Argon ion beam scanning electron microscope
CN309480250SActive Publication Date: 2025-09-05YIDONG OPTICAL TECH (SUZHOU) CO LTD
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Patent Information
- Application Number
- CN202430827823.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-26
- Publication Date
- 2025-09-05
- Estimated Expiration
- 2039-12-26
Smart Images
Figure 000007_ABST
Abstract
1. The name of this design product: Argon ion beam scanning electron microscope. 2. Purpose of this design product: Used for ion beam polishing and electron beam imaging analysis of samples to achieve characterization of microstructure and composition. 3. The key point of the design of this product lies in its shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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