Transmission electron microscope (Emei EM-F200)
CN309296603SActive Publication Date: 2025-05-16GUANGZHOU HUIJU TECH CO LTD
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Patent Information
- Application Number
- CN202430653660.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-16
- Publication Date
- 2025-05-16
- Estimated Expiration
- 2039-10-16
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Figure 000007_ABST
Abstract
1. The name of the product of this design: Transmission Electron Microscope (Emei EM‑F200). 2. Purpose of this design product: used for observing the ultrastructure of materials. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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