X-ray diffractometer (D7 benchtop)
CN309364224SActive Publication Date: 2025-07-01安徽国科仪器科技有限公司
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Patent Information
- Application Number
- CN202430672964.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-24
- Publication Date
- 2025-07-01
- Estimated Expiration
- 2039-10-24
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Figure 000005_ABST
Abstract
1. Name of the design product: X-ray diffractometer (D7 desktop). 2. Use of the design product: Used for determining the crystal structure of substances and performing qualitative and quantitative analysis of phases. 3. Design key points of the design product: Lies in the combination of shape and pattern. 4. Picture or photograph that best shows the design key points: Perspective view. 5. The back of the design product is a part that is not easily seen or not seen during use, so the rear view is omitted; the bottom surface of the design product is a part that is not easily seen or not seen during use, so the bottom view is omitted.
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