Pinhole adjustment stand
By using a micrometer-driven spring-assisted structure, the problems of insufficient pinhole adjustment accuracy and high cost are solved, achieving high-precision, low-cost pinhole adjustment, which is suitable for optical systems such as confocal microscopes.
Patent Information
- Application Number
- CN202522417715.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-11-14
- Publication Date
- 2026-08-25
- Estimated Expiration
- 2035-11-14
AI Technical Summary
In the existing technology, the pinhole adjustment device has problems such as insufficient accuracy, high cost, complex structure, and difficulty in promotion and application in ordinary industrial testing and teaching laboratories.
Employing a micrometer-driven and spring-assisted structure, this device achieves multi-degree-of-freedom adjustment of the pinhole in the XOY plane and Z-axis direction using three types of micrometers. The combination of tension and compression springs ensures the stability and accuracy of the adjustment, reducing reliance on high-voltage power supplies and complex control systems.
It achieves high-precision, quantifiable, low-cost, and easy-to-operate adjustment of pinholes, improves the controllability of the adjustment process and the consistency of results, reduces the risk of system failure, and is suitable for a variety of application scenarios.
Smart Images

Figure CN224682472U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of optical precision instrument adjustment device technology, and in particular to pinhole adjustment frame. Background Technology
[0002] As one of the core instruments in the field of modern optical microscopy, the confocal microscope effectively suppresses the interference of stray light from the non-focal plane through the optical path design of point light source illumination and pinhole conjugate detection, which significantly improves the imaging resolution and contrast. It has irreplaceable application value in fields such as biomedical research, materials science analysis and industrial precision testing.
[0003] Among them, the pinhole is a key functional component of the system. The accuracy of its spatial position directly determines the coupling efficiency of the illumination optical path and the detection optical path, which in turn affects the clarity, signal-to-noise ratio and measurement accuracy of the final image. Specifically, the pinhole must be strictly aligned with the focal plane of the objective lens. Any slight positional deviation may lead to optical path mismatch, causing image blurring, artifacts or quantitative analysis errors. Therefore, high-precision adjustment of the pinhole is a crucial part of the assembly, use and maintenance of the confocal system.
[0004] In the existing technology, there are two main types of solutions for pinhole adjustment. One type is the manual coarse adjustment structure commonly used in economical equipment. It achieves pinhole position adjustment through a simple screw pushing mechanism. The pushing force generated by turning the screw pushes the pinhole part to move in the plane or axial direction. This type of structure relies entirely on the operator's experience and feel to control the adjustment force and direction. It not only lacks quantitative feedback of the displacement, but also the adjustment accuracy is limited by the screw pitch, making it difficult to achieve fine adjustment at the micron or even submicron level. Another type is the flexible hinge and piezoelectric drive solution used in high-end scientific research equipment. It uses a flexible hinge structure, such as a frictionless hinge made of a thin metal sheet, to build a floating carrier for the pinhole adjustment mechanism. It is combined with a piezoelectric ceramic actuator to achieve micro-displacement output by driving the pinhole to achieve nanometer-level precision displacement using the inverse piezoelectric effect. However, its technical implementation depends on a complex supporting system: on the one hand, it requires a high-voltage drive power supply and a closed-loop control circuit, resulting in extremely high overall system costs; on the other hand, the small stroke characteristics of the flexible hinge and piezoelectric ceramic, with a single-axis adjustment range of only a few micrometers to tens of micrometers, limit its adjustment flexibility. Moreover, the complex structure is sensitive to environmental temperature, vibration and other factors, making maintenance difficult. It is only suitable for scientific research laboratories with extremely high stability requirements and sufficient budgets, and it is difficult to promote its application in ordinary industrial testing, teaching laboratories and other conventional scenarios.
[0005] Therefore, developing a pinhole adjustment device that combines high-precision adjustment, quantifiable operation, low cost, and simplified structure has become a key requirement for promoting the popularization and performance improvement of confocal microscope technology. Utility Model Content
[0006] This invention aims to solve at least one of the technical problems existing in the prior art. To this end, this invention proposes a pinhole adjustment bracket, which adopts a micrometer drive and spring-assisted structure to achieve three-dimensional high-precision quantifiable adjustment of the pinhole. It is low in cost, easy to operate, and solves the problems of low precision in manual adjustment and high cost of piezoelectric solutions. It is widely applicable to industrial and laboratory scenarios.
[0007] The pinhole adjustment bracket according to an embodiment of the present invention includes: Fixing plate; An adjusting plate is floatingly disposed on the fixed plate along the thickness direction of the fixed plate. A mounting base is movably mounted on the adjustment plate, and the mounting base is used to mount the pinhole plate. Several micrometers are mounted on the adjustment plate, and the ends of the micrometers abut against the mounting base to adjust the position of the mounting base along the length of the fixed plate. Several second micrometers are mounted on the adjustment plate, and the ends of the second micrometers abut against the mounting base to adjust the position of the mounting base along the width direction of the fixed plate; Multiple third micrometers are connected to the fixed plate and the adjusting plate respectively. The multiple third micrometers cooperate to adjust the position of the adjusting plate along the thickness direction of the fixed plate.
[0008] The pinhole adjustment frame according to the embodiments of this utility model has at least the following beneficial effects: the adjustment frame uses a fixed plate as a rigid reference support for the entire device, providing a stable installation foundation and positioning reference for other components. Simultaneously, it defines the spatial coordinate system for pinhole adjustment through its relative positional relationship with the adjustment plate. Furthermore, the coordinated drive of three types of micrometers enables multi-degree-of-freedom adjustment of the pinhole in the XOY plane and Z-axis direction. The operator can directly read the displacement value through the micrometer's dial, thereby achieving quantitative adjustment of the pinhole's X, Y, and Z coordinates. As a mature precision mechanical measurement and adjustment tool, the micrometer, with its standard pitch and minimum scale reaching 0.01mm or even higher, can directly provide quantitative feedback on the displacement. The operator does not need to rely on additional sensors or complex measuring equipment; simply observing the micrometer's dial allows real-time monitoring of the pinhole's movement distance, completely solving the problem of low adjustment accuracy and unpredictable results caused by reliance on operator experience and feel in traditional manual adjustment methods. The reproduced problem significantly improves the controllability of the adjustment process and the consistency of the adjustment results, enabling repeated pinhole position calibration to achieve a stable high-precision state. Furthermore, this structure fully utilizes the reliability and simplicity of mechanical components; the micrometer, fixing plate, adjustment plate, and mounting base are all conventionally machined parts, eliminating the need for complex electronic control systems such as high-voltage power supplies and closed-loop circuits required for piezoelectric drives, or special materials such as flexible hinges. This significantly reduces manufacturing costs and technical barriers, while also reducing the risk of system failure due to electronic component malfunctions or environmental interference, improving the overall reliability and service life of the device. It achieves high-precision, quantifiable, low-cost, and easy-to-operate pinhole adjustment in three-dimensional space, effectively solving the technical problems of insufficient manual adjustment precision and excessively high cost of high-end drive solutions in existing technologies. It provides a superior technical solution for pinhole adjustment in optical systems such as confocal microscopes, combining high performance and economy, and possesses outstanding substantive features and significant progress.
[0009] According to some embodiments of the present invention, the pinhole adjustment frame is connected to the adjustment plate and the fixed plate by a tension spring. The two ends of the tension spring are respectively connected to the fixed plate and the adjustment plate. The tension spring is used to drive the adjustment plate to move toward one side of the fixed plate.
[0010] According to some embodiments of the present invention, the pinhole adjustment frame is fixed with a first fixing screw on the fixing plate and a second fixing screw on the adjustment plate. One end of the tension spring is installed on the first fixing screw and fixedly connected to the fixing plate, and the other end of the tension spring is installed on the second fixing screw and fixedly connected to the adjustment plate.
[0011] According to some embodiments of the present invention, the pinhole adjustment bracket is provided with a first countersunk hole corresponding to the first fixing screw, the adjustment plate is provided with a second countersunk hole corresponding to the second fixing screw, the tension spring can drive the adjustment plate to fit against the mounting base, and the tension spring can be placed in the first countersunk hole and the second countersunk hole.
[0012] According to some embodiments of the present invention, the pinhole adjustment frame has multiple tension springs, which are distributed between the adjustment plate and the fixing plate.
[0013] According to some embodiments of the present invention, the pinhole adjustment frame is provided, wherein the third micrometer is mounted on the adjustment plate, and the end of the third micrometer is extendable and retractable and remains in contact with the surface of the fixed plate.
[0014] According to some embodiments of the present invention, the pinhole adjustment bracket has one first micrometer, and a first compression spring is provided between the adjustment plate and the mounting base. The two ends of the first compression spring are respectively connected to the adjustment plate and the mounting base to push the mounting base towards one side of the first micrometer.
[0015] According to some embodiments of the present invention, the pinhole adjustment bracket has the first compression spring located on the side of the mounting base away from the first micrometer, and the center line of the first compression spring coincides with the center line of the first micrometer.
[0016] According to some embodiments of the present invention, the pinhole adjustment bracket includes a second micrometer, and a second compression spring is provided between the adjustment plate and the mounting base. The two ends of the second compression spring are respectively connected to the adjustment plate and the mounting base to push the mounting base towards one side of the second micrometer.
[0017] According to some embodiments of the present invention, the pinhole adjustment bracket has the second compression spring located on the side of the mounting base away from the second micrometer, and the center line of the second compression spring coincides with the center line of the second micrometer.
[0018] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description
[0019] The above and / or additional aspects and advantages of this utility model will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which: Figure 1 This is a schematic diagram of the overall structure of the pinhole adjustment frame according to an embodiment of the present invention; Figure 2 This is a schematic cross-sectional view of the pinhole adjustment frame according to an embodiment of the present invention; Figure 3 This is an exploded structural diagram of the pinhole adjustment bracket according to an embodiment of the present invention; Figure 4 This is a flowchart illustrating the assembly method of the pinhole adjustment bracket used in embodiments of this utility model; Figure 5 This is a flowchart illustrating the method of using the pinhole adjustment bracket in an embodiment of this utility model.
[0020] Explanation of icon numbers: Fixing plate 100; First countersunk hole 101; First fixing screw 110; Adjusting plate 200; second countersunk hole 201; first micrometer 210; second micrometer 220; third micrometer 230; second fixing screw 240; Mounting base 300; first positioning post 301; second positioning post 302; first compression spring 310; second compression spring 320; 400 pinhole plate; 500 tension spring. Detailed Implementation
[0021] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this utility model, and should not be construed as limiting this utility model.
[0022] In the description of this utility model, it should be understood that the directional descriptions, such as up, down, front, back, left, right, etc., indicate the directional or positional relationship based on the directional or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.
[0023] In the description of this utility model, "several" means one or more, "multiple" means two or more, "greater than," "less than," and "exceeding" are understood to exclude the stated number, while "above," "below," and "within" are understood to include the stated number. If "first" or "second" is used in the description, it is only for the purpose of distinguishing technical features and should not be construed as indicating or implying relative importance, or implicitly indicating the number of indicated technical features, or implicitly indicating the order of the indicated technical features.
[0024] In the description of this utility model, unless otherwise explicitly defined, terms such as "setting," "installation," and "connection" should be interpreted broadly, and those skilled in the art can reasonably determine the specific meaning of the above terms in this utility model in conjunction with the specific content of the technical solution.
[0025] In the description of this utility model, the terms "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of this utility model. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.
[0026] As one of the core instruments in the field of modern optical microscopy, the confocal microscope effectively suppresses the interference of stray light from the non-focal plane through the optical path design of point light source illumination and pinhole conjugate detection, which significantly improves the imaging resolution and contrast. It has irreplaceable application value in fields such as biomedical research, materials science analysis and industrial precision testing.
[0027] Among them, the pinhole is a key functional component of the system. The accuracy of its spatial position directly determines the coupling efficiency of the illumination optical path and the detection optical path, which in turn affects the clarity, signal-to-noise ratio and measurement accuracy of the final image. Specifically, the pinhole must be strictly aligned with the focal plane of the objective lens. Any slight positional deviation may lead to optical path mismatch, causing image blurring, artifacts or quantitative analysis errors. Therefore, high-precision adjustment of the pinhole is a crucial part of the assembly, use and maintenance of the confocal system.
[0028] In the existing technology, there are two main types of solutions for pinhole adjustment. One type is the manual coarse adjustment structure commonly used in economical equipment. It achieves pinhole position adjustment through a simple screw pushing mechanism. The pushing force generated by turning the screw pushes the pinhole part to move in the plane or axial direction. This type of structure relies entirely on the operator's experience and feel to control the adjustment force and direction. It not only lacks quantitative feedback of the displacement, but also the adjustment accuracy is limited by the screw pitch, making it difficult to achieve fine adjustment at the micron or even submicron level. Another type is the flexible hinge and piezoelectric drive solution used in high-end scientific research equipment. It uses a flexible hinge structure, such as a frictionless hinge made of a thin metal sheet, to build a floating carrier for the pinhole adjustment mechanism. It is combined with a piezoelectric ceramic actuator to achieve micro-displacement output by driving the pinhole to achieve nanometer-level precision displacement using the inverse piezoelectric effect. However, its technical implementation depends on a complex supporting system: on the one hand, it requires a high-voltage drive power supply and a closed-loop control circuit, resulting in extremely high overall system costs; on the other hand, the small stroke characteristics of the flexible hinge and piezoelectric ceramic, with a single-axis adjustment range of only a few micrometers to tens of micrometers, limit its adjustment flexibility. Moreover, the complex structure is sensitive to environmental temperature, vibration and other factors, making maintenance difficult. It is only suitable for scientific research laboratories with extremely high stability requirements and sufficient budgets, and it is difficult to promote its application in ordinary industrial testing, teaching laboratories and other conventional scenarios.
[0029] Therefore, developing a pinhole adjustment device that combines high-precision adjustment, quantifiable operation, low cost, and simplified structure has become a key requirement for promoting the popularization and performance improvement of confocal microscope technology.
[0030] Therefore, such as Figures 1 to 3As shown, the pinhole adjustment frame proposed in this utility model includes a fixed plate 100, an adjustment plate 200 floatingly disposed on the fixed plate 100 along the thickness direction of the fixed plate 100, a mounting base 300 movably disposed on the adjustment plate 200 for mounting a pinhole plate 400, a plurality of first micrometers 210 mounted on the adjustment plate 200, a plurality of second micrometers 220 mounted on the adjustment plate 200, and a plurality of third micrometers 230 respectively connected to the fixed plate 100 and the adjustment plate 200. Specifically, the ends of the first micrometers 210 abut against the mounting base 300 to adjust the position of the mounting base 300 along the length direction of the fixed plate 100; the ends of the second micrometers 220 abut against the mounting base 300 to adjust the position of the mounting base 300 along the width direction of the fixed plate 100; and the plurality of third micrometers 230 cooperate to adjust the position of the adjustment plate 200 along the thickness direction of the fixed plate 100. It should be noted that the adjustment frame uses the fixed plate 100 as a rigid reference support for the entire device, providing a stable installation foundation and positioning reference for other components. Simultaneously, the spatial coordinate system for pinhole adjustment is defined by its relative positional relationship with the adjustment plate 200. Specifically, the coordinated drive of three types of micrometers enables multi-degree-of-freedom adjustment of the pinhole in the XOY plane and Z-axis direction. The operator can directly read the displacement value through the micrometer's dial, thereby achieving quantitative adjustment of the pinhole's X, Y, and Z coordinates. As a mature precision mechanical measurement and adjustment tool, the micrometer, with its standard pitch and minimum scale reaching 0.01mm or even higher, can directly provide quantitative feedback on displacement. The operator does not need to rely on additional sensors or complex measuring equipment; simply observing the micrometer's dial allows real-time monitoring of the pinhole's movement distance. This completely solves the problems of low adjustment accuracy and unreproducible results caused by reliance on operator experience and feel in traditional manual adjustment methods, significantly improving the adjustment efficiency. The controllability of the adjustment process and the consistency of the adjustment results enable repeated pinhole position calibration to achieve a stable high-precision state. Furthermore, this structure fully utilizes the reliability and simplicity of mechanical components. The micrometer, fixed plate 100, adjusting plate 200, and mounting base 300 are all conventionally machined parts, eliminating the need for complex electronic control systems such as high-voltage power supplies and closed-loop circuits required for piezoelectric drives, or special materials such as flexible hinges. This significantly reduces manufacturing costs and technical barriers, while also reducing the risk of system failure due to electronic component malfunctions or environmental interference, improving the overall reliability and service life of the device. It achieves high-precision, quantifiable, low-cost, and easy-to-operate pinhole adjustment in three-dimensional space, effectively solving the technical problems of insufficient manual adjustment precision and excessively high cost of high-end drive solutions in existing technologies. It provides a superior technical solution for pinhole adjustment in optical systems such as confocal microscopes, combining high performance and economy, and possesses outstanding substantive features and significant progress.
[0031] Refer to Figure 2In some embodiments of this utility model, the adjusting plate 200 and the fixed plate 100 are connected by a tension spring 500. The two ends of the tension spring 500 are connected to the fixed plate 100 and the adjusting plate 200 respectively. The tension spring 500 is used to drive the adjusting plate 200 to move towards one side of the fixed plate 100, which cleverly solves the problem of unexpected displacement of the adjusting plate 200 during the adjustment process. When no micrometer driving force is applied, the preload of the tension spring 500 causes the adjusting plate 200 to naturally return to the initial position, ensuring the basic stability of the adjusting frame. When the adjusting force is applied by the third micrometer 230, the tensile deformation of the tension spring 500 allows the adjusting plate 200 to float controllably along the thickness direction of the fixed plate 100, providing the necessary space for the three-dimensional adjustment of the pinholes set on the pinhole plate 400. Furthermore, the introduction of the tension spring 500 not only simplifies the reset mechanism of the adjusting plate 200 and avoids the additional design of a complex reset structure, but also reduces the impact or wear caused by rigid collisions of components during the adjustment process through the adaptive adjustment characteristics of the elastic force, extending the service life of the adjusting frame while maintaining high precision and reliability in the adjustment process. Specifically, in some embodiments of this utility model, the fixing plate 100 is fixed with a first fixing screw 110, and the adjusting plate 200 is fixed with a second fixing screw 240. For example, the first fixing screw 110 is fixed to the fixing plate 100 by a first fixing nut, and the second fixing screw 240 is fixed to the adjusting plate 200 by a second fixing nut. Further, one end of the tension spring 500 is mounted on the first fixing screw 110 and fixedly connected to the fixing plate 100, and the other end of the tension spring 500 is mounted on the second fixing screw 240 and fixedly connected to the adjusting plate 200. Understandably, the first fixing screw 110 on the fixed plate 100 and the second fixing screw 240 on the adjusting plate 200 provide clear installation positioning points for the tension spring 500, ensuring that the tension direction of the tension spring 500 is strictly consistent with the floating direction of the adjusting plate 200. This avoids additional lateral force or torsional deformation caused by misalignment of the tension spring 500, thus ensuring that the tension of the tension spring 500 always acts in the expected adjustment direction, improving the stability and controllability of the adjusting frame in the thickness direction, i.e., the pinhole during Z-axis adjustment. Furthermore, the screw fixing method allows users to quickly disassemble or replace the tension spring 500 according to actual adjustment needs, improving the maintenance convenience of the adjusting frame. Simultaneously, by adjusting the screw insertion depth or replacing the tension spring 500 with a different elastic coefficient, it can flexibly adapt to the needs of different weight pinhole plates 400 or different adjustment strokes, further expanding the applicability and functional flexibility of the adjusting frame, ensuring optimal adjustment performance in diverse application scenarios.Furthermore, considering better space saving when not in use, in some embodiments of this utility model, the fixing plate 100 is provided with a first countersunk hole 101 corresponding to the first fixing screw 110, and the adjusting plate 200 is provided with a second countersunk hole 201 corresponding to the second fixing screw 240. The tension spring 500 can drive the adjusting plate 200 to fit against the mounting base 300, and the tension spring 500 can be placed in the first countersunk hole 101 and the second countersunk hole 201. This not only improves the structural compactness and aesthetics of the adjusting frame, and facilitates the stacking and storage of the adjusting plate 200 and the fixing plate 100 when not in use, i.e., after removing the third micrometer 230, but also enhances the stability and reliability of the tension spring 500. Understandably, the first countersunk hole 101 on the fixed plate 100 and the second countersunk hole 201 on the adjusting plate 200 not only provide storage space for the tension spring 500, allowing it to be placed inside the countersunk hole in its natural or pre-tensioned state, but also provide physical restraint for the adjusting plate 200 in the adjusting state, limiting excessive deformation or displacement of the tension spring 500 in the non-adjusting direction. This further ensures that the tension of the tension spring 500 always acts along the floating direction of the adjusting plate 200, i.e., the thickness direction, improving the accuracy and consistency of the adjustment process. Furthermore, the countersunk hole design facilitates the assembly and positioning of the tension spring 500, reducing installation difficulty, while providing additional protection for the tension spring 500, reducing the impact of external dust or impurities on its performance, extending its service life, and ensuring that the adjusting frame maintains stable adjusting performance during long-term use. Optionally, there may be multiple tension springs 500, distributed between the adjusting plate 200 and the fixed plate 100. Through the synergistic action of multiple tension springs 500, the force between the adjusting plate 200 and the fixed plate 100 can be evenly distributed, avoiding the problem of elastic fatigue or inconsistent deformation caused by excessive force on a single tension spring 500. This ensures that the force on the adjusting plate 200 is balanced in all directions during the floating process, maintaining the structural symmetry and adjustment consistency of the adjusting frame, and ensuring that the adjusting plate 200 can always move smoothly during the adjustment process, avoiding adjustment deviations or jamming caused by uneven local force. In addition, the presence of multiple tension springs 500 also provides a sufficient structural basis for tilting the pinholes of the pinhole plate 400 for differentiated adjustments by multiple micrometers, further expanding the dimensions of pinhole adjustment. In some embodiments of this utility model, the third micrometer 230 is installed on the adjusting plate 200, and the end of the third micrometer 230 can extend and retract and maintain contact with the surface of the fixed plate 100.The third micrometer 230 has an extendable end that directly interacts with the surface of the fixed plate 100. By rotating the micrometer cylinder of the third micrometer 230, the extension length of the micrometer screw can be changed, precisely controlling the displacement of the adjusting plate 200 along the thickness direction. This, in turn, causes the mounting base 300 and the pinhole mounted on the adjusting plate 200 to move axially or change their tilt angle. This design fully utilizes the high-precision scale and stable mechanical characteristics of the micrometer. The operator can directly read the adjustment amount through the scale of the third micrometer 230, achieving quantitative control of the Z-axis displacement. This solves the problems of low adjustment accuracy and unreproducible results caused by the lack of feedback in traditional manual adjustment. At the same time, the direct connection structure between the third micrometer 230 and the adjusting plate 200 simplifies the transmission path, reduces energy loss and error accumulation in intermediate links, and further improves the accuracy and response speed of the adjustment, providing reliable technical support for the pinhole axial calibration of optical systems such as confocal microscopes.
[0032] Refer to Figure 3In some embodiments of this utility model, there is one first micrometer 210, and a first compression spring 310 is provided between the adjusting plate 200 and the mounting base 300. The two ends of the first compression spring 310 are respectively connected to the adjusting plate 200 and the mounting base 300 to push the mounting base 300 against one side of the first micrometer 210. Understandably, the first compression spring 310 is positioned between the adjusting plate 200 and the mounting base 300, with its two ends connected to the adjusting plate 200 and the mounting base 300 respectively. It pushes the mounting base 300 against one side of the first micrometer 210 when no driving force is applied or when a driving force is applied, ensuring stable contact between the mounting base 300 and the micrometer. Furthermore, the preload of the first compression spring 310 ensures that the micrometer screw of the first micrometer 210 maintains appropriate contact pressure with the mounting base 300, avoiding poor contact caused by a floating adjusting plate 200 or a loose mounting base 300. This guarantees precise control of the displacement of the mounting base 300 by the first micrometer 210. In application, when rotating the first micrometer 210 to adjust the X-axis displacement, the first compression spring 310 can adaptively compensate for minor gaps or vibrations during the adjustment process, maintaining the continuity and stability of the driving force, further improving the adjustment accuracy and the reproducibility of the results. Furthermore, the introduction of the first compression spring 310 simplifies the structural design of the adjustment bracket, eliminating the need for an additional locking mechanism to maintain the adjusted state of the mounting base 300. This reduces manufacturing costs and operational complexity, while simultaneously improving the safety and reliability of the adjustment process. Specifically, the first compression spring 310 is located on the side of the mounting base 300 opposite to the first micrometer 210, and its centerline coincides with that of the first micrometer 210. This centerline coincidence ensures that the direction of the spring force of the first compression spring 310 is on the same straight line as the direction of the driving force of the first micrometer 210, avoiding lateral force or torque interference caused by the skewness of the first compression spring 310. This ensures that the displacement of the mounting base 300 in the X-axis direction is strictly along a straight path, reducing deviations and wear during the adjustment process. In addition, the symmetrical arrangement of the first compression spring 310 with the first micrometer 210 also evenly distributes the force during the adjustment process, reducing local stress concentration between the mounting base 300 and the adjustment plate 200, and extending the service life of the components.
[0033] Similarly, refer to Figure 3In some embodiments of this utility model, a second micrometer 220 is provided, and a second compression spring 320 is disposed between the adjusting plate 200 and the mounting base 300. The two ends of the second compression spring 320 are connected to the adjusting plate 200 and the mounting base 300 respectively, so as to push the mounting base 300 against one side of the second micrometer 220. Similarly, the second compression spring 320 is located on the side of the mounting base 300 opposite to the second micrometer 220, and the center line of the second compression spring 320 coincides with the center line of the second micrometer 220. The function and effect of the second compression spring 320 on the second micrometer 220 and the mounting base 300 can be referred to the function and effect of the first compression spring 310 on the first micrometer 210 and the mounting base 300, which will not be described in detail here.
[0034] In some embodiments of this utility model, see also Figure 3 The mounting base 300 has a first positioning post 301 and a second positioning post 302 on its outer side, which are spaced apart around the circumference of the mounting base 300. Correspondingly, a first compression spring 310 is located on the side of the mounting base 300 opposite to the first micrometer 210 and is sleeved with the first positioning post 301, and a second compression spring 320 is located on the side of the mounting base 300 opposite to the second micrometer 220 and is sleeved with the second positioning post 302, thereby facilitating the positioning and installation of the first compression spring 310 and the second compression spring 320.
[0035] Refer to Figure 4 The assembly method according to the present invention is applied to the pinhole adjustment bracket according to the present invention, wherein the assembly method includes the following steps: S110, Fix one end of the tension spring: One end of the tension spring 500 is fixed to the screw head of the first fixing screw 110, and the first fixing screw 110 is screwed into and fixed to the fixing plate 100. S120, Fix the other end of the tension spring: The other end of the tension spring is fixed to the screw head of the second fixing screw 240, and the second fixing screw 240 is screwed into and fixed to the adjusting plate 200. S130, Installing the pinhole plate: The pinhole plate 400 is installed on the inside of the mounting base 300; S1401, Install compression springs: The first compression spring 310 is fitted into the first positioning post 301, and the second compression spring 320 is fitted into the second positioning post 302; S140, Connecting Mounting Base: After the compression spring is installed, the first micrometer 210 is screwed into the adjusting plate 200 and the end of the first micrometer 210 is driven to press against the mounting base 300. The second micrometer 220 is screwed into the adjusting plate 200 and the end of the second micrometer 220 is driven to press against the mounting base 300. S200, Connecting Adjustment Plate: After fixing one end of the tension spring, fixing the other end of the tension spring, installing the pinhole plate and connecting mounting base, the third micrometer 230 is screwed into the adjustment plate 200 and the end of the third micrometer 230 is driven to press against the fixed base.
[0036] It should be noted that the tension spring 500, the pinhole plate 400, and the compression spring are assembled in parallel, allowing for separate assembly to improve efficiency. The mounting base 300 is then floatingly connected to the adjusting plate 200 via the first micrometer 210 and the second micrometer 220. Next, the adjusting plate 200 is floatingly connected to the fixed base via the third micrometer 230 to complete the assembly. By placing the micrometers in the later assembly step, the force transmission path between the fixed plate 100, the adjusting plate 200, and the mounting base 300 is ensured to be accurate. This ensures that the adjusting frame can be directly put into high-precision adjustment after assembly, significantly improving production efficiency and product quality.
[0037] Other configurations and operations of the assembly method according to the embodiments of this utility model are known to those skilled in the art and will not be described in detail here.
[0038] Refer to Figure 5 The method of use according to an embodiment of the present invention is applied to a pinhole adjustment bracket according to an embodiment of the present invention, wherein the method of use A100 includes the following steps: A110. Adjust the X-axis position: Tighten the first micrometer 210 to adjust the X-axis position of the mounting base 300; A120. Adjust the Y-axis position: Turn the second micrometer 220 to adjust the Y-axis position of the mounting base 300; A130. Adjust the Z-axis position: Tighten several micrometers 230 to adjust the Z-axis position of the mounting base 300 and / or the tilt angle of the mounting base 300.
[0039] To address this, independent adjustment operations were designed for the X, Y, and Z axes, achieving quantitative control through scale feedback. Furthermore, rotating multiple third micrometers 230 allows for simultaneous or independent adjustment of the tilt angle of the mounting base 300, meeting the needs of complex optical path calibration. This split-axis adjustment mode enables operators to flexibly select the adjustment sequence and magnitude based on actual image quality feedback. For example, prioritizing the adjustment of the Z-axis to ensure optical path coupling, and then optimizing the X / Y axes to improve planar coordinate accuracy, thereby significantly improving adjustment efficiency and image quality. In addition, the quantitative adjustment characteristics based on the micrometers avoid the reliance on experience in traditional manual adjustments, making the adjustment process reproducible and the results verifiable. This lowers the operational threshold and improves the consistency of system assembly and adjustment, providing strong support for the rapid deployment and precise maintenance of optical equipment such as confocal microscopes.
[0040] Other configurations and operations of the usage method according to the embodiments of this utility model are known to those skilled in the art and will not be described in detail here.
[0041] The embodiments of the present utility model have been described in detail above with reference to the accompanying drawings. However, the present utility model is not limited to the above embodiments. Within the scope of knowledge possessed by those skilled in the art, various changes can be made without departing from the spirit of the present utility model.
Claims
1. A pinhole adjustment bracket, characterized in that, include: Fixing plate; An adjusting plate is floatingly disposed on the fixed plate along the thickness direction of the fixed plate. A mounting base is movably mounted on the adjustment plate, and the mounting base is used to mount the pinhole plate. Several micrometers are mounted on the adjustment plate, and the ends of the micrometers abut against the mounting base to adjust the position of the mounting base along the length of the fixed plate. Several second micrometers are mounted on the adjustment plate, and the ends of the second micrometers abut against the mounting base to adjust the position of the mounting base along the width direction of the fixed plate; Multiple third micrometers are connected to the fixed plate and the adjusting plate respectively. The multiple third micrometers cooperate to adjust the position of the adjusting plate along the thickness direction of the fixed plate.
2. The pinhole adjustment bracket according to claim 1, characterized in that: The adjusting plate and the fixed plate are connected by a tension spring. The two ends of the tension spring are connected to the fixed plate and the adjusting plate, respectively. The tension spring is used to drive the adjusting plate to move towards one side of the fixed plate.
3. The pinhole adjustment bracket according to claim 2, characterized in that: The fixing plate is fixed with a first fixing screw, the adjusting plate is fixed with a second fixing screw, one end of the tension spring is installed on the first fixing screw and fixedly connected to the fixing plate, and the other end of the tension spring is installed on the second fixing screw and fixedly connected to the adjusting plate.
4. The pinhole adjustment bracket according to claim 3, characterized in that: The fixing plate is provided with a first countersunk hole corresponding to the first fixing screw, the adjusting plate is provided with a second countersunk hole corresponding to the second fixing screw, the tension spring can drive the adjusting plate to fit against the mounting base, and the tension spring can be placed in the first countersunk hole and the second countersunk hole.
5. The pinhole adjustment bracket according to claim 2, characterized in that: There are multiple tension springs, which are distributed between the adjusting plate and the fixing plate.
6. The pinhole adjustment bracket according to any one of claims 1 to 5, characterized in that: The third micrometer is mounted on the adjustment plate, and the end of the third micrometer is telescopic and keeps in contact with the surface of the fixed plate.
7. The pinhole adjustment bracket according to claim 1, characterized in that: The first micrometer has one end, and a first compression spring is provided between the adjusting plate and the mounting base. The two ends of the first compression spring are respectively connected to the adjusting plate and the mounting base to push the mounting base towards one side of the first micrometer.
8. The pinhole adjustment bracket according to claim 7, characterized in that: The first compression spring is located on the side of the mounting base opposite to the first micrometer, and the center line of the first compression spring coincides with the center line of the first micrometer.
9. The pinhole adjustment bracket according to claim 1, characterized in that: The second micrometer has one end, and a second compression spring is provided between the adjusting plate and the mounting base. The two ends of the second compression spring are respectively connected to the adjusting plate and the mounting base to push the mounting base towards one side of the second micrometer.
10. The pinhole adjustment bracket according to claim 9, characterized in that: The second compression spring is located on the side of the mounting base opposite to the second micrometer, and the center line of the second compression spring coincides with the center line of the second micrometer.