 incident from the side by 90 degrees, causing it to illuminate the workpiece 10 on the sample stage 3 vertically downwards; second, it allows the photoluminescence signal (PL signal) emitted upwards by the workpiece 10 after excitation to pass through and be ultimately captured by the optical imaging assembly 2.

[0032] In this embodiment, to ensure the stability of the light source, the PL excitation light source 41 and the beam splitter 42 in the photoluminescence module 4 are precisely integrated into a single optical path block 43. The PL excitation light source 41 can be disposed on the inner sidewall of the optical path block 43, the top edge of the beam splitter 42 is close to the top of the sidewall of the optical path block 43 where the PL excitation light source 41 is disposed, and the bottom edge of the beam splitter 42 is close to the bottom of the opposite sidewall of the optical path block 43, and is placed stably at a 45-degree angle.

[0033] In this embodiment, the backlight imaging module 6 includes a backlight 61, which is preferably a white LED array, mounted on the sample stage 3 and directly below the workpiece 10. The backlight 61 and the optical imaging component 2 located above the sample stage 3 constitute a standard transmissive imaging optical path. When the backlight 61 is lit, the uniform light emitted by it penetrates the workpiece 10 to be inspected, causing defects such as physical holes, cracks, or opaque impurities on the workpiece 10 to appear as high-contrast dark areas in the image, thus being clearly identified.

[0034] In this embodiment, both the PL excitation light source 41 and the backlight source 61 employ LED arrays. Compared to traditional laser light sources, LED arrays, as surface light sources, can provide large-area, highly uniform, and gentle illumination. Their power density is far lower than that of lasers, effectively avoiding photo-induced damage to sensitive materials such as perovskites and ensuring the non-destructive nature of the detection. Furthermore, LEDs are lower in cost, have a longer lifespan, and faster response speed, making them ideal for applications requiring rapid light source switching in this device.

[0035] In this embodiment, a collaborative controller 7 is also included. This system manages the photoluminescence module 4, electroluminescence module 5, backlight imaging module 6, and optical imaging component 2 through electrical connection. After the user sets the test process through the host computer 9, the collaborative controller 7 will strictly and automatically execute the instructions according to the preset sequence: first, turn on the PL excitation light source 41 and trigger the optical imaging component 2 to take pictures; then, turn off the PL excitation light source 41 and turn on the power of the electroluminescence module 5 to excite the workpiece 10 to emit light and take pictures; finally, turn off the electroluminescence module 5 and turn on the backlight 61 to perform transmission imaging and take pictures. The whole process does not require manual intervention and realizes "one-click" fully automatic detection.

[0036] In this embodiment, the specific defects of workpiece 10 are shown in the table below, based on the synergistic analysis using photoluminescence (PL), electroluminescence (EL), and backlighting imaging modes: 1 No dark area Bright Bright No defects 2 No dark area There is a dark area There is a dark area Material failure 3 No dark area Bright There is a dark area Charge transport is blocked 4 There is a dark area There is a dark area There is a dark area Hole In this embodiment, a heat sink 44 is connected to the outside of the side wall where the PL excitation light source 41 is located. This heat sink is used to efficiently dissipate the heat generated by the LED array during operation and prevent light intensity drift due to temperature rise. In addition, a heat dissipation air inlet 11 and a cooling fan 12 are also provided on the side wall of the housing 1 to provide overall heat dissipation protection for the electronic components inside the housing 1.

[0037] In this embodiment, the device also includes a power control structure 8, which comprises an EL power supply 81 and an independent power supply 82. The EL power supply 81 applies a precise and controllable electrical bias voltage to the workpiece 10 through the electroluminescent module 5; while the independent power supply 82 supplies power to all other components, including the PL excitation light source 41, the backlight 61, the optical imaging assembly 2, and the cooling fan 12. This dual-power supply design effectively avoids electromagnetic interference between high-voltage drive and low-voltage control, ensuring the purity and stability of the test data.

[0038] In this embodiment, the electrical connection between the electroluminescent module 5 and the workpiece 10 is preferably a cable, with one end of the cable connected to the EL power supply 81 and the other end clamping the positive and negative electrodes of the workpiece 10.

[0039] In this embodiment, a monitoring module 13 is also integrated on the outer wall of the housing 1. The monitoring module 13 is preferably a DC voltage and current meter, electrically connected to the electroluminescent module 5, and can display the voltage and current values ​​applied to the workpiece 10 in real time in digital or graphical form. This allows the operator to simultaneously acquire the IV characteristic curve of the device while observing the EL image, and directly correlate the electrical performance parameters with the area of ​​uneven light emission.

[0040] In this embodiment, the housing 1 adopts a drawer-type sample compartment 31 design, and the sample stage 3 that carries the workpiece 10 is completely integrated into this drawer structure. During operation, the workpiece 10 can be easily placed or removed simply by pulling out the drawer, and then pushed in to lock it. The whole process is smooth and safe, avoiding the risk of accidental contact that may occur if an arm is put into the equipment.

[0041] In this embodiment, a power button 14 and a status indicator light 15 are also provided on the outer wall of the housing 1. The indicator light clearly reflects the current working status of the device through three-color LEDs (e.g., green represents standby, yellow represents testing, and red represents abnormality).

[0042] The implementation principle of the integrated testing device for perovskite solar cells proposed in this application is as follows: Preparation stage: The operator opens the drawer-type sample chamber 31, places the workpiece 10 to be tested on the sample stage 3, clamps the electrode with the cable, and then pushes the sample chamber in and closes it.

[0043] Start Test: Press the power button 14 and start the preset automated test program through the co-controller 7. The status indicator 15 turns yellow.

[0044] Photoluminescence (PL) imaging: The system first activates the PL excitation source 41, and the emitted excitation light is reflected by the beam splitter 42 and then illuminates the workpiece 10, causing the workpiece 10 to emit PL fluorescence. This fluorescence signal passes through the beam splitter 42 and the bandpass filter 21, and is acquired by the optical imaging component 2 to generate a PL image, which mainly reflects the intrinsic quality and defect distribution of the material.

[0045] Electroluminescence (EL) imaging: The system turns off the PL excitation source 41 and turns on the EL power supply 81. Current is injected into the workpiece 10 through the electroluminescence module. The workpiece 10 emits EL light under electrical injection. The optical imaging component 2 collects the signal and generates an EL image. This image mainly reflects the electrical properties of the workpiece 10.

[0046] Backlight Imaging: The system shuts off the EL power supply 81 and activates the backlight 61 located below the sample stage 3. Light penetrates the workpiece 10 and is captured by the optical imaging component 2 to generate a backlight image, which is mainly used to identify macroscopic structural defects such as physical holes and cracks.

[0047] Analysis Phase: After the test is completed, status indicator 15 turns green. The system has automatically acquired three fully registered images of the PL, EL, and backlight at the same location. R&D personnel can overlay and compare these three images to accurately attribute common defects in workpiece 10.

[0048] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An integrated testing device for perovskite solar cells, characterized in that, include: The enclosure (1), the optical imaging assembly (2) disposed within the enclosure (1), and the sample stage (3) for carrying the workpiece (10) to be inspected; In addition, it also includes: The photoluminescence module (4) is configured to emit excitation light to the workpiece (10) on the sample stage (3) to generate a photoluminescence signal; An electroluminescent module (5) is configured to apply an electrical bias voltage to a workpiece (10) on the sample stage (3) to generate an electroluminescent signal; The backlight imaging module (6) is configured to emit a light beam that penetrates the workpiece (10) on the sample stage (3); The photoluminescence module (4), electroluminescence module (5) and backlight imaging module (6) are integrated with the sample stage (3) and the optical imaging component (2) in the housing (1), so that when the workpiece (10) is kept in a fixed position on the sample stage (3), the optical imaging component (2) can sequentially acquire the PL image, EL image and backlight image generated by the aforementioned three modules respectively, so as to realize the correlation analysis of defects at the same workpiece (10) position.

2. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The optical imaging component (2) is also provided with a bandpass filter (21) in its optical path. The transmission band of the bandpass filter (21) matches the characteristic band of the photoluminescence signal of the workpiece (10).

3. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The photoluminescence module (4) includes a PL excitation light source (41) and a beam splitter (42). The beam splitter (42) is disposed in the optical path between the optical imaging component (2) and the sample stage (3) and is configured to: reflect the excitation light emitted by the PL excitation light source (41) to the workpiece (10) on the sample stage (3); and allow the photoluminescence signal emitted from the workpiece (10) to be transmitted through the beam splitter (42) to the optical imaging component (2).

4. The integrated testing device for perovskite solar cells according to claim 3, characterized in that, The photoluminescence module (4) further includes an optical path block (43) disposed in the optical path path. The PL excitation light source (41) and the beam splitter (42) are integrated in the optical path block (43). A heat sink (44) is connected to the side of the optical path block (43) near the PL excitation light source (41). The heat sink (44) is configured to dissipate the heat generated by the PL excitation light source (41). Alternatively, the side wall of the housing (1) is also provided with a heat dissipation air inlet (11) and a cooling fan (12).

5. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The backlight imaging module (6) includes a backlight source (61), and the backlight source (61) and the optical imaging component (2) are respectively disposed on both sides of the sample stage (3) to realize transmissive imaging of the workpiece (10).

6. An integrated testing device for perovskite solar cells according to claim 3 or 5, characterized in that, The backlight imaging module (6) includes a backlight source (61), and the photoluminescence module (4) includes a PL excitation source (41), both of which are LED arrays.

7. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The device also includes a coordinating controller (7), which is electrically connected to the photoluminescence module (4), the electroluminescence module (5), the backlight imaging module (6), and the optical imaging component (2). The coordinating controller (7) is configured to automatically trigger the photoluminescence module (4), the electroluminescence module (5), and the backlight imaging module (6) to work in sequence according to a preset timing, and control the optical imaging component (2) to perform image acquisition in the corresponding time window.

8. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The housing (1) is also provided with a power control structure (8), which includes an EL power supply (81) and an independent power supply (82). The EL power supply (81) is configured to apply an electrical bias voltage to the workpiece (10) through the electroluminescent module (5), and the independent power supply (82) is configured to supply power to the photoluminescent module (4), the backlight imaging module (6), and the optical imaging component (2).

9. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The outer wall of the housing (1) is also provided with a monitoring module (13), which is electrically connected to the electroluminescent module (5). The monitoring module (13) is configured to monitor the voltage and current values ​​applied to the workpiece (10) by the electroluminescent module (5) in real time.

10. The integrated testing device for perovskite solar cells according to claim 1, characterized in that, The housing (1) also includes a drawer-type sample compartment (31), and the sample stage (3) that carries the workpiece (10) to be tested is located in the drawer-type sample compartment (31).

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