IGBT SiC power chip testing equipment
CN309274071SActive Publication Date: 2025-05-06SHENZHEN WEIYUJIA SEMICON EQUIP CO LTD
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Patent Information
- Application Number
- CN202430625625.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-05-06
- Estimated Expiration
- 2039-09-30
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Figure 000001_ABST
Abstract
1. The name of this design product: IGBT Sic power chip testing equipment. 2. Purpose of this design product: This design product is an IGBT Sic power chip testing equipment, which is used to perform aging tests on electronic products. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: Stereoscopic diagram 1.
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