Flow diverter structure

By designing diagonally distributed current guides and protruding sampling sections, the current distribution is optimized, solving the temperature drift problem caused by current concentration in traditional shunts, and achieving higher current measurement accuracy and heat dissipation efficiency.

CN224934054UActive Publication Date: 2026-11-03SHENZHEN YEZHAN ELECTRONICS
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Patent Information

Application Number
CN202522027178.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-19
Publication Date
2026-11-03
Estimated Expiration
2035-09-19

AI Technical Summary

Technical Problem

Traditional large-size shunts, under high-current scenarios, suffer from localized current concentration in the resistive element due to unreasonable design of the current input and output points, resulting in excessive temperature drift and affecting the accuracy of current measurement.

Method used

The design employs a diagonally distributed current guide section, combined with an integrally molded protruding sampling section and adjustment groove structure, to optimize the current flow, evenly distribute the current, reduce local temperature rise, and improve resistance stability.

Benefits of technology

It effectively reduces temperature drift, improves current measurement accuracy, and maintains the heat dissipation advantage of large-size shunts, making it suitable for high-current precision measurement scenarios.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a shunt structure, including resistance body, first pin, second pin and flow guide structure, resistance body has opposite first connection side and second connection side in the first direction, the first pin connects first connection side, and the second pin connects second connection side, and the flow guide structure includes the first flow guide part of input current and the second flow guide part of output current, both are arranged in the one end of first pin, second pin away from resistance body, and diagonal distribution is presented on the shunt structure. The utility model discloses the current direction of optimization through diagonal distribution's flow guide part, effectively disperses the current on resistance body, reduces the local temperature rise of local current concentration on resistance body, thereby reduces temperature drift, preserves the heat dissipation advantage of big size shunt simultaneously, improves resistance value stability, improves current measurement precision, is applicable to big current accurate measurement scene.
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Description

Technical Field

[0001] This utility model relates to the field of electronic technology, specifically to a shunt structure. Background Technology

[0002] This utility model relates to the field of current measurement and power electronics technology, specifically to a shunt structure for high current scenarios. As a core component for accurate current measurement, the shunt is widely used in new energy vehicles, industrial control, energy storage systems and other fields. Its working principle is based on Ohm's law. By collecting the voltage signal across the two ends of the shunt body and combining it with the known shunt resistance value, the current value flowing through it is calculated. Therefore, the resistance stability of the shunt directly determines the accuracy of current measurement.

[0003] While existing large-size shunts possess good heat dissipation capabilities and can adapt to long-term high-current operation, their temperature drift values ​​are generally large, causing the current measurement accuracy to decrease with the increase of ambient temperature or operating temperature. In particular, in traditional shunt products, the design of setting the current input and output points in the center of the pins can easily lead to local current concentration in the resistive element, resulting in excessive temperature drift and thus affecting the measurement accuracy of the shunt product. Utility Model Content

[0004] In order to solve the above-mentioned technical problems, the main purpose of this utility model is to provide a shunt structure that improves current distribution design, reduces temperature drift, and enhances product detection accuracy.

[0005] To achieve the above objectives, this utility model proposes a shunt structure, comprising:

[0006] A resistor having a first connection side and a second connection side disposed opposite to each other in a first direction;

[0007] A first pin and a second pin, wherein the first pin is connected to the first connection side and is provided with a first sampling section, and the second pin is connected to the second connection side and is provided with a second sampling section; and,

[0008] The current guiding structure includes a first current guiding part and a second current guiding part. The first current guiding part is used for input current, and the second current guiding part is used for output current. The first current guiding part is disposed in a first direction at the end of the first pin away from the resistor, and the second current guiding part is disposed in a first direction at the end of the second pin away from the resistor. The first current guiding part and the second current guiding part are diagonally distributed on the shunt structure.

[0009] Optionally, a first adjustment structure is provided on the first pin. The first adjustment structure is configured in conjunction with the first current guiding part and the first sampling part to uniformly flow the current through the first sampling part and the resistor.

[0010] The second pin is provided with a second adjustment structure, which is configured in conjunction with the second current guide and the second sampling section to uniformly flow the current through the second sampling section and the resistor.

[0011] Optionally, the first sampling section is disposed in a first direction at one end of the first pin near the resistor, and is diagonally distributed on the first pin with the first current-conducting section.

[0012] The second sampling section is disposed in the first direction at one end of the second pin near the resistor, and is diagonally distributed on the second pin with the second current-conducting section.

[0013] Optionally, the first adjustment structure includes a first adjustment groove disposed between the first sampling section and the first flow guiding section. The first pin has a first end side and a second end side disposed opposite to each other in a second direction. The first end side is relatively close to the first flow guiding section, and the second end side is relatively close to the first sampling section. One end of the first adjustment groove passes through the second end side to form an opening, and the other end of the first adjustment groove extends in a direction close to the first end side.

[0014] The second adjustment structure includes a second adjustment groove disposed between the second sampling section and the second flow guide section. The second pin has a third end side and a fourth end side disposed opposite to each other in a second direction. The third end side is relatively close to the second flow guide section, and the fourth end side is relatively close to the second sampling section. One end of the second adjustment groove passes through the fourth end side to form an opening, and the other end of the second adjustment groove extends toward the direction close to the third end side.

[0015] The second direction is perpendicular to the first direction.

[0016] Optionally, the distance between the center of the first sampling section or the second sampling section and the resistor in the first direction is l1, and the minimum distance between the first adjustment slot or the second adjustment slot and the resistor in the first direction is L1, where l1 / L1 is greater than or equal to 2 and less than or equal to 3.

[0017] Optionally, the first adjustment groove and the second adjustment groove extend along the second direction;

[0018] The distance between the center of the first sampling section and the second end side, or between the center of the second sampling section and the fourth end side, in the second direction is l2. The total size of the first adjustment groove or the second adjustment groove in the second direction is L2, and l2 / L2 is greater than or equal to 2 and less than or equal to 3.

[0019] Optionally, the end of the first or second adjustment groove opposite to the opening is set to be arc-shaped.

[0020] Optionally, both the first and second flow guides are configured as mounting through holes, which are used for connecting posts to pass through to fix the shunt and simultaneously input or output current.

[0021] Optionally, the inner diameter of the mounting through hole is D, and the minimum distance between the mounting through hole and the edge of the splitter is d, where d is greater than or equal to 0.5D and less than or equal to D.

[0022] Optionally, the first sampling portion is configured as a protrusion protruding from one side of the first pin and integrally formed with the first pin; and / or, the second sampling portion is configured as a protrusion protruding from one side of the second pin and integrally formed with the second pin.

[0023] The technical solution provided by this utility model has the following beneficial effects:

[0024] The shunt structure provided by this utility model includes a resistor, a first pin, a second pin, and a current-conducting structure. The resistor has a first connection side and a second connection side opposite to each other in a first direction. The first pin is connected to the first connection side, and the second pin is connected to the second connection side. The current-conducting structure includes a first current-conducting part for the input current and a second current-conducting part for the output current. These two parts are respectively located at the ends of the first pin and the second pin away from the resistor and are diagonally distributed in the shunt structure. This utility model optimizes the current flow through the diagonal distribution design of the current-conducting parts, effectively dispersing the current on the resistor, reducing excessive local temperature rise caused by local current concentration on the resistor, thereby reducing temperature drift. At the same time, it retains the heat dissipation advantages of a large-size shunt, improves resistance stability, and enhances current measurement accuracy, making it suitable for high-current precision measurement scenarios. Attached Figure Description

[0025] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0026] Figure 1 A top view of an embodiment of the shunt structure provided by this utility model;

[0027] Figure 2 A top view of yet another embodiment of the shunt structure provided by this utility model;

[0028] Figure 3 for Figure 2 Side view of the middle splitter structure;

[0029] Figure 4 for Figure 2 A schematic diagram of the current flow in a shunt structure.

[0030] Explanation of icon numbers:

[0031] 100 - Shunt structure; 10 - Resistor element; 11 - First connection side; 12 - Second connection side; 20 - First pin; 21 - First end side; 22 - Second end side; 30 - Second pin; 31 - Third end side; 32 - Fourth end side; 41 - First sampling section; 42 - Second sampling section; 51 - First current guide section; 52 - Second current guide section; 60 - Opening; 61 - First adjustment slot; 62 - Second adjustment slot.

[0032] The realization of the purpose, functional characteristics and excellent effects of this utility model will be further explained below in conjunction with specific embodiments and accompanying drawings. Detailed Implementation

[0033] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0034] It should be noted that if the embodiments of this utility model involve directional indication, the directional indication is only used to explain the relative positional relationship and movement of each component in a specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0035] Furthermore, if the embodiments of this utility model involve descriptions such as "first" or "second," these descriptions are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of those features. Additionally, the meaning of "and / or" throughout the text includes three parallel solutions; for example, "A and / or B" includes solution A, solution B, or a solution where both A and B are satisfied simultaneously. Furthermore, the technical solutions of the various embodiments can be combined with each other, but this must be based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or impossible to implement, it should be considered that such a combination of technical solutions does not exist and is not within the scope of protection claimed by this utility model.

[0036] Please see Figures 1 to 4 This utility model provides a shunt structure 100. This shunt structure 100 is particularly suitable for high-current precision measurement scenarios such as new energy vehicles and energy storage systems. Specifically, the shunt structure 100 includes a resistor 10, a first pin 20, a second pin 30, and a current-conducting structure. The resistor 10 is an alloy resistor, which can be made of manganese-copper alloy, possessing characteristics of low temperature coefficient and high resistivity. The first pin 20 and the second pin 30 are both made of highly conductive material, specifically copper alloy, such as brass or copper.

[0037] The resistor 10 has a first connection side 11 and a second connection side 12 arranged opposite to each other in a first direction (i.e., the direction of current conduction, preferably the length direction of the shunt structure 100). The first pin 20 can be fixedly connected to the first connection side 11 by means of soldering or the like, and the second pin 30 can also be fixedly connected to the second connection side 12 by soldering. The soldering connection can ensure the conductive continuity between the first pin 20 or the second pin 30 and the resistor 10, and avoid the additional resistance value caused by poor contact from affecting the measurement accuracy.

[0038] In optional embodiments, such as Figure 1 or Figure 2 As shown, the current-guiding structure includes a first current-guiding section 51 for input current and a second current-guiding section 52 for output current. The first current-guiding section 51 is disposed in a first direction at the end of the first pin 20 away from the resistor 10, and the second current-guiding section 52 is disposed in a first direction at the end of the second pin 30 away from the resistor 10. The first current-guiding section 51 and the second current-guiding section 52 are diagonally distributed on the shunt structure 100. Specifically, if viewed from a top view of the shunt structure 100, with the center of the resistor 10 as the origin, the first current-guiding section 51 is located in the corresponding region of the first quadrant, and the second current-guiding section 52 is located in the corresponding region of the third quadrant. Preferably, the first current-guiding section 51 and the second current-guiding section 52 form a central angular symmetry relationship. This symmetry relationship ensures that after the current is input from the first current-guiding section 51, the diffusion path along the second direction (perpendicular to the first direction, preferably the width direction of the shunt structure 100) is completely symmetrical, avoiding local current density differences caused by the offset of the current-guiding section position.

[0039] Furthermore, a first sampling unit 41 is provided on the first pin 20, and a second sampling unit 42 is provided on the second pin 30. The first sampling unit 41 and the second sampling unit 42 are respectively used to collect the voltage signal across the resistor 10. Subsequently, the current value flowing through the shunt can be calculated based on Ohm's law in combination with the known resistance value of the resistor 10.

[0040] The specific forms of the first sampling unit 41 and the second sampling unit 42 are not limited. In optional embodiments, such as... Figure 4 As shown, the first sampling part 41 is configured as a protrusion protruding from one side of the first pin 20. The protrusion and the first pin 20 are integrally formed using a molding process, and the material is the same as that of the first pin 20. Similarly, the second sampling part 42 is configured as a protrusion protruding from one side of the second pin 30, integrally formed with the second pin 30, and the material is the same as that of the second pin 30.

[0041] In this embodiment, the protrusion is preferably cylindrical, with its axis perpendicular to the pin surface. During processing, it can be integrally formed with the corresponding pin through a forging process, thereby ensuring that there are no connection gaps between the protrusion and the pin, avoiding contact resistance caused by gaps, and improving the connection strength between the protrusion and the pin to prevent the protrusion from falling off during use.

[0042] In this embodiment, since the sampling section and the pin are integrally formed without any additional connection gaps, current can be smoothly transmitted to the sampling section when flowing within the pin, avoiding voltage loss due to contact resistance. The protruding post structure allows the terminals of the external sampling wires to be more tightly fitted onto the protruding post, ensuring reliable contact between the sampling terminals and the sampling section and reducing changes in contact resistance. Compared to the sampling section of a traditional shunt, this embodiment ensures stable conductivity between the sampling section and the pin, improving the accuracy of voltage sampling. Simultaneously, the protruding post structure facilitates the positioning and installation of the external sampling wire terminals, reducing assembly errors and improving production efficiency.

[0043] Traditional shunts, with their current input and output points centered on the pins, are prone to localized current concentration in the resistor 10. Excessive local current density generates excessive heat in this area, causing overheating and consequently, a change in the resistance of the resistor 10 with increasing temperature (i.e., temperature drift), affecting measurement accuracy. This embodiment, however, optimizes the current flow through diagonally distributed current guides, effectively dispersing the current on the resistor 10 (e.g., ...). Figure 4 As shown, this reduces the local current density of resistor 10, minimizing excessive local temperature rise and thus reducing temperature drift. Simultaneously, resistor 10, first pin 20, and second pin 30 retain a large size design. This large size increases the heat dissipation area, allowing for rapid dissipation of heat generated during operation, preserving the heat dissipation advantages of a large shunt, further ensuring the resistance stability of resistor 10, and ultimately improving current measurement accuracy.

[0044] The specific structures of the first guide section 51 and the second guide section 52 can also be selected as needed. In this embodiment, for example... Figure 1 and Figure 2As shown, both the first guide portion 51 and the second guide portion 52 are configured as mounting through holes. These mounting through holes are circular in shape and serve both mechanical fixing and current transmission functions. Specifically, the mounting through holes allow connecting posts (such as bolts or rivets) to pass through, fixing the shunt structure 100 to external equipment and achieving stable installation of the shunt. On the other hand, current is transmitted through the contact between the connecting post and the inner wall of the mounting through hole. After the external circuit wires are connected to the connecting post, the current can be transferred from the connecting post to the inner wall of the mounting through hole and then flow into the first pin 20, or flow out from the second pin 30 to the inner wall of the mounting through hole and then to the connecting post, ultimately inputting into the external circuit. This ensures resistance stability and ultimately improves the current measurement accuracy of the shunt structure 100, making it particularly suitable for high-current measurement scenarios with limited installation space.

[0045] Preferably, such as Figure 1 As shown, the inner diameter of the mounting through hole is D, and the minimum distance between the mounting through hole and the edge of the splitter is d, which is the shortest distance from the edge of the mounting through hole to the outermost edge of the splitter. In this embodiment, d is greater than or equal to 0.5D and less than or equal to D.

[0046] It is understandable that if d is less than 0.5D, the edge thickness of the shunt is too thin, which can easily lead to stress concentration during the fastening of the connecting post, causing edge cracking. This not only affects the mechanical life of the shunt but may also damage the conductive path due to cracking, leading to measurement failure. If d is greater than D, the mounting via is too close to the center of the shunt, which will compress the effective conductive area of ​​the pins, potentially causing current to concentrate around the via and increasing local temperature rise. In this embodiment, since d is controlled within the range of 0.5D to D, the mounting via and the edge of the shunt are kept at a reasonable distance. On the one hand, the edge of the shunt retains sufficient thickness to withstand the fastening force during the installation of the connecting post, avoiding edge cracking and ensuring the stability of the mechanical structure. On the other hand, the reasonable spacing ensures that the pin area around the mounting via retains sufficient conductive area. After the current flows in from the mounting via, it can diffuse fully within the pin, avoiding current concentration due to insufficient conductive area. Combined with the diagonal distribution design of the first current guiding part 51 and the second current guiding part 52 in the above embodiment, the current path is further optimized.

[0047] Based on the above embodiments, please refer to Figure 2 and Figure 3 A first adjustment structure is provided on the first pin 20, and a second adjustment structure is provided on the second pin 30. The first adjustment structure is configured to cooperate with the first flow guide 51 and the first sampling section 41, and can specifically be configured as a groove or slot structure formed on the first pin 20. The second adjustment structure has the same structure as the first adjustment structure, also being a groove or slot formed on the second pin 30. The second adjustment structure is also configured to cooperate with the second flow guide 52 and the second sampling section 42, and is located between the second flow guide 52 and the second sampling section 42.

[0048] In this embodiment, when current flows from the first guide section 51 into the first pin 20, without an adjustment structure, some current may preferentially flow to the first sampling section 41 due to the shorter path, resulting in an uneven distribution of the current flowing through the first sampling section 41 and the current flowing through the resistor 10, affecting the accuracy of voltage sampling. The first adjustment structure changes the current path within the first pin 20, allowing the current to be more evenly distributed when flowing to the first sampling section 41 and the resistor 10. Similarly, the second adjustment structure enables the current to flow evenly through the second sampling section 42 and to the second guide section 52 after flowing from the resistor 10 to the second pin 30.

[0049] In this embodiment, after the current enters the first pin 20 from the first current guide 51, it first contacts the first adjustment structure, forcing the current to be redistributed within the first pin 20. This allows the current to flow evenly through the first sampling section 41 to achieve voltage sampling, and then flows evenly along the first direction to the first connection side 11 and into the resistor 10. Similarly, after passing through the resistor 10, the current flows into the second pin 30, where it is also evenly distributed under the action of the second adjustment structure.

[0050] The specific forms of the first and second adjustment structures can vary, as long as they can achieve the flow guiding function. Specifically, the first adjustment structure includes a first adjustment groove 61 disposed between the first sampling section 41 and the first flow guiding section 51. The first pin 20 has a first end side 21 and a second end side 22 disposed opposite to each other in a second direction, wherein the first end side 21 is relatively close to the first flow guiding section 51, and the second end side 22 is relatively close to the first sampling section 41. One end of the first adjustment groove 61 extends through the second end side 22, forming an opening 60, the width of which is the same as the width of the first adjustment groove 61. The other end of the first adjustment groove 61 extends toward the first end side 21.

[0051] The second adjustment structure includes a second adjustment groove 62 disposed between the second sampling section 42 and the second flow guide section 52. The second pin 30 has a third end side 31 and a fourth end side 32 disposed opposite to each other in a second direction. The third end side 31 is relatively close to the second flow guide section 52, and the fourth end side 32 is relatively close to the second sampling section 42. One end of the second adjustment groove 62 extends through the fourth end side 32, forming an opening 60. The other end of the second adjustment groove 62 extends in a direction close to the third end side 31, and its size is the same as that of the first adjustment groove 61.

[0052] In this embodiment, the first adjustment slot 61 and the second adjustment slot 62 can be machined by milling. The milling process ensures the dimensional accuracy of the adjustment slots and avoids the current distribution effect being affected by the dimensional deviation of the adjustment slots. In this embodiment, when the current enters the first pin 20 from the first current guide 51, it flows to the first connection side 11 and the first sampling part 41. Due to the presence of the first adjustment slot 61, the current cannot flow directly from the first current guide 51 to the first sampling part 41 in a straight line, but needs to bypass the first adjustment slot 61. This bypassing process makes the current evenly distributed in the first pin 20. Similarly, after the current flows into the second pin 30, it bypasses the second adjustment slot 62 under the action of the second adjustment slot 62 and flows to the second connection side 12, achieving uniform current distribution.

[0053] In this embodiment, the specific structures of the first adjustment slot 61 and the second adjustment slot 62 can precisely guide the current path, avoiding local current concentration within the pin and further optimizing the current distribution. At the same time, the adjustment slots do not significantly reduce the overall heat dissipation area of ​​the pin, thus preserving the heat dissipation advantages of a large-size shunt.

[0054] Furthermore, such as Figure 2 As shown, the distance between the center of the first sampling section 41 and the resistor 10 in the first direction is l1, and the minimum distance between the first adjustment groove 61 and the resistor 10 in the first direction is L1 (that is, the distance between the edge of the adjustment groove near the resistor 10 and the resistor 10), and l1 / L1 is greater than or equal to 2 and less than or equal to 3.

[0055] The spacing between the second sampling section 42 and the resistor 10, and the spacing between the second adjustment slot 62 and the resistor 10 are set to be consistent with the first sampling section 41 and the first adjustment slot 61. That is, the spacing between the center of the second sampling section 42 and the resistor 10 in the first direction is l1, and the minimum spacing between the second adjustment slot 62 and the resistor 10 in the first direction is L1. l1 / L1 is greater than or equal to 2 and less than or equal to 3.

[0056] It is understandable that if l1 / L1 is too small, the first sampling section 41 will be too close to the resistor 10, which may cause the voltage drop across the pin between the resistor 10 and the sampling section to be mixed into the sampling signal, affecting the accuracy of voltage sampling. If l1 / L1 is too large, the first sampling section 41 will be too far from the resistor 10, and the sampling signal may be attenuated due to pin transmission, which will also affect the sampling accuracy. In this embodiment, l1 / L1 is controlled within the range of 2-3, which can avoid the above problems and, together with the adjustment slot, achieve the best current distribution effect, further improving the resistance stability and current measurement accuracy.

[0057] Alternatively, please continue reading Figure 2The first adjustment groove 61 and the second adjustment groove 62 extend along the second direction, respectively. The distance between the center of the first sampling part 41 and the second end side 22, or between the center of the second sampling part 42 and the fourth end side 32, in the second direction is l2. The total dimension of the first adjustment groove 61 or the second adjustment groove 62 in the second direction is L2, and l2 / L2 is greater than or equal to 2 and less than or equal to 3.

[0058] It is understandable that if l2 / L2 is too small, the first sampling section 41 will be too close to the second end 22, which may cause the current to concentrate in the region near the second end 22 in the second direction, resulting in excessive current flowing through the first sampling section 41 and affecting sampling accuracy. If l2 / L2 is too large, the first sampling section 41 will be too far from the second end 22, weakening the guiding effect of the adjustment slot on the current and failing to effectively achieve uniform current distribution. Controlling l2 / L2 within the range of 2-3 ensures the best guiding effect of the adjustment slot on the current while guaranteeing the sampling accuracy of the sampling section.

[0059] Preferably, the end of the first adjustment groove 61 opposite to the opening 60 (i.e., the end extending towards the first end side 21) is arc-shaped, with a smooth transition at the end of the first adjustment groove 61 and no sharp edges. Similarly, the end of the second adjustment groove 62 opposite to the opening 60 is also arc-shaped. It can be understood that when current flows through the end of the first adjustment groove 61, if the end is sharp, the current tends to concentrate at the sharp point, generating a local high current density, resulting in excessive local temperature rise. The arc-shaped end allows the current to flow smoothly along the arc-shaped surface, avoiding current concentration at the end and ensuring that the current remains uniformly distributed within the first pin 20. Similarly, the arc-shaped end of the second adjustment groove 62 can achieve the same effect.

[0060] In other words, the arc-shaped design at the ends of the first and second adjustment slots 62 solves the problem of current concentration caused by sharp ends, further reducing local temperature rise and temperature drift. At the same time, the arc-shaped ends can reduce stress concentration generated during processing, improve the structural strength of the first pin 20 and the second pin 30, avoid cracking and other damage to the shunt structure 100 due to stress concentration during long-term use, and extend the service life of the shunt structure 100.

[0061] The above description is only a preferred embodiment of the present utility model and does not limit the patent scope of the present utility model. Any equivalent structure made using the contents of the present utility model specification and drawings, or directly or indirectly applied to other related technical fields, are similarly included within the patent protection scope of the present utility model.

Claims

1. A shunt structure, characterized in that, include: A resistor having a first connection side and a second connection side disposed opposite to each other in a first direction; A first pin and a second pin, wherein the first pin is connected to the first connection side and is provided with a first sampling section, and the second pin is connected to the second connection side and is provided with a second sampling section; as well as, The current guiding structure includes a first current guiding part and a second current guiding part. The first current guiding part is used for input current, and the second current guiding part is used for output current. The first current guiding part is disposed in a first direction at the end of the first pin away from the resistor, and the second current guiding part is disposed in a first direction at the end of the second pin away from the resistor. The first current guiding part and the second current guiding part are diagonally distributed on the shunt structure.

2. The shunt structure as described in claim 1, characterized in that, The first pin is provided with a first adjustment structure, which is configured in conjunction with the first current guiding part and the first sampling part to uniformly flow the current through the first sampling part and the resistor. The second pin is provided with a second adjustment structure, which is configured in conjunction with the second current guide and the second sampling section to uniformly flow the current through the second sampling section and the resistor.

3. The shunt structure as described in claim 2, characterized in that, The first sampling section is disposed in a first direction at one end of the first pin near the resistor, and is diagonally distributed on the first pin with the first current-conducting section; The second sampling section is disposed in the first direction at one end of the second pin near the resistor, and is diagonally distributed on the second pin with the second current-conducting section.

4. The shunt structure as described in claim 3, characterized in that, The first adjustment structure includes a first adjustment groove disposed between the first sampling section and the first flow guiding section. The first pin has a first end side and a second end side disposed opposite to each other in a second direction. The first end side is relatively close to the first flow guiding section, and the second end side is relatively close to the first sampling section. One end of the first adjustment groove passes through the second end side to form an opening, and the other end of the first adjustment groove extends in a direction close to the first end side. The second adjustment structure includes a second adjustment groove disposed between the second sampling section and the second flow guide section. The second pin has a third end side and a fourth end side disposed opposite to each other in a second direction. The third end side is relatively close to the second flow guide section, and the fourth end side is relatively close to the second sampling section. One end of the second adjustment groove passes through the fourth end side to form an opening, and the other end of the second adjustment groove extends toward the direction close to the third end side. The second direction is perpendicular to the first direction.

5. The shunt structure as described in claim 4, characterized in that, The distance between the center of the first sampling unit or the second sampling unit and the resistor in the first direction is l1, and the minimum distance between the first adjustment slot or the second adjustment slot and the resistor in the first direction is L1, where l1 / L1 is greater than or equal to 2 and less than or equal to 3.

6. The shunt structure as described in claim 4, characterized in that, The first adjustment groove and the second adjustment groove extend along the second direction, respectively; The distance between the center of the first sampling section and the second end side, or between the center of the second sampling section and the fourth end side, in the second direction is l2. The total size of the first adjustment groove or the second adjustment groove in the second direction is L2, and l2 / L2 is greater than or equal to 2 and less than or equal to 3.

7. The shunt structure as described in claim 4, characterized in that, The end of the first or second adjustment groove opposite to the opening is set to be arc-shaped.

8. The shunt structure as described in any one of claims 2 to 7, characterized in that, Both the first and second flow guides are configured with mounting through holes, which are used for connecting posts to pass through to fix the shunt and to input or output current.

9. The shunt structure as described in claim 8, characterized in that, The inner diameter of the mounting through hole is D, and the minimum distance between the mounting through hole and the edge of the distributor is d, where d is greater than or equal to 0.5D and less than or equal to D.

10. The shunt structure according to any one of claims 1 to 7, characterized in that, The first sampling portion is configured as a protrusion protruding from one side of the first pin and integrally formed with the first pin; and / or, the second sampling portion is configured as a protrusion protruding from one side of the second pin and integrally formed with the second pin.