Alloy chip resistor appearance detection device

Abstract

The utility model provides a kind of alloy patch resistor appearance detection device, it includes center turntable, feeding assembly, bottom camera, side direction camera, top camera and sorting assembly.The center turntable is equipped with load ring, and load ring is transparent;Feeding assembly includes bunker, conveying belt, lever, return spring and cam, and the bottom of bunker is equipped with discharge port, and discharge port is towards the demarcation position of lever and conveying belt, and the position of bunker adjacent conveying belt is equipped with gyro wheel, and the surface of gyro wheel and conveying belt is equipped with interval.In the alloy patch resistor appearance detection device described above, load ring is transparent, and bottom camera and top camera are respectively configured on its upper and lower sides to collect the front and back image information of patch resistor;Lever and conveying belt cooperate to replace mechanical arm to feed one by one to be measured resistance, save the process of clamping product, improve the efficiency of patch resistor appearance detection.

Description

Technical Field

[0001] This utility model relates to the field of alloy chip resistor production, and in particular to an appearance inspection device for alloy chip resistors. Background Technology

[0002] Surface mount resistors are made by mixing metal powder and glass enamel powder and then screen printing the mixture onto a substrate. They are resistant to moisture and high temperatures and have a small temperature coefficient. They can significantly save circuit space and costs, allowing for more refined designs, and are now being mass-produced using existing manufacturing processes.

[0003] Because surface mount resistors are small and thin components, and are mass-produced, the large number of products manufactured on assembly lines puts significant pressure on product inspection. Existing inspection equipment requires clamping and positioning the surface mount resistors before using CCD images to determine if there are any defects in their appearance. Even with the assistance of robotic arms, the efficiency of clamping and disassembling products cannot keep up with the assembly speed of surface mount resistors. Furthermore, the appearance inspection process requires capturing images of both the front and back of the product; simply increasing the number of clamping stations cannot meet the inspection requirements.

[0004] Therefore, how to improve the appearance inspection efficiency of existing chip resistors is a problem that needs to be solved. Utility Model Content

[0005] The purpose of this invention is to overcome the shortcomings of the existing technology and provide an alloy chip resistor appearance inspection device that saves clamping and disassembly steps in the appearance inspection process and improves inspection sales.

[0006] The objective of this utility model is achieved through the following technical solution: An appearance inspection device for alloy chip resistors includes: a central turntable and a feeding assembly, a bottom camera, a side camera, a top camera, and a sorting assembly arranged around the central turntable; The central turntable is equipped with a material carrying ring, which is transparent. The bottom camera and the top camera are located on both sides of the material carrying ring, and the side camera faces the center of the material carrying ring. The feeding assembly includes a hopper, a conveyor belt, a lever, a return spring, and a cam. The bottom of the hopper has a discharge port facing the boundary between the lever and the conveyor belt, so that the surface mount resistor to be tested located at the discharge port can simultaneously contact the lever and the conveyor belt. A roller is provided near the conveyor belt in the hopper, and there is a gap between the roller and the surface of the conveyor belt. The cam is used to drive the lever to swing towards the conveyor belt, so that the lever pushes the surface mount resistor to be tested into the gap between the roller and the conveyor belt.

[0007] In one embodiment, the lever is provided with a feeding part, which contacts the edge of the chip resistor to be tested, and the thickness of the feeding part is less than the thickness of the chip resistor.

[0008] In one embodiment, the return spring contacts the lever, and the return spring is used to push the lever away from the conveyor belt.

[0009] In one embodiment, the bottom camera, the side camera, and the top camera are all equipped with adjustable brackets.

[0010] In one embodiment, the sorting assembly includes a plurality of collection tanks and a plurality of air nozzles that match the collection tanks. The air nozzles are located above the material carrying ring and face the opening of the collection tank.

[0011] In one embodiment, a label is affixed to the outer wall of the collection tank.

[0012] In one embodiment, the sorting component further includes a card holder with multiple limiting grooves, and the bottom of the collection tank is embedded in the limiting grooves.

[0013] In one embodiment, the collection tank is provided with a handrail.

[0014] In one embodiment, the opening of the collection tank extends from the side of the material-carrying ring to the bottom surface of the material-carrying ring.

[0015] In one embodiment, the lever has a clearance portion on the side near the conveyor belt.

[0016] In the aforementioned alloy chip resistor appearance inspection device, the material carrier ring is a transparent part, and bottom cameras and top cameras are respectively arranged on its upper and lower sides to collect front and back image information of the chip resistor; the lever and the conveyor belt work together to replace the robotic arm to feed the resistors to be tested one by one, saving the product clamping process and improving the efficiency of chip resistor appearance inspection. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of a device for inspecting the appearance of alloy chip resistors. Figure 2 This is a structural diagram of the sorting and feeding components; Figure 3 Top view of an alloy chip resistor appearance inspection device; Figure 4 This is a schematic diagram showing the interaction between the feeding assembly and the central turntable; Figure 5 This is a diagram showing the internal state of the feeding component before the feeding action is performed. Figure 6 This is a diagram showing the internal state of the feeding component when performing the feeding action.

[0019] Reference numerals: 10, Alloy chip resistor appearance inspection device; 20, Chip resistor; 100, Central turntable; 110, Material carrying ring; 200, Feeding assembly; 210, Hopper; 211, Discharge port; 212, Roller; 220, Conveyor belt; 230, Lever; 231, Feeding part; 232, Clearance part; 240, Return spring; 250, Cam; 300, Bottom camera; 400, Side camera; 500, Top camera; 600, Sorting assembly; 610, Collection tank; 611, Label; 612, Handrail; 620, Air nozzle; 630, Card holder; 700, Adjustable distance bracket. Detailed Implementation

[0020] To facilitate understanding of this utility model, a more complete description will be given below with reference to the accompanying drawings. The drawings illustrate preferred embodiments of this utility model. However, this utility model can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the disclosure of this utility model.

[0021] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly attached to the other element or there may be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0023] Please see Figure 1and Figure 3 This utility model provides an alloy chip resistor appearance inspection device 10, which includes: a central turntable 100 and a feeding component 200, a bottom camera 300, a side camera 400, a top camera 500 and a sorting component 600 arranged around the central turntable 100.

[0024] Please see Figure 1 and Figure 2 The central turntable 100 is equipped with a material carrier ring 110, which is transparent. This ensures that the bottom of the surface mount resistor is not obstructed when it is placed on the material carrier ring 110, eliminating the need to flip the resistor during image acquisition. A bottom camera 300 and a top camera 500 are located on either side of the material carrier ring 110, while a side camera 400 faces the center of the material carrier ring 110. These three cameras (bottom camera 300, top camera 500, and side camera 400) are used to photograph the surface mount resistor, capturing images of its front and back sides. The side camera 400 captures images of the resistor's side to check for any warping issues.

[0025] Please see Figure 4 and Figure 5 The feeding assembly 200 includes a hopper 210, a conveyor belt 220, a lever 230, a return spring 240, and a cam 250. The bottom of the hopper 210 has a discharge port 211 facing the boundary between the lever 230 and the conveyor belt 220, so that the surface-mount resistor to be tested located at the discharge port 211 simultaneously contacts both the lever 230 and the conveyor belt 220. A roller 212 is located near the conveyor belt 220 in the hopper 210, with a gap between the roller 212 and the surface of the conveyor belt 220. The cam 250 drives the lever 230 to swing towards the conveyor belt 220, so that the lever 230 pushes the surface-mount resistor 20 to be tested into the gap between the roller 212 and the conveyor belt 220. Figure 6 As shown.

[0026] The principle of the alloy chip resistor appearance inspection device 10 for performing appearance inspection on the chip resistor 20 is as follows: The surface mount resistors to be tested are stored in the hopper 210. The surface mount resistors in the hopper 210 are stacked, with one side of the bottommost surface mount resistor 20 in contact with the lever 230 and the other side in contact with the conveyor belt 220. At this point, the friction generated by the rotation of the conveyor belt 220 is insufficient to detach the surface mount resistor from the hopper 210. The rotation of the cam 250 pushes the lever 230 to swing, causing the lever 230 to push the surface mount resistor 20 into the gap between the roller 212 and the conveyor belt 220. The squeezing action of roller 212 increases the friction between the conveyor belt 220 and the chip resistor 20. Furthermore, the push of lever 230 causes the chip resistor 20 to shift away from adjacent chip resistors, reducing the contact area and thus decreasing the friction between the chip resistor 20 and its adjacent counterparts. This reduces the resistance to the chip resistor 20's displacement, allowing it to be carried out of the hopper 210 by the conveyor belt 220 and transferred to the loading ring 110. At this point, the components within the hopper 210 are... Figure 5 The state shown becomes Figure 6 The state shown.

[0027] When the central turntable 100 rotates, it drives the chip resistors 20 on the material carrier ring 110 to pass through the bottom camera 300, the side camera 400, and the top camera 500 in sequence to collect image information of the back, side, and front of the chip resistors 20. This allows the chip resistors 20 with appearance defects to be identified, and the sorting component 600 removes the defective resistors, thus completing the appearance inspection process.

[0028] As can be seen from the above, the swing of the lever 230 is triggered by the cam 250. The cam 250 rotates at a constant speed, which drives the lever 230 to swing at a fixed rhythm, feeding the chip resistors 20 one by one. It replaces the existing robotic arm for feeding and solves the problem that the chip resistors 20 are difficult to pick up and easy to fall due to their small size.

[0029] Furthermore, the carrier ring 110 is transparent, allowing direct observation of the front and back of the chip resistor 20 after it is placed on it. This means that there is no need to flip the chip resistor 20 during the appearance inspection process, and there is no need to provide a fixture for limiting the position, which effectively improves the appearance inspection efficiency.

[0030] Please see Figure 5 and Figure 6 In one embodiment, the lever 230 is provided with a feeding part 231, which contacts the edge of the chip resistor 20 to be tested. The thickness of the feeding part 231 is less than the thickness of the chip resistor. When the lever 230 swings, it only pushes the chip resistor 20 that is in contact with the feeding part 231 to feed the resistor.

[0031] Please see Figure 5 and Figure 6In one embodiment, the return spring 240 contacts the lever 230, and the return spring 240 is used to push the lever 230 away from the conveyor belt 220. After the lever 230 completes the feeding action, it flips in the opposite direction under the elastic force provided by the return spring 240 to achieve automatic reset.

[0032] Please see Figure 1 and Figure 2 In one embodiment, the bottom camera 300, the side camera 400, and the top camera 500 are all equipped with adjustable brackets 700. The fixed position of the bottom camera 300, the side camera 400, or the top camera 500 can be adjusted by the adjustable brackets 700 to obtain a clearer image.

[0033] Please see Figure 2 In one embodiment, the sorting component 600 includes multiple collection tanks 610 and multiple air nozzles 620 matched with the collection tanks 610. Each collection tank 610 has a handle 612, and the air nozzles 620 are positioned above a material carrier ring 110, facing the opening of the collection tank 610. The air nozzles 620 blow air onto the surface mount resistors 20 on the material carrier ring 110, blowing the surface mount resistors 20 into the material carrier ring 110 to achieve the unloading operation. Multiple material carrier rings 110 are provided, respectively for storing defective and qualified products. Labels 611 are affixed to the outer wall of the collection tanks 610, allowing the operator to visually identify the storage location of qualified and defective surface mount resistors 20. Preferably, the sorting component 600 also includes a card holder 630, which has multiple limiting grooves (not shown). The bottom of the collection tank 610 is embedded in the limiting grooves. The limiting grooves provide positioning to prevent the collection tanks 610 from shifting.

[0034] Please see Figure 2 Preferably, the opening of the collection tank 610 extends from the side of the material carrier ring 110 to the bottom surface of the material carrier ring 110. This increases the coverage area of ​​the opening of the collection tank 610 to ensure that the chip resistor 20 can smoothly enter the opening of the collection tank 610 during the feeding process.

[0035] Please see Figure 5 and Figure 6 In one embodiment, a clearance portion 232 is provided on the side of the lever 230 near the conveyor belt 220. This prevents the lever 230 from interfering with the conveyor belt 220 when it swings, ensuring a smooth and unobstructed feeding process.

[0036] The embodiments described above are merely illustrative of several implementations of this utility model, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this utility model, and these all fall within the protection scope of this utility model. Therefore, the protection scope of this utility model patent should be determined by the appended claims.

Claims

1. A device for inspecting the appearance of alloy chip resistors, characterized in that, include: A central turntable and a feeding assembly, a bottom camera, a side camera, a top camera, and a sorting assembly arranged around the central turntable; The central turntable is equipped with a material carrying ring, which is transparent. The bottom camera and the top camera are located on both sides of the material carrying ring, and the side camera faces the center of the material carrying ring. The feeding assembly includes a hopper, a conveyor belt, a lever, a return spring, and a cam. The bottom of the hopper has a discharge port facing the boundary between the lever and the conveyor belt, so that the surface mount resistor to be tested located at the discharge port can simultaneously contact the lever and the conveyor belt. A roller is provided near the conveyor belt in the hopper, and there is a gap between the roller and the surface of the conveyor belt. The cam is used to drive the lever to swing towards the conveyor belt, so that the lever pushes the surface mount resistor to be tested into the gap between the roller and the conveyor belt.

2. The appearance inspection device for alloy chip resistors according to claim 1, characterized in that, The lever is provided with a feeding part, which contacts the edge of the chip resistor to be tested, and the thickness of the feeding part is less than the thickness of the chip resistor.

3. The alloy chip resistor appearance inspection apparatus according to claim 1, characterized by The return spring contacts the lever, and the return spring is used to push the lever away from the conveyor belt.

4. The alloy chip resistor appearance inspection apparatus according to claim 1, characterized by The bottom camera, the side camera, and the top camera are all equipped with adjustable brackets.

5. The alloy chip resistor appearance inspection apparatus according to claim 1, characterized by The sorting assembly includes multiple collection tanks and multiple air nozzles that match the collection tanks. The air nozzles are located above the material carrying ring and face the opening of the collection tank.

6. The appearance inspection device for alloy chip resistors according to claim 5, characterized in that, The outer wall of the collection tank is labeled.

7. The alloy chip resistor appearance inspection apparatus according to claim 5, characterized by The sorting assembly also includes a card holder, which has multiple limiting grooves, and the bottom of the collection tank is embedded in the limiting grooves.

8. The alloy chip resistor appearance inspection apparatus according to claim 5, characterized by The collection tank is equipped with a handrail.

9. The appearance inspection device for alloy chip resistors according to claim 5, characterized in that, The opening of the collection tank extends from the side of the material-carrying ring to the bottom surface of the material-carrying ring.

10. The appearance inspection device for alloy chip resistors according to claim 1, characterized in that, The lever has a clearance section on the side closest to the conveyor belt.

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