A new high-speed test mechanism for 0BB

Abstract

The utility model discloses a novel high -speed test mechanism of 0BB, including bottom plate and install the carousel and IV detection subassembly on bottom plate, the outside shaping of carousel has four stations, and both sides of every station all are installed with adsorption subassembly, and one side of IV detection subassembly installs detection camera, and the front end of IV detection subassembly is installed with XYT adjusting platform, and both sides of XYT adjusting platform all are provided with vertical adjusting seat, and the installation board is connected between two vertical adjusting seats, and the support seat is installed on the installation board, and the PCB vacuum support board is locked on the support seat. This novel high -speed test mechanism of 0BB is transferred to the top of PCB vacuum support board by carousel after the photograph of camera, and the lower surface of silicon wafer is detected after the rise of PCB in the position adjustment of PCB vacuum support board, and the stability of silicon wafer is improved by the adsorption of silicon wafer, and the smooth operation of IV detection is guaranteed.

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